The device is CMOS Synchronous Dynamic RAM organized as 2,097,152 - word x 8-bit x 4-bank. it is
fabricated with an advanced submicron CMOS technology and designed to operate from a singl y 3.3V only
power supply. It is packaged in JEDEC standard pinout and standard plastic TSOP package.
Features
• Single 3.3V () power supply
• High speed clock cycle time : 7/8ns
• Fully synchronous with all signals referenced to a positive clock edge
Voltage on any pin relative to VssVIN, V
Supply voltage relative to VssVDD, V
Short circuit output currentI
Power dissipationP
Operating temperatureT
Storage temperatureT
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
peumanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Maximum A.C. Operating Requirements for LVTTL Compatible
ParameterSymbolMinMaxUnitNotes
Input High VoltageV
Input Low VoltageV
CMOS Synchronous Dynamic RAM
ParameterSymbolValueUnit
OUT
DDQ
OUT
D
OPT
STG
IH
IL
2.0V
V
-2.0
SSQ
-0.5 to + 4.6V
-0.5 to + 4.6V
50mA
1.0W
0 to + 70
-55 to + 125
+ 2.0V2
DDQ
0.8
V2
°C
°C
Recommended DC Operating Conditions for LVTTL Compatible
ParameterSymbolMinTypMaxUnit
Supply Voltage V
Input High Voltage, all inputsV
Input Low Voltage, all inputsV
Notes : 1. Capacitance measured with effective capacitance measuring method.
2. The overshoot and undershoot voltage duration is 3ns with no input clamp diodes.
in
CLK
I/O
2.5 3.755.0pF1
2.53.254.0pF1
4.05.256.5pF1
Document : 1G5-0153Rev.1Page 4
Page 5
≤
≤
≤
∞
≥
≥
≥
∞
≤
≤
≤
∞≥≥≥∞≤≥
≥
≤
≤
≤
µA
≤
≤
µA
Preliminary VG36648041CT
VIS
DC Characteristics (Recommended Operating Conditions unless otherwise noted)
Parameter SymbolTest Conditions
Operating currentI
Precharge standby
current in power
down mode
Precharge standby current
in Nonpower down mode
Active standby current in
power down mode
Active standby current in
Nonpower down mode
Operating current
(Burst mode)
Refresh currentI
Self refresh currentI
Input leakage current
(Inputs)
Output leakage current
(I/O pins)
Output Low VoltageV
Output High VoltageV
Notes :
1. ICC1 depends on output loading and cycle rates. Specified values are obtained with the output
open. In addition to this, ICC1 is measured on condition that addresses are changed only one
time during t
2. ICC4 depends on output loading and cycle rates. Specified values are obtained with the output
open. In addition to this, ICC4 is measured on condition that addresses are changed only one
time during t
3. ICC5 is measured on condition that addresses are changed only one time during t
4. For LVTTL compatible, VG36648041.
CMOS Synchronous Dynamic RAM
VG36648041B
-7-8UnitNotes
MinMaxMinMax
CC1
I
CC
ICC 2PS
I
CC
I
CC
I
CC
I
CC
I
CC
ICC 3NS
I
CC4
CC5t
CC6
I
LI
I
IL
CK(MIN.)
CK(MIN.)
OL
OH
Burst length = 1
One bank active
tRC t
RC(MIN.)
2P
CKE V
CKE V
2N
CKE V
CS V
Input signals are changed one
time during 2 CLK cycles.
