Datasheet WM2614IDT, WM2614CDT Datasheet (Wolfson)

Page 1
WM2614
DNL (LSB)
Quad 12-bit Serial Input Voltage Output DAC
Production Data, June 1999, Rev 1.0
FEATURES
• Quad 12-bit DAC voltage output DAC
• Dual 2.7V to 5.5V supply (separate digital and analogue
supplies)
• DNL ±±0.4 LSB, INL ±±1.5 LSB
• Low power consumption:
- 5.5mW, slow mode −− 5V supply
- 3.3mW, slow mode −− 3V supply
• TMS320, (Q)SPI, and Microwire compatible serial
interface
• Programmable settling time of 4µµs or 12µµs typical
APPLICATIONS
• Battery powered test instruments
• Digital offset and gain adjustment
• Battery operated/remote industrial controls
• Machine and motion control devices
• Wireless telephone and communication systems
• Speech synthesis
• Arbitrary waveform generation
ORDERING INFORMATION
DEVICE TEMP. RANGE PACKAGE
WM2614CDT 0° to 70°C 16-pin TSSOP
WM2614IDT -40° to 85 °C 16-pin TSSOP
DESCRIPTION
The WM2614 is a quadruple 12-bit voltage output, resistor string, digital-to-analogue converter. Each DAC can be individually powered down under software control. A hardware controlled mode is provided that powers down all DACs. Power down reduces current consumption to 10nA.
The device has been designed to interface efficiently to industry standard microprocessors and DSPs, including the TMS320 family. The WM2614 is programmed with a 16-bit serial word comprising of a DAC address, individual DAC control bits and a 12-bit value.
The WM2614 has provision for two supplies: one supply for the serial interface (DVDD, DGND) and one for the DACs, reference buffers and output buffers (AVDD, AGND). This enables a typical application where the device can be controlled via a microprocessor operating on a 3V supply, with the DACs operating on a 5V supply. Alternatively, the supplies can be tied together in a single supply application.
Excellent performance is delivered with a typical DNL of 0.4 LSBs. The settling time of the DAC is programmable to allow the designer to optimize speed versus power dissipation. The output stage is buffered by a x2 gain near rail-to-rail amplifier, which features a Class AB output stage. DACs A and B can have a different reference voltage to DACs C and D.
The device is available in a 16-pin TSSOP package. Commercial temperature (0° to 70°C) and Industrial temperature (-40° to 85°C) variants are supported.
BLOCK DIAGRAM TYPICAL PERFORMANCE
AVDD
DVDD
(16)
(1)
REFINAB (15) REFINCD (10)
DIN (4)
FS (7)
SCLK (5)
NCS (6)
WM2614
16-BIT SHIFT
REGISTER CONTROL
LOGIC
POWER-ON
RESET
(9)
AGND
DAC A
data
14-BIT
DATA AND
AND
DGND
CONTROL
HOLDING
LATCH
(8)
REFERENCE
INPUT BUFFER
X1
12-BIT
DAC
LATCH
2-BIT
CONTROL
LATCH
DAC B
DAC C
DAC D
(3)
NLDAC
OUTPUT BUFFER
POWERDOWN/
SPEED
CONTROL
(2)
NPD
DAC
X2
WOLFSON MICROELECTRONICS LTD
Lutton Court, Bernard Terrace, Edinburgh, EH8 9NX, UK Tel: +44 (0) 131 667 9386 Fax: +44 (0) 131 667 5176 Email: [email protected] http://www.wolfson.co.uk
(14) OUTA
(13) OUTB
(12) OUTC
(11) OUTD
1
AVDD = DVDD = 5V, V
0.8
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-1 0 512 1024 1536 2048 2559 3071 3583 4095
= 2.048V, Speed = Fast mode, Load = 10k/100pF
REF
DIGITAL CODE
Production Data Datasheets contain final
specifications current on publication date.
