Datasheet X5083S8IZ Specification

Page 1
DATASHEET
SCK SI
V
SS
WP
V
CC
CS/WDI
SO
1 2
3 4
8 7
6 5
X5083
RESET
N
O
L
O
N
G
E
R
A
V
A
I
L
A
B
L
E
O
R
S
U
P
P
O
R
T
E
D
X5083
CS
/WDI
WP
SO
1
2 3
4
RESET
8
7 6
5
V
CC
V
SS
SCK SI
X5083
CPU Supervisor with 8Kbit SPI EEPROM
Applying power to the device activates the power-on reset circuit which holds RESET allows the power supply and oscillator to stabilize before the processor can execute code.
The Watchdog Timer provides an independent protection mechanism for microcontrollers. When the microcontroller fails to restart a timer within a selectable time out interval, the device activates the RESET from three preset values. Once selected, the interval does not change, even after cycling the power.
The device’s low V
CC
system from low voltage conditions, resetting the system when V asserted until V
falls below the minimum VCC trip point. RESET is
CC
returns to the proper operating level and
CC
stabilizes. Five industry standard V available, however, Intersil’s unique circuits allow the threshold to be reprogrammed to meet custom requirements or to fine­tune the threshold for applications requiring higher precision.
Pinouts
active for a period of time. This
signal. The user selects the interval
detection circuitry protects the user’s
thresholds are
TRIP
8 LD TSSOP
November 12, 2015
Features
•Low VCC detection and reset assertion
- Four standard reset threshold voltages
4.63V, 4.38V, 2.93V, 2.63V
- Re-program low V special programming sequence
- Reset signal valid to V
• Selectable time out watchdog timer
• Long battery life with low power consumption
- <50µA max standby current, watchdog on
- <1µA max standby current, watchdog off
- <400µA max active current during read
• 8Kbits of EEPROM
• Save critical data with Block Lock
- Block lock first or last page, any 1/4 or lower 1/2 of EEPROM array
• Built-in inadvertent write protection
- Write enable latch
- Write protect pin
• SPI Interface - 3.3MHz clock rate
• Minimize programming time
- 16 byte page write mode
- 5ms write cycle time (typical)
• SPI modes (0,0 & 1,1)
reset threshold voltage using
CC
= 1V
CC
memory
FN8127
Rev 4.00
• Available packages
- 8 Ld TSSOP, 8 Ld SOIC, 8 Ld PDIP
• Pb-free plus anneal available (RoHS compliant)
Applications
8 LD SOIC, 8 LD PDIP
FN8127 Rev 4.00 Page 1 of 21 November 12, 2015
• Communications Equipment
- Routers, Hubs, Switches
- Set Top Boxes
• Industrial Systems
- Process Control
- Intelligent Instrumentation
• Computer Systems
- Desktop Computers
- Network Servers
• Battery Powered Equipment
Page 2
X5083
uC
RESET
CS
SCK
SI
SO
WP
VCC
VSS
RESET
SPI
VCC
VSS
X5083
2.7-5.0V
10K
WATCHDOG
TIMER
COMMAND
DECODE &
CONTROL
LOGIC
SI
SO
SCK
CS
/WDI
V
CC
POR AND LOW
GENERATION
V
TRIP
+
-
RESET (X5083)
VOLTAGE RESET
PROTECT LOGIC
8KBITS
EEPROM
WATCHDOG
DETECTOR
WP
ARRAY
STATUS
REGISTER
TRANSITION
RESET
RESET & WATCHDOG
TIMEBASE
X5083
STANDARD V
TRIP
LEVEL SUFFIX
4.63V (+/-2.5%) -4.5A
4.38V (+/-2.5%) -4.5
2.93V (+/-2.5%) -2.7A
2.63V (+/-2.5%) -2.7
See “Ordering Information” on page 3 for more details
For Custom Settings, call Intersil.
Typical Application
Block Diagram
FN8127 Rev 4.00 Page 2 of 21 November 12, 2015
Page 3
X5083
Ordering Information
PART NUMBER RESET (ACTIVE LOW)
(Note 1)
X5083PIZ-4.5A (No longer available or supported)
X5083S8Z-4.5A X5083 ZAL 0 to 70 8 Ld SOIC M8.15E
X5083S8IZ-4.5A (Note 2) X5083 ZAM -40 to 85 8 Ld SOIC M8.15E
X5083S8Z X5083 Z
X5083S8IZ (Note 2) X5083 ZI -40 to 85 8 Ld SOIC M8.15E
X5083V8IZ (No longer available,
recommended replacement: X5083S8IZ)
X5083S8Z-2.7A X5083 ZAN
X5083S8IZ-2.7A* X5083 ZAP -40 to 85 8 Ld SOIC M8.15E
X5083S8Z-2.7* X5083 ZF
X5083S8IZ-2.7* X5083 ZG -40 to 85 8 Ld SOIC M8.15E
X5083V8IZ-2.7 (No longer available,
recommended replacement: X5083S8IZ-2.7)
NOTE:
1. Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
2. *Add "-T1" suffix for tape and reel.
*Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.
PART
MARKING
X5083P ZAM
583 IZ -40 to 85 8 Ld TSSOP M8.173
583 GZ -40 to 85 8 Ld TSSOP M8.173
VCC RANGE
(V)
4.5-5.5 4.5-4.75
4.5-5.5 4.25-4.5
2.7-5.5 2.85-3.0
2.7-5.5 2.55-2.7
V
TRIP
RANGE (V)
TEMPERATURE
RANGE (°C)
-40 to 85 8 Ld PDIP* MDP0031
0 to 70 8 Ld SOIC M8.15E
0 to 70 8 Ld SOIC M8.15E
0 to 70 8 Ld SOIC M8.15E
PACKAGE
(RoHS Compliant)
PKG.
DWG. #
Pin Description
PIN
(SOIC/
PDIP)
13CS
24SOSerial Output. SO is a push/pull serial data output pin. A read cycle shifts data out on this pin. The falling edge of the
57SISerial Input. SI is a serial data input pin. Input all opcodes, byte addresses, and memory data on this pin. The rising edge
68SCKSerial Clock. The Serial Clock controls the serial bus timing for data input and output. The rising edge of SCK latches in
35WP
46V
82V
7 1 RESET
PIN
TSSOP NAME FUNCTION
/WDI Chip Select Input. CS HIGH, deselects the device and the SO output pin is at a high impedance state. Unless a
nonvolatile write cycle is underway, the device will be in the standby power mode. CS placing it in the active power mode. Prior to the start of any operation after power-up, a HIGH to LOW transition on CS
is required. Watchdog Input. A HIGH to LOW transition on the WDI pin restarts the Watchdog timer. The absence of a HIGH to LOW transition within the watchdog time out period results in RESET
serial clock (SCK) clocks the data out.
of the serial clock (SCK) latches the input data. Send all opcodes (Table 1), addresses and data MSB first.
the opcode, address, or data bits present on the SI pin. The falling edge of SCK changes the data output on the SO pin.
Write Protect. When WP is LOW, nonvolatile write operations to the memory are prohibited. This “Locks” the memory to protect it against inadvertent changes when WP
Ground
SS
Supply Voltage
CC
Reset Output. RESET is an active LOW, open drain output which goes active whenever VCC falls below the minimum V RESET watchdog time out period. A falling edge of CS about 1V and remains active for 250ms after the power supply stabilizes.
sense level. It will remain active until VCC rises above the minimum VCC sense level for 250ms.
CC
goes active if the watchdog timer is enabled and CS remains either HIGH or LOW longer than the selectable
will reset the watchdog timer. RESET goes active on power-up at
is HIGH, the device operates normally.
LOW enables the device,
going active.
FN8127 Rev 4.00 Page 3 of 21 November 12, 2015
Page 4
X5083
01234567
SCK
SI
CS
06h
012345678910 20 21 22 23
16 Bits
0001h
02h
WP
VP = 15-18V
00h
WREN Write Address Data
FIGURE 1. SET V
TRIP
LEVEL SEQUENCE (V
CC
= DESIRED V
TRIP
VALUE)
Principles of Operation
Power-on Reset
Application of power to the X5083 activates a power-on reset circuit. This circuit goes LOW at 1V and pulls the RESET active. This signal prevents the system microprocessor from starting to operate with insufficient voltage or prior to stabilization of the oscillator. RESET
active also blocks communication to the device through the SPI interface. When V
exceeds the device V
CC
circuit releases RESET executing code. While V
value for 200ms (nominal) the
TRIP
, allowing the processor to begin
CC
< V
communications to the
TRIP
device are inhibited.
Low Voltage Monitoring
During operation, the X5083 monitors the VCC level and asserts RESET V
. The RESET signal prevents the microprocessor from
TRIP
if supply voltage falls below a preset minimum
operating in a power fail or brownout condition and terminates any SPI communication in progress. The RESET
signal remains active until the voltage drops below 1V. It also remains active until V
When VCC falls below V
returns and exceeds V
CC
, any communications in progress
TRIP
for 200ms.
TRIP
are terminated and communications are inhibited until V exceeds V
TRIP
for t
PURST
.
Watchdog Timer
The watchdog timer circuit monitors the microprocessor activity by monitoring the WDI input. The microprocessor must toggle the CS
/WDI pin periodically to prevent a RESET signal. The CS/WDI pin must be toggled from HIGH to LOW prior to the expiration of the watchdog time out period. The state of two nonvolatile control bits in the status register determine the watchdog timer period. The microprocessor can change these watchdog bits with no action taken by the microprocessor these bits remain unchanged, even after total power failure.
pin
CC
VCC Threshold Reset Procedure
The X5083 is shipped with a standard VCC threshold (V voltage. This value will not change over normal operating and storage conditions. However, in applications where the standard V needed in the V
is not exactly right, or if higher precision is
TRIP
value, the X5083 threshold may be
TRIP
adjusted. The procedure is described below, and uses the application of a high voltage control signal.