2t
CLK high pulse widtht
CLK low pulse widtht
CKE setup timet
CKE hold timet
Address setup timet
Address hold timet
Command setup timet
Command hold timet
Data input setup timet
Data input hold timet
Output data hold timet
CLK to output in low - Zt
CLK to output in H - Z3t
Row active to active delay t
RAS to CAS delayt
Row precharge timet
ROW active timet
ROW cycle timet
Last data in to burst stopt
Data - in to ACT(REF) commandt
Data - in to precharget
Transition timet
Mode reg. set cyclet
Power down exit setup timet
Self refresh exit timet
Refresh time t
RRD
RCD
RP
RAS
RC
BDL
DAL
DPL
T
RSC
PDE
SRX
REF
1416ns
2020ns
2020ns
40120K48120Kns
6068ns
11CLK
1+ t
RP
1+t
RP
11CLK
110110ns
22CLK
22ns
11CLK
6464ms
CLK
Document : 1G5-0153Rev.1Page 7
Page 8
Preliminary VG36648041CT
VIS
Basic Features and Function Description
1.Simplified State Diagram
CMOS Synchronous Dynamic RAM
Mode
Register
Set
MRS
IDLE
Self
Refresh
y
r
t
n
e
F
L
t
E
S
ACT
i
x
e
F
L
E
S
REF
CKE
C
K
E
AUTO
Refresh
Power
Down
Write (Write recovery)
WRITE
SUSPEND
WRITE A
SUSPEND
CKE
CKE
Auto Precharge
CKE
Write with
CKE
WRITE A
WRITE
B
S
T
READ
READ A
Active
Power
Down
Read
CKE
CKE
Read with
Auto Precharge
CKE
CKE
READ
SUSPEND
READA
SUSPEND
ROW
ACTIVE
T
S
B
h
Write
Write recov
Read (write recovery)
A
u
P
R
E
(
P
t
i
w
ry
h
e
e
t
d
i
r
e
r
W
p
o
t
u
A
R
e
a
d
w
t
o
i
t
P
h
r
e
c
h
a
r
g
r
e
c
h
a
r
g
e
t
e
r
m
i
n
a
t
i
o
n
)
A
e
g
r
a
PRE
Write
W
e
A
(
w
r
i
t
e
P
CKE
CKE
Read
R
u
e
t
a
o
d
P
w
r
e
i
t
c
h
h
a
r
g
e
h
t
i
e
g
w
r
e
a
t
i
r
h
c
e
r
P
o
t
u
r
e
c
o
v
e
r
y
)
)
n
o
i
t
a
n
i
m
r
e
t
e
g
r
a
h
c
e
r
P
(
E
R
POWER
ON
Precharge
Precharge
Automatic sequence
Manual input
Note: After the AUTO refresh operation, precharge operation is
performed automatically and enter the IDLE state
Document : 1G5-0153Rev.1Page 8
Page 9
Preliminary VG36648041CT
VIS
2.Truth Table
2.1 Command Truth Table
FUNCTIONSymbol
Device deselectDESLHXHXXXXXX
No operationNOPHXLHHHXXX
Mode register setMRSHXLLLLLLV
Bank activate ACTHXLLHHVVV
ReadREADHXLHLHVLV
Read with auto prechargeREADAHXLHLHVHV
WriteWRITHXLHLLVLV
Write with auto prechargeWRITAHXLHLLVHV
Precharge select bankPREHXLLHLVLX
Precharge all banksPALLHXLLHLXHX
Burst stopBSTHXLHHLXXX
CBR (Auto) refreshREFHHLLLHXXX
Self refreshSELFHLLLLHXXX
CMOS Synchronous Dynamic RAM
CKE
CSRASCASWEBAA10
A11
A9 - A0n - 1n
2.2 DQM Truth Table
CKE
FUNCTIONSymbol
Data write/output enableENBHXL
Data mask/output disableMASKHXH
HCurrent state CS RAS CAS WEAddressCommandActionNotes
IdleHXXXXDESLNop or Power down2
LHHXXNOP or BSTNop or Power down2
LHLHBA, CA, A10READ/READA ILLEGAL3
LHLLBA, CA, A10WRIT/WRITAILLEGAL3
LLHHBR, RAACTRow active
LLHLBA, A10PRE/PALLNop
LLLHXREF/SELFRefresh or Self refresh4
LLLLOp-CodeMPSMode register access
Row activeHXXXXDESLNop
LHHXXNOP or BSTNop
LHLHBA, CA, A10READ/READA Begin read : Determine AP5
LHLLBA, CA, A10WRIT/WRITABegin write : Determine AP5
LLHHBA, RAACTILLEGAL3
LLHLBA, A10PRE/PALLPrecharge6
(1/3)
LLLHXREF/SELFILLEGAL
LLLLOp-CodeMRSILLEGAL
ReadHXXXXDESL
LHHHXNOP
LHHLXBST
LHLHBA, CA, A10READ/READA Term burst, new read : Determine AP7
HXXXXXXINVALID, CLK (n - 1)would exit S.R.
