Datasheet XC5204PQ160 Specification

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XC5200 Series Field Programmable Gate Arrays

November 5, 1998 (Version 5.2)

Features

• Low-cost, register/latch rich, SRAM based

07*

Product Specification

- Footprint compatibility in co mm on pa ck ag es within

- Over 150 device/package combinations, including

reprogrammable architecture

-0.5µm three-layer metal CMOS process technology

- 256 to 1936 logic cells (3,000 to 23,000 “gates”)

- Price competitive with Gate Arrays

• System Level Features

- System performance beyond 50 MHz

• Fully Supported by Xilinx Development System

- Automatic place and route software

- Wide selection of PC and Workstation platforms

- Over 100 3rd-party Allian ce inte rf aces

- Supported by shrink-wrap Foundation software

- 6 levels of interconnect hierarchy

- VersaRing

™

I/O Interface for pin-locking

Description

- Dedicated carry logic for high-speed arithmetic functions

- Cascade chain for wide input functions

- Built-in IEEE 1149.1 JTAG boundary scan test circuitry on all I/O pins

- Internal 3-state bussin g ca pa bilit y

- Four dedicated low-skew clock or signal distribution nets

• Versatile I/O and Packaging

- Innovative VersaRing

™

I/O interface provides a high

logic cell to I/O ratio, with up to 244 I/O signals

- Programmable output slew-rate control maximizes performance an d reduces noise

- Zero Flip-Flop hold time for input registers simplifies system timing

- Independent Output Enables for external bussing

The XC5200 Field-Programmable Gate Array Family is engineered to deliver low cost. Building on experiences gained with three previous successful SRAM FPGA families, the XC5200 family brings a robust feature set to programmable logic design. The VersaBlock

the VersaRing I/O interface, and a rich hierarchy of interconnect resources combine to enhance design flexibility and reduce time-to-market. Complete support for the XC5200 family is delivered through t he familia r Xilinx soft ware environme nt. The XC52 00 fa mily is f ully su pported on popular workstation and PC platforms. Popular design entry methods are fully supported, includ ing ABEL, schematic capture, VHDL, and Verilog HDL synthesis. Designers utilizing logic s ynthesis can use th eir existing tools to design with the XC5200 devices.

Table 1: XC5200 Field-Programmable Gate Array Family Members

the XC5200 Series and with the XC4000 Series

advanced BGA, TQ, and VQ packaging available

™

logic module,

Device XC5202 XC5204 XC5206 XC5210 XC5215

Logic Cells 256 480 784 1,296 1,936 Max Logic Gates 3,000 6,000 10,000 16,000 23,000 Typical Gate Range 2,000 - 3,000 4,000 - 6,000 6,000 - 10,000 10,000 - 16,000 15,000 - 23,000 VersaBlock Array 8 x 8 10 x 12 14 x 14 18 x 18 22 x 22 CLBs 64 120 196 324 484 Flip-Flops 256 480 784 1,296 1,936 I/Os 84 124 148 196 244 TBUFs per Longline 1014162024

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XC5200 Family Compared to

XC4000/Spartan™ and XC3000 Series

For readers alrea dy familiar with th e XC4000/S partan and XC3000 FPGA Families, this section describes sig nificant differences between them and the XC5200 family. Unless otherwise indicated, comparisons refer to both XC4000/Spartan and XC3000 devices.

Configurable Logic Block (CLB) Resources

Each XC5200 CLB c ontai n s fo ur inde pe nde nt 4- inp ut fu nc tion generators and four registers, which are configured as

four indepe ndent L ogic Ce lls™ ( LCs). The re gisters in e ach XC5200 LC are optionally configurable as edge-triggered D-type flip-flops or as transparent level-sensitive latches.

The XC5200 CLB includes dedicated carry logic that provides fast arithmetic ca rry capability. The dedicated carry logic may also be used to cascade function generators for implementing wide arithmetic functions.

XC4000 family:

decoders. Wide decoders are implemented using cascade logic. Although sa crificing s peed for s ome desig ns, lack of wide edge decoders reduces the die area and hence cost of the XC5200.

XC4000/Spartan family:

differs from that o f the XC4000/Spar tan family in that the sum is generated in an additional function generator in the adjacent column. This design reduces XC5200 die size and hence cost for many applications. Note, however, that a loadable up/down counter requires the same number of function gener ators in bo th families . XC3000 has no d edicated carry.

XC4000/Spartan family:

mized for cost and hence cannot im plement RAM.

Input/Output Block (IOB) Resources

The XC5200 family maintains footprint compatibility with the XC4000 family, but not with the XC3000 family.

T o minimize cost and maximize the number of I/O per Logic Cell, the XC5200 I/O does not incl ude flip-flops or latches.

For high performance paths, the XC5200 family provides direct connections from each IOB to the registers in the adjacent CLB i n order to emulate IOB registers.

Each XC5200 I/O Pin provides a programmable delay element to contro l input s et-up tim e. This element can be used to avoid potential hold-time problems. Each XC5200 I/O Pin is capable of 8-mA source and si nk currents.

IEEE 1149.1-type boundary scan is supported in each XC5200 I/O.

XC5200 devices have no wide edge

XC5200 dedicated carry logic

XC5200 lookup tables are opti-

Table 2: Xilinx Field-Programmable Gate Array Families

Parameter XC5200 Spartan XC4000 XC3000

CLB function generators

CLB inputs 20 9 9 5 CLB outputs 12 4 4 2 Global buffers 4 8 8 2 User RAM no yes yes no Edge decoders no no yes no Cascade chain yes no no no Fast carry logic yes yes yes no Internal 3-state yes yes yes yes Boundary scan yes yes yes no Slew-rate control yes yes yes yes

4332

Routing Resources

The XC5200 family provides a flexible coupling of logic and local routing res ourc es ca lled t he VersaBlock . The XC5 200 Ver saBlock elemen t incl udes t he CLB, a Loc al In terconne ct Matrix (LIM), and direct connects to neighboring VersaBlocks.

The XC5200 provides four global buffers for clocking or high-fanout co nt rol s igna l s. Ea ch bu f f er may b e s ou rced by means of its dedicated pad or from any internal source.

Each XC5200 TBUF ca n dr i ve up t o t wo h ori zo nt al a nd t w o vertical Longlines. There are no internal pull-ups for XC5200 Longlines.

Configuration and Readback

The XC5200 supports a new configuration mode called Express mode.

XC4000/Spartan family:

global reset but not a global set. XC5200 devices use a different configuration process than

that of the XC 3000 f ami ly, but use t he s ame p ro cess as th e XC4000 and Spartan families.

XC3000 family:

fer, XC5200 devices may be used in daisy chains with XC3000 devices.

XC3000 family:

gle-function input pin that overrides all other inputs. The PROGRAM pin does not exist in XC3000.

Although their configuration processes dif-

The XC5200 PROGRAM pin is a sin-

The XC5200 family provides a

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XC5200 Series Field Programmable Gate Arrays

XC3000 family:

XC5200 devices support an additional pro -

gramming mode: Peripheral Synchronous.

XC3000 family:

The XC5200 family does not support Power-down, but of f ers a Glo bal 3- sta te input that does not reset any flip-flops.

XC3000 family:

The XC5200 family does not provide an on-chip crystal oscillato r amplifier, but it does provide an internal oscillator fro m whic h a variet y of fre quen cies up to 12 MHz are available.

Architectural Overview

Figure 1 presents a simplified, conceptual overview of the

XC5200 architecture. Similar to conventional FPGAs, the XC5200 family consists of programmable IOBs, programmable logic blocks, and programmable interconnect. Unlike other FPGAs, however, the logic and local routing resources of th e XC5200 family are combin ed in flexible VersaBlocks (Figure 2). General-purpose routing connects to the VersaBlock through the General Routing Matrix (GRM).

VersaBlock: Abundant Local Routing Plus V ersatile Log ic

The basic logic elemen t in ea ch VersaBlock structure is the Logic Cell, shown in Figure 3. Each LC contains a 4-input function generator (F), a storage device (FD), and control logic. There are five independent inputs and three outputs to each LC. The independence of the inputs and outputs allows the software to maximize the resource utilization within each LC. Each Logic Cell also contains a direct feedthrough path that does not sacrifice the use of either the function gen erator or the register ; this featu re is a fi rst for FPGAs. The st orage devic e is configu rable as ei ther a D flip-flop or a latch. The control logic consists of carry logic for fast implementation of arithmetic functions, which can also be configured as a cascade chain allowing decode of very wide input functions.

Input/Output Blocks (IOBs)

VersaRing

GRM

VersaRing

GRM

Versa-

Block

Versa-

Block

Versa-

Block

GRM

Versa-

Block

GRM

Versa-

Block

GRM

Versa-

Block

VersaRing

GRM

Versa-

Block

Versa-

Block

Versa-

Block

Figure 1: XC5200 Architectural Overview

GRM

4 4

CLB

LC3 LC2 LC1 LC0

Direct Connects

4 4

LIM

Figure 2: VersaBlock

VersaRing

X4955

X5707

November 5, 1998 (Version 5.2) 7-85

F4 F3 F2 F1

CI CE CK CLR

Figure 3: XC5200 Logic Cell (Four LCs per CLB)

X4956

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The XC5200 CLB consists of four LCs, as shown in

Figure 4. Each CLB has 20 independent inputs and 12

independent outputs. The top and bottom pairs of LCs can be configured to implement 5-input functions. The challenge of FPGA implementation software has always been to maximize the usage of logic resources. The XC5200 family addresses this issue by surrounding each CLB with

two types of local inter connect — the Local Interconne ct Matrix (LIM) and direct connects. These two interconnect resources, combine d with the CLB, form the VersaBlock, represented in Fi gure 2.

F4 F3 F2 F1

LC3

LC2

F4 F3

F2 F1

LC1

F4 F3 F2 F1

LC0

CI CE CK CLR

X4957

Figure 4: Configurable Logic Block

The LIM provides 100% connectivity of the inputs and outputs of each LC in a given CLB. The benefit of the LIM is that no general routing resources are required to connect feedback paths within a CLB. The LIM connects to the GRM via 24 bidirectional nodes.

The direct connects allow immediate connections to neighboring CLBs, once again without using any of the general interconnect. These two layers of local routing resource improve the granularity of the architecture, effe ctively making the XC5200 family a “sea of logic cells.” Each Versa-Block has four 3-state buffers that share a common enable line and directly drive horizontal and vertical Longlines, creating robust on-chip bussing capability. The VersaBlock allows fast, local impleme ntation of log ic functions, effectively imple menting user designs in a hier archical fashion. These resources also minimize local routing congestion and improve the efficiency of the general interconnect, which is used for connecting larger groups of logic. It is this combination of both fine-grain and coarse-grain architecture attributes that maximize logic utilization in the XC5200 family. This symmetrical structure takes full advantage of the third metal layer, freeing the placement software to pack user logic optimally with minimal routing restrictions.

VersaRing I/O Interface

The interface between the IOBs an d core logic has been redesigned in the XC5200 family. The IOBs are completely decoupled from the core logic. The XC5200 IOBs contain dedicated boundary-scan logic for added board-level testability, but do not include input or output registers. This approach allows a maximum number of IOBs to be placed around the device, improving the I/O-to-gate ratio and decreasing the cost per I/O. A “freeway” of interconnect cells surrounding the device forms the VersaRing, which provides connec tions from the IOBs to the internal logic . These incremental routing resources provide abundant connections from each IOB to the nearest VersaBlock, in addition to Longline connections surrounding the device. The VersaRing eliminates the historic trade-off between high logic utilization and pin placement flexibility. These incremental edge re so urce s giv e u se rs incre ase d fle xibilit y in preassigning (i.e., locking) I/O pins before completing their logic designs. Th is ability acce lerates tim e-to-mar ket, since PCBs and other system components can be manufactured concurrent with the logic design.

General Routing Matrix

The GRM is functionally similar to the switch matrices found in other architectures, but it is novel in its tight coupling to the logic resources contained in the VersaBlocks. Advanced simulation tools were used during the development of the XC5200 architecture to determine the optimal level of routing resources required. The XC5200 family contains six levels of interconnect hierarchy — a series of

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XC5200 Series Field Programmable Gate Arrays

single-length lines, double-length lines, and Longlines all routed through the GRM. The direct connects, LIM, and logic-cell feedthrough are contained within each Versa-Block. Throughout the XC5200 interconnect, an efficient multiplexing sc heme, in c ombination with thre e layer metal (TLM), w as used to impro ve the overall efficiency of silicon usage.

Performance Overview

The XC5200 family has been benchmarked with many designs running synchronous clock rates beyond 66 MHz. The performance of an y design depe nds on the circ uit to be implemented, a nd t he d elay through the co m bin at or ial an d sequential logic elements, plus the delay in the interconnect routing. A rough estimate of timing can be made by assuming 3-6 ns per logic level, which includes direct-connect routing delays, depending on speed grade. More accurate estimations can be made using the information in the Switching Characteristic Guideline section.

Takin g Advantage of Reconfiguration

FPGA devices can be recon figured to ch ange l ogic fu nction while resident in the s ystem. T his capab ility gives the system designer a new degree of freedom not available with any other type of logic.

Hardware can be changed as easily as software. Design updates or modifications are easy, and can be made to products alrea dy in the fie ld. A n FPGA can even be reco nfigured dynamically to perform different functions at different times.

Reconfigurable logic can be used to implement system self-diagnostics, create systems capable of being reconfigured for different environments or operations, or implement multi-purpose hardware for a given application. As an added benefit, using reconfigurable FPGA devices simplifies hardware design and debugging and shortens product time-to-market.

Detailed Functional Description

Configurable Logic Blocks (CLBs)

Figure 4 shows the logic in the XC5200 CLB, which con-

sists of four Logic Cells (LC[3:0]). Each Logic Cell consists of an independent 4-input Lookup Table (LUT), and a D-Type flip-flop or latch with c ommon cloc k, clock enable, and clear, but individually selectable clock polarity. Additional logic features provided in the CLB are:

• An independent 5-in put LUT by combining two 4-input LUTs.

• High-speed carry propagate logic.

• High-speed pattern decoding.

• High-speed direct connection to flip-flop D-inputs.

• Individual selection of either a transparent,

level-sensitive latch or a D flip-flop.

• Four 3-state buffers with a shared Output Enable.

5-Input Functions

Figure 5 illustrates how the outputs from the LUTs from

LC0 and LC1 can be combined with a 2:1 multiplexer (F5_MUX) to provide a 5-input function. The outputs from the LUTs of LC2 and LC3 can be similarly combined.

I1 I2 I3 I4

F4 F3 F2

F5_MUX

F4 F3

F2 F1

5-Input Function

CKCE

CLR

LC1

LC0

out

Qout

X5710

November 5, 1998 (Version 5.2) 7-87

Figure 5: Two LUTs in Parallel Combined to Create a 5-input Function

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XC5200 Series Field Programmable Gate Arrays

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carry out

A3 or B3

A3 and B3 to any two

A2 or B2

A2 and B2 to any two

A1 or B1

A1 and B1 to any two

A0 or B0

A0 and B0 to any two

CY_MUX

CKCE CLR

carry in

F4 F3

XOR

F2 F1

F4 F3

XOR

F2 F1

F4 F3

XOR

F2 F1

F4 F3

XOR

F2 F1

LC3

LC2

LC1

LC0

carry3

half sum3

carry2

half sum2

carry1

half sum1

carry0

half sum0

F4 F3

XOR

F2 F1

sum3

LC3

F4 F3

XOR

F2 F1

sum2

LC2

F4 F3

XOR

F2 F1

sum1

LC1

F4 F3 F2

XOR

CE CLR

sum0

LC0

F=0

CY_MUX

Initialization of carry chain (One Logic Cell)

X5709

Figure 6: XC5200 CY_MUX Used for Adder Carry Propagate

Carry Function

The XC5200 family supports a carry-logic feature that enhances the performance of arithmetic functions such as counters, adders, etc. A c arry m ultiplexe r (CY_ MUX) symbol is used to indicate the XC5200 carry logic. This symbol represents the dedicated 2:1 multiplexer in each LC that performs the one-bit high-speed carry propagate per logic cell (four bits per CLB).

While the carry propagate is performed inside the LC, an adjacent LC must be used to complete the arithmetic function. Figure 6 represents an example of an adder function. The carry propagate is performed on the CLB shown,

which also generat es the half -sum fo r the four -bit ad der . A n adjacent CLB is responsible fo r XORing the half-su m with the corresponding carry-out. Thus an adder or counter requires two LCs per bit. Notice that the carry chain requires an initialization stage, which the XC5200 family accomplishes using the carry initialize (CY_INIT) macro and one additional LC. The carry chain can propagate vertically up a column of CLBs.

The XC5200 library contains a set of Relationally-Placed Macros (RPMs) and arithmetic func tions designed to take advantage of the dedicated carry logic. Using and modifying these macros m akes it much easie r to implement cus-

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XC5200 Series Field Programmable Gate Arrays

tomized RPMs, freeing the designer from the need to become an expert on architecture s.

cascade out

A15 A14 A13 A12

A11 A10 A9 A8

F4 F3

AND

F2 F1

F4 F3

AND

F2 F1

F3 A5 A4

A3 A2 A1 A0

AND

F=0

CY_MUX

cascade in

CY_MUX

Initialization of carry chain (One Logic Cell)

CE CLR

LC3

LC2

LC1

LC0

out

X5708

Figure 7: XC 5200 CY_MU X Used f or Decoder Cascade Logic

Cascade Function

Each CY_MUX can be connected to the CY_MUX in the adjacent LC to provide cascadable decode logic. Figure 7 illustrates how the 4- input func tion gener ator s can be configured to take advantage of these four cascaded CY_MUXes. Note th at AND an d OR casca ding are spec ifi c cases of a general decode. In AND cascading all bits are decoded equal to logic one, while in OR cascading all bits are decoded equ al to logic ze ro. The flexib ility of the LUT achieves this result. The XC5200 library contains gate macros designed to take advantage of this function.

CLB Flip-Flops and Latches

The CLB can pass the combinatorial output(s) to the interconnect network, but can also store the combinatorial

results or other incoming data in flip-flops, and connect their outputs to the interconnect network as well. The CLB storage elements can also be configured as latches.

Table 3: CLB Storage Element Functionality (active rising edge is shown)

Mode CK CE CLR D Q

Power-Up or

XXXX0 XX1X0

Flip-Flop

__/

1* 0* D D

0X0*XQ

Latch

11*0*XQ 01*0*DD

Both X 0 0* X Q

Legend:

__/

0* 1*

Don’t care Rising edge Input is Low or unconnected (default value) Input is High or unconnecte d (default value)

Data Inputs and Outputs

The source of a storage element data input is programmable. It is driven by the function F, or by the Direct In (DI) block input. The flip-flops or latches drive the Q CLB outputs.

Four fast feed-through paths from DI to DO are available, as shown in Figure 4. This bypass is sometimes used by the automated router to repower internal signals. In addition to the storage element (Q) and direct (DO) outputs, there is a combinatorial output (X) that is always sourced by the Lookup Table.

The four edge-triggered D-type flip-flops or level-sensitive latches have common clock (CK) and clock enable (CE) inputs. Any of the clock inputs can also be permanently enabled. Storage element functionality is described in

Table 3.

Clock Input

The flip-flops ca n b e trig ger ed o n e ith er th e risin g or fa lling clock edge. The clock pin is shared by all four storage elements with individual polarity control. Any inverter placed on the clock input is automatically absorbed into the CLB.

Clock Enable

The clock enable signal (CE) is active High. The CE pin is shared by the four storage elements. If left unconnected for any, the clock enable for that storage element defaults to the active state. CE is not invertible within the CLB.

Clear

An asynchrono us st orage el ement input ( CLR) can be us ed to reset all four flip- flops or latches in t he CLB. This input

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XC5200 Series Field Programmable Gate Arrays

Figure 8: Schematic Symbols for Global Reset

Product Obsolete or Under Obsolescence

can also be indep en dentl y dis ab led f or any fli p -fl op . CLR is active High. It is not invertible within the CLB.

STARTUP

PAD

IBUF

GR GTS

CLK

Q2 Q3

Q1Q4

DONEIN

X9009

Global Reset

A separate Global Reset line clears each storage element during power-up, reconfiguration, or when a dedicated Reset net is driven active. This global net (GR) does not compete with other routing resources; it uses a dedicated distribution networ k.

GR can be driven from any user-programmable pin as a global reset input. To use this global net, place an input pad and input buffer in the schematic or HDL code, driving the GR pin of the STARTUP symbol. (See Figure 9.) A specific pin location can be assigned to this input using a LOC attribute or property, just as with any other user-programmable pad. An inverter can optionally be inserted after the input buffer to invert the sense of the Global Reset signal. Alternatively, GR can be driven from any internal node.

Using FPGA Flip-Flops and Latches

The abundance of flip-flops in the XC5200 Series invites pipelined desi gns. This is a po werful way of i ncreas in g performance by breaking the function into smaller subfunctions and executing them in parallel, passing on the results through pipe li ne f li p- f lops . This me th od sh oul d be se ri o us ly considered wherever throughput is more important than latency.

To include a CLB flip-flop, place the appropriate library symbol. For example, FD CE is a D -ty pe f li p-f lo p wit h c loc k enable and asynchronous clear. The corresponding latch symbol is called LDCE.

In XC5200-Series devices, the flip-flops can be used as registers or shift registers without blocking the function generators from performing a different, perhaps unrelated task. This ability increases the functional capacity of the devices.

The CLB setup time is specified between the function generator inputs and the clock input CK. Therefore, the specified CLB flip-flop setup time includes the delay through the function generator.

Three-State Buffers

The XC5200 family has four dedicated Three-State Buffers (TBUFs, or BUFTs in the sche matic library) per CLB (see

Figure 9). The four buffers are individually configurable

through four configuration bits to operate as simple non-inverting buffers or in 3-state mode. When in 3-state mode the CLB output enable (TS) control signal drives the enable to all four buffers. Each TBUF can drive up to two horizontal an d/or t wo vertic al Lon glines. These 3- state buf fers can be used to implement multiplexed or bidirectional buses on the horizontal or vertical longlines, saving logic resources.

The 3-state buffer e nable is an ac tive-High 3- state (i.e. an active-Low enable), as shown in Table 4.

Table 4: Three-State Buffer Functionality

IN T OUT

X1Z

IN 0 IN

Another 3-stat e buffer with similar acce ss is located near each I/O block along the right and left edges of the array.

The longlines driven by the 3-state buffers have a weak keeper at each end. This circuit prevents undefined floating levels. However, it is overridden by any driver. To ensure the lon glin e goes high when n o bu ffers ar e on , add an additional BUFT to drive the output High du ring al l of t he previously undefined states.

Figure 10 shows how to use the 3-state buffers to imple-

ment a multiplexer. The selection is acco mplished by the buffer 3-state signal.

CLB

LC3

LC2

LC1

LC0

Horizontal Longlines

X9030

7-90 November 5, 1998 (Version 5.2)

Figure 9: XC5200 3-State Buffers

Page 9

PAD

Vcc

X9001

Input

Buffer

Delay

Pullup

Pulldown

Slew Rate

Control

Output Buffer

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

• A + DB • B + DC • C + DN • N

Z = D

~100 k

Ω

ABCN

"Weak Keeper"

BUFT BUFT BUFT BUFT

Figure 10: 3-State Buffers Implement a Multip lexer

Input/Output Blocks

User-configurable input/output blocks (IOBs) provide the interface betwee n external package pins and the inte rnal logic. Ea ch IOB controls one package pin and can be configured for input, output, or bidirectional signals.

The I/O block, shown in Figure 11, consists of an input buffer and an output buffer. The output driver is an 8-mA full-rail CMOS buffer with 3-state control. Two slew-rate control modes are supported to minimize bus transients. Both the o ut put bu ffer and the 3-state co ntro l a re i n ve rti bl e . The input buffer has globally selected CMOS or TTL input thresholds. T he input bu ffer is invertib le and also provides a programmable delay line to assure reliable chip-to-chip set-up and hold times. Minimum ESD protec tion is 3 KV using the Human Body Model.

Figure 11: XC5200 I/O Block

IOB Input Signals

The XC5200 inputs can be globally configured for either TTL (1.2V) or CMOS thresholds , using an option in the bitstream generation software. There is a slight hysteresis of about 300mV.

The inputs of XC5200-Series 5-Volt devices can be driven by the outputs o f any 3. 3-V olt device, if the 5- V olt inputs ar e in TTL mode.

Supported sources for XC5200-Series device inputs are shown in Table 5.

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X6466

Table 5: Supported Sources for XC5200-Series Device Inputs

XC5200 Input Mode

Source

Any device , Vcc = 3.3 V, CMOS outputs

Any device, Vcc = 5 V, TTL outputs

Any device, Vcc = 5 V, CMOS outputs

5 V,

TTL

√

CMOS

Unreliable

√

√√

Optional Delay Guarantees Zero Hold Time

XC5200 devices do no t have storage el ements in the IOB s. However, XC5200 IOBs can be efficiently routed to CLB flip-flops or latches to store the I/O signals.

The data input to th e re gister can o ption ally be d elaye d by several nanoseconds. With the delay enabled, the setup time of the input flip -flop is increa sed so that n ormal clock routing does not result in a positive hold-time requirement. A positive hold time requirement can lead to unreliable, temperature- or processing-dependent operation.

