Datasheet X28HC64SM-12, X28HC64SI-90, X28HC64SI-70, X28HC64SI-55, X28HC64SI-12 Datasheet (XICOR)

...
Page 1
X28HC64
1
64K X28HC64 8K x 8 Bit
5 Volt, Byte Alterable E
2
PROM
© Xicor, Inc. 1994, 1995, 1996 Patents Pending Characteristics subject to change without notice 3857-3.0 8/5/97 T1/C0/D0 EW
55ns Access Time
Simple Byte and Page Write
—Single 5V Supply
—No External High Voltages or VPP Control
Circuits
—Self-Timed
—No Erase Before Write —No Complex Programming Algorithms —No Overerase Problem
Low Power CMOS
—40 mA Active Current Max. —200 µA Standby Current Max.
Fast Write Cycle Times
—64 Byte Page Write Operation —Byte or Page Write Cycle: 2ms Typical —Complete Memory Rewrite: 0.25 sec. Typical —Effective Byte Write Cycle Time: 32µs Typical
Software Data Protection
End of Write Detection
DATA Polling —Toggle Bit
PIN CONFIGURATIONS
3857 FHD F03
A
6
A
5
A
4
A
3
A
2
A
1
A
0
NC
I/O
0
A
8
A
9
A
11
NC OE A
10
CE I/O
7
I/O
6
4321323130
14 15 16 17 18 19 20
5 6 7 8 9 10 11 12 13
29 28 27 26 25 24 23 22 21
X28HC64
LCC
PLCC
A7A12NCNCVCCWE
NC
I/O1I/O
2
V
SS
NC
I/O3I/O4I/O
5
3857 ILL F22
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
X28HC64
A
3
A
4
A
5
A
6
A
7
A
12
NC NC V
CC
NC WE NC A
8
A
9
A
11
OE
32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17
A
2
A
1
A
0
I/O
0
I/O
1
I/O
2
NC
V
SS NC
I/O
3
I/O
4
I/O
5
I/O
6
I/O
7
CE
A
10
TSOP
3857 FHD F02.1
NC
A
12
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
I/O
0
I/O
1
I/O
2
V
SS
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17 16 15
V
CC
WE NC A
8
A
9
A
11
OE A
10
CE I/O
7
I/O
6
I/O
5
I/0
4
I/O
3
X28HC64
PLASTIC DIP
FLAT PACK
CERDIP
SOIC
High Reliability
—Endurance: 100,000 Cycles —Data Retention: 100 Years
JEDEC Approved Byte-Wide Pinout
DESCRIPTION
The X28HC64 is an 8K x 8 E2PROM, fabricated with Xicor’s proprietary, high performance, floating gate CMOS technology. Like all Xicor programmable non­volatile memories the X28HC64 is a 5V only device. The X28HC64 features the JEDEC approved pinout for byte­wide memories, compatible with industry standard RAMs.
The X28HC64 supports a 64-byte page write operation, effectively providing a 32µs/byte write cycle and en­abling the entire memory to be typically written in 0.25 seconds. The X28HC64 also features DATA Polling and Toggle Bit Polling, two methods providing early end of write detection. In addition, the X28HC64 includes a user-optional software data protection mode that further enhances Xicor’s hardware write protect capability.
Xicor E2PROMs are designed and tested for applica­tions requiring extended endurance. Inherent data re­tention is greater than 100 years.
PGA
X28HC64
11
I/O
0
10
A
0
14
V
SS
9
A
1
8
A
2
7
A
3
6
A
4
5
A
5
2
A
12
28
V
CC
12
I/O
1
13
I/O
2
15
I/O
3
4
A
6
3
A
7
1
NC
16
I/O
4
20
CE
22
OE
24
A
9
17
I/O
5
27
WE
19
I/O
7
21
A
10
23
A
11
25
A
8
18
I/O
6
26
NC
BOTTOM VIEW
3857 FHD F04
Page 2
2
X28HC64
PIN DESCRIPTIONS Addresses (A0–A12)
The Address inputs select an 8-bit memory location during a read or write operation.
Chip Enable (CE)
The Chip Enable input must be LOW to enable all read/ write operations. When CE is HIGH, power consumption is reduced.