LHHXXXXS.R. Recovery2
LHLHHXXS.R. Recovery2
LHLHLXXILLEGAL
LHLLXXXILLEGAL
LLXXXXXMaintain S.R.
HHHXXXXIdle after t
HHLHHXXIdle after t
HHLHLXXILLEGAL
HHLLXXXILLEGAL
HLHXXXXBegin clock suspend next cycle5
HLLHHXXBegin clock suspend next cycle5
HLLHLXXILLEGAL
HLLLXXXILLEGAL
LHXXXXXExit clock suspend next cycle2
LLXXXXXMaintain clock suspend
HXXXXXINVALID, CLK (n - 1) would exit P.D.
LHXXXXX
LLXXXXXMaintain power down mode
HHHXXXRefer to operations in Operative
HHLHXXRefer to operations in Operative
HHLLHXRefer to operation in Operative
HHLLLHXAuto Refresh
HHLLLLOp - Code Refer to operations in Operative
HLHXXXRefer to operations in Operative
HLLHXXRefer to operations in Operative
HLLLHXRefer to operations in Operative
HLLLLHXSelf refresh3
HLLLLLOp - Code Refer to operations in Operative
Note
1
RC
RC
EXIT P.D. Idle
Command Table
Command Table
Command Table
Command Table
Command Table
Command Table
Command Table
Command Table
2
LXXXXXXPower down3
Any state
other than
listed above
Note:
1. H : Hight level, L : low level, X : High or low level (Don't care).
2. CKE Low to High transition will re-enable CLK and other inputs asynchronously. A minimum setup
time must be satisfied before any command other than EXIT.
3. Power down and Self refresh can be entered only from the both banks idle state.
4. Must be legal command as defined in Operative Command Table.
5. Illegal if t
Document : 1G5-0153Rev.1Page 13
HHXXXXXRefer to operations in Operative
Command Table
HLXXXXXBegin clock suspend next cycle4
LHXXXXXExit clock suspend next cycle
LLXXXXXMaintain clock suspend
is not satisfied.
SREX
Page 14
Preliminary VG36648041CT
VIS
5.Mode Register (Address Input for Mode Set)
CMOS Synchronous Dynamic RAM
13
12
0Reserved
0
12
13
x
x
13
12
x
x
10
11
00
1110
x
x
11
10
xx0
98
00
9
1
9
8
0
8
00
7
1
76
0
76
6
5
5
LTMODE
5
LTMODE
3
4
32
4
WT
3
4
WT
21
2
1
BL
1
BL
0
JEDEC Standard Test Set
0
Burst Read and Single Write (for Write Through Cache)
The precharge command can be asserted anytime after t
Soon after the precharge command is asserted, the precharge operation is performed and the synchronous DRAM
enters the idle state after t
The earliest timing in a read cycle that a precharge command can be asserted without losing any data in the burst is
as follows.
PrechargeE
CLK
Command
CAS latency = 2
DQ
is satisfied. The parameter tRP is the time required to perform the precharge.
RP(min.)
T0T1
Read
RAS(min)
T2
Q0
is satisfied.
T3
Q1
T4T5
PRE
T6
Q3Q2
Burst lengh=4
T7
Hi - Z
Command
CAS latency = 3
DQ
CAS latency = 2 : One clock earlier than the last output data.
3 : Two clocks earlier than the last output data.
In order to write all data to the memory cell correctly, the asynchronous parameter ”t
fied. The t
minimum number of clocks can be calculated by dividing t
last data word is valid. In the following table, minus means clocks before the reference; plus means time
after the reference.
DPL(min.)
In summary, the precharge command can be asserted relative to the reference clock that indicates the
specification defines the earliest time that a precharge command can be asserted. The
CAS latencyReadWrite
Read
Q0
DPL(min.)
2-1+ t
3-2+ t
by the clock cycle time.
DPL(min.)
DPL(min.)
PRE
Q1
Q2
” must be satis-
DPL
(t
Q3
RAS
is satisfied)
Hi - Z
Document : 1G5-0153Rev.1Page 17
Page 18
Preliminary VG36648041CT
VIS
8.Auto Precharge
During a read or write command cycle, A10 controls whether auto precharge is selected. If A10 is high
in the read or write command (Read with Auto precharge command or Write with Auto precharge command), auto precharge is selected and begins automatically after the burst access.
In the write cycle, t
being precharged.
