Datasheet W49F201T-55B, W49F201T-55, W49F201T-45B, W49F201T-45, W49F201S-55B Datasheet (Winbond Electronics)

...
Preliminary W49F201
128K × 16 CMOS FLASH MEMORY
GENERAL DESCRIPTION
The W49F201 is a 2-megabit, 5-volt only CMOS flash memory organized as 128K × 16 bits. The device can be programmed and erased in-system with a standard 5V power supply. A 12-volt VPP is not required. The unique cell architecture of the W49F201 results in fast program/erase operations with extremely low current consumption (compared to other comparable 5-volt flash memory products). The device can also be programmed and erased using standard EPROM programmers.
FEATURES
Single 5-volt operations:
5-volt Read/Erase/Program
Fast Program operation:
Word-by-Word programming: 50 µS (max.)
Fast Erase operation: 60 mS (typ.)
Fast Read access time: 45/55 nS
Endurance: 1K/10K cycles (typ.)
Ten-year data retention
Hardware data protection
Sector configuration
One 8K words boot block with lockout
protection
Two 8K words parameter blocks
One 104K words (208K bytes) Main Memory
Array Blocks
Low power consumption
Active current: 25 mA (typ.)
Standby current: 20 µA (typ.)
Automatic program and erase timing with
internal VPP generation
End of program or erase detection
Toggle bit
Data polling
Latched address and data
TTL compatible I/O
JEDEC standard word-wide pinouts
Available packages: 44-pin SOP, 48-pin TSOP
Publication Release Date: June 1999
- 1 - Revision A1
Preliminary W49F201
CE
OE
WE
PIN CONFIGURATIONS
1
NC
2
NC
3
NC
4
A7
5
A6
6
A5
7
A4
8
A3
9
A2 A1 A0
CE
GND
OE DQ0 DQ8 DQ1 DQ9 DQ2
DQ10
DQ3
DQ11
A15
A14
A13
A12
A11
A10
A9
A8 NC NC
WE
RESET
NC NC NC NC
NC
A7
A6
A5
A4
A3
A2
A1
10 11 12 13 14 15 16 17 18 19 20 21 22
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
21
22 23 24
44-pin
SOP
48-pin TSOP
BLOCK DIAGRAM
V
DD
V
44
RESET
43
WE
42
A8
41
A9
A10
40
A11
39
A12
38 37
A13
36
A14
35
A15 A16
34
NC
33
GND
32 31
DQ15
DQ7
30
DQ14
29
DQ6
28
DQ13
27
DQ5
26
DQ12
25
DQ4
24
23
V
CC
48
A16
47
NC GND
46 45
DQ15
DQ7
44
DQ14
43
DQ6
42
DQ13
41
DQ5
40
DQ12
39
DQ4
38
VCC
37
DQ11
36
DQ3
35
DQ10
34
DQ2
33
DQ9
32
DQ1
31
DQ8
30
DQ0
29 28
OE GND
27 26
CE
25
A0
SS
CE OE
CONTROL
OUTPUT BUFFER
WE
RESET
MAIN MEMORY
A0
A16
. .
DECODER
104K WORDS
PARAMETER BLOCK2 8K WORDS
PARAMETER BLOCK1 8K WORDS
BOOT BLOCK 8K WORDS
PIN DESCRIPTION
SYMBOL PIN NAME
RESET A0A16
DQ0DQ15
VDD Power Supply
GND Ground
NC No Connection
Reset Address Inputs
Data Inputs/Outputs Chip Enable Output Enable Write Enable
DQ0
. .
DQ15
1FFFF
06000 05FFF
04000 03FFF
02000 01FFF
00000
- 2 -
Preliminary W49F201
FUNCTIONAL DESCRIPTION
Read Mode
The read operation of the W49F201 is controlled by CE and OE, both of which have to be low for the host to obtain data from the outputs. CE is used for device selection. When CE is high, the chip is de-selected and only standby power will be consumed. OE is the output control and is used to gate data to the output pins. The data bus is in high impedance state when either CE or OE is high. Refer
to the timing waveforms for further details.