Output Enable (OE)
The Output Enable input controls the data output buffers and is used to initiate read operations.
Data In/Data Out (I/O0–I/O7)
Data is written to or read from the X28HC64 through the I/O pins.
Write Enable (WE)
The Write Enable input controls the writing of data to the X28HC64.
PIN NAMES
Symbol Description
A0–A
12
Address Inputs
I/O0–I/O
7
Data Input/Output
WE Write Enable CE Chip Enable OE Output Enable
V
CC
+5V
V
SS
Ground
NC No Connect
3857 PGM T01
3857 FHD F01
X BUFFERS
LATCHES AND
DECODER
I/O BUFFERS
AND LATCHES
Y BUFFERS
LATCHES AND
DECODER
CONTROL
LOGIC AND
TIMING
65,536-BIT
E2PROM
ARRAY
I/O0–I/O
7
DATA INPUTS/OUTPUTS
CE OE
V
CC
V
SS
A0–A
12
ADDRESS
INPUTS
WE
FUNCTIONAL DIAGRAM
Page 3
X28HC64
3
DEVICE OPERATION Read
Read operations are initiated by both OE and CE LOW. The read operation is terminated by either CE or OE returning HIGH. This two line control architecture elimi­nates bus contention in a system environment. The data bus will be in a high impedance state when either OE or CE is HIGH.
Write
Write operations are initiated when both CE and WE are LOW and OE is HIGH. The X28HC64 supports both a CE and WE controlled write cycle. That is, the address is latched by the falling edge of either CE or WE, whichever occurs last. Similarly, the data is latched internally by the rising edge of either CE or WE, which­ever occurs first. A byte write operation, once initiated, will automatically continue to completion, typically within 2ms.
Page Write Operation
The page write feature of the X28HC64 allows the entire memory to be written in 0.25 seconds. Page write allows two to sixty-four bytes of data to be consecutively written to the X28HC64 prior to the commencement of the internal programming cycle. The host can fetch data from another device within the system during a page write operation (change the source address), but the page address (A6 through A12) for each subsequent valid write cycle to the part during this operation must be the same as the initial page address.
The page write mode can be initiated during any write operation. Following the initial byte write cycle, the host can write an additional one to sixty-three bytes in the same manner as the first byte was written. Each succes­sive byte load cycle, started by the WE HIGH to LOW transition, must begin within 100µs of the falling edge of the preceding WE. If a subsequent WE HIGH to LOW transition is not detected within 100µs, the internal automatic programming cycle will commence. There is no page write window limitation. Effectively the page write window is infinitely wide, so long as the host continues to access the device within the byte load cycle time of 100µs.
Write Operation Status Bits
The X28HC64 provides the user two write operation status bits. These can be used to optimize a system write cycle time. The status bits are mapped onto the I/O bus as shown in Figure 1.
DATA Polling (I/O7)
The X28HC64 features DATA Polling as a method to indicate to the host system that the byte write or page write cycle has completed. DATA Polling allows a simple bit test operation to determine the status of the X28HC64, eliminating additional interrupt inputs or external hard­ware. During the internal programming cycle, any at­tempt to read the last byte written will produce the complement of that data on I/O7 (i.e. write data = 0xxx xxxx, read data = 1xxx xxxx). Once the programming cycle is complete, I/O7 will reflect true data.
Toggle Bit (I/O6)
The X28HC64 also provides another method for deter­mining when the internal write cycle is complete. During the internal programming cycle I/O6 will toggle from HIGH to LOW and LOW to HIGH on subsequent attempts to read the device. When the internal cycle is complete the toggling will cease and the device will be accessible for additional read or write operations.
Figure 1. Status Bit Assignment
3857 FHD F11
5TBDP 43210I/O
RESERVED TOGGLE BIT DATA POLLING
Page 4
4
X28HC64
DATA Polling can effectively reduce the time for writing to the X28HC64. The timing diagram in Figure 2 illus­trates the sequence of events on the bus. The software flow diagram in Figure 3 illustrates one method of implementing the routine.
