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White Microelectronics • Phoenix, AZ • (602) 437-1520
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SRAM MONOLITHICS
WS512K16-XXX
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Min Max Unit
Operating Temperature T
A -55 +125 °C
Storage Temperature T
STG -65 +150 °C
Signal Voltage Relative to GND V
G -0.5 Vcc+0.5 V
Junction Temperature T
J 150 °C
Supply Voltage V
CC -0.5 7.0 V
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Max Unit
Supply Voltage V
CC 4.5 5.5 V
Input High Voltage V
IH 2.2 VCC + 0.3 V
Input Low Voltage V
IL -0.3 +0.8 V
Operating Temp. (Mil.) T
A -55 +125 °C
Parameter
Symbol
Condition Max Unit
Input capacitance CIN
VIN = 0V, f = 1.0MHz
25 pF
Output capicitance C
OUT
V
OUT
= 0V, f = 1.0MHz
25 pF
This parameter is guaranteed by design but not tested.
CAPACITANCE
(T
A = +25°C)
DC CHARACTERISTICS
(V
CC
= 5.0V, GND = 0V, TA = -55°C to +125°C)
Parameter Sym Conditions Units
Min Max
Input Leakage Current ILI VCC = 5.5, VIN = GND to VCC 10 µA
Output Leakage Current ILO CS = VIH, OE = VIH, VOUT = GND to VCC 10 µA
Operating Supply Current ICC CS = VIL, OE = VIH, f = 5MHz, Vcc = 5.5 290 mA
Standby Current ISB CS = VIH, OE = VIH, f = 5MHz, Vcc = 5.5 30 mA
Output Low Voltage VOL IOL = 8mA, VCC = 4.5 0.4 V
Output High Voltage V
OH IOH = -4.0mA, VCC = 4.5 2.4 V
NOTE: DC test conditions: V
IH = VCC -0.3V, VIL = 0.3V
Parameter Symbol Conditions Units
Min Typ Max
Data Retention Supply Voltage V
DR CS ≥ VCC -0.2V 2.0 5.5 V
Data Retention Current I
CCDR1 VCC = 3V 2.0 12.0* mA
* Also available in Low Power version. Please call factory for informaion.
DATA RETENTION CHARACTERISTICS
(TA = -55°C to +125°C)
CS1 CS2 WE OE LB UB Mode Data I/O Power
I/O1-8 I/O9-16
H H X X X X Not Select High Z High Z Standby
LH
HL
Output Disable High Z High Z Active
LH
HL
L H Data Out High Z
H L H L Read High Z Data Out Active
L L Data Out Data Out
L H Data In High Z
L X H L Write High Z Data In Active
L L Data In Data In
HH X X
XX H H
HL
LH
HL
LH