Setting the V
This procedure is used to set the V value. For example, if the current V V
is 4.6V, this procedure will directly make the change. If
TRIP
TRIP
Voltage
to a higher voltage
TRIP
is 4.4V and the new
TRIP
the new setting is to be lower than the current setting, then it is necessary to reset the trip point before setting the new value.
To set the new V threshold voltage to the V programming voltage V followed by a write of Data 00h to address 01h. CS on the write operation initiates the V sequence. Bring WP
voltage, apply the desired V
TRIP
pin and tie the WP pin to the
CC
. Then send a WREN command,
P
programming
TRIP
LOW to complete the operation.
TRIP
going HIGH
Note: This operation also writes 00h to array address 01h.
Resetting the V
This procedure is used to set the V level. For example, if the current V V
must be 4.0V, then the V
TRIP
is reset, the new V
Voltage
TRIP
to a “native” voltage
TRIP
is 4.4V and the new
TRIP
must be reset. When V
is something less than 1.7V. This
TRIP
TRIP
procedure must be used to set the voltage to a lower value.
To reset the new V threshold voltage to the Vcc pin and tie the WP programming voltage V followed by a write of data 00h to address 03h. CS on the write operation initiates the V sequence. Bring WP
voltage, apply the desired V
TRIP
. Then send a WREN command,
P
programming
LOW to complete the operation.
TRIP
TRIP
pin to the
going HIGH
Note: This operation also writes 00h to array address 03h.
TRIP
)
TRIP
FN8127 Rev 4.00 Page 4 of 21 November 12, 2015
Page 5
X5083
01234567
SCK
SI
CS
06h
012345678910 20 21 22 23
16 Bits
0003h
02h
WP
VP = 15-18V
00h
WREN
Write
Address
Data
FIGURE 2. RESET V
TRIP
LEVEL SEQUENCE (VCC > 3V. WP = 15-18V)
1
2 3 4
8
7 6
5
X5083
V
TRIP
Adj.
V
P
RESET
4.7K
SI
SO
CS
SCK
µC
Adjust
Run
FIGURE 3. SAMPLE V
TRIP
RESET CIRCUIT
FN8127 Rev 4.00 Page 5 of 21 November 12, 2015
Page 6
X5083
V
TRIP
Programming
Apply 5V to V
CC
Decrement V
CC
RESET pin
goes active?
Measured V
TRIP
-
Desired V
TRIP
DONE
Execute
Sequence
Reset V
TRIP
Set VCC = VCC Applied =
Desired V
TRIP
Execute
Sequence
Set V
TRIP
New VCC Applied =
Old V
CC
Applied + Error
(V
CC
= VCC - 50mV)
Execute
Sequence
Reset V
TRIP
New VCC Applied =
Old V
CC
Applied - Error
Error  –Emax
–Emax < Error < Emax
YES
NO
Error
Emax
Emax = Maximum Desired Error
FIGURE 4. V
TRIP
PROGRAMMING SEQUENCE
FN8127 Rev 4.00 Page 6 of 21 November 12, 2015
Page 7
X5083
SPI Serial Memory
The memory portion of the device is a CMOS serial EEPROM array with Intersil’s block lock protection. The array is internally organized as x 8. The device features a Serial Peripheral Interface (SPI) and software protocol allowing operation on a simple four-wire bus.
The device utilizes Intersil’s proprietary Direct Write providing a minimum endurance of 100,000 cycles and a minimum data retention of 100 years.
The device is designed to interface directly with the synchronous Serial Peripheral Interface (SPI) of many popular microcontroller families.
The device monitors the bus and asserts RESET watchdog timer is enabled and there is no bus activity within the user selectable time out period or the supply voltage falls below a preset minimum V
TRIP
.
The device contains an 8-bit instruction register. It is accessed via the SI input, with data being clocked in on the rising edge of SCK. CS
must be LOW during the entire operation.
All instructions (Table 1), addresses and data are transferred MSB first. Data input on the SI line is latched on the first rising edge of SCK after CS
goes LOW. Data is output on the SO line by the falling edge of SCK. SCK is static, allowing the user to stop the clock and then start it again to resume operations where left off.
cell,
output if the
instruction will set the latch and the WRDI instruction will reset the latch (Figure 7). This latch is automatically reset upon a power-up condition and after the completion of a valid Write Cycle.
Status Register
The RDSR instruction provides access to the status register. The status register may be read at any time, even during a write cycle. The status register is formatted as follows.