3857 FHD F13
WRITE DATA
SAVE LAST DATA
AND ADDRESS
READ LAST
ADDRESS
IO
7
COMPARE?
READY
NO
YES
WRITES
COMPLETE?
NO
YES
Figure 3. DATA Polling Software Flow
DATA POLLING I/O
7
Figure 2. DATA Polling Bus Sequence
3857 FHD F12
CE
OE
WE
I/O
7
X28HC64 READY
LAST
WRITE
HIGH Z
V
OL
V
IH
A0–A
12
An An An An An An
V
OH
An
Page 5
X28HC64
5
THE TOGGLE BIT I/O
6
Figure 4. Toggle Bit Bus Sequence
Figure 5. Toggle Bit Software Flow
The Toggle Bit can eliminate the software housekeeping chore of saving and fetching the last address and data written to a device in order to implement DATA Polling. This can be especially helpful in an array comprised of multiple X28HC64 memories that is frequently updated. Toggle Bit Polling can also provide a method for status checking in multiprocessor applications. The timing diagram in Figure 4 illustrates the sequence of events on the bus. The software flow diagram in Figure 5 illustrates a method for polling the Toggle Bit.
3857 FHD F15
LOAD ACCUM
FROM ADDR n
COMPARE
ACCUM WITH
ADDR n
READY
COMPARE
OK?
NO
YES
LAST WRITE
3857 FHD F14
CE
OE
WE
I/O
6
X28HC64 READY
V
OH
V
OL
LAST
WRITE
HIGH Z
* Beginning and ending state of I/O6 will vary.
*
*
Page 6
6
X28HC64
HARDWARE DATA PROTECTION
The X28HC64 provides two hardware features that protect nonvolatile data from inadvertent writes.
• Default VCC Sense—All write functions are inhibited when VCC is 3V typically.
• Write Inhibit—Holding either OE LOW, WE HIGH, or CE HIGH will prevent an inadvertent write cycle during power-up and power-down, maintaining data integrity.
SOFTWARE DATA PROTECTION
The X28HC64 offers a software controlled data protec­tion feature. The X28HC64 is shipped from Xicor with the software data protection NOT ENABLED; that is, the device will be in the standard operating mode. In this mode data should be protected during power-up/-down operations through the use of external circuits. The host would then have open read and write access of the device once VCC was stable.
The X28HC64 can be automatically protected during power-up and power-down without the need for external circuits by employing the software data protection fea-
ture. The internal software data protection circuit is enabled after the first write operation utilizing the soft­ware algorithm. This circuit is nonvolatile and will remain set for the life of the device unless the reset command is issued.
Once the software protection is enabled, the X28HC64 is also protected from inadvertent and accidental writes in the powered-up state. That is, the software algorithm must be issued prior to writing additional data to the device.
SOFTWARE ALGORITHM
Selecting the software data protection mode requires the host system to precede data write operations by a series of three write operations to three specific ad­dresses. Refer to Figure 6 and 7 for the sequence. The three-byte sequence opens the page write window enabling the host to write from one to sixty-four bytes of data. Once the page load cycle has been completed, the device will automatically be returned to the data pro­tected state.
Page 7
X28HC64
7
SOFTWARE DATA PROTECTION Figure 6. Timing Sequence—Byte or Page Write
3857 FHD F16
Figure 7. Write Sequence for Software Data Protection
Regardless of whether the device has previously been protected or not, once the software data protection algorithm is used, the X28HC64 will automatically dis­able further writes unless another command is issued to deactivate it. If no further commands are issued the X28HC64 will be write protected during power-down and after any subsequent power-up.
Note: Once initiated, the sequence of write operations
should not be interrupted.
