—Automatically Performs a Store Operation
Upon Loss of V
NOVRAM
CC
• Single 5 Volt Supply
• Ideal for use with Single Chip Microcomputers
—Minimum I/O Interface
—Serial Port Compatible (COPS™, 8051)
—Easily Interfaced to Microcontroller Ports
• Software and Hardware Control of Nonvolatile
Functions
• Auto Recall on Power-Up
• TTL and CMOS Compatible
• Low Power Dissipation
—Active Current: 10mA
—Standby Current: 50µA
• 8-Lead PDIP and 8-Lead SOIC Packages
• High Reliability
—Store Cycles: 1,000,000
—Data Retention: 100 Years
FUNCTIONAL DIAGRAM
DESCRIPTION
The Xicor X24C45 is a serial 256 bit NOVRAM featuring
a static RAM configured 16 x 16, overlaid bit-by-bit with
a nonvolatile E2PROM array. The X24C45 is fabricated
with Xicor’s Advanced CMOS Floating Gate technology.
The Xicor NOVRAM design allows data to be transferred
between the two memory arrays by means of software
commands or external hardware inputs. A store operation (RAM data to E2PROM) is completed in 5ms or less
and a recall operation (E2PROM data to RAM) is completed in 2µs or less.
The X24C45 also includes the AUTOSTORE feature, a
user selectable feature that automatically performs a
store operation when VCC falls below a preset threshold.
Xicor NOVRAMs are designed for unlimited write operations to RAM, either from the host or recalls from E2PROM
and a minimum 1,000,000 store operations. Inherent data
retention is specified to be greater than 100 years.
NONVOLATILE
E2PROM
STORE
STATIC
ROW
DECODE
CE (1)
DI (3)
SK (2)
AUTOSTORE™ NOVRAM is a trademark of Xicor, Inc.
COPS is a trademark of National Semiconductor Corp.
The Chip Enable input must be HIGH to enable all read/
write operations. CE must remain HIGH following a
Read or Write command until the data transfer is complete. CE LOW places the X24C45 in the low power
standby mode and resets the instruction register. Therefore, CE must be brought LOW after the completion of an
operation in order to reset the instruction register in
preparation for the next command.
Serial Clock (SK)
The Serial Clock input is used to clock all data into and
out of the device.
Data In (DI)
Data In is the serial data input.
Data Out (DO)
Data Out is the serial data output. It is in the high
impedance state except during data output cycles in
response to a READ instruction.
AUTOSTORE Output (AS)
AS is an open drain output which, when asserted indi-
cates VCC has fallen below the AUTOSTORE threshold
(V
outputs and used as an interrupt input to a microcontroller
or as an input to a low power reset circuit.
RECALL
RECALL LOW will initiate an internal transfer of data
from E2PROM to the RAM array.
). AS may be wire-ORed with multiple open drain
ASTH
PIN CONFIGURATIONPIN DESCRIPTIONS
DIP/SOIC
CE
SK
DI
DO
1
2
3
4
X24C45
8
7
6
5
PIN NAMES
SymbolDescription
CEChip Enable
SKSerial Clock
DISerial Data In
DOSerial Data Out
RECALLRecall Input
ASAUTOSTORE Output
V
CC
V
SS
+5V
Ground
V
CC
AS
RECALL
V
SS
3833 FHD F02.1
3833 PGM T01
2
Page 3
X24C45
DEVICE OPERATION
The X24C45 contains an 8-bit instruction register. It is
accessed via the DI input, with data being clocked in on
the rising edge of SK. CE must be HIGH during the entire
data transfer operation.
Table 1. contains a list of the instructions and their
operation codes. The most significant bit (MSB) of all
instructions is a logic one (HIGH), bits 6 through 3 are
either RAM address bits (A) or don’t cares (X) and bits
2 through 0 are the operation codes. The X24C45
requires the instruction to be shifted in with the MSB first.
After CE is HIGH, the X24C45 will not begin to interpret
the data stream until a logic “1” has been shifted in on DI.
Therefore, CE may be brought HIGH with SK running
and DI LOW. DI must then go HIGH to indicate the start
condition of an instruction before the X24C45 will begin
any action.
In addition, the SK clock is totally static. The user can
completely stop the clock and data shifting will be
stopped. Restarting the clock will resume shifting of
data.
