Datasheets AN990 Datasheet

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AN990
Analog Sensor Conditi oning Circuits – An Ov erview
Author: Kumen Blake
Microchip Technology Inc.
INTRODUCTION
Target Audience
This application note is intended for hardware design engineers that need to co nditio n the output of commo n analog sensors.
Goals
• Review sensor types (e.g., voltage output)
• Show various conditioning circuits
• Give technical references
Description
Analog sensors produce a change in an electrical property to indicate a change in its environment. This change in electrical property needs to be conditioned by an analog circuit before conversion to digital. Further processing occurs in the digital domain but is not addressed in this application note.
The applications mentioned are:
• Electrical
• Magnetic
• Temperature
• Humidity
• Force, Weight, Torque and Pressure
• Motion and Vibration
•Flow
• Fluid Level and Volume
• Light and Infrared (IR)
•Chemistry For each type of electrical property, commonly used
conditioning circuits are shown. Each circuit has an accompanying list of advantages and disadvantages, and a list of sensor types appropriate for that circuit. The electrical properties covered are:
•Voltage
• Current
• Resistance
• Capacitance
•Charge
In addition, circuit and firmware concerns common to many embedded designs are briefly mentioned:
• Input Protection
• Sensor Failure Detection
•Filtering
• Analog-to-Digital (A-to-D) Conversion
• Correction of Results References to documents that treat these subjects in
more depth have been included in the “References” section.
SENSOR APPLICATIONS
This section reviews a few analog sensor applications. For each application, a list of common sensor types is given for convenience. A good resource for many of these applications is OMEGA handbooks [1, 2].
There are many more analog sensors than the ones discussed in this application note. For example:
• Time/frequency counters [14]
• Distance ranging sensor [25]
• Current sensing transformer [6] Emphasis is placed on the electrical behavior of the
various sensors. It is necessary to know this information when selecting an appropriate sensor conditioning circu it.
Electrical
These applications measure the state at some point in an electrical circuit. They include monitoring the condition of a crucial electrical circuit or power source.
TABLE 1: ELECTRICAL APPLICATIONS
Sensor Electrical Parameter
Voltage Voltage Current Current Charge Charge
®
Engineering’s
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Magnetic
These sensors are used to detect magnetic field strength and/or direction. They are commonly used in compasses and motor control [6].
TABLE 2: MAGNETIC APPLICATIONS
Sensor Electrical Parameter
Hall effect [6] Voltage Magneto-resistive Resistance
Temperature
The most common sensor application is temperature measurement. Some common sensors are listed in Table 3. Overviews of temperature sensors can be found in the references [14, 15].
TABLE 3: TEMPERATURE
APPLICATIONS
Sensor Electrical Parameter
Thermocouple [19, 20] Voltage RTD [18] Resistance Thermistor [16, 17] Resistance IC Voltage IR Thermal Sensor Current Thermo Piles Voltage
Humidity
Two common ways to measure humidity are listed in Table 4. It is often necessary to compensate for temperature in these applic ati on s.
TABLE 4: HUMIDITY APPLICATIONS
Sensor Electrical Parameter
Capacitive Capacitance Infrared (IR) Current
Motion and Vibration
Some common analog motion and vibration sensors are listed in Table 6. In many cases, more integrated solutions are available.
TABLE 6: MOTION AND VIBRATION
APPLICATIONS
Sensor Electrical Parameter
LVDT [10] AC Voltage Piezo-electric Voltage or Charge Microphone Voltage Motor Sensors [6] Voltage, Resistance,
Current, ... Ultrasonic Distance [25] Time IC Accelerometers Voltage
Flow
Many different approaches are used for measuring the flow of liquids and gases. A short sample is shown in Table 7.
TABLE 7: FLOW APPLICATIONS
Sensor Electrical Parameter
Magnetic Flow Meter AC Voltage Mass Flow Meter
(temperature) Ultrasound/Doppler Frequency Hot-wire Anemometer
[24] Mechanical Transducer
(e.g., turbine)
Resistance
Resistance
Volt a ge, ...
Fluid Level and Volume
Table 8 gives several examples of fluid level sensors. Fluid volume in a rigid cont ainer can be calcu lated from the level.
