Datasheets aod606 Datasheet

Page 1
A
A
A
A
AOD606
-
p
Complementary Enhancement Mode Field Effect Transistor
General Description
The AOD606 uses advanced trench technology MOSFETs to provide excellent
and low gate charge. The
R
DS(ON)
complementary MOSFETs may be used in H-bridge, Inverters and other applications.
free (meets ROHS & Sony 259 specifications). AOD606L is a Green Product ordering option. AOD606 and AOD606L are electrically identical.
Standard product AOD606 is Pb
TO-252-4L D-PAK
D1/D2
Top View Drain Connected to Tab
Features
n-channel p-channel
(V) = 40V -40V
V
DS
I
= 8A (VGS=10V) -8A (VGS = -10V)
D
R
DS(ON) RDS(ON)
< 33 m (VGS=10V) < 50 m (VGS = -10V) < 47 m (V
=4.5V) < 70 m (VGS = -4.5V)
GS
D1/D2
G1
S1
n-channel
S1 G1 S2 G2
Absolute Maximum Ratings T Parameter Max n-channel
Drain-Source Voltage
Continuous Drain
Current
G
Pulsed Drain Current
Avalanche Current
TC=25°C
TC=100°C
C
C
Repetitive avalanche energy L=0.1mH
TC=25°C
Power Dissipation
B
=100°C
T
C
TA=25°C
Power Dissipation
A
TA=70°C
Junction and Storage Temperature Range
=25°C unless otherwise noted
A
Symbol Max p-channel Units
V
DS
V
GS
I
D
I
DM
I
C
AR
E
AR
P
D
P
DSM
T
, T
STG
40
±20Gate-Source Voltage
8
8
30
8
20
20
10
1.3
-55 to 175
Thermal Characteristics: n-channel and p-channel Parameter
Maximum Junction-to-Ambient Maximum Junction-to-Ambient
Maximum Junction-to-Case
B
Maximum Junction-to-Ambient Maximum Junction-to-Ambient
Maximum Junction-to-Case
B
t 10s Steady-State Steady-State
t 10s Steady-State Steady-State
Symbol Device Typ Max
R
θJA
R
θJC
R
θJA
R
θJC
n-ch 17.4 30 °C/W n-ch 50 60 °C/W n-ch 4 7.5 °C/W
p-ch 16.7 25 °C/W p-ch 40 50 °C/W p-ch 2.5 3 °C/W
G2
-channel
S2
-40
±20
8
8
-30
-8
30
50
25
2.52
1.6
-55 to 175
V
V
A
A
mJ
W
W
°C
Alpha & Omega Semiconductor, Ltd.
Page 2
AOD606
N-Channel MOSFET Electrical Characteristics (T
Symbol Min Typ Max Units
Parameter Conditions
=25°C unless otherwise noted)
J
STATIC PARAMETERS
BV
I
DSS
I
GSS
V
GS(th)
I
D(ON)
R
DS(ON)
g
FS
V
SD
I
S
DSS
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Body leakage current
Gate Threshold Voltage V
On state drain current
Static Drain-Source On-Resistance
Forward Transconductance
Diode Forward Voltage
Maximum Body-Diode Continuous Current
I
=10mA, VGS=0V
D
=32V, VGS=0V
V
DS
V
=0V, VGS=±20V
DS
DS=VGS, ID
V
=10V, VDS=5V
GS
=10V, ID=8A
V
GS
=4.5V, ID=6A
V
GS
V
=5V, ID=8A
DS
I
=1A, VGS=0V
S
=250µA
T
J
=125°C
T
J
=55°C
40 V
1
µA
5
100 nA
1 2.3 3 V
30 A
27 33
39 52
37 47
m
m
25 S
0.76 1 V
8A
DYNAMIC PARAMETERS
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate resistance V
V
=0V, VDS=20V, f=1MHz
GS
=0V, VDS=0V, f=1MHz
GS
404 pF
95 pF
37 pF
2.7
SWITCHING PARAMETERS
(10V)
Q
g
Q
(4.5V)
g
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t
f
t
rr
Q
rr
A: The value of R
Power dissipation P the user's specific board design, and the maximum temperature of 175°C may be used if the PCB allows it. B. The power dissipation P dissipation limit for cases where additional heatsinking is used. C: Repetitive rating, pulse width limited by junction temperature T
D. The R
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of T G. The maximum current rating is limited by bond-wires. H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T curve provides a single pulse rating. Rev 0: January 2006
Total Gate Charge
Total Gate Charge
Gate Source Charge
Gate Drain Charge
Turn-On DelayTime
Turn-On Rise Time
Turn-Off DelayTime
Turn-Off Fall Time
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T
θJA
is based on R
DSM
is based on T
D
is the sum of the thermal impedence from junction to case R
θJA
and the maximum allowed junction temperature of 150°C. The value in any given application depends on
θJA
=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper
J(MAX)
=175°C.