RCL and RECALL
Either a software RCL instruction or a LOW on the
RECALL input will initiate a transfer of E2PROM data
into RAM. This software or hardware recall operation
sets an internal “previous recall” latch. This latch is reset
upon power-up and must be intentionally set by the user
to enable any write or store operations. Although a recall
operation is performed upon power-up, the previous
recall latch is not set by this operation.
WRDS and WREN
Internally the X24C45 contains a “write enable” latch. This
latch must be set for either writes to the RAM or store
operations to the E2PROM. The WREN instruction sets
the latch and the WRDS instruction resets the latch,
disabling both RAM writes and E2PROM stores, effectively protecting the nonvolatile data from corruption. The
write enable latch is automatically reset on power-up.
STO
The software STO instruction will initiate a transfer of
data from RAM to E2PROM. In order to safeguard
against unwanted store operations, the following conditions must be true:
• STO instruction issued.
• The internal “write enable” latch must be set
(WREN instruction issued).
• The “previous recall” latch must be set (either a
software or hardware recall operation).
Once the store cycle is initiated, all other device functions are inhibited. Upon completion of the store cycle,
the write enable latch is reset. Refer to Figure 4 for a
state diagram description of enabling/disabling conditions for store operations.
TABLE 1. INSTRUCTION SET
InstructionFormat, I2 I1 I
0
Operation
WRDS (Figure 3)1XXXX000Reset Write Enable Latch (Disables Writes and Stores)
STO (Figure 3)1XXXX001Store RAM Data in E2PROM
ENAS1XXXX010Enable AUTOSTORE Feature
WRITE (Figure 2)1AAAA011Write Data into RAM Address AAAA
WREN (Figure 3)1XXXX100Set Write Enable Latch (Enables Writes and Stores)
RCL (Figure 3)1XXXX101Recall E2PROM Data into RAM
READ (Figure 1)1AAAA11XRead Data from RAM Address AAAA
X = Don’t Care
A = Address
3
3833 PGM T11
Page 4
X24C45
WRITE
The WRITE instruction contains the 4-bit address of the
word to be written. The write instruction is immediately
followed by the 16-bit word to be written. CE must
remain HIGH during the entire operation. CE must go
LOW before the next rising edge of SK. If CE is brought
LOW prematurely (after the instruction but before 16 bits
of data are transferred), the instruction register will be
reset and the data that was shifted-in will be written to
RAM.
If CE is kept HIGH for more than 24 SK clock cycles (8-bit
instruction plus 16-bit data), the data already shifted-in will
be overwritten.
READ
The READ instruction contains the 4-bit address of the
word to be accessed. Unlike the other six instructions, I
of the instruction word is a “don’t care”. This provides two
advantages. In a design that ties both DI and DO
together, the absence of an eighth bit in the instruction
allows the host time to convert an I/O line from an output
to an input. Secondly, it allows for valid data output
during the ninth SK clock cycle.
D0, the first bit output during a read operation, is truncated. That is, it is internally clocked by the falling edge
of the eighth SK clock; whereas, all succeeding bits are
clocked by the rising edge of SK (refer to Read Cycle
Diagram).
LOW POWER MODE
When CE is LOW, non-critical internal devices are
powered-down, placing the device in the standby power
mode, thereby minimizing power consumption.
AUTOSTORE Feature
The AUTOSTORE instruction (ENAS) sets the
“AUTOSTORE enable” latch, allowing the X24C45 to
automatically perform a store operation when VCC falls
below the AUTOSTORE threshold (V
ASTH
WRITE PROTECTION
The X24C45 provides two software write protection
mechanisms to prevent inadvertent stores of unknown
data.
Power-Up Condition
Upon power-up the “write enable” and “AUTOSTORE
enable” latches are in the reset state, disabling any store
operation.
Unknown Data Store
0
The “previous recall” latch must be set after power-up.
It may be set only by performing a software or hardware
recall operation, which assures that data in all RAM
locations is valid.
SYSTEM CONSIDERATIONS
Power-Up Recall
The X24C45 performs a power-up recall that transfers
the E2PROM contents to the RAM array. Although the
data may be read from the RAM array, this recall does
not set the “previous recall” latch. During this power-up
recall operation, all commands are ignored. Therefore,
the host should delay any operations with the X24C45 a
minimum of t
after VCC is stable.
PUR
).
