10-bit, 3.0 V analog-to-digital
interface for CCD cameras
Preliminary specification
Supersedes data of 1998 Mar 27
File under Integrated Circuits, IC02
1998 Oct 15
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
FEATURES
• Correlated Double Sampling (CDS), Automatic Gain
Control (AGC), 10-bit Analog-to-Digital Converter (ADC)
and reference regulator included
• Fully programmable via a 3-wire serial interface
• Sampling frequency up to 18 MHz
• AGC gain range of 36 dB (in steps of 0.1 dB)
• Low power consumption of only 190 mW (typ.)
• Power consumption in standby mode of 4.5 mW (typ.)
• 3.0 V operation and 2.5 to 3.6 V operation for the digital
outputs
• Active control pulses polarity selectable via serial
interface
• 8-bit DAC included for analog settings
• TTL compatible inputs, CMOS compatible outputs.
QUICK REFERENCE DATA
APPLICATIONS
• Low-power, low-voltage CCD camera systems.
GENERAL DESCRIPTION
The TDA8787 is a 10-bit analog-to-digital interface for
CCD cameras. The device includes a correlated double
sampling circuit, AGC and a low-power 10-bit ADC
together with its reference voltage regulator.
AGC gain is controlled via the serial interface.
The ADC input clamp level is controlled via the serial
interface.
An additional DAC is provided for additional system
controls; its output voltage range is 1.0 V (p-p) which is
available at pin OFDOUT.
TDA8787
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
V
CCA
V
CCD
V
CCO
I
CCA
I
CCD
I
CCO
analog supply voltage2.73.03.6V
digital supply voltage2.73.03.6V
digital outputs supply voltage2.52.63.6V
analog supply currentall clamps active−5570mA
digital supply current−811mA
digital outputs supply currentf
= 18 MHz; CL=20pF;
pix
−12mA
input ramp response time is 800 µs
ADC
res
V
i(CDS)(p-p)
f
pix(max)
f
pix(min)
DR
AGC
N
tot(rms)
ADC resolution−10−bits
maximum CDS input voltage
(peak-to-peak value)
VCC= 2.85 V650−−mV
V
≥ 3.0 V800−−mV
CC
maximum pixel rate18−−MHz
minimum pixel rate5−−MHz
AGC dynamic range−36−dB
total noise from CDS input to
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1998 Oct 153
ok, full pagewidth
BLOCK DIAGRAM
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
Philips SemiconductorsPreliminary specification
CPCDS1
CPCDS2
V
CCA3
AGND3
V
CCA1
AGND1
OFDOUT
SHP
47
7
8
42
41
CORRELATED
4
IN
6
5
9
DOUBLE
SAMPLING
OFD DAC
15
143
TEST2
TEST1AGND4
V
CCD3
V
ref
DGND3
1
SHD
48
CDS CLOCK GENERATOR
CLAMP
16
TEST3
2
CLAMP
V
CCA2
18
AGND2
17
AGC
9-BIT
REGISTER
8-BIT
REGISTER
CLPDM
CLPOB
13
45
OAGCOAGCC
40
REGULATOR
OE
37
OUTPUT
BUFFER
20
19
39
38
26
36
35
34
33
32
31
30
29
28
27
25
44
MGM541
DGND1
V
CCD1
DGND2
V
CCD2
OGND
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
V
CCO
DCLPC
24
PBK
11
PRE-
BLANKING
10
STDBY
AGND5
12
43
COMPARATOR
SHIFTERSHIFT
TDA8787
46
SEN
DAC
23
SCLK
7-BIT
REGISTER
SERIAL
INTERFACE
22
SDATA
10-bit ADC
21
VSYNC
CLK
DATA
FLIP-
FLOP
Fig.1 Block diagram.