Supply of products conforms to Wolfson
Microelectronics’ terms and conditions.
2614Mastera.doc June 18, 1999 14:36
1999 Wolfson Microelectronics Ltd.
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WM2614 Production Data Rev 1.0
PIN CONFIGURATION
DVDD
NPD
NLDAC
DIN
SCLK
NCS
FS
1 2 3 4 5 6 7
16 15 14 13 12 11 10
AVDD REFINAB OUTA OUTB OUTC OUTD REFINCD
8DGND 9 AGND
PIN DESCRIPTION
PIN NO NAME TYPE DESCRIPTION
1 2
3
4 5 6 7 8
9 10 11 12 13 14 15 16
DVDD Supply Digital supply.
NPD Digital input Power down. Powers down all DACs overriding their individual power down settings
and all output stages. This pin is active low.
NLDAC Digital input Load DAC. Digital input active low. NLDAC must be taken low to update the DAC
latch from the holding latches.
DIN Digital input Serial data input.
SCLK Digital input Serial clock input.
NCS Digital input Chip select. This pin is active low.
FS Digital input Frame synchronisation for serial output data. DGND Ground Digital ground. AGND Ground Analogue ground.
REFINCD Analogue input Voltage reference input for DACs C and D.
OUTD Analogue output DAC D output. OUTC Analogue output DAC C output. OUTB Analogue output DAC B output. OUTA Analogue output DAC A output.
REFINAB Analogue input Voltage reference input for DACs A and B.
AVDD Supply Analogue supply.
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this device.
CONDITION MIN MAX
Supply voltages, DVDD to DGND, AVDD to AGND Supply voltage differences, AVDD to DVDD Digital input voltage Reference input voltage Operating temperature range, T
Storage temperature Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
A
WM2614CDT WM2614IDT
-2.8V 2.8V
-0.3V DVDD + 0.3V
-0.3V AVDD + 0.3V 0°C
-40°C
-65°C 150°C
7V
70°C 85°C
260°C
2
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Production Data Rev 1.0 WM2614
RECOMMENDED OPERATING CONDITIONS
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Supply voltage High-level digital input voltage
Low-level digital input voltage Reference voltage to REFINAB,
REFINCD Load resistance Load capacitance
Serial clock rate Operating free-air temperature
Note: Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.
AVDD, DVDD 2.7 5.5 V
V
f
V V
REF
R C
SCLK
T
IH
IL
L
L
A
DVDD = 2.7V to 5.5V 2 V DVDD = 2.7V to 5.5V 0.8 V
See Note AVDD - 1.5 V
2 10 kΩ
100 pF
20 MHz
WM2614CDT 0 70 °C
WM2614IDT -40 85 °C
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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WM2614 Production Data Rev 1.0 ELECTRICAL CHARACTERISTICS
Test Conditions:
RL = 10kΩ, CL = 100pF. AVDD = DVDD = 5V ±± 10%, V recommended operating free-air temperature range (unless noted otherwise).