The input flip-flop setup time is defined between the data measured at the de vice I/O pin and the clock inpu t at the CLB (not at the clock pin). Any routing delay from the device clock pin to the clock input of the CLB must, therefore, be subtracted from this setup time to arrive at the real setup time requirement relative to the device pins. A short specified setup time might, therefore, result in a negative setup time at the device pins, i.e., a positive hold-time requirement.

When a delay is i nser t ed on th e data l ine , mor e c loc k de l ay can be tolerated without causing a positive hold-time requirement. Sufficient dela y eliminat es the poss ibility of a data hold-time requirement at the external pin. The maximum delay is therefore inserted as the software default.

The XC5200 IO B has a one-ta p delay elemen t: either the delay is insert ed (defau lt), or i t is not. The delay guarante es a zero hold time with respect to clocks routed through any of the XC5200 global clock buffers. (See “Global Lines” on

page 96 for a description of the global clock buffers in the

XC5200.) For a shorter input register setup time, with

5 V,

Data

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XC5200 Series Field Programmable Gate Arrays

Figure 12: Open-Drain Output

Product Obsolete or Under Obsolescence

non-zero hold, attach a NODELAY attribute or property to the flip-fl op or input buffer.

IOB Output Signals

Output signals can be optionally inverted within the IOB, and pass directly to the pad. As with the inputs, a CLB flip-flop or latch can be used to store the output signal.

An active-High 3-state signal can be used to place the output buffer in a high-impedance state, implementing 3-state outputs or bidirectional I/O. Under configuration control, the output (OUT) and output 3-state (T) signals can be inverted. The polarity of these signals is independently configured for each IOB.

The XC5200 devi ces p rovid e a gua rant eed out put sin k current of 8 mA.

Supported destinations for XC5200-Series device outputs are shown in Table 6.(For a detailed disc ussion of how to interface between 5 V and 3.3 V devices, see the 3V Products section of

An output can be co nfi gure d as open- drain (open -col lect or) by placing an OBUFT symbol in a schematic or HDL code, then tying the 3-state pin (T) to the output signal, and the input pin (I ) to Ground. (See Figure 12.)

Table 6: Supported Destinations for XC5 200-Series Outputs

XC5200 device, V CMOS-threshold inputs

Any typical devi ce, V CMOS-threshold inputs

Any device, VCC = 5 V, TTL-threshold inputs

Any device, V CMOS-threshold inputs

1. Only if destination device has 5-V tolerant inp uts

The Programmable Logic Data Book

XC5200 Output Mode

Destination

=3.3 V,

= 3.3 V,

= 5 V,

OPAD

OBUFT

5 V,

CMOS

√

some

√

X6702

For XC5200 devices, maximum total capacitive load for simultaneous fast mo de switching in the sam e direction is 200 pF for all packag e pins between ea ch Power/Ground pin pair. For some XC5200 devices, additional internal Power/Ground pin pairs are connected to special Power and Ground planes within the packages, to reduce ground bounce.

For slew-rate limited outputs this total is two times larger for each device type: 400 pF for XC5200 devices. This maximum capacitive load should not be exceeded, as it can result in ground bounce of greater tha n 1.5 V amplitud e and more than 5 ns duration. This level of ground bounce may cause undesired transient behavior on an output, or in the internal logic. This r estriction is commo n to all high-spe ed digital ICs, and is not particular to Xilinx or the XC5200 Series.

XC5200-Series devices have a feature called “Soft Start-up,” de sig ned to reduc e groun d boun ce whe n all ou tputs are turned on simultaneously at the end of configuration. When the configuration process is finished and the device starts up, the first activation of the outputs is automatically slew-rate limited. Immediately following the initial activation of the I/O, the slew rate of the individual outputs is determined by the individual configuration option for each IOB.

Global Three-State

A separate Global 3-State line (not shown in Figure 11) forces all FPGA outputs to the high-impedance state, unless boundary scan is enabled and is executing an EXTEST instruction. This global net (GTS) does not compete with othe r rou tin g res ources ; i t uses a dedi cate d di stribution network.

GTS can be driven from any user-programmable pin as a global 3-state input. To use this global net, place an input pad and input buffer in the schematic or HDL code, driving the GTS pin of the STARTUP symbol. A specific pin location can be assigned to this input using a LOC attribute or property, just as with any other us er-prog rammabl e pad. A n inverter can optionally be inserted after the input buffer to invert the sens e of the Gl obal 3-S tate si gnal. Us ing GTS is similar to Global Reset. See Figure 8 on page 90 for details. Alternatively, GTS can be driven from any internal node.

Other IOB Options

There are a number of other programmable options in the XC5200-Series IOB.

Output Slew Rate

The slew rate of each output buffer is, by default, reduced, to minimize power bus tran sient s when switchin g non-cr itical signals. For critical sig nals, attach a FAST attribute or property to the output buffer or flip-flop.

7-92 November 5, 1998 (Version 5.2)

Pull-up and Pull-down Resistors

Programmable IOB pull-up and pull-down resistors are useful for tying unused pins to Vcc or Ground to minimize power consumption and reduce noise sensitivity. The configurable pull-up resistor is a p-channel transistor that pulls

Page 11

Product Obsolete or Under Obsolescence

to Vcc. The confi gurabl e pull-d own resi stor is an n-chan nel transistor that pulls to Ground.

The value of these resistors is 20 kΩ − 100 kΩ. This high value makes them unsuit able as wired-AND pull-u p resistors.

The pull-up resi stors f or most u ser-pr ogrammable IOBs are active during th e configuration process. Se e Table 13 on

page 124 for a list of pins with pull-ups active before and

during configuration. After configuration, voltage levels of unused pads, bonded

or unbonded, must be valid logic levels, to reduce noise sensitivity and avoid excess current. Therefore, by default, unused pads are configured with the internal pull-up resistor active. Alternatively, they can be individually configured with the pull-down resistor, or as a driven output, or to be driven by an external source. To activate the internal pull-up, attach the PULLUP library component to the n et attached to the pad. To activate the internal pull-down, attach the PULLDOWN library component to the net attached to the pad.

JTAG Support

Embedded logic attached to the IOBs contains test structures compatible with IEEE Standard 1149.1 for boundary scan testing, simplifying board-level testing. More information is provided in “Boundary Scan” on page 98.

Oscillator

XC5200 devices include a n internal os cillator. This oscillator is used to clock the powe r-on time-ou t, c lear co nfigu ration memory, and source CCLK in Master configuration modes. The oscillator ru ns at a n omi n al 12 M Hz fr e qu en cy that varies with process, Vcc, and temperature. The output CCLK frequency is selectable as 1 MHz (default), 6 MHz, or 12 MHz.

The XC5200 oscillator divides the internal 12-MHz clock or a user clock. The user then has the choice of dividing by 4, 16, 64, or 256 for the “OSC1” output and dividing by 2, 8, 32, 128, 1024, 4096, 16384, or 65536 for the “OSC2” output. The division is specified via a “DIVIDEn_BY=x” attribute on the symbol, where n=1 for OSC1, or n=2 for OSC2. These frequencies can vary by as much as -50% or + 50%.

The OSC5 macro is used where an internal oscillator is required. The CK_DIV macro is applicable when a user clock input is specified (see Figure 13).

XC5200 Series Field Programmable Gate Arrays

OSCS

CK_DIV

Figure 13: XC5200 Oscillator Macros

OSC1 OSC2

5200_14

VersaBlock Routing

The General Routing Matrix (GRM) connects to the Versa-Block via 24 bidirectional ports (M0-M23). Excluding direct connections, global nets, and 3-statable Longlines, all VersaBlo ck i np ut s and ou tp ut s con ne ct to th e GR M vi a these 24 ports. Four 3-statable unidirectional signals (TQ0-TQ3) drive out of the VersaBlock directly onto the horizontal and vertical Longlines. Two horizontal global nets and two vertical global nets connect directly to every CLB clock pin; the y can conn ect to ot her CLB inp uts via th e GRM. Each CLB also has four unidirectional direct connects to each of its four neighboring CLBs. These direct connects can also feed directly back to the CLB (see

Figure 14).

In addition, ea ch C LB ha s 1 6 dir ec t in p ut s, four direct con nections from each of the neighboring CLBs. These direct connections provide high-speed local routing that bypasses the GRM.

Local Interconnect Matrix

The Local Inter connect M atrix (L IM) is built from in put and output multiplexers. The 13 CLB outputs (12 LC outputs plus a V outputs via the output multiplexers, which consist of eight fully populated 13-to-1 multiplexers. Of the eight

VersaBlock outputs, four signals drive each neighboring CLB directly, and provide a di rect feed back path to the inp ut multiplexers. The four remaining multiplexer outputs can drive the GRM through four TBUFs (TQ0-TQ3). All eight multiplexer outputs can connect to the GRM through the bidirection al M0- M23 s ign al s . A ll ei gh t s i gna ls a lso c on ne ct to the input multiplexers and are potential inputs to that CLB.

/GND signal) connect to the eight VersaBlock

November 5, 1998 (Version 5.2) 7-93

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XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

To GRM M0-M23

Direct West

Global Nets

North

South

East

West

Direct North

Feedback

Input

Multiplexers

CLK CE CLR

OUT

CLB

LC3

LC2

LC1

LC0

/GND

Output

Multiplexers

To Longlines

and GRM TQ0-TQ3

Direct to

East

Direct South

Figure 14: VersaBlock Details

CLB inputs have several possible sources: the 24 signals from the GRM, 16 direct connections from neighboring VersaBlocks, four signals from global, low-skew buffers, and the four signals from the CLB output multiplexers. Unlike the output multiplexers, the input multip lexers are not fully populated; i.e., only a subset of the available signals can be con nected to a given CLB in put. The fle xibility of LUT input swapping and LUT mapping compensates for this limitation. For example, if a 2-input NAND gate is required, it can be mapped into any of the four LUTs, and use any two of the four inputs to the LUT.

Direct Connects

The unidirectional direct-connect segments are connected to the logic input/output pins through the CLB input and output multiple xe r ar ra ys , and th us by pa ss t he g ene ra l rou t i ng matrix altogether. These lines increase the routing channel utilization, while simultaneously reducing the delay incurred in speed-critical connections.

X5724

The direct connects also provide a high-speed path from the edge CLBs to the VersaRing input/output buffers, and thus reduce pin-to-pin set-up time, clock-to-out, and combinational prop agation delay. Direct connects from the input buffers to the CLB DI pin (direct flip-flop input) are only available on the left and right edges of the device. CLB look-up table inputs and combinatorial/registered outputs have direct connects to input/output buffers on all four sides.

The direct connects are ideal for developing customized RPM cells. Using direct connects improves the macro performance, and leaves the other routing channels intact for improved routing. Direct connects can also route through a CLB using one of the four cell-feedthrough paths.

General Routing Matrix

The General R outing Matrix, shown in Figure 15, provide s flexible bidirectio nal connect ions to the Local Inter connect

7-94 November 5, 1998 (Version 5.2)

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Product Obsolete or Under Obsolescence

Matrix through a hierarchy of different-length metal segments in both the horizontal and vertical directions. A pro-

XC5200 Series Field Programmable Gate Arrays

GRM

Versa-

Block

GRM

Versa-

Block

GRM

Versa-

Block

Six Levels of Routing Hierarchy

LIM5

Single-length Lines

Double-length Lines

Direct Connects

Longlines and Global Lines

Local Interconnect Matrix Logic Cell Feedthrough

Path (Contained within each Logic Cell)

GRM

Versa-

Block

Versa-

Block

Versa-

Block

GRM

4 4

GRM

Versa-

Block

GRM

Versa-

Block

GRM

Versa-

Block

CLB

LC3

LC2 LC1

LC0

LIM

4 4

Figure 15: XC5200 Interconnect Structure

grammable interconnect point (PIP) establishes an electrical connection between two wire segments. The PIP, consisting of a pass transisto r switch controlled by a memo ry element, provides bidirectional (in some cases, unidirectional) connection between two adjoining wires. A collection of PIPs inside the General Routing Matrix and in the Local Interconnect Matrix provides connectivity between various types of metal segments. A hierarchy of PIPs and

November 5, 1998 (Version 5.2) 7-95

Direct Connects

X4963

associated routing segments combine to provide a powerful interco nnect hierarchy:

• Forty bidirectional single-length segments per CLB

provide ten routing channels to each of the four neighboring CLBs in four directions.

• Sixteen bi directional doub le-length segments per CLB

provide four routing channels to each of four other (non-neighbor ing ) CL Bs in four dir ec tio ns .

• Eight horizontal and eight vertical bidirectional Longline

Page 14

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

segments span the width and height of the chip, respectively.

Two low-skew horizontal and vertical unidirectional global-line segment s span each row and co lumn of the chip, respectively.

Single- and Double-Length Lines

The single- and double-length bidirectional line segments make up the bulk of the routing channels. The double-length lines hop across every other CLB to reduce the propagation del ays i n spe ed-cri tic al ne ts. R egene rating the signal strength is recommended after traversing three or four such segm ents. X ilinx place- and-route software a utomatically connects buffers in the path of the signal as necessary. Single- and double-len gth lines cannot drive onto Longlines and global lines; Longlines and global lines can, however, drive onto single- and double-length lines. As a general rule, Longline and global-line connections to the general routing matrix are unidirectional, with the signal direction from these lines toward the routing matrix.

Longlines

Longlines ar e used for hig h-fan-o ut sig nals, 3 -state b usses, low-skew nets, and faraway d e stinations. Row and column splitter PIP s in the middl e of the ar ray ef fecti vely doub le the total number of Longlines by electrically dividing them into two separated half-lines. Longlines are driven by the 3-state buffers in ea ch CLB, and are driv en by similar buffers at the periphery of the array from the VersaRing I/O Interface.

Bus-oriented desi gns ar e easil y impl emented by usin g Longlines in conju ncti on with the 3-st ate buf fe rs in th e CL B and in the VersaRing. Additionally, weak keeper cells at the periphery reta in the last valid logic level on the Longlin es when all buffers are in 3-stat e mode.

Longlines connect to the single-length or double-length lines, or to the logic inside the CLB, through the General Routing Matrix. The only manner in which a Longline can be driven is through the four 3-state buffers; therefore, a Longline-to-Longline or single-line-to-Longline connection through PIPs in the General Routing Matrix is not possible. Again, as a general rule, long- and global-line connections to the General Routing Matrix are unidirectional, with the signal direction from these lines toward the routing matrix.

carry/cascade logic described above, implementing a wide logic function in p lace of the wired func tion. In the c ase of 3-state bus a pplicat ions, t he user must in sure th at all s tates of the multiplexing function are defined. This process is as simple as adding an additional TBUF to drive the bus High when the previously undefined states are activated.

Global Lines

Global buffers in Xilinx FPGAs are special buffers that drive a dedicated routing network called Global Lines, as shown in Figure 16. This network is intended for high-fanout clocks or other c ontrol signals , to maxi mize spe ed and minimize skewing while distributing the signal to many loads.

The XC5200 family has a total of four global buffers (BUFG symbol in the library), each with its own dedicated routing channel. Two are distributed vertically and two horizontally throughout the FPGA.

The global lines provide direct input only to the CLB clock pins. The global lines also connect to the General Routing Matrix to provide ac cess from these lines to the function generators and other control signals.

Four clock input pads at the corners of the chip, as shown in Figure16, provide a high-s peed, low -skew c lock n etwork to each of the four global-line buffers. In addition to the dedicated pad, the global lines can be sourced by internal logic. PIPs from several routing channels within the VersaRing can also be configured to drive the global-line buffers.

Details of all the programmable interconnect for a CLB is shown in Figure 17.

GCK1

GCK4

The XC5200 famil y has no p ull -u ps on t he e nds of t he Lon glines sourced by TBUFs, unlike the XC4000 Series. Consequently, wired functions (i. e. , WAND and WORAND) and wide multiplexing functions requiring pull-ups for undefined states (i.e ., bus ap pl ic at ion s) must be i mp leme nt ed in a di fferent way. In the case of the wired functions, the same functionality can be achieved by taking advantage of the

7-96 November 5, 1998 (Version 5.2)

GCK2

Figure 16: Global Lines

GCK3

X5704

Page 15

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

x9010

SINGLE LONG

CARRY

DOUBLEGLOBAL

DIRECT

CLB

DIRECT

Figure 17: Detail of Programmable Interconnect Associated with XC5200 Series CLB

November 5, 1998 (Version 5.2) 7-97

DIRECT

LONG

GLOBAL

DOUBLE

SINGLE

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XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

VersaRing Input/Output Interface

The Vers aRing, shown in Figure 18, is positioned between the core logic and the pad ring; it has all the routing resources of a VersaBlock without the CLB logic. The VersaRing decouples the core logic from the I/O pads. Each VersaRing Cell provides up to four pad-cell connections on one side, and connects directly to the CLB ports on the other side.

VersaRing

GRM

VersaBlock

GRM

VersaBlock

Interconnect

4 4

Interconnect

4 4

Figure 18: VersaRing I/O Interface

Pad

X5705

Boundary Scan

The “bed of nails” has been the trad itional method of test ing electronic assemblies. This approach has become less appropriate, due to closer pin spacing and more sophisticated assembly methods like surface-mount technology and multi-layer boards. The IEEE boundary scan standard

1149.1 was developed to facilitate board-level testing of electronic assemblies. Design and test engineers can imbed a standard test logic structure in their device to achieve high fault coverage for I/O and internal logic. This structure is easily implemented with a four-pin interface on any boundary sca n-compatib le IC. IEEE 1 149.1- compatibl e devices may be serial daisy- chaine d toget her , connec ted in parallel, or a combination of the two.

XC5200 devices support all the mandatory boundary-scan instructions specified in the IEEE standard 1149.1. A Test Access Port (TAP) and registers are provided that implement the EXTEST, SAMPLE/PRELOAD, and BYPASS instructions. The TAP can also s upport two USERCODE instructions. When the boundary scan configuration option is selected, three normal user I/O pins become dedicated inputs for these functions. Another user output pin becomes the dedicated boundary scan output.

Boundary-scan operation is independent of individual IOB configuration and package type. All IOBs are treated as independently controlled bidirectional pins, including any unbonded IOBs. R etaining the bidirection al test capability after configura tion provides f lexibility for inte rconnect te sting.

Also, internal signals can be captured during EXTEST by connecting them to unbonded IOBs, or to the unused outputs in IOBs used as unidirectional input pins. This technique partially compensates for the lack of INTEST support.

The user can serially load commands and data into these devices to control the driving of their outputs and to examine their inputs. This method is an improvement over bed-of-nails testing. It avoids the need to over-drive device outputs, and it reduces the user interface to four pins. An optional fift h pin, a re set for the c ontrol logic, is describe d in the standard but is not implemented in Xilinx devices.

The dedicated on-chip logic implementing the IEEE 1149.1 functions in cl u des a 16- st a te mac hin e, an i nstr uc t i on r eg ister and a number of data registers. The functional details can be found in the IEEE 1149.1 specification and are also discussed in the Xilinx application note XAPP 017:

“Bound-

ary Scan in XC40 00 and XC5200 Series devices”

Figure 19 on page 99 is a diagram of the XC5200-Series

boundary scan logic. It includes three bits of Data Register per IOB, the IEEE 11 49.1 Test Access Port controller, and the Instruction Register with decodes.

The public boundary-scan instructions are always available prior to confi guration . After c onfig uration, the pub lic inst ructions and any USERCODE instructions are only available if specified in the design. While SAMPLE and BYPASS are available during configuration, it is recommended that boundary-scan operations not be performed during this transitory period.

In addition to the test instructions outlined above, the boundary-sca n circui try can be used t o config ure the FPGA device, and to read back the configuration data.

All of the XC4000 boundary-scan modes are supported in the XC5200 family. Three additional outputs for the UserRegister are provided (Reset, Update, and Shift), repre-

7-98 November 5, 1998 (Version 5.2)

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Product Obsolete or Under Obsolescence

senting the decoding of the corresponding state of the boundary-scan internal state machine.

XC5200 Series Field Programmable Gate Arrays

DATA IN

IOB IOB

IOB

TDI

M U

TDO

IOB

IOB IOB

IOB IOB IOB IOB IOB

IOB IOB IOB

BYPASS

INSTRUCTION REGISTER

BYPASS

IOB

D Q

IOB.O

IOB.T

IOB.I

IOB.O

TDO U X

TDI

IOB.T

IOB.I

IOB.O

SHIFT/

CAPTURE

D Q

DATAOUT UPDATE EXTEST

CLOCK DATA

1 0

0 1

1 0

0 1

1 0

0 1

Figure 19: XC5200-Series Boundary Scan Logic

November 5, 1998 (Version 5.2) 7-99

X1523_01

Page 18

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

XC5200-Series devi ces c an a lso be conf igu red t hrou gh t he boundary scan logic. See XAPP 017 for more information.

Data Registers

The primary data register is the boundary scan register. For each IOB pin in the FPGA, bonded or not, it includes three bits for In , Out and 3-State Contro l. Non-IOB pins have appropriate partial bit population for In or Out only. PROGRAM boundary scan register. Each EXTEST CAPTURE-DR state captur es all In, Out, and 3-State pins.

The data register also includes the following non-pin bits: TDO.T, and TDO.O, which are always bits 0 and 1 of the data register, respectively, and BSCANT.UPD, which is always the last bit of the data register. These three boundary scan bits are special-purp ose Xilinx te st sig nal s.

The other standard data register is the single flip-flop BYPASS register. It synchronizes data being passed through the FPGA to the next downstream boundary scan device.

The FPGA provides two additional data regis ters that can be specified using the BSCAN macro. The FPGA provides two user pins (BSCAN.SEL1 and BSCAN.SEL2) which are the decodes of two user ins truction s, USER1 an d USER2. For these instructions, two corresponding pins (BSCAN.TDO1 an d BSCAN.TDO 2) allow user scan data to be shifted out on TDO. The data register clock (BSCAN.DRCK) is available fo r control of test logic which the user may wish to implement with CLBs. The NAND of TCK and RUN-TEST-IDLE is also provided (BSCAN.IDLE).

, CCLK and DONE are not included in the

Instruction Set

The XC5200-Series boundary scan instruction set also includes instructions to configure the device and read back the configuration data. The instruction set is coded as shown in Table 7.

Table 7: Boundary Scan Instructions

Instruction I2

I1 I0

0 0 0 EXTEST DR DR 0 0 1 SAMPLE/PR

0 1 0 USER 1 BSCAN.

0 1 1 USER 2 BSCAN.

1 0 0 READBACK Readback

1 0 1 CONFIGURE DOUT Disabled 1 1 0 Reserved ——

1 1 1 BYPASS Bypass

Test

Selected

ELOAD

TDO Source

DR Pin/Logic

TDO1

TDO2

Data

I/O Data

Source

User Logic

Pin/Logic

—

Bit Sequence

The bit sequence within each IOB is: 3-State, Out, In. The data-register cells for the TAP pins TMS, TCK, and TDI have an OR-gate that permanently disables the output buffer if boundary-scan operation is selected. Consequently , it is im possibl e for t he outp uts in IO Bs used b y T A P inputs to conflict with TAP operation. TAP data is taken directly from the pin, and cannot be overwritten by injected boundary-scan data.

The primary global clock inputs (PGCK1-PGCK4) are taken directl y f ro m t he pin s, a nd ca nno t be ov erwr i tte n w it h boundary-scan data. However, if necessary, it is possible to drive the clock input from boundary scan. The external clock source is 3-stated, and the clock net is driven with boundary scan data through the output driver in the clock-pad I OB. If t he cloc k-pad I OBs are u sed for non-cl ock signals, the data may be overwritten normally.

Pull-up and pull-down resistors remain active during boundary scan. Before and during configuration, all pins are pulled up. After configuration, the choice of internal pull-up or pull-down resistor must be taken into account when designing test vectors to detect open-circuit PC traces.

From a cavity-up view of the chip (as shown in XDE or Epic), starting in the upper right chip corner, the boundary scan data-register bits are ordered as shown in Ta ble 8 . The device-specific pinout tables for the XC5200 Series include the boundary scan locati ons for each IOB pin.

Table 8: Boundary Scan Bit Sequence

Bit Position I/O Pad Location

Bit 0 (TDO) Top-edge I/O pads (right to left)

Bit 1 ...

... Left-edge I/O pads (top to bottom) ... Bottom-edge I/O pads (left to right) ... Right-edge I/O pads (bottom to top)

Bit N (TDI) BSCANT.UPD

BSDL (Boundary Scan Description Language) files for XC5200-Series devices are available on the Xilinx web site in the File Download area.

Including Boundary Scan

If boundary sc an is o nly to be use d duri ng c onfig urat ion, no special eleme nts nee d be in cluded i n the s chematic or HD L code. In this case, the special boundary scan pins TDI, TMS, TCK and TDO can be used for user function s after configuration.

T o in dicate that boundary scan remain enable d after conf iguration, incl ude the BSCAN library sym bol and connect pad symbols to the TDI, TMS, TCK and TDO pins, as shown in

Figure 20.

7-100 November 5, 1998 (Version 5.2)

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Figure 20: Boundary Scan Schematic Example

Product Obsolete or Under Obsolescence

From

User Logic

Optional

TDI TMS TCK TDO1 TDO2

IBUF

BSCAN

RESET

UPDATE

SHIFT

TDO

DRCK

IDLE SEL1 SEL2

To User

Logic

To User Logic

X9000

Even if the boundary scan symbol is used in a schematic, the input pins TMS, TCK, and TDI can still be used as inputs to be rout ed to interna l logic. Care must be take n not to force the chip into an undesired boundary scan state by inadvertently applying boundary scan input patterns to these pins. The simplest way to prevent this is to keep TMS High, and then apply whatever signal is desired to TDI and TCK.