Reset Operation
The RESET input pin can be used in some application. When RESET pin is at high state, the device is in normal operation mode. When RESET pin is driven low for at least a period of TRP, it will halts
the device and all outputs are at high impedance state. The device also resets the internal state machine to read array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence to assure data integrity. As the high state re-asserted
to the RESET pin, the device will return to read or standby mode, it depends on the control signals. The system can read data TRH after the RESET pin returns to VIH. The other function for RESET pin is temporary reset the boot block. By applying the 12V to RESET pin, the boot block can be
reprogrammed even though the boot block lockout function is enabled.
Boot Block Operation
There is one 8K-word boot block in this device, which can be used to store boot code. It is located in the first 8K words of the memory with the address range from 0000(hex) to 1FFF(hex).
See Command Codes for Boot Block Lockout Enable for the specific code. Once this feature is set the data for the designated block cannot be erased or programmed (programming lockout); other memory locations can be changed by the regular programming method.
There is one condition that the lockout feature can be overrides. Just apply 12V to RESET pin, the lockout feature will temporary be inactivated and the boot block can be erased/programmed. Once
the RESET pin returns to TTL level, the lockout feature will be activated again. In order to detect whether the boot block feature is set on the 8K-words block, users can perform
software command sequence: enter the product identification mode (see Command Codes for Identification/Boot Block Lockout Detection for specific code), and then read from address "0002 hex". If the output data in DQ0 is "1", the boot block programming lockout feature is activated; if the output data in DQ0 is "0", the lockout feature is inactivated and the block can be erased/programmed.
To return to normal operation, perform a three-byte command sequence (or an alternate single-word command) to exit the identification mode. For the specific code, see Command Codes for Identification/Boot Block Lockout Detection.
Chip Erase Operation
The chip-erase mode can be initiated by a six-word command sequence. After the command loading cycle, the device enters the internal chip erase mode, which is automatically timed and will be
Publication Release Date: June 1999
- 3 - Revision A1
Preliminary W49F201
completed in a fast 100 mS (typical). The host system is not required to provide any control or timing during this operation. The entire memory array will be erased to FF(hex). by the chip erase operation if the boot block programming lockout feature is not activated. Once the boot block lockout feature is activated, the chip erase function will erase all the sectors except the boot mode.
Sector Erase Operation
The three sectors, main memory and two parameters blocks, can be erased individually by initiating a six-word command sequence. Sector address is latched on the falling WE edge of the sixth cycle while the 30(hex) data input command is latched at the rising edge of WE. After the command loading cycle, the device enters the internal sector erase mode, which is automatically timed and will be completed in a fast 100 mS (typical). The host system is not required to provide any control or timing during this operation. The device will automatically return to normal read mode after the erase operation completed. Data polling and/or Toggle Bits can be used to detect end of erase cycle.
When the boot block lockout feature is inactivated, the boot block and the main memory block will be erased together. Once the boot block is locked, only the main memory block will be erased by the execution of sector erase operation.
Program Operation
The W49F201 is programmed on a word-by-word basis. Program operation can only change logical data "1" to logical data "0" The erase operation (changed entire data in main memory and/or boot block from "0" to "1" is needed before programming.
The program operation is initiated by a 4-word command cycle (see Command Codes for Word Programming). The device will internally enter the program operation immediately after the word­program command is entered. The internal program timer will automatically time-out (50 µS max. ­TBP) once completed and return to normal read mode. Data polling and/or Toggle Bits can be used to detect end of program cycle.
Hardware Data Protection
The integrity of the data stored in the W49F201 is also hardware protected in the following ways: (1) Noise/Glitch Protection: A WE pulse of less than 15 nS in duration will not initiate a write cycle.
(2) VDD Power Up/Down Detection: The programming operation is inhibited when VDD is less than
2.5V typical.
(3) Write Inhibit Mode: Forcing OE low, CE high, or WE high will inhibit the write operation. This
prevents inadvertent writes during power-up or power-down periods.
(4) VDD power-on delay: When VDD has reached its sense level, the device will automatically time-out
5 mS before any write (erase/program) operation.
Data Polling (DQ7)- Write Status Detection
The W49F201 includes a data polling feature to indicate the end of a program or erase cycle. When the W49F201 is in the internal program or erase cycle, any attempt to read DQ7 of the last word loaded will receive the complement of the true data. Once the program or erase cycle is completed, DQ7 will show the true data. Note that DQ7 will show logical "0" during the erase cycle, and become logical "1" or true data when the erase cycle has been completed.