When using auto precharge in the read cycle, knowing when the precharge starts is important because
the next activate command to the bank being precharged cannot be executed until the precharge cycle
ends. Once auto precharge has started, an activate command to the bank can be asserted after tRP has
been satisfied.
A Read or Write command without auto - precharge can be terminated in the midst of a burst operation.
However, a Read or Write command with auto - precharge can not be interrupted by the same bank commands before the entire burst operation is completed. Therefore use of the same bank Read, Write, Precharge or Burst Stop command is prohibited during a read or write cycle with auto - precharge. It should be
noted that the device will not respond to the Auto - Precharge command if the device is programmed for full
page burst read or write cycles.
The timing when the auto precharge cycle begins depends both on both the CAS Iatency programmed
into the mode register and whether the cycle is read or write.
CMOS Synchronous Dynamic RAM
DAL(min.)
must be satisfied before asserting the next activate command to the bank
8.1 Read with Auto Precharge
During a READA cycle, the auto precharge begins one clock earlier (CL = 2) or two clocks earlier
(CL = 3) than the last word output.
READ with AUTO PRECHARGE
T0T1
CLK
Command
CAS latency = 2
DQ
Command
READA B
READA B
QB0
T3
QB1
T2
No New Command to Bank B
No New Command to Bank B
T4
Auto precharge starts
Auto precharge starts
T5
QB3QB2
T6
Burst lengh = 4
T7
Hi - Z
T8
CAS latency = 3
DQ
Remark READA means READ with AUTO PRECHARGE
Document : 1G5-0153Rev.1Page 18
QB0
QB1
QB2
QB3
Hi - Z
Page 19
Preliminary VG36648041CT
VIS
8.2 Write with Auto Precharge
During a write cycle, the auto precharge starts at the timing that is equal to the value of t
after the last data word input to the device.
WRITE with AUTO PRECHRGE
CLK
Command
CAS latency = 2
CMOS Synchronous Dynamic RAM
T0T1
WRITA B
T2
No New Command to Bank B
T3
T4T5
AUTO PRECHARGE starts
t
DPL
T6
DPL(min.)
Burst lengh = 4
T7
T8
DQ
Command
CAS latency = 3
DQ
Remark WRITA means WRITE with AUTO Precharge
DB0
WRITA B
DB0
DB1
No New Command to Bank B
DB1
DB2
DB3DB2
AUTO PRECHARGE starts
t
DPL
DB3
In summary, the auto precharge cycle begins relative to a reference clock that indicates the last data
word is valid.
In the table below, minus means clocks before the reference; plus means clocks after the reference.
CAS latencyReadWrite
2-1+ t
3-2+ t
DPL(min.)
DPL(min.)
Hi - Z_
Hi - Z
Document : 1G5-0153Rev.1Page 19
Page 20
Preliminary VG36648041CT
VIS
8.3 Multibank Operation- Read with Auto Precharge
During a READA cycle interrupted by a Read, Write command of another banks, the auto-pre-
charge scheduled time would not be changed.
Multibank Operation
CLK
Command
CAS latency=2
CMOS Synchronous Dynamic RAM
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14
READA ARead B
Burst lengh=8
Auto precharge bank A starts
DQ
Command
CAS latency=3
DQ
READA A
QA0QA1
Read B
QA0
QB0
QA1
QB0
Similiar top.21
QB2 QB3 QB4 QB5 QB6 QB7 QB1
Auto precharge bank A starts
QB2 QB3 QB4 QB5 QB6 QB7 QB1
Hi-Z
Hi-Z
Document : 1G5-0153Rev.1Page 20
Page 21
Preliminary VG36648041CT
VIS
8.4 Multibank Operation- Write with Auto Precharge
During a WRITEA cycle interrupted by a Read, Write command of another banks, the auto-pre-
charge scheduled time would not be changed.