Force, Weight, Torque, and Pressure
The sensors in this section measure a mechanical force or strain. Common types are listed in Table 5.
TABLE 5: FORCE, WEIGHT, TORQUE,
AND PRESSURE APPLICATIONS
Sensor Electrical Parameter
Strain Gage [8 - 10] Resistance Load Cell Resistance Piezo-electric Volt a ge or Cha rge Mechanical Transducer Resistance, Voltage, ...
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TABLE 8: FLUID LEVEL AND VOLUME
APPLICATIONS
Sensor Electrical Parameter
Ultrasound Time Mechanical Transducer Resistance, Voltage, ... Capacitive Capacitance Switch (e.g., vibrating) On/Off Thermal
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Light and Infrared (IR)
Light and IR are used t o detec t the pre sence of obje ct s (e.g., people in a burglar alarm) and reduction in visibility (smoke and turb idity detectors).
TABLE 9: LIGHT AND IR
APPLICATIONS
Sensor Electrical Parameter
Photodiode [22, 23] Current
Chemistry
Table 10 gives a short list of sensors that detect chemical conditions.
TABLE 10: CHEMISTRY APPLICATIONS
Sensor Electrical Parameter
pH Electrode Voltage (with high output
impedance) Solution Conductivity Resistance CO Sensor Voltage or Charge Turbidity (photodiode) Current Colorimeter (photodiode) Current
Advantages
• High input impedance
• Low bias current (CMO S op amps)
• Positive gain
• Simplicity
Disadvantages
• Limited input voltage range
• Input stage distortion
• Amplifies common mo de nois e
Sensor Examples
• Thermocouple
• Thermo pile
• Piezo-ele ctric film
BUFFER FOR HIGH IMPEDANCE VOLTAGE SOURCE
This circuit requires a FET input op amp (e.g., CMOS input); see Figure 2. The FET input gives very high input impedance and ve ry low in put bia s curre nt, esp e­cially at room temperature (the ESD diodes conduct more current at higher temperatures). The operational amplifier (op amp) is used as a non-inverting amplifier.
BASIC SIGNAL CONDITIONING CIRCUITS
This section is organized by the sensor’s electrical property . For eac h sensor electri cal property liste d, one or more conditioning circuits are shown. Advantages, disadvantage s and sen sor examples are listed for each circuit.
Voltage Sensors
The circuits in this se ction cond ition a vol tage p roduced by a sensor.
NON-INVERTING GAIN AMPLIFIER
Figure 1 shows a non-inverting gain amplifier using an op amp. It presents a hi gh impe dance to the sens or (at
) and produces a positive gain from V
V
SEN
V
DD
V
SEN
R
1
MCP6XXX
R
2
FIGURE 1: Non-inverting Gain Amplifier.
SEN
V
OUT
to V
OUT
V
DD
V
SEN
R
1
FET Input Op Amp
MCP6XXX
R
2
V
OUT
FIGURE 2: Non-inverting Gai n Amplifier for High-Impedance Sensors with Voltage Output.
Advantages
• Very high input impedance
• Very low bias curre nt (CMOS op amps)
.
• Positive gain
• Simplicity
Disadvantages
• Limited input voltage range
• Input stage distortion
• Amplifies common mo de nois e
Sensor Example
• pH electrode
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The pH electrode’s impedance is a function of temper­ature and can be quite large. Its output voltage is proportional to absolute temperature.
INVERTING GAIN AMPLIFIER
Figure 3 shows an inverting gain amplifier using an op amp. It presents an impedance of R
) and produces a negative gain from V
V
SEN
V
.
OUT
V
DD
to the sensor (at
1
SEN
to
MCP6XXX
V
OUT
V
SEN
R
1
R
2
FIGURE 3: Inverting Gain Amplifier.
Advantages
• Resistive isolation from the source
• Large input voltage range is possible
• Virtually no input stage distortion
• Simplicity
Disadvantages
• Resistive loading of the source
• Inverti ng gain
• Amplifies common mode noise
Advantages
• Resisti ve isolation from the source
• Large input voltage range is possible
• Rejects common mo de noi se ; it is good for remote sensors
• Simplicity
Disadvantages
• Resistive loading of the source
• Input stage distortion
Sensor Examples
• Remote thermocouple
• Wheatstone bridge
INSTRUMENTATION AMPLIFIER
Figure 5 shows an instrument ation am plifi er circu it that conditions a remote volt age s enso r. The input resistors provide isolation and detection of sensor open-circuit failure. It amplifies the input difference voltage (V
SEN
V V
+–V
SEN
SEN
–) and rejects common mode noise.