TDA8787
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
PINNING
SYMBOLPINDESCRIPTION
V
CCD3
DGND32digital ground 3
AGND43analog ground 4
IN4input signal from CCD
AGND15analog ground 1
V
CCA1
CPCDS17clamp storage capacitor pin 1
CPCDS28clamp storage capacitor pin 2
OFDOUT9analog output of the additional 8-bit control DAC
STDBY10standby mode control input (LOW: TDA8787 active; HIGH: TDA8787 standby)
PBK11pre-blanking control input
CLPDM12clamp pulse input at dummy pixel
CLPOB13clamp pulse input at optical black
TEST114test pin input 1 (should be connected to AGND2)
TEST215test pin input 2 (should be connected to AGND1)
TEST316test pin input 3 (should be connected to AGND2)
AGND217analog ground 2
V
CCA2
V
CCD1
DGND120digital ground 1
SDATA21serial data input for serial interface control
SCLK22serial clock input for serial interface
SEN23strobe pin for serial interface
VSYNC24vertical sync pulse input
V
CCO
OGND26digital output ground
D027ADC digital output 0 (LSB)
D128ADC digital output 1
D229ADC digital output 2
D330ADC digital output 3
D431ADC digital output 4
D532ADC digital output 5
D633ADC digital output 6
D734ADC digital output 7
D835ADC digital output 8
D936ADC digital output 9 (MSB)
OE37output enable control input (LOW: outputs active; HIGH: outputs in high impedance)
V
CCD2
DGND239digital ground 2
CLK40data clock input
1digital supply voltage 3
6analog supply voltage 1
18analog supply voltage 2
19digital supply voltage 1
25output supply voltage
38digital supply 2
1998 Oct 154
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CCA
V
CCD
V
CCO
∆V
CC
V
i
I
o
T
stg
T
amb
T
j
Note
1. The supply voltages V
voltage difference ∆VCC remains as indicated.
analog supply voltagenote 1−0.3+7.0V
digital supply voltagenote 1−0.3+7.0V
output stages supply voltagenote 1−0.3+7.0V
supply voltage difference
between V
between V
between V
CCA
CCA
CCD
and V
and V
and V
CCD
CCO
CCO
−1.0+1.0V
−1.0+1.0V
−1.0+1.0V
input voltagereferenced to AGND−0.3+7.0V
data output current−±10mA
storage temperature−55+150°C
operating ambient temperature−20+75°C
junction temperature−150°C
, V
CCA
CCD
and V
may have any value between −0.3 and +7.0 V provided that the supply
CCO
HANDLING
Inputs and outputs are protected against electrostatic discharges in normal handling. However, to be totally safe, it is
desirable to take normal precautions appropriate to handling integrated circuits.
THERMAL CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSVALUEUNIT
R
th(j-a)
thermal resistance from junction to ambientin free air76K/W
1998 Oct 156
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
CHARACTERISTICS
V
CCA=VCCD
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Supplies
V
CCA
V
CCD
V
CCO
I
CCA
I
CCD
I
CCO
Digital inputs
I
NPUTS: SHP, SHD, STDBY, CLPDM, CLPOB, SCLK, SDATA, SEN, VSYNC, OE AND PBK
V
IL
V
IH
I
i
Clamps
= 3.0 V; V
CCO
= 2.6 V; f
= 18 MHz; T
pix
=25°C; unless otherwise specified.