Multibank Operation
CLK
Command
CAS latency=2
CMOS Synchronous Dynamic RAM
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10
WRITA A
Read B
Burst lengh=8
Auto precharge bank A starts
DQ
Command
CAS latency=3
DQ
Multibank Operation
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11
CLK
Command
CAS latency=2
DQ
DA1
DA1
DA1
DB0
DA0
WRITA A
DA0
WRITA AWrite B
DA0
Read B
DB1
DB2
DB0
DB3
DB1
DB0
DB4
DB2DB3
DB1
Auto precharge bank A starts
DB6
DB5
DB4
Auto precharge bank A starts
DB2
DB3
DB7
DB5
DB4
Burst lengh=8
Hi-Z
Hi-Z
Hi-Z
Auto precharge bank A starts
Command
CAS latency=3
DQ
WRITA AWrite B
DA0
DA1
DB0
DB1
DB2
DB3
DB4
DB5DB6DB7
Document : 1G5-0153Rev.1Page 21
Hi-Z
Page 22
Preliminary VG36648041CT
VIS
9.Read/Write Command Interval
9.1 Read to Read command interval
During a read cycle when a new read command is asserted, it will be effective after the CAS latency,
even if the previous read operation has not completed. READ will be interrupted by another READ.
Each read command can be asserted in every clock without any restriction.
READ to READ Command Interval
CLK
CMOS Synchronous Dynamic RAM
T0T1
T2
T3
T4T5
Burst lengh=4, CAS latency=2
T6
T7
T8
1 cycle
Read B
QA0
QB0
QB2QB1
Command
DQ
Read A
9.2 Write to Write Command Interval
During a write cycle, when a new Write command is asserted, the previous burst will terminated and the
new burst will begin with a new write command. WRITE will be interrupted by another WRITE.
Each write command can be asserted in every clock without any restriction.
WRITE to WRITE Command Interval
T0T1
T2
T3
T4T5
QB3
Burst lengh=4, CAS latency=2
T6
Hi-Z_
T7
T8
CLK
1 cycle
Write B
QB0
QB2QB1
QB3
Hi-Z_
Command
DQ
Write A
QA0
Document : 1G5-0153Rev.1Page 22
Page 23
Preliminary VG36648041CT
VIS
9.3 Write to Read Command Interval
The write command to read command interval is also a minimum of 1 cycle. Only the write data before
the read command will be written. The data bus must be Hi-Z at least one cycle prior to the first D
WRITE to READ Command Interval
CLK
CMOS Synchronous Dynamic RAM
T0T1
1 cycle
T2
T3
T4T5
.
OUT
Burst lengh=4
T6
T7
T8
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
WRITE A
DA0
Write A
DA0
Read B
Read B
9.4 Read to Write Command Interval
During a read cycle, READ can be interrupted by WRITE.
DQM must be in High at least 3 clocks prior to the write command. There is a restriction to avoid a data
conflict. The data bus must be Hi-Z using DQM before Write.
Hi-Z
Hi-Z
QB0
QB1
QB0
QB1
QB3QB2
QB2
QB3
Document : 1G5-0153Rev.1Page 23
Page 24
Preliminary VG36648041CT
VIS
READ to WRITE Command Interval
CMOS Synchronous Dynamic RAM
CLK
Command
DQM
DQ
CLK
Command
T0T1
Hi-Z
T0T1
Read
Read
1 cycle
T2
D0
Write
CAS latency=2
T7
T8
T8
T9
D1
T3
T4T5
T4T5
D3D2
T6
T2
T3
T6
Burst length=8, CAS latency=2
T7
Write
DQM
DQ
CLK
Command
DQM
DQ
Q0
T0T1
Read
The minimum command interval = (4+1) cycles
T2
Q2
Q2
Hi-Z is
necessary
T4T5
Hi-Z is
necessary
example: Burst length=4, CAS latency=3
Write
D0
Q1D0
T3
D1
T6
T7
D1
D2
T8
D2
Document : 1G5-0153Rev.1Page 24
Page 25
Preliminary VG36648041CT
VIS
10.BURST Termination
There are two methods to terminate a burst operation other than using a read or a write command.
One is the burst stop command and the other is the precharge command.
10.1 BURST Stop Command
During a read burst. when the burst stop command is asserted, the burst read data are terminated and the data bus goes to high-impedance after the CAS latency from the burst stop command.
During a write burst, when the burst stop command is asserted, any data provided at that cycle
will not be written. The burst write is effectively terminated and no further data can be written until a
new write command is asserted.