Status Register/Block Lock/WDT Byte
765 4 3 210
0 0 0 WD1 WD0 BL2 BL1 BL0
Block Lock Memory
Intersil’s block lock memory provides a flexible mechanism to store and lock system ID and parametric information. There are seven distinct block lock memory areas within the array which vary in size from one page to as much as half of the entire array. These areas and associated address ranges are block locked by writing the appropriate two byte block lock instruction to the device as described in Table 1 and Figure 9. Once a block lock instruction has been completed, that block lock setup is held in the nonvolatile status register until the next block lock instruction is issued. The sections of the memory array that are block locked can be read but not written until block lock is removed or changed.
Write Enable Latch
The device contains a Write Enable Latch. This latch must be SET before a Write Operation is initiated. The WREN
TABLE 1. INSTRUCTION SET AND BLOCK LOCK PROTECTION BYTE DEFINITION
INSTRUCTION FORMAT INSTRUCTION NAME AND OPERATION
0000 0110 WREN: set the write enable latch (write enable operation)
0000 0100 WRDI: reset the write enable latch (write disable operation)
0000 0001 Write status instruction—followed by:
0000 0101 READ STATUS: reads status register & provides write in progress status on SO pin
0000 0010 WRITE: write operation followed by address and data
0000 0011 READ: read operation followed by address
Block lock/WDT byte: (See Figure 1)
000WD 000WD 000WD 000WD 000WD 000WD 000WD 000WD
WD2000 --->no block lock: 00h-00h--->none of the array
1
WD2001 --->block lock Q1: 0000h-00FFh--->lower quadrant (Q1)
1
WD2010 --->block lock Q2: 0100h-01FFh--->Q2
1
WD2011 --->block lock Q3: 0200h-02FFh--->Q3
1
WD2100 --->block lock Q4: 0300h-03FFh--->upper quadrant (Q4)
1
WD2101 --->block lock H1: 0000h-01FFh--->lower half of the array (H1)
1
WD2110 --->block lock P0: 0000h-000Fh--->lower page (P0)
1
WD2111 --->block lock Pn: 03F0h-03FFh--->upper page (PN)
1
FN8127 Rev 4.00 Page 7 of 21 November 12, 2015
Page 8
X5083
Watchdog Timer
The watchdog timer bits, WD0 and WD1, select the watchdog time out period. These nonvolatile bits are programmed with the WRSR instruction. A change to the Watchdog Timer, either setting a new time out period or turning it off or on, takes effect, following either the next command (read or write) or cycling the power to the device.
The recommended procedure for changing the Watch-dog Timer settings is to do a WREN, followed by a write status register command. Then execute a soft-ware loop to read the status register until the MSB of the status byte is zero. A valid alternative is to do a WREN, followed by a write status register command. Then wait 10ms and do a read status command.
TABLE 2. WATCHDOG TIMER DEFINITION
STATUS REGISTER BITS
0 0 1.4s
0 1 600ms
1 0 200ms
1 1 disabled (factory default)
WATCHDOG TIME OUT
(TYPICAL)WD1 WD0
Read Sequence
When reading from the EEPROM memory array, CS is first pulled low to select the device. The 8-bit READ instruction is transmitted to the device, followed by the 16-bit address. After the READ opcode and address are sent, the data stored in the memory at the selected address is shifted out on the SO line. The data stored in memory at the next address can be read sequentially by continuing to provide clock pulses. The address is automatically incremented to the next higher address after each byte of data is shifted out. When the highest address is reached, the address counter rolls over to address $0000 allowing the read cycle to be continued indefinitely. The read operation is terminated by taking CS
high. Refer to the
read EEPROM array sequence (Figure 5).
To read the status register, the CS
line is first pulled low to select the device followed by the 8-bit RDSR instruction. After the RDSR opcode is sent, the contents of the status register are shifted out on the SO line. Refer to the read status register sequence (Figure 6).
Write Sequence
Prior to any attempt to write data into the device, the “Write Enable” Latch (WEL) must first be set by issuing the WREN instruction (Figure 7). CS instruction is clocked into the device. After all eight bits of the instruction are transmitted, CS user continues the write operation without taking CS after issuing the WREN instruction, the write operation will be ignored.
is first taken LOW, then the WREN
must then be taken HIGH. If the
HIGH
To write data to the EEPROM memory array, the user then issues the WRITE instruction followed by the 16 bit address and then the data to be written. Any unused address bits are specified to be “0’s”. The WRITE operation minimally takes 32 clocks. CS
must go low and remain low for the duration of the operation. If the address counter reaches the end of a page and the clock continues, the counter will roll back to the first address of the same page and overwrite any data that may have been previously written.
For a write operation (byte or page write) to be completed, CS can only be brought HIGH after bit 0 of the last data byte to be written is clocked in. If it is brought HIGH at any other time, the write operation will not be completed (Figure 8).
