This new generation of trench MOSFETs from Zetex utilizes a unique structure that
combines the benefits of low on-resistance with fast switching speed. This makes
them ideal for high efficiency, low voltage, power management applications.
FEATURES
Low on-resistance
•
= 30V : RDS(on)= 0.025 ; ID= 7.6A
= -30V : RDS(on)= 0.035 ; ID= -6.3A
ZXMC3A18DN8
8
O
S
Fast switching speed
•
Low threshold
•
• Low gate drive
•
Low profile SOIC package
APPLICATIONS
•
Motor Drive
•
LCD backlighting
ORDERING INFORMATION
DEVICEREEL
SIZE
ZXMC3A18DN8TA7”12mm500 units
ZXMC3A18DN8TC13”12mm2500 units
TAPE
WIDTH
QUANTITY
PER REEL
DEVICE MARKING
•
ZXMC
3A18
Q1 = N-channelQ2 = P-channel
Top View
ISSUE 1 - MAY 2005
1
SEMICONDUCTORS
Page 2
ZXMC3A18DN8
ABSOLUTE MAXIMUM RATINGS
PARAMETERSYMBOLLIMITUNIT
Drain-Source VoltageV
Gate-Source VoltageV
Continuous Drain Current
= 10V; TA=25°C)
(V
GS
(VGS= 10V; TA=70°C)
(VGS= 10V; TA=25°C)
Pulsed Drain Current
(c)
Continuous Source Current (Body Diode)
Pulsed Source Current (Body Diode)
(a) (d)
Power Dissipation at T
=25°C
A
(b)(d)
(b)(d)
(a)(d)
(b)
(c)
DSS
I
I
DM
I
I
SM
P
GS
D
S
D
Linear Derating Factor
Power Dissipation at T
=25°C
A
(a) (e)
P
D
Linear Derating Factor
Power Dissipation at T
=25°C
A
(b) (d)
P
D
Linear Derating Factor
Operating and Storage Temperature RangeT
j,Tstg
THERMAL RESISTANCE
PARAMETERSYMBOLVALUEUNIT
Junction to Ambient
Junction to Ambient
Junction to Ambient
(a) (d)
(a) (e)
(b) (d)
R
R
R
⍜JA
⍜JA
⍜JA
30-30V
±20±20V
7.6
6.1
5.8
-6.3
-5.0
-4.8
37-30A
3.63.2A
3730A
1.25
10
1.8
14
2.1
17
-55 to +150°C
100°C/W
70°C/W
60°C/W
A
A
A
W
mW/°C
W
mW/°C
W
mW/°C
NOTES
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions.
(b) For a device surface mounted on FR4 PCB measured at t ⱕ 10 sec.
(c) Repetitive rating - pulse width limited by maximum junction temperature. Pulse width 300s, d⬍= 0.02. Refer to Transient Thermal Impedance
graph.
(d) For device with one active die.
(e) For device with two active die running at equal power.
ISSUE 1 - MAY 2005
SEMICONDUCTORS
2
Page 3
CHARACTERISTICS
ZXMC3A18DN8
ISSUE 1 - MAY 2005
3
SEMICONDUCTORS
Page 4
ZXMC3A18DN8
N-Channel
ELECTRICAL CHARACTERISTICS (at T
PARAMETERSYMBOLMIN.TYP. MAX. UNIT CONDITIONS
STATIC
Drain-Source Breakdown VoltageV
Zero Gate Voltage Drain CurrentI
Gate-Body LeakageI
Gate-Source Threshold VoltageV
Static Drain-Source On-State
Resistance
Forward Transconductance
DYNAMIC
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
Gate-Source ChargeQ
Gate-Drain ChargeQ
SOURCE-DRAIN DIODE
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
(1)
(1) (3)
(3)
(2) (3)
(1)
(3)
(3)
= 25°C unless otherwise stated)
amb
(BR)DSS
DSS
GSS
GS(th)
R
DS(on)
30VID= 250A, VGS=0V
0.5 AVDS=30V, VGS=0V
100
1.0VID= 250A, VDS=V
0.025
0.030
g
fs
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
V
SD