Burst Termination
CMOS Synchronous Dynamic RAM
CLK
Command
CAS latency=2
DQ
CAS latency=3
DQ
Remark BST: Burst stop command
T0T1
Read
T0T1
T2
T2
Q0
T3
T3
BST
Q1
Q0
T4T5
Q2
Q1
T4T5
Burst lengh=X, CAS Intency=2,3
T6
Hi-Z
Q2
Burst lengh=X, CAS latency=2,3
T6
T7
Hi-Z
T7
CLK
Command
CAS latency=2,3
DQ
Write
Q0
Q0
Q1
Q2
BST
Hi-Z_
Remark BST: Burst command
Document : 1G5-0153Rev.1Page 25
Page 26
Preliminary VG36648041CT
VIS
10.2 PRECHARGE TERMINATION
10.2.1 PRECHARGE TERMINATION in READ Cycle
precharge command is asserted, the burst read operation is terminated and precharge starts.
mand.
mand.
Precharge Termination in READ Cycle
CMOS Synchronous Dynamic RAM
During READ cycle, the burst read operation is terminated by a precharge command. When the
The same bank can be activated again after tRP from the precharge command.
When CAS latency is 2,the read data will remain valid until one clock after the precharge com-
When CAS latency is 3, the read data will remain valid until two clocks after the precharge com-
CLK
Command
CAS latency=2
DQ
command
CAS latency=3
DQ
T0T1
Read
Read
T2
T3
Q0Q3
T4T5
PREACT
Q1
Q0Q3
Q2
PREACT
Q1
T6
t
RP
t
RP
Q2
T7
Hi-Z
Burst lengh= X
T8
Hi-Z
Document : 1G5-0153Rev.1Page 26
Page 27
Preliminary VG36648041CT
VIS
10.2.2 Precharge Termination in WRITE Cycle
PRECHARGE TERMINATION in WRITE Cycle
CMOS Synchronous Dynamic RAM
During WRITE cycle, the burst write operation is terminated by a precharge command. When the precharge command is asserted, the burst write operation is terminated and precharge starts.
The same bank can be activated again after tRP from the precharge command. The
DQM must be high to mask invalid data in.
During WRITE cycle, the write data written prior to the precharge command will be
correctly stored. However, invalid data may be written at the same clock as the precharge command. To prevent this from happening, DQM must be high at the same
clock as the precharge command. This will mask the invalid data.
The burst counter wraps
from the highest order
page address back to zero
during this time interval
QAa-2
QAa-1
Read
Command
Bank B
(Bank D)
QAa+1
QAa
Full page burst operation
does not teminate when
the burst length is satisfied;
the burst counter increments
and continues bursting
beginning with the starting
address
The burst counter wraps
from the highest order
page address back to zero
during this time interval
Write
Command
Bank B
(Bank D)
Full page burst operation
does not terminate when
the burst length is satisfied;
the burst counter increments
and continues bursting
beginning with the starting
address
The burst counter wraps
from the highest order
page address back to zero
during this time interval
Write
Command
Bank B
(Bank D)
Full page burst operation
does not terminate when
the burst length is satisfied;
the burst counter increments
and continues bursting
beginning with the starting
address
2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION.
MOLD PROTRUSION SHALL NOT EXCEED 0.15mm(0.006") PER SIDE.
DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION.
INTERLEAD PROTRUSION SHALL NOT EXCEED 0.25mm(0.01") PER SIDE.
3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSIONS/INTRUSION.
ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD TO
BE WIDER THAN THE MAX b DIMENSION BY MORE THAN 0.13mm.
DAMBAR INTRUSION SHALL NOT CAUSE THE LEAD TO BE NARROWER
THAN THE MIN b DIMENSION BY MORE THAN 0.07mm.
MIN.
0.002
0.037
0.012
0.012
0.005
0.005
0.870
0.0315 BASIC
0.455
0.395
0.016
0.005
INCHES
NOM.
------
---
0.039
---
---
---
---
0.875
0.028 REF.
0.463
0.400
0.020
---
------------0.120.005
MAX.
0.047
0.006
0.041
0.018
0.016
0.008
0.006
0.880
0.471
0.405
0.024
0.010
RAD R1
B
B
L
SECTION B-B
c
c1
RAD R
0¢X~8
c
¢X
0.100(0.004")
28
27
e
A2
A1
E1
A
SEATING PLANE
DETAIL A
b
b1
BASE METAL
WITH PLATING
DETAIL A
E
54
1
ZD
b
D
Document : 1G5-0153Rev.1Page 70
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