amb
analog supply voltage2.73.03.6V
digital supply voltage2.73.03.6V
digital outputs supply
2.52.63.6V
voltage
analog supply currentall clamps active−5570mA
digital supply current−811mA
digital outputs supply
in number of pixels
INPUT CLAMP (DRIVEN BY CLPDM)
g
m(CDS)
CDS input clamp
transconductance
OPTICAL BLACK CLAMP (DRIVEN BY CLPOB)
G
shift
gain from CPCDS1 and 2
to AGC inputs
I
LSB(cp)
charge pump current for
±1 LSB error at ADC
output
I
push(cp)
available push current of
the charge pump
I
pull(cp)
available pull current of
the charge pump
AGC code = 383 for
18−−pixels
maximum 4 LSB error
1.52.73.5mS
−0.27−−
AGC code = 0−±350−µA
AGC code = 383−±10−µA
−650−µA
−−650−µA
1998 Oct 157
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Correlated Double Sampling (CDS)
V
i(CDS)(p-p)
maximum peak-to-peak
CDS input amplitude
(video signal)
V
reset(max)
maximum CDS input reset
pulse amplitude
I
i(IN)
input current into pin IN
(pin 4)
t
CDS(min)
CDS control pulses
minimum active time
t
h(IN-SHP)
CDS input hold time
(pin IN) compared to
control pulse SHP
t
h(IN-SHD)
CDS input hold time
(pin IN) compared to
control pulse SHD
Amplifier
DR
∆G
AGC
AGC
AGC dynamic range−36−dB
maximum AGC gain step−0.3−+0.3dB
Analog-to-Digital Converter (ADC)
LE
LE
i
d
integral linearity errorf
differential linearity errorf
Total chain characteristics (CDS + AGC + ADC)
f
pix(max)
t
CLKH
t
CLKL
t
d(SHD-CLK)
maximum pixel frequency18−−MHz
CLK pulse width HIGH15−−ns
CLK pulse width LOW15−−ns
time delay between
SHD and CLK
t
su(PBK-CLK)
set-up time of PBK
compared to CLK
V
i(IN)
video input dynamic signal
for ADC full-scale output
N
tot(rms)
total output noise (RMS
value)
O
CCD(max)
maximum offset between
CCD floating level and
CCD dark pixel level
V
n(i)(eq)(rms)
equivalent input noise
voltage (RMS value)
VCC= 2.85 V650−−mV
V
≥ 3.0 V800−−mV
CC
500−−mV
at floating gate level−1−+1µA
video input = V
i(CDS)(p-p)
;
1115−ns
2 LSB error at ADC output
V
CCA=VCCD
T
=25°C; see Fig.9
amb
V
CCA=VCCD
T
=25°C; see Fig.9
amb
= 18 MHz; ramp input−±1.3±2.5LSB
pix
= 18 MHz; ramp input−±0.5±0.9LSB
pix
=30V;
=30V;
35 7ns
35 7ns
see Fig.910−−ns
10−−ns
AGC code = 00800−−mV
AGC code = 38312.7−−mV
see Fig.8
AGC gain=0dB−0.25−LSB
AGC gain=9dB−0.8−LSB
−70−+70mV
−110−µV
1998 Oct 158
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Digital-to-analog converter (OFDOUT DAC)
V
OFDOUT(p-p)
additional 8-bit control
DAC (OFD) output voltage
(peak-to-peak value)
V
OFDOUT(0)
DC output voltage for
code 0
V
OFDOUT(255)
DC output voltage for
code 255
TC
DAC
DAC output range
temperature coefficient
Z
OFDOUT
I
OFDOUT
DAC output impedance−2000−Ω
OFD output current drivestatic−− 100µA
Digital outputs (f
V
V
I
OH
OL
OZ
HIGH-level output voltage IOH= −1mAV
LOW-level output voltageIOL= 1 mA0−0.5V
output current in 3-state
mode
t
t
C
h(o)
d(o)
L
output hold timesee Fig.911−−ns
output delay timeCL= 22 pF; V
output load capacitance−− 22pF
Serial interface
f
SCLK(max)
maximum frequency of
serial interface
= 18 MHz; CL=22pF)
pix
Ri=1MΩ−1.0−V
−AGND−V
−AGND + 1.0 −V
−250−ppm/°C
− 0.5 −V
0.5V<Vo<V
C
= 22 pF; V
L
CCO
CCO
= 3.0 V−28tbfns
CCO
= 2.7 V−27tbfns
CCO
−20−+20µA
CCO
5−−MHz
V
1998 Oct 159
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
handbook, full pagewidth
IN
SHP
SHD
CLK
0.6 V
t
h(IN-SHP)
N
0.6 V
t
h(IN-SHD)
2.2 V
N + 1N + 2N + 3
t
CDS(min)
t
CLKH
0.6 V
t
CDS(min)
0.6 V
TDA8787
2.2 V
2.2 V
0.6 V
SDATA
PBK
t
d(SHD-CLK)
t
h(o)
N − 1
t
d(o)
2.2 V
0.6 V
t
su(PBK-CLK)
50%
Fig.3 Pixel frequency timing diagram; all polarities active HIGH.