4
Page 5
X24C45
1
CE
2345678
1A1AAA1X*
SK
DI
9 101112222324
D
1
D
2
D
3
D14D
15
D
0
D
13
DO
HIGH Z
*Bit 8 of Read Instructions is Don’t Care
D
0
Figure 1. RAM Read
Figure 2. RAM Write
3833 FHD F09.1
CE
1
SK
DI
2345678
1A1AAA1
Figure 3. Non-Data Operations
CE
SK
DI
1
1XI
9 101121222324
D
D
0
2345678
XXXI
0
2
1
1
D
2
I
0
D12D
13D14D15
3833 FHD F10.1
3833 FHD F11.1
5
Page 6
X24C45
Figure 4. X24C45 State Diagram
POWER
ON
RAM READ
OR WRITE
WREN
COMMAND
POWER
OFF
AUTOSTORE
POWER DOWN
RAM
READ & WRITE
ENABLED
STORE ENABLED
AUTOSTORE
ENABLED
STO OR
WRDS CMD
ENAS COMMAND
STO OR
WRDS CMD
RAM
READ
ENABLED
RAM
READ
ENABLED
RAM
READ & WRITE
ENABLED
STORE
ENABLED
POWER-UP
RECALL
RAM READ
RCL COMMAND
OR RECALL
RAM READ
WREN
COMMAND
RAM READ
OR WRITE
3833 FHD F12.1
6
Page 7
X24C45
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias .................. –65°C to +135°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with
Respect to V
.......................................
SS
–1V to +7V
D.C. Output Current ............................................. 5mA
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
VCC Supply Current10mASK = 0.4V/2.4V Levels @ 1MHz,
(TTL Inputs)DO = Open, All Other Inputs = V
VCC Supply Current2mAAll Inputs = VIH, CE = V
IL
IH
(During AUTOSTORE)DO = Open, VCC = 4.3V
I
SB1
I
SB2
VCC Standby Current1mADO = Open, CE = VIL,
(TTL Inputs)All Other Inputs = V
VCC Standby Current50µADO = Open, CE = V
IH
SS
(CMOS Inputs)All Other Inputs = VCC – 0.3V
I
LI
I
LO
V
lL
V
IH
V
OL
V
OH
V
OL(AS)
(1)
(1)
Input Load Current10µAVIN = VSS to V
Output Leakage Current10µAV
= VSS to V
OUT
Input LOW Voltage–10.8V
Input HIGH Voltage2VCC + 1V
Output LOW Voltage0.4VIOL = 4.2mA
Output HIGH Voltage2.4VIOH = –2mA
Output LOW Voltage (AS)0.4VI
OL (AS)
= 1mA
CC
CC
3833 PGM T04.3
ENDURANCE AND DATA RETENTION
ParameterMin.Units
Endurance100,000Data Changes Per Bit
Store Cycles1,000,000Store Cycles
Data Retention100Years
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V
SymbolParameterMax.UnitsTest Conditions
(2)
C
OUT
(2)
C
IN
Notes: (1) VIL min. and VIH max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.
Output Capacitance8pFV
Input Capacitance6pFV
7
OUT
IN
= 0V
3833 PGM T05
= 0V
3833 PGM T06.1
Page 8
X24C45
EQUIVALENT A.C. LOAD CIRCUIT
A.C. CONDITIONS OF TEST
Input Pulse Levels0V to 3V
5V
919Ω
Input Rise and
Fall Times10ns
Input and Output
Timing Levels1.5V
OUTPUT
497Ω
100pF
3833 FHD F03
A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Read and Write Cycle Limits
SymbolParameterMin.Max.Units
(3)
F
t
SKH
t
SKL
t
DS
t
DH
t
PD1
t
PD
t
Z
t
CES
t
CEH
t
CDS
SK
SK Frequency1MHz
SK Positive Pulse Width400ns
SK Negative Pulse Width400ns
Data Setup Time400ns
Data Hold Time80ns
SK to Data Bit 0 Valid375ns
SK to Data Valid375ns
Chip Enable to Output High Z1µs
Chip Enable Setup800ns
Chip Enable Hold350ns
Chip Deselect800ns
POWER-UP TIMING
3833 PGM T07.1
3833 PGM T08.1
SymbolParameterMax.Units
(4)
t
PUR
(4)
t
PUW
Notes: (3) SK rise and fall times must be less than 50ns.
(4) t
and t
PUR
are periodically sampled and not 100% tested.
