
ZXMN6A09K
60V N-CHANNEL ENHANCEMENT MODE MOSFET IN DPAK
SUMMARY
V
(BR)DSS
=60V : R
DESCRIPTION
This new generation of Trench MOSFETs from Zetex utilizes a unique
structure that combines the benefits of low on-resistance with fast switching
speed. This makes them ideal for high efficiency, low voltage power
management applications.
=0.045 ; ID=11.2A
DS(on)
FEATURES
Low on-resistance
•
Fast switching speed
•
Low threshold
•
Low gate drive
•
• D-Pak (T0-252) package
APPLICATIONS
•
DC-DC Converters
•
Power Management functions
•
Disconnect switches
•
Motor control
ORDERING INFORMATION
DEVICE REEL
SIZE
ZXMN6A09KTC 13” 16mm 2500 units
TAPE
WIDTH
QUANTITY PER
REEL
DEVICE MARKING
•
ZXMN
6A09K
K
A
P
D
PINOUT
ISSUE 4 - JANUARY 2005
TOP VIEW
1
SEMICONDUCTORS

ZXMN6A09K
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL LIMIT UNIT
Drain-source voltage V
Gate-source voltage V
Continuous drain current @ V
=10V; TA=25°C
GS
@VGS=10V; TA=70°C
@VGS=10V; TA=25°C
Pulsed drain current
(c)
Continuous source current (body diode)
Pulsed source current (body diode)
Power dissipation at T
=25°C
A
(c)
(a)
(b)
(b)
(a)
(b)
I
I
I
I
P
DSS
GS
D
DM
S
SM
D
Linear derating factor
Power dissipation at T
=25°C
A
(b)
P
D
Linear derating factor
Power dissipation at T
=25°C
A
(d)
P
D
Linear derating factor
Operating and storage temperature range T
j,Tstg
THERMAL RESISTANCE
PARAMETER SYMBOL VALUE UNIT
Junction to ambient
Junction to ambient
Junction to ambient
(a)
(b)
(d)
R
R
R
⍜JA
⍜JA
⍜JA
60 V
±20 V
11.2
9.0
7.3
40 A
10.8 A
40 A
4.3
34.4
mW/°C
10.1
80.8
mW/°C
2.15
17.2
mW/°C
-55 to +150 °C
29 °C/W
12.3 °C/W
58 °C/W
A
W
W
W
NOTES
(a) For a device surface mounted on 50mm x 50mm x 1.6mm FR4 PCB with high coverage of single sided 2oz copper, in still air conditions.
(b) For a device surface mounted on FR4 PCB measured at t ⱕ 10 sec.
(c) Repetitive rating 50mm x 50mm x 1.6mm FR4 PCB, D=0.02 pulse width=300s - pulse width limited by maximum junction temperature.
(d) For a device surface mounted on 50mm x 50mm x 1.6mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions.
ISSUE 4 - JANUARY 2005
SEMICONDUCTORS
2