3857 FHD F17
CE
WE
(VCC)
WRITE PROTECTED
V
CC
0V
DATA
ADDR
AA
1555
55
0AAA
A0
1555
t
BLC MAX
WRITES
OK
BYTE
OR
PAGE
t
WC
WRITE LAST
BYTE TO
LAST ADDRESS
WRITE DATA 55
TO ADDRESS
0AAA
WRITE DATA A0
TO ADDRESS
1555
WRITE DATA XX
TO ANY
ADDRESS
AFTER t
WC
RE-ENTERS DATA
PROTECTED STATE
WRITE DATA AA
TO ADDRESS
1555
BYTE/PAGE LOAD ENABLED
OPTIONAL BYTE OR PAGE WRITE ALLOWED
Page 8
8
X28HC64
RESETTING SOFTWARE DATA PROTECTION Figure 8. Reset Software Data Protection Timing Sequence
Figure 9. Software Sequence to Deactivate Software Data Protection
In the event the user wants to deactivate the software data protection feature for testing or reprogramming in an E2PROM programmer, the following six step algo­rithm will reset the internal protection circuit. After tWC, the X28HC64 will be in standard operating mode.
Note: Once initiated, the sequence of write operations
should not be interrupted.
3857 ILL F18.2
CE
WE
STANDARD OPERATING MODE
Vcc
DATA
ADDRAA1555
55
0AAA
80
1555
t
WC
AA
1555
55
0AAA
20
1555
WRITE DATA 55
TO ADDRESS
0AAA
3857 ILL F19.2
WRITE DATA 55
TO ADDRESS
0AAA
WRITE DATA 80
TO ADDRESS
1555
WRITE DATA AA
TO ADDRESS
1555
WRITE DATA 20
TO ADDRESS
1555
WRITE DATA AA
TO ADDRESS
1555
Page 9
X28HC64
9
SYSTEM CONSIDERATIONS
Because the X28HC64 is frequently used in large memory arrays, it is provided with a two line control architecture for both read and write operations. Proper usage can provide the lowest possible power dissipation and elimi­nate the possibility of contention where multiple I/O pins share the same bus.
To gain the most benefit it is recommended that CE be decoded from the address bus and be used as the primary device selection input. Both OE and WE would then be common among all devices in the array. For a read operation, this assures that all deselected devices are in their standby mode and that only the selected device(s) is outputting data on the bus.
Because the X28HC64 has two power modes, standby and active, proper decoupling of the memory array is of
prime concern. Enabling CE will cause transient current spikes. The magnitude of these spikes is dependent on the output capacitive loading of the I/Os. Therefore, the larger the array sharing a common bus, the larger the transient spikes. The voltage peaks associated with the current transients can be suppressed by the proper selection and placement of decoupling capacitors. As a minimum, it is recommended that a 0.1µF high fre­quency ceramic capacitor be used between VCC and VSS at each device. Depending on the size of the array, the value of the capacitor may have to be larger.
In addition, it is recommended that a 4.7µF electrolytic bulk capacitor be placed between VCC and VSS for each eight devices employed in the array. This bulk capacitor is employed to overcome the voltage droop caused by the inductive effects of the PC board traces.
Normalized ICC(RD) by Temperature Over Frequency
Normalized ICC(RD) @ 25% Over the VCC Range and Frequency
1.4
1.2
0.8
0.4
0.6
0.2
1.0
01020
- 55°C + 25°C
I
CC
RD
NORMALIZED (mA)
FREQUENCY (MHz)
3857 FHD F20.1
+ 125°C
5.5 V
CC
1.4
1.2
0.8
0.4
0.6
0.2
1.0
01020
I
CC
RD
NORMALIZED (mA)
FREQUENCY (MHz)
3857 FHD F21.1
4.5 V
CC
5.0 V
CC
5.5 V
CC
Page 10
10
X28HC64
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias
X28HC64 ..................................... –10°C to +85°C
X28HC64I, X28HC64M ............. –65°C to +135°C
Storage Temperature .......................–65°C to +150°C
Voltage on any Pin with
Respect to V
SS
.......................................
–1V to +7V
D.C. Output Current .............................................5mA
Lead Temperature
(Soldering, 10 seconds).............................. 300°C
*COMMENT
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating condi­tions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temperature Min. Max.
Commercial 0°C +70°C Industrial –40°C +85°C Military –55°C +125°C
3857 PGM T02.1
Supply Voltage Limits
X28HC64 5V ±10%
3857 PGM T03.1
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)
Limits
Symbol Parameter Min. Typ.
