DATASHEETS saa3323 DATASHEETS (Philips)

INTEGRATED CIRCUITS
DATA SH EET
SAA3323
Drive processor for DCC systems
Preliminary specification File under Integrated Circuits, IC01
Philips Semiconductors
May 1994
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

FEATURES

Operating supply voltage: 2.7 to 3.6 V
Low power dissipation: 84 mW (typ)
Single chip digital equalizer, tape formatting and error
correction
8-bit flash analog-to-digital converter (ADC) for low symbol error rate
Two switchable Infinite Impulse-Response (IIR) filter sections
10-tap Finite Impulse-Response (FIR) filter per main data channel, with 8 bit coefficients, identical for all main channels
10-tap FIR filter for the AUX channel
Analog and digital eye outputs
Interrupt line triggered by internal auxiliary envelope
processing e.g. label, counter, and others
Robust programmable digital PLL clock extraction unit
Low power SLEEP mode
Slew rate limited Electromagnetic Compatibility (EMC)
friendly output
Digital Compact Cassette (DCC) optimized error correction
Programmable symbol synchronization strategy for tape input data
Microcontroller control of capstan servo possible during playback and recording
Frequency and phase regulation of capstan servo during playback
Choice of Dynamic Random Access Memory (DRAM) and Static Random Access Memory (SRAM) types for system Random Access Memory (RAM)
Scratch pad RAM for microcontroller in system RAM
Integrated interface for Precision Adaptive Sub-band
Coding (PASC) data bus
Three wire microcontroller ‘L3’ interface
Protection against invalid auxiliary data
Seamless joins between recordings.

GENERAL DESCRIPTION

The SAA3323 performs the drive processor function in the DCC system. This function is built up of digital equalizer, error correction and tape formatting functions. The digital equalizer is intended for use with DCC read amplifiers TDA1318 or TDA1380. The tape formatting and error correction circuit is intended for use with PASC ICs SAA2003 and SAA2013, and write amplifiers TDA1319 or TDA1381.

ORDERING INFORMATION

TYPE NUMBER
SAA3323H 80 TQFP80 SAA3323GP 80 QFP80
Note
1. When using reflow soldering it is recommended that the Dry Packing instructions in the
Pocketbook”
are followed. The pocketbook can be ordered using the code 9398 510 34011.
PINS PIN POSITION MATERIAL CODE
(1)
(1)
PACKAGE
plastic SOT315-1 plastic SOT318-2
“Quality Reference
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

BLOCK DIAGRAM

handbook, full pagewidth
SBDIR
SBMCLK
SBEF
SBDA
SBCL
SBWS
SAA3323
SUB-BAND
2
I S
INTERFACE
DIGITAL-
TO-ANALOG
CONVERTER
PHASE
LOCKED
LOOP
TAPE
INPUT
BUFFER
ERROR
CORRECTOR
ZERO
CROSSING
INTERNAL DATA BUS
RAM
INTERFACE
8116
(1)
FIR
IIR
AUXILIARY ENVELOPE
DETECTION
ANAEYE
RDSYNC
(2)
ANALOG
TO-DIGITAL
CONVERTER
EQUALIZER
MODULE
TAPE
OUTPUT
BUFFER
CONTROL
INTERFACE
RDMUX BIAS V
ref(p)
V
ref(n)
TCLOCK WDATA
SPEED URDA RESET SLEEP
L3REF L3DATA
(1) FIR = Finite Impulse-Response. (2) IIR = Infinite Impulse-Response.
OEN
WEN
D0 to D7
A0 to A10
A11 to A16
Fig.1 Block diagram.
PINO1
PINO2
PINI
L3INT
L3CLK
L3MODE
MLB761
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

PINNING

SYMBOL
PIN
DESCRIPTION TYPE
(1)
QFP80 TQFP80
SBWS 1 79 word select for sub-band PASC interface I/O (1 mA) SBCL 2 80 bit clock for sub-band PASC interface I/O (1 mA) SBDA 3 1 data line for sub-band PASC interface I/O (1 mA) SBDIR 4 2 direction line for sub-band PASC interface O (1 mA) SBMCLK 5 3 master clock for sub-band PASC interface I URDA 6 4 unreliable data O (1 mA) L3MODE 7 5 mode line for L3 interface I L3CLK 8 6 bit clock line for L3 interface I L3DATA 9 7 serial data line for L3 interface I/O (2 mA) L3INT 10 8 L3 interrupt output O (1 mA) V V
DD1 SS1
11 9 digital supply voltage S
12 10 digital ground S L3REF 13 11 L3 bus timing reference O (1 mA) RESET 14 12 reset SAA3323 I SLEEP 15 13 sleep mode selection of SAA3323 I CLK24 16 14 24.576 MHz clock input I AZCHK 17 15 channel 0 and channel 7 azimuth monitor O (1 mA) MCLK 18 16 6.144 MHz clock output O (1 mA) TEST3 19 17 TEST3 output; do not connect O (1 mA) ERCOSTAT 20 18 ERCO status, for symbol error rate measurements O (1 mA) OEN 21 19 output enable for RAM O (2 mA) A10/
RAS 22 20 address SRAM; RAS DRAM O (2 mA) V V
DD2 SS2
23 21 digital supply voltage S
24 22 digital ground S D7 25 23 data SRAM I/O (4 mA) D6 26 24 data SRAM I/O (4 mA) D5 27 25 data SRAM I/O (4 mA) D4 28 26 data SRAM I/O (4 mA) D3 29 27 data SRAM; data DRAM I/O (4 mA) D2 30 28 data SRAM; data DRAM I/O (4 mA) D1 31 29 data SRAM; data DRAM I/O (4 mA) V V
DD7 SS7
32 30 digital supply voltage for RAM S
33 31 digital ground for RAM S D0 34 32 data SRAM; data DRAM I/O (4 mA) A0 35 33 address SRAM; address DRAM O (2 mA) A1 36 34 address SRAM; address DRAM O (2 mA) A2 37 35 address SRAM; address DRAM O (2 mA) A3 38 36 address SRAM; address DRAM O (2 mA)
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL
DESCRIPTION TYPE
QFP80 TQFP80
A4 39 37 address SRAM; address DRAM O (2 mA)
PIN
V V
SS3 DD3
40 38 digital ground S
41 39 digital supply voltage S A5 42 40 address SRAM; address DRAM O (2 mA) A6 43 41 address SRAM; address DRAM O (2 mA) A7 44 42 address SRAM; address DRAM O (2 mA) A12/PINO5 45 43 address SRAM; Port expander output 5 O (2 mA) A14/PINO1 46 44 address SRAM; Port expander output 1 O (2 mA) A16/PINO3 47 45 address SRAM; Port expander output 3 O (2 mA) A15/PINO4 48 46 address SRAM; Port expander output 4 O (2 mA) WEN 49 47 write enable for RAM O (2 mA) A13/PINO2 50 48 address SRAM; Port expander output 2 O (2 mA) A8 51 49 address SRAM; address DRAM O (2 mA) V
DD4
V
SS4
CAS 54 52 address SRAM; CAS for DRAM O (2 mA)
A9/
52 50 digital supply voltage S
53 51 digital ground S
A11 55 53 address SRAM O (2 mA) SPEED 56 54 Pulse Width Modulation (PWM) capstan control output for deck O PINO2 57 55 Port expander output 2 O
(1 mA)
t
(1 mA)
t
WDATA 58 56 serial output to write amplifier O (1 mA) TCLOCK 59 57 3.072 MHz clock output for tape I/O O (1 mA) V
SS5
V
DD5
TEST2 62 60 TEST mode select; do not connect I RDMUX 63 61 analog multiplexed input from read amplifier I V
ref(p)
V
ref(n)
SUBSTR 66 64 substrate connection I BIAS 67 65 bias current for ADC I V
SSA
V
DDA
ANAEYE 70 68 analog eye pattern output O
60 58 digital ground S
61 59 digital supply voltage S
64 62 ADC positive reference voltage I
65 63 ADC negative reference voltage I
68 66 analog ground S
69 67 analog supply voltage S
pd A A A A A
A
RDSYNC 71 69 synchronization output for read amplifier O (1 mA) V V
DD6 SS6
72 70 digital supply voltage S
73 71 digital ground S CHTST1 74 72 channel test pin 1 O (1 mA) CHTST2 75 73 channel test pin 2 O (1 mA) TEST0 76 74 TEST mode select; do not connect I TEST1 77 75 TEST mode select; do not connect I
pd pd
(1)
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL
PIN
DESCRIPTION TYPE
(1)
QFP80 TQFP80
PINI 78 76 Port expander input I PINO1 79 77 Port expander output 1 O (1 mA) SBEF 80 78 sub-band PASC error flag line O (1 mA)
Note
1. I = input; IA= analog input; Ipd= input with pull-down resistance; I/O = bidirectional; O = output; OA= analog output; Ot= 3-state output; S = supply.
handbook, full pagewidth
SBDA
SBDIR
SBMCLK
URDA
L3MODE
L3CLK
L3DATA
L3INT
V
DD1
V
SS1
L3REF RESET SLEEP
SBWS
SBCL
80 1 2 3 4 5 6 7 8 9
10 11 12 13
SBEF
PINO1
79
78
77
PINI 76
TEST1 75
74
CHTST1
CHTST2 73
72
SAA3323
TEST0
V
SS6
71
DD6
V
70
ANAEYE
RDSYNC 69
68
V
67
DDA
V
SSA
66
BIAS 65
ref(n)Vref(p)
V
SUBSTR
64
63
62
RDMUX 61
60 59 58 57 56 55 54 53 52 51 50 49 48
TEST2
V
DD5
V
SS5
TCLOCK WDATA
PINO2 SPEED A11
A9/CAS
V
SS4
V
DD4 A8 A13/PINO2
MCLK
OEN
14 15 16 17 18 19 20
25
26
21
DD2
V
22
SS2
V
23 D7
24 D6
D5
D4
27
D3
28 D2
29 D1
V
CLK24
AZCHK
TEST3
ERCOSTAT
A10/RAS
Fig.2 Pin configuration (SOT315-1; TQFP80).
30
DD7
31
SS7
V
32 D0
A0
47
WEN A15/PINO4
46
A16/PINO3
45
A14/PINO1
44
A12/PINO5
43
A7
42
A6
41
35
36
37
38
39
DD3
V
40 A5
MLB762
34
33
A1
A2
A3
A4
SS3
V
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
SBMCLK
L3MODE
L3DATA
ERCOSTAT
A10/RAS
SBWS SBCL
SBDA
SBDIR
URDA
L3CLK
L3INT
V
DD1
V
SS1
L3REF
RESET
SLEEP
CLK24
AZCHK
MCLK
TEST3
OEN
V
DD2
V
SS2
DD6
SBEF
PINO1
80
79 1 2 3 4 5 6 7 8 9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
PINI 78
TEST1 77
76
CHTST2 75
TEST0
SS6
V
CHTST1 74
73
SAA3323
V
72
ANAEYE
RDSYNC 71
70
DDA
V
69
SSA
V
68
BIAS
67
ref(n)
SUBSTR
V
66
65
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41
V
ref(p)
RDMUX TEST2
V
DD5
V
SS5
TCLOCK
WDATA PINO2 SPEED A11 A9/CAS
V
SS4
V
DD4
A8 A13/PINO2
WEN A15/PINO4 A16/PINO3 A14/PINO1
A12/PINO5 A7 A6 A5
V
DD3
25
26
D7
D6
27 D5
D4
29
30
31 D1
32
DD7
V
28
D2
D3
Fig.3 Pin configuration (SOT318-2; QFP80).
33
SS7
V
34 D0
35 A0
36 A1
37 A2
38 A3
39 A4
40
SS3
V
MLB763
May 1994 8