- 4 -
Preliminary W49F201
WE
CEOEWE
RESET
Toggle Bit (DQ6)- Write Status Detection
In addition to data polling, the W49F201 provides another method for determining the end of a program cycle. During the internal program or erase cycle, any consecutive attempts to read DQ6 will produce alternating 0's and 1's. When the program or erase cycle is completed, this toggling between 0's and 1's will stop. The device is then ready for the next operation.
Product Identification
The product ID operation outputs the manufacturer code and device code. Programming equipment automatically matches the device with its proper erase and programming algorithms.
The manufacturer and device codes can be accessed by software or hardware operation. In the software access mode, a six-word (or JEDEC 3-word) command sequence can be used to access the product ID. A read from address 0000H outputs the manufacturer code, 00DA(hex). A read from address 0001(hex) outputs the device code, 00AE(hex). The product ID operation can be terminated by a three-word command sequence or an alternative one-word command sequence (see Command Definition table).
In the hardware access mode, access to the product ID is activated by forcing CE and OE low, high, and raising A9 to 12 volts.
TABLE OF OPERATING MODES
Operating Mode Selection
(VHH = 12V ±5 %)
MODE PINS
ADDRESS DQ.
Read VIL VIL VIH VIH AIN Dout Erase/Program VIL VIH VIL VIH AIN Din Standby VIH X X VIH X High Z Erase/Program X VIL X VIH X High Z/DOUT Inhibit X X VIH VIH X High Z/DOUT Output Disable X VIH X VIH X High Z Product ID VIL VIL VIH VIH A0 = VIL;
A1A15 = VIL; A9 = VHH
VIL VIL VIH VIH A0 = VIH;
A1A15 = VIL; A9 = VHH
Reset X X X VIL X High Z
Manufacturer Code 00DA (Hex)
Device Code 00AE (Hex)
Publication Release Date: June 1999
- 5 - Revision A1
TABLE OF COMMAND DEFINITION
Preliminary W49F201
COMMAND
DESCRIPTION
Read 1 Chip Erase 6 Main Memory Erase 6 Word Program 4 Boot Block Lockout 6 Product ID Entry 3 Product ID Exit Product ID Exit
Notes:
1. Address Format: A14A0 (Hex); Data Format: DQ15DQ8 (Don't Care); DQ7-DQ0 (Hex)
2. Either one of the two Product ID Exit commands can be used.
3. SA: Sector Address SA = 03XXXh for Parameter Block1 SA = 05XXXh for Parameter Block2 SA = 1FXXXh
- for Main Memory Block when Boot Block lockout feature is activated
- for both Boot Block and Main Memory Block when Boot Block lockout feature is inactivated
NO. OF 1ST CYCLE 2ND CYCLE 3RD CYCLE 4TH CYCLE 5TH CYCLE 6TH CYCLE
Cycles Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data
AIN D
OUT
5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 10 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 SA 30 5555 AA 2AAA 55 5555 A0 AIN D 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 40 5555 AA 2AAA 55 5555 90
(1) (1)
5555 AA 2AAA 55 5555 F0
3
XXXX F0
1
IN
- 6 -
Preliminary W49F201
Command Flow
Command Codes for Word Program
WORD SEQUENCE ADDRESS DATA
0 Write 5555H AAH 1 Write 2AAAH 55H 2 Write 5555H A0H 3 Write Programmed-address Programmed-data
Pause 50 µS
Word Program Flow Chart
Word Program
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data A0
to
address 5555
Load data Din
to
programmed-
address
Pause 50 S
Notes for software program code: Data Format: DQ15DQ8: Don't Care; DQ7-DQ0 (Hex) Address Format: A14A0 (Hex)
*It is not allowed to assert read command during the 4-word command sequence(program). To assert the read command during the 4-word command sequence will abort programming procedure.