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Static DAC Specifications
Resolution Integral non-linearity Differential non-linearity Zero code error Gain error D.c. power supply rejection ratio
INL See Note 1 DNL See Note 2 ZCE See Note 3 3
GE See Note 4 0.25
d.c. PSRR See Note 5 0.5 mV/V Zero code error temperature coefficient Gain error temperature coefficient
DAC Output Specifications
Output voltage range Output load regulation
Power Supplies
Active supply current
I
DD
Power down supply current
Dynamic DAC Specifications
Slew rate
Settling time
Glitch energy Signal to noise ratio
Signal to noise and distortion ratio
Total harmonic distortion
Spurious free dynamic range
SNR fs = 400ksps, f
SNRD fs = 400ksps, f
THD fs = 400ksps, f
SPFDR fs = 400ksps, f
= 2.048V and AVDD = DVDD = 3V ±± 10%, V
REF
See Note 6 10 ppm/°C See Note 6 10 ppm/°C
2kΩ to 10kΩ load
See Note 7
No load, V
AVDD = 5V, V
AVDD = 5V, V
AVDD = 3V, V
AVDD = 3V, V
= DVDD, V
IH
REF
REF
REF
REF
= 0V
IL
= 2.048V Slow 1.6 2.4
= 2.048V Fast 3.8 5.6
= 1.024V Slow 1.2 1.8
= 1.024V Fast
See Note 8
No load,
all digital inputs 0V or DVDD
See Note 9
DAC code 128 to 4095, 10%-90%
Slow Fast
See Note 10
DAC code 128 to 4095
Slow Fast
See Note 11
Code 2047 to 2048 10 nV-s
= 1kHz,
OUT
BW = 20kHz,
See Note 12
= 1kHz,
OUT
BW = 20kHz,
See Note 12
= 1kHz,
OUT
BW = 20kHz,
See Note 12
= 1kHz,
OUT
BW = 20kHz,
See Note 12
= 1.024V over
REF
12 bits
±±1.5 ±±4 ±±0.4 ±±1
±±12
±±0.6
LSB LSB
mV
% FSR
0 AVDD - 0.1 V
0.1 0.25 %
3.2 4.8
0.01 10 µA
0.5
2.5
1.0
4.0
12.0
4.0
V/µs V/µs
µs µs
66 74 dB
54 66 dB
-68 -56 dB
56 70 dB
mA
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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Production Data Rev 1.0 WM2614
Test Conditions:
RL = 10kΩ, CL = 100pF. AVDD = DVDD = 5V ±± 10%, V
= 2.048V and AVDD = DVDD = 3V ±± 10%, V
REF
= 1.024V over
REF
recommended operating free-air temperature range (unless noted otherwise).
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Reference
Reference input resistance Reference input capacitance Reference feedthrough
R C
REFIN
REFIN
V
= 1VPP at 1kHz
REF
10 MΩ
5 pF
-75 dB
+ 1.024V dc, DAC code 0
Reference input bandwidth
V
= 0.2VPP + 1.024V dc
REF
DAC code 2048
Slow Fast
0.5
MHz
1
MHz
Digital Inputs
High level input current Low level input current Input capacitance
I
IH
I
IL
C
I
Input voltage = DVDD 1 µA
Input voltage = 0V -1 µA
3 pF
Notes:
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects of zero code and full scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two codes. A guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in digital input code.
3. Zero code error is the voltage output when the DAC input code is zero.
4. Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying AVDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are normalised to V
REF
.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as a percentage of the full scale output voltage with a 10kΩ load.
8. IDD is measured while continuously writing code 2048 to the DAC. For VIH < DVDD - 0.7V and VIL > 0.7V supply current will increase.
9. Typical supply current in power down mode is 10nA. Production test limits are wider for speed of test.
10. Slew rate results are for the lower value of the rising and falling edge slew rates.
11. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges. Limits are ensured by design and characterisation, but are not production tested.
12. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency f
generated with a sampling frequency fs.
OUT
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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WM2614 Production Data Rev 1.0 SERIAL INTERFACE
t
WLtWH
SCLK
DIN
1 2 3 4 5 15 16
t
SUDtHD
t
SUCSFS
D0D1D12D13D14D15
NCS
t
WHFS
t
SUFSCLK
t
SUC16FS
FS
Figure 1 Timing Diagram Test Conditions:
RL = 10kΩ, CL = 100pF. AVDD = DVDD = 5V ±± 10%, V
= 2.048V and AVDD = DVDD = 3V ±± 10%, V
REF
= 1.024V over recommended
REF
operating free-air temperature range (unless noted otherwise).
SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
t
SUCSFS
t
SUFSCLK
t
SUC16FS
Setup time NCS low before negative FS edge. Setup time FS low before first negative SCLK edge. Setup time, sixteenth negative SCLK edge after FS low
on which D0 is sampled before rising edge of FS.