FUNCTIONAL DESCRIPTION

Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
RAM
41464
analog
output
analog
input
IEC958
analog CC
L output
analog CC
R output
L
DAC
TDA1305
R
SFC3 SAA2003 STEREO
FILTER CODEC
2
ADAS3
SAA2013
ADAPTIVE
ALLOCATION
L
R
baseband
I S
ADC
SAA7366
DIGITAL
AUDIO I/O
TDA1315
2
filtered I S
AUDIO IN/OUT PASC PROCESSOR
sub-band
2
I S
BUFFER
64K x 4
DRP
SAA2023
OR
SAA3323
DRIVE
PROCESSOR
search data
TAPE DRIVE PROCESSING
speed control
WRAMP
TDA1381
WRITE AMP.
RDAMP
TDA1380
READ AMP.
FIXED HEAD
CAPSTAN
DRIVE
TAPE
MECHANICS
DRIVERS
detect switch
SYSTEM CONTROL
Fig.4 DCC system block diagram.
handbook, full pagewidth
SYSTEM
MICROCONTROLLER
MBD620
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
A simplified block diagram of the SAA3323 is shown in Fig.1.

DCC drive processing

The SAA3323 provides the following functions for the DCC drive processing.
LAYBACK MODES
P
Analog-to-digital conversion
Tape channel equalization
Tape channel data and clock recovery
10-to-8 demodulation
Data placement in system RAM
C1 and C2 error correction decoding
Interfacing to sub-band serial PASC interface
Interfacing to microcontroller for SYSINFO and AUX
data
Capstan control for tape deck.
R
ECORD MODES
Interfacing to sub-band serial PASC interface
C1 and C2 error correction encoding
Formatting for tape transfer
8-to-10 modulation
Interfacing to microcontroller for SYSINFO and AUX
data
Capstan control for tape deck, programmable by microcontroller.
S
EARCH MODE
Table 1 Basic modes of TFE module.
MODE EXPLANATION
DPAP audio and SYSINFO (main data) play;
AUX play
DPAR audio and SYSINFO (main data) play;
AUX record
DRAR audio and SYSINFO (main data) record;
AUX record
REGISTERS
TFE The TFE module has 8 writable and 5 readable registers
that are accessible via the L3 interface, one write register (CMD) and four read registers (STATUS0 to STATUS3) which are directly addressable, the other registers are indirectly addressable via commands sent to the CMD register. The registers are named as shown in Table 2.
Table 2 TFE register names.
REGISTER NAME READ/WRITE
CMD W STATUS0 R STATUS1 R STATUS2 R STATUS3 R SET0 W SET1 W SET2 W SET3
(1)
W SPDDTY W BYTCNT W RACCNT W SPEED R
Detection and interpretation of AUX envelope information
AUX envelope counting
Search speed estimation.

Tape Formatting and Error (TFE) correction module

The TFE module has 3 basic modes of operation as shown in Table 1.
Note
1. The 4 LSBs of register ‘SET3’ set RAM type (RType) and RAM timing (RTim). See Table 3.
For normal operation the 4 MSBs of register ‘SET3’ should be logic 0.
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 3 RAM settings by register SET3.
RAM REGISTER SET3
RTYPE 0 bit 0 RTYPE 1 bit 1 RTim 0 bit 2 RTim 1 bit 3
TFE
DATA STREAMS
The TFE module has three read/write data streams that are accessible via the L3 interface and they are shown in Table 4.
Table 5 TFE commands.
NAME
RDSPEED 00000000read SPEED register LDSET0 00010000load new TFE settings register 0 LDSET1 00010001load new TFE settings register 1 LDSET2 00010010load new TFE settings register 2 LDSET3 00010011load new TFE settings register 3 LDSPDDTY 00010101load SPDDTY register LDBYTCNT 00010111load BYTCNT register LDRACCNT 00011000load RACCNT register RDAUX 00100000read AUXILIARY information RDSYS 00100001read SYSINFO RDDRAC Y Z 100010read RAM data bytes (8 bits) from quarter YZ RDWDRAC Y Z 100011read RAM data words (12 bits) from quarter YZ WRAUX 00110000write AUXILIARY information WRSYS 00110001write SYSINFO WRDRAC Y Z 110010write RAM data bytes (8 bits) to quarter YZ WRWDRAC Y Z 110011write RAM data words (12 bits) to quarter YZ
COMMAND BYTE
76543210
Table 4 TFE data streams.
DATA STREAM NAME READ/WRITE
SYSINFO R/W AUXINFO R/W Scratch pad RAM R/W
COMMANDS
TFE ‘ These are the commands that need to be sent to the TFE
in order to access the indirectly accessible registers and the data streams, see Table 5.
EXPLANATION

Digital equalizer module

The digital equalizer module has 2 basic modes of operation as shown in Table 6.
Table 6 Basic modes of equalizer module.
MODE EXPLANATION
Play main data and AUX channels are
equalized
Search only AUX channel is processed; AUX
envelope information is processed
May 1994 10
DIGITAL EQUALIZER REGISTERS The digital equalizer module has 9 write only, 3 read only
and 1 read/write register(s) that are accessible via the L3 interface, one write register (CMD) and 2 read registers (STATUS0 and STATUS1) which are directly addressable, the other registers are indirectly addressable via commands sent to the CMD register. The registers are named as shown in Table 7.
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 7 Digital equalizer register names.
REGISTER NAME READ/WRITE
CMD W STATUS0 R STATUS1 R COEFCNT W FCTRL W CHT1SEL W CHT2SEL W ANAEYE W AEC R/W SSPD R INTMASK W DEQ2SET W CLKSET W
Table 9 Digital equalizer commands.
COMMAND BYTE
NAME
76543210
WRCOEF 0 0 1 1 0 0 0 0 write FIR coefficients to the digital equalizer buffer bank RDCOEF 0 0 1 0 0 0 0 0 read FIR coefficients from the digital equalizer active bank LDCOEFCNT 0 0 0 1 0 0 1 1 load FIR coefficient counter LDFCTRL 0 0 0 1 0 1 0 0 load filter control register LDT1SEL 0 0 0 1 0 1 1 0 load CHTST1 pin selection register LDT2SEL 0 0 0 1 0 1 1 1 load CHTST2 pin selection register LDTAEYE 0 0 0 1 1 0 0 0 load ANAEYE channel selection register LDAEC 0 0 0 1 1 0 0 1 load AEC counter RDAEC 0 0 1 0 0 0 1 0 read AEC counter RDSSPD 0 0 1 0 0 1 0 0 read SEARCH speed register LDINTMSK 0 0 0 1 0 0 1 0 load interrupt mask register LDDEQ3SET 0 0 0 1 0 0 0 0 load digital equalizer settings register LDCLKSET 0 0 0 1 0 0 0 1 load PLL clock extraction settings register
DATA STREAMS The digital equalizer module has one write only and one
read only data stream that are accessible via the L3 interface and they are shown in Table 8.
Table 8 Digital equalizer data streams.
DATA STREAM NAME READ/WRITE
FIR coefficients to buffer bank W FIR coefficients from active bank W
IGITAL EQUALIZER COMMANDS
D These are the commands that need to be sent to the digital
equalizer in order to access the indirectly accessible registers and the data streams.
EXPLANATION
Table 10 Filter control register.
BIT 7654321 0
Meaning −−−µCS Default 0 0 0 0 1 0 1 1
Note
1. µCS is a microcontroller controlled coefficient bank switch. This causes the filter coefficients to be activated at a time that is safe for the digital equalizer, i.e. at the end of the FIR program and that the complete value of coefficient number 9 has been received.
May 1994 11
(1)
SH1 SH0 Reserved
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 11 SH1 and SH2 (FIR output scaling).
SH
10
0 0 FIR mod 256 01
10
11
EFFECT ON FIR OUTPUT
FIR
mod 256
---------­2
FIR
mod 256
---------­4
FIR
mod 256
---------­8
Transfer of FIR coefficients
For the main data channels (tracks 0 to 7) there are 10 coefficients (taps) each of 8 bits, where all of the data channels make use of the same coefficients. The addresses for the main data coefficients 0 to 9 are 0to9
There are ten coefficients (taps) each of 8 bits for the aux channel (CHAUX). The addresses for the auxiliary coefficients 0 to 9 are 16 to 25
respectively.
dec
respectively.
dec
There are 2 banks of coefficients for both the aux and the main data channels, namely the ‘buffer’, and the ‘active’ banks. The microcontroller writes only to the ‘buffer’ banks, and reads only from the ‘active’ banks.
The microcontroller can poll the digital equalizer status bit BKSW to see when the switch occurs. BKSW starts life LOW, goes HIGH as a result of the bank switching and goes LOW as result of the complete value of a main data coefficient being received by the digital equalizer.
The microcontroller sets µCS HIGH before sending the new set of aux or main data coefficients, the digital equalizer resets it once the bank switch occurs.
The actual FIR coefficients that are used are a function of the tape head, read amplifier and type of tape (i.e. pre-recorded or own recorded) used, such information is outside of the scope of this data sheet.
Coefficient address counter (COEFCNT)
This 5 bit counter is used to point to the FIR coefficient to be transferred to or from the digital equalizer.
Table 12 Coefficient address counter.
BIT 7654321 0
Meaning −−−CC4 CC3 CC2 CC1 CC0 Default 0 0 0 0 0 0 0 0

Pin explanations and interfacing to other hardware

RESET This is an active HIGH input which resets the SAA3323
and brings it into its default mode, DPAP. This reset does not affect the contents of the FIR filter coefficients in the digital equalizer. This should be connected to the system reset, which can be driven by the microcontroller. The duration of the reset pulse should be at least 15 µs.
SLEEP This pin is an active HIGH input which puts the SAA3323
in a low power consumption SLEEP mode. This pin should be connected to the DCC SLEEP signal, which can be driven by the microcontroller. The CLK24 clock may be stopped and the VREFP and VREFN inputs brought to ground while the SAA3323 is in ‘sleep’ mode to further reduce power consumption. When recovering from sleep
mode, the SLEEP pin should be taken LOW and the SAA3323 reset.
CLK24 This is the 24.576 MHz clock input and should be
connected directly to the SAA2003 (pin CLK24).