ZXMN6A09K
ELECTRICAL CHARACTERISTICS (at T
= 25°C unless otherwise stated)
amb
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS
STATIC
Drain-source breakdown voltage V
Zero gate voltage drain current I
Gate-body leakage I
Gate-source threshold voltage V
Static drain-source on-state resistance
Forward transconductance
DYNAMIC
(3)
(1) (3)
(1)
Input capacitance C
Output capacitance C
Reverse transfer capacitance C
SWITCHING
(2) (3)
Turn-on-delay time t
Rise time t
Turn-off delay time t
Fall time t
Total gate charge Q
Total gate charge Q
Gate-source charge Q
Gate drain charge Q
(BR)DSS
DSS
GSS
GS(th)
R
DS(on)
g
fs
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
60 V ID= 250A, VGS=0V
1 AVDS= 60V, VGS=0V
100 nA VGS=±20V, VDS=0V
1.0 V ID= 250A, VDS=V
0.045 ⍀ VGS= 10V, ID= 7.3A
0.070 ⍀ V
= 4.5V, ID=5.6A
GS
15 S VDS= 15V, ID= 7.3A
1426 pF
V
= 30V, VGS=0V
134 pF
DS
f=1MHz
64 pF
4.8 ns
V
= 30V, ID=1A
4.6 ns
32.5 ns
DD
≅6.0⍀,VGS= 10V
R
G
(refer to test circuit)
14.5 ns
15 nC VDS= 30V, VGS= 4.5V
= 5.6A
I
D
29 nC
7.0 nC
4.7 nC
= 30V, VGS= 10V
V
DS
= 7.3A
I
D
SOURCE-DRAIN DIODE
Diode forward voltage
Reverse recovery time
Reverse recovery charge
(1)
(3)
(3)
V
SD
t
rr
Q
rr
0.85 0.95 V Tj=25°C, IS= 6.6A,
V
=0V
GS
25.6 ns
26.0 nC
T
=25°C, IS= 3A,
j
di/dt=100A/s
GS
NOTES
(1) Measured under pulsed conditions. Pulse width ⱕ 300s; duty cycle ⱕ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
SEMICONDUCTORS
4
ISSUE 4 - JANUARY 2005

PACKAGE OUTLINE
Controlling dimensions are in millimeters. Approximate
conversions are given in inches
PACKAGE DIMENSIONS
DIM
Millimeters Inches
Min Max Min Max Min Max Min Max
DIM
A 2.18 2.38 0.086 0.094 e 2.30 BSC 0.090 BSC
A1 ᎏ 0.127
0.005 H 9.40 10.41 0.370 0.410
b 0.635 0.89 0.025 0.035 L 1.40 1.78 0.055 0.070
b2 0.762 1.114 0.030 0.045 L1 2.74 REF 0.108 REF
b3 5.20 5.46 0.205 0.215 L2 0.051 BSC 0.020 BSC
c 0.457 0.609 0.018 0.024 L3 0.89 1.27 0.035 0.050
c2 0.457 0.584 0.018 0.023 L4 0.635 1.01 0.025 0.040
D 5.97 6.22 0.235 0.245 L5 1.14 1.52 0.045 0.060
D1 5.20 ᎏ 0.205
E 6.35 6.73 0.250 0.265 ⍜⬚ 0ⴗ 15ⴗ 0ⴗ 15
E1 4.32 ᎏ 0.170
Millimeters Inches
⍜1⬚ 0ⴗ 10ⴗ 0 10
ZXMN6A09K
© Zetex Semiconductors plc 2005
Europe
Zetex GmbH
Streitfeldstraße 19
D-81673 München
Germany
Telefon: (49) 89 45 49 49 0
Fax: (49) 89 45 49 49 49
europe.sales@zetex.com
These offices are supported by agents and distributors in major countries world-wide.
Thispublicationisissued to provide outlineinformationonlywhich (unless agreed bytheCompanyin writing) may notbeused,applied or reproduced
for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. The Company
reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.
For the latest product information, log on to www.zetex.com
Americas
Zetex Inc
700 Veterans Memorial Hwy
Hauppauge, NY 11788
USA
Telephone: (1) 631 360 2222
Fax: (1) 631 360 8222
usa.sales@zetex.com
Asia Pacific
Zetex (Asia) Ltd
3701-04 Metroplaza Tower 1
Hing Fong Road, Kwai Fong
Hong Kong
Telephone: (852) 26100 611
Fax: (852) 24250 494
asia.sales@zetex.com
Corporate Headquarters
Zetex Semiconductors plc
Zetex Technology Park
Chadderton, Oldham, OL9 9LL
United Kingdom
Telephone (44) 161 622 4444
Fax: (44) 161 622 4446
hq@zetex.com
ISSUE 4 - JANUARY 2005
7
SEMICONDUCTORS