To write to the status register, the WRSR instruction is followed by the data to be written (Figure 9). Data bits 5, 6 and 7 must be “0”.
Read Status Operation
If there is not a nonvolatile write in progress, the read status instruction returns the block lock setting from the status register which contains the watchdog timer bits WD1, WD0, and the block lock bits IDL2-IDL0 (Figure 6). The block lock bits define the block lock condition (Table 1). The watchdog timer bits set the operation of the watchdog timer (Table 2). The other bits are reserved and will return ’0’ when read. See Figure 6.
During an internal nonvolatile write operaiton, the Read Status Instruction returns a HIGH on SO in the first bit following the RDSR instruction (the MSB). The remaining bits in the output status byte are undefined. Repeated Read Status Instructions return the MSB as a ‘1’ until the nonvolatile write cycle is complete. When the nonvolatile write cycle is completed, the RDSR instruction returns a ‘0’ in the MSB position with the remaining bits of the status register undefined. Subsequent RDSR instructions return the Status Register Contents. See Figure 10.
RESET Operation
The RESET output is designed to go LOW whenever VCC has dropped below the minimum trip point and/or the watchdog timer has reached its programmable time out limit.
The RESET
output is an open drain output and requires a pull
up resistor.
Operational Notes
The device powers-up in the following state:
• The device is in the low power standby state.
• A HIGH to LOW transition on CS
active state and receive an instruction.
• SO pin is high impedance.
• The write enable latch is reset.
• Reset signal is active for t
is required to enter an
.
PURST
FN8127 Rev 4.00 Page 8 of 21 November 12, 2015
Page 9
X5083
0123456789
CS
SCK
SI
SO
High Impedance
Read Instruction
(1 Byte)
Byte Address (2 Byte)
Data Out
1514 3210
20 21 22 23 24 25 26 27 28 29 30
76543210
FIGURE 5. READ OPERATION SEQUENCE
01234567
CS
SCK
SI
SO
Read Status Instruction
SO = Status Reg When no Nonvolatile
Write Cycle
...
...
...
B L 2
B
L 1
B L 0
W
D 0
W
D 1
FIGURE 6. READ STATUS OPERATION SEQUENCE
Data Protection
The following circuitry has been included to prevent inadvertent writes:
• A WREN instruction must be issued to set the write enable latch.
•CS must come HIGH at the proper clock count in order to start a nonvolatile write cycle.
• When V inhibited.
is below V
CC
, communications to the device are
TRIP
FN8127 Rev 4.00 Page 9 of 21 November 12, 2015
Page 10
X5083
01234567
CS
SI
SCK
High Impedance
SO
Instruction
(1 Byte)
FIGURE 7. WREN/WRDI SEQUENCE
32 33 34 35 36 37 38 39
SCK
SI
CS
012345678910
SCK
SI
Instruction 16 Bit Address
Data Byte 1
76543210
CS
40 41 42 43 44 45 46 47
Data Byte 2
76543210
Data Byte 3
76543210
Data Byte N
15 14 13 3 2 1 0
20 21 22 23 24 25 26 27 28 29 30 31
654 321 0
FIGURE 8. EEPROM ARRAY WRITE SEQUENCE
0123456789
CS
SCK
SI
SO
High Impedance
Instruction
10 11 12 13 14 15
Data Byte
65432 10
W
D 1
W
D 0
B
L
2
L 1
L 0
BB
FIGURE 9. STATUS REGISTER WRITE SEQUENCE
FN8127 Rev 4.00 Page 10 of 21 November 12, 2015
Page 11
X5083
01234567
CS
SCK
SI
SO
SO MSB HIGH while in the Nonvolatile write cycle
01234567
READ STATUS INSTRUCTION
READ STATUS INSTRUCTION
SO MSB still HIGH indicates Nonvolatile write cycle still in progress
01234567
CS
SCK
SI
SO
01234567
READ STATUS INSTRUCTION
READ STATUS INSTRUCTION
1st detected SO MSB LOW indicates end of Nonvolatile write cycle
43210
WD1
WD0
BL2
BL1
BL0
NONVOLATILE WRITE IN PROGRESS
NONVOLATILE WRITE ENDS
FIGURE 10. READ NONVOLATILE WRITE STATUS
FN8127 Rev 4.00 Page 11 of 21 November 12, 2015
Page 12
X5083
012345
CS
SCK
SI
INSTRUCTION
t
WC
Non-volatile
Write
Operation
67
NEXT
Wait tWC after a write for new operation, if not using polling procedure
FIGURE 11. END OF NONVOLATILE WRITE (NO POLLING)
WAVEFORM INPUTS OUTPUTS
Must be steady
Will be steady
May change from LOW to HIGH
Will change from LOW to HIGH
May change from HIGH to LOW
Will change from HIGH to LOW
Don’t Care: Changes Allowed
Changing: State Not Known
N/A Center Line
is High Impedance
Symbol Table
FN8127 Rev 4.00 Page 12 of 21 November 12, 2015
Page 13
X5083
Absolute Maximum Ratings Operating Conditions
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . .-65°C to 135°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to 150°C
Voltage on Any Pin with Respect To V
. . . . . . . . . . . . . -1.0V to 7V
ss
D.C. Output Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA
Lead Temperature (Soldering, 10s) . . . . . . . . . . . . . . . . . . . . . 300°C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Temperature Range
Commercial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to 85°C
V
Range
CC
-2.7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7V to 5.5V
Blank . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
DC Electrical Specifications (Over the recommended operating conditions unless otherwise specified.)