Sub-band serial PASC interface connections

The timing for the sub-band serial PASC interface is given in Figs 5 to 7.
May 1994 12
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
SBCL(in) SBWS(in) SBDA(in)
SBCL(in) SBWS(in) SBDA(in)
SBCL(in)
SBWS(in)
SBDA(in)
bit number
2 x t 40 ns
MCLK
40 ns
1514131211109876543210
31302928272625242322212019181716
V
IH
V
OH
V
IH
V
OH
V
IH
V
OH
MGB381
Fig.5 Sub-band serial PASC interface timing; DRAR mode.
May 1994 13
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
SBCL(out) SBWS(out) SBDA(out) SBEF(out)
SBCL(out) SBWS(out) SBDA(out) SBEF(out)
SBMCLK(in)
SBCL(out)
SBWS(out)
SBDA(out)
SBDA(out)
60 ns
7 ns
7 ns
1514131211109876543210
31302928272625242322212019181716
bit number
V
IH
V
IL
V
OH
V
OL
V
OH
V
OL
V
OH
V
OL
V
OH
V
OL
MGB382
Fig.6 Sub-band serial PASC interface timing in play modes; DRPMAS = logic 1.
May 1994 14
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
SBCL(in) SBWS(in) SBDA(out) SBEF(out)
SBCL(in) SBWS(in) SBDA(out) SBEF(out)
SBCL(in)
SBWS(in)
SBDA(out)
SBDA(out)
2 x t 40 ns
MCLK
t (40 85) ns
MCLK
t (40 40) ns
MCLK
40 ns
1514131211109876543210
31302928272625242322212019181716
bit number
V
IH
V
IL
V
IH
V
IL
V
OH
V
OL
V
OH
V
OL
MGB383
Fig.7 Sub-band serial PASC interface timing in play modes; DRPMAS = logic 0.
SBMCLK This is the sub-band master clock input for the sub-band
serial PASC interface. The frequency of this signal is nominally 6.144 MHz. When the SAA3323 is used with SAA2003 this pin is tied to ground, and the TFE settings bit ‘DRPMAS’ set to logic 1.
SBDIR This output pin is the sub-band serial PASC bus direction
signal, it indicates the direction of transfer on the sub-band serial PASC bus. This pin connects directly to the SBDIR pin on the SAA2003. The transfer directions are shown in Table 13.
Table 13 PASC bus transfer directions.
SBDIR DIRECTION
1 SAA3323 to SAA2003 transfer (audio play) 0 SAA2003 to SAA3323 transfer (audio record)
SBCL This input/output pin is the bit clock line for the sub-band
serial PASC interface to the SAA2003. When used with SAA2003 this pin is input only. It has a nominal frequency of 768 kHz.
SBWS This input/output pin is the word select line for the
sub-band serial PASC interface to the SAA2003. When used with SAA2003 this pin is input only. It has a nominal frequency of 12 kHz.
SBDA This input/output pin is the serial data line for the sub-band
serial PASC interface to the SAA2003.
SBEF This active HIGH output pin is the error-per-byte line for
the sub-band serial PASC interface to the SAA2003.
May 1994 15
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
URDA This active HIGH output pin indicates that the main data
(audio), the SYSINFO and the AUXILIARY data are NOT usable, regardless of the state of the corresponding reliability flags. The state of this pin is reflected in the URDA bit of STATUS byte 0, which can be read by the microcontroller. This pin should be connected directly to
handbook, full pagewidth
SNUM
SBWS
L3REF
'FIRST BYTE"
SBDA
0
the URDA pin of the SAA2003. URDA goes active as a result of a reset, a mode change from mode DRAR to DPAP, or if the SAA3323 has had to re-synchronize with the incoming data from tape.
The position of the first sub-band serial PASC bytes in a tape frame is shown in Figs 8 and 9.
1
MGB384
byte 0
byte 1 byte 2
Fig.8 Position of first sub-band serial PASC bytes in a tape frame in DPAP/DPAR mode.
handbook, full pagewidth
SNUM
SBWS
L3REF
'FIRST BYTE'
SBDA
30
byte 0 byte 1 byte 2
Fig.9 Position of first sub-band serial PASC bytes in a tape frame in DRAR mode.
MGB385
May 1994 16
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

RAM connections

The SAA3323 has been designed to operate with DRAMs and SRAMs. Suitable DRAMs are 64K × 4-bit or 256K × 4-bit configurations operating in page mode, with an access time of 80 to 100 ns. The timing for read, write and refresh cycles for DRAMs is shown in Figs 10 to 12. The timing for SRAMs is shown in Figs 13 to 19.
For fast SRAMs: (these values are subject to verification during characterization in). The conditions (most critical at the required VDD) are shown in Table 14.
Table 14 Fast SRAM conditions.
CONDITION
Write pulse duration t Data set-up to rising Write cycle time T Read access time t
(1)
140 ns
W
WEN tsu≤ 72 ns
200 ns
cy
240 ns
ACC
TIME
Note
1. The SAA3323 should work in: RType = ‘01’; RTim = ‘00’ mode.
A9/
CAS
When SAA3323 is used with SRAM this output pin is Address line 9, and should be connected directly to the corresponding address pin on the SRAM. When SAA3323 is used with DRAM this output pin is the column address strobe (active LOW), it connects directly to the column address strobe pin of the DRAM.
A10/
RAS
When SAA3323 is used with SRAM this output pin is Address line 10, and should be connected to the corresponding address pin of the SRAM. When SAA3323 is used with DRAM this output pin is the row address strobe (active LOW), it connects directly to the row address strobe pin of the DRAM.
OEN This output pin is the output enable (active LOW) for the
RAM, it connects directly to the output enable pin of the RAM.
WEN This output pin is the write enable (active LOW) for the
RAM, it connects directly to the write enable pin of the RAM.
TO A8
A0 When SAA3323 is used with DRAM these output pins are
the multiplexed column and row address lines. When the 64K × 4-bit DRAM is used, pins A0 to A7 should be connected to the DRAM address input pins, and pin A8 should be left unconnected. When using the 256K × 4-bit DRAM the address pins A0 to A8 should be connected to the address input pins of the DRAM.
When SAA3323 is used with SRAM these are the lower address pins and should be connected directly to the SRAM address pins.
A11 This output pin is the an address pin for the SRAM and
when SRAM is used they should be connected directly to the address pins of the SRAM. When DRAM is used this pin should not be connected.
A10 AND A12 TO A16 These output pins are the upper address pins for the
SRAM and when SRAM is used they should be connected directly to the address pins of the SRAM. When DRAM is used or when the small SRAM is used all or some of these pins become available as Port expander outputs.
May 1994 17
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 15 Port expander outputs.
PIN NAME
PIN
QFP80 TQFP80
PORT EXPANDER
OUTPUT
CONDITIONS
A14/PINO1 46 44 PINO1 RType = 00 A13/PINO2 50 48 PINO2 RType = 00 A16/PINO3 47 45 PINO3 RType = 00 or RType = 01 A15/PINO4 48 46 PINO4 RType = 00 or RType = 01 A12/PINO5 45 43 PINO5 RType = 00
TO D3
D0 When SAA3323 is used with SRAM these I/O pins form the lower nibble of the data bus connection to the RAM, and
should be connected to the corresponding data I/O pins of the SRAM. When SAA3323 is used with DRAM these input/output pins are the data lines for the RAM, they should be connected directly to the DRAM data I/O pins.
D4
TO D7
These input/output pins are the upper nibble of the data bus for use with SRAM, and when SRAM is being used they should be connected directly to the corresponding SRAM I/O pins.
handbook, full pagewidth
WEN
OEN
A10/RAS
A9/CAS
A0 to A8
D0 to D3
t
RAS
t
RP
t
ASR
ROW ADDRESS COLUMN ADDRESS COLUMN ADDRESS COLUMN ADDRESS
t
RAH
t
RCD
t
RAC
t
ASC
t
CAS
t
t
CP
OFF
t
CAH
t
CAC
NIBBLE 0 DATA NIBBLE 1 DATA NIBBLE 2 DATA
Fig.10 DRAM read cycle timing.
t
OEZ
MGB386
May 1994 18
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
WEN
OEN
A10/RAS
A9/CAS
A0 to A8
D0 to D3
t
RP
t
ASR
ROW ADDRESS
t
WCS
t
RAH
t
RCD
t
ASC
t
DS
t
CAS
t
CAH
NIBBLE 0 DATA NIBBLE 2 DATA
t
DH
t
Fig.11 DRAM write cycle timing.
t
RAS
CP
COLUMN ADDRESSCOLUMN ADDRESS
NIBBLE 1 DATA
t
WCH
COLUMN ADDRESS
MGB387
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WEN
OEN
A10/RAS
A9/CAS
A0 to A8
D0 to D3
t
RP
t
ASR
ROW ADDRESS
t
RAH
Fig.12 DRAM refresh cycle timing.
May 1994 19
t
RAS
MGB388
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
ADDRESS ADDRESS t
AA
t
OLZ
READ
t
OH
DATADATA
READ
Fig.13 Fast SRAM read cycle timing.
t
OHZ
MGB389
t
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
WP
t
AW
t
WC
ADDRESS ADDRESS
t
DW1
t
WRITE
DH1
t
OLZ
t
AA
READ MODIFY WRITE
Fig.14 Fast SRAM write cycle timing; RTim = “00”.
May 1994 20
t
WP
t
DHO1
DATADATA DATA
t
OHZ
t
DH2
t
DW2
MGB390
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
t
WP
t
AW
t
WC
ADDRESS ADDRESS
t
DAH
t
DW1
WRITE
t
DDH
t
OLZ
t
AA
READ MODIFY WRITE
t
t
OHZ
DHO1
t
WP
t
DW2 DATADATADATA
t
DDH
t
DAH
Fig.15 Fast SRAM write cycle timing; RTim = “01”.
MGB391
t
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
WP
t
AW
t
WC
ADDRESS ADDRESS
t
t
DW1
WRITE
t
DH1
OLZ
t
OHZ
t
AA
READ MODIFY WRITE
Fig.16 Fast SRAM write cycle timing; RTim = “10”.
May 1994 21
t
WOA
t
WP
t
DHO1
t
DW2 DATADATADATA
t
DH2
MGB392
Philips Semiconductors Preliminary specification
,,
Drive processor for DCC systems SAA3323
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
MGB393
WRITE READ MODIFY WRITE
Fig.17 Fast SRAM write cycle timing; RTim = “11”.
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
ADDRESS ADDRESS
t
OLZ
t
AA
READ READ
t
OH
Fig.18 Slow SRAM read cycle timing.
May 1994 22
t
OHZ
DATADATA
MGB394
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
WEN
OEN
A0 to A16
D0 to D7
Table 16 Timing values for Figs 10 to 12.
SYMBOL VALUE (ns)
t
RP
t
RAS
t
RCD
t
CP
t
CAS
t
ASR
t
RAH
t
ASC
t
CAM
t
DS
t
DH
t
WCS
t
WCH
t
RAC
t
CAC
11051070301001002530100251003010016080
ADDRESSADDRESS
t DATADATA
WRITE
t
AW t
DW2
t
WP
WC
t
DH
t
t
AW t
WC
WP
t
DW1
WRITE
t
DH
Fig.19 Slow SRAM write cycle timing.
Table 17 Timing values for Figs 13 to 17.
SYMBOL VALUE (ns)
t
WP
t
AW
t
WC
t
DW
t
DM
t
AA
t
HC
Table 18 Timing values for Figs 18 and 19.
SYMBOL VALUE (ns)
t
WP
t
AW
t
WC
t
DW
t
DM
t
AA
MGB395
1401802007225240250
22526030014025280
May 1994 23
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