µ
Exit
Publication Release Date: June 1999
- 7 - Revision A1
Command Codes for Chip Erase
BYTE SEQUENCE ADDRESS DATA
1 Write 5555H AAH 2 Write 2AAAH 55H 3 Write 5555H 80H 4 Write 5555H AAH 5 Write 2AAAH 55H 6 Write 5555H 10H
Chip Erase Acquisition Flow
Load data AA
to
address 5555
Preliminary W49F201
Pause 200 mS
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 10
to
address 5555
Pause 200 mS
Exit
Notes for chip erase: Data Format: DQ15-DQ8: Don't Care; DQ7DQ0 (Hex) Address Format: A14A0 (Hex)
- 8 -
Command Codes for Sector Erase
BYTE SEQUENCE ADDRESS DATA
1 Write 5555H AAH 2 Write 2AAAH 55H 3 Write 5555H 80H 4 Write 5555H AAH 5 Write 2AAAH 55H 6 Write SA* 30H
Sector Erase Acquisition Flow
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Preliminary W49F201
Pause 200 mS
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 30
to
address SA*
Pause 200 mS
Exit
Notes for chip erase: Data Format: DQ15-DQ8: Don't Care; DQ7DQ0 (Hex) Address Format: A14A0 (Hex)
SA = 03XXX for parameter block1 SA = 05XXX for parameter block2 SA = 1FXXX
- for Main Memory Block when Boot Block lockout feature is activated
- for both Boot Block and Main Memory Block when Boot Block lockout feature is inactivated
Publication Release Date: June 1999
- 9 - Revision A1
Preliminary W49F201
Command Codes for Product Identification and Boot Block Lockout Detection
BYTE
SEQUENCE
ALTERNATE PRODUCT (6)
IDENTIFICATION/BOOT BLOCK
LOCKOUT DETECTION ENTRY
SOFTWARE PRODUCT
IDENTIFICATION/BOOT BLOCK LOCKOUT
DETECTION EXIT (7)
ADDRESS DATA ADDRESS DATA
1 Write 5555 AA 5555H AAH 2 Write 2AAA 55 2AAAH 55H 3 Write 5555 90 5555H F0H
Pause 10 µS Pause 10 µS
Software Product Identification and Boot Block Lockout Detection Acquisition Flow
Product Identification Entry (1)
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Product Identification
and Boot Block Lockout Detection
Mode (3)
Read address = 0000
data = 00DA
(2)
Product Identification Exit(7)
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 90
to
address 5555
Pause 10 S
Notes for software product identification/boot block lockout detection: (1) Data Format: DQ15-DQ8 (Don't Care), DQ7DQ0 (Hex); Address Format: A14A0 (Hex) (2) A1A16 = VIL; manufacture code is read for A0 = VIL; device code is read for A0 = VIH.
(3) The device does not remain in identification and boot block lockout detection mode if power down. (4) If the output data in DQ0 = 1, the boot block programming lockout feature is activated; if the output data in DQ0 = 0, the lockout feature is
inactivated and the block can be programmed. (5) The device returns to standard operation mode. (6) Optional 1-write cycle (write F0 hex at XXXX address) can be used to exit the product identification/boot block lockout detection.
µ
Read address = 0001
data = 00AE
Read address = 0002
data in DQ0 =1/0
(2)
(4)
Load data F0
to
address 5555
Pause 10 S
Normal Mode
µ
(5)
- 10 -
Command Codes for Boot Block Lockout Enable
BYTE SEQUENCE BOOT BLOCK LOCKOUT FEATURE SET
ADDRESS DATA
1 Write 5555H AAH 2 Write 2AAAH 55H 3 Write 5555H 80H 4 Write 5555H AAH 5 Write 2AAAH 55H 6 Write 5555H 40H
Pause 200 mS
Boot Block Lockout Enable Acquisition Flow
Boot Block Lockout Feature Set Flow
Load data AA
to
address 5555
Preliminary W49F201
Notes for boot block lockout enable: Data Format: DQ15-DQ8 Don't Care), DQ7DQ0 (Hex) Address Format: A14A0 (Hex)
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 40
to
address 5555
Pause 200 mS
Exit
Publication Release Date: June 1999
- 11 - Revision A1
Preliminary W49F201
OE
CE=OE
CE
CE
DC CHARACTERISTICS
Absolute Maximum Ratings
PARAMETER RATING UNIT
Power Supply Voltage to Vss Potential -0.5 to +7.0 V Operating Temperature 0 to +70 Storage Temperature -65 to +150
D.C. Voltage on Any Pin to Ground Potential except Transient Voltage (<20 nS ) on Any Pin to Ground Potential -1.0 to VDD +1.0 V
Voltage on OE Pin to Ground Potential
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the
device.