SEN
V
DD
V
R
1
R
+ –
R
R
1
DD
2
Instrumentation Amplifier
V
2
REF
V
OUT
Sensor Examples
• Thermo pile
• High-side (VDD) voltage sensor
DIFFERENCE AMPLIFIER
Figure 4 shows a diffe renc e ampli fie r usin g an op am p. It presents an impedance of R sensor (V difference voltage (V
V
SEN
SEN
+
+ and V
SEN
R
1
SEN
+–V
to each end of the
1
–) and amplifies the input
–).
SEN
R
2
V
DD
MCP6XXX
V
OUT
V
SEN
R
1
R
2
FIGURE 4: Difference Amp.
FIGURE 5: Instrumentation Amplifier.
Advantages
• Excellent rejection of common mode noise; it is great for remote sensors
• Resisti ve isolation from the source
• Detection of sensor failure
Disadvantages
• Resistive loading of the source
•Cost
Sensor Examples
• Remote thermocouple
• Remote RTD (with a current source or voltage divider to produce a voltage from the RTD)
• Wheatstone bridge
- Strain gage
- Pressure sensor
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V ARIABLE GAIN FOR WIDE DYNAMIC RANGE AND NON-LINEAR SENSORS
Figure 6 shows a Programmable Gain Amplifie r (PGA) used to condition multiple sensors. These PGAs (e.g., MCP6S22) allow the user to sel ect an input se nsor and gain with the SPI™ bus. It can also help linearize non-linear sensors (e.g., a thermistor; see [16]).
V
DD
MCP6SX2
V
V
SEN
CH0 CH1
DD
V
OUT
V
OUT
4
SPI™ Control
V
REF
V
To other
SS
sensor
FIGURE 6: Programmable Gain Amplifer.
Advantages
• Multiple sensors (input MUX)
• CMOS input (high impedance and low bias current)
• Digital control (SPI) of input and gain
• Linearization of non-linear sources
Disadvantages
• Input stage distortion
• Amplifies common mode noise
• Needs microcontroller unit (MCU) and firmware
Sensor Examples
• Thermistor (with voltag e div ider to convert resistance to voltage)
• Thermo pile
• Piezo-electric film
Current Sensors
The circuits in this sectio n condit ion a cu rrent p roduced by a sensor.
RESISTIVE DETECTOR
Figure 7 shows a resistor (R1) that converts the se nsor current (I difference amplifier that amplifies the voltage across the resistor while rejecting common mode noise.
.
R1 << R
FIGURE 7: Current Sensor.
Advantages
• Good rejection of common mode noise
• Resisti ve isolation from the source
• Wide input voltage range
Disadvantages
• Resistive loading of the source
• Input stage distortion
Sensor Examples
• High-side (VDD) current sensor
• AC mains (line) current
) to a voltage (see [6]), as well as a
SEN
I
SEN
R
2
R
1
R
2
2
R
3
V
DD
MCP6XXX
R
3
V
OUT
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TRANSIMPEDANCE AMPLIFIER
Figure 8 shows a transimpedance amplifier (R1 and the op amp) that converts the sensor current (I voltage. The capacitor C
is sometimes needed to
1
SEN
) to a
stabilize the amplifier when the source has a large capacitance (e.g., see [5]).
I
SEN
V
DD
R
2
R
2
R
1
V
OUT
C
1
V
DD
MCP6XXX
FIGURE 8: Transimpedance Amplifier.
Advantages
• Good impedance buffering of source
• Simplicity
Disadvantages
• Design may need to be stabilized
Sensor Examples
• IR smoke detector
• Photodiode
• Photodetector
LOGARITHMIC AMPLIF IER (LOG AMP)
Figure 8 shows a logarithmic ampli fie r (D1A and the op amp) that converts the sensor current (I
SEN
) to a voltage proportional to the logarithm of the current. R maintains negative feedback when I negative. D
is used to correct D1A for temperature
1B
is small or
SEN
changes.