Read/write connections

TCLOCK This output pin is the 3.072 MHz clock output for the read
and write amplifiers, it should be connected directly to the WCLOCK pin of the write amplifier and to the RDCLK pin of the read amplifier.
RDMUX This input pin carries the time multiplexed analog tape
channel signals from the read amplifier.
V
AND V
ref(n)
ref(p)
These are the lower and upper voltage reference inputs for the ADC in the digital equalizer part of SAA3323.
BIAS This pin defines a bias current for the ADC. It should be
connected to the analog supply voltage V
via a 47 k
DDA
resistor.
RDSYNC This output line provides synchronization information for
the read Amplifier data transfers. The relationship between TCLOCK, RDSYNC and the channel information carried by the RDMUX line is given in Fig.20. This pin should be connected directly to the RDSYNC pin of the read amplifier. When the digital equalizer in SAA3323 is in search mode this pin will be HIGH ensuring that only the AUX channel is processed by the SAA3323.
WDATA This output pin is the multiplexed data and control line for
the write amplifier. Figure 21 shows the manner in which this information is multiplexed onto WDATA. The WDATA pin should be connected directly to the WDATA pin of the write amplifier.
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TCLOCK WDATA
TCLOCK RDMUX
RDSYNC
SYNC
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
AUX
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
AUX
Fig.20 RDMUX, RDSYNC and TCLOCK timing.
TCH0
TCH1
TCH2
TCH3
TCH4
TDAPLB
TAUPLB
TERAUX
TCH5
Fig.21 WDATA and TCLOCK timing.
TCH6
CH0
CH1
TCHAUX
CH2
CH3
TCH7
CH4
CH5
CH6
MGB397
AUX
CH7
MGB396
May 1994 24
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

Tape deck capstan control connections

S
PEED
This pin outputs a pulse width modulated signal that may be used for controlling the tape capstan of the deck.
Operation of the SPEED control signal
Table 19 gives the sources that determine the duty factor of the SPEED signal. Note that the 3-state SPEED output may be put into high-impedance state by programming the TFE setting by bit HiZSpd.
Table 19 SPEED signal duty factor.
SOURCE FOR
MODE µCSPD
DPAP 0 tape DPAP 1 µC DPAR 0 tape DPAR 1 µC DRAR 0 50% DRAR 1 µC
SPEED DUTY
FACTOR
(1)
(2)
(1)
(2)
(3)
(2)
Notes
1. “Tape” means that the duty factor has been calculated from the played back main data tape signal. When tape is the source for the duty factor of the SPEED signal, the type of regulation can be chosen with the TFE settings bits EnFReg and SeINBand.
2. “µC” means that the microcontroller programs the duty factor via the SPDDTY register.
3. “50%” means that the duty factor is fixed at 50%.
May 1994 25
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
MEA717
100 %
91 %
duty factor speed
50 %
9 %
0
+ 2 blocks
+ 10.6 ms
+ 1.65 blocks + 8.8 ms
0
– 1.65 blocks – 8.8 ms
– 2 blocks – 10.6 ms
Fig.22 SPEED regulation duty factor as a function of phase characteristic.
If EnFReg is programmed ‘LOW’ then there is phase regulation of the capstan speed. The period of the pulse width modulated SPEED signal is 41.66 µs. The SAA3323 performs a new calculation to determine the duty factor of SPEED once every 21.33 ms, giving a sampling rate of approximately 46.9 Hz. This calculation is basically a phase comparison between the incoming Main Data tape frame and an internally generated reference. The SPEED duty factor as a function of phase characteristic is shown in Fig.22. As shown the duty factor increases monotonously from approximately 9% when the incoming Main Data tape frame is 1.65 tape blocks (8.8 ms) too early up to 91% when it is 1.65 tape blocks (8.8 ms) too late. Outside of a ±2 tape blocks range the pulse width characteristic overflows and repeats itself forming a sawtooth pattern. The SAA3323 has an internal buffer of ±8.8 ms outside of which the phase information is invalid.
Table 20 POT and FOT deviation thresholds.
SeINBand
(DEVIATION FROM NOMINAL)
POT
0 ±6% ±9% 1 ±3% ±4.5%
If EnFReg is programmed ‘HIGH’ then the above description is over-ridden with frequency information. If the incoming main data bit rate deviation from the nominal 96000 bits/s rate is less than the Phase Only Threshold (POT) then the control is as described above in the phase control description. If the deviation is more than the Frequency Only Threshold (FOT) then the SPEED information is gated with the phase information resulting in the SPEED signal being continuously HIGH or LOW while the condition continues. If the deviation is between the POT and the FOT then the frequency information is gated with the Phase information for 50% of the time.
The deviation thresholds POT and FOT are programmable via the TFE settings bit SeINBand.
FOT
(DEVIATION FROM NOMINAL)
May 1994 26
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
If SLEEP is ‘HIGH’ then the state of the SPEED signal will be the state that it was in just before the SAA3323 went into sleep. Thus if SPEED was HIGH just before sleep it will stay HIGH during sleep. The same applies if it was LOW or if it was in ‘high-Z’ state. Note that a reset of the SAA3323 will take the SPEED signals out of ‘high-Z’ state.