XC5200 Series Field Programmable Gate Arrays

Typically, a 0.1 µF capacitor connected near the Vcc and Ground pins of the package will provide a dequate decoupling.

Output buf fers capa ble of driv ing/sink ing the spe cified 8 mA loads under specified worst-case conditions may be capa ble of driving/sinking up to 10 times as much current under best case conditions.

Noise can be reduced by minimizing external load capacitance and reducing simultaneous output transitions in the same direction. It may also be b eneficia l to loca te heav ily loaded output buf f ers ne ar t he G round p ads. Th e I/O Blo ck output buffers have a slew-rate limited mode (default) which should be used where output rise and fall times are not speed-critical.

GND

Ground and Vcc Ring for I/O Drivers

Avoiding Inadvertent Boundary Sca n

If TMS or TCK is used as user I/O, care must be taken to ensure that at leas t on e of th ese p ins is held co nsta nt du ring configuration. In some applications, a situation may occur where TMS or TCK is driven during configuration. This may cause the device to go into boundary scan mode and disrupt the configuration process.

To prevent activation of boundary scan during configuration, do either of the following:

• TMS: Tie High to put the Test Access Port controller in a benign RESET state

• TCK: Tie High or Low—do not toggle this clock input.

For more information regarding boundary scan, refer to the Xilinx Application Note XAPP 017, “

XC4000 and XC5200 Devices

.“

Boundary Scan in

Power Distribution

Power for the FPGA is di stri bute d thro ugh a grid t o achiev e high noise immunity and isolation between logic and I/O. Inside the FPGA, a dedicated Vcc and Ground ring surrounding the logic array provides power to the I/O drivers, as shown in Figure 21. An independent matrix of Vcc and Ground lines supplies the interior logic of the device.

This power distribu tion grid provides a stable supply an d ground for all internal logic, providing the external package power pins are all connected and appropriately decoupled.

Vcc

GND

Vcc

Logic Power Grid

X5422

Figure 21: XC5200-Series Power Distribution

Pin Descriptions

There are three types of pins in the XC5200-Series devices:

• Permanently dedicated pins

• User I/O pins that can have special functions

• Unrestricted user-programmable I/O pins. Before and dur ing conf igurat ion, al l out puts not used fo r the

configuration process are 3-stated and pulled high with a 20 kΩ - 100 kΩ pull-up resistor.

After configuration, if an IOB is unused it is configured as an input with a 20 kΩ - 100 kΩ pull-up resi stor.

Device pins for XC5200-Series devices are described in

Ta ble 9. Pin functions during configuration for each of the

seven configuration modes are summarized in “Pin F unc-

November 5, 1998 (Version 5.2) 7-101

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XC5200 Series Field Programmable Gate Arrays

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tions During Co nf igu ra ti o n” on p ag e 124, in the “Configura-

tion Timing” sectio n.

Table 9: Pin Descriptions

I/O

During

Pin Name

Permanently Dedicated Pins

VCC I I

GND I I

CCLK I or O I

DONE I/O O

PROGRAM

User I/O Pins That Can Have Special Functions

RDY/BUSY

RCLK

M0, M1, M2 I I/O

TDO O O

Config.

OI/O

I/O

After

Config. Pin Description

Five or more (depe nding on package) connecti ons to th e nominal +5 V supply vo ltage . All must be con nected, and each must be decoupled with a 0.01 - 0.1 µF capacitor to Ground.

Four or more (depending on package type) connections to Ground. All must be connected.

During confi guration, Configurati on Clock (CCLK ) is an output i n Master modes or Asynchronous Peri pheral mode, but is an input in Slave mode, Synchronous Peripheral mode, and Express mode. After configuration, CCLK has a weak pull-up resistor and can be selected as the Readback Clock. There is no CCLK High time restriction on XC5200-Series devices, except during Readback. See “Violating the Maximum High

and Low Time Specif icatio n for the Read back Clo ck” on page113 for an explanation of

this exception. DONE is a bidire ction al s ignal with an opt ional inter nal pull- up resi sto r. As a n output , i t

indicates th e completion of the c onfiguration process. As an input, a Lo w level on DONE can be configured to delay the global logic initialization and the enabling of outputs. The exact timing, the clock source for the Low-to-High transiti on, and the optional pull-up resi stor are s elected as options in the program that creat es the co nfigurat ion bit stream. The resistor is includ ed by default.

PROGRAM ory. It is us ed t o ini t iat e a co nf igur at i on c ycl e . W he n PR OG RAM executes a complete clear cycle, before it goes into a WAIT state and releases INIT The PROGRAM

During Peripheral mode configuration, this pin indicates when it is appropriate to write another byte o f data into the FPGA. T he same status is also av ailable on D7 in Asynchronous Peripheral mode, if a read operation is performed when the device is selected. After configuration, RDY/BUSY RDY/BUSY

During Master Parallel configuration, each change on the A0-A17 outputs is preceded by a rising edge on RCLK PROMs. It is rarely used during configuration. After configuration, RCLK grammable I/O pin.

As Mode inputs, these pins are sampled before the start of configuration to determine the configuration mode to be used. After configuration, M0, M1, a n d M2 become user-programmable I/O. During configu ratio n, these pins hav e weak pul l-up res istors . For the most po pular con figuration m ode, Slave Serial, the mode pi ns can thus be left un connecte d. A pull -down resistor value of 3.3 kΩ is recommended for other modes.

If boundary scan is used, this pi n is the Test D ata Outp ut. If boundar y scan is not used, this pin is a 3-state output, after configuration is completed. This pin can be user output only when called out by special schematic definitions. To use this pin, pla ce the libra ry c ompon ent TDO inst ead of the us ual pad sy mbol. An o utput buffer must still be used.

is an active Low input that forces the FPGA to clear its configuration mem-

is pulled High with a high-impedance pull-up prior to INIT going High.

goes High, the FPGA

pin has an optional weak pull-up after configuration.

is a user-programma ble I/O pi n.

, a redundant output signal. RCLK is useful for clocked

is a user-pro-

7-102 November 5, 1998 (Version 5.2)

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Table 9: Pin Descriptions (Continued)

XC5200 Series Field Programmable Gate Arrays

I/O

During

Pin Name

TDI, TCK,

TMS

HDC O I/O

LDC

INIT

GCK1 -

GCK4

CS0

, CS1,

WS, RS

A0 - A17 O I/O

D0 - D7 I I/O

DIN I I/O

DOUT O I/O

Config.

OI/O

I/O I/O

Weak

Pull-up

After

Config. Pin Description

(JTAG)

I or I/O

II/O

I/O

If boundary scan is used, these pi ns are Test Data In, Test Clock, and Test Mode Select inputs respe ctively . They com e direct ly from t he pads, bypassing the IOBs . These p ins can also be used as inputs to the CLB logic after configuration is completed.

I/O

If the BSCAN symbo l is no t pl a ced i n t he de si gn , al l bou ndar y s ca n fu nc ti ons ar e inhi b -

or I

ited once configuration is completed, and thes e pins become user-programmable I/O. In this case, t hey must be called ou t by special sche matic definit ions. To use these pi ns, place the l ibrary com ponen ts TDI , TCK, and TM S ins tead of th e us ual pa d sy mbols. In put or output buffers must still be used.

High During Configuration (HDC) is driven High until the I/O go active. It is available as a control output indicating that configuration is not yet completed. After configuration, HDC is a user-programmable I/O pin.

Low During Configuration (LDC control out put indicating that configuration is not yet co mpleted. After configuration, LDC

is a user-programmable I/O pin.

Before and during configuration, INIT pull-up resistor is recommended. As an active-Low open-drain output, INIT internal clearing of the configuration memory. As an active-Low input, it can be used to hold the FPGA in the internal WAIT state before the start of configuration. Master mode devices st ay in a WAIT state an addition al 50 to 250 µs after INIT During configuration, a Low on this output indicates that a configuration data error has occurred. Af ter the I/O go active, INIT

Four Global inputs each drive a dedicated internal global net with short delay and minimal skew. These inter nal global net s can also be drive n from inter nal logic. If not use d to drive a global net, any of these pins is a user-programmable I/O pin. The GCK1-GCK4 pins provide the shortest path to the four Global Buffers. Any in put pad symbol connected directly to the input of a BUFG symbol is automatically placed on one of these pins.

These four inputs are used in Asynchronous Peripheral mode. The chip is selected when CS0 (WS on Read Strobe (RS

and drives D0 - D6 High. In Express mode, CS1 is used as a serial-enable signal for daisy-chaining. WS Strobe overrides. After configuration, these are user-programmable I/O pins.

During Master Parallel configuration, these 18 output pins address the configuration EPROM. After configuration, they are user-programmable I/O pins.

During Master Parallel , Perip heral, a nd Expres s conf igurati on, thes e eight input pi ns receive configuration data. After configuration, they are user-programmable I/O pins.

During Slave Serial or Master Serial configuration, DIN is the serial configuration data input receiving data on the rising edge of CCLK. During Parallel configuration, DIN is the D0 input. After configuration, DIN is a user-programmable I/O pin.

During configuration in any mode but Express mode, DOUT is the serial configuration data output that can drive t he DIN of dais y-chain ed slav e FPGAs. D OUT data changes on the falling edge of CCLK. In Express mode, DOUT is the status output that can drive the CS1 of daisy-chained FPGAs, to enabl e and disable d ownstream devices. After configuration, DOUT is a user-programmable I/O pin.

is Low and CS1 is High. While the chip is selected, a Low on Write Strobe

) loads the data present on the D0 - D7 inputs into the internal data buffer. A Low

) changes D7 in to a s ta tu s out pu t — H igh i f Read y , L ow i f Bu sy —

and RS should be mutu ally exc lusiv e, but if b oth are Low simult aneousl y, the Write

) is driven Low unt il the I/ O go activ e. It is av ailabl e as a

is a bidirectional signal. A 1 kΩ - 10 kΩ external

is held Low during the power stabilization and

has gone High.

is a user-programmable I/O pin.

November 5, 1998 (Version 5.2) 7-103

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XC5200 Series Field Programmable Gate Arrays

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Table 9: Pin Descriptions (Continued)

I/O

During

Pin Name

Unrestricted User-Programmable I/O Pins

I/O

Config.

Weak

Pull-up

I/O

After

Config. Pin Description

These pins ca n be configur ed to be inp ut and/or out put after c onfigurati on is complete d.

I/O

Before configuration is completed, these pins have an internal high-value pull-up resistor (20 kΩ - 100 kΩ) that defines the logic level as High.

Configuration

Configuration is the process of loading design-specific programming dat a into one or more FPGAs to define the functional operation of the internal blocks and their interconnections. This is somewhat like loading the command registers of a programmable peripheral chip. XC5200-Series dev ic es us e s e ve ral hun dr ed b its o f con fi g uration data per CLB and its associated interconnects. Each configuration bit defines the state of a stat ic memory cell that controls e ith er a f un ction look-up tab le b it, a m u ltiplexer input, or an interconnect pass transistor. The development system translates the design into a netlist file. It automatically partitions, places and routes the logic and generates the configuration data in PROM format.

Special Purpose Pins

Three configuration mode pins (M2, M1, M0) are sampled prior to configuration to determine the configuration mode. After configuration, these pins can be used as auxiliary I/O connections. The development system does not use these resources unless they are explicitly specified in the design entry. This is done by placing a special pad symbol called MD2, MD1, or MD0 instead of the input or output pad symbol.

In XC5200-Series devices, the mode pins have weak pull-up resistors during configuration. With all three mode pins High, Slav e S eri al mode i s sel ec ted, w hic h i s t he m os t popular configuration mode. Therefore, for the most common configuration mode, the mode pins can be left unconnected. (Note, howeve r, that the int ernal pull-up resistor value can be as high as 100 k Ω.) After configuratio n, th ese pins can individually have weak pull-up or pull-down resistors, as specified in the design. A pull-down resistor value of 3.3kΩ is recommended.

These pins are located in the lower left chip corner and are near the readback nets. This location allows convenient routing if compatibility with the XC2000 and XC3000 family conventions of M0/RT, M1/RD is desired.

Configuratio n Modes

XC5200 devices have seven configuration modes. These modes are sel ect ed by a 3 -bit input cod e appl ied t o th e M2,

M1, and M0 inputs . There are three self-loading Mas ter modes, two Periph er a l mod es, and a Serial Slave mode,

Table 10: Configuration Modes

Mode M2 M1 M0 CCLK Data

Master Serial 0 0 0 output Bit-Serial Slave Serial 1 1 1 input Bit-Serial Master

Parallel Up

Master Parallel Down

Peripheral Synchronous*

Peripheral Asynchronous

Express 0 1 0 input Byte-Wide Reserved 001 ——

Note :*Peripheral Synchronous can be considered byte-wid e Slave Parallel

which is use d prim ari ly f o r d ai sy -c ha i ned de vi ce s. T he se venth mode, called Express mode, is an additional slave mode that allows high-speed parallel configuration. The coding for mode selection is shown in Table 10.

Note that the smallest package, VQ64, only supports the Master Serial, Slave Serial, and Express modes.A detailed description of each configuration mode, with timing information, is included la ter in t his da ta shee t. Du ring con figu ration, some of the I/O pins are used temporarily for the configuration process. All pins used during configuration are shown in Table 13 on page 124.

1 0 0 output Byte-Wide,

increment

from 00000

1 1 0 output Byte-Wide,

decrement

from 3FFFF

0 1 1 input Byte-Wide

1 0 1 output Byte-Wide

Master Modes

The three Master modes use an internal oscillator to generate a Configur ati on Cl ock ( CCLK) for dri ving pote nti al sl av e devices. They also generate address and timing for external PROM(s) containing the configuration data.

Master Parallel (Up or Down) modes generate the CCLK signal and PROM addresses and receive byte parallel data. The data is internally serialized into the FPGA data-frame format. The up and down selection generates starting addresses at either zero or 3FFFF , for compatibility with different microprocessor addressing conventions. The

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XC5200 Series Field Programmable Gate Arrays

Master Seria l mode gener ates CCLK and r ecei ves t he con figuration data in serial for m from a Xilinx s erial-con figuration PROM.

CCLK speed is selec table as 1 MHz (defaul t) , 6 MHz, or 12 MHz. Configuration always starts at the default slow frequency, then can switch to the higher frequency during the first frame. Frequency tolerance is -50% to +50%.

Peripheral Modes

The two Peripheral modes accept byte-wide data from a bus. A RDY/BUSY nal. In Asynchronous Peripheral mode, the internal oscillator generates a CCLK burst signal that serializes the byte-wide dat a. CCLK ca n als o dr iv e s lav e de vi ce s. I n t he synchronous mode, an externally supplied clock input to CCLK serializes the data.

status is available as a handshake sig-

Slave Serial Mode

In Slave Serial mode, the FPGA receives serial configuration data on the rising edge of CCLK and, after loading its configuration, passes additional data out, resynchronized on the next falling edge of CCLK.

Multiple slave devices with identical configurations can be wired with parallel DIN inputs. In this way, multiple devices can be configured simultaneously.

Serial Daisy Chain

Multiple devices with different configurations can be con-

nected together in a “daisy c hain,” and a s ingle combine d bitstream used to configure the chain of slave devices.

To configure a daisy chain of devices, wire the CCLK pins of all devices in parallel, as shown in Figure 28 on page

114. Connect the DOUT of each device to the DIN of the

next. The lead or master FPGA and following slaves each passes resynchronized configuration data coming from a single source. The header data, including the length count, is passed through and is captured by each FPGA when it recognizes the 0010 preamble. Following the length-count data, each FPGA outputs a High on DOUT until it has received its required number of data frames.

After an FPGA has received its configuration data, it passes on any additional frame start bits and configuration data on DOUT. When the total number of configuration clocks applied afte r memory initialization equals the valu e of the 24-bit length count, the FPGA s begin the start-up sequence and become operational together. FPGA I/O are normally rel eased two CCLK cycle s after the last config uration bit is received. Figure 25 on page 109 shows the start-up timing for an XC5200-Series device.

The daisy-chained bitstream is not simply a concatenation of the individual bitstr eam s. T he PR OM f ile fo rmatte r mu st be used to combin e t he bit str eams f or a dai sy-c hained con figuration.

Multi-Family Daisy Chain

All Xilinx FPGAs of the XC2000, XC3000, XC4000, and XC5200 Series use a c ompa tibl e bit stre am fo rmat and can, therefore, be connected in a daisy chain in an arbitrary sequence. There is, however, one limitation. If the chain contains XC5 200 -Se ri es d ev i ce s, t h e ma st e r n orm all y c annot be an XC2000 or XC3000 device.

The reason for t his r ule i s sh ow n in F igur e25 on page 109. Since all devices in the chain store the same length count value and generate or receive one common sequence of CCLK pulses, they all recognize length-count match on the same CCLK edge, as indicated on the left edge of

Figure 25. The master device then generates additional

CCLK pulses until it reaches its finish point F. The different families generate or require different numbers of additional CCLK pulses until they reach F. Not reaching F means that the device does not really finish its configuration, although DONE may have gone High, the outputs became active, and the internal reset was released. For the XC5200-Series device, not reaching F means that readback cannot be initiated and most boundary scan instructions cannot be used.

The user has some control over the relative timing of these events and can , the refo re, ma ke su re th at they occ ur at t he proper time and the finish poi nt F is reached . Ti ming is controlled using options in the bitstream generation software.

XC5200 devices always have the same number of CCLKs in the power up delay, independent of the configuration mode, unlike t he X C3000/ XC400 0 Ser ies d evi ces. To guarantee all devices in a daisy chain have finished the power-up delay, tie the INIT pins together, as shown in

Figure 27.

XC3000 Master with an XC5200-Series Slave

Some designers want to use an XC3000 lead device in peripheral mode and have the I/O pins of the XC5200-Series devices all available for user I/O. Figure 22 provides a solution for that case.

This solution requires one CLB, one IOB and pin, and an internal oscillator with a frequency of up to 5 MHz as a clock source. The XC3000 master device must be configured with late Internal Reset, which is the default option.

One CLB and one IOB in the lead XC3000-family device are used to generat e the additi onal CCLK pulse required by the XC5200-Series devices. When the lead device removes the internal RESET signal, the 2-bit shift register responds to its clock input and generates an active Low output signal for the duration of the subsequent clock period. An external connection between this output and CCLK thus creates the extra CCLK pulse.

November 5, 1998 (Version 5.2) 7-105

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XC5200 Series Field Programmable Gate Arrays

Figure 22: CCLK Generation for XC30 00 Master Driving an XC5200-Series Slave

Product Obsolete or Under Obsolescence

OE/T

Reset 0

Active Low Output

Active High Output

etc

Express Mode

Express mode is similar to Slave Serial mode, except the data is presented in parallel format, and is clocked into the target devic e a byte at a time rather than a b it at a time. T he data is loaded in paralle l into eight different columns: it is not internally serialized. Eight bits of configuration data are loaded with every CCLK cycle, therefore this configuration mode runs at eight times the data rate of the other six modes. In this mod e the XC 5200 fam ily is capab le of supporting a CCLK freq uency of 10 MHz , which is equi valent to an 80 MHz serial rate, because eight bits of configuration data are being loa ded per CCL K cycle. An XC5210 in th e Express mode, for instance, can be configured in about 2 ms. The Expres s mode do es no t su pport C RC err or chec k ing, but does support constant-field error checking. A length count is not used in Express mode.

In the Express configuration mode, an external signal drives the CCLK input(s). The firs t byte of parallel configuration data must be available at the D inputs of the FPGA devices a short set -u p time be fo re th e se co nd risin g C CL K edge. Subsequent data bytes are clocked in on each consecutive rising CCLK edge. See Figure 38 on page 123.

Bitstream generation currently generates a bitstream sufficient to pro gram in al l confi gurati on mode s except Ex press . Extra CCLK cycles are necessary to complete the configuration, since in this mode data is read at a rate of eight bits per CCLK cycle instead of one bit per cycle. Normally the entire start-up sequence requires a number of bits that is equal to the number of CCLK cycles needed. An additional five CCLKs (equivalent to 40 extra bits) will guarantee completion of configuration, regardless of the start-up options chosen.

Multiple slave devices with identical configurations can be wired with parallel D0-D7 inputs. In this way, multiple devices can be configured simultaneously.

Output Connected to CCLK

X5223

Pseudo Daisy Chain

Multiple devices with differ ent configurations can be connected togethe r in a pseudo daisy chain , provided t hat all of the devices are in Express mode. A single combined bitstream is used to configure the chain of Express mode devices, but the input data bus must drive D0-D7 of each device. T ie H igh t he CS1 p in o f the firs t dev ice t o be c onfigured, or leave it fl oatin g in t he XC5 200 sin ce i t has an int ernal pull-up. Connect the DOUT pin of each FPGA to the CS1 pin of the next device in the chain. The D0-D7 inputs are wired to each device in parallel. The DONE pins are wired together, with one or more internal DONE pull-ups activated. Alternatively, a 4.7 kΩ external resistor can be used, if desired. (See Figure 37 on page 122.) CCLK pins are tied together.

The requirement that all DONE pins in a daisy chain be wired togeth er appl i es on l y to Exp ress mod e, an d o nly i f al l devices in the chain are to become active simultaneously. All devices in Express mode are synchronized to the DONE pin. User I/O for each device become active after the DONE pin for that device goes High. (The exact timing is determined by options to the bitstream generation software.) Since the DONE pin is open-drain and does not drive a High value, tying the DONE pins of all devices together prevents all devices in the chain from going High until the last device in the chain has completed its configuration cycle.

The status pin D OUT is p ulled LO W two in ternal-oscilla tor cycles (nominally 1 MHz) after INIT

is recognized as High,

and remains Low until th e devi ce’ s c onfig urat ion memo ry i s full. Then DOUT is pulled High to signal the next device in the chain to accept the configuration data on the D7-D0 bus. All device s re c ei ve and r ecog ni z e t he si x by t es of preamble and length count, irrespective of the level on CS1; but subsequent frame data is accepted only when CS1 is High and the device’s configuration memory is not already full.

Setting CCLK Frequency

For Master modes, CCLK can be gen er at ed in o ne o f th ree frequencies. In the default slow mode, the frequency is nominally 1 MHz. In fast CCLK mode, the frequency is nominally 12 MHz. In medium CCLK mode, the frequency is nominally 6 MHz. The fr eq uen cy rang e i s - 50% to + 50%. The frequenc y is selected by an option when running the bitstream gener ati on so ftw are. If an X C5200 -Seri es Mast er is driving an XC3000- or XC2000-family slave, slow CCLK mode must be used. Slow mode is the default.

Table 11: XC5200 Bitstream Format

Data Type Value Occurrences

Fill Byte 11111111 Once per bitPreamble 11110010 Length Counter COUNT(23:0) Fill Byte 11111111

stream

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XC5200 Series Field Programmable Gate Arrays

Table 11 : XC5200 Bitstrea m Fo r mat

Data Type Value Occurrences

Start Byte 11111110 Once per data Data Frame * DATA(N-1: 0 ) Cyclic Redundancy Check or

Constant Field Check Fill Nibble 1111 Extend Write Cycle FFFFFF Postamble 11111110 Once per deFill Bytes (30) FFFF…FF

Start-Up Byte FF Once per bit-

*Bits per Frame (N) depends on device size, as described for table 11.

CRC(3:0) or 0110

frame

vice

stream

Data Stream Format

The data st ream (“bitstream”) format is identical for all configuration mode s, with th e except ion of Exp ress mode . In Express mode, the device becomes active when DONE goes High, therefore no length count is required. Additionally, CRC error checking is no t suppo rted in Ex pres s mode .

The data stream formats are shown in Table 11. Express mode data is shown with D0 at the left and D7 at the right. For all other modes, bit-serial data is read from left to right, and byte-parallel data is effectively assembled from this serial bitstream, with the first bit in each byte assigned to D0.

The configuration data stream begins with a string of eight ones, a preamble code, followed by a 24-bit length count and a separator field of ones (or 24 fill bits, in Express mode). This header is followed by the actual configuration data in frames. The length and number of frames depends on the device t ype (s ee Table 12). Each frame begins wit h a start field and ends with an error check. In all modes except Express mode, a postamble code is required to signal the end of data for a single device. In all cases, additional start-up bytes of data are required to provide four clocks for the startup sequence at the end of configuration. Long daisy chains require additional startup bytes to shift the last data through the chain. All startup bytes are don’t-cares; these bytes are not included in bitstreams created by the Xilinx software.

In Express mode, only non-CRC error checking is supported. In all o ther mo des , a sel ec ti on of CRC o r non -C RC error checking is allowed by the bit stream generat ion software. The non-C RC error checking tests for a designated end-of-frame fiel d for eac h f rame. For CRC e rror check ing , the software calculates a running CRC and inserts a unique four-bit partial check at the end of each frame. The 11-bit CRC check of the last frame of an FPGA includes the last seven data bits.

Detection of an e rror res ult s in t he s uspe nsion of d ata load ing and the pulling down of the INIT

pin. In Master modes,

CCLK and address signals continue to operate externally. The user must dete ct INIT by pulsing the PROGRAM

and initialize a new configuration

pin Low or cycling Vcc.