-0.5 to VDD +1.0 V
-0.5 to 12.5 V
°C °C
DC Operating Characteristics
(VDD = 5.0V ±10%, VSS = 0V, TA = 0 to 70° C)
PARAMETER SYM. TEST CONDITIONS LIMITS UNIT
MIN. TYP. MAX.
Power Supply Current
Standby VDD Current (TTL input)
Standby VDD Current
(CMOS input)
ICC
Address inputs = VIL/VIH, at f = 5 MHz
ISB1
Other inputs = VIL/VIH
ISB2
Other inputs = VDD -0.3V/GND
= VIL, WE= VIH, all DQs open
= VIH, all DQs open
= VDD -0.3V, all DQs open
- 25 50 mA
- 2 3 mA
- 20 100
µA
Input Leakage Current
Output Leakage Current
Input Low Voltage VIL - -0.3 - 0.8 V Input High Voltage VIH - 2.0 - VDD +0.5 V Output Low Voltage VOL IOL = 2.1 mA - - 0.45 V Output High Voltage VOH IOH = -0.4 mA 2.4 - - V
ILI VIN = GND to VDD - - 10
ILO VOUT = GND to VDD - - 10
Publication Release Date: June 1999
- 12 - Revision A1
µA
µA
Preliminary W49F201
Power-up Timing
PARAMETER SYMBOL TYPICAL UNIT
Power-up to Read Operation TPU. READ 100 Power-up to Write Operation TPU. WRITE 5 mS
CAPACITANCE
(VDD = 5.0V, TA = 25° C, f = 1 MHz)
PARAMETER SYMBOL CONDITIONS MAX. UNIT
I/O Pin Capacitance CI/O VI/O = 0V 12 pf
Input Capacitance CIN VIN = 0V 6 pf
AC CHARACTERISTICS
AC Test Conditions
PARAMETER CONDITIONS
Input Pulse Levels 0V to 3.0V Input Rise/Fall Time < 5 nS Input/Output Timing Level 1.5V/1.5V Output Load 1 TTL Gate and CL = 30 pF
µS
AC Test Load and Waveform
Input
3V
0V
D
OUT
30 pF
(Including Jig and
Scope)
Test Point
1.5V
Output
1.5V
Test Point
+5V
1.8K
1.3K
Publication Release Date: June 1999
- 13 - Revision A1
Preliminary W49F201
AC Characteristics, continued
Read Cycle Timing Parameters
(VCC = 5.0V ±10 %, VCC = 0V, TA = 0 to 70° C)
PARAMETER SYM. W49F201-45 W49F201-55 UNIT
MIN. MAX. MIN. MAX.
Read Cycle Time TRC Chip Enable Access Time TCE Address Access Time TAA Output Enable Access Time TOE
Low to Active Output
CE
Low to Active Output
OE
High to High-Z Output
CE
High to High-Z Output
OE
Output Hold from Address Change TOH 0 - 0 - nS
Note: The parameter of TCLZ, TOLZ, TCHZ, TOHZ are characterized only and is not 100% tested.
TCLZ
TOLZ TCHZ TOHZ
45 - 55 - nS
- 45 - 55 nS
- 45 - 55 nS
- 35 - 40 nS
0 - 0 - nS 0 - 0 - nS
- 25 - 25 nS
- 25 - 25 nS
Write Cycle Timing Parameters
PARAMETER SYMBOL MIN. TYP. MAX. UNIT
Address Setup Time TAS 0 - - nS Address Hold Time TAH 50 - - nS
WE and WE and
High Setup Time
OE
High Hold Time
OE
Pulse Width
CE WE Pulse Width WE High Width
Data Setup Time TDS 50 - - nS Data Hold Time TDH 10 - - nS Word programming Time TBC - 35 50 Erase Cycle Time TEC - 60 200 mS
Note: All AC timing signals observe the following guidelines for determining setup and hold times:
(a) High level signal's reference level is VIH and (b) low level signal's reference level is VIL.
Setup Time
CE
Hold Time
CE
TCS 0 - - nS TCH 0 - - nS TOES 0 - - nS TOEH 0 - - nS TCP 70 - - nS TWP 70 - - nS TWPH 100 - - nS
µS
- 14 -
AC Characteristics, continued
OE
CE
WE
OE
CE
WE
Data Polling and Toggle Bit Timing Parameters
PARAMETER SYM. W49F201-45 W49F201-55 UNIT
to Data Polling Output Delay to Data Polling Output Delay
High to OE Low for Data Polling to Toggle Bit Output Delay to Toggle Bit Output Delay
High to OE Low for Toggle Bit
TOEP ­TCEP ­TOEHP 100 TOET ­TCET ­TOEHT 100
Hardware Reset Timing Parameters
Preliminary W49F201
MIN. MAX. MIN. MAX.