Microcontroller connections

L3REF This active LOW output pin indicates the start of a time
segment, it goes LOW for 5.2 µs once every 42.66 ms approximately and can be used for generating interrups for the microcontroller. If a re-synchronization occurs then the time between the occurrences van vary. This pin can be connected directly to the interrupt input of the microcontroller.
L3CLK This input pin is the clock line for the microcontroller
interface.
L3DATA This input/output pin is the serial data line for the
microcontroller interface.
Table 21 Timing values for Fig.23.
SYMBOL TIME
t t t t t t t t t t t t t
W1 d1 h2 d2 d5 cL cH su1 h1 d3 h3 d4 d4
(2)
T+t
su (L3MODE)+th (L3MODE)
T+t
su (L3MODE)+th (L3CLK)
T+t
su (L3CLK)+th (L3MODE)
T+t
su (L3CLK)+td (L3DATA)
0 td5≤ 50 ns T+t
su (L3CLK)+th (L3CLK)
T+t
su (L3CLK)+th (L3CLK)
T+t
su (L3DATA)+th (L3CLK)
T+t
su (L3CLK)+th (L3DATA)
2 × T+t T+t 2 × T+t 3 × T+t
su (L3MODE)+td (L3DATA)
h (L3CLK)+td (L3DATA)
su (L3CLK)+td (L3DATA) su (L3CLK)+td (L3DATA)
(1)
; tw1≥ 200 ns ; td1≥ 200 ns ; th2≥ 200 ns
; td2≤ 250 ns
; tcL≥ 200 ns ; tcH≥ 200 ns
; t
200 ns
su1
; th1≤ 35 ns
; td3≤ 250 ns
; th3≥ 50 ns
; td4≤ 410 ns ; td4≤ 575 ns
Notes
1. T is the period of the master clock on the chip.
2. t
is the delay time between the last bit of a byte and
d4
first bit of the next byte, if no ‘halt’ is used.
L3MODE This input determines the type of transfer that is occurring
between the microcontroller and the SAA3323. If L3MODE is LOW then a device address can be sent by the microcontroller. If L3MODE is HIGH then a data transfer may be occurring.
L3INT This pin carries interrupts from the digital equalizer
module. It can also be programmed to reflect the state of the AENV, LABEL and VIRGIN signals.
May 1994 27
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
t
handbook, full pagewidth
L3MODE
L3CLK
L3DATA DRP to microcontroller
L3MODE
L3CLK
L3DATA microcontroller to DRP
t
h2
t
d5
t
t
cL
cH
t
d1
t
h1
0 1234 567
t
su1
W1
t
d1
t
d5
a.
t
h2
b.
L3MODE
t
t
cL
cH
L3CLK
L3DATA microcontroller to DRP
L3MODE
L3CLK
L3DATA DRP to microcontroller
a. Halt mode. b. Addressing mode. c. Data mode (transfer from microcontroller to SAA3323). d. Data mode (transfer from SAA3323 to microcontroller).
t
d1
t
d1
t
d3
t
h1
0 1234 567
t
su1
t
t
cL
cH
t
h3
0 1234 567
t
d2
t
d4
t
h2
c.
t
h2
t
d5
MGB398
d.
Fig.23 L3 interface timing and typical transfers (1).
May 1994 28
May 1994 29
L3MODE L3CLK L3DATA
L3MODE L3CLK L3DATA
L3MODE L3CLK L3DATA
L3MODE L3CLK L3DATA
L3MODE L3CLK L3DATA
TFE3 WCMD
LDSET0 TFE3 WDAT SET0 DATA TFE3 WCMD LDSET1 TFE3 WDAT SET1 DATA
a.
TFE3 RSTAT
STATUS0
DATA
STATUS1
DATA
STATUS2
DATA
STATUS3
DATA
b.
TFE3 WCMD LDBYCYNT TFE3 WDAT D8HEX TFE3 WCMD RDSYS TFE3 RDAT SYSINFO(8)
c.
TFE3 WCMD STATUS0
TFE3 RSTAT
LDBYCYNT TFE3 WDAT D8HEX TFE3 WCMD RDSYS TFE3 RSTAT SYSINFO(8) TFE3 RDAT
STATUS0
DATA
TFE3 RDAT SYSINFO(9)
d.
DATA
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYSINFO(9)
MGB399
a. Write settings bytes 0 and 1 to TFE3 part of SAA3323. b. Read all 4 status bytes from TFE part of SAA3323. c. Read 2 SYSINFO bytes starting at byte 8 (in high-speed transfer part of program). d. Read 2 SYSINFO bytes starting at byte 8 (in low-speed transfer part of program).
Fig.24 L3 interface timing and typical transfers (2).
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Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

SAA3323 test pins

TEST0
TO TEST3
These input pins are for test only, do not connect.
AZCHK This output pin indicates the occurrence of a tape channel
sync symbol on tape channels TCH0 and TCH7, the distance between the pulses for the TCH0 and TCH7 channels gives a measure of the azimuth error between the tape and head alignment. Figure 25 shows the typical timing for this signal.
ERCOSTAT This output pin can be connected to a symbol error rate
measurement system.

Port expansion pins

PINI This input pin is connected directly to the PINI bit in the
status byte 1, it can be read by the microcontroller, and may be used for any CMOS level compatible input signals.
PINO1 This output pin is connected directly to the PINO1 bit of the
TFE settings 0 register. The microcontroller can set or reset this pin.
PINO2
TO PINO5
Depending upon the type and the size of system RAM used, some or all of these Port expander output pins may be available, (please see Section “RAM connections” “A10 and A12 to A16” on interfacing to the RAM pins).

Supply pins

V
TO V
DD1
DD6
These are the supply pins, all of these pins must be connected. We recommend that each power supply pin pair (i.e. V
DD1
to V
SS1
, V
DD2
to V
, etc.) be decoupled
SS2
using a 22 nF capacitor as close as is physically possible to the pins of the SAA3323.
TO V
V
SS1
SS6
These are the supply ground pins, all of which must be connected.
Duration of the one tape block
handbook, full pagewidth
AZCHK
(8 periods MCLK)
1.3 µs
This is a measure of the azimuth error.
Nominal Inter Frame Gap (IFG) lasts 660 µs.
5.3 ms
MEA705
Fig.25 AZCHK timing.
May 1994 30
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
V
DD7
This is the supply pin for the output buffers to the data lines of the system RAM. It should always be connected externally. Decouple this pin with a 22 nF capacitor to the V
pin.
SS7
V
SS7
This is the ground supply pin for the output buffers of the
internally to all the supply ground pins (V however it should always be connected externally.

Auxiliary envelope detection

INTMASK INTMASK is a interrupt mask register. This register sets
the mode of operation for the interrupt interface, and is writable only.
SS1
to V
SS6
data lines of the system RAM. This pin is connected
Table 22 Interrupt mask register.
BIT 7 6 5 4 3 2 1 0
Meaning BP1 BP0 Vup
(1)
AEup
(2)
AEdn
(3)
Lup
(4)
Ldn
(5)
ECZ
Default 0 0 0 0 0 0 0 0
Notes
1. Vup rising edge of VIRGIN interrupt.
2. AEup rising edge of AUX envelope interrupt.
3. AEdn falling edge of AUX envelope interrupt.
4. Lup rising edge of LABEL interrupt.
5. Ldn falling edge of LABEL interrupt.
6. ECZ AUX envelope counter has just reached zero interrupt.
),
(6)
BP1 AND BP0 (BYPASS) If any of the bypass bits are HIGH then the interrupts are
not passed on to the microcontroller, instead the level of the corresponding signal is available an the interrupt pin.
Table 23 BP1 and BP0.
BP
EFFECT OF BYPASS
10
0 0 no bypass 0 1 LAB on L3INT pin; note 1 1 0 AENV on L3INT pin; note 2 1 1 VIR on L3INT pin; note 3
Notes
1. LAB = LABEL (HIGH if a LABEL condition is detected in the envelope of the AUX channel).
2. AENV = envelope of the AUX channel (1 bit binary).
3. VIR = VIRGIN (indicated by the total [continuous] absence of signal on the AUX channel).
The AUX envelope information is only valid when the digital equalizer is in search mode and when the tape speed is between the values of 3to48×nominal tape speed. The timing relationships between the AUX channel input signal, AENV, LAB and VIR are shown in Figs 26 to 28. The delays td1 and td2 are between 0.25 and 0.5t delays td3, td4, td5 and td6 are between 2 and 6t
(AUX envelope periods). The
AUX
AUX
(AUX envelope periods). When using the digital equalizer in search mode first
program the digital equalizer to search mode, then program the INTMASK register.
MASK If the BP1 and BP0 bits are LOW then the mask bits take
effect. Any combination of the mask bits may be HIGH, enabling the corresponding interrupts. The interrupt pin L3INT is active LOW when used for interrupts and active HIGH when used for bypassing. So if it is not in bypass mode and at least one of the interrupts has occurred it will go LOW and stays LOW until DEQ status byte 0 has been read. Extra interrupts that occur after the first interrupt and before the DEQ status byte 0 is read are seen in the status register. Extra interrupts that occur after the status byte
May 1994 31
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
has been read will generate a new interrupt. Interrupts that are already noted in the digital equalizer Status 0 are cleared by reading it.
Table 24 Digital equalizer STATUS0.
BIT 7654321 0
(1)
Meaning BKSW
TEST Vup
Notes
1. BKSW (filter bank switched) indicates that the last main data coefficients sent to the digital equalizer have been activated.
2. Vup indicates whether an interrupt caused by the rising edge of VIRGIN has occurred.
3. AEup indicates whether an interrupt caused by the rising edge of AUX envelope has occurred.
4. AEdn indicates whether an interrupt caused by the falling edge of AUX envelope has occurred
5. Lup indicates whether an interrupt caused by the rising edge of LABEL has occurred.
6. Ldn indicates whether an interrupt caused by the falling edge of LABEL has occurred.
7. ECZ indicates that the AUX envelope counter has reached zero.
(2)
AEup
(3)
AEdn
(4)
Lup
(5)
Ldn
(6)
ECZ
(7)
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RDMUX
AENV
AENV (internal)
LAB
t
AUX
t
d1
t
d2
Fig.26 AUX channel envelope to AENV delays.
t
AUX
t
d3
MGB400
t
d4
MGB401
Fig.27 AENV to LAB delays.
May 1994 32
Philips Semiconductors Preliminary specification

Drive processor for DCC systems SAA3323
t
handbook, full pagewidth
AENV (internal)
Vir
AUX
t
d5
t
d6
Fig.28 AENV to VIR delays.
Table 25 Digital equalizer STATUS1.
BIT 76543210
Meaning −−−−−VIR
Notes
1. VIR gives the state of the VIRGIN signal.
2. AENV represents the state of the AENV signal.
3. LAB gives the state of the LAB signal.
AUX envelope count (AECNT) register
This 16 bit register is used for loading the AUX envelope counter and for reading the state of that counter, it is therefore readable and writable as 2 bytes. Least Significant Byte first.
Table 26 AECNT register.
(1)
MGB402
AENV
(2)
LAB
(3)
AECNT LEAST SIGNIFICANT BYTE MOST SIGNIFICANT BYTE
BIT 7654321076543210
7
Meaning 2
262524232221202152142132122112
Search speed (SSPD) register
Search speed 2