I
SEN
V
DD
R
2
R
2
D
1A
R
1
V
DD
MCP6XXX
V
OUT
V
DD
R
3
V
COR
D
1B
D1A and D1B are a matched pair in the same package.
FIGURE 9: Logarithmic Amplifier.
When the source (I in parallel with R polarity to D
1A
.
) has both polarities, ad d a diode
SEN
and D1A, and with the opposite
1
Advantages
• Wide dynamic range of currents
• Good impedance buffering of source
• Simplicity
1
Disadvantages
• Needs temperature correction
Sensor Example
• Photodiode (e.g., PWM encoded digital signal)
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Resistive Sensors
The sensors in this section produce a change in resis­tance. There are four basic strategies shown here for converting this resistance into a measurable electrical quantity:
• Resistance-to-voltage conversion
• Resistance-to-current conversion
• RC decay
• Oscillator frequency
RESISTANCE-TO-VOLTAGE CONVERSION
The first strategy for conditioning a resistive sensor is to produce a voltage that is a function of the change in resistance.
Voltage Divider
Figure 10 shows a voltage divider (R converts the sensor resistance to a voltage. The op amp buffers the voltage divider for further signal processi ng. This approach ha s been used in AN867 and AN897 [21, 16].
V
DD
V
R
SEN
DD
MCP6XXX
R
1
FIGURE 10: Voltage Divider with Op Amp.
Advantages
• Simplicity
• Ratiometric output (with an Analog-to-Digital Converter (ADC) using V voltage)
• Detection of open sensor (failure)
as its reference
DD
and R1) that
SEN
V
OUT
Voltage Divider and Variable Gain
Figure 11 shows a voltage divider (R converts the sensor resistance to a voltage. The PGA buffers the voltage divider for further signal processing and can be set to different gains when the sensor is non-linear.
V
DD
R
R
1
SEN
CH0 CH1
SPI™ Control
V
REF
V
DD
MCP6SXX
V
DD
V
SS
To other sensor
V
SEN
OUT
and R1) that
V
OUT
4
FIGURE 11: Voltage Divider with PGA.
Advantages
• Linearization of non-linear sensors
• Ratiometric output (with an ADC using VDD as its reference voltage)
• Multiplexing several sensors
• Detection of open sensor (failure)
Disadvantages
• Poor common mode noise rejection
• Needs a controller and firmware
• Voltage is a non-linear function of resistance
Sensor Example
•Thermistor
Wheatstone Bridge
Figure 12 shows a Wheatstone bridge that converts a change in resist ance to a chang e in dif ferentia l volt age. The op amp amplifies the difference voltage.
Disadvantages
• Poor common mode noise rejection
• Voltage is a non-linear function of resistance
V
DD
R
1
R
SEN
V
DD
MCP6XXX
Sensor Examples
•Thermistor
R
SEN
R
1
V
OUT
•RTD
• Magneto-resistive compass R
2
FIGURE 12: Wheatstone Bridge – Single Op Amp Circuit.
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Advantages
• Good rejection of common mode noise
• Ratiometric output (with an ADC using V
DD
as its
reference voltage)
• Simplicity
• Detection of open sensor (failure)
Disadvantages
• Gain is a function of R
• Needs a controller and firmware to correct
• Voltage is a non-linear function of resistance
SEN
Sensor Examples
• Strain gage
• Pressure sensor
• Magneto-resistive compass Figure 13 shows another Wheatstone bridge circuit.
The instrumentation amplifier amplifies the bridge’s difference voltage and gives excellent rejection of common mode noise.
(
V
DD
R
1
R
Instrumentation
SEN
Amp
Floating Current Source
Figure 14 shows a circuit t hat pr ovid es a cu rrent sourc e
) that accurately converts resistance to voltage.
(I
SEN
, R1B, R1, R2, R3 and the op amp for m a current
R
1A
source (Howland current pump). C current source and reduces noise. R from ground for remote sensors. The voltage across R
is amplified by a difference amplifier (Figure 4)
SEN
which also rejects common mode noise. The voltage on top of R
can be used to detect an open (failed) sensor.
4
Another current source is shown in [3, 18].
.