(1)
Max. Units Test Conditions
I
CC
VCC Current (Active) 15 40 mA CE = OE = VIL, WE = VIH, All (TTL Inputs) I/O’s = Open, Address Inputs =
TTL Levels @ f = 10 MHz
I
SB1
VCC Current (Standby) 1 2 mA CE = VIH, OE = V
IL
(TTL Inputs) All I/O’s = Open, Other Inputs = V
IH
I
SB2
VCC Current (Standby) 100 200 µA CE = VCC – 0.3V, OE = GND (CMOS Inputs) All I/O’s = Open, Other Inputs =
VCC – 0.3V
I
LI
Input Leakage Current ±10 µAVIN = VSS to V
CC
I
LO
Output Leakage Current ±10 µAV
OUT
= VSS to VCC, CE = V
IH
V
lL
(2)
Input LOW Voltage –1 0.8 V
V
IH
(2)
Input HIGH Voltage 2 VCC + 1 V
V
OL
Output LOW Voltage 0.4 V IOL = 5mA
V
OH
Output HIGH Voltage 2.4 V IOH = –5mA
3857 PGM T04.2
Notes: (1) Typical values are for TA = 25°C and nominal supply voltage
(2) VIL min. and VIH max. are for reference only and are not tested.
Page 11
X28HC64
11
ENDURANCE AND DATA RETENTION
Parameter Min. Max. Unit
Minimum Endurance 100,000 Cycles Data Retention 100 Years
3857 PGM T05.3
POWER-UP TIMING
Symbol Parameter Typ.
(1)
Units
t
PUR
(3)
Power-up to Read Operation 100 µs
t
PUW
(3)
Power-up to Write Operation 5 ms
3857 PGM T06
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V
Symbol Parameter Max. Units Test Conditions
C
I/O
(3)
Input/Output Capacitance 10 pF V
I/O
= 0V
C
IN
(3)
Input Capacitance 6 pF V
IN
= 0V
3857 PGM T07.1
A.C. CONDITIONS OF TEST
Input Pulse Levels 0V to 3V Input Rise and
Fall Times 5ns Input and Output
Timing Levels 1.5V
3857 PGM T08.1
MODE SELECTION
CE OE WE Mode I/O Power
L L H Read D
OUT
Active
L H L Write D
IN
Active
H X X Standby and High Z Standby
Write Inhibit X L X Write Inhibit — X X H Write Inhibit
3857 PGM T09
Note: (3) This parameter is periodically sampled and not 100% tested.
EQUIVALENT A.C. LOAD CIRCUITS SYMBOL TABLE
WAVEFORM
INPUTS
OUTPUTS
Must be steady
Will be steady
May change from LOW to HIGH
Will change from LOW to HIGH
May change from HIGH to LOW
Will change from HIGH to LOW
Don’t Care: Changes Allowed
Changing: State Not Known
N/A
Center Line is High Impedance
3857 FHD F22.3
5V
1.92K
30pF
OUTPUT
1.37K
Page 12
12
X28HC64
Read Cycle Limits
X28HC64-70 X28HC64-90 X28HC64-12
–55°C to +125° C –55°C to +125° C –55°C to +125°C
Symbol Parameter Min. Max. Min. Max. Min. Max. Units
t
RC
Read Cycle Time 70 90 120 ns
t
CE
Chip Enable Access Time 70 90 120 ns
t
AA
Address Access Time 70 90 120 ns
t
OE
Output Enable Access Time 35 40 50 ns
t
LZ
(4)
CE LOW to Active Output 0 0 0 ns
t
OLZ
(4)
OE LOW to Active Output 0 0 0 ns
t
HZ
(4)
CE HIGH to High Z Output 30 30 30 ns
t
OHZ
(4)
OE HIGH to High Z Output 30 30 30 ns
t
OH
Output Hold from 0 0 0 ns Address Change
3857 PGM T10.1
A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Read Cycle
3857 FHD F05
Notes: (4) tLZ min., tHZ, t
OLZ
min., and t
OHZ
are periodically sampled and not 100% tested. tHZ max. and t
OHZ
max. are measured from the
point when CE or OE return HIGH (whichever occurs first) to the time when the outputs are no longer driven.
t
CE
t
RC
ADDRESS
CE
OE
WE
DATA VALID
DATA VALID
t
OE
t
LZ
t
OLZ
t
OH
t
AA
t
HZ
t
OHZ
DATA I/O
V
IH
HIGH Z
Page 13
X28HC64
13
WRITE CYCLE LIMITS
Symbol Parameter Min. Typ.