N
MGM764
1998 Oct 1510
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
handbook, full pagewidth
IN
SHP
SHD
CLK
2.2 V
t
h(IN-SHP)
N
2.2 V
t
h(IN-SHD)
t
CLKL
0.6 V
N + 1N + 2N + 3
t
CDS(min)
2.2 V2.2 V
2.2 V
t
CDS(min)
0.6 V
t
d(SHD-CLK)
TDA8787
0.6 V
handbook, full pagewidth
SDATA
PBK
t
N − 1
h(o)
t
d(o)
2.2 V
0.6 V
t
su(PBK-CLK)
50%
Fig.4 Pixel frequency timing diagram; all polarities active LOW.
MGM543
1.0
OFDOUT DAC
voltage
output
(V)
0
0
OFDOUT control DAC input code
255
N
FCE088
Fig.5 DAC voltage output as a function of DAC input code.
1998 Oct 1511
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
(1)
handbook, full pagewidth
AGCOUT
CLPOB
(active HIGH)
CLPDM
(active HIGH)
PBK
(active HIGH)
VIDEOOPTICAL BLACK
4 pixels
CLPOB
WINDOW
HORIZONTAL FLYBACKDUMMYVIDEO
(2)
PBK window
4 pixels
CLPDM
WINDOW
TDA8787
(1)
MGM544
(1) In case the number of clamp pixels is limited to 18t
(2) When dummy pixels are not available.
Fig.6 Line frequency timing diagram.
42
handbook, halfpage
AGC
gain
36
(dB)
30
24
18
12
6
0
−6
064192320
; otherwise this timing interval can be smaller.
W(clamp)
128
256384
AGC input code
FCE057
Fig.7 AGC gain as a function of AGC input code.
1998 Oct 1512
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
10
handbook, halfpage
N
tot(rms)
(LSB)
8
6
4
2
0
Noise measurement at ADC outputs:
Coupling capacitor at input is grounded, so only noise contribution of the front-end is evaluated. Front-end works at 18 Mpixels with line of 1024 pixels
whose first 40 are used to run CLPOB and the last 40 for CLPDM. Data at the ADC outputs are measured during the other pixels. As a result of this,
the standard deviation of the codes statistic is computed, resulting in the noise. No quantization noise is taken into account as no signal is inputted.
640192320128
256383
AGC code
FCE098
Fig.8 Total noise performance as a function of AGC gain.
1998 Oct 1513
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
handbook, full pagewidth
SDATA
SCLK
SEN
OFDOUT DAC
LATCHES
8-bit DAC
D0
D1 D2 D3 D4 D510D6
LSBMSB
8 9 7 6
AGC GAIN
LATCHES
AGC controlADC clamp
ADC CLAMP
LATCHES
control
SHIFT REGISTER
D7 D8 D9 A0 A1
CONTROL PULSE
POLARITY
LATCHES
control pulses
polarity settings
TDA8787
LATCH
SELECTION
MGM546
handbook, full pagewidth
SDATA
SCLK
SEN
Fig.9 Serial interface block diagram.
t
su2
t
MSBLSB
A1A0D9D7D6D5D4D3
t
su1
D8
hd4
D2D1D0
t
hd3
t
su3
MGM547
t
su1=tsu2=tsu3
= 10 ns (min.); t
hd3=thd4
= 10 ns (min.).
Fig.10 Loading sequence of control input data via the serial interface.
1998 Oct 1514
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
Table 1 Serial interface programming
ADDRESS BITS
A1A0
00AGC gain control (D8 to D0); bit D9 should be set to logic 0
01DAC OFDOUT output control (D7 to D0); bits D8 and D9 should be set to logic 0
10ADC clamp reference control (D6 to D0); bits D7, D8 and D9 should be set to logic 0
11control pulses (pins SHP, SHD, CLPDM, CLPOB, PBK and CLK) polarity settings
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
APPLICATION DIAGRAM
handbook, full pagewidth
(2) (2)
(2)
CCD
1 µF
V
CCD
V
CCA
1 µF
1 µF
1 µF
100
nF
V
CCD3
DGND3
AGND4
AGND1
V
CCA1
CPCDS1
CPCDS2
OFDOUT
STDBY
PBK
CLPDM
SHD
48 47 46 45 44 43 42 41 40 39 38 37
1
2
3
IN
4
5
6
7
8
9
10
11
12
13 14 15 16 17 18 19 20 21 22 23 24
SHP
OAGC
OAGCC
V
CCA
100
1 µF
CCA3
V
DCLPC
AGND5
TDA8787HL
nF
AGND3
CLK
V
CCD
CCD2
DGND2
V
100
nF
OE
TDA8787
V
CCD
D9
36
D8
35
D7
34
D6
33
D5
32
D4
31
D3
30
D2
29
D1
28
D0
27
OGND
26
V
CCO
25
100
nF
V
CCD
TEST3
CCA2
V
AGND2
100
nF
TEST1
TEST2
V
CCD
(1) Pins SEN and VSYNC should be interconnected when vertical sync signal is not available.