V
DD
R
1A
R
1B
R
2
V
DD
MCP6XXX
C
1
R
1
R
R
2
I
SEN
SEN
R
stabilizes this
1
provides isolation
4
3
Diff.
Amp.
V
OUT
V
R
SEN
R
1
V
REF
OUT
FIGURE 13: Wheatstone Bridge – Instrumentation Amplifier Circuit.
Advantages
• Excellent common mo de noi se reje cti on
• Ratiometric output (with an ADC using V
DD
as its
reference voltage)
• Detection of open sensor (failure)
Disadvantages
•Cost
• Voltage is a non-linear function of resistance
Sensor Examples
• Strain gage
• Pressure sensor
• Magneto-resistive compass Other implementations are shown in application notes
AN251, AN717 and AN695 [8, 9, 10].
R1 = R1A || R
1B
R3 << R2 and R
SEN
R
4
FIGURE 14: Howland Current Pump and Resistive Sensor with Difference Amplifier.
Advantages
• Lineari ty of resistance to voltage conversion
• Ratiometric output (with an ADC using VDD as its reference voltage)
Disadvantages
•Cost
• Requires accurate resistors
Sensor Examples
•Thermistor
•RTD
• Hot-wire anemometer
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RESISTANCE-TO-CURRENT CONVERSION
The second strategy for condi tionin g a resis tive se nsor is to produce a current that is a function of the resistance. F igure 15 show s the ba sic st rateg y, where the “I-to-V Amplifier” can be a transimpedance amp (Figure 8) or a logarithmic amp (Figure 9).
V
DD
R
SEN
R
2
R
2
I
SEN
V
DD
I-to-V
Amplifier
V
OUT
FIGURE 15: Resistance-to-Current Conversion Circuit.
Advantages
• Ratiometric output (with an ADC using VDD as its reference voltage)
• Simplicity
Disadvantages
• Inverti ng gain
Sensor Example
•Thermistor
RC DECAY
The third strategy for conditioning a resistive sensor is to produce a voltage with a RC decay (single pole response to a step). The time it takes for the voltage to decay to a threshold is a measure of the resistance.
Figure 16 show a circuit using a MC U circuit that sets a ratiometric threshold (proportional to V measured for both R correct for V PICmicro
, C1, and temperature errors. The
DD
®
MCU provides the switching and control
and R
1
separately in order to
SEN
). The time is
DD
needed. Application notes AN863, AN512 and AN929 [7, 11, 14] detail variations of this circuit.
PICmicro® MCU
R
SEN
P
2
R1
P
1
P
0
C
1
FIGURE 16: RC Decay.
Advantages
• Ratiometric correction of VDD, C1 and temperature errors
•Accurate
• Simple timing measurement
Disadvantages
• PICmicro MCU timing resolution
• Digital noise
• Threshold must be ratiometric
Sensor Example
•Thermistor
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OSCILLATOR FREQUENCY
The fourth strategy for conditioning a resistive sensor is to measure a change in oscillation frequency; Figure 17 shows one implementation. It is a state variable oscillator using resistors, capacitors, op amps and a comparator. Its operation and design are det ailed in application notes AN866 and AN895 [4, 12].
C
4
R
V
DD
1
MCP6XXX
R
5
R
6
C
1
V
DD
C
5
MCP6XXX
V
R
DD
2
MCP6XXX
C
2
V
DD
R
VDD/2
R
3
7
R
V
DD
MCP65XX
R
V
DD
MCP6XXX
8
4
V
OUT
Capacitive Sensors
The sensors in this section produce a change in capacitance. There are four basic strategies shown here for converting this capacitance into a measurable electrical quantity:
• RC decay
• Oscillator frequency
• Integration of current
• Wheatstone bridge
RC DECAY
The first strategy for con ditioning a capa citive sens or is to produce a voltage with a RC decay (single pole response to a step). The time it takes for the voltage to decay to a threshold is a measure of the capacitance. Figure 18 measures t his time, where the thr eshold is proportional to V coefficient to minimize temperature errors. The PICmi­cro® MCU provides the switching and control needed. AN863, AN512 and AN929 [7, 11, 14] detail a similar circuit.
PICmicro® MCU
. R1 has a low temperature
DD
R
1
P
1
P
0
C
SEN
FIGURE 17: State Variable Oscillato r.