SR
51.2

× normal speed×=
-----------

SV
Table 27 Search speed register.
BIT 76543210
Meaning SVF
(1)
SV4
(2)
SV3
(2)
SV2
(2)
SV1
(2)
Notes
1. SVF speed validation flag, if HIGH then the search speed measurement is invalid.
2. SV4 to SV0 search speed value.
3. SR1 and SR0 search speed range.
May 1994 33
SV0
(2)
SR1
1029
(3)
SR0
(3)
8
2
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
ANAEYE register
Table 28 ANAEYE register analog eye pattern selection register.
BIT 76543210
Meaning −−−AEN
(1)
ACHN3
Default 00000000
Notes
1. AEN analog eye pattern output enable. If this bit is LOW the Digital-to-Analog Converter (DAC) is switched off and the output is HIGH.
2. ACHN3 to ACHN0 select channel for analog eye output.
Table 29 ACHN3 to ACHN0 channel selections for analog eye output.
(2)
ACHN2
(2)
ACHN1
(2)
ACHN0
(2)
ACHN
CHANNEL ON ANAEYE
32 1 0
00 0 0 0 00 0 1 1 00 1 0 2 00 1 1 3 01 0 0 4 01 0 1 5 01 1 0 6 01 1 1 7 1 0 0 0 AUX
T1sel register
Table 30 T1SEL register CHTST1 pin selection register.
BIT 7654321 0
Meaning T1F2 T1F1 T1F0 T1C3 T1C2 T1C1 T1C0 Default 0 0 0 0 0 0 0 0
Table 31 T1C3 to T1C0 CHTST1 pin channel selections.
T1C
CHANNEL ON CHTST1
32 1 0
00 0 0 0 00 0 1 1 00 1 0 2 00 1 1 3 01 0 0 4 01 0 1 5 01 1 0 6 01 1 1 7 1 0 0 0 AUX
May 1994 34
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 32 T1F2 to T1F0 CHTST1 pin function selections.
T1F
21 0
0 0 0 off; logic 0 0 0 1 digital eye pattern 0 1 0 sliced data 0 1 1 bit clock 1 0 0 clock extraction frequency
The digital eye pattern is in 8 bits two’s complement notation, the sliced data and the bit clock give the current binary state of the corresponding signals, and the clock extraction frequency output is in 8 bits offset binary format. The timing diagrams for the digital eye pattern output and the clock extraction frequency output are shown in Fig.29.
FUNCTION OF CHTST1 PIN
T2sel register
Table 33 T2SEL register CHTST2 pin selection register.
BIT 7 6 5 4 3 2 1 0
Meaning T2F2 T2F1 T2F0 T2C3 T2C2 T2C1 T2C0 Default 0 0 0 0 0 0 0 0
Table 34 T2C3 to T2C0 CHTST2 pin channel selections.
T2C
321 0
000 0 0 000 1 1 001 0 2 001 1 3 010 0 4 010 1 5 011 0 6 011 1 7 1 0 0 0 AUX
CHANNEL ON
CHTST2
Table 35 T2F2 to T2F0 CHTST2 pin function selections.
T2F
FUNCTION OF CHTST2 PIN
210
0 0 0 off; logic 0 0 0 1 digital eye pattern 0 1 0 sliced data 0 1 1 bit clock 1 0 0 clock extraction frequency
May 1994 35
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
RDSYNC
TCLOCK
MCLK
CHTST
LSB MSB
01234567 0123
MGB403
Fig.29 CHTST1 and CHTST2 output timing.
Table 36 DEQSET digital equalizer settings.
BIT 76543210
Meaning −−−−−ACup
(1)
DM1 DM0
Default 00000000
Note
1. ACup is the AUX envelope counter direction is up. This setting caused the AUX envelope counter increment or to decrement by 1 every rising edge of the AUX envelope signal AENV.
DM1 and DM0
Table 37 DM1 and DM0 digital equalizer mode of
operation.
DM
10
0 0 normal 0 1 search 1 0 off 1 1 off
MODE OF OPERATION OF
DIGITAL EQUALIZER
(1)
(2) (3) (3)
Notes
1. In normal mode the main data channels and the AUX channel are processed (equalized), the AUX channel envelope information is not processed.
2. In search mode only the AUX channel is processed by the digital equalizer.
3. Off means that the digital equalizer is put to sleep (low power), this can be used for example in portable recording equipment. RDSYNC is HIGH if off mode. Also note that the other digital equalizer registers are not addressable while the digital equalizer is in off mode.
May 1994 36
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
CLKSET
Table 38 CLKSET clock extraction settings.
BIT 7654321 0
Meaning LEAE Default 1 0 0 1 1 0 1 0
Note
1. LEAE (leakage enable): this setting enables a leakage function in the PLL clock extraction loop filter. This gives a slightly improved performance with high SER tapes at the cost of a slight decrease in dynamic performance. For home (static) applications program this bit to logic 1 and for portable applications to logic 0.
(1)
FR1 FR0 GNOR GE1 GE0 RD1 RD0
Table 39 FR1 and FR0 clock extraction frequency range
control.
FR
10
EFFECT ON PLL FREQUENCY
LOOP
0 0 range ±8% 0 1 range ±16% 1 0 range ±22% 1 1 range ±28%
Note that in the (FR = 0) range the clock extraction stays in its normal range only, hence it does not enter the extended range.
Figure 30 shows the lock characteristic of the clock extraction PLL.
bit rate
deviation
(%)
30
(3)
20
(2)
handbook, full pagewidth
Table 40 GNOR gain in normal frequency range mode of
clock extraction.
GNOR EFFECT ON GAIN IN NORMAL RANGE
0 gain 2; for portable (mobile) applications 1 gain 1; for home (static) applications
Table 41 GE1 and GE0 gain in extended frequency
range mode of clock extraction.
GE
10
EFFECT ON PLL GAIN IN EXTENDED
RANGE
0 0 gain 2 0 1 gain 3 1 0 gain 4 1 1 gain 5; do not use
MGB404
28% frequency loop range limitation
22% frequency loop range limitation
16% frequency loop range limitation
10
(1) Gain 4. (2) Gain 3. (3) Gain 2.
0
2
10
3
10
Fig.30 Clock extraction PLL lock characteristic.
May 1994 37
(1)
8% frequency loop range limitation
4
f (Hz)
10
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
RD1 and RD0 return delay
This is the delay before returning to normal mode after being in ‘extended range mode’ (i.e. the number of consecutive channel clock bit periods where the bit clock frequency falls within the normal range before the clock extraction returns to normal frequency mode).
Table 42 RD1 and RD0 return delay.
RD
10
0064 0 1 128 1 0 256 1 1 512

SYSINFO and AUX data offsets in the SAA3323

AUX data consists of 4 blocks of 36 bytes, one block being transferred in each (n) time segment.
Table 43 Block offsets with respect to time segment.
MODE DESCRIPTION
DPAP SYSBLK = (SNUM + 3) MOD4; or read all 4 SYSINFO blocks when SNUM = logic 0; if AUX and
DRAR SYSBLK = SNUM; AUXBLK = (SNUM + 1) MOD4 DPAR SYSBLK = (SNUM + 3) MOD4; or read all 4 SYSINFO blocks when SNUM = logic 0
DELAY IN BITS TO RETURN TO
NORMAL MODE
main were recorded simultaneously then AUXBLK = (SNUM + 1) MOD4; else read and interpret 1 AUX block in each time segment.
The 128 bytes in each tape frame contain SYSINFO. The SYSINFO bytes can for convenience, be considered as being grouped into 4 SYSINFO blocks with: SYSBLK0 SI0 to SI31, SYSBLK1 SI31 to SI63, etc.
In modes DPAP and DRAR SYSINFO transfers may occur in two ways:
1. 4 blocks of 36 bytes, one block being transferred to the SAA3323 in each time segment.
2. 1 block of 128 bytes being transferred in time segment 1.
In mode DRAR SYSINFO must be transferred as 4 blocks of 32 bytes, one block in each segment.
Figures 31 to 34 show the offsets between the SYSINFO and AUX and the time segment counter, for the various modes of operation of the SAA3323.
May 1994 38
Philips Semiconductors Preliminary specification
,
,
Drive processor for DCC systems SAA3323
SNUM
AUX BLK
SYS BLK
SYS BLK
AUX, MAIN DATA INPUT FROM TAPE
01 23 0123012
3012
123012301230123
3012301230122301
*
0 1 2 3
0 1 2 3
0 1 2 3
01 23 01230123012
0 1 2 3
MLB413
Fig.31 SYSINFO and AUX block delays in DPAP mode; audio and AUX simultaneously recorded.
SNUM
AUX BLK
SYS BLK
SYS BLK
AUX, MAIN DATA INPUT FROM TAPE
01 23 0123012
DEPENDS ON PHASE OF AUX WRT MAIN DATA CHANNELS
3012301230122301
*
0 1 2 3
0 1 2 3
01 23 01230123012
Fig.32 SYSINFO and AUX block delays in DPAP mode; audio and AUX separately recorded.
May 1994 39
0 1 2 3
3012
0 1 2 3
MLB414
Philips Semiconductors Preliminary specification
,
,
,
,
,,,
,
Drive processor for DCC systems SAA3323
handbook, full pagewidth
SNUM
AUX BLK
SYS BLK
AUX, MAIN DATA OUTPUT TO TAPE
01230123012
3012
123012301230123
012301230123012
3012301230122301
Fig.33 SYSINFO and AUX block delays in DRAR mode.
MBG405
SNUM
AUX BLK
SYS BLK
SYS BLK
01 23 0123012
123012301230123
,,,
3012301230122301
*
0 1 2
,
3
MAIN DATA INPUT FROM TAPE
AUX OUTPUT TO TAPE
01 23 01230123012
012301230122301
1
,,,,
Fig.34 SYSINFO and AUX block delays in DPAR mode.
May 1994 40
0 1 2 3
,
0 1 2 3
3012
0 1
,
2 3
MLB416
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