Table 12: Internal Configuration Data Structure

Device

VersaBlock

Array

PROM

Size

(bits)

Xilinx

Serial PROM

Needed

XC52028 x 842,416XC1765E XC520410 x 1270,704XC17128E XC520614 x 14106,288XC17128E XC521018 x 18165,488XC17256E XC521522 x 22237,744XC17256E

Bits per Frame = (34 x number of Rows) + 28 for the top + 28 for the bottom + 4 splitter bits + 8 start bits + 4 error check bits + 4 fill bits

+ 24 extended write bits

= (34 x number of Rows) + 100

In the XC5202 (8 x 8), there are 8 fill bits per frame, not 4

Number of Frames = (12 x number of Columns) + 7 for the left edge + 8 for the right edge + 1 splitter bit = (12 x number of Columns) + 16

Program Data = (Bits per Frame x Number of Fram es) + 48 header bits + 8 postamble bits + 240 fill bits + 8 start-up bits = (Bits per Frame x Number of Frames) + 304

PROM Size = Program Data

Cyclic Redundancy Check (CRC) for Configuration and Readback

The Cyclic Redundancy Check is a method of error detection in data transmission applications. Generally, the transmitting system performs a calculation on the serial bitstream. The result of this calculation is tagged onto the data stream as additional check bits. The receiving system performs an id enti cal cal culat ion on the bits tre am and compares the result with the received checksum.

Each data frame of the configuration bitstream has four error bits at the end, as shown in Table 11. If a frame data error is detected during the loading of the FPGA, the configuration process with a potentially corrupted bitstream is terminated. T he FPGA pul ls t he IN IT a Wait st ate.

During Readback , 11 bits of the 16-bit check sum are ad ded to the end of the Readback data stream. The checksum is computed using the CRC-16 CCITT polynomial, as shown in Figure 23. The checksum consists of the 11 most significant bits of the 1 6-bi t code. A cha nge in th e chec ksum i ndicates a change in the Readback bitstream. A comparison to a previous checks um is mean ingful only if th e readb ack data is independent of the current device state. CLB outputs should not be included (Read Capture option not used). Statist ical ly, one error out of 20 48 mi ght go un dete cted.

pin Low and goes int o

November 5, 1998 (Version 5.2) 7-107

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XC5200 Series Field Programmable Gate Arrays

Figure 23: Circuit for Generating CRC-16

Product Obsolete or Under Obsolescence

LAST DATA FRAME

345678910111213 141

Polynomial: X16 + X15 + X2 + 1

1 0 151413121110 9 8 7 651111

CRC – CHECKSUM

START BIT

Readback Data Stream

X15

SERIAL DATA IN

X1789

X16

Configuration Sequence

There are four majo r s t eps i n t he XC52 00-S er ies po wer- up configuration sequence.

• Power-On Time-Out

• Initialization

• Configuration

• Start-Up

The full process is illustrated in Figure 24.

Power-On Time-Out

An internal power-on reset circuit is triggered when power is applied. Wh en V of the FPGA begin to operate (i.e., performs a write-and-read test of a sample pair of configuration memory bits), the programmable I/O buffers are 3-stated with active high-impedance pull-up resistors. A time-out delay — nominally 4 ms — is initiate d to allo w the pow er-supply voltage to stabilize. For correct operation the power supply must reach V not dip below it thereafter.

There is no distinction between master and slave modes with regard to the time-out delay. Instead, the INIT used to ensure that all daisy-chained devices have completed initi ali zati on. Si nce XC 2000 d evic es do n ot have thi s signal, extra care must be taken to guarantee proper operation when daisy-chaining them with XC5200 devices. For proper operation with XC3000 devices, the RESET which is used in XC3000 to delay configuration, should be connected to INIT

If the time-out delay is ins ufficient, configu rat ion s hould b e delayed by holding the INIT has reached ope ra tin g leve ls.

This delay is applied only on power-up. It is not applied when reconfiguring an FPGA by pulsing the PROGRAM pin Low . D uring all th ree ph ases — P ower- on, I niti aliz ation , and Configuration — DONE is held Low; HDC, LDC INIT

are active; DOUT is driven; and all I/O buffers are dis-

abled.

reaches the voltage at which portions

(min) by the end of the time-out, and must

line is

signal,

pin Low until the power supply

, and

Initialization

This phase clears the configuration memory and establishes the configuration mode.

The configuration memory is cleared at the rate of one frame per internal clock cycle (nominally 1 MHz). An open-drain bidirectional signal, INIT configuration memory is completely cleared. The device then tests for the abse nce of an external active -low lev el on INIT

. The mode lines are sampled two internal cloc k cycles

later (nominally 2 µs). The master device waits an additional 32 µs to 256 µs

(nominally 64-128 µs) to provide adequat e time for a ll of the slave devices to r ecogniz e the release of INIT the master device enters the Configuration phase.

Boundary Scan

Instructions

Available:

EXTEST*

SAMPLE/PRELOAD*

BYPASS

CONFIGURE*

(*only when PROGRAM = High)

Master CCLK

Goes Active after

50 to 250 µs

SAMPLE/PRELOAD

BYPASS

EXTEST

SAMPLE PRELOAD

BYPASS

USER 1 USER 2

CONFIGURE

READBACK

If Boundary Scan is Selected

Yes

Generate

One Time-Out Pulse

Completely Clear

Configuration

Yes

Mode Lines

Load One

Configuration

Data Frame

Yes

Configuration

Data to DOUT

Count Equals

Yes

Sequence

Operational

Figure 24: Configuration Sequence

, is released whe n the

~1.3 µs per Frame

Yes

PROGRAM

Pull INIT Low

and Stop

of 4 ms

Memory

INIT

High? if

Master

Sample

Frame

Error

Config-

uration

memory

Full

Pass

CCLK

Length

Count

Start-Up

as well. Then

= Low

Yes

LDC Output = L, HDC Output = H

I/O Active

X9017

7-108 November 5, 1998 (Version 5.2)

Page 27

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

CCLK

XC2000

XC3000

XC4000E/EX

XC5200/

CCLK_NOSYNC

XC4000E/EX

XC5200/

CCLK_SYNC

XC4000E/EX

XC5200/

UCLK_NOSYNC

XC4000E/EX

XC5200/

UCLK_SYNC

Synchronization

Uncertainty

Figure 25: Start-up Timing

Length Count Match

DONE

I/O

Global Reset

DONE

I/O

Global Reset

DONE

C1 C2

I/O

GSR Active

DONE IN

DONE

C1, C2 or C3

I/O

GSR Active

DONE

I/O

GSR Active

DONE

C1 U2

I/O

GSR Active

C2 C3 C4

Di Di+1

U2 U3 U4C1

U2 U3 U4

DONE IN

Di Di+1 Di+2

UCLK Period

CCLK Period

C3 C4

F = Finished, no more

configuration clocks needed Daisy-chain lead device must have latest F

Heavy lines describe default timing

X6700

November 5, 1998 (Version 5.2) 7-109

Page 28

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Configuration

The length cou nter b egins c ounting immediat ely upo n entr y into the configuration state. In slave-mode operation it is important to wait at le ast two cycles of the internal 1-MHz clock oscillator after INIT CCLK and feeding the serial bitstream. C onfiguration will not begin until the internal configuration logic reset is released, which happens two cycles after INIT

A master device’s configuration is delayed from 32 to 256 µs to ensure prop er operati on with any s lave devic es driv en by the master dev ice.

The 0010 preamble code, included for all modes except Express mode, indicates that the following 24 bits represent the lengt h coun t . Th e le ngt h c ou nt i s th e t ot al nu mbe r of configu ra tio n c l ock s ne ed ed to l o ad t he co mple te c on fig uration data. (Four additional configuration clocks are required to complete the configuration process, as discussed below.) After the preamble and the length count have been pass ed thro ugh to all devic es i n the daisy chain , DOUT is held High to prevent frame start bits from reaching any daisy-chained devices. In Express mode, the length count bits are ignored, and DOUT is held Low, to disable the next device in the pseudo daisy chain.

A specific co nfi gura tion b it, early in the f irst frame of a master device, controls the configuration-clock rate and can increase it by a factor of eight. Therefore, if a fast configuration clock is selected by the bitstream, the slower clock rate is used until this configuration bit is det ected.

Each frame has a start field followed by the frame-configuration data bits and a fr ame e rror fi eld. If a fra me da ta er ror is detected, the FPGA halts loading, and signals the error by pulling the open -drain IN IT tion frames have been loaded into an FPGA, DOUT again follows the input data so that the remaining data is passed on to the next device. In Express mode, when the first device is fully programmed, DOUT goes High to enable the next device in the chain.

Delaying Configuration After Power-Up

To delay master mode configuration after power-up, pull the bidirectional INIT (open-drain) driver. (See Figure 12.)

Using an open-collector or open-drain driver to hold INIT Low before the beginning of master mode configuration causes the FPGA to wait after completing the configuration memory clear operation. When INIT externally, the device determines its configuration mode by capturing its mode pi ns , and is rea dy to st ar t the c onf i gura tion process. A master d evice waits up to an addi tional 250 µs to make sure that any slaves in the optional daisy chain have seen that INIT

is recognized before toggling

goes High.

pin Low. After all configura-

pin Low, using an open-collector

is no longer held Low

is High.

Start-Up

Start-up is the transition from the configuration process to the intended user operation. This transition involves a change from one clock source to another, and a change from interfacing parallel or serial configuration data where most outputs are 3-sta ted, to n ormal op eration with I/ O pins active in the user-system. Start-up must make sure that the user-logic ‘wakes up’ gracefully, that the outputs become active w i tho ut c au sin g c ont en tio n wi th t he co nf i guration signals, and that the internal flip-flops are released from the global Reset at the right time.

Figure 25 describes start-up timing for the three Xilinx fam-

ilies in detail. Express mode configuration always uses either CCLK_SYNC or UCLK_SYNC timin g, the other configuration mod es can use a ny of the f our t iming sequ ence s.

T o access the inter nal st art-up si gnals, pl ace the ST A RTUP library symbol.

Start-up Timing

Different FPGA families have different star t-u p seq uenc es . The XC2000 family goes t hrou gh a f ixed seque nce. DONE

goes High and t he int ernal glob al Res et is de-a ctiv ated one CCLK period after the I/O become active.

The XC3000A family offers some flexibility. DONE can be programmed to go High one CCLK period before or after the I/O become active. Independent of DONE, the internal global Reset is de-activated one CCLK period before or after the I/O become active.

The XC4000/XC5200 Series offers additional flexibility. The three ev ents — DO NE going High, the internal Re set being de-activated, and the user I/O going active — can all occur in any arbitrary sequence. Each of them can occur one CCLK period befo re or af t er, or simultaneous wit h, any of the others. This relative timing is selected by means of software options in the bitstream generation software.

The default option, and the most practical one, is for DONE to go High first, disconne cting the co nfigurat ion data sour ce and avoiding any contention when the I/Os become active one clock later. Reset is then re leased anot her c lock perio d later to make sure that user-operation starts from stable internal conditions. This is the most common sequence, shown with heavy lines in Figure 25, but the designer can modify it to meet particular requirements.

Normally, the start-up se quence i s cont rolled by the intern al device oscillator outpu t (CCLK), which is asynchr onous to the system clock.

XC4000/XC5200 Series offers another start-up clocking option, UCLK_NOSYNC. The three events described above need not be t rigger ed by CCLK. They can, as a configuration option, be triggered by a us er clock. This means that the device can wake up in synchronism with the user system.

7-110 November 5, 1998 (Version 5.2)

Page 29

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

When the UCLK_SYNC option is enabled, the user can externally hold the open-drain DONE output Low, and thus stall all further progress in the start-up sequence until DONE is released and h as go ne Hig h. Th is option ca n be used to force s ynchro nization of seve ral FPGA s to a c ommon user clock, or to guarantee that all devices are successfully configured before any I/Os go active.

If either of these two options is selected, and no user clock is specifie d in the desi gn or at tache d to the devi ce, th e chi p could reach a po i nt w her e t he conf i gur ati o n o f th e de v ice is complete and the Done pin is asserted, but the outputs do not become active . The solution is either to r ecreate the bitstream specifying the start-up clock as CCLK, or to supply the appropriate user clock.

Start-up Sequence

The Start-up sequence begins when the configuration memory is ful l , and t he to ta l numbe r o f co nf i gu ra tio n c loc k s received since INIT the length count.

The next rising clock edge sets a flip-flop Q0, shown in

Figure 26. Q0 is the leading bit of a 5-bit shift register. The

outputs of this register can be prog rammed to control three events.

• The release of the open-drain DONE output

• The chang e of configuration-related pins to the user function, activating all IOBs.

• The termination of the global Set/Reset initialization of all CLB and IOB storage elements.

The DONE pin can also be w ire- A NDe d wit h DONE pins of other FPGAs or wit h other external signa ls, and can then be used as input to bit Q3 of the start-up register. This is called “Start-up Timing Synchronous to Done In” and is selected by either CCLK_SYNC or UCLK _SYN C.

When DONE is not use d as an inpu t, the operatio n is cal led “Start-up Timing Not Synchronous to DONE In,” and is selected by either CCLK_NOSYNC or UCLK _NO SYNC.

As a configuration option, the start-up control register beyond Q0 can be clocked either by subsequent CCLK pulses or from an on-chip user net called STARTUP.CLK. These signals can be accessed by placing the STARTUP library symbol.

Start-up from CCLK

If CCLK is used to drive the start-up, Q0 through Q3 provide the timing. Heavy lines in Figure 25 show the default timing, which is compatible with XC2000 and XC3000 devices using early DONE a nd late Reset. The thin lines indicate all other possible timing options.

Start-up from a User Clock (STARTUP.CLK)

When, instead of CCLK, a user -supplied start-up clock is selected, Q1 i s used to br i dg e t he un k nown pha se r el at ion -

went High equals the loaded value of

ship between CCLK and the user clock. This arbitration causes an unavoidable one-cycle uncertainty in the timing of the rest of the start-up sequence.

DONE Goes High to Signal End of Configuration

In all configuration modes except Express mode, XC5200-Series devices read the expected length count from the bitstream and store it in an internal register. The length count v ari es acc ording to t he num ber of dev ices and the composition of the daisy chain. Each device also counts the number of CCLKs during configuration.

Two conditions have to be met in order for the DONE pin to go high:

• the chip's internal memory must be full, and

• the configuration length count must be met, This is important because the counter that determines

when the length count is met begins with the very first CCLK, not the first one after the preamble.

Therefore, if a stray bit is inserted before the preamble, or the data source is not ready at the time of the first CCLK, the internal counter that holds the number of CCLKs will be one ahead of the actual number of data bits read. At the end of configuratio n, the con figuration m emory will be fu ll, but the number of bits in the internal counter will not match the expected length count.

As a consequence, a Master mode device will con tinue to send out CCLKs until the internal counter turns over to zero, and then reac hes the correct length count a second time. This will tak e several seco nds [2 — which is sometime s inte rpret ed as the dev ice no t conf iguring at all.

If it is not possible to have the data ready at the time of the first CCLK, the problem can be avoided by increasing the number in the length count by the appropriate value.

In Express mod e , th er e is no le ng th co un t. T h e DON E pin for each devic e goes Hig h when th e device h as recei ved its quota of configuration data. Wiring the DONE pins of several devices together delays start-up of all devices until all are fully configured.

Note that DONE is an open-drain output and does not go High unless an in ternal pull-up is activate d or an external pull-up is attached. The internal pull-up is activated as the default by the bitstream generation software.

exactly

∗ CCLK period]

Release of User I/O After DONE Goes High

By default, the us er I/O a re re le as ed on e CCL K cy cle af te r the DONE pin goes High. If CCLK is not clocked after DONE goes High, the outputs remain in their initial state — 3-stated, with a 20 kΩ - 100 kΩ pull-up. The delay from

November 5, 1998 (Version 5.2) 7-111

Page 30

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

DONE High to active user I/O is controlled by an option to the bitstream generation software.

Q3 Q1/Q4

STARTUP

DONE IN

IOBs OPERATIONAL PER CONFIGURATION

Q0 Q1 Q2 Q3 Q4

FULL

LENGTH COUNT

CLEAR MEMORY

CCLK

STARTUP.CLK

USER NET

0 1

Figure 26: Start-up Logic

GLOBAL RESET OF ALL CLB FLIP-FLOPS/LATCHES

1 0

GR ENABLE GR INVERT STARTUP.GR

STARTUP.GTS GTS INVERT

GTS ENABLE 0 1

1 0

DQKDQ

CONFIGURATION BIT OPTIONS SELECTED BY USER

CONTROLLED BY STARTUP SYMBOL IN THE USER SCHEMATIC (SEE LIBRARIES GUIDE)

1 0

DQKDQ

GLOBAL 3-STATE OF ALL IOBs

" FINISHED "

ENABLES BOUNDARY SCAN, READBACK AND

CONTROLS THE OSCILLATOR

X9002

DONE

Release of Global Reset After DONE Goes High

By default, Global Rese t (GR ) is r ele ased two CC LK cy cles after the DON E pin go es High. If CCLK is not clock ed twice after DONE goes High, all flip-f lops are held in their initial reset state. The dela y from DONE Hig h to GR inactive is controlled by an option to the bitstream generation software.

Configuration Complete After DONE Goes High

Three full CCLK cycles are required after the D ONE pin goes High, as show n in Figure 25 on page 109. If CCLK is not clocked thr ee times after DONE g oes High, readback cannot be initiated and most boundary scan instructions cannot be used.

7-112 November 5, 1998 (Version 5.2)

Configuration Throug h the Boundary Scan Pins

XC5200-Series devices can be configured through the boundary scan pins.

For detailed inform ati on, r efe r to the Xilin x a pp lica tion n ote

XAPP017, “

Devices

Boundary Scan in XC4000 and XC5200

.”

Readback

The user can read back the content of configuration memory and the level of certain internal nodes without interfering with the normal operation of the device.

Readback not only reports the downloaded configuration bits, but can also include the present state of the device, represented by the content of all flip-flops and latches in CLBs.

Page 31

Figure 27: Readback Schematic Example

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Note that in XC5200-Series devices, configuration data is

not

inverted with respect to configuration as it is in XC2000

and XC3000 families. Readback of Expr ess mode bitstrea ms resu lts in data that

does not resemble the original bitstream, because the bitstream format differs fro m othe r mod es .

XC5200-Series Readback does not use any dedicated pins, but uses four internal nets (RDBK.TRIG, RDBK.DATA, RDBK.RIP and RDBK.CLK) that can be routed to any IOB. To access the internal Readback signals, place the READBACK library symbol and attach the appropriate pad sym b ols , as sh own in Figure 27.

After Readback has been initiated by a Low-to-High transition on RDBK.TRIG, the RDBK.RIP (Read In Progress) output goes High on the next rising edge of RDBK.CLK. Subsequent rising edges of this clock shift out Readback data on the RDBK.DATA net.

Readback data does not include the preamble, but starts with five dummy bits (all High) followed by the Start bit (Low) of the first fr ame. The first two data bits of the first frame are always High.

Each frame en ds w i th fo ur er ro r che ck bits. They are rea d back as High. The last seven bits of the last frame are also read back as High. An additional Start bit (Low) and an 11-bit Cyclic Redundancy Check (CRC) signature follow, before RDBK.RIP returns Low.

IF UNCONNECTED,

DEFAULT IS CCLK

MD0

READ_TRIGGER

IBUF

CLK

TRIG

READBACK

DATA

RIP

READ_DATA

OBUF

MD1

X1786

Readback Options

Readback options are: Read Capture, Read Abort, and Clock Select. They are set with the bitstream generation software.

Read Capture

When the Read Capture option is selected, the readback data stream includes sampled values of CLB and IOB signals. The rising edge of RDBK.TRIG latches the inverted values of th e CLB out puts a nd the IOB outp ut and input signals. Note that while the bits describing configuration (interconn ect and f unct ion gene rato rs) ar e CLB and IOB output signals

are

inverted.

When the Read Ca pture o ption is n ot selecte d, the v alues of the capture bits reflect the configuration data originally written to those memory locations.

not

inverted, the

The readback signals are located in the lower-left corner of the device.

Read Abort

When the Read Abort option is selected, a High-to-Low transition on RDBK.TRIG terminates the readback operation and prepare s the logic to accept another trigger.

After an aborted readback, additional clocks (up to one readback cloc k per conf igura tio n fr ame) m ay be r equi red to re-initiali ze the contro l logic . The status of rea dback is indi cated by the output co ntrol net RDBK.RIP. RDBK.RIP is High whenever a readback is in progress.

Clock Select

CCLK is the default clock. However, the user can insert another clock on RDBK.CLK. Readback control and data are clocked on rising edges of RDBK.CLK. If readback must be inhibite d for secu rity r easons, th e readba ck contr ol nets are simply not connected.

Violating the Maximum High and Low Time Specification for the Readback Clock

The readback clock has a maximum High and Low time specification. In some cases , this specific ation cannot be met. For exampl e, if a processor is contr olling readback, an interrupt may fo rce it to s top in the mi ddle of a r eadback. This necessitates stopping the clock, and thus violating the specification.

The specification is mandatory only on clocking data at the end of a frame prior to the next start bit. The transfer mechanism will load the data to a shift register during the last six clock cycles of the frame, prior to the start bit of the following frame. This loading process is dynamic, and is the source of the maximu m High and Low tim e re qu ir em e nt s.

Therefore, the specification only applies to the six clock cycles prior to and including any start bit, including the clocks before the first start bit in the readback data stream. At other times, the fra me da ta is al re ady i n th e re gis ter and the register is not dynamic. Thus, it can be shifted out just like a regular shift register.

The user must pre cisely calcu late the lo cation of the readback data relative to the frame. The system must keep track of the position within a data frame, and disable interrupts before frame boundar ies. Fr ame lengt hs an d data formats are listed in Table 11 and Table 12.

Readback with the XChecker Cable

The XChecker Universal Download/Readback Cable and Logic Probe uses the readback feature for bitstream verification. It can also display selected internal signals on the PC or workstation screen, functioning as a low-cost in-circuit emulator.

November 5, 1998 (Version 5.2) 7-113

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XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Configuration Timing

The seven configuration modes are discussed in detail in this section. Timing specifications are included.

Slave Serial Mode

In Slave Serial mode, an external signal drives the CCLK input of the FPGA. T he ser i al co nf i gu ra tio n bi t str eam mus t be available at the DIN input of the lead FPGA a short setup time before each rising CCLK edge.

The lead FPGA then presents the preamble data—and all data that overflows the lead device—on its DOUT pi n.

NOTE: M2, M1, M0 can be shorted to Ground if not used as I/O

3.3 KΩ

M0 M1

XC5200

MASTER

SERIAL

PROGRAM DONE

DOUT

CCLK

DIN

LDC

INIT

VCC

4.7 KΩ

XC1700E

CLK

DATA

RESET/OE

(Low Reset Option Used)

There is an internal delay of 0.5 CCLK periods, which means that D OUT ch an g es o n th e fa llin g CC LK e dg e, and the next FPGA in the daisy chain accepts data on the subsequent rising CCLK edge.

Figure 28 shows a full master/slave system. An

XC5200-Series device in Slave Serial mode should be connected as shown in the thir d de vice fro m the lef t.

Slave Serial mode i s se lect ed by a < 111> on the mo de pi ns (M2, M1, M0). Slave Serial i s the default mod e if the mode pins are left unc on ne ct ed , a s they ha ve weak pul l - up r esi stors during configuration.

NOTE: M2, M1, M0 can be shorted to VCC if not used as I/O

INIT

VCC

3.3 KΩ

DINDOUT DOUT CCLK

XC3100A

RESET

D/P

3.3 KΩ

PWRDN

SLAVE

INIT

VPP

CEO

+5 V

N/C

M0 M1

DIN CCLK

Spartan,

XC4000E/EX,

XC5200 SLAVE

PROGRAM

DONE

PROGRAM

Figure 28: Master/Slave Serial Mode Circuit Diagram

DIN

CCLK

DOUT

(Output)

Bit n Bit n + 1

DCC

CCD

CCH

CCO

Description Symbol Min Max Units

CCLK

DIN setup 1 T DIN hold 2 T DIN to DOUT 3 T High time 4 T Low time 5 T Frequency F

DCC CCD CCO CCH CCL

Note: Configuration must be delayed until the INIT pins of all dai sy -chained FPGAs are High.

20 ns

0ns

45 ns 45 ns

Figure 29: Slave Serial Mode Programming Switching Characteristics

X9003_01

CCL

Bit nBit n - 1

X5379

30 ns

10 MHz

7-114 November 5, 1998 (Version 5.2)

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Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Master Serial Mode

In Master Serial mode, the CCLK output of the lead FPGA drives a Xilinx Serial PROM that feeds the FPGA DIN input. Each rising edge of the CCLK output increments the Serial PROM internal ad dress coun ter. The next data bit is put on the SPROM dat a output, connecte d to the FP GA DIN pin. The lead FPGA accepts this data on the subsequent rising CCLK edge.

The lead FPGA then presents the preamble data—and all data that overflows the lead device—on its DOUT pin. There is an internal pipeline delay of 1.5 CCLK periods, which means that DOUT changes on the falling CCLK edge, and the next FPGA in the daisy ch ain accepts data on the subsequent rising CCLK edge.

In the bitstream generation software, the user can specify Fast ConfigRate, which, starting several bits into the first frame, incre ases the CCLK f reque ncy b y a fac tor of twel ve.