Advantages
• Accuracy (with calibration)
• Good startup
• Easy processing using a PICmicro
®
MCU
Disadvantages
•Cost
•Design complexity
Sensor Examples
•RTD
• Hot-wire anemometer
FIGURE 18: RC Decay.
Advantages
• Ratiometric correction of VDD and temperature errors
•Accurate
• Simple timing measurement
Disadvantages
• PICmicro MCU timing resolution
• Digital noise
• Threshold must be ratiometric
Sensor Examples
• Capacitive humidity sensor
• Capacitive touch sensor
• Capacitive tank level sensor
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OSCILLATOR FREQUENCY
The second strategy for conditioning a capacitive sewnsor is to measure a change in oscillation frequency. The multi-vibrator (oscillator) in Figure 19 produces a change in oscillation frequency as a function of capacitance. Its operation and design is detailed in AN866 and AN895 [4, 12].
C
SEN
V
DD
R
2
R
3
R
V
DD
MCP65XX
R
1
V
OUT
4
FIGURE 19: Multi-vibrator (oscillator).
Advantages
•Cost
• Ratiometric operation
• Easy processing using a PICmicro
®
MCU
Disadvantages
• Reduced accuracy
Sensor Examples
• Capacitive humidity sensor
• Capacitive touch sensor
• Capacitive tank level sensor
SINGLE SLOPE INTEGRATING DETECTOR
The third strategy for conditioning a capacitive sensor is to integrate a current and measure the elapsed time to reach a voltage threshold. Figure20 shows a single-slope integrating detector. Switch SW controlled by the PICmicro across C
at the start o f the integr atio n peri od. T he
SEN
®
MCU, zeros the voltage
voltage at the output of the op amp linearly increases with time; the rate of increase is set by V
REF
and R1. The comparator at the output, which can be on the PICmicro MCU, trips at a time proportional to C
SEN
AN611 [13] discusses a similar circuit.
V
DD
V
DD
V
REF
R
C
1
SEN
to MCU
MCP65XX
MCP65XX
SW1
FIGURE 20: Single-slope Integrating Detector.
Advantages
• Easy processing using a PICmicro® MCU
• Accuracy depends on V
REF
and R
1
Disadvantages
•Cost
Sensor Examples
• Capacitive humidity sensor
• Capacitive touch sensor
• Capacitiv e tank level sensor
,
1
.
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CAPACITIVE WHEATSTONE BRIDGE
The fourth strategy for co nditioni ng a capa citive se nsor is to convert its impedance, at a specific frequency, to a voltage using a Wheatstone bridge. Figure 21 produces a change in differential voltage as a function of change in capacitance. An AC voltage source must drive the bridge; its frequency needs to be stable and accurate. R that is controlled to zero-out the differential voltage, or it can be a regular resistor. R the instrumentation amp correctly, and to keep the node betwee n th e capac ito rs fr om d rift ing over t ime . It needs to be much larger than C the divider equation can be corrected for this resistance, if necessary.
can be a di gital potentiome ter (digi-pot)
1
provides a means to bias
3
’s impedance (1/j ωC2);
2
V
AC
C
SEN
C
2
R
3
Instrumentation
R
1
Amplifier
R
2
V
REF
V
OUT
Charge Sensors
Figure 22 shows a simplified model of a “charge sensor.” It is a capacitive source that produces AC energy as a function of a change in the environment.
C
SEN
V
SEN
FIGURE 22: Simplified Charge Sensor Model.
Figure 23 shows a charge amplifier (C1 and the op amp) that co nverts the sensor e nergy (charge) to an output voltage. R input of the op amp, and creates a high-pass filter pol e (keeps the inverting input of the op amp from drifting over time). The change in charge of P almost exclusively across C accurate way to measure the charge produced by the sensor.
provides a bias path for the inverting
1
appears
, which makes this an
1
R
1
SEN
FIGURE 21: Capacitive Wheatstone Bridge.
Advantages
• Excellent common mo de noi se reje cti on
• Ratiometric output (with an ADC using V
DD
as its
reference voltage)
• Detection of open or shorted sensor (failure)
Disadvantages
• Needs AC stimulus
• Power dissipation
Sensor Examples
• Remote capacitive sensors
- Humidity sensor
- Touch sensor
- Tank level sensor
C
1
P
SEN
V
DD
R
R
V
DD
2
3
MCP6XXX
FIGURE 23: Charge Amplifier.