(1)
Max. Units
t
WC
(5)
Write Cycle Time 2 5 ms
t
AS
Address Setup Time 0 ns
t
AH
Address Hold Time 50 ns
t
CS
Write Setup Time 0 ns
t
CH
Write Hold Time 0 ns
t
CW
CE Pulse Width 50 ns
t
OES
OE HIGH Setup Time 0 ns
t
OEH
OE HIGH Hold Time 0 ns
t
WP
WE Pulse Width 50 ns
t
WPH
(6)
WE HIGH Recovery 50 ns
t
DV
(6)
Data Valid 1 µs
t
DS
Data Setup 50 ns
t
DH
Data Hold 0 ns
t
DW
(6)
Delay to Next Write 10 µs
t
BLC
Byte Load Cycle 0.15 100 µs
3857 PGM T11.2
WE Controlled Write Cycle
3857 FHD F06
Notes: (5) tWC is the minimum cycle time to be allowed from the system perspective unless polling techniques are used. It is the maximum
time the device requires to automatically complete the internal write operation.
(6) t
WPH
and tDW are periodically sampled and not 100% tested.
ADDRESS
t
AS
t
WC
t
AH
t
OES
t
DV
t
DS
t
DH
t
OEH
CE
WE
OE
DATA IN
DATA OUT
HIGH Z
DATA VALID
t
CS
t
CH
t
WP
Page 14
14
X28HC64
CE Controlled Write Cycle
3857 FHD F07
Page Write Cycle
3857 FHD F08
Notes: (7) Between successive byte writes within a page write operation, OE can be strobed LOW: e.g. this can be done with CE and WE
HIGH to fetch data from another memory device within the system for the next write; or with WE HIGH and CE LOW effectively performing a polling operation.
(8) The timings shown above are unique to page write operations. Individual byte load operations within the page write must
conform to either the CE or WE controlled write cycle timing.
ADDRESS
t
AS
t
OEH
t
WC
t
AH
t
OES
t
CS
t
DV
t
DS
t
DH
t
CH
CE
WE
OE
DATA IN
DATA OUT
HIGH Z
t
CW
DATA VALID
WE
OE
(7)
BYTE 0 BYTE 1 BYTE 2 BYTE n BYTE n+1 BYTE n+2
t
WP
t
WPH
t
BLC
t
WC
CE
ADDRESS *
(8)
I/O
*For each successive write within the page write operation, A6–A12 should be the same or writes to an unknown address could occur.
LAST BYTE
Page 15
X28HC64
15
DATA Polling Timing Diagram
(9)
3857 FHD F09
CE
OE
WE
I/O
6
t
OES
t
DW
t
WC
t
OEH
HIGH Z
*
*
* I/O6 beginning and ending state will vary, depending upon actual tWC.
ADDRESS An
DIN=X D
OUT
=X D
OUT
=X
t
WC
t
OEH
t
OES
An An
CE
WE
OE
I/O
7
t
DW
Toggle Bit Timing Diagram
(9)
3857 FHD F10
Note: (9) Polling operations are by definition read cycles and are therefore subject to read cycle timings.
Page 16
16
X28HC64
0.020 (0.51)
0.016 (0.41)
0.150 (3.81)
0.125 (3.17)
0.610 (15.49)
0.590 (14.99)
0.110 (2.79)
0.090 (2.29)
1.460 (37.08)
1.400 (35.56)
1.300 (33.02) REF.
PIN 1 INDEX
0.160 (4.06)
0.125 (3.17)
0.030 (0.76)
0.015 (0.38)
3926 FHD F04
PIN 1
SEATING
PLANE
0.062 (1.57)
0.050 (1.27)
0.550 (13.97)
0.510 (12.95)
0.085 (2.16)
0.040 (1.02)
0°
15°
28-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
TYP. 0.010 (0.25)
PACKAGING INFORMATION
Page 17
X28HC64
17
PACKAGING INFORMATION
0.620 (15.75)
0.590 (14.99)
TYP. 0.614 (15.60)
0.110 (2.79)
0.090 (2.29)
TYP. 0.100 (2.54)
1.30 (33.02) REF.
