
查询ZXMC3A17DN8_05供应商
COMPLEMENTARY 30V ENHANCEMENT MODE MOSFET
SUMMARY
N-Channel : V
P-Channel : V
(BR)DSS
(BR)DSS
DESCRIPTION
This new generation of trench MOSFETs from Zetex utilizesauniquestructurethat
combines the benefits of low on-resistance with fast switching speed. This makes
them ideal for high efficiency, low voltage, power management applications.
FEATURES
Low on-resistance
•
= 30V : R
= -30V : R
= 0.050 ; ID= 5.4A
DS(on)
= 0.070 ; ID= -4.4A
DS(on)
ZXMC3A17DN8
8
O
S
Fast switching speed
•
Low threshold
•
Low gate drive
•
•
Low profile SOIC package
APPLICATIONS
•
Motor drive
•
LCD backlighting
Q1 = N-channel
ORDERING INFORMATION
DEVICE REEL SIZE TAPE WIDTH QUANTITY PER REEL
ZXMC3A17DN8TA 7” 12mm 500 units
ZXMC3A17DN8TC 13” 12mm 2500 units
DEVICE MARKING
•
ZXMC
3A17
Q2 = P-channel
PINOUT
Top View
ISSUE 1 - OCTOBER 2005
1
SEMICONDUCTORS

ZXMC3A17DN8
ADVANCE INFORMATION
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL N-channel P-channel UNIT
Drain-Source Voltage V
Gate-Source Voltage V
Continuous Drain Current
= 10V; TA=25°C)
(V
GS
(VGS= 10V; TA=70°C)
(VGS= 10V; TA=25°C)
Pulsed Drain Current
(c)
Continuous Source Current (Body Diode)
Pulsed Source Current (Body Diode)
(a) (d)
Power Dissipation at T
=25°C
A
(b)(d)
(b)(d)
(a)(d)
(b)
(c)
Linear Derating Factor
(a) (e)
Power Dissipation at T
=25°C
A
Linear Derating Factor
(b) (d)
Power Dissipation at T
=25°C
A
Linear Derating Factor
Operating and Storage Temperature Range T
DSS
GS
I
D
I
DM
I
S
I
SM
P
D
P
D
P
D
j,Tstg
30 -30 V
±20 ±20 V
5.4
4.3
4.1
-4.4
-3.6
-3.4
23 -20 A
2.6 -2.5 A
23 -20 A
1.25
10
1.8
14
2.1
17
-55 to +150 °C
A
W
mW/°C
W
mW/°C
W
mW/°C
THERMAL RESISTANCE
PARAMETER SYMBOL VALUE UNIT
Junction to Ambient
Junction to Ambient
Junction to Ambient
NOTES:
(a) For a dual device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions.
(b) For a dual device surface mounted on FR4 PCB measured at t ⱕ 10 sec.
(c) Repetitive rating 25mm x 25mm FR4 PCB, D = 0.02, pulse width = 300s - pulse width limited by maximum junction temperature.
(d) For a dual device with one active die.
(e) For dual device with two active die running at equal power.
SEMICONDUCTORS
(a) (d)
(a) (e)
(b) (d)
R
R
R
⍜JA
⍜JA
⍜JA
100 °C/W
70 °C/W
60 °C/W
ISSUE 1 - OCTOBER 2005
2

ZXMC3A17DN8
N-CHANNEL
ELECTRICAL CHARACTERISTICS (at T
PARAMETER SYMBOL MIN.
STATIC
Drain-Source Breakdown
Voltage
Zero Gate Voltage Drain
Current
Gate-Body Leakage I
Gate-Source Threshold
Voltage
Static Drain-Source On-State
Resistance
(1)
Forward
Transconductance
DYNAMIC
(3)
(1) (3)
Input Capacitance C
Output Capacitance C
Reverse Transfer Capacitance C
SWITCHING
(2) (3)
Turn-On-Delay Time t
Rise Time t
Turn-Off Delay Time t
Fall Time t
Gate Charge Q
Total Gate Charge Q
Gate-Source Charge Q
Gate-Drain Charge Q
SOURCE-DRAIN DIODE
Diode Forward Voltage
Reverse Recovery Time
(1)
(3)
Reverse Recovery Charge
(1) Measured under pulsed conditions. Pulse width ⱕ 300ms; Duty cycle ⱕ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
(3)
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
g
fs
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
V
SD
t
rr
Q
rr
= 25°C unless otherwise stated)
amb
TYP.
30 V ID=250A, VGS=0V
1.0 V ID=250A, VDS=V
10 S VDS= 10V, ID=7.8A
600 pF
104 pF
58.5 pF
2.9 ns
6.4 ns
16 ns
11.2 ns
6.9 nC VDS= 15V, VGS=5V
12.2 nC
1.7 nC
2.4
0.85 0.95 V Tj=25°C, IS=3.2A,
18.8 ns
14.1 nC
ADVANCE INFORMATION
MAX. UNIT CONDITIONS
0.5 AVDS=30V, VGS=0V
100
0.050
0.065⍀⍀
nA VGS=±20V, VDS=0V
VGS= 10V, ID=7.8A
=4.5V,ID=6.8A
V
GS
= 25V, VGS=0V
V
DS
f=1MHz
V
=15V,ID=3.5A
DD
≅ 6.0⍀,
R
G
=10V
V
GS
=3.5A
I
D
V
= 15V, VGS=10V
DS
=3.5A
I
nC
D
=0V
V
GS
=25°C, IF=3.5A,
T
j
di/dt=100A/s
GS
SEMICONDUCTORS
ISSUE 1 - OCTOBER 2005
4