J(MAX)
V
=10V, VDS=20V, ID=8A
GS
=10V, VDS=20V, RL=2.5,
V
GS
=3
R
GEN
=8A, dI/dt=100A/µs
I
F
=8A, dI/dt=100A/µs
I
F
=175°C.
J(MAX)
and case to ambient.
θJC
9.2 nC
4.5 nC
1.6 nC
2.6 nC
3.5 ns
6ns
13.2 ns
3.5 ns
22.9
ns
18.3 nC
=25°C. The
A
=25°C. The SOA
A
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Alpha & Omega Semiconductor, Ltd.
Page 3
AOD606
S
N-Channel MOSFET TYPICAL ELECTRICAL AND THERMAL CHARACTERISTIC
30
(A)
D
I
10V
25
20
15
5V
4.5V
4V
10
VGS=3.5V
5
0
012345
(Volts)
V
DS
Fig 1: On-Region Characteristics
50
45
VGS=4.5V
)
40
(m
35
DS(ON)
R
30
25
VGS=10V
20
0 4 8 12 16 20
I
(A)
D
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
20
VDS=5V
15
10
(A)
D
I
125°C
5
25°C
0
2 2.5 3 3.5 4 4.5
V
(Volts)
GS
Figure 2: Transfer Characteristics
1.8
VGS=10V
=8A
1.6
I
D
1.4
VGS=4.5V
=6A
I
1.2
1
Normalized On-Resistance
D
0.8
0 25 50 75 100 125 150 175
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
100
90
80
)
(m
DS(ON)
R
70
60
50
40
30
25°C
125°C
20
10
246810
V
(Volts)
GS
Figure 5: On-Resistance vs. Gate-Source Voltage
Alpha & Omega Semiconductor, Ltd.
ID=8A
1.0E+01
1.0E+00
125°C
1.0E-01
(A)
1.0E-02
S
I
1.0E-03
25°C
1.0E-04
1.0E-05
0.0 0.2 0.4 0.6 0.8 1.0 1.2
(Volts)
V
SD
Figure 6: Body-Diode Characteristics
Page 4
AOD606
S
o
N-Channel MOSFET TYPICAL ELECTRICAL AND THERMAL CHARACTERISTIC
10
VDS=20V
=8A
I
8
D
6
(Volts)
GS
4
V
2
0
0246810
Q
(nC)
g
Figure 7: Gate-Charge Characteristics
100.0 T
=175°C, TA=25°C
J(Max)
10µs
R
DS(ON)
limited
10.0
(Amps)
D
I
1.0
100µs
1ms
10ms
DC
700
600
C
500
iss
400
300
C
Capacitance (pF)
200
oss
C
rss
100
0
0 5 10 15 20 25 30 35 40
V
DS
(Volts)
Figure 8: Capacitance Characteristics
200
T
160
T
J(Max)
=25°C
A
=175°C
120
80
Power (W)
40
0.1
0.1 1 10 100
(Volts)
V
Figure 9: Maximum Forward Biased Safe
DS
Operating Area (Note F)
10
D=Ton/T
T
J,PK=TC+PDM.ZθJC.RθJC
R
=7.5°C/W
θJC
In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
0
0.0001 0.001 0.01 0.1 1 10
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-to-
Case (Note F)
1
0.1
Normalized Transient
Thermal Resistance
JC
θ
Z
Single Pulse
P
T
n
T
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Alpha & Omega Semiconductor, Ltd.