0.026 (0.66)
0.014 (0.36)
TYP. 0.018 (0.46)
0.225 (5.72)
0.140 (3.56)
0.060 (1.52)
0.015 (0.38)
3926 FHD F08
PIN 1
SEATING
PLANE
0.200 (5.08)
0.125 (3.18)
0.070 (1.78)
0.030 (0.76)
TYP. 0.055 (1.40)
0.610 (15.49)
0.500 (12.70)
0.100 (2.54)
0.035 (0.89)
TYP. 0.010 (0.25)
0°
15°
28-LEAD HERMETIC DUAL IN-LINE PACKAGE TYPE D
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
1.490 (37.85)
1.435 (36.45)
Page 18
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X28HC64
PACKAGING INFORMATION
0.021 (0.53)
0.013 (0.33)
0.420 (10.67)
0.050 (1.27) TYP.
TYP. 0.017 (0.43)0.045 (1.14) x 45°
0.300 (7.62) REF.
0.453 (11.51)
0.447 (11.35)
TYP. 0.450 (11.43)
0.495 (12.57)
0.485 (12.32)
TYP. 0.490 (12.45)
PIN 1
0.400
(10.16)
REF.
0.553 (14.05)
0.547 (13.89)
TYP. 0.550 (13.97)
0.595 (15.11)
0.585 (14.86)
TYP. 0.590 (14.99)
3° TYP.
0.048 (1.22)
0.042 (1.07)
0.140 (3.56)
0.100 (2.45)
TYP. 0.136 (3.45)
0.095 (2.41)
0.060 (1.52)
0.015 (0.38)
SEATING PLANE
±0.004 LEAD
CO – PLANARITY
3926 FHD F13
32-LEAD PLASTIC LEADED CHIP CARRIER PACKAGE TYPE J
NOTES:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. DIMENSIONS WITH NO TOLERANCE FOR REFERENCE ONLY
Page 19
X28HC64
19
0.2980 (7.5692)
0.2920 (7.4168)
0.4160 (10.5664)
0.3980 (10.1092)
0.0192 (0.4877)
0.0138 (0.3505)
0.0160 (0.4064)
0.0100 (0.2540)
0.050 (1.270) BSC
0.7080 (17.9832)
0.7020 (17.8308)
0.0110 (0.2794)
0.0040 (0.1016)
0.1040 (2.6416)
0.0940 (2.3876)
0.0350 (0.8890)
0.0160 (0.4064)
0.0125 (0.3175)
0.0090 (0.2311)
0° – 8°
X 45°
3926 FHD F17
28-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S
NOTES:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. FORMED LEAD SHALL BE PLANAR WITH RESPECT TO ONE ANOTHER WITHIN 0.004 INCHES
3. BACK EJECTOR PIN MARKED “KOREA”
4. CONTROLLING DIMENSION: INCHES (MM)
SEATING PLANE
BASE PLANE
PACKAGING INFORMATION
Page 20
20
X28HC64
0.150 (3.81) BSC
0.300 (7.62) BSC
0.458 (11.63) ––
0.458 (11.63)
0.442 (11.22)
PIN 1
0.400 (10.16) BSC
0.560 (14.22)
0.540 (13.71)
3926 FHD F14
0.020 (0.51) x 45° REF.
0.095 (2.41)
0.075 (1.91)
0.022 (0.56)
0.006 (0.15)
0.055 (1.39)
0.045 (1.14)
TYP. (4) PLCS.
0.040 (1.02) x 45° REF. TYP. (3) PLCS.
0.050 (1.27) BSC
0.028 (0.71)
0.022 (0.56) (32) PLCS.