LIMITS
SYMBOL PARAMETER TEST CONDITIONS
I
CC1
I
CC2
I
SB1
I
SB2
I
SB3
I
I
LO
V
(Note 1) Input LOW Voltage -0.5 V
IL
VIH (Note 1) Input HIGH Voltage V
V
OL1
V
OL2
V
OL3
V
OH1
V
OH2
V
OH3
V
OLRS
VCC Write Current (Active) SCK = VCC x 0.1/VCC x 0.9 @ 5MHz,
SO = Open
VCC Read Current (Active) SCK = VCC x 0.1/VCC x 0.9 @ 5MHz,
SO = Open
VCC Standby Current WDT = OFF CS = VCC, VIN = VSS or VCC,
= 5.5V
V
CC
VCC Standby Current WDT = ON CS = VCC, VIN = VSS or VCC,
= 5.5V
V
CC
VCC Standby Current WDT = ON CS = VCC, VIN = VSS or VCC,
V
= 3.6V
CC
Input Leakage Current VIN = VSS to VCC 0.110µA
LI
Output Leakage Current V
= VSS to V
OUT
CC
0.1 10 µA
x 0.7 V
CC
Output LOW Voltage VCC > 3.3V, IOL = 2.1mA 0.4 V
Output LOW Voltage 2V < VCC 3.3V, IOL = 1mA 0.4 V
Output LOW Voltage VCC 2V, IOL = 0.5mA 0.4 V
Output HIGH Voltage VCC > 3.3V, IOH = -1.0mA V
Output HIGH Voltage 2V < VCC 3.3V, IOH = -0.4mA V
Output HIGH Voltage VCC 2V, IOH = -0.25mA V
Reset Output LOW Voltage I
= 1mA 0.4 V
OL
- 0.8 V
CC
- 0.4 V
CC
- 0.2 V
CC
5mA
0.4 mA
A
50 µA
20 µA
x 0.3 V
CC
+ 0.5 V
CC
UNITMIN TYP MAX
Power-Up Timing
SYMBOL PARAMETER MIN MAX UNIT
(Note 2) Power-up to read operation 1 ms
t
PUR
t
(Note 2) Power-up to write operation 5 ms
PUW
.
Capacitance T
= +25°C, f = 1MHz, VCC = 5V
A
SYMBOL TEST MAX UNIT CONDITIONS
C
(Note 2) Output capacitance (SO, RESET, RESET) 8 pF V
OUT
C
(Note 2) Input capacitance (SCK, SI, CS, WP)6pFV
IN
OUT
IN
= 0V
= 0V
NOTES:
min. and VIH max. are for reference only and are not tested.
1. V
IL
2. This parameter is periodically sampled and not 100% tested.
FN8127 Rev 4.00 Page 13 of 21 November 12, 2015
Page 14
X5083
5V
SO
100pF
5V
3.3k
RESET
30pF
1.64k
1.64k
OUTPUT
Equivalent A.C. Load Circuit at 5V V
CC
A.C. Test Conditions
Input pulse levels VCC x 0.1 to VCC x 0.9
Input rise and fall times 10ns
Input and output timing level V
CC
x 0.5
AC Electrical Specifications (Over recommended operating conditions, unless otherwise specified)
2.7V-5.5V
SYMBOL PARAMETER
DATA INPUT TIMING
f
SCK
t
CYC
t
LEAD
t
LAG
t
WH
t
WL
t
SU
t
H
t
(Note 3) Input rise time s
RI
t
(Note 3) Input fall time s
FI
t
CS
t
(Note 4) Write cycle time 10 ms
WC
Clock frequency 0 3.3 MHz
Cycle time 300 ns
CS lead time 150 ns
CS lag time 150 ns
Clock HIGH time 130 ns
Clock LOW time 130 ns
Data setup time 20 ns
Data hold time 20 ns
CS deselect time 100 ns
DATA OUTPUT TIMING
f
SCK
t
DIS
t
V
t
HO
t
(Note 3) Output rise time 50 ns
RO
t
(Note 3) Output fall time 50 ns
FO
Clock frequency 0 3.3 MHz
Output disable time 150 ns
Output valid from clock low 130 ns
Output hold time 0 ns
NOTES:
3. This parameter is periodically sampled and not 100% tested.
is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal nonvolatile write cycle.