10 ns
8 ns
10 ns
Setup time, sixteenth positive SCLK edge (first positive after D0 sampled) before NCS rising edge.
t
SUC16CS
If FS is used instead of the sixteenth positive edge to update the DAC, then the setup time is between the FS
10 ns 25 ns
25 ns
8 ns 5 ns
20 ns
t
WHCLK
t
WLCLK
t
SUDCLK
t
HDCLK
t
WHFS
rising edge and the NCS rising edge. Pulse duration, SCLK high. Pulse duration, SCLK low. Setup time, data ready before SCLK falling edge. Hold time, data held valid after SCLK falling edge. Pulse duration, FS high.
t
SUC16CS
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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Production Data Rev 1.0 WM2614
INL - LSB
OUTPUT VOLTAGE - V
OUTPUT VOLTAGE - V
OUTPUT VOLTAGE - V
= 1V, Input Code
OUTPUT VOLTAGE - V
TYPICAL PERFORMANCE GRAPHS
3
5V = VDD, V
2
1
0
-1
-2
-3 0 512 1024 1536 2048 2559 3071 3583 4095
Figure 2 Integral Non-Linearity
= 2.048V, Speed = Fast mode, Load = 10k/100pF
REF
DIGITAL CODE
0.4
AVDD = DVDD = 3V, V
0.35
0.3
0.25
0.2
0.15
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
= 1V, Input Code = 0
REF
ISINK - mA
Slow Fast
0.4
AVDD = DVDD = 5V, V
0.35
0.3
0.25
0.2
0.15
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
= 2V, Input Code = 0
REF
ISINK - mA
Figure Sink 3 Current AVDD = DVDD = 3V Figure 4 Sink Current AVDD = DVDD = 5V
2.06
AVDD = DVDD = 3V, V
2.055
2.05
2.045
REF
4.1
4.095
4.09
4.085
4.08
AVDD =DVDD = 5V, V
= 2V, Input Code = 4095
REF
Slow Fast
2.04
2.035 0 1 2 3 4 5 6 7 8 9 10
ISOURCE - mA
Slow Fast
4.075
4.07 0 1 2 3 4 5 6 7 8 9 10
ISOURCE - mA
Slow Fast
Figure 5 Source Current AVDD = DVDD = 3V Figure 6 Source Current AVDD = DVDD = 5V
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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WM2614 Production Data Rev 1.0 DEVICE DESCRIPTION
GENERAL FUNCTION
The device uses a resistor string network buffered with an op amp to convert 12-bit digital data to analogue voltage levels (see Block Diagram). The output voltage is determined by the reference input voltage and the input code according to the following relationship:
Output voltage =
INPUT OUTPUT
1111 1111 1111
: :
1000 0000 0001
1000 0000 0000
0111 1111 1111
: :
0000 0000 0001
0000 0000 0000 0V
Table 1 Binary Code Table (0V to 2V
CODE
( )
REF
V2
4096
( )
V2 REF
( )
V2 REF
( )
V2
( )
V2 REF
( )
V2 REF
Output), Gain = 2
REFIN
2048 4096
4095 4096
2049 4096
2047 4096
1
4096
REFREF
=
V
POWER ON RESET
An internal power-on-reset circuit resets the DAC register to all 0s on power-up.
BUFFER AMPLIFIER
The output buffer has a near rail-to-rail output with short circuit protection and can reliably drive a 2kΩ load with a 100pF load capacitance.
EXTERNAL REFERENCE
The reference voltage input is buffered which makes the DAC input resistance independent of code. The REFIN pin has an input resistance of 10MΩ and an input capacitance of typically 5pF. The reference voltage determines the DAC full-scale output.
HARDWARE CONFIGURATION OPTIONS
The device has two configuration options that are controlled by device pins.