CCLK

(Output)

DSCK

Serial Data In

n n + 1 n + 2

The value incr eases fr om a nomi nal 1 MH z, to a n ominal 1 2 MHz. Be sure that the serial PROM and slaves are fast enough to support this data rate. The Medium ConfigRate option changes the frequency to a nominal 6 MHz. XC2000, XC3000/A, and XC3100A devices do not support the Fast or Medium ConfigRate options.

The SPROM CE input can be driven f rom either LDC DONE. Using LDC

avoids potential contention on the DIN pin, if this pin is configured as user-I/ O, but LDC restricted to be a permanently High user output after configuration. Using DONE can also avoid contention on DIN, provided the DONE before I/O enable option is invoked.

Figure 28 on page 114 show s a full master/slave sy stem.

The leftmost device is in Master Serial mode. Master Serial mode is selected by a <000> on the mode

pins (M2, M1, M0).

CKDS

is then

Serial DOUT

(Output)

n – 3 n – 2 n – 1 n

X3223

Description Symbol Min Max Units

CCLK

Notes: 1. At power-up, Vcc must rise from 2.0 V to Vcc min in less than 25 ms, otherwis e del ay configuration by pulling PROGRAM

Low until Vcc is valid.

2. Master Serial mode timing is based on testing in slave mode.

DIN setup 1 T DIN hold 2 T

DSCK

CKDS

20 ns

0ns

Figure 30: Master Serial Mode Programming Switching Characteri stics

In the two Master Parallel modes, the lead FPGA directly addresses an industry-standard byte-wide EPROM, and accepts eight data bits just before incrementing or decrementing the address outputs.

The eight data bits are serialized in the lead FPGA, which then presents the preamble data—and all data that overflows the lead devic e— on its DO UT pin . T h ere is an in te rnal delay of 1.5 CCLK periods, after the rising CCLK edge that accepts a byte of data (and also changes the EPROM address) until the f alling CCLK edge that makes the LSB (D0) of this byte appear at DOUT. This means that DOUT changes on the falling CC LK edge, and the next FPGA in the daisy chain accepts data on the subsequent rising CCLK edge.

The PROM address pins can be incremented or decremented, depending on the mode pin settings. This option allows the FPGA to sh ar e th e PROM with a wide variety of microprocessors and microcontrollers. Some processors must boot from the bottom of memory (all zeros) while others must boot from the top. The FPGA is flexible and can load its conf igu ratio n bit str eam fro m eit her e nd of the memory .

Master Parallel Up mode is selected by a <100> on the mode pins (M2, M1, M0). The EPROM addresses start at 00000 and increment.

Master Parallel Down mod e is selected by a <110> on the mode pins. The EPROM addresses start at 3FFFF and decrement.

November 5, 1998 (Version 5.2) 7-115

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XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

NOTE:M0 can be shorted to Ground if not used as I/O.

VCC

4.7K

3.3 K

DOUT

INIT

PROGRAM D7 D6 D5 D4 D3 D2 D1 D0

HIGH

LOW

M0 M1

XC5200

Master

Parallel

TO DIN OF OPTIONAL

N/C

CCLK

A17 A16 A15 A14 A13 A12 A11 A10

A9 A8 A7 A6 A5 A4 A3 A2 A1 A0

DONE

DAISY-CHAINED FPGAS

TO CCLK OF OPTIONAL DAISY-CHAINED FPGAS

. . .

EPROM (8K x 8)

. . .

(OR LARGER)

. . .

A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1

A0 OE CE

USER CONTROL OF HIGHER ORDER PROM ADDRESS BITS CAN BE USED TO SELECT BETWEEN ALTERNATIVE CONFIGURATIONS

D7 D6 D5 D4 D3 D2 D1 D0

M0 M1 M2

DIN

CCLK

XC5200/

XC4000E/EX/

Spartan

SLAVE

PROGRAM

DONE

N/C

DOUT

INIT

DATA BUS

PROGRAM

Figure 31: Master Parallel Mode Circuit Diagram

X9004_01

7-116 November 5, 1998 (Version 5.2)

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Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

A0-A17

(output)

D0-D7

RCLK

(output)

CCLK

(output)

DOUT

(output)

Address for Byte n

7 CCLKs CCLK

Byte

DRC

Address for Byte n + 1

RAC

RCD

D7D6

Byte n - 1 X6078

Description Symbol Min Max Units

0 200 ns

60 ns

0ns

active cycle (rising edge ).

CCLK

Delay to Address valid 1 T Data setup time 2 T Data hold time 3 T

RAC DRC RCD

Note: 1. At power-up, VCC must rise from 2.0 V to VCC min in less then 25 ms, otherwise delay conf i guration by pulling PROGRAM

Low until V

2. The first Data byte is loaded and CCLK star ts at the end of the first RCLK

is Valid.

This timing di agram shows that the EPROM requirements are extremely relaxed. EPROM acces s time can be longer than 500 ns. EPROM data output has no hold-time requirements.

Figure 32: Master Parallel Mode Programming Switching Characteristics

November 5, 1998 (Version 5.2) 7-117

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XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Synchronous Peripheral Mode

Synchronous Peripheral mode can also be considered Slave Parallel mode. An external signal drives the CCLK input(s) of t he FPG A(s). The firs t byt e of parall el c onfi guration data must be available at the Data inputs of the lead FPGA a short setup time before the rising CCLK edge. Subsequent data bytes are clocked in on every eighth consecutive rising CCLK edge.

The same CCLK edge that accepts data, also causes the RDY/BUSY name is a misnomer. In Synchron ou s Pe rip h er al m od e it is really an ACKNOWLEDGE signal. Synchronous operation does not requir e t his r es pon se, but it i s a me an i ngful si g nal

output to go High for one CCLK period. The pin

NOTE:

M2 can be shorted to Ground if not used as I/O

CLOCK

DATA BUS

N/C

M0 M1 M2

CCLK

0-7

3.3 kΩ

DOUT

for test purposes. Note that RDY/BUSY a high-impedance pullup prior to INIT

is pulled High with

going High.

The lead FPGA serializes the data and presents the preamble data (and all data that overflows the lead d e vice) on its DOUT pin. There is an int erna l d elay o f 1 .5 CCLK pe r iods, which means that DOUT changes on the falling CCLK edge, and the next FPGA in the daisy chain accepts data on the subsequent rising CCLK edge.

In order to complete the serial shift operation, 10 additional CCLK rising edges are required after the last data byte has been loaded, plus one more CCLK cycle for each daisy-chained device.

Synchronous Peripheral mode is selected by a <011> on the mode pins (M2, M1, M0).

N/C

M0 M1

CCLK OPTIONAL DAISY-CHAINED FPGAs

DIN

DOUT

XC5200

SYNCHRO-

4.7 kΩ

CONTROL

SIGNALS

3.3 kΩ

PROGRAM

NOUS

PERIPHERAL

RDY/BUSY INIT DONE

PROGRAM

Figure 33: Synchronous Peripheral Mode Circuit Diagram

XC5200E/EX

SLAVE

INIT

PROGRAM

DONE

X9005

7-118 November 5, 1998 (Version 5.2)

Page 37

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

CCL

CCLK

INIT

DOUT

RDY/BUSY

D0 - D7

BYTE 0

BYTE 0 OUT BYTE 1 OUT

1 2 3456 7

BYTE 1

Description Symbol Min Max Units

CCLK

INIT (High) setup time 1 T D0 - D7 setup time 2 T D0 - D7 hold time 3 T CCLK High time T CCLK Low time T CCLK Frequency F

IC DC CD

CCH CCL

Notes: 1. Peripheral Sync hronous mode can be considered Slave Par allel mode. An external CCLK provides timing, clocking in the

first data byte on the second rising edge of CCLK after INIT

goes high. Subsequent data bytes are clocked in on every

eighth consecutive risi ng edge of CCLK.

2. The RDY/BUSY

line goes High for one CCLK period aft er data has been clocked in, although synchronous operation does

not require such a response.

3. The pin name RDY/BUSY

is a misnomer. In synchronous peripheral mode this is really an ACKNOWLEDGE signal.

4.Note that data starts to shift ou t serially on the DOUT pin 0.5 CCLK periods aft er i t was loaded in parallel. Therefore, additional CCLK pulses are clearly required after the last byt e has been loaded.

5 µs

60 ns

0ns 50 ns 60 ns

8MHz

X6096

Figure 34: Synchronous Periph eral Mode Programming Switching Characteristics

November 5, 1998 (Version 5.2) 7-119

Page 38

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Asynchronous Peripheral Mode

Write to FPGA

Asynchronous Peripheral mode uses the trailing edge of the logic AND condition of WS and CS1 being High to accept byte-wide data from a microprocessor bu s. In t he l ead FPGA, t hi s d at a i s l oa de d i n to a double-buffered UART-like parallel-to-serial converter and is serially shifted into the internal logic.

The lead FPGA pres ents the preamble data (and all data that overflows the lead device) on its DOUT pin. The RDY/BUSY

output from the lead FPGA acts as a handshake signal to the microprocessor. RDY/BUSY when a byte has been rec eived, and goes Hig h again when the byte-wide input buffer has transferred its information into the shift register, and the buffer is ready to receive new data. A new write may be started immediately, as soon as the RDY/BUSY

output has gone Low, acknowledging receipt of the prev ious data . Write may not be te rminated until RDY/BUSY that RDY/BUSY

is High again for o ne CC LK peri od. Note

is pulled High with a high-impedance

pull-up prior to INIT going High. The length of the BUSY

the UART. If the shift register was empty when the new byte was received, the BUSY CCLK periods. If the shift reg ister was still full when the new byte was received, the BUSY nine CCLK periods.

Note that after the last byte has been entered, only seven of its bits are shifted ou t. CCLK remains High with DOUT equal to bit 6 (t he next-t o-last bit) of the last byte ente red.

and CS0 being Low and RS

goes Low

signal depends on the activity in

signal lasts for only two

signal can be a s lo ng a s

The READY/BUSY

handshake can be ignored if the delay from any one Write to the end of the next Write is guaranteed to be longer than 10 CCLK period s.

Status Read

The logic AND conditio n of the CS0, CS1 and RS inputs puts the device status on the Dat a bus.

• D7 High indicates Ready

• D7 Low indicates Busy

• D0 through D6 go unconditionally High It is mandator y th at t he whol e st a rt -u p se quen c e b e s t art e d

and completed by one byte-wide input. Otherwise, the pins used as Write Strobe or Chip Enable might become active outputs and interfere with the final byte transfer. If this transfer does not occur, the start-up sequence is not completed all the way to the finish (point F in Figure 25 on page

109).

In this case, at worst, the internal re set is not rele ased. At best, Readback and Boundary Scan are inhibited. The length-count value, as generated by the software, ensures that these problems never occur.

Although RDY/BUSY microprocessors can more easily read this information on one of the data lines. For this purpose, D7 represents the RDY/BUSY

status when RS is Low, WS is High, and the

two chip select lines are both active. Asynchronous Peripheral mode is selected by a <101> on

the mode pins (M2, M1, M0).

is brought out as a separate signal,

M0 M1

CCLK

DIN

XC5200/

XC4000E/EX

SLAVE

INIT DONE PROGRAM

N/C

DOUT

X9006

CONTROL

SIGNALS

4.7 kΩ

REPROGRAM

VCC

4.7 kΩ

3.3 kΩ

DATA

BUS

ADDRESS

BUS

ADDRESS

...

DECODE

LOGIC

N/C N/C

3.3 kΩ

M0 M1

D0–7

CS0

XC5200

ASYNCHRO-

NOUS

PERIPHERAL

CS1 RS WS RDY/BUSY INIT

DONE

PROGRAM

CCLK

DOUT

OPTIONAL DAISY-CHAINED FPGAs

Figure 35: Asynchronous Peripheral Mode Circuit Diagram

7-120 November 5, 1998 (Version 5.2)

Page 39

WS/CS0

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Write to LCA Read Status

RS, CS0

RS, CS1

D0-D7

CCLK

RDY/BUSY

DOUT

WTRB

Previous Byte D6 D7 D0 D1 D2

BUSY

READY

BUSY

WS, CS1

X6097

Description Symbol Min Max Units

100 ns

60 ns

0ns

60 ns

Write

Effective Write time

, WS=Low; RS, CS1=High

(CSO

DIN setup time 2 T DIN hold time 3 T RDY/BUSY

delay after end of

DC CD

WTRB

Write or Read

RDY

RDY/BUSY of Read

RDY/BUSY

active after beginning

Low output (Note 4) 6 T

760ns

BUSY

2 9 CCLK

periods

Notes: 1. Configuration m ust be delayed until INIT pins of all daisy-chained FPGAs are high.

2. The time from the end of WS

to CCLK cycle for the new byte of data depends on the completion of previous byte processing

and the phase of internal timing generator for CCLK.

3. CCLK and DOUT timing is tested in slave mode.

4. T

indicates that the double-buffered parallel-to-serial converter is not yet ready to receive new data. The shortest T

BUSY

occurs when a byte is loaded into an em pty parallel-to-serial converter. The longest T loaded into the input register before the second-level buffer has started shifting out data.

occurs when a new word is

BUSY

This timing diag ram shows very rela xed requ irement s. Data n eed not be held beyon d the risi ng edge o f WS. RDY/BUSY will go active within 60 ns af te r th e en d o f WS may not be terminated until RDY/BUSY

. A new write may be asserted immediately after RDY/BUSY goes Low, but write

has been High for one CCLK period.

Figure 36: Asynchronous Peripheral Mode Programming Switching C h aracteristics

November 5, 1998 (Version 5.2) 7-121

Page 40

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Express Mode

Express mode is simila r to S lave Serial m ode, except that data is processed one byte per CCLK cycle instead of one bit per CCLK cycle. An external source is used to drive CCLK, while byte-wide d a ta is lo ade d d ir ect ly in to th e co nfiguration data shift registers. A CCLK frequency of 10 MHz is equivalent to an 80 MHz serial rate, because eight bits of configuration data are loaded per CCLK cycle. Express mode does not support CRC error checking, but does support constant-field error checking.

In Express mode, an external signal drives the CCLK input of the FPGA device. The first byte of parallel configuration data must be available at the D inputs of the FPGA a short setup time before the second rising CCLK edge. Subsequent data bytes are clocked in on each consecutive rising CCLK edge.

If the first device is configured in Express mode, additional devices may be daisy -chained only if every device in th e chain is also config ured in E xpres s mode. CCLK p ins are tied together and D0-D7 pins are tied together for all devices along the chain. A status signal is passed from DOUT to CS1 of successive devices along the chain. The lead device in the chain ha s its CS1 inp ut tied Hig h (or floating, since there is an internal pullup). Frame data is

accepted only when CS1 is Hig h and the d evice’s con figu-

M0 M1 M2

DATA BUS

CS1

D0-D7

VCC

4.7KΩ

DOUT

XC5200

ration memory is not already full. The status pin DOUT is pulled Low two internal-oscillator cycles after INIT nized as High, and remains Low until the device’s configuration memory is full. DOU T is then pulled High to signal the next devic e in t he chain to acc ept t he confi gurati on dat a on the D0-D7 bus.

The DONE pins of a ll devices in the chain sho uld be tied together, with one or more active internal pull-ups. If a large number of devices are included in the chain, deactivate some of the internal pull-ups, since the Low-driving DONE pin of the last device in the chain must sink the current from all pull-ups in the chain. The DONE pull-up is activated by default. It can be deactivated using an option in the bitstream generation software.

XC5200 devices in Express mode are always synchronized to DONE. The device becomes active after DONE goes High. DONE is an open-drain output. With the DONE pins tied together, therefore, the exte rnal DONE sig nal stay s low until all d evice s ar e co nfigur ed, then all devi ces i n t he dai sy chain become active simultaneously. If the DONE pin of a device is left unconnected, the device becomes active as soon as that device has been configured.

Express mode is selected by a <010> on the mode pins (M2, M1, M0).

VCC

NOTE: M2, M1, M0 can be shorted

M0 M1

CS1

D0-D7

Optional

Daisy-Chained

XC5200

3.3 kΩ

DOUT

to Ground if not used as I/O

To Additional Optional Daisy-Chained Devices

is recog-

PROGRAM

INIT

CCLK

PROGRAM

INIT

CCLK CCLK

Figure 37: Express Mode Circuit Diagram

7-122 November 5, 1998 (Version 5.2)

PROGRAM

INIT

DONEDONE

To Additional Optional Daisy-Chained Devices

X6611_01

Page 41

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

CCLK

INIT

D0-D7

Serial Data Out

(DOUT)

RDY/BUSY

CS1

DC BYTE

BYTE1BYTE2BYTE

Internal INIT

Description Symbol Min Max Units

INIT (High) Setup time required 1 T DIN Setup time required 2 T

CCLK

DIN hold time required 3 T CCLK High time T CCLK Low time T CCLK frequency F

Note: If not driven by the preceding DOUT, CS1 mus t remain high until the device is fully con figured.

IC DC CD

CCH CCL

FPGA Filled

X5087

5 µs

30 ns

0ns

30 ns 30 ns

10 MHz

Figure 38: Express Mode Programming Switching Characteristics

November 5, 1998 (Version 5.2) 7-123

Page 42

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Table 13. Pin Functions During Configuration

CONFIGURATION MODE: <M2:M1:M0>

SLAVE

<1:1:1>

TDI TDI TDI TDI TDI TDI TDI TDI-I/O

TCK TCK TCK TCK TCK TCK TCK TCK-I/O

TMS TMS TMS TMS TMS TMS TMS TMS-I/O

M1 (HIGH) (I) M1 (LOW) (I) M1 (HIGH) (I) M1 (LOW) (I) M1 (HIGH) (I) M1 (LOW) (I) M1 (HIGH) (I) I/O M0 (HIGH) (I) M0 (LOW) (I) M0 (HIGH) (I) M 0 (HIGH) (I) M0 (LOW) (I) M0 (LOW) (I) M0 (LOW) (I) I/O M2 (HIGH) (I) M2 (LOW) (I) M2 (LOW) (I) M2 (HIGH) (I) M2 (HIGH) (I) M2 (HIGH) (I) M2 (LOW) (I) I/O

HDC (HIGH) HDC (HIGH) HDC (HIGH) HDC (HIGH) HDC (HIGH) HDC (HIGH) HDC (HIGH) I/O

LDC (LOW)LDC (LOW)LDC (LOW)LDC (LOW)LDC (LOW)LDC (LOW)LDC (LOW) I/O

-ERROR INIT-ERROR INIT-ERROR INIT-ERROR INIT-ERROR INIT-ERROR INIT-ERROR I/O

INIT

DONE DONE DONE DONE DONE DONE DONE DONE

PROGRAM (I) PROGRAM (I) PROGRAM (I) PROGRAM (I) PROGRAM (I) PROGRAM (I) PROGRAM (I) PROGRAM

DIN (I) DIN (I) DATA 0 (I) DATA 0 (I) DATA 0 (I) DATA 0 (I) DATA 0 (I) I/O

DOUT DOUT DOUT DOUT DOUT DOUT DOUT I/O

CCLK (I) CCLK (O) CCLK (I) CCLK ( O) CCLK (O) CCLK (O) CCLK (I) CCLK (I)

TDO TDO TDO TDO TDO TDO TDO TDO-I/O

Notes: 1. A shaded table ce ll represents a 20-kΩ to 100-kΩ pull-up resistor before and during configuration.

2. (I) represents an input (O) represents an output.

3. INIT

MASTER-SER

<0:0:0>

is an open-drain output during configuration.

SYN.PERIPH

<0:1:1>

DATA 7 (I) DATA 7 (I) DATA 7 (I) DATA 7 (I) DATA 7 (I) I/O

DATA 6 (I) DATA 6 (I) DATA 6 (I) DATA 6 (I) DATA 6 (I) I/O DATA 5 (I) DATA 5 (I) DATA 5 (I) DATA 5 (I) DATA 5 (I) I/O

DATA 4 (I) DATA 4 (I) DATA 4 (I) DATA 4 (I) DATA 4 (I) I/O DATA 3 (I) DATA 3 (I) DATA 3 (I) DATA 3 (I) DATA 3 (I) I/O

DATA 2 (I) DATA 2 (I) DATA 2 (I) DATA 2 (I) DATA 2 (I) I/O DATA 1 (I) DATA 1 (I) DATA 1 (I) DATA 1 (I) DATA 1 (I) I/O

RDY/BUSY RDY/BUSY RCLK RCLK I/O

ASYN.PERIPH

<1:0:1>

CSO (I) I/O

RS (I) I/O

WS (I) A0 A0 I/O

CS1 (I) A2 A2 CS1 (I) I/O

MASTER-HIGH

<1:1:0>

A16 A16 GCK1-I/O A17 A17 I/O

A1 A1 GCK4-I/O

A3 A3 I/O A4 A4 I/O A5 A5 I/O A6 A6 I/O A7 A7 I/O A8 A8 I/O

A9 A9 I/O A10 A10 I/O A11 A11 I/O A12 A12 I/O A13 A13 I/O A14 A14 I/O A15 A15 I/O

MASTER-LOW

<1:0:0>

EXPRESS

<0:1:0>

USER

OPERATION

I/O

GCK2-I/O

I/O

GCK3-I/O

ALL OTHERS

7-124 November 5, 1998 (Version 5.2)

Page 43

Product Obsolete or Under Obsolescence

Configuration Switching Characteristics

XC5200 Series Field Programmable Gate Arrays

Vcc

PROGRAM

INIT

X1532

POR

CCLK OUTPUT or INPUT

M0, M1, M2 (Required)

Master Modes

Description Symbol Min Max Units

Power-On-Reset T Program Latency T CCLK (output) Delay

period (slow) period (fast)

T T

POR

ICCK CCLK CCLK

RE-PROGRAM

>300 ns

ICCK

VALID

CCLK

DONE RESPONSE

<300 ns

I/O

215 ms

670µs per CLB column

40 640 100

375

3000

375

µs ns ns

Slave and Peripheral Modes

Description Symbol Min Max Units

Power-On-Reset T Program Latency T CCLK (input) Delay (required)

period (require d)

Note:

At power-up, VCC must rise from 2.0 to VCC min in less than 15 ms, otherwise delay conf i guration using PROGRAM until V

is valid.

POR

ICCK

CCLK

215 ms

670µs per CLB column 5

100

µs ns

November 5, 1998 (Version 5.2) 7-125

Page 44

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

XC5200 Program Readback Switching Characteristic Guidelines

Testing of the switchi ng parame t ers is mod eled af te r t es ti ng m et hods sp ec ifie d by MI L- M-3 85 10/60 5. Al l devi ces ar e 10 0% functionall y tes ted . I nter nal ti min g par ameters are not measu red d ire ctly. They are der ive d from b en chmark tim ing pa tter ns that are taken at device introduction, prior to any process improvements.

The following guidelines reflect worst-case values over the recommended opera ting conditions.

Finished

Internal Net

RTL

rdbk.TRIG

RCRT

RCH

rdclk.I

RTRC

RCL

rdbk.RIP

rdbk.DATA

RCRR

DUMMY DUMMY

RCRD

VALID

Description Symbol Min Max Units

rdbk.TRIG rdbk.TRIG setup to i nitiate and abort Readback

rdbk.TRIG hold to init iat e an d ab or t Re ad ba ck

rdclk.1 rdbk.DATA delay

rdbk.RIP delay High time Low time

Note 1: Timing parameters apply to all speed grad es. Note 2: rdbk.TRIG is High prior to Finished, Fin is hed will trigger the first Readback

1 2

7 6 5 4

RTRC

RCRT

RCRD

RCRR

RCH

RCL

200

250 250

250 250 500 500

X1790

ns ns

ns ns ns ns

7-126 November 5, 1998 (Version 5.2)

Page 45

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

XC5200 Switching Characteristics

Definition of Terms

In the following tables, some specifications may be designated as Advance or Preliminary. These terms are defined as follows:

Advance: Initial estimates based on simulation and/or extrapolation from other speed grades, devices, or device families. Use as estimates, not for production.

Preliminary: Based on preliminary characterizati on. Further changes are not expected. Unmarked: Specifications not identified as either Advance or Preliminary are to be considered Final.

XC5200 Operating Conditions

Symbol Description Min Max Units

IHT

ILT

IHC

ILC

Supply voltage relative to GND Commercial: 0°C to 85°C junct ion 4.75 5.25 V Supply voltage relative to GND Industrial: -40°C to 100°C junction 4.5 5.5 V

High-level input voltage — TTL configuration 2.0 V Low-level input voltage — TTL configuration 0 0.8 V High-level input voltage — CMOS configuration 70% 100% V Low-level input voltage — CMOS configuration 0 20% V Input signal transition time 250 ns

CC CC

XC5200 DC Characteristics Over Operating Conditions

Symbol Description Min Max Units

CCO

RIN

Note: 1. With no output current loads, all package pins at Vcc or GND, either TTL or CMOS inputs, and the FPGA configured with a

High-level output voltage @ IOH = -8.0 mA, VCC min 3.86 V Low-level output voltage @ IOL = 8.0 mA, VCC max 0.4 V Quiescent FPGA supply current (Note 1) 15 mA Leakage current -10 +10 µA Input capacitance (sample tested) 15 pF Pad pull-up (when selected) @ VIN = 0V (sample teste d) 0.02 0.30 mA

tie option.