4. t
WC
UNITMIN MAX
FN8127 Rev 4.00 Page 14 of 21 November 12, 2015
Page 15
X5083
SCK
CS
SO
SI
MSB Out MSB–1 Out LSB Out
ADDR
LSB IN
t
CYC
t
V
t
HO
t
WL
t
WH
t
DIS
t
LAG
SCK
CS
SI
SO
MSB IN
t
SU
t
RI
t
LAG
t
LEAD
t
H
LSB IN
t
CS
t
FI
High Impedance
V
CC
t
PURST
t
PURST
t
R
t
F
t
RPD
RESET
0 Volts
V
TRIP
V
TRIP
Serial Output Timing
Serial Input Timing
Power-Up and Power-Down Timing
FN8127 Rev 4.00 Page 15 of 21 November 12, 2015
Page 16
X5083
CS
t
CST
RESET
t
WDO
t
RST
t
WDO
t
RST
RESET
Output Timing
SYMBOL PARAMETER MIN TYP MAX UNIT
V
TRIP
Reset trip point voltage, X5083PT-4.5A (Note 6) Reset trip point voltage, X5083PT Reset trip point voltage, X5083PT-2.7A Reset trip point voltage, X5083PT-2.7
t
PURST
t
(Note 5) VCC detect to reset/output 500 ns
RPD
t
(Note 5) VCC fall time 0.1 ns
F
t
(Note 5) VCC rise time 0.1 ns
R
V
RVALID
Power-up reset time out 100 200 280 ms
Reset valid V
CC
4.5
4.25
2.85
2.55
1V
4.63
4.38
2.93
2.63
4.75
4.5
3.00
2.7
NOTES:
5. This parameter is periodically sampled and not 100% tested.
6. PT = Package/Temperature
CS vs. RESET Timing
V
RESET Output Timing
SYMBOL PARAMETER MIN TYP MAX UNIT
t
WDO
t
CST
t
RST
Watchdog time out period,
WD1 = 1, WD0 = 1(default) WD1 = 1, WD0 = 0 WD1 = 0, WD0 = 1 WD1 = 0, WD0 = 0
100 450
1
OFF
200 600
1.4
300 800
2
CS pulse width to reset the watchdog 400 ns
Reset time out 100 200 300 ms
ms ms
sec
FN8127 Rev 4.00 Page 16 of 21 November 12, 2015
Page 17
X5083
SCK
SI
CS
0001h (set)
V
CC
(V
TRIP
)
V
PE
t
TSU
t
THD
t
VPH
t
VPS
V
P
V
TRIP
t
RP
t
VPO
t
PCS
02h06h
0003h (reset)WREN Write
Addr.
00 Data
V
Programming Timing Diagram
TRIP
V
Programming Parameters
TRIP
PARAMETER DESCRIPTION MIN MAX UNIT
t
VPS
t
VPH
t
PCS
t
TSU
t
THD
t
WC
t
VPO
t
RP
V
P
V
TRAN
V
tv
NOTES:
7. V
TRIP
8. For custom V
V
program enable voltage setup time 1 µs
TRIP
V
program enable voltage hold time 1 µs
TRIP
V
programming CS inactive time 1 µs
TRIP
V
setup time s
TRIP
V
hold (stable) time 10 ms
TRIP
V
write cycle time 10 ms
TRIP
V
program enable voltage off time (between successive adjustments) 0 µs
TRIP
V
program recovery period (between successive adjustments) 10 ms
TRIP
Programming voltage 15 18 V
V
programmed voltage range 2.0 5.0 V
TRIP
V
program variation after programming (0-75°C). (programmed at 25°C) -25 +25 mV
TRIP
programming parameters are periodically sampled and are not 100% tested.
settings, Contact Factory.
TRIP
FN8127 Rev 4.00 Page 17 of 21 November 12, 2015
Page 18
X5083
Revision History
The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to the web to make sure that you have the latest revision.
DATE REVISION CHANGE
November 12, 2015 FN8127.4 Updated Ordering Information table on page 3.
Added Revision History and About Intersil sections. Updated POD MDP0027 to POD M8.15E.
About Intersil
Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets.
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product information page found at www.intersil.com
You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask.
Reliability reports are also available from our website at www.intersil.com/support.
.
FN8127 Rev 4.00 Page 18 of 21 November 12, 2015
Page 19
X5083
Unless otherwise specified, tolerance : Decimal ± 0.05
The pin #1 identifier may be either a mold or mark feature.
Interlead flash or protrusions shall not exceed 0.25mm per side.
Dimension does not include interlead flash or protrusions.
Dimensions in ( ) for Reference Only.
Dimensioning and tolerancing conform to AMSE Y14.5m-1994.