35 - 40 45 - 55
- 100 ­35 - 40 45 - 55
- 100 -
nS nS nS nS nS nS
PARAMETER SYM. MIN. MAX. UNIT
RESET Pulse Width RESET High Time Before Read(1)
Note: 1. The parameters are characterized only and is not 100% tested.
TRP 500 - nS TRH 50 - nS
Publication Release Date: June 1999
- 15 - Revision A1
TIMING WAVEFORMS
WE
Read Cycle Timing Diagram
Address A16-0
CE
OE
V
WE
DQ15-0
IH
High-Z
Preliminary W49F201
T
RC
T
CE
T
OE
T
T
OLZ
T
CLZ
Data Valid
T
OH
AA
T
Data Valid
T
CHZ
OHZ
High-Z
Controlled Command Write Cycle Timing Diagram
Address A16-0
WE
DQ15-0
T
AS
CE
OE
T
CS
T
OES
T
AH
T
WP
Data Valid
T
CH
T
OEH
T
WPH
T
DS
T
DH
- 16 -
Timing Waveforms, continued
CE
Controlled Command Write Cycle Timing Diagram
AS
T
Address A16-0
CE
T
OES
OE
WE
Preliminary W49F201
AH
T
T
TCPH
OEH
TCP
DQ15-0
High Z
Program Cycle Timing Diagram
Address A16-0
DQ15-0
CE
OE
WE
*
*
*Note: It is not allowed to assert read operation(CE# &OE# are both active) during the command sequence. If read command is asserted during the command sequence, then the device will return to read mode(abort write).
5555
WP
T
Word 0 Word 1
AA
TDS
Data Valid
TDH
Word Program Cycle
55552AAA
T
WPH
Word 2
Address
A055
Data-In
Word 3
BP
T
Internal Write Start
Publication Release Date: June 1999
- 17 - Revision A1
Timing Waveforms, continued
DATA
Polling Timing Diagram
Preliminary W49F201
Address A16-0
WE
CE
OE
DQ7
Toggle Bit Timing Diagram
Address A16-0
WE
An
T
OEHP
T
OEP
X
An An An
TCEP
X
T
T
EC
BP or
X
TOES
X
CE
OE
DQ6
T
OEHT
BP orTEC
T
- 18 -
OES
T
Timing Waveforms, continued
Boot Block Lockout Enable Timing Diagram
Six-word code for Boot Block Lockout Feature Enable
Preliminary W49F201
Address A16-0
DQ15-0
CE
OE
WE
Chip Erase Timing Diagram
Address A16-0
5555
XX80
SW23
5555 2AAA
XXAA
SW3
5555
2AAA
XXAA
T
SW0
*Note: It is not allowed to assert read operation(CE# &OE# are both active) during the command sequence. If read command is asserted during the command sequence, then the device will return to read mode(abort write).
5555
XX55
WP
T
WPH
SW1
Six-word code for 5V-only software chip erase
2AAA
5555 5555 2AAA
5555
XX55 XX40
SW5
SW4
5555
T
EC
DQ15-0
WE
CE
OE
XXAA
T
WP
SW0
XX55 XX80
T
WPH
SW1
XXAA
SW2
SW3
XX55
SW4
XX10
SW5
T
EC
Internal Erase starts
Publication Release Date: June 1999
- 19 - Revision A1
Timing Waveforms, continued
Sector Erase Timing Diagram
Six-word code for 5V-only software Main Memory Erase
Preliminary W49F201
Address A16-0
DQ15-0
CE
OE
WE
Reset Timing Diagram
5555 2AAA
XXAA
TWP
T
WPH
SW0
*Note: It is not allowed to assert read operation(CE# &OE# are both active) during the command sequence. If read command is asserted during the 4-word command sequence, then the device will return to read mode(abort write).