0.200 (5.08) BSC
0.558 (14.17) ––
0.088 (2.24)
0.050 (1.27)
0.120 (3.05)
0.060 (1.52)
PIN 1 INDEX CORDER
32-PAD CERAMIC LEADLESS CHIP CARRIER PACKAGE TYPE E
NOTE:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. TOLERANCE: ±1% NLT ±0.005 (0.127)
PACKAGING INFORMATION
Page 21
X28HC64
21
PACKAGING INFORMATION
0.561 (14.25)
0.541 (13.75)
3926 FHD F15
28-LEAD CERAMIC PIN GRID ARRAY PACKAGE TYPE K
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
0.020
0.016
12 13 15 17 18
11 10 14 16 19
9 8 20 21
7 6 22 23
5 2 28 24 25
4312726
TYP. 0.100
ALL LEADS
0.080
0.070
4 CORNERS
PIN 1 INDEX
0.660 (16.76)
0.640 (16.26)
0.100
0.080
0.072
0.061
0.185 (4.70)
0.175 (4.44)
0.050
0.008
A
A
A
A
NOTE: LEADS 4,12,18 & 26
0.080
0.070
Page 22
22
X28HC64
PACKAGING INFORMATION
3926 FHD F16
28-LEAD CERAMIC FLAT PACK
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
0.740 (18.80) MAX.
0.019 (0.48)
0.015 (0.38)
0.050 (1.27) BSC
0.045 (1.14) MAX.
PIN 1 INDEX
128
0.130 (3.30)
0.090 (2.29)
0.045 (1.14)
0.025 (0.66)
0.180 (4.57) MIN.
0.006 (0.15)
0.003 (0.08)
0.030 (0.76) MIN.
0.370 (9.40)
0.250 (6.35)
TYP. 0.300 2 PLCS.
0.440 (11.18) MAX.
Page 23
X28HC64
23
PACKAGING INFORMATION
3926 ILL F38.1
8.02 (0.315)
7.98 (0.314)
1.18 (0.046)
1.02 (0.040)
0.17 (0.007)
0.03 (0.001)
0.26 (0.010)
0.14 (0.006)
0.50 (0.0197) BSC
0.58 (0.023)
0.42 (0.017)
14.15 (0.557)
13.83 (0.544)
12.50 (0.492)
12.30 (0.484)
PIN #1 IDENT. O 0.76 (0.03)
SEATING PLANE
SEE NOTE 2
SEE NOTE 2
0.50 ± 0.04
(0.0197 ± 0.0016)
0.30 ± 0.05
(0.012 ± 0.002)
14.80 ± 0.05
(0.583 ± 0.002)
1.30 ± 0.05
(0.051 ± 0.002)
0.17 (0.007)
0.03 (0.001)
TYPICAL
32 PLACES
15 EQ. SPC. 0.50 ± 0.04
0.0197 ± 0.016 = 7.50 ± 0.06 (0.295 ± 0.0024) OVERALL
TOL. NON-CUMULATIVE
SOLDER PADS
FOOTPRINT
NOTE:
1. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS (INCHES IN PARENTHESES).
32-LEAD THIN SMALL OUTLINE PACKAGE (TSOP) TYPE T
Page 24
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X28HC64
LIMITED WARRANTY
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness tor any purpose. Xicor, Inc. reserves the right to discontinue production and change specifications and prices at any time and without notice.
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents, licenses are implied.
US. PATENTS
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481; 4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829,482; 4,874,967; 4,883,976. Foreign patents and additional patents pending.
LIFE RELATED POLICY
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with appropriate error detection and correction, redundancy and back-up features to prevent such an occurrence.
Xicor’s products are not authorized for use as critical components in life support devices or systems.
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its satety or effectiveness.
ORDERING INFORMATION
Device
Access Time
–55 = 55ns –70 = 70ns –90 = 90ns –12 = 120ns
Temperature Range
Blank = Commercial = 0°C to +70°C I = Industrial = –40°C to +85°C M = Military = –55°C to +125°C MB = MIL-STD-883
Package
P = 28-Lead Plastic DIP D = 28-Lead Cerdip J = 32-Lead PLCC S = 28-Lead Plastic SOIC E = 32-Pad LCC K = 28-Lead Pin Grid Array F = 28-Lead Flat Pack T = 32-Lead TSOP
X28HC64 X X -X
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