3.
5.
4.
2.
Dimensions are in millimeters.1.
NOTES:
DETAIL "A"
SIDE VIEW “A
TYPICAL RECOMMENDED LAND PATTERN
TOP VIEW
A
B
4
4
0.25 AMC B
C
0.10 C
5
ID MARK
PIN NO.1
(0.35) x 45°
SEATING PLANE
GAUGE PLANE
0.25
(5.40)
(1.50)
4.90 ± 0.10
3.90 ± 0.10
1.27
0.43 ± 0.076
0.63 ±0.23
4° ± 4°
DETAIL "A"
0.22 ± 0.03
0.175 ± 0.075
1.45 ± 0.1
1.75 MAX
(1.27)
(0.60)
6.0 ± 0.20
Reference to JEDEC MS-012.
6.
SIDE VIEW “B”
Package Outline Drawing
M8.15E
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
Rev 0, 08/09
FN8127 Rev 4.00 Page 19 of 21 November 12, 2015
Page 20
X5083
D
L
A
e
b
A1
NOTE 5
A2
SEATING PLANE
L
N
PIN #1 INDEX
E1
12 N/2
b2
E
eB
eA
c
Plastic Dual-In-Line Packages (PDIP)
MDP0031 PLASTIC DUAL-IN-LINE PACKAGE
SYMBOL PDIP8 PDIP14 PDIP16 PDIP18 PDIP20 TOLERANCE NOTES
A 0.210 0.210 0.210 0.210 0.210 MAX
A1 0.015 0.015 0.015 0.015 0.015 MIN
A2 0.130 0.130 0.130 0.130 0.130 ±0.005
b 0.018 0.018 0.018 0.018 0.018 ±0.002
b2 0.060 0.060 0.060 0.060 0.060 +0.010/-0.015
c 0.010 0.010 0.010 0.010 0.010 +0.004/-0.002
D 0.375 0.750 0.750 0.890 1.020 ±0.010 1
E 0.310 0.310 0.310 0.310 0.310 +0.015/-0.010
E1 0.250 0.250 0.250 0.250 0.250 ±0.005 2
e 0.100 0.100 0.100 0.100 0.100 Basic
eA 0.300 0.300 0.300 0.300 0.300 Basic
eB 0.345 0.345 0.345 0.345 0.345 ±0.025
L 0.125 0.125 0.125 0.125 0.125 ±0.010
N 8 14 16 18 20 Reference
Rev. B 2/99
NOTES:
1. Plastic or metal protrusions of 0.010” maximum per side are not included.
2. Plastic interlead protrusions of 0.010” maximum per side are not included.
3. Dimensions E and eA are measured with the leads constrained perpendicular to the seating plane.
4. Dimension eB is measured with the lead tips unconstrained.
5. 8 and 16 lead packages have half end-leads as shown.
FN8127 Rev 4.00 Page 20 of 21 November 12, 2015
Page 21
X5083
INDEX AREA
E1
D
N
123
-B-
0.10(0.004) C AM BS
e
-A-
b
M
-C-
A1
A
SEATING PLANE
0.10(0.004)
c
E
0.25(0.010) BM M
L
0.25
0.010
GAUGE
PLANE
A2
NOTES:
1. These package dimensions are within allowable dimensions of JEDEC MO-153-AC, Issue E.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E1” does not include interlead flash or protrusions. Inter­lead flash and protrusions shall not exceed 0.15mm (0.006 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “b” does not include dambar protrusion. Allowable dambar protrusion shall be 0.08mm (0.003 inch) total in excess of “b” dimen­sion at maximum material condition. Minimum space between protru­sion and adjacent lead is 0.07mm (0.0027 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. (Angles in degrees)
0.05(0.002)
Thin Shrink Small Outline Plastic Packages (TSSOP)
M8.173
8 LEAD THIN SHRINK NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
NOTESMIN MAX MIN MAX
A - 0.047 - 1.20 -
A1 0.002 0.006 0.05 0.15 -
A2 0.031 0.051 0.80 1.05 -
b 0.0075 0.0118 0.19 0.30 9
c 0.0035 0.0079 0.09 0.20 -
D 0.116 0.120 2.95 3.05 3
E1 0.169 0.177 4.30 4.50 4
e 0.026 BSC 0.65 BSC -
E 0.246 0.256 6.25 6.50 -
L 0.0177 0.0295 0.45 0.75 6
N8 87
o
0
o
8
o
0
o
8
-
Rev. 1 12/00
All trademarks and registered trademarks are the property of their respective owners.
© Copyright Intersil Americas LLC 2005-2015. All Rights Reserved.
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
FN8127 Rev 4.00 Page 21 of 21 November 12, 2015
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
For information regarding Intersil Corporation and its products, see www.intersil.com
For additional products, see www.intersil.com/en/products.html
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