XC5200 Absolute Maximum Ratings

Symbol Description Units

STG

SOL

Note:

Supply voltage relative to GND -0.5 to +7.0 V Input voltage with respect to GND -0.5 to V Voltage applied to 3-state output -0.5 to V

+0.5 V

Storage temperature (ambient) -65 to +150 °C Maximum soldering temperature (10 s @ 1/16 in. = 1.5 mm) +260 °C Junction temper at ur e in pla st i c pac ka ge s +125 °C Junction temper at ur e in ce ra m ic pac k a ge s +150 °C

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those list ed under Recommended Operating Conditions is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.

1. Notwithstanding the definit i on of the above terms, all specifications are subject to change without not i ce.

November 5, 1998 (Version 5.2) 7-127

Page 46

XC5200 Series Field Programmable Gate Arrays

TBUF

Product Obsolete or Under Obsolescence

XC5200 Global Buffer Switching Characteristic Guidelines

Testing of the switching parameters is modeled after testing methods specified by MIL-M-38510/605. All devices are 100% functionally tested. Since many internal timing parameters cannot be measured directly, they are derived from benchmark timing patterns. The following guidelines reflect worst-case values over the recommended operating conditions. For more detailed, more precise, and more up-to-date timing information, use the values provided by the timing calculator and used in the simulator.

Speed Grade-6-5-4-3

Description Symbol Device

Global Signal Distribution

From pad through gl obal buffer, to any clock (CK)

BUFG

Max

(ns)

XC5202 9.1 8.5 8.0 6.9 XC5204 9.3 8.7 8.2 7.6

Max (ns)

Max

(ns)

XC5206 9.4 8.8 8.3 7.7 XC5210 9.4 8.8 8.5 7.7 XC5215 10.5 9.9 9.8 9.6

XC5200 Longline Switching Characteristic Guidelines

Description Symbol Device

TBUF driving a Longline

I to Longline, while TS is Low; i.e., buffer is constantly active

TS going Low to Longline going from flo ating High or Low to active Low or High

TS going High to TBUF going inactive, not driving Longline

Note:

1. Die-size-dependent parameters are based upon XC5215 characterization. Production specificatio ns will var y with array size.

Speed Grade

XC5202 6.0 3.8 3.0 2.0

XC5204 XC5206 XC5210 XC5215

XC5202 7.8 5.6 4.7 4.0

XC5204 XC5206 XC5210 XC5215

OFF

XC52xx 3.0 2.8 2.6 2.4

-6 -5 -4 -3

Max

(ns)

Max (ns)

6.4 4.1 3.2 2.3

6.6 4.2 3.3 2.7

6.6 4.2 3.3 2.9

7.3 4.6 3.8 3.2

8.3 5.9 4.9 4.3

8.4 6.0 5.0 4.4

8.9 6.3 5.3 4.5

7-128 November 5, 1998 (Version 5.2)

Page 47

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

XC5200 CLB Switching Characteristic Guidelines

Speed Grade -6 -5 -4 -3

Description Symbol

Combinatorial Delays

F inputs to X output T F inputs via transparent latch to Q T DI inputs to DO output (Logic-Cell

Feedthrough) F inputs via F5_MUX to DO output T

Carry Delays

Incremental delay per bit T Carry-in overhead from DI T Carry-in overhead from F T Carry-out overhead to DO T

Sequential Delays

Clock (CK) to out (Q) (Flip-Flop) T Gate (Latch enable) going active to out (Q) T

Set-up Time Before Clock (CK)

F inputs T F inputs via F5_MUX T DI input T CE input T

Hold Times After Clock (CK)

F inputs T F inputs via F5_MUX T DI input T CE input T

Clock Widths

Clock High Time T Clock Low Time T Toggle Frequency (MHz) (Note 3) F

Reset Delays

Width (High) T Delay from CLR to Q (Flip-Flop) T Delay from CLR to Q (Latch) T

Global Reset Delays

Width (High) T Delay from internal GR to Q T

ILO ITO

IDO

IMO

CYDI

CYL

CYO

CKO

ICK MICK DICK EICK

CKI

CKMI

CKDI CKEI

TOG

CLRW

CLR

CLRL

GCLRW

GCLR

Min (ns)

Max (ns)

Min (ns)

Max

(ns)

Min

(ns)

Max

(ns)

Min

(ns)

Max

(ns)

5.6 4.6 3.8 3.0

8.0 6.6 5.4 4.3

4.3 3.5 2.8 2.4

7.2 5.8 5.0 4.3

0.7 0.6 0.5 0.5

1.8 1.6 1.5 1.4

3.7 3.2 2.9 2.4

4.0 3.2 2.5 2.1

5.8 4.9 4.0 4.0

9.2 7.4 5.9 5.5

2.3 1.8 1.4 1.3

3.8 3.0 2.5 2.4

0.8 0.5 0.4 0.4

1.6 1.2 0.9 0.9

00 0 0 00 0 0 00 0 0 00 0 0

6.0 6.0 6.0 6.0

6.0 6.0 6.0 6.0 83 83 83 83

6.0 6.0 6.0 6.0

7.7 6.3 5.1 4.0

6.5 5.2 4.2 3.0

6.0 6.0 6.0 6.0

14.7 12.1 9.1 8.0

Note:

1. The CLB K to Q output delay (T Data In hold-time requirement (T

2. Timing is based upon the XC5215 device. For other devices, see Timing Calculator.

3. Maximum flip-flop toggle rate for export control purposes.

) of any CLB, plus the shortest possible interconnect delay, is always longer than the

CKO

) of any CLB on the same die.

CKDI

November 5, 1998 (Version 5.2) 7-129

Page 48

XC5200 Series Field Programmable Gate Arrays

Global Clock-to-Output Delay

Direct

Connect

IOB

CLB

FAST

BUFG

Global Clock-to-Output Delay

Direct

Connect

IOB

CLB

BUFG

Input Set-up & Hold

Time

F,DI

IOB(NODELAY)

Direct

Connect

CLB

BUFG

Input Set-up & Hold

Time

Direct

Connect

CLB

IOB

(NODELAY)

F,DI

BUFG

Input Set-up & Hold

Time

IOB

Direct

Connect

CLB

BUFG

Input

Set-up & Hold

Time

IOB

Direct

Connect

CLB

BUFG

Input

Set-up

& Hold

Time

IOB

Direct

Connect

CLB

BUFG

F,DI

Product Obsolete or Under Obsolescence

XC5200 Guaranteed Input and Output Parameters (Pin-to-Pin)

All values lis t ed bel ow ar e te s te d dir ec tly, and guaranteed ove r t he ope rat i n g co ndi tio ns . Th e s ame par ame te rs ca n als o b e derived indirectly from the Global Buffer specifications. The delay calculator uses this indirect method, and may overestimate because of worst-case assumptions. When there is a discrepancy between these two methods, the values listed below should be used, and the derived values should be considered conservative overestimates.

Description Symbol Device

Global Clock to Output Pad (fast) T

(Max)

Global Clock to Output Pad (slew-limited) T

(Max)

Input Set-up Time (no delay ) to CLB Flip -Flop T

(Min)

Input Hold Time (no delay) to CLB Flip-F lop T

(Min)

Input Set-up Time (with delay) to CL B Flip-F lop D I Input T

Input Set-up Time (with delay) to CLB Flip-Flop F Input T

(Min)

Input Hold Time (with delay) to CLB Flip-F lop T

Speed Grade

ICKOF

XC5202 XC5204 XC5206 XC5210 XC5215

ICKO

XC5202 XC5204 XC5206 XC5210 XC5215

PSUF

XC5202 XC5204 XC5206 XC5210 XC5215 XC5202

PHF

XC5204 XC5206 XC5210 XC5215

PSU

XC5202 7.3 6.6 6.6 6.6 XC5204 XC5206 XC5210 XC5215

PSUL

XC5202 XC5204 XC5206 XC5210 XC5215 XC52xx

-6 -5 -4 -3

Max (ns)

Max

(ns)

Max

(ns)

Max (ns)

16.9 15.1 10.9 9.8

17.1 15.3 11.3 9.9

17.2 15.4 11.9 10.8

17.2 15.4 12.8 11.2

19.0 17.0 12.8 11.7

21.4 18.7 12.6 11.5

21.6 18.9 13.3 11.9

21.7 19.0 13.6 12.5

21.7 19.0 15.0 12.9

24.3 21.2 15.0 13.1

2.5 2.0 1.9 1.9

2.3 1.9 1.9 1.9

2.2 1.9 1.9 1.9

2.2 1.9 1.9 1.8

2.0 1.8 1.7 1.7

3.8 3.8 3.5 3.5

3.9 3.9 3.8 3.6

4.4 4.4 4.4 4.3

5.1 5.1 4.9 4.8

5.8 5.8 5.7 5.6

7.3 6.6 6.6 6.6

7.2 6.5 6.4 6.3

7.2 6.5 6.0 6.0

6.8 5.7 5.7 5.7

8.8 7.7 7.5 7.5

8.6 7.5 7.5 7.5

8.5 7.4 7.4 7.4

8.5 7.4 7.4 7.3

8.5 7.4 7.4 7.2 0 000

Note:

7-130 November 5, 1998 (Version 5.2)

1. These measurements assume that the CLB flip-flop uses a direct interconnect to or from the IOB. The INREG/ OUTREG properties, or XACT-Performance, can be used to assure that direct connects are used . t DI that bypasses the look- up table, which only offers direct connec ts to IOBs on the left and right edges of the die. t applies to the CLB inputs F that feed the look-up table, which offers direct connect to IOBs on all four edges, as do the CLB Q outputs.

2. When testing outputs (fast or slew-limited), half of the outputs on one side of the device are switching.

(Min)

applies only to the CLB input

PSU

PSUL

Page 49

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

XC5200 IOB Switching Characteristic Guidelines

Speed Grade -6 -5 -4 -3

Description Symbol

Input

Propagation Delays from CMOS or TTL Levels

Pad to I (no delay) T Pad to I (with delay) T

Output

Propagation Delays to CMOS or TTL Levels

Output (O) to Pad (fast) T Output (O) to Pad (slew-limited) T From clock (CK) to output pad (fast), using direct connect between Q

and output (O) From clock (CK) to output pad (slew-limited), using direct connect be-

tween Q and output (O) 3-state to Pad active (fast) T 3-state to Pad active (slew-limited) T Internal GTS to Pad active T

OKPOF

OKPOS

TSONF TSONS

PID

OPF OPS

GTS

Max

(ns)

5.7 5.0 4.8 3.3

11.4 10.2 10.2 9.5

4.6 4.5 4.5 3.5

9.5 8.4 8.0 5.0

10.1 9.3 8.3 7.5

14.9 13.1 11.8 10.0

5.6 5.2 4.9 4.6

10.4 9.0 8.3 6.0

17.7 15.9 14.7 13.5

Max (ns)

Max

(ns)

Max (ns)

Note:

1. Timing is measured at pin threshold, with 50-pF external capacitance loads. Slew-limi ted output rise/fall times are approximately two times long er than fast output rise/fall time s.

2. Unused and unbonded IOBs are configured by default as inputs with internal pull-up resistors.

3. Timing is based upon the XC5215 device. For other devices, see Timing Calculator.

November 5, 1998 (Version 5.2) 7-131

Page 50

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

XC5200 Boundary Scan (JTAG) Switching Characteristic Guidelines

The following gui delines r eflect wor st-case valu es over the recommended oper ating con ditions. They are expres sed in units of nanoseconds and apply to all X C5200 devices un less otherwise noted.

Speed Grade -6

Description Symbol Min Max Min Max Min Max Min Max

Setup and Hold

Input (TDI) to clock (TCK)

TDITCK

30.0

30.0 setup time Input (TDI) to clock (TCK)

TCKTDI

0 hold time Input (TMS) to clock (TCK)

TMSTCK

15.0

15.0 setup time Input (TMS) to clock (TCK)

TCKTMS

hold time

Propagation Delay

Clock (TCK) to Pad (TDO) T

TCKPO

30.0 30.0 30.0 30.0

Clock

Clock (TCK) High Clock (TCK) Low

(MHz) F

MAX

Note 1: Input pad setup and hold times are specified with respect to the internal clock.

TCKH

TCKL

MAX

30.0

10.0 10.0 10.0 10.0

-5 -4 -3

30.0

15.0

30.0

15.0

30.0

7-132 November 5, 1998 (Version 5.2)

Page 51

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Device-Specific Pinout Tables

Device-specific ta bles includ e all pack ages fo r each XC 5200-S eries devic e. The y follow th e pad lo cations ar ound th e die, and include boundary scan register locations.

Pin Locations for XC5202 Devices

The following table may contain pinout information for unsupported device/package combinations. Please see the availability charts elsewhere in the XC5200 Series data sheet for availability information.

Pin Description VQ64* PC84 PQ100 VQ100 TQ144 PG156 Boundary Scan Order

VCC - 2 92 89 128 H3 -

1. I/O (A8) 57 3 93 90 129 H1 51

2. I/O (A9) 58 4 94 91 130 G1 54

3. I/O - - 95 92 131 G2 57

4. I/O - - 96 93 132 G3 63

5. I / O (A10) - 5 97 94 1 33 F1 66

6. I/O (A11) 59 6 98 95 134 F2 69 GND - - - - 137 F3 -

7. I/O (A12) 60 7 99 96 138 E3 78

8. I / O (A13) 61 8 100 97 139 C1 81

9. I / O (A14) 62 9 1 98 142 B1 90

10. I/O (A15) 63 10 2 99 143 B2 93 VCC 64113100144C3 GND - 12 4 1 1 C4 -

11. GCK1 (A16, I/O ) 1 13 5 2 2 B3 102

12. I/O (A17) 2 14 6 3 3 A1 105

13. I/O (TDI) 3 15 7 4 6 B4 111

14. I/O (TCK) 4 16 8 5 7 A3 114 GND - - - - 8 C6 -

15. I/O (TMS) 5 17 9 6 11 A5 117

16. I/O 6 18 10 7 12 C7 123

17. I/O - - - - 13 B7 126

18. I/O - - 11 8 14 A6 129

19. I/O - 19 12 9 15 A7 135

20. I/O 7 20 13 10 16 A8 138 GND 8 21 14 11 17 C8 VCC 9 22 15 12 18 B8 -

21. I/O - 23 16 13 19 C9 141

22. I/O 10 24 17 14 20 B9 147

23. I/O - 18 15 21 A9 150

24. I/O - - - 22 B10 153

25. I/O - 25 19 16 23 C10 159

26. I/O 11 26 20 17 24 A10 162 GND - - - 27 C11 -

27. I/O 12 27 21 18 28 B12 165

28. I/O - 22 19 29 A13 171

29. I/O 13 28 23 20 32 B13 174

30. I/O 14 29 24 21 33 B14 177

31. M1 (I/O) 15 30 25 22 34 A15 186 GND - 31 26 23 35 C13 -

32. M0 (I/O) 16 32 27 24 36 A16 189 VCC - 33 28 25 37 C14 -

33. M2 (I/O) 17 34 29 26 38 B15 192

34. GCK2 (I/O) 18 35 30 27 39 B16 195

November 5, 1998 (Version 5.2) 7-133

Page 52

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description VQ64* PC84 PQ100 VQ100 TQ144 PG156 Boundary Scan Order

35. I/O (HDC) 19 36 31 28 40 D14 204

36. I/O - - 32 29 43 E14 207

37. I/O (LDC) 20 37 33 30 44 C16 210 GND - - - - 45 F14 -

38. I/O - 38 34 31 48 F16 216

39. I/O 21 39 35 32 49 G14 219

40. I/O - - 36 33 50 G15 222

41. I/O - - 37 34 51 G16 228

42. I/O 22 40 38 35 52 H16 231

43. I/O (ERR VCC 24 42 40 37 54 H14 GND 25 43 41 38 55 J14 -

44. I/O 26 44 42 39 56 J15 240

45. I/O 27 45 43 40 57 J16 243

46. I/O - - 44 41 58 K16 246

47. I/O - - 45 42 59 K15 252

48. I/O 28 46 46 43 60 K14 255

49. I/O 29 47 47 44 61 L16 258 GND - - - - 64 L14 -

50. I/O - 48 48 45 65 P16 264

51. I/O 30 49 49 46 66 M14 267

52. I/O - 50 50 47 69 N14 276

53. I/O 31 51 51 48 70 R16 279 GND - 52 52 49 71 P14 DONE 32 53 53 50 72 R15 VCC 33 54 54 51 73 P13 PROG 34 55 55 52 74 R14 -

54. I/O (D7) 35 56 56 53 75 T16 288

55. GCK3 (I/O) 36 57 57 54 76 T15 291

56. I/O (D6) 37 58 58 55 79 T14 300

57. I/O - - 59 56 80 T13 303 GND - - - - 81 P11 -

58. I/O (D5) 38 59 60 57 84 T10 306

59. I/O (CS0

60. I/O - - 62 59 86 R10 315

61. I/O - - 63 60 87 T9 318

62. I/O (D4) 39 61 64 61 88 R9 324

63. I/O - 62 65 62 89 P9 327 VCC 40 63 66 63 90 R8 GND 41 64 67 64 91 P8 -

64. I/O (D3) 42 65 68 65 92 T8 336

65. I/O (RS

66. I/O - - 70 67 94 T6 342

67. I/O - - - - 95 R7 348

68. I/O (D2) 44 67 71 68 96 P7 351

69. I/O - 68 72 69 97 T5 360 GND - - - - 100 P6 -

70. I/O (D1) 45 69 73 70 101 T3 363

71. I/O (RCLK-BUSY

72. I/O (D0, DIN) 46 71 75 72 105 P4 372

73. I/O (DOUT) 47 72 76 73 106 T2 375

, INIT) 23 41 39 36 53 H15 234

) - 60 61 58 85 P10 312

) 43 66 69 66 93 T7 339

- 70 74 71 102 P5 366

/RDY)

7-134 November 5, 1998 (Version 5.2)

Page 53

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description VQ64* PC84 PQ100 VQ100 TQ144 PG156 Boundary Scan Order

CCLK 48 73 77 74 107 R2 VCC - 74 78 75 108 P3 -

74. I/O (TDO) 49 75 79 76 109 T1 0 GND - 76 80 77 110 N3 -

75. I/O (A0, WS

76. GCK4 (A1, I/O) 51 78 82 79 112 P2 15

77. I/O (A2, CS1) 52 79 83 80 115 P1 18

78. I/O (A3) - 80 84 81 116 N1 21 GND - - - - 118 L3 -

79. I/O (A4) - 81 85 82 121 K3 27

80. I/O (A5) 53 82 86 83 122 K2 30

81. I/O - - 87 84 123 K1 33

82. I/O - - 88 85 124 J1 39

83. I/O (A6) 54 83 89 86 125 J2 42

84. I/O (A7) 55 84 90 87 126 J3 45 GND 56 1 91 88 127 H2 -

* VQ64 package supports Master Serial, Slave Serial, and Express configuration modes only.

)50778178111R1 9

Additional No Connect (N.C.) Connections on TQ144 Packa ge

TQ144

135 9 41 67 98 117 136 10 42 68 99 119 140 25 46 77 103 120 141 26 47 78 104

4 30 62 82 113 5 31 63 83 114

Notes: Boundary Scan Bit 0 = TDO.T

Boundary Scan Bit 1 = TDO.O Boundary Scan Bit 1056 = BSCAN.UP D

Pin Locations for XC5204 Devices

Pin Description PC84 PQ100 VQ100 TQ144 PG156 PQ160 Boundary Scan Order

VCC 2 92 89 128 H3 142 -

1. I/O (A8) 3 93 90 129 H1 143 78

2. I/O (A9) 4 94 91 130 G1 144 81

3. I/O - 95 92 131 G2 145 87

4. I/O - 96 93 132 G3 146 90

5. I/O (A10) 5 97 94 133 F1 147 93

6. I/O (A11) 6 98 95 134 F2 148 99

7. I/O - - - 135 E1 149 102

8. I/O - - - 136 E2 150 105

GND - - - 137 F3 151 -

9. I/O - - - - D1 152 111

10. I/O - - - - D2 153 114

11. I/O (A12) 7 99 96 138 E3 154 117

12. I/O (A13) 8 100 97 139 C1 155 123

13. I/O - - - 140 C2 156 126

November 5, 1998 (Version 5.2) 7-135

Page 54

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 PQ100 VQ100 TQ144 PG156 PQ160 Boundary Scan Order

14. I/O - - - 141 D3 157 129

15. I/O (A14) 9 1 98 142 B1 158 138

16. I/O (A15) 10 2 99 143 B2 159 141

VCC 11 3 100 144 C3 160 GND 12 4 1 1 C4 1 -

17. GCK1 (A16, I/O) 13 5 2 2 B3 2 150

18. I/O (A17) 14 6 3 3 A1 3 153

19. I/O - - - 4 A2 4 159

20. I/O - - - 5 C5 5 162

21. I/O (TDI) 15 7 4 6 B4 6 165

22. I/O (TCK) 16 8 5 7 A3 7 171

GND - - - 8 C6 10 -

23. I/O - - - 9 B5 11 174

24. I/O - - - 10 B6 12 177

25. I/O (TMS) 17 9 6 11 A5 13 180

26. I/O 18 10 7 12 C7 14 183

27. I/O - - - 13 B7 15 186

28. I/O - 11 8 14 A6 16 189

29. I/O 19 12 9 15 A7 17 195

30. I/O 20 13 10 16 A8 18 198

GND 21141117C819 VCC 22151218B820 -

31. I/O 23 16 13 19 C9 21 201

32. I/O 24 17 14 20 B9 22 207

33. I/O - 18 15 21 A 9 23 210

34. I/O - - - 22 B10 24 213

35. I/O 25 19 16 23 C10 25 219

36. I/O 26 20 17 24 A10 26 222

37. I/O - - - 25 A11 27 225

38. I/O - - - 26 B11 28 231

GND - - - 27 C11 29 -

39. I/O 27 21 18 28 B12 32 234

40. I/O - 22 19 29 A13 33 237

41. I/O - - - 30 A14 34 240

42. I/O - - - 31 C12 35 243

43. I/O 28 23 20 32 B13 36 246

44. I/O 29 24 21 33 B14 37 249

45. M1 (I/O) 30 25 22 34 A15 38 258

GND 31262335C1339 -

46. M0 (I/O) 32 27 24 36 A16 40 261

VCC 33282537C1441 -

47. M2 (I/O) 34 29 26 38 B15 42 264

48. GCK2 (I/O) 35 30 27 39 B16 43 267

49. I/O (HDC) 36 31 28 40 D14 44 276

50. I/O - - - 41 C15 45 279

51. I/O - - - 42 D15 46 282

52. I/O - 32 29 43 E14 47 288

53. I/O (LDC) 37 33 30 44 C16 48 291

54. I/O - - - - E15 49 294

55. I/O - - - - D16 50 300

GND - - - 45 F14 51 -

56. I/O - - - 46 F15 52 303

7-136 November 5, 1998 (Version 5.2)

Page 55

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PC84 PQ100 VQ100 TQ144 PG156 PQ160 Boundary Scan Order

57. I/O - - - 47 E16 53 306

58. I/O 38 34 31 48 F16 54 312

59. I/O 39 35 32 49 G14 55 315

60. I/O - 36 33 50 G15 56 318

61. I/O - 37 34 51 G16 57 324

62. I/O 40 38 35 52 H16 58 327

63. I/O (ERR, INIT) 41 39 36 53 H15 59 330

VCC 42403754H1460 GND 43413855J1461 -

64. I/O 44 42 39 56 J15 62 336

65. I/O 45 43 40 57 J16 63 339

66. I/O - 44 41 58 K16 64 348

67. I/O - 45 42 59 K15 65 351

68. I/O 46 46 43 60 K14 66 354

69. I/O 47 47 44 61 L16 67 360

70. I/O - - - 62 M16 68 363

71. I/O - - - 63 L15 69 366

GND - - - 64 L14 70 -

72. I/O - - - - N16 71 372

73. I/O - - - - M15 72 375

74. I/O 48 48 45 65 P16 73 378

75. I/O 49 49 46 66 M14 74 384

76. I/O - - - 67 N15 75 387

77. I/O - - - 68 P15 76 390

78. I/O 50 50 47 69 N14 77 396

79. I/O 51 51 48 70 R16 78 399

GND 52524971P1479 DONE 53 53 50 72 R15 80 VCC 54545173P1381 PROG 55 55 52 74 R14 82 -

80. I/O (D7) 56 56 53 75 T16 83 408

81. GCK3 (I/O) 57 57 54 76 T15 84 411

82. I/O - - - 77 R13 85 420

83. I/O - - - 78 P12 86 423

84. I/O (D6) 58 58 55 79 T14 87 426

85. I/O - 59 56 80 T13 88 432

GND - - - 81 P11 91 -

86. I/O - - - 82 R11 92 435

87. I/O - - - 83 T11 93 438

88. I/O (D5) 59 60 57 84 T10 94 444

89. I/O (CS0

90. I/O - 62 59 86 R10 96 450

91. I/O - 63 60 87 T9 97 456

92. I/O (D4) 61 64 61 88 R9 98 459

93. I/O 62 65 62 89 P9 99 462

VCC 63666390R8100 GND 64676491P8101 -

94. I/O (D3) 65 68 65 92 T8 102 468

95. I/O (RS

96. I/O - 70 67 94 T6 104 474

97. I/O - - - 95 R7 105 480

98. I/O (D2) 67 71 68 96 P7 106 483

) 60 61 58 85 P10 95 447

) 66 69 66 93 T7 103 471

November 5, 1998 (Version 5.2) 7-137

Page 56

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 PQ100 VQ100 TQ144 PG156 PQ160 Boundary Scan Order