Page 5
AOD606
S
o
N-Channel MOSFET TYPICAL ELECTRICAL AND THERMAL CHARACTERISTIC
10
8
6
(A), Peak Avalanche Current I
4
t
A
TA=25°C
2
D
IL
=
D
VBV
DD
0
0.00001 0.0001 0.001
Time in avalanche, t
(s)
A
Figure 12: Single Pulse Avalanche capability
10
8
(A)
D
6
4
Current rating I
2
0
0 25 50 75 100 125 150 175
T
(°C)
CASE
Figure 14: Current De-rating (Note B)
25
20
15
10
Power Dissipation (W)
5
0
0 25 50 75 100 125 150 175
(°C)
T
CASE
Figure 13: Power De-rating (Note B)
50
TA=25°C
40
30
20
Power (W)
10
0
0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 15: Single Pulse Power Rating Junction-to-
Ambient (Note H)
10
1
D=Ton/T
T
J,PK=TA+PDM.ZθJA.RθJA
R
=60°C/W
θJA
0.1
Normalized Transient
Thermal Resistance
0.01
JA
θ
Z
Single Pulse
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)
Alpha & Omega Semiconductor, Ltd.
In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
P
T
Pulse Width (s)
n
T
Page 6
AOD606
j
P-Channel MOSFET Electrical Characteristics (T
Symbol Min Typ Max Units
Parameter Conditions
=25°C unless otherwise noted)
J
STATIC PARAMETERS
BV
I
DSS
I
GSS
V
GS(th)
I
D(ON)
R
DS(ON)
g
FS
V
SD
I
S
DSS
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Body leakage current
Gate Threshold Voltage V
On state drain current
Static Drain-Source On-Resistance
Forward Transconductance
Diode Forward Voltage Maximum Body-Diode Continuous Current
=-250µA, VGS=0V
I
D
V
=-32V, VGS=0V
DS
V
=0V, VGS=±20V
DS
DS=VGS ID
V
GS
V
GS
V
GS
V
DS
I
=-1A,VGS=0V
S
=-250µA
=-10V, VDS=-5V
=-10V, ID=-8A
=-4.5V, ID=-4A
=-5V, ID=-8A
T
J
=125°C
T
J
=55°C
-40 V
-1
-5
µA
±100 nA
-1 -1.8 -3 V
-30 A
35 50
62
55 70
m
m
16 S
-0.75 -1 V
-8 A
DYNAMIC PARAMETERS
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate resistance V
V
=0V, VDS=-20V, f=1MHz
GS
=0V, VDS=0V, f=1MHz
GS
657 pF
143 pF
63 pF
6.5
SWITCHING PARAMETERS
(10V)
Q
g
(4.5V)
Q
g
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t
f
t
rr
Q
rr
A: The value of R qJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The Power dissipation PDSM is based on R qJA and the maximum allowed specific board design, and the maximum temperature of 175°C may be used if the PCB allows it. B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation limit for cases where additional heatsinking is used. C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C. D. The R qJA is the sum of the thermal impedence from junction to case R qJC and case to ambient. E. The static characteristics in Figures 1 to 6 are obtained using <300 ms pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C. G. The maximum current rating is limited by bond-wires. H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. The SOA curve provides a single pulse rating. Rev 0 : January 2006
Total Gate Charge (10V)
Total Gate Charge (4.5V)
Gate Source Charge
Gate Drain Charge
Turn-On DelayTime
Turn-On Rise Time
Turn-Off DelayTime
Turn-Off Fall Time
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
=-10V, VDS=-20V, ID=-8A
V
GS
=-10V, VDS=-20V, RL=2.5,
V
GS
R
=3
GEN
I
=-8A, dI/dt=100A/µs
F
I
=-8A, dI/dt=100A/µs
F
unction temperature of 150°C. The value in any given application depends on the user's
14.1 nC
7nC
2.2 nC
4.1 nC
8ns
12.2 ns
24 ns
12.5 ns
23.2
ns
18.2 nC
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Alpha & Omega Semiconductor, Ltd.