Advantages
• Excellent common mode noise rejection
• Ratiometric output (with an ADC using V
DD
reference voltage)
• Detection of open or shorted sensor (failure)
Disadvantages
• Needs AC stimulus
• Power dissipation
Sensor Example
• Piezo-ele ctric film
V
OUT
as its
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ADDITIONAL SIGNAL CONDITIONING
Circuit and firmware concerns common to many embedded designs are mentio ned here.
Input Protection
Sensor inputs need to be protected against Electro­static Discharge (ESD), overvoltage and overcurrent events; especially if they are remote from the conditioning circuit. AN929 [14] covers these issues.
Sensor Failure Detection
Some of the circuits in this application note provide means to detect sensor failure. Other examples are given in AN929 [14].
Filtering
All of the circuits in this application note also need output filters [3]. Analog filters are used to improve ADC performance. When properly designed, they prevent interference from aliasing (even to DC) and can reduce the sample frequ ency requirement s (saving power and MCU overhead). A simple RC filter is good enough for many applications. More difficult analog fil­ters need to be implemented with active RC filters.
®
Microchip Technology Inc.’s FilterLab an innovative tool that simplifies analog active-filter (using op amps) design. It is available at no cost from our web site (www.microchip.com). The FilterLab active-filter so ftware design tool provi des full s chematic diagrams of the filter circuit with component values. It also outputs the filter circuit in SPICE format.
Additional filtering can be performed digitally, if necessary. A simple averaging of results is usually good enough.
software [26] is
A-to-D Conversion
Many times, the conditi oned sensor output is converted to digital format by an ADC. Many of the circuits in this application note are ratiometric so that variations in power supply are corrected at the ADC (e.g., Wheat­stone bridges). Others circuits use an absolute reference for the ADC.
Correction of Results
Sensor errors can be corrected by calibrating each system. This can be accomplished in hardware (e.g., Digi-Pot) or firmware (e.g., calibration constants in non-volatile memory).
Correction for other environmental parameters may also be needed. For example, a capacitive humidity sensor may need correction for temperature. This is usually easiest to handle in firmware, but can also be done in hardware.
Non-linear sensors need additional correction. They may use polynomials or other mathematical functions in the MCU, to produce a best estimate of the parame­ter of interest. It is also possib le to use a lin ear interp o­lation table in firmware; AN942 [27] gives one implementation.
SUMMARY
This application note is intended to assist circuit designers select a circuit topology for common sensor types. Common sensor applications are listed and described. Many basic signal-conditioning circuits are shown. Sensor-conditioning circuitry, and firmware common to many embedded designs, are briefly mentioned. The “References” section points to other resources that cover particular topics in detail.
© 2005 Microchip Technology Inc. DS00990A-page 13
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AN990
REFERENCES
General References
[1] “The OMEGA® Made in the USA Handbook™,” Vol.1, OMEGA Engineering, Inc., 2002.
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[2] “The OMEGA Vol.2, OMEGA Engineering, Inc., 2002.
[3] AN682, “Using Single Supply Operational Amplifiers in Embedded Systems,” Bonnie Baker; Microchip Technology Inc., DS00682, 2000.
[4] AN866, “Designing Operational Amplifier Oscil la tor Circuits For Sensor Applications,” Jim Lepkowski; Microchip Technology Inc., DS00866, 2003.
Current Sensors
[5] AN951, “Amplifying High-Impedance Sensors – Photodiode Example, ” Kum en Bl ake a nd Steven Bible; Microchip Technology Inc., DS00951, 2004.
[6] AN894, “Motor Control Sensor Feedback Circuits,” Jim Lepkowski; Microchip Technology Inc., DS00894,
2003.
Resistor Sensors
[7] AN863, “A Comparator Based Slope ADC,” Joseph Julicher; Microchip Technology Inc., DS00863, 2003.
[8] AN251, “Bridge Sensing with the MCP6S2X PGAs,” Bonnie C. Baker; Microchip Technology Inc., DS00251, 2003.