Power-up to Read Operation200µs
Power-up to Write or Store Operation5ms
are the delays required from the time VCC is stable until the specified operation can be initiated. These parameters
Notes: (5) NOP designates when the X24C45 is not currently executing an instruction.
(6) Recall rise time must be <10µs.
(7) Typical values are for TA = 25°C and nominal supply voltage.
Store Time After Clock 8 of STO Command25ms
(7)
Max.Units
3833 PGM T11
3833 FHD F06
3833 PGM T12.1
10
Page 11
X24C45
AUTOSTORE Cycle Limits
SymbolParameterMin.Max.Units
t
ASTO
V
ASTH
V
ASEND
AUTOSTORE Cycle Time5ms
AUTOSTORE Threshold Voltage4.04.3V
AUTOSTORE Cycle End Voltage3.5V
AUTOSTORE Cycle Timing Diagrams
5
4
3
2
VOLTS (V)
1
STORE TIME
V
ASTH
0V
AS
V
CC
AUTOSTORE CYCLE IN PROGRESS
t
ASTO
TIME (ms)
V
CC
t
PUR
t
ASTO
t
PUR
V
ASTH
V
ASEND
3833 PGM T13.1
3833 FHD F08
SYMBOL TABLE
WAVEFORM
11
INPUTS
Must be
steady
May change
from LOW
to HIGH
May change
from HIGH
to LOW
Don’t Care:
Changes
Allowed
N/A
OUTPUTS
Will be
steady
Will change
from LOW
to HIGH
Will change
from HIGH
to LOW
Changing:
State Not
Known
Center Line
is High
Impedance
Page 12
X24C45
PACKAGING INFORMATION
8-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P
0.430 (10.92)
0.360 (9.14)
0.092 (2.34)
DIA. NOM.
PIN 1 INDEX
PIN 1
0.300
(7.62) REF.
0.255 (6.47)
0.245 (6.22)
0.060 (1.52)
0.020 (0.51)
HALF SHOULDER WIDTH ON
ALL END PINS OPTIONAL
SEATING
PLANE
0.150 (3.81)
0.125 (3.18)
0.110 (2.79)
0.090 (2.29)
0.015 (0.38)
MAX.
TYP. 0.010 (0.25)
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
0.140 (3.56)
0.130 (3.30)
0.020 (0.51)
0.015 (0.38)
0.062 (1.57)
0.058 (1.47)
0.020 (0.51)
0.016 (0.41)
0.325 (8.25)
0.300 (7.62)
0°
15°
12
3926 FHD F01
Page 13
X24C45
PACKAGING INFORMATION
8-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S
PIN 1 INDEX
(4X) 7°
0.050 (1.27)
0.010 (0.25)
0.020 (0.50)
PIN 1
X 45°
0.014 (0.35)
0.019 (0.49)
0.188 (4.78)
0.197 (5.00)
0.150 (3.80)
0.158 (4.00)
0.004 (0.19)
0.010 (0.25)
0.228 (5.80)
0.244 (6.20)
0.053 (1.35)
0.069 (1.75)
0.050" TYPICAL
0° – 8°
0.0075 (0.19)
0.010 (0.25)
0.016 (0.410)
0.037 (0.937)
0.250"
FOOTPRINT
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
3926 FHD F22.1
13
0.050"
TYPICAL
0.030"
TYPICAL
8 PLACES
Page 14
X24C45
ORDERING INFORMATION
X24C45PT-V
Device
VCC Limits
Blank = 5V ±10%
Temperature Range
Blank = Commercial = 0°C to +70°C
I = Industrial = –40°C to +85°C
M = Military = –55°C to +125°C
Package
P = 8-Lead Plastic DIP
S = 8-Lead SOIC
LIMITED WARRANTY
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes
no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described
devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness tor any purpose. Xicor, Inc. reserves the right to
discontinue production and change specifications and prices at any time and without notice.
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents,
licenses are implied.
US. PATENTS
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481;
4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829,482; 4,874,967; 4,883,976.
Foreign patents and additional patents pending.
LIFE RELATED POLICY
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with
appropriate error detection and correction, redundancy and back-up features to prevent such an occurrence.
Xicor’s products are not authorized for use as critical components in life support devices or systems.
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life,
and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected
to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure
of the life support device or system, or to affect its satety or effectiveness.
14
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