ADVANCE INFORMATION
ZXMC3A17DN8
P-CHANNEL
ELECTRICAL CHARACTERISTICS (at T
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS
STATIC
Drain-Source Breakdown
Voltage
Zero Gate Voltage Drain
Current
Gate-Body Leakage I
Gate-Source Threshold
Voltage
Static Drain-Source
On-State Resistance
Forward
Transconductance
DYNAMIC
(3)
(1)
(1) (3)
Input Capacitance C
Output Capacitance C
Reverse Transfer
Capacitance
SWITCHING
(2) (3)
Turn-On-Delay Time t
Rise Time t
Turn-Off Delay Time t
Fall Time t
Gate Charge Q
Total Gate Charge Q
Gate-Source Charge Q
Gate Drain Charge Q
SOURCE-DRAIN DIODE
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
(1)
(3)
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
g
fs
iss
oss
C
rss
d(on)
r
d(off)
f
g
g
gs
gd
V
SD
t
rr
(3)
Q
rr
= 25°C unless otherwise stated)
amb
-30 V ID= -250A, VGS=0V
-1.0 AVDS= -30V, VGS=0V
100 nA VGS=±20V, VDS=0V
-1.0 V ID= -250A, VDS=V
0.070
0.110⍀⍀
VGS= -10V, ID=-3.2A
= -4.5V, ID= -2.5A
V
GS
6.4 S VDS= -15V, ID= -3.2A
630 pF
= -15V, VGS=0V
V
113 pF
78 pF
1.7 ns
2.9 ns
29.2 ns
8.7 ns
DS
f=1MHz
V
=-15V,ID=-1A
DD
≅ 6.0⍀,
R
G
= -10V
V
GS
8.3 nC VDS= -15V, VGS=-5V
= -3.2A
I
D
15.8 nC
1.8 nC
2.8 nC
V
= -15V, VGS=
DS
-10V
= -3.2A
I
D
-0.85 -0.95 V Tj=25°C, IS= -2.5A,
=0V
V
GS
19.5 ns
16.3 nC
=25°C, IS= -1.7A,
T
j
di/dt=100A/s
GS
NOTES:
(1) Measured under pulsed conditions. Pulse width ⱕ 300ms; Duty cycle ⱕ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 1 - OCTOBER 2005
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SEMICONDUCTORS

ZXMC3A17DN8
ADVANCE INFORMATION
N-CHANNEL TYPICAL CHARACTERISTICS
SEMICONDUCTORS
ISSUE 1 - OCTOBER 2005
6

ADVANCE INFORMATION
N-CHANNEL TYPICAL CHARACTERISTICS
ZXMC3A17DN8
ISSUE 1 - OCTOBER 2005
7
SEMICONDUCTORS

ZXMC3A17DN8
ADVANCE INFORMATION
P-CHANNEL TYPICAL CHARACTERISTICS
SEMICONDUCTORS
ISSUE 1 - OCTOBER 2005
8

ADVANCE INFORMATION
P-CHANNEL TYPICAL CHARACTERISTICS
ZXMC3A17DN8
ISSUE 1 - OCTOBER 2005
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SEMICONDUCTORS

ZXMC3A17DN8
SO8 PACKAGE OUTLINE (Conforms to JEDEC MS-012AA Iss. C)
Controlling dimensions are in millimeters. Approximate conversions are given in inches
PACKAGE DIMENSIONS
DIM
Millimeters Inches
Min Max Min Max Min Max Min Max
DIM
Millimeters Inches
A 1.35 1.75 0.053 0.069 e 1.27 BSC 0.050 BSC
A1 0.10 0.25 0.004 0.010 b 0.33 0.51 0.013 0.020
D 4.80 5.00 0.189 0.197 c 0.19 0.25 0.008 0.010
H 5.80 6.20 0.228 0.244 ⍜ 0° 8° 0° 8°
E 3.80 4.00 0.150 0.157 h 0.25 0.50 0.010 0.020
L 0.40 1.27 0.016 0.050 - ----
© Zetex Semiconductors plc 2005
Europe
Zetex GmbH
Streitfeldstraße 19
D-81673 München
Germany
Telefon: (49) 89 45 49 49 0
Fax: (49) 89 45 49 49 49
europe.sales@zetex.com
These offices are supported by agents and distributors in major countries world-wide.
This publicationis issued toprovide outline informationonly which (unless agreed by the Company inwriting) maynot be used,applied or reproduced
for any purposeor form part of any order or contract orbe regarded as a representation relating to the products or services concerned. The Company
reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.
For the latest product information, log on to www.zetex.com
Americas
Zetex Inc
700 Veterans Memorial Hwy
Hauppauge, NY 11788
USA
Telephone: (1) 631 360 2222
Fax: (1) 631 360 8222
usa.sales@zetex.com
Asia Pacific
Zetex (Asia) Ltd
3701-04 Metroplaza Tower 1
Hing Fong Road, Kwai Fong
Hong Kong
Telephone: (852) 26100 611
Fax: (852) 24250 494
asia.sales@zetex.com
Corporate Headquarters
Zetex Semiconductors plc
Zetex Technology Park
Chadderton, Oldham, OL9 9LL
United Kingdom
Telephone (44) 161 622 4444
Fax: (44) 161 622 4446
hq@zetex.com
ISSUE 1 - OCTOBER 2005
SEMICONDUCTORS
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