Scratch pad RAM

The SAA3323 provides the microcontroller with a scratch pad RAM that the microcontroller can use for whatever it likes. The size of the scratch pad depends upon the size and type of RAM used with the SAA3323. The locations in
Table 44 Availability of RAM quarters for the scratch pad RAM.
RTYPE
TYPE OF RAM USED AVAILABLE RAM QUARTERS YZ
10
0 0 DRAM 64K × 400 0 0 DRAM 256K × 4 00, 01, 10 and 11 0 1 SRAM 32K × 8 fast 00 1 0 SRAM 128K × 8 fast 00, 01, 10 and 11 1 1 SRAM (2×) 32K × 8 slow 00 1 1 SRAM 128K × 8 slow 00 and 10
Note
1. In RAM quarter YZ = 00, the scratch pad is arranged as 6 pages, where each page consists of 7 columns × 64 rows. The pages are numbered 0to5, the columns 1to7 and the rows 0to63. This gives a total of (6 × 7 × 64) 2688 locations.
In each of the RAM quarters YZ = 01, 10 and 11 the scratch pad is arranged as 6 pages where each page consists of 8 columns× 448 rows. The pages are numbered 0to5, the columns 0to7 and the rows 0 to 447. This gives then a total of (6 × 8 × 448) 21504 locations per RAM quarter YZ.
the scratch pad RAM may be written and read in 8 bit or 12 bit units.
The RAM may be viewed as having up to 4 quarters, the availability of these quarters for the scratch pad RAM is given in Table 44.
(1)
During communication with the scratch pad RAM, the RAM quarter YZ is chosen when sending the RDDRAC, RDWDRAC, WRDRAC or WRWDRAC commands to the TFE module.
Use of the scratch pad RAM outside the specified ranges is not allowed and it may upset the operation of the SAA3323.
As with SYSINFO and AUX transfers can occur at high speed at all times except the second half of time segment 0, that is when the status bit SLOWTFR is HIGH. When SLOWTFR is HIGH the microcontroller must poll the status bit RFBT to investigate when a transfer can occur.
Two addressing modes are available for the scratch pad, namely random access and auto-increment. For random access mode the address of each location is sent by the microcontroller to the SAA3323 before each location transfer. For auto-increment mode the address of the first location is sent by the microcontroller before the first location transfer, auto-incrementing of the row occurs then for all transfers until the end of the column.
The 8 bit transfers are initiated by the WRDRAC and RDDRAC commands, these transfers are each 1 byte per memory location, therefore the byte counter will increment after each byte transfer.
The 12 bit transfers are initiated by the WRDRAC and RDDRAC commands, these transfers are each 2 bytes per memory location. The first byte contains the 4 Most Significant Bits (MSBs) of the memory location in its 4 Least Significant Bits (LSBs) positions. The other bit positions being ‘don’t care’. The second byte contains the 8 LSBs of the memory location. The byte counter is incremented after the transfer of the second byte.
The RACCNT and BYTCNT registers are used for addressing the scratch pad.
For RAM quarter YZ = 00 the mapping of the scratch pad RAM address onto the RACCNT and BYTCNT registers is shown in Table 45.
May 1994 41
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Table 45 Mapping of scratch pad RAM address for RAM quarter YZ = 00.
REGISTER RACCNT BYTCNT
BIT 654321 076543210
Value P2 P1 P0 C2 C1 C0 1 1 R6 R5 R4 R3 R2 R1 R0
For The other three quarters of the RAM the mapping of the scratch pad RAM address onto the RACCNT and BYTCNT registers is shown in Table 46.
Table 46 Mapping of scratch pad RAM address for RAM quarter YZ = 01, 10 and 11.
REGISTER RACCNT BYTCNT
BIT 654321 076543210
Value P2 P1 P0 C2 C1 C0 R8 R7 R6 R5 R4 R3 R2 R1 R0

Mode changes

The possible mode changes for the TFE are shown in Table 47.
Table 47 Mode changes.
CURRENT
MODE
DPAP yes yes DRAR yes no DPAR yes no
T
IMING FOR SAA3323 MODE CHANGES
DPAP DRAR DPAR
NEW MODE
Mode change DPAP to DRAR
This mode change occurs at the end of the time segment in which the TFE module receives the new settings. Writing of the first Main and AUX data to tape starts at the start of the time segment 1 which occurs 2 ‘end of time segment 3’ s after the mode change. The delay to writing to tape is approximately 222 ms, as shown in Fig.35.
If ‘seamless appending’ is required the new settings should be sent to the TFE module during time segment 2.
Mode change DPAP to DPAR
This mode change occurs at the first end of time segment 2 after the TFE module receives the new settings. Output of AUX to tape begins at the start of the following time segment 1, (i.e. approximately85.3 ms after the mode change), as shown in Fig.36.
Mode change DRAR to DPAP
This mode change occurs at the first end of time segment 0 after the TFE module receives the new setting. Writing of Main and AUX data stops immediately after the mode change.The time segment jumps back to logic 0, URDA goes HIGH and stays HIGH for 5 time segments (i.e. approximately 213.3 ms) after which it goes LOW, as shown in Fig.37.
Mode change DPAR to DPAP
This mode change occurs at the first end of time segment 0 after the TFE module receives the new setting. The writing of AUX data to tape stops immediately after the mode change. The first AUX read from tape can be expected during the following time segment 0 or 1 (i.e. approximately 128 to 170.67 ms after the mode change), as shown in Fig.38.
Mode change DPAP to search
This mode change occurs almost instantaneously, program the digital equalizer module in SAA3323 to go to search mode, then program the interrupt mask register to select the required type of interrupt.
Mode change search to DPAP
This mode change occurs almost instantaneously, program the interrupt mask register to disable interrupts program the digital equalizer module of SAA3323 to go to normal mode. A re-synchronization will most likely occur when as result of the data being read from tape, thus causing URDA to go HIGH.
May 1994 42
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
ndbook, halfpage
NEW MODE
AUXILIARY, MAIN
TAPE OUT
handbook, halfpage
SNUM
MODE
NEW MODE
URDA
SNUM
MODE
01 230123012
DPAP DRAR
DRAR
222 ms
Fig.35 Mode change to DRAR.
1230 12301
DRAR
DPAP
0
DPAP
213.3 ms
MEA707 - 2
MEA709 - 1
handbook, halfpage
SNUM
MODE
NEW MODE
AUXILIARY
TAPE OUT
Fig.36 Mode change to DPAR.
handbook, halfpage
NEW MODE
AUXILIARY
TAPE OUT
AUXILIARY
MICROCONTROLLER
1230123012
SNUM
MODE
DPAP
DPAR
85.3 ms
DPAR
1230123012
DPAR DPAP
DPAP
128 ms
TO
170.66 ms
MEA708 - 2
MEA710 - 2
Fig.37 Mode change from DRAR.
May 1994 43
Fig.38 Mode change from DPAR.
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DD
V
I
I
I
V
O
I
O
I
DD
I
SS
P
tot
T
stg
T
amb
V
es1
V
es2
supply voltage 2.7 3.6 V input voltage note 1 0.5 VDD + 0.5 V input current 10 +10 mA output voltage tbf tbf V output current 20 +20 mA supply current 100 mA supply current 100 mA total power dissipation 500 mW storage temperature 55 +150 °C operating ambient temperature 40 +85 °C electrostatic handling note 2 2000 +2000 V electrostatic handling note 3 200 +200 V
Notes
1. The input voltage must not exceed maximum supply voltage unless otherwise specified.
2. Equivalent to discharging a 100 pF capacitor through a 1.5 k series resistor.
3. Equivalent to discharging a 200 pF capacitor through a 0 series resistor.

DC CHARACTERISTICS

= 2.7 to 3.6 V; T
V
DD
= 40 to +85 °C; unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Supply
V
DD
I
DD
supply voltage 2.7 tbf 3.6 V supply current digital plus analog;
28.1 mA
see Fig.39 inputs with internal
pull-down to V
SS
; all other inputs to V or V
DD
−−100 µA
SS
Inputs CLK24, L3CLK, L3MODE, PINI, SLEEP and SBMCLK
V
IL
V
IH
I
I
LOW level input voltage −−0.3V HIGH level input voltage 0.7V input current VI=0VtoVDD;
T
=25°C
amb
10 +10 µA
DD
−−V
DD
V
Inputs TEST0, TEST1 and TEST2
V
IL
V
IH
I
I
LOW level input voltage −−0.3V HIGH level input voltage 0.7V input current VI=VDD; T
=25°C25 400 µA
amb
DD
−−V
DD
V
May 1994 44
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Input RESET
V
tLH
V
tHL
V
hys
positive-going threshold −−0.8V negative-going threshold 0.2V hysteresis (V
tLH
to V
) 0.3V
tHL
Outputs AZCHK, CHTST1, CHTST2, ERCOST AT, L3INT, TCLOCK and WDATA
V
OH
V
OL
Outputs A0 to A8, A9/
V
OH
V
OL
HIGH level output voltage IO= 1 mA VDD− 0.5 −−V LOW level output voltage IO= 1mA −−0.4 V
CAS, A10/RAS, OEN and WEN
HIGH level output voltage IO= 2 mA VDD− 0.5 −−V LOW level output voltage IO= 2mA −−0.4 V
Outputs SPEED and PINO2
V
OH
V
OL
I
OZ
HIGH level output voltage IO= 1 mA VDD− 0.5 −−V LOW level output voltage IO= 1mA −−0.4 V 3-state leakage current VI=0VtoVDD;
T
=25°C
amb
Inputs/outputs SBCL, SBDA and SBWS
V
OH
V
OL
V
IL
V
IH
I
OZ
HIGH level output voltage IO= 1 mA VDD− 0.5 −−V LOW level output voltage IO= 1mA −−0.4 V LOW level input voltage outputs in 3-state −−0.3V HIGH level input voltage outputs in 3-state 0.7V 3-state leakage current VI= 0 V to VDD;
T
=25°C
amb
Inputs/outputs A11 to A16 and L3DATA
V
OH
V
OL
V
IL
V
IH
I
OZ
HIGH level output voltage IO= 2 mA VDD− 0.5 −−V LOW level output voltage IO= 2mA −−0.4 V LOW level input voltage outputs in 3-state −−0.3V HIGH level input voltage outputs in 3-state 0.7V 3-state leakage current VI= 0 V to VDD;
T
=25°C
amb
Inputs/outputs D0 to D7
V
OH
V
OL
V
IL
V
IH
I
OZ
HIGH level output voltage IO= 4 mA VDD− 0.5 −−V LOW level output voltage IO= 4mA −−0.4 V LOW level input voltage outputs in 3-state −−0.8 V HIGH level input voltage outputs in 3-state 2 −−V 3-state leakage current VI=0VtoVDD;
T
=25°C
amb
DD
DD
−−V
DD
V
L3REF, MCLK, PINO3, RDSYNC, SBDIR, SBEF, URDA,
10 +10 µA
DD
DD
−−V
10 +10 µA
DD
DD
−−V
10 +10 µA
10 +10 µA
V
V
V
May 1994 45
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
Average current consumption
MLB778
V (V)
DD
I
DD
(mA)
60
max
40
typ
min
20
0
2.0
2.5
3.0 3.5 4.0
Fig.39 Average current consumption.