DEVICE POWER DOWN
The device can be powered-down by pulling pin NPD (Pin 2) high. This powers down all DACs overriding their individual power down settings. This will reduce power consumption to typically 10nA. When the power down function is released the device reverts to the DAC code set prior to power down.
SIMULTANEOUS DAC UPDATE
The NLDAC pin (Pin 3) can be held high to prevent serial word writes from updating the DAC latches. By writing new values to multiple DACs then pulling NLDAC low, all new DAC codes are loaded into the DAC latches simultaneously.
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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Production Data Rev 1.0 WM2614
1
SERIAL INTERFACE
Explanation of data transfer: First, the device has to be enabled with NCS set to low. Then, a falling edge of FS starts shifting the data
bit-per-bit (starting with the MSB) to the internal register on the falling edges of SCLK. After 16 bits have been transferred, the next rising edge on SCLK or FS causes the content of the shift register to be moved to the DAC holding latch. If NLDAC is low, the DAC latch will also updated immediately.
The serial interface of the device can be used in two basic modes:
• four wire (with chip select)
• three wire (without chip select)
Using chip select (four wire mode), it is possible to have more than one device connected to the serial port of the data source (DSP or microcontroller). If there is no need to have more than one device on the serial bus, then NCS can be tied low.
SERIAL CLOCK AND UPDATE RATE
Figure 1 shows the device timing. The maximum serial rate is: f
max = MHz20
SCLK
The digital update rate is limited to an 800ns period, or 1.25MHz frequency. However, the DAC settling time to 12 bits limits the update rate for large input step transitions.
+
=
tt
minWCLminWCH
SOFTWARE CONFIGURATION OPTIONS
The 16 bits of data can be transferred with the sequence shown in Table 2. D11-D0 contains the 12-bit data word. D15-D12 hold the programmable options.
D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
A1 A0 PWR SPD New DAC value (12 bits)
Table 2 Register Map
DAC ADDRESSING
A particular DAC (A, B, C, D) within the device is selected by A1 and A0 within the input word.
A1 A0 DAC ADDRESS
0 0 DAC A 0 1 DAC B 1 0 DAC C 1 1 DAC D
PROGRAMMABLE SETTLING TIME
Settling time is a software selectable 12µs or 4µs, typical to within ±0.5LSB of final value. This is controlled by the value of D12 and associated DAC address. A ONE defines a settling time of 4µs, a ZERO defines a settling time of 12µs for that DAC.
PROGRAMMABLE POWER DOWN
The power down function is controlled by D13. A ZERO configures that DAC as active, a ONE configures that DAC into power down mode. When the power down function is released the device reverts to the DAC code set prior to power down.
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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WM2614 Production Data Rev 1.0 PACKAGE DIMENSIONS
DM013.ADT: 16 PIN TSSOP (5.0 x 4.4 x 1.0 mm)
b
A2
A1
A
e
916
E1 E
GAUGE
D
81
0.05
C
-C-
SEATING PLANE
PLANE
θθ
0.25
c
L
Dimensions
Symbols
(mm)
MIN NOM MAX A A
1
A
2
b c D e E E
1
L
θθ
REF:
NOTES: A. ALL LINEAR DIMENSIONS ARE IN MILLIMETERS. B. THIS DRAWING IS SUBJECT TO CHANGE WITHOUT NOTICE. C. BODY DIMENSIONS DO NOT INCLUDE MOLD FLASH OR PROTRUSION, NOT TO EXCEED 0.25MM. D. MEETS JEDEC.95 MO-153, VARIATION = AB. REFER TO THIS SPECIFICATION FOR FURTHER DETAILS.
----- ----- 1.20
0.05 ----- 0.15
0.80 1.00 1.05
0.19 ----- 0.30
0.09 ----- 0.20
4.90 5.00 5.10
0.65 BSC
6.4 BSC
4.30 4.40 4.50
0.45 0.60 0.75
o
0
----- 8
o
JEDEC.95, MO-153
WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999
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