[9] AN717, “Building a 10-bit Bridge Sensing Circuit using the PIC16C6XX and MCP601 Operational Amplifier ,” Bonnie C. Ba ker; Microch ip Technology Inc., DS00717, 1999.
[10] AN695, “Interfacing Pressure Sensors to Microchip’s Analog Peripherals,” Bonnie Baker; Microchip Technology Inc., DS00695, 2000.
[11] AN512, “Implementing Ohmmeter/Temperature Sensor,” Doug Cox; Microchip Technology Inc., DS00512, 1997.
[12] AN895 “Oscillator Circuits For RTD Temperature Sensors,” Ezana Haile and Jim Lepkowski; Microchip Technology Inc., DS00895, 2004.
Capacitance Sensors
Made in the USA Handbook™,”
[15] AN679, “Temperature Sensing Technologies,” Bonnie C. Baker; Micro chip Technology Inc., DS00679,
1998. [16] AN897; “Thermistor Temperature Sensing with
MCP6SX2 PGAs,” Kumen Blake and Steven Bible; Microchip Technology Inc., DS00897, 2004.
[17] AN685, “Thermistors in Single Supply Temperature Sensing Circuits,” Bonnie C. Baker; Microchip Technology Inc., DS00685, 1999.
[18] AN687, “Precision Temperature-Sensing With RTD Circuits,” Bonnie C. Baker; Microchip Technology Inc., DS00687, 2003.
[19] AN684, “Single Supply Temperature Sensing with Thermocouples,” Bonnie C. Baker; Microchip Technology Inc., DS00684, 1998.
[20] AN844, “Simplified Thermocouple Interfaces and PICmicro Technology Inc., DS00844, 2002.
[21] AN867, “Temperature Sensing With A Programmable Gain Amplifier,” Bonnie C. Baker; Microchip Technology Inc., DS00867, 2003.
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MCUs,” Joseph Julicher; Microchip
Other Sensors
[22] AN865, “Sensing Ligh t with a Prog rammable G ain Amplifier ,” Bonnie C. Ba ker; Microch ip Technology Inc., DS00865, 2003.
[23] AN692, “Using a Digit al Potentiometer to Optim ize a Precision Single-Supply Photo Detection Circuit,” Bonnie C. Baker; Micro chip Technology Inc., DS00692,
2004. [24] TB044, “Sensing Air Flow with the PIC16C781,”
Ward Brown; Microchip Technology Inc., DS91044,
2002. [25] AN597, “Implementing Ultrasonic Ranging,”
Robert Schreiber; Microchip Technology Inc., DS00597, 1997.
Signal Conditioning
[26] FilterLab® 2.0 User’s Guide;” Microchip Technology Inc., DS51419, 2003.
[27] AN942, “Piecewise Linear Interpolation on PIC12/14/16 Series Microcontrollers,” John Day and Steven Bible; Microchip Technology Inc., 2004.
[13] AN611, “Resistance and Capacitance Meter Using a PIC16C622,” Rodger Richie; Microchip Technology Inc., DS00611, 1997.
Temperature Sensors
[14] AN929, “Temperature Measurement Circuits for Embedded Applications,” Jim Lepkowski; Microchip Technology Inc., DS00929, 2004.
DS00990A-page 14 © 2005 Microchip Technology Inc.
Page 15
Note the following details of the code protection feature on Microchip devices:
Microchip products meet the specification contained in their particular Microchip Data Sheet.
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions.
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are com mitted to continuously improving the code protect ion f eatures of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digit al Mill ennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WAR­RANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFOR MANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of M icrochip’s prod ucts as critical components in life support systems is not authorized except with express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, Accuron, dsPIC, K
EELOQ, microID, MPLAB, PIC, PICmicro,
PICSTART, PRO MATE, PowerSmart, rfPIC, and SmartShunt are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
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All other trademarks mentioned herein are property of their respective companies.
© 2005, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved.
Printed on recycled paper.
Microchip received ISO/TS-16949:2002 quality system certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona and Mountain View, California in October 2003. The Company’s quality system processes and procedures are for its PICmicro devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.
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8-bit MCUs, KEELOQ
®
code hopping
© 2005 Microchip Technology Inc. DS00990A-page 15
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