99. I/O 68 72 69 97 T5 107 486

100. I/O - - - 98 R6 108 492

101. I/O - - - 99 T4 109 495

GND - - - 100 P6 110 -

102. I/O (D1) 69 73 70 101 T3 113 498

103. I/O

104. I/O - - - 103 R4 115 507

105. I/O - - - 104 R3 116 510

106. I/O (D0, DIN) 71 75 72 105 P4 117 516

107. I/O (DOUT) 72 76 73 106 T2 118 519

108. I/O (TDO) 75 79 76 109 T1 121 0

109. I/O (A0, WS

110. GCK4 (A1, I/O) 78 82 79 112 P2 124 15

111. I/O - - - 113 N2 125 18

112. I/O - - - 114 M3 126 21

113. I/O (A2, CS1) 79 83 80 115 P1 127 27

114. I/O (A3) 80 84 81 116 N1 128 30

115. I/O - - - 117 M2 129 33

116. I/O - - - - M1 130 39

117. I/O - - - 119 L2 132 42

118. I/O - - - 120 L1 133 45

119. I/O (A4) 81 85 82 121 K3 134 51

120. I/O (A5) 82 86 83 122 K2 135 54

121. I/O - 87 84 123 K1 137 57

122. I/O - 88 85 124 J1 138 63

123. I/O (A6) 83 89 86 125 J2 139 66

124. I/O (A7) 84 90 87 126 J3 140 69

(RCLK-BUSY

CCLK 73 77 74 107 R2 119 VCC 74 78 75 108 P3 120 -

GND 76 80 77 110 N3 122 -

GND - - - 118 L3 131 -

GND 1 91 88 127 H2 141 -

/RDY)

) 77 81 78 111 R1 123 9

70 74 71 102 P5 114 504

Additional No Connect (N.C.) Connections for PQ160 Package

PQ160

83089111136 93190112

Notes: Boundary Scan Bit 0 = TDO.T

Boundary Scan Bit 1 = TDO.O Boundary Scan Bit 1056 = BSCAN.UP D

7-138 November 5, 1998 (Version 5.2)

Page 57

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Locations for XC5206 Devices

Pin Description PC84 PQ100 VQ100 TQ144 PQ160 TQ176 PG191 PQ208 Boundary Scan Order

VCC 2 92 89 128 142 155 J4 183 -

1. I/O (A8) 3 93 90 129 143 156 J3 184 87

2. I/O (A9) 4 94 91 130 144 157 J2 185 90

3. I/O - 95 92 131 145 158 J1 186 93

4. I/O - 96 93 132 146 159 H1 187 99

5. I/O - - - - - 160 H2 188 102

6. I/O - - - - - 161 H3 189 105

7. I/O (A10) 5 97 94 133 147 162 G1 190 111

8. I/O (A11) 6 98 95 134 148 163 G2 191 114

9. I/O - - - 135 149 164 F1 192 117

10. I/O - - - 136 150 165 E1 193 123

GND - - - 137 151 166 G3 194 -

11. I/O - - - - 152 168 C1 197 126

12. I/O - - - - 153 169 E2 198 129

13. I/O (A12) 7 99 96 138 15 4 170 F3 199 138

14. I/O (A13) 8 100 97 139 155 171 D2 200 14 1

15. I/O - - - 140 156 172 B1 201 150

16. I/O - - - 141 157 173 E3 202 153

17. I/O (A14) 9 1 98 142 158 174 C2 203 162

18. I/O (A15) 10 2 99 143 159 175 B2 204 165

VCC 11 3 10 0 144 160 176 D3 205 GND 1241111D42 -

19. GCK1 (A16, I/O) 13 5 2 2 2 2 C3 4 174

20. I/O (A17) 14 6 3 3 3 3 C4 5 177

21. I/O - - - 4 4 4 B3 6 183

22. I/O - - - 5 5 5 C5 7 186

23.I/O (TDI) 1574666A28 189

24.I/O (TCK) 1685777B49 195

25. I/O - - - - 8 8 C6 10 198

26. I/O - - - - 9 9 A3 11 201

GND - - - 8 10 10 C7 14 -

27. I/O - - - 9 11 11 A4 15 207

28. I/O - - - 10 12 12 A5 16 210

29. I/O (TMS) 17 9 6 11 13 13 B7 17 213

30. I/O 18 10 7 12 14 14 A6 18 219

31. I/O - - - - - 15 C8 19 222

32. I/O - - - - - 16 A7 20 225

33. I/O - - - 13 15 17 B8 21 234

34.I/O - 118141618A822 237

35. I/O 19 12 9 15 17 19 B9 23 246

36. I/O 20 13 10 16 18 20 C9 24 249

GND 21 1411171921D925 VCC 22 1512182022D1026 -

37. I/O 23 16 13 19 21 23 C10 27 255

38. I/O 24 17 14 20 22 24 B10 28 258

39.I/O - 1815212325A929 261

40. I/O - - - 22 24 26 A10 30 267

41. I/O - - - - - 27 A11 31 270

November 5, 1998 (Version 5.2) 7-139

Page 58

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 PQ100 VQ100 TQ144 PQ160 TQ176 PG191 PQ208 Boundary Scan Order

42. I/O - - - - - 28 C11 32 273

43. I/O 25 19 16 23 25 29 B11 33 279

44. I/O 26 20 17 24 26 30 A12 34 282

45. I/O - - - 25 27 31 B12 35 285

46. I/O - - - 26 28 32 A13 36 291

GND - - - 27 29 33 C12 37 -

47. I/O - - - - 30 34 A15 40 294

48. I/O - - - - 31 35 C13 41 297

49. I/O 27 21 18 28 32 36 B14 42 303

50. I/O - 22 19 29 33 37 A16 43 306

51. I/O - - - 30 34 38 B15 44 309

52. I/O - - - 31 35 39 C14 45 315

53. I/O 28 23 20 32 36 40 A17 46 318

54. I/O 29 24 21 33 37 41 B16 47 321

55. M1 (I/O) 30 25 22 34 38 42 C15 48 330

GND 31 2623353943D1549 -

56. M0 (I/O) 32 27 24 36 40 44 A18 50 333

VCC 33 2825374145D1655 -

57. M2 (I/O) 34 29 26 38 42 46 C16 56 336

58. GCK2 (I/O) 35 30 27 39 43 47 B17 57 339

59. I/O (HDC) 36 31 28 40 44 48 E16 58 348

60. I/O - - - 41 45 49 C17 59 351

61. I/O - - - 42 46 50 D17 60 354

62. I/O - 32 29 43 47 51 B18 61 360

63. I/O (LDC) 37 33 30 44 48 52 E17 62 363

64. I/O - - - - 49 53 F16 63 372

65. I/O - - - - 50 54 C18 64 375

GND - - - 45 51 55 G16 67 -

66. I/O - - - 46 52 56 E18 68 378

67. I/O - - - 47 53 57 F 18 69 384

68. I/O 38 34 31 48 54 58 G17 70 387

69. I/O 39 35 32 49 55 59 G18 71 390

70. I/O - - - - - 60 H16 72 396

71. I/O - - - - - 61 H17 73 399

72. I/O - 36 33 50 56 62 H18 74 402

73.I/O - 3734515763J1875 408

74. I/O 40 38 35 52 58 64 J17 76 411

75. I/O (ERR

VCC 42 4037546066J1578 GND 43 4138556167K1579 -

76. I/O 44 42 39 56 62 68 K16 80 420

77. I/O 45 43 40 57 63 69 K17 81 423

78. I/O - 44 41 58 64 70 K18 82 426

79.I/O - 4542596571L1883 432

80. I/O - - - - - 72 L17 84 435

81. I/O - - - - - 73 L16 85 438

82. I/O 46 46 43 60 66 74 M18 86 444

83. I/O 47 47 44 61 67 75 M17 87 447

84. I/O - - - 62 68 76 N18 88 450

85. I/O - - - 63 69 77 P18 89 456

GND - - - 64 70 78 M16 90 -

86. I/O - - - - 71 79 T18 93 459

, INIT)41 3936535965J1677 414

7-140 November 5, 1998 (Version 5.2)

Page 59

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PC84 PQ100 VQ100 TQ144 PQ160 TQ176 PG191 PQ208 Boundary Scan Order

87. I/O - - - - 72 80 P17 94 468

88. I/O 48 48 45 65 73 81 N16 95 471

89. I/O 49 49 46 66 74 82 T17 96 480

90. I/O - - - 67 75 83 R17 97 483

91. I/O - - - 68 76 84 P16 98 486

92. I/O 50 50 47 69 77 85 U18 99 492

93. I/O 51 51 48 70 78 86 T16 100 495

GND 52 52 49 71 79 87 R16 101 DONE 53 53 50 72 80 88 U17 103 VCC 54 54 51 73 81 89 R15 106 PROG 55 55 52 74 82 90 V18 108 -

94. I/O (D7) 56 56 53 75 83 91 T15 109 504

95. GCK3 (I/O) 57 57 54 76 84 92 U16 110 507

96. I/O - - - 77 85 93 T 14 111 516

97. I/O - - - 78 86 94 U15 112 519

98. I/O (D6) 58 58 55 79 87 95 V17 113 522

99. I/O - 59 56 80 88 96 V16 114 528

100. I/O - - - - 89 97 T13 115 531

101. I/O - - - - 90 98 U14 116 534

GND - - - 81 91 99 T12 119 -

102. I/O - - - 82 92 100 U13 120 540

103. I/O - - - 83 93 101 V13 121 543

104. I/O (D5) 59 60 57 84 94 102 U12 122 552

105. I/O (CS0

106. I/O - - - - - 104 T11 124 558

107. I/O - - - - - 105 U11 125 564

108. I/O - 62 59 86 96 106 V11 126 567

109. I/O - 63 60 87 97 107 V10 127 570

110. I/O (D4) 61 64 61 88 98 108 U10 128 576

111. I/O 62 65 62 89 99 109 T10 129 579

VCC 63 66 63 90 100 110 R10 130 GND 6 4 67 64 91 101 111 R9 131 -

112. I/O (D3) 65 68 65 92 102 112 T9 132 588

113. I/O (RS

114. I/O - 70 67 94 104 114 V9 134 600

115. I/O - - - 95 105 115 V8 135 603

116. I/O - - - - - 116 U8 136 612

117. I/O - - - - - 117 T8 137 615

118. I/O (D2) 67 71 68 96 106 118 V7 138 618

119. I/O 68 72 69 97 107 119 U7 139 624

120. I/O - - - 98 108 120 V6 140 627

121. I/O - - - 99 109 121 U6 141 630

GND - - - 100 110 122 T7 142 -

122. I/O - - - - 111 123 U5 145 636

123. I/O - - - - 112 124 T6 146 639

124. I/O (D1) 69 73 70 101 113 125 V3 147 642

125. I/O

(RCLK-BUSY Y)

126. I/O - - - 103 115 127 U4 149 651

127. I/O - - - 104 116 128 T5 150 654

128. I/O (D0, DIN) 71 75 72 105 117 129 U 3 151 660

129. I/O (DOUT) 72 76 73 106 118 130 T4 152 663

) 60 61 58 85 95 103 V12 123 555

) 66 69 66 93 103 113 U9 133 591

70 74 71 102 114 126 V2 148 648

/RD

November 5, 1998 (Version 5.2) 7-141

Page 60

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 PQ100 VQ100 TQ144 PQ160 TQ176 PG191 PQ208 Boundary Scan Order

CCLK 73 77 74 107 119 131 V1 153 VCC 74 78 75 108 120 132 R4 154 -

130. I/O (TDO) 7 5 79 76 109 121 133 U2 159 -

GND 7 6 80 77 110 122 134 R3 160 -

131. I/O (A0, WS) 77 81 78 111 123 135 T3 161 9

132. GCK4 (A1, I/O) 78 82 79 112 124 136 U1 162 15

133. I/O - - - 113 125 137 P3 163 18

134. I/O - - - 114 126 138 R2 164 21

135. I/O (A2, CS1) 79 83 80 115 127 139 T2 165 27

136. I/O (A3) 80 84 81 116 12 8 140 N3 166 30

137. I/O - - - 117 129 141 P2 167 33

138. I/O - - - - 130 142 T1 168 42

GND - - - 118 131 143 M3 171 -

139. I/O - - - 119 132 144 P1 172 45

140. I/O - - - 120 133 145 N1 173 51

141. I/O (A4) 81 85 82 121 13 4 146 M2 174 54

142. I/O (A5) 82 86 83 122 13 5 147 M1 175 57

143. I/O - - - - - 148 L3 176 63

144. I/O - - - - 136 149 L2 177 66

145. I/O - 87 84 123 137 150 L1 178 69

146. I/O - 88 85 124 138 151 K1 179 75

147. I/O (A6) 83 89 86 125 13 9 152 K2 180 78

148. I/O (A7) 84 90 87 126 14 0 153 K3 181 81

GND 1 91 88 127 141 154 K4 182 -

Additional No Connect (N.C.) Connections for PQ208 and TQ 176 Packages

PQ208 TQ176

195 1 39 65 104 143 158 167 196 3 51 66 105 144 169 206 12 52 91 107 155 170 207 13 53 92 117 156 208 38 54 102 118 157

Notes: Boundary Scan Bit 0 = TDO.T

Boundary Scan Bit 1 = TDO.O Boundary Scan Bit 1056 = BSCAN.UP D

Pin Locations for XC5210 Devices

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

VCC 2 128 142 155 183 J4 VCC* 212 -

1. I/O (A8) 3 129 143 156 184 J3 E8 213 111

2. I/O (A9) 4 130 144 157 185 J2 B7 214 114

3. I/O - 131 145 158 186 J1 A7 215 117

4. I/O - 132 146 159 187 H1 C7 216 123

5. I/O - - - 160 188 H2 D7 217 126

6. I/O - - - 161 189 H3 E7 218 129

Boundary Scan

Order

7-142 November 5, 1998 (Version 5.2)

Page 61

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

7. I/O (A10) 5 133 147 162 190 G1 A6 220 135

8. I/O (A11) 6 134 148 163 191 G2 B6 221 138

VCC ------VCC*222 -

9. I/O - - - - - H4 C6 223 141

10. I/O - - - - - G4 F7 224 150

11. I/O - 135 149 164 192 F1 A5 225 153

12. I/O - 136 150 165 193 E1 B5 226 162

GND - 137 151 166 194 G3 GND* 227 -

13. I/O - - - - 195 F2 D6 228 165

14. I/O - - - 167 196 D1 C5 229 171

15. I/O - - 152 168 197 C1 A4 230 174

16. I/O - - 153 169 198 E2 E6 231 177

17. I/O (A12) 7 138 154 170 199 F3 B4 232 183

18. I/O (A13) 8 139 155 171 200 D2 D5 233 186

19. I/O - - - - - F4 A3 234 189

20. I/O - - - - - E4 C4 235 195

21. I/O - 140 156 172 201 B1 B3 236 198

22. I/O - 141 157 173 202 E3 F6 237 201

23. I/O (A14) 9 142 158 174 203 C2 A2 238 210

24. I/O (A15) 10 143 159 175 204 B2 C3 239 213

VCC 11 144 160 176 205 D3 VCC* 240 GND 12 1 1 1 2 D4 GND* 1 -

25. GCK1 (A16, I/O) 13 2 2 2 4 C3 D4 2 222

26. I/O (A17) 14 3 3 3 5 C4 B1 3 225

27. I/O - 4 4 4 6 B3 C2 4 231

28. I/O - 5 5 5 7 C5 E5 5 234

29. I/O (TDI) 15 6 6 6 8 A2 D3 6 237

30. I/O (TCK) 16 7 7 7 9 B4 C1 7 243

31. I/O - - 8 8 10 C6 D2 8 246

32. I/O - - 9 9 11 A3 G6 9 249

33. I/O - - - - 12 B5 E4 10 255

34. I/O - - - - 13 B6 D1 11 258

35. I/O - - - - - D5 E3 12 261

36. I/O - - - - - D6 E2 13 267

GND - 8 10 10 14 C7 GND* 14 -

37. I/O - 9 11 11 15 A4 F5 15 270

38. I/O - 10 12 12 16 A5 E1 16 273

39. I/O (TMS) 17 11 13 13 17 B7 F4 17 279

40. I/O 18 12 14 14 18 A6 F3 18 282

VCC ------VCC*19 -

41. I/O - - - - - D7 F2 20 285

42. I/O - - - - - D8 F1 21 291

43. I/O - - - 15 19 C8 G4 23 294

44. I/O - - - 16 20 A7 G3 24 297

45. I/O - 13 15 17 21 B8 G2 25 306

46. I/O - 14 16 18 22 A8 G1 26 309

47. I/O 19 15 17 19 23 B9 G5 27 318

48. I/O 20 16 18 20 24 C9 H3 28 321

GND 21 17 19 21 25 D9 GND* 29 VCC 2218 20 22 26D10VCC*30 -

49. I/O 23 19 21 23 27 C10 H4 31 327

Boundary Scan

Order

November 5, 1998 (Version 5.2) 7-143

Page 62

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

50. I/O 24 20 22 24 28 B10 H5 32 330

51. I/O - 21 23 25 29 A9 J2 33 333

52. I/O - 22 24 26 30 A10 J1 34 339

53. I/O - - - 27 31 A11 J3 35 342

54. I/O - - - 28 32 C11 J4 36 345

55. I/O - - - - - D11 J5 38 351

56. I/O - - - - - D12 K1 39 354

VCC ------VCC*40 -

57. I/O 25 23 25 29 33 B11 K2 41 357

58. I/O 26 24 26 30 34 A12 K3 42 363

59. I/O - 25 27 31 35 B12 J6 43 366

60. I/O - 26 28 32 36 A13 L1 44 369

GND - 27 29 33 37 C12 GND* 45 -

61. I/O - - - - - D13 L2 46 375

62. I/O - - - - - D14 K4 47 378

63. I/O - - - - 38 B13 L3 48 381

64. I/O - - - - 39 A14 M1 49 387

65. I/O - - 30 34 40 A15 K5 50 390

66. I/O - - 31 35 41 C13 M2 51 393

67. I/O 27 28 32 36 42 B14 L4 52 399

68. I/O - 29 33 37 43 A16 N1 53 402

69. I/O - 30 34 38 44 B15 M3 54 405

70. I/O - 31 35 39 45 C14 N2 55 411

71. I/O 28 32 36 40 46 A17 K6 56 414

72. I/O 29 33 37 41 47 B16 P1 57 417

73. M1 (I/O) 30 34 38 42 48 C15 N3 58 426

GND 3135 39 43 49D15GND*59 -

74. M0 (I/O) 32 36 40 44 50 A18 P2 60 429

VCC 3337 41 45 55D16VCC*61 -

75. M2 (I/O) 34 38 42 46 56 C16 M4 62 432

76. GCK2 (I/O) 35 39 43 47 57 B17 R2 63 435

77. I/O (HDC) 36 40 44 48 58 E16 P3 64 444

78. I/O - 41 45 49 59 C17 L5 65 447

79. I/O - 42 46 50 60 D17 N4 66 450

80. I/O - 43 47 51 61 B18 R3 67 456

81. I/O (LDC) 37 44 48 52 62 E17 P4 68 459

82. I/O - - 49 53 63 F16 K7 69 462

83. I/O - - 50 54 64 C18 M5 70 468

84. I/O - - - - 65 D18 R4 71 471

85. I/O - - - - 66 F17 N5 72 474

86. I/O - - - - - E15 P5 73 480

87. I/O - - - - - F15 L6 74 483

GND - 45 51 55 67 G16 GND* 75 -

88. I/O - 46 52 56 68 E18 R5 76 486

89. I/O - 47 53 57 69 F18 M6 77 492

90. I/O 38 48 54 58 70 G17 N6 78 495

91. I/O 39 49 55 59 71 G18 P6 79 504

VCC ------VCC*80 -

92. I/O - - - 60 72 H16 R6 81 507

93. I/O - - - 61 73 H17 M7 82 510

94. I/O - - - - - G15 N7 84 516

Boundary Scan

Order

7-144 November 5, 1998 (Version 5.2)

Page 63

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

95. I/O - - - - - H15 P7 85 519

96. I/O - 50 56 62 74 H18 R7 86 522

97. I/O - 51 57 63 75 J18 L7 87 528

98. I/O 40 52 58 64 76 J17 N8 88 531

99. I/O (ERR

VCC 42 54 60 66 78 J15 VCC* 90 GND 43 55 61 67 79 K15 GND* 91 -

100. I/O 44 56 62 68 80 K16 L8 92 540

101. I/O 45 57 63 69 81 K17 P9 93 543

102. I/O - 58 64 70 82 K18 R9 94 546

103. I/O - 59 65 71 83 L18 N9 95 552

104. I/O - - - 72 84 L17 M9 96 555

105. I/O - - - 73 85 L16 L9 97 558

106. I/O - - - - - L15 R10 99 564

107. I/O - - - - - M15 P10 100 567

VCC ------VCC*101 -

108. I/O 46 60 66 74 86 M18 N10 102 570

109. I/O 47 61 67 75 87 M17 K9 103 576

110. I/O - 62 68 76 88 N18 R11 104 579

111. I/O - 63 69 77 89 P18 P11 105 588

GND - 64 70 78 90 M16 GND* 106 -

112. I/O - - - - - N15 M10 107 591

113. I/O - - - - - P15 N11 108 600

114. I/O - - - - 91 N17 R12 109 603

115. I/O - - - - 92 R18 L10 110 606

116. I/O - - 71 79 93 T18 P12 111 612

117. I/O - - 72 80 94 P17 M11 112 615

118. I/O 48 65 73 81 95 N16 R13 113 618

119. I/O 49 66 74 82 96 T17 N12 114 624

120. I/O - 67 75 83 97 R17 P13 115 627

121. I/O - 68 76 84 98 P16 K10 116 630

122. I/O 50 69 77 85 99 U18 R14 117 636

123. I/O 51 70 78 86 100 T16 N13 118 639

GND 52 71 79 87 101 R16 GND* 119 DONE 53 72 80 88 103 U17 P14 120 VCC 54 73 81 89 106 R15 VCC* 121 PROG 55 74 82 90 108 V18 M12 122 -

124. I/O (D7) 56 75 83 91 109 T15 P15 123 648

125. GCK3 (I/O) 57 76 84 92 110 U16 N14 124 651

126. I/O - 77 85 93 111 T14 L11 125 660

127. I/O - 78 86 94 112 U15 M13 126 663

128. I/O - - - - - R14 N15 127 666

129. I/O - - - - - R13 M14 128 672

130. I/O (D6) 58 79 87 95 113 V17 J10 129 675

131. I/O - 80 88 96 114 V16 L12 130 678

132. I/O - - 89 97 115 T13 M15 131 684

133. I/O - - 90 98 116 U14 L13 132 687

134. I/O - - - - 117 V15 L14 133 690

135. I/O - - - - 118 V14 K11 134 696

GND - 81 91 99 119 T12 GND* 135 -

136. I/O - - - - - R12 L15 136 699

, INIT) 41 53 59 65 77 J16 P8 89 534

Boundary Scan

Order

November 5, 1998 (Version 5.2) 7-145

Page 64

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

137. I/O - - - - - R11 K12 137 708

138. I/O - 82 92 100 120 U13 K13 138 711

139. I/O - 83 93 101 121 V13 K14 139 714

VCC ------VCC*140 -

140. I/O (D5) 59 84 94 102 122 U12 K15 141 720

141. I/O (CS0

142. I/O - - - 104 124 T11 J13 144 726

143. I/O - - - 105 125 U11 J14 145 732

144. I/O - 86 96 106 126 V11 J15 146 735

145. I/O - 87 97 107 127 V10 J11 147 738

146. I/O (D4) 61 88 98 108 128 U10 H13 148 744

147. I/O 62 89 99 109 129 T10 H14 149 747

VCC 63 90 100 110 130 R10 VCC* 150 GND 64 91 101 111 131 R9 GND* 151 -

148. I/O (D3) 65 92 102 112 132 T9 H12 152 756

149. I/O (RS

150. I/O - 94 104 114 134 V9 G14 154 768

151. I/O - 95 105 115 135 V8 G15 155 771

152. I/O - - - 116 136 U8 G13 156 780

153. I/O - - - 117 137 T8 G12 157 783

154. I/O (D2) 67 96 106 118 138 V7 G11 159 786

155. I/O 68 97 107 119 139 U7 F15 160 792

VCC ------VCC*161 -

156. I/O - 98 108 120 140 V6 F14 162 795

157. I/O - 99 109 121 141 U6 F13 163 798

158. I/O - - - - - R8 G10 164 804

159. I/O - - - - - R7 E15 165 807

GND - 100 110 122 142 T7 GND* 166 -

160. I/O - - - - - R6 E14 167 810

161. I/O - - - - - R5 F12 168 816

162. I/O - - - - 143 V5 E13 169 819

163. I/O - - - - 144 V4 D15 170 822

164. I/O - - 111 123 145 U5 F11 171 828

165. I/O - - 112 124 146 T6 D14 172 831

166. I/O (D1) 69 101 113 125 147 V3 E12 173 834

167. I/O (RCLK-BUSY

168. I/O - 103 115 127 149 U4 D13 175 843

169. I/O - 104 116 128 150 T5 C14 176 846

170. I/O (D0, DIN) 71 105 117 129 151 U3 F10 177 855

171. I/O (DOUT) 72 106 118 130 152 T4 B15 178 858

CCLK 73 107 119 131 153 V1 C13 179 VCC 74 108 120 132 154 R4 VCC* 180 -

172. I/O (TDO) 75 109 121 133 159 U2 A15 181 -

GND 76 110 122 134 160 R3 GND* 182 -

173. I/O (A0, WS

174. GCK4 (A1, I/O) 78 112 124 136 162 U1 B13 184 15

175. I/O - 113 125 137 163 P3 E11 185 18

176. I/O - 114 126 138 164 R2 C12 186 21

177. I/O (CS1, A2) 79 115 127 139 165 T2 A13 187 27

178. I/O (A3) 80 116 128 140 166 N3 B12 188 30

179. I/O - - - - - P4 F9 189 33

) 60 85 95 103 123 V12 J12 142 723

) 66 93 103 113 133 U9 H11 153 759

/RDY) 70 102 114 126 148 V2 C15 174 840

) 77 111 123 135 161 T3 A14 183 9

Boundary Scan

Order

7-146 November 5, 1998 (Version 5.2)