AC CHARACTERISTICS

= 2.7 to 3.6 V; T
V
DD
= 40 to +85 °C; CL= 10 pF on all outputs; see Fig.40; unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Clock inputs
C
I
CLK24 f
CLK24
t
24L
t
24H
SBMCLK f
SBMCLK
t
SCL
t
SCH
input capacitance −−10 pF
clock frequency 24 24.576 25 MHz pulse width LOW 12 −−ns pulse width HIGH 12 −−ns
clock frequency 6.144 12.5 MHz pulse width LOW 30 −−ns pulse width HIGH 30 −−ns
May 1994 46
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Clock output MCLK
C
L
t
d
f
MCLK
t
MCL
t
MCH
t
pd
Inputs
C
I
L3CLK, L3MODE AND RESET t
su
t
h
PINI t
su
t
h
Outputs
C
L
A0 TO A8 t
pd
A9/CAS, A10/RAS AND OEN t
pd
t
d
WEN t
pd
t
d
AZCHK, CHTST1, CHTST2, L3INT, PINO3, RDSYNC, SBEF AND WDATA t
pd
ERCOSTAT, L3REF, SBDIR, SPEED, PINO2, URDA AND TCLOK t
pd
load capacitance −−20 pF delay time from SLEEP HIGH to
20 ns
SLEEP active clock frequency 6.144 6.25 MHz MCLK pulse width LOW 50 −−ns MCLK pulse width HIGH 50 −−ns propagation delay time from rising
−−65 ns
edge of CLK24
input capacitance −−10 pF
set-up time to rising edge of MCLK 35 −−ns hold time from rising edge of MCLK 0 −−ns
set-up time to rising edge of MCLK 60 −−ns hold time from rising edge of MCLK 0 −−ns
load capacitance −−20 pF
propagation delay time from falling
−−50 ns
edge of CLK24
propagation delay time from falling
−−50 ns
edge of CLK24 delay time from SLEEP HIGH to
20 ns
SLEEP active
propagation delay time
from falling edge of CLK24 −−50 ns from falling edge of
edge of CLK24
delay time from SLEEP HIGH to
WEN to rising
long write pulse mode
−−50 ns
20 ns
SLEEP active
propagation delay time from rising
−−45 ns
edge of MCLK
propagation delay time from rising
−−55 ns
edge of MCLK
May 1994 47
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Inputs/outputs
C
I
C
L
A11 TO A16 t
d
t
pd
TO D3
D0 t
d
t
su
t
h
t
pd
D4
TO D7
t
d
t
su
t
h
t
pd
L3DATA t
d
t
su
t
h
t
pd
SBCL AND SBWS t
d
t
su
t
h
t
pd
input capacitance −−10 pF load capacitance −−20 pF
delay time from SLEEP HIGH to
25 ns
SLEEP active propagation delay time from falling
−−55 ns
edge of CLK24
delay time from SLEEP HIGH to
20 ns
SLEEP active set-up time to falling edge of CLK24 5 −−ns hold time from falling edge of CLK24 15 −−ns propagation delay time
from falling edge of CLK24 −−50 ns from rising edge of CLK24 early write mode −−50 ns
delay time from SLEEP HIGH to
25 ns
SLEEP active set-up time to falling edge of CLK24 5 −−ns hold time from falling edge of CLK24 15 −−ns propagation delay time
from falling edge of CLK24 −−50 ns from rising edge of CLK24 early write mode −−50 ns
delay time from SLEEP HIGH to
25 ns
SLEEP active set-up time to rising edge of MCLK 35 −−ns hold time from rising edge of MCLK 0 −−ns propagation delay time
from rising edge of MCLK −−50 ns from L3MODE −−45 ns
delay time from SLEEP HIGH to
25 ns
SLEEP active set-up time to rising edge of MCLK 40 −−ns hold time from rising edge of MCLK 0 −−ns propagation delay time
from rising edge of SBMCLK −−60 ns from rising edge of MCLK
−−55 ns
(3-state control)
May 1994 48
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
SBDA t
d
delay time from SLEEP HIGH to SLEEP active
t
su
t
h
t
pd
set-up time to rising edge of MCLK 35 −−ns hold time from rising edge of MCLK 0 −−ns propagation delay time from rising
edge of MCLK
handbook, full pagewidth
CLK24
IN1
OUT1
MCLK
IN2
OUT2
SBMCLK
OUT3
t
su1
t
h1
t
d1
t
MCL
t
SCL
t
d2
t
pd
t
su2
t
d5
25 ns
−−55 ns
t
24H
t
24L
t
d4
t
t
SCH
MCH
t
d
t
h2
MGB407
V
IH
V
IL
V
IH
V
IL
V
OH
V
OL
V
OH
V
OL
V
IH
V
IL
V
OH
V
OL
V
IH
V
IL
V
OH
V
OL
Fig.40 Timing for AC characteristics.
May 1994 49
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

ADC CHARACTERISTICS

V
= 2.7 to 3.6 V; T
DD
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
AC RDMUX ADC resolution 8 bits
V
ref(p)
V
ref(n)
V
ref
Z
i
C
I
I
I
positive reference voltage −−V negative reference voltage 0 −−V V
ref(p)
input impedance V
input capacitance (RDMUX) −−15 pF
input current −−90 µA DNL differential non-linearity −−±0.99 LSB S/(THD+N) signal-to-total harmonic
distortion plus noise ratio
Timing
T
cy
t
d1
cycle time of CLK24 40 −−ns
TCLOCK delay time from
rising edge of CLK24 t
su
RDMUX set-up time to falling
edge of CLK24 t
h
RDMUX hold time from falling
edge of CLK24
= 40 to +85 °C; CL= 10 pF on TCLOCK output; see Fig.41; unless otherwise specified.
amb
0.5 V
DD
to V
ref(n)
to V
V
ref(p) ref(n)
to V
ref(n) SS
20 dB (FS);
2.0 −−V 700 1200 1500
650 −Ω
24 −−dB
100 to 500 kHz
CL=10pF −−80 ns
Z
< 150 60 −−ns
source
40 −−ns
t
handbook, full pagewidth
CLK24
TCLOCK
CLK ADC
RDMUX
TESTBUS
d1
t
d2
t
d3
t
h
t
d4
t
su
SAMPLE(1)
Fig.41 ADC timing.
May 1994 50
V
IH
V
T
cy
DATA SAMPLE(1-2)DATA SAMPLE(1-3)
MGB408
IL
V
OH
V
OL
V
IH
V
IL
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

DAC CHARACTERISTICS

V
= 2.7 to 3.6 V; T
DD
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
DIGEYE/ANAEYE resolution 6 bits
V
o
ANAEYE output voltage ZL>1MΩ−(VDD− 1.1)
= 40 to +85 °C; unless otherwise specified.
amb
to V
V
DD
May 1994 51
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

PACKAGE OUTLINES

handbook, full pagewidth
seating plane
80 61
1
pin 1 index
20
21
0.1 S
14.3
13.7
S
B
1.45
(4x)
60
1.05
0.5
14.3
12.1
B
13.7
11.9
0.15 M
0.25
0.13
41
40
0.25
0.5 0.15 M A
0.13
12.1
11.9
1.5
1.3
0.16
0.04
MBB947
Dimensions in mm.
Fig.42 Plastic thin quad flatpack; 80 leads; body 12 × 12 × 1.4 mm (SOT315-1; TQFP80).
May 1994 52
detail X
1.45
1.05
A
(4x)
0.7
0.3
0.70
0.58
X
0.18
0.12
0 to 4
1.7
1.5
o
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
handbook, full pagewidth
seating plane
80 65
1
pin 1 index
24
25 40
0.10
S
18.2
17.6
S
B
64
1.0 (4x)
0.6
0.8
20.1
19.9
24.2
23.6
B
0.20 M
0.45
0.30
41
Dimensions in mm.
0.8
0.45
0.30
0.20 M A
14.1
13.9
2.90
2.65
Fig.43 Plastic quad flatpack; 80 leads (lead length 1.95 mm); body 14 × 20 × 2.7 mm; high stand-off
height (SOT318-2; QFP80).
May 1994 53
0.25
0.05
1.2
0.8 A
(4x)
detail X
1.0
0.6
X
1.4
1.2
0.25
0.14
0 to 7
MSA394 - 1
3.2
2.7
o
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323
SOLDERING Plastic quad flatpacks
YWAVE
B During placement and before soldering, the component
must be fixed with a droplet of adhesive. After curing the adhesive, the component can be soldered. The adhesive can be applied by screen printing, pin transfer or syringe dispensing.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder bath is 10 s, if allowed to cool to less than 150 °C within 6 s. Typical dwell time is 4 s at 250 °C.
A modified wave soldering technique is recommended using two solder waves (dual-wave), in which a turbulent wave with high upward pressure is followed by a smooth laminar wave. Using a mildly-activated flux eliminates the need for removal of corrosive residues in most applications.
B
Y SOLDER PASTE REFLOW
Reflow soldering requires the solder paste (a suspension of fine solder particles, flux and binding agent) to be
applied to the substrate by screen printing, stencilling or pressure-syringe dispensing before device placement.
Several techniques exist for reflowing; for example, thermal conduction by heated belt, infrared, and vapour-phase reflow. Dwell times vary between 50 and 300 s according to method. Typical reflow temperatures range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 min at 45 °C.
EPAIRING SOLDERED JOINTS (BY HAND-HELD SOLDERING
R
IRON OR PULSE
-HEATED SOLDER TOOL)
Fix the component by first soldering two, diagonally opposite, end pins. Apply the heating tool to the flat part of the pin only. Contact time must be limited to 10 s at up to 300 °C. When using proper tools, all other pins can be soldered in one operation within 2 to 5 s at between 270 and 320 °C. (Pulse-heated soldering is not recommended for SO packages.)
For pulse-heated solder tool (resistance) soldering of VSO packages, solder is applied to the substrate by dipping or by an extra thick tin/lead plating before package placement.
May 1994 54
Philips Semiconductors Preliminary specification
Drive processor for DCC systems SAA3323

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.

LIFE SUPPORT APPLICATIONS

These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
The Digital Compact Cassette logo is a registered trade mark of Philips Electronics N.V.
May 1994 55
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SCD31 © Philips Electronics N.V. 1994
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
Printed in The Netherlands
513061/1500/01/pp56 Date of release: May 1994 Document order number: 9397 732 30011
Philips Semiconductors
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