ABSOLUTE MAXIMUM RATINGS (TA = 25 C UNLESS OTHERWISE NOTED)
ParameterSymbol5 secsSteady StateUnit
Drain-Source VoltageV
Gate-Source VoltageV
b
Continuous DrainCurrent (TJ= 150 C)
Continuous DrainCurrent(TJ= 150 C)
Pulsed Drain Current
Continuous Source Current (diode conduction)
Maximum Power Dissipationbfor SC 75
Maximum Power Dissipationbfor SC-75
Maximum Power Dissipationbfor SC 89
Maximum Power Dissipationbfor SC-89
Operating Junction and Storage Temperature RangeTJ, T
Gate-Source ESDRating (HBM, Method 3015)ESD2000V
Notes
d. Pulse width limited by maximum junction temperature.
e. Surface Mounted on FR4 Board.
a
b
b
TA = 25 C
TA = 85 C
TA = 25 C
TA = 85 C
TA = 25 C
TA = 85 C
DS
GS
I
I
D
D
I
DM
I
S
P
P
D
D
stg
600
400350
275250
175150
9080
275250
160140
20
6
500
1000
−55 to 150
Device Marking
WTX1012 = A
V
V
mA
mA
mW
mW
C
WEITRON
http://www.weitron.com.tw
1/631-Mar-09
Page 2
WTX1012
Electrical Characteristics(T
=25°C Unless otherwise noted)
A
ParameterSymbolTest ConditionMinTypMaxUnit
Static
Gate Threshold VoltageV
Gate-Body LeakageI
Zero Gate Voltage Drain CurrentI
Zero Gate Voltage Drain CurrentI
On-State Drain Current
Drain-Source On-StateResistance
Forward Transconductance
Diode ForwardVoltage
Dynamic
Total Gate ChargeQ
Gate-Source ChargeQ
Gate-Drain ChargeQ
Turn-On Delay Timet
Rise Timet
Turn-Off Delay Timet
Fall Timet
Notes
1. Pulse test; pulse width300 s, duty cycle2%.
2. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is notimplied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.