Page 7
AOD606
P-Channel MOSFET Electrical Characteristics (T
30
-10V
25
-6V
20
(A)
15
D
-I
10
5
0
012345
Fig 1: On-Region Characteristics
80
70
60
)
(m
50
DS(ON)
R
40
-5V
-V
VGS=-4.5V
-3V
(Volts)
DS
-4.5V
VGS=-4V
-3.5V
=25°C unless otherwise noted)
J
25
20
15
(A)
D
-I
10
5
0
012345
Figure 2: Transfer Characteristics
1.80
1.60
1.40
1.20
VDS=-5V
125°C
(Volts)
-V
GS
VGS=-10V I
=-8A
D
25°C
VGS=-4.5V I
=-6A
D
30
VGS=-10V
20
048121620
-I
(A)
D
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
120
ID=-8A
100
)
80
(m
DS(ON)
R
60
40
25°C
125°C
20
2.00E+00 4.00E+00 6.00E+00 8.00E+00 1.00E+01
-V
(Volts)
GS
Figure 5: On-Resistance vs. Gate-Source Voltage
1.00
Normalized On-Resistance
0.80 0 25 50 75 100 125 150 175
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
1.0E+01
1.0E+00
1.0E-01
1.0E-02
(A)
S
-I
1.0E-03
125°C
25°C
1.0E-04
1.0E-05
1.0E-06
0.0 0.2 0.4 0.6 0.8 1.0 1.2
(Volts)
-V
SD
Figure 6: Body-Diode Characteristics
Alpha & Omega Semiconductor, Ltd.
Page 8
AOD606
P-Channel MOSFET Electrical Characteristics (T
10
8
6
(Volts)
GS
4
-V
2
0
0481216
100.0
10.0
(Amps)
D
-I
1.0
VDS=-20V I
=-8A
D
(nC)
-Q
g
Figure 7: Gate-Charge Characteristics
T
=175°C, TA=25°C
J(Max)
R
DS(ON)
limited
10µs
100µs
1msDC
=25°C unless otherwise noted)
J
1200
1000
800
600
400
Capacitance (pF)
C
oss
200
C
rss
0
0 5 10 15 20 25 30
Figure 8: Capacitance Characteristics
200
160
120
80
Power (W)
40
C
-V
iss
DS
(Volts)
T T
J(Max)
=25°C
A
=175°C
0.1
0.1 1 10 100
-V
(Volts)
DS
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
10
D=Ton/T T
J,PK=TC+PDM.ZθJC.RθJC
R
=3°C/W
θJC
In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
0
0.0001 0.001 0.01 0.1 1 10
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-to-
Case (Note F)
1
0.1
Normalized Transient
Thermal Resistance
JC
θ
Z
Single Pulse
P
T
on
T
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Alpha & Omega Semiconductor, Ltd.
Page 9
AOD606
o
P-Channel MOSFET Electrical Characteristics (T
10
t
=
A
8
6
4
(A), Peak Avalanche Cu r ren t
D
-I
TA=25°C
2
0.00001 0.0001 0.001
Time in avalanche, t
A
Figure 12: Single Pulse Avalanche capability
10
8
(A)
D
6
4
Current rating -I
2
(s)
IL
D
VBV
DD
=25°C unless otherwise noted)
J
60
50
40
30
20
Power Dissipation (W)
10
0
0 25 50 75 100 125 150 175
Figure 13: Power De-rating (Note B)
60
50
40
30
Power (W)
20
10
T
CASE
(°C)
TA=25°C
0
0 25 50 75 100 125 150 175
(°C)
T
CASE
Figure 14: Current De-rating (Note B)
0
0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 15: Single Pulse Power Rating Junction-to-
Ambient (Note H)
10
D=Ton/T T
J,PK=TA+PDM.ZθJA.RθJA
R
=50°C/W
1
θJA
In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
0.1
Normalized Transient
Thermal Resi stance
0.01
θJA
Z
Single Pulse
P
T
n
T
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)
Alpha & Omega Semiconductor, Ltd.
Page 10
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