(2) Input signals IN, SHD and SHP must be adjusted to comply with timing signals t
CLPOB
V
CCA
Fig.11 Application diagram.
1998 Oct 1516
CCD1
V
h(IN-SHP)
SDATA
DGND1
100
nF
and t
SCLK
serial
interface
V
CCD
h(IN-SHD)
SEN
VSYNC
(1)
MGM548
(see Chapter “Characteristics”).
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
PACKAGE OUTLINE
LQFP48: plastic low profile quad flat package; 48 leads; body 7 x 7 x 1.4 mm
c
y
X
36
37
25
Z
24
E
A
TDA8787
SOT313-2
e
w M
pin 1 index
48
1
e
DIMENSIONS (mm are the original dimensions)
mm
A
A1A2A3b
max.
0.20
1.60
0.05
1.45
1.35
UNIT
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
b
p
0.25
w M
D
H
D
p
0.27
0.17
12
Z
D
(1)(1)(1)
cE
D
0.18
7.1
0.12
6.9
b
p
13
v M
B
v M
02.55 mm
scale
(1)
eH
H
7.1
6.9
0.5
9.15
8.85
D
E
A
B
9.15
8.85
H
E
LL
E
0.75
0.45
A
p
A
2
A
1
L
detail X
Z
D
0.12 0.10.21.0
0.95
0.55
(A )
3
L
p
Zywvθ
E
0.95
0.55
θ
o
7
o
0
OUTLINE
VERSION
SOT313-2
IEC JEDEC EIAJ
REFERENCES
1998 Oct 1517
EUROPEAN
PROJECTION
ISSUE DATE
94-12-19
97-08-01
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
CCD cameras
SOLDERING
Introduction
There is no soldering method that is ideal for all IC
packages. Wave soldering is often preferred when
through-hole and surface mounted components are mixed
on one printed-circuit board. However, wave soldering is
not always suitable for surface mounted ICs, or for
printed-circuits with high population densities. In these
situations reflow soldering is often used.
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(order code 9398 652 90011).
Reflow soldering
Reflow soldering techniques are suitable for all LQFP
packages.
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 50 and 300 seconds depending on heating
method. Typical reflow peak temperatures range from
215 to 250 °C.
Wave soldering
TDA8787
If wave soldering cannot be avoided, for LQFP
packages with a pitch (e) larger than 0.5 mm, the
following conditions must be observed:
•A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave)
soldering technique should be used.
•The footprint must be at an angle of 45° to the board
direction and must incorporate solder thieves
downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder is
10 seconds, if cooled to less than 150 °C within
6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron
(less than 24 V) applied to the flat part of the lead. Contact
time must be limited to 10 seconds at up to 300 °C. When
using a dedicated tool, all other leads can be soldered in
one operation within 2 to 5 seconds between
270 and 320 °C.
Wave soldering is not recommended for LQFP packages.
This is because of the likelihood of solder bridging due to
closely-spaced leads and the possibility of incomplete
solder penetration in multi-lead devices.
CAUTION
Wave soldering is NOT applicable for all LQFP
packages with a pitch (e) equal or less than 0.5 mm.
1998 Oct 1518
Philips SemiconductorsPreliminary specification
10-bit, 3.0 V analog-to-digital interface for
TDA8787
CCD cameras
DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1998 Oct 1519
Philips Semiconductors – a worldwide company
Argentina: see South America
Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 625 344, Fax.+381 11 635 777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands545104/750/02/pp20 Date of release: 1998 Oct 15Document order number: 9397 75004259
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