SA = Sector Address
5555 5555 2AAA SA
XX55 XX80
SW1
SW2
XXAA
SW3
XX55
SW4
XX30
SW5
TEC
Internal Erase starts
CE
OE
RESET
T
RH
T
RP
- 20 -
ORDERING INFORMATION
Preliminary W49F201
PART NO. ACCESS
TIME
(nS)
W49F201S-45 45 50 200 (CMOS) 44-pin SOP 1K W49F201S-55 55 50 200 (CMOS) 44-pin SOP 1K W49F201T-45 45 50 200 (CMOS) W49F201T-55 55 50 200 (CMOS) W49F201S-45B 45 50 200 (CMOS) 44-pin SOP 10K W49F201S-55B 55 50 200 (CMOS) 44-pin SOP 10K W49F201T-45B 45 50 200 (CMOS) W49F201T-55B 55 50 200 (CMOS)
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications where personal injury might occur as a consequence of product failure.
POWER
SUPPLY
CURRENT
MAX.
(mA)
STANDBY
VDD
CURRENT
MAX.
(µA)
PACKAGE CYCLE
48-pin TSOP (12 mm × 20 mm) 48-pin TSOP (12 mm × 20 mm)
48-pin TSOP (12 mm × 20 mm) 48-pin TSOP (12 mm × 20 mm)
1K 1K
10K 10K
Publication Release Date: June 1999
- 21 - Revision A1
PACKAGE DIMENSIONS 48-pin TSOP (12 mm × 20 mm)
Preliminary W49F201
1
θ
L
44-pin SOP
1
Y
SEATING PLANE
48
e
E
D H
D
L1
A2
A1
2344
E
22
b
c
A
Y
L
L1
H
E
c
θ
D
A2
A
e
b
A1
Symbol
A A1 A2 D H E b
c e
L L1 Y
θ
Symbol
Dimension in mm
MIN.
NOM.
MAX.
0.05
0.95
18.3
19.8
D
11.9
0.17
0.10
0.50
0
MIN. NOM. MAX. MAX.NOM.
A
0.10
A1
2.26
A2
b
0.36 0.500.41
0.10 0.210.15
c
28.07
D
13.10
E
15.80
H
E
e
1.12 1.421.27
L
0.60 1.000.80
L1
Y
θ
1.20
1.051.00
18.4 18.5
20.0 20.2
12.1
12.0
0.27
0.22
0.21
0.50
0.60
0.70
0.80
0.10 5
Dimension in mm
3.00
2.82
28.32
28.19
13.30
13.50
16.00
16.20
1.35
0
0.10 7
Dimension in Inches
NOM.
MIN.
0.002
0.037
0.720
0.780 0.787 0.795
0.468
0.007
0.004
0.020
0
MAX.
0.047
0.041
0.039
0.724 0.728
0.476
0.472
0.009
0.011
0.008
0.020
0.024
0.028
0.031
0.004 5
Dimension in Inches
MIN.
0.004
0.089
0.016
0.014 0.020
0.004 0.0080.006
1.105 1.1151.110
0.516
0.524
0.622
0.044 0.0560.050
0.024 0.0400.032
0.053
0
0.118
0.111
0.531
0.6380.630
0.004 7
- 22 -
Preliminary W49F201
VERSION HISTORY
VERSION DATE PAGE DESCRIPTION
A1 Jun. 1999 - Renamed from W29F201C
Headquarters
No. 4, Creation Rd. III, Science-Based Industrial Park, Hsinchu, Taiwan TEL: 886-3-5770066 FAX: 886-3-5796096 http://www.winbond.com.tw/ Voice & Fax-on-demand: 886-2-27197006
Winbond Electronics (H.K.) Ltd.
Rm. 803, World Trade Square, Tower II, 123 Hoi Bun Rd., Kwun Tong, Kowloon, Hong Kong TEL: 852-27513100 FAX: 852-27552064
Taipei Office
11F, No. 115, Sec. 3, Min-Sheng East Rd., Taipei, Taiwan TEL: 886-2-27190505 FAX: 886-2-27197502
Note: All data and specifications are subject to change without notice.
Winbond Electronics North America Corp. Winbond Memory Lab. Winbond Microelectronics Corp. Winbond Systems Lab.
2727 N. First Street, San Jose, CA 95134, U.S.A. TEL: 408-9436666
FAX: 408-5441798
Publication Release Date: June 1999
- 23 - Revision A1
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