t
rr
Q
rr
17.5SVDS= 15V, ID= 5.8A
1800pF
289pF
178pF
5.5ns
8.7ns
33ns
8.5ns
19.4nCVDS= 15V, VGS=5V
36nC
5.5nC
7.0
0.95VTj=25°C, IS= 6A,
20.5ns
41.5nC
nAVGS=±20V, VDS=0V
⍀
VGS= 10V, ID= 5.8A
⍀
= 4.5V, ID= 5.3A
V
GS
= 25V, VGS=0V
V
DS
f=1MHz
V
= 15V, ID=6A
DD
≅ 6.0⍀,
R
G
= 10V
V
GS
= 3.5A
I
D
V
= 15V, VGS= 10V
DS
= 3.5A
I
D
nC
=0V
V
GS
=25°C, IF= 6A,
T
j
di/dt=100A/s
GS
NOTES
(1) Measured under pulsed conditions. Pulse width ⱕ 300ms; Duty cycle ⱕ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
SEMICONDUCTORS
4
ISSUE 1 - MAY 2005
Page 5
TYPICAL CHARACTERISTICS
ZXMC3A18DN8
ISSUE 1 - MAY 2005
5
SEMICONDUCTORS
Page 6
ZXMC3A18DN8
TYPICAL CHARACTERISTICS
SEMICONDUCTORS
ISSUE 1 - MAY 2005
6
Page 7
ZXMC3A18DN8
P-Channel
ELECTRICAL CHARACTERISTICS (at T
PARAMETERSYMBOLMIN.TYP. MAX. UNIT CONDITIONS
STATIC
Drain-Source Breakdown VoltageV
Zero Gate Voltage Drain CurrentI
Gate-Body LeakageI
Gate-Source Threshold VoltageV
Static Drain-Source On-State
Resistance
Forward Transconductance
DYNAMIC
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
Gate-Source ChargeQ
Gate-Drain ChargeQ
SOURCE-DRAIN DIODE
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
(1)
(1) (3)
(3)
(2) (3)
(1)
(3)
(3)
= 25°C unless otherwise stated)
amb
(BR)DSS
DSS
GSS
GS(th)
R
DS(on)
-30VID= -250A, VGS=0V
-1.0AVDS=-30V, VGS=0V
100
-1.0VID= 250A, VDS=V
0.035
0.050
g
fs
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
V
SD
t
rr
Q
rr
8.6SVDS= -15V, ID= -4.8A
1603pF
434pF
388pF
4.8ns
9.5ns
60ns
38ns
25nCVDS= -15V, VGS= -5V
45nC
5.1nC
11.5
0.82-0.95 VTj=25°C, IS= -3.7,
32.5ns
18.4nC
nAVGS=±20V, VDS=0V
⍀
VGS= -10V, ID= -4.8A
⍀
= -4.5V, ID= -4.0A
V
GS
= -15V, VGS=0V
V
DS
f=1MHz
V
= -15V, ID=-1A
DD
≅ 6.0⍀,
R
G
= 10V
V
GS
= -4.8A
I
D
V
= -15V, VGS= -10V
DS
= -4.8A
I
D
nC
=0V
V
GS
=25°C, IF= -2.2,
T
j
di/dt=100A/s
GS
NOTES
(1) Measured under pulsed conditions. Pulse width ⱕ 300ms; Duty cycle ⱕ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 1 - MAY 2005
7
SEMICONDUCTORS
Page 8
ZXMC3A18DN8
PACKAGE OUTLINE
⍜
D
H
E
Pin 1
c
A
Seating Plane
L
b
e
A1
Controlling dimensions are in millimetres. Approximate conversions are given in inches
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for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. The Company
reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.
For the latest product information, log on to www.zetex.com
Americas
Zetex Inc
700 Veterans Memorial Hwy
Hauppauge, NY 11788
USA
Telephone: (1) 631 360 2222
Fax: (1) 631 360 8222
usa.sales@zetex.com
MillimetresInches
Asia Pacific
Zetex (Asia) Ltd
3701-04 Metroplaza Tower 1
Hing Fong Road, Kwai Fong
Hong Kong
Telephone: (852) 26100 611
Fax: (852) 24250 494
asia.sales@zetex.com
Corporate Headquarters
Zetex Semiconductors plc
Zetex Technology Park
Chadderton, Oldham, OL9 9LL
United Kingdom