Page 65

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PC84 TQ144 PQ160 TQ176 PQ208 PG223 BG225 PQ240

180. I/O - - - - - N4 D11 190 39

181. I/O - 117 129 141 167 P2 A12 191 42

182. I/O - - 130 142 168 T1 C11 192 45

183. I/O - - - - 169 R1 B11 193 51

184. I/O - - - - 170 N2 E10 194 54

- ------GND* GND - 118 131 143 171 M3 - 196 -

185. I/O - 119 132 144 172 P1 A11 197 57

186. I/O - 120 133 145 173 N1 D10 198 66

187. I/O - - - - - M4 C10 199 69

188. I/O - - - - - L4 B10 200 75

VCC ------VCC*201 -

189. I/O (A4) 81 121 134 146 174 M2 A10 202 78

190. I/O (A5) 82 122 135 147 175 M1 D9 203 81

191. I/O - - - 148 176 L3 C9 205 87

192. I/O - - 136 149 177 L2 B9 206 90

193. I/O - 123 137 150 178 L1 A9 207 93

194. I/O - 124 138 151 179 K1 E9 208 99

195. I/O (A6) 83 125 139 152 180 K2 C8 209 102

196. I/O (A7) 84 126 140 153 181 K3 B8 210 105

GND 1 127 141 154 182 K4 GND* 211 -

Boundary Scan

Order

Additional No Connect (N.C.) Connections for PQ208 and PQ24 0 Packag es

PQ208 PQ240

1 53 105 157 208 22 143 219 354107158

37 158 51 102 155 206 83 195 52 104 156 207 98 204

Notes: * Pins labeled VCC* are internally bonded to a VCC plane within the BG225 package. The external pins are: B2, D8, H15, R8,

B14, R1, H1, and R15. Pins labeled GND* are internally bonded to a ground plane within the BG225 package. The external pins are: A1, D12, G7,

G9, H6, H8, H10, J8, K8, A8 , F8, G8, H2 , H7 , H9, J7, J9, M8. Boundary Scan Bit 0 = TDO.T Boundary Scan Bit 1 = TDO.O Boundary Scan Bit 1056 = BSCAN.UP D

Pin Locations for XC5215 Devices

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

VCC 142 183 212 K1 VCC* VCC* -

1. I/O (A8) 143 184 213 K2 E8 D14 138

2. I/O (A9) 144 185 214 K3 B7 C14 141

3. I/O 145 186 215 K5 A7 A15 147

4. I/O 146 187 216 K4 C7 B15 150

5. I/O - 188 217 J1 D7 C15 153

6. I/O - 189 218 J2 E7 D15 159

7. I/O (A10) 147 190 220 H1 A6 A16 162

November 5, 1998 (Version 5.2) 7-147

Page 66

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

8. I/O (A11) 148 191 221 J3 B6 B16 165

9. I/O - - - H2 - C17 171

10. I/O - - - G1 - B18 174 VCC - - 222 E1 VCC* VCC* -

11. I/O - - 223 H3 C6 C18 177

12. I/O - - 224 G2 F7 D17 183

13. I/O 149 192 225 H4 A5 A20 186

14. I/O 150 193 226 F2 B5 B19 189 GND 151 194 227 F1 GND* GND* -

15. I/O - - - H5 - C19 195

16. I/O - - - G3 - D18 198

17. I/O - 195 228 D1 D6 A21 201

18. I/O - 196 229 G4 C5 B20 207

19. I/O 152 197 230 E2 A4 C20 210

20. I/O 153 198 231 F3 E6 B21 213

21. I/O (A12) 154 199 232 G5 B4 B22 219

22. I/O (A13) 155 200 233 C1 D5 C21 222

23. I/O - - - F4 - D20 225

24. I/O - - - E3 - A23 234

25. I/O - - 234 D2 A3 D21 237

26. I/O - - 235 C2 C4 C22 243

27. I/O 156 201 236 F5 B3 B24 246

28. I/O 157 202 237 E4 F6 C23 249

29. I/O (A14) 158 203 238 D3 A2 D22 258

30. I/O (A15) 159 204 239 C3 C3 C24 261 VCC 160 205 240 A2 VCC* VCC* GND 1 2 1 B1 GND* GND* -

31. GCK1 (A16, I/O) 2 4 2 D4 D4 D23 270

32. I/O (A17) 3 5 3 B2 B1 C25 273

33. I/O 4 6 4 B3 C2 D24 279

34. I/O 5 7 5 E6 E5 E23 282

35. I/O (TDI) 6 8 6 D5 D3 C26 285

36. I/O (TCK) 7 9 7 C4 C1 E24 294

37. I/O - - - A3 - F24 297

38. I/O - - - D6 - E25 303

39. I/O 8 10 8 E7 D2 D26 306

40. I/O 9 11 9 B4 G6 G24 309

41. I/O - 12 10 C5 E4 F25 315

42. I/O - 13 11 A4 D1 F26 318

43. I/O - - 12 D7 E3 H23 321

44. I/O - - 13 C6 E2 H24 327

45. I/O - - - E8 - G25 330

46. I/O - - - B5 - G26 333 GND 10 14 14 A5 GND* GND* -

47. I/O 11 15 15 B6 F5 J23 339

48. I/O 12 16 16 D8 E1 J24 342

49. I/O (TMS) 13 17 17 C7 F4 H25 345

50. I/O 14 18 18 B7 F3 K23 351 VCC - - 19 A6 VCC* VCC* -

51. I/O - - 20 C8 F2 L24 354

52. I/O - - 21 E9 F1 K25 357

53. I/O - - - B8 - L25 363

7-148 November 5, 1998 (Version 5.2)

Page 67

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

54. I/O - - - A8 - L26 366

55. I/O - 19 23 C9 G4 M23 369

56. I/O - 20 24 B9 G3 M24 375

57. I/O 15 21 25 E10 G2 M25 378

58. I/O 16 22 26 A9 G1 M26 381

59. I/O 17 23 27 D10 G5 N24 390

60. I/O 18 24 28 C10 H3 N25 393 GND 19 25 29 A10 GND* GND* VCC 20 26 30 A11 VCC* VCC* -

61. I/O 21 27 31 B10 H4 N26 399

62. I/O 22 28 32 B11 H5 P25 402

63. I/O 23 29 33 C11 J2 P23 405

64. I/O 24 30 34 E11 J1 P24 411

65. I/O - 31 35 D11 J3 R26 414

66. I/O - 32 36 A12 J4 R25 417

67. I/O - - - B12 - R24 423

68. I/O - - - A13 - R23 426

69. I/O - - 38 E12 J5 T26 429

70. I/O - - 39 B13 K1 T25 435 VCC - - 40 A16 VCC* VCC* -

71. I/O 25 33 41 A14 K2 U24 438

72. I/O 26 34 42 C13 K3 V25 441

73. I/O 27 35 43 B14 J6 V24 447

74. I/O 28 36 44 D13 L1 U23 450 GND 29 37 45 A15 GND* GND* -

75. I/O - - - B15 - Y26 453

76. I/O - - - E13 - W25 459

77. I/O - - 46 C14 L2 W24 462

78. I/O - - 47 A17 K4 V23 465

79. I/O - 38 48 D14 L3 AA26 471

80. I/O - 39 49 B16 M1 Y25 474

81. I/O 30 40 50 C15 K5 Y24 477

82. I/O 31 41 51 E14 M2 AA25 483

83. I/O - - - A18 - AB25 486

84. I/O - - - D15 - AA24 489

85. I/O 32 42 52 C16 L4 Y23 495

86. I/O 33 43 53 B17 N1 AC26 498

87. I/O 34 44 54 B18 M3 AA23 501

88. I/O 35 45 55 E15 N2 AB24 507

89. I/O 36 46 56 D16 K6 AD25 510

90. I/O 37 47 57 C17 P1 AC24 513

91. M1 (I/O) 38 48 58 A20 N3 AB23 522 GND 39 49 59 A19 GND* GND* -

92. M0 (I/O) 40 50 60 C18 P2 AD24 525 VCC 41 55 61 B20 VCC* VCC* -

93. M2 (I/O) 42 56 62 D17 M4 AC23 528

94. GCK2 (I/O) 43 57 63 B 19 R2 AE24 531

95. I/O (HDC) 44 58 64 C19 P3 AD23 540

96. I/O 45 59 65 F16 L5 AC22 543

97. I/O 46 60 66 E17 N4 AF24 546

98. I/O 47 61 67 D18 R3 AD22 552

99. I/O (LDC) 48 62 68 C20 P4 AE23 555

November 5, 1998 (Version 5.2) 7-149

Page 68

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

100. I/O - - - F17 - AE22 558

101. I/O - - - G16 - AF23 564

102. I/O 49 63 69 D19 K7 AD20 567

103. I/O 50 64 70 E18 M5 AE21 570

104. I/O - 65 71 D20 R4 AF21 576

105. I/O - 66 72 G17 N5 AC19 579

106. I/O - - 73 F18 P5 AD19 582

107. I/O - - 74 H16 L6 AE20 588

108. I/O - - - E19 - AF20 591

109. I/O - - - F19 - AC18 594 GND 51 67 75 E20 GND* GND* -

110. I/O 52 68 76 H17 R5 AD18 600

111. I/O 53 69 77 G18 M6 AE19 603

112. I/O 54 70 78 G19 N6 AC17 606

113. I/O 55 71 79 H18 P6 AD17 612 VCC - - 80 F20 VCC* VCC* -

114. I/O - 72 81 J16 R6 AE17 615

115. I/O - 73 82 G20 M7 AE16 618

116. I/O - - - H20 - AF16 624

117. I/O - - - J18 - AC15 627

118. I/O - - 84 J19 N7 AD15 630

119. I/O - - 85 K16 P7 AE15 636

120. I/O 56 74 86 J20 R7 AF15 639

121. I/O 57 75 87 K17 L7 AD14 642

122. I/O 58 76 88 K18 N8 AE14 648

123. I/O (ERR VCC 60 78 90 L20 VCC* VCC* GND 61 79 91 K20 GND* GND* -

124. I/O 62 80 92 L19 L8 AE13 660

125. I/O 63 81 93 L18 P9 AC13 663

126. I/O 64 82 94 L16 R9 AD13 672

127. I/O 65 83 95 L17 N9 AF12 675

128. I/O - 84 96 M20 M9 AE12 678

129. I/O - 85 97 M19 L9 AD12 684

130. I/O - - - N20 - AC12 687

131. I/O - - - M18 - AF11 690

132. I/O - - 99 N19 R10 AE11 696

133. I/O - - 100 P20 P10 AD11 699 VCC - - 101 T20 VCC* VCC* -

134. I/O 66 86 102 N18 N10 AE9 702

135. I/O 67 87 103 P19 K9 AD9 708

136. I/O 68 88 104 N17 R11 AC10 711

137. I/O 69 89 105 R19 P11 AF7 714 GND 70 90 106 R20 GND* GND* -

138. I/O - - - N16 - AE8 720

139. I/O - - - P18 - AD8 723

140. I/O - - 107 U20 M10 AC9 726

141. I/O - - 108 P17 N11 AF6 732

142. I/O - 91 109 T19 R12 AE7 735

143. I/O - 92 110 R18 L10 AD7 738

144. I/O 71 93 111 P16 P12 AE6 744

145. I/O 72 94 112 V20 M11 AE5 747

, INIT) 59 77 89 K19 P8 AF14 651

7-150 November 5, 1998 (Version 5.2)

Page 69

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

146. I/O - - - R17 - AD6 750

147. I/O - - - T18 - AC7 756

148. I/O 73 95 113 U19 R13 AF4 759

149. I/O 74 96 114 V19 N12 AF3 768

150. I/O 75 97 115 R16 P13 AD5 771

151. I/O 76 98 116 T17 K10 AE3 774

152. I/O 77 99 117 U18 R14 AD4 780

153. I/O 78 100 118 X20 N13 AC5 783 GND 79 101 119 W20 GND* GND* DONE 80 103 120 V18 P14 AD3 VCC 81 106 121 X19 VCC* VCC* PROG 82 108 122 U17 M12 AC4 -

154. I/O (D7) 83 109 123 W19 P15 AD2 792

155. GCK3 (I/O) 84 110 124 W18 N14 AC3 795

156. I/O 85 111 125 T15 L11 AB4 804

157. I/O 86 112 126 U16 M13 AD1 807

158. I/O - - 127 V17 N15 AA4 810

159. I/O - - 128 X18 M14 AA3 816

160. I/O - - - U15 - AB2 819

161. I/O - - - T14 - AC1 828

162. I/O (D6) 87 113 129 W17 J10 Y3 831

163. I/O 88 114 130 V16 L12 AA2 834

164. I/O 89 115 131 X17 M15 AA1 840

165. I/O 90 116 132 U14 L13 W4 843

166. I/O - 117 133 V15 L14 W3 846

167. I/O - 118 134 T13 K11 Y2 852

168. I/O - - - W16 - Y1 855

169. I/O - - - W15 - V4 858 GND 91 119 135 X16 GND* GND* -

170. I/O - - 136 U13 L15 V3 864

171. I/O - - 137 V14 K12 W2 867

172. I/O 92 120 138 W14 K13 U4 870

173. I/O 93 121 139 V13 K14 U3 876 VCC - - 140 X15 VCC* VCC* -

174. I/O (D5) 94 122 141 T12 K15 V2 879

175. I/O (CS0

176. I/O - - - X13 - T1 888

177. I/O - - - V12 - R4 891

178. I/O - 124 144 W12 J13 R3 894

179. I/O - 125 145 T11 J14 R2 900

180. I/O 96 126 146 X12 J15 R1 903

181. I/O 97 127 147 U11 J11 P3 906

182. I/O (D4) 98 128 148 V11 H13 P2 912

183. I/O 99 129 149 W11 H14 P1 915 VCC 100 130 150 X10 VCC* VCC* GND 101 131 151 X11 GND* GND* -

184. I/O (D3) 102 132 152 W10 H12 N2 924

185. I/O (RS

186. I/O 104 134 154 T10 G14 N3 936

187. I/O 105 135 155 U10 G15 M1 939

188. I/O - 136 156 X9 G13 M2 942

189. I/O - 137 157 W9 G12 M3 948

) 95 123 142 X14 J12 V1 882

) 103 133 153 V10 H11 N4 927

November 5, 1998 (Version 5.2) 7-151

Page 70

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

190. I/O - - - X8 - M4 951

191. I/O - - - V9 - L1 954

192. I/O (D2) 106 138 159 W8 G11 J1 960

193. I/O 107 139 160 X7 F15 K3 963 VCC - - 161 X5 VCC* VCC*

194. I/O 108 140 162 V8 F14 J2 966

195. I/O 109 141 163 W7 F13 J3 972

196. I/O - - 164 U8 G10 K4 975

197. I/O - - 165 W6 E15 G1 978 GND 110 142 166 X6 GND* GND*

198. I/O - - - T8 - H2 984

199. I/O - - - V7 - H3 987

200. I/O - - 167 X4 E14 J4 990

201. I/O - - 168 U7 F12 F1 996

202. I/O - 143 169 W5 E13 G2 999

203. I/O - 144 170 V6 D15 G3 1002

204. I/O 111 145 171 T7 F11 F2 1008

205. I/O 112 146 172 X3 D14 E2 1011

206. I/O (D1) 113 147 173 U6 E12 F3 1014

207. I/O (RCLK-BUSY

208. I/O - - - W4 - D2 1023

209. I/O - - - W3 - F4 1032

210. I/O 115 149 175 T6 D13 E3 1035

211. I/O 116 150 176 U5 C14 C2 1038

212. I/O (D0, DIN) 117 151 177 V4 F10 D3 1044

213. I/O (DOUT) 118 152 178 X1 B15 E4 1047 CCLK 119 153 179 V3 C13 C3 VCC 120 154 180 W1 VCC* VCC* -

214. I/O (TDO) 121 159 181 U4 A15 D4 0 GND 122 160 182 X2 GND* GND* -

215. I/O (A0, WS

216. GCK4 (A1, I/O) 124 162 184 V2 B13 C4 15

217. I/O 125 163 185 R5 E11 D5 18

218. I/O 126 164 186 T4 C12 A3 21

219. I/O (A2, CS1) 127 165 187 U3 A13 D6 27

220. I/O (A3) 128 166 188 V1 B12 C6 30

221. I/O - - - R4 - B5 33

222. I/O - - - P5 - A4 39

223. I/O - - 189 U2 F9 C7 42

224. I/O - - 190 T3 D11 B6 45

225. I/O 129 167 191 U1 A12 A6 51

226. I/O 130 168 192 P4 C11 D8 54

227. I/O - 169 193 R3 B11 B7 57

228. I/O - 170 194 N5 E10 A7 63

229. I/O - - 195 T2 - D9 66

230. I/O - - - R2 - C9 69 GND 131 171 196 T1 GND* GND* -

231. I/O 132 172 197 N4 A11 B8 75

232. I/O 133 173 198 P3 D10 D10 78

233. I/O - - 199 P2 C10 C10 81

234. I/O - - 200 N3 B10 B9 87 VCC - - 201 R1 VCC* VCC* -

/RDY) 114 148 174 V5 C15 G4 1020

) 123 161 183 W2 A14 B3 9

7-152 November 5, 1998 (Version 5.2)

Page 71

Product Obsolete or Under Obsolescence

XC5200 Series Field Programmable Gate Arrays

Pin Description PQ160 HQ208 HQ240 PG299 BG225 BG352 Boundary Scan Ord er

235. I/O - - - M5 - B11 90

236. I/O - - - P1 - A11 93

237. I/O (A4) 134 174 202 N1 A10 D12 99

238. I/O (A5) 135 175 203 M3 D9 C12 102

239. I/O - 176 205 M2 C9 B12 105

240. I/O 136 177 206 L5 B9 A12 111

241. I/O 137 178 207 M1 A9 C13 114

242. I/O 138 179 208 L4 E9 B13 117

243. I/O (A6) 139 180 209 L3 C8 A13 126

244. I/O (A7) 140 181 210 L2 B8 B14 129 GND 141 182 211 L1 GND* GND* -

Additional No Connect (N.C.) Connections for HQ208 and HQ 240 Packages

HQ208 HQ240

206 102 219 207 104 22 208 105 37

1 107 83

3 155 98 51 156 143 52 157 158 53 158 204 54 - -

Notes: * Pins labeled VCC* are internally bonded to a VCC plane within the BG225 and BG352 packages. The external pins for the

BG225 are: B2, D8, H15, R8, B14, R1, H1, and R15. The external pins for the BG352 are: A10, A17, B2, B25, D13, D19, D7, G23, H4, K1, K26, N23, P4, U1, U26, W23, Y4, AC1 4, AC20, AC8, AE2, AE25, AF10, and AF17. Pins labeled GND* are internally bonded to a ground plane within the BG225 and BG352 packages. The external pins for the BG225 are: A1, D12, G7, G9, H6, H8, H10, J8, K8, A8, F8, G8, H2, H7, H9, J7, J9, M8. The external pins for the BG352 are: A1, A2, A5, A8, A14, A19, A22, A25, A26, B1, B26, E1, E26, H1, H26, N1, P26, W1, W26, AB1, AB26, AE1, AE26, AF1, AF13, AF19, AF2, AF22, AF25, AF26, AF5, AF8.

Boundary Scan Bit 0 = TDO.T Boundary Scan Bit 1 = TDO.O Boundary Scan Bit 1056 = BSCAN.UP D

November 5, 1998 (Version 5.2) 7-153

Page 72

XC5200 Series Field Programmable Gate Arrays

Product Obsolete or Under Obsolescence

Product Availability

PINS 64 84 100 100 144 156 160 176 191 208 208 223 225 240 240 299 352

XC5202

XC5204

XC5206

XC5210

XC5215

7/8/98

TYPE

CODE

Plast.

PLCC

VQFP

VQ64*

-6

CI CI CI CI CI CI

-5 CI CI CI CI CI CI

-4CCCCCC

-3CCCCCC

-6 CI CI CI CI CI CI

-5 CI CI CI CI CI CI

-4 CCCCCC

-3 CCCCCC

-6 CI CI CI CI CI CI CI CI

-5 CI CI CI CI CI CI CI CI

-4 CCCC CCC C

-3 CCCC CCC C

-6 CI CI CI CI CI CI CI CI

-5 CI CI CI CI CI CI CI CI

-4 C C CC CCC C

-3 C C CC CCC C

-6 CI CI CI CI CI CI

-5 CCCCCC

-4 CCCCCC

-3 CCCCCC

PQFP

PC84

PQ100

Plast.

VQFP

VQ100

TQFP

TQ144

PGA

Plast.

TQFP

Ceram.

PQFP

PG156

PQ160

Ceram.

TQ176

QFP

PGA

High-Perf.

PG191

HQ208

C = Commercial TJ = 0° to +85°C I= Industri al T

= -40°C to +100°C

* VQ64 package supports Master Serial, Slave Serial, and Express conf i guration modes only.

Plast.

PGA

PQFP

PQ208

Plast.

Ceram.

PG223

QFP

BGA

BG225

Plast.

High-Perf.

HQ240

PGA

BGA

PQFP

PQ240

Plast.

Ceram.

PG299

BG352

User I/O Per Package

Device XC5202 XC5204 XC5206 XC5210 XC5215

7/8/98

Max

I/O

VQ64 PC84 PQ100 VQ100 TQ144 PG156 PQ160 TQ176 PG191 HQ208 PQ208 PG223 BG225 HQ240 PQ240 PG299 BG352

52 65 81 81 84 84

124 148 196 244

65 81 81 117 124 124 65 81 81 117 133 148 148 148 65 117 133 149 164 196 196 196

Ordering Information

Example:

Device Type

Speed Grade

Package Type

133 164 196 197 244 244

XC5210-6PQ208C

Temperature Range Number of Pins Package Type

7-154 November 5, 1998 (Version 5.2)

Page 73

Revisions

Product Obsolete or Under Obsolescence

Version Description

12/97 Rev 5.0 added -3, -4 specification

7/98 Rev 5.1 added Spartan family to comparison, removed HQ304

11/98Rev 5.2 All specifications made final.

XC5200 Series Field Programmable Gate Arrays

November 5, 1998 (Version 5.2) 7-155

Datasheet XC5204PQ160 Specification

Specifications and Main Features

Frequently Asked Questions

User Manual

Features

Description

Configurable Logic Block (CLB) Resources

Input/Output Block (IOB) Resources

Routing Resources

Configuration and Readback

Architectural Overview

VersaRing I/O Interface

General Routing Matrix

Performance Overview

Takin g Advantage of Reconfiguration

Detailed Functional Description

Configurable Logic Blocks (CLBs)

5-Input Functions

Carry Function

Cascade Function

CLB Flip-Flops and Latches

Data Inputs and Outputs

Clock Input

Clock Enable

Clear

Global Reset

Using FPGA Flip-Flops and Latches

Three-State Buffers

Input/Output Blocks

IOB Input Signals

Optional Delay Guarantees Zero Hold Time

IOB Output Signals

Global Three-State

Other IOB Options

Output Slew Rate

Pull-up and Pull-down Resistors

JTAG Support

Oscillator

VersaBlock Routing

Local Interconnect Matrix

Direct Connects

General Routing Matrix

Single- and Double-Length Lines

Longlines

Global Lines

VersaRing Input/Output Interface

Boundary Scan

Data Registers

Instruction Set

Bit Sequence

Including Boundary Scan

Avoiding Inadvertent Boundary Sca n

Power Distribution

Pin Descriptions

Configuration

Special Purpose Pins

Configuratio n Modes

Master Modes

Peripheral Modes

Slave Serial Mode

Serial Daisy Chain

Multi-Family Daisy Chain

XC3000 Master with an XC5200-Series Slave

Express Mode

Pseudo Daisy Chain

Setting CCLK Frequency

Data Stream Format

Cyclic Redundancy Check (CRC) for Configuration and Readback

Configuration Sequence

Power-On Time-Out

Initialization

Configuration

Delaying Configuration After Power-Up

Start-Up

Start-up Timing

Start-up Sequence

Start-up from CCLK

Start-up from a User Clock (STARTUP.CLK)

DONE Goes High to Signal End of Configuration

Release of User I/O After DONE Goes High