The VG3617161ET is CMOS Synchronous Dynamic RAM organized as 524,288-word X 16-bit X 2-bank.
It is fabricated with an advanced submicron CMOS technology and designed to operate from a single 3.3V
power supply. This SDRAM is delicately designed with performance concern for current high-speed application. Programmable CAS Latency and Burst Length make it possible to be used in widely various domains. It
is packaged by using JEDEC standard pinouts and standard plastic 50-pin TSOP II.
Features
• Single 3.3V +/- 0.3V power supply
• Clock frequency:166MHz, 143MHz, 125MHz
• Fully synchronous with all signals referenced to a positive clock edge
Voltage on any pin relative to VssVIN,V
Supply voltage relative to VssVDD,V
Short circuit output currentI
Power dissipationP
Operating temperatureT
Storage temperatureT
Recommended DC Operating Conditions (TA=0~70°C)
ParameterSymbolMinTypMaxUnitNote
Supply VoltageV
Input High Voltage, all inputsV
Input Low Voltage, all inputsV
DD
IH
IL
OUT
DDQ
OUT
D
OPT
STG
-1.0 to +4.6V
-1.0 to +4.6V
50mA
1.0W
0 to + 70°C
-55 to + 125°C
3.03.33.6V
2.0 –VDD+0.3VI
-0.3 –0.8VII
Note I.Overshoot limit : V
II .Undershoot limit : VIL=V
DC Electrical Characteristics
ParameterDescriptionMin.Max.UnitNote
I
IL
I
OL
V
OH
V
OL
(All other pins not under test = 0V)
IH(MAX.)=VDDQ
SSQ
INVDD
Output disable, ()
LVTTL Output ”H” Level Voltage(l
LVTTL Output ”L” Level Voltage(l
+2.0V with a pulse width < 3ns
-2.0V with a pulse width< 3ns and -1.5V with a pulse width< 5ns
Address changed once during t
Burst length = 1 (One bank active)
Precharge Standby Current in non power-down
mode
Input signals are changed once during 2 clocks
Precharge Standby Current in non power-down
mode
Input signals are stable
Precharge Standby Current in power-down mode
, outputs open
,
CSV
(min)
, t
(min)
(max)
CK
, t
CK
IH
IL
≥
(min), tCK =tCK
CLKV
= ,
= tCK(min)
CK(min)
IL
.
(min)
(max)
I
DD1
I
DD2N
I
DD2NS
I
DD2P
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
-6-7-8Unit Note
MinMaxMinMaxMinMax
11510595
4040403
353535
mA
222
3,4
Precharge Standby Current in power-down mode
, t
= ,
IL
(max)
CK
CLKV
IL
(max)
I
Active Standby Current in non power-down mode
(min)
, CS V
IH(min)
, t
= t
CK
CK(min)
Input signals are changed once during 2 clocks
Active Standby Current in non power-down mode
, t
= ,
(min)
CK
CLKV
IL
(max)
I
Input signals are stable
Active Standby Current in power-down mode
, t
(max)
CK = tCK(min)
Active Standby Current in power-down mode
(max)
, t
CK =
,
CLKV
IL
(max)
I
Operating Current
(Page burst, and all banks activated)
t
CCD
= t
CCD(min)
, outputs open, gapless data
Refresh Current
(t
REF
= 64ms)
(min)
Self Refresh CurrentI
DD2PS
I
DD3N
DD3NS
I
DD3P
DD3PS
I
DD4
I
DD5
DD6
222
5050503
404040
353535
353535
1501401304,5
10090803
111
Document:1G5-0189Rev.1Page 5
Page 6
VIS
0.3V
±
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
A.C Characteristics:
(6)(7)(8)(10)
(VDD=3.3V , VSS=0V, Ta=0 to 70°C)
SymbolA.C. Parameter-6-7-8
Unit
Note
ns
9
9
CLK
CLK
ns
CLK
CLK
CLK
ns
CLK
ms
CLK
CLK
CLK
t
CH
t
CL
t
T
t
CK3
t
CK2
t
IS
t
IH
t
DS
t
DH
t
LZ
t
HZ3
t
HZ2
t
AC3
t
AC2
t
OH
t
RCD
t
RRD
t
CCD
t
DPL
t
RAS
t
RP
t
DAL3
t
DAL2
t
RC
t
RSC
t
REF
t
SRX
t
BDL
t
PDE
MinMaxMinMaxMinMax
Clock high time2.52.53
Clock low time2.52.53
Transition time (Rise and Fall)0.5100.5100.510
Clock cycle timeCL* = 3678
CL* = 281012
Address/Control Input setup time1.51.752
Address/Control Input hold time111
Data Input setup time1.51.752
Data Input hold time111
Data output low impedance111
Data output high imped-
ance
Access time from CLK
(positive edge)
Data output hold time2.32.52.5
RAS to CAS delay182020
Row activate to row activate delay121416
CAS to CAS Delay time111
Last data in to precharge222
Row activate to precharge time 36100,00042100,00048100,000
Precharge to refresh/row activate
command
Data-in to ACT (REF) Command (CL = 3)555
Data-in to ACT (REF) Command (CL = 2)555
Row cycle time546372
Mode Register Set Cycle time222
Refresh time646464
Minimum CKE ”High”for Self-Refresh exit111
Last data in to burst STOP command111
Power Down Exit set-up time111
CL* = 35.55.56
CL* = 2677
CL* = 35.566
CL* = 2677
333
Note:
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
2. All voltages are referenced to VSS.
3. These parameters depend on the cycle rate and these values are measured by the cycle rate under the minimum value of tCK
and tRC.
4. These parameters depend on the output loading. Specified values are obtained with the outputs open.
5. Assume minimum column address update cycle t
CCD
(min).
Document:1G5-0189Rev.1Page 6
Page 7
VG3617161ET
VIS
6. Power-up sequence is described in Note 10.
7. A.C. Test Conditions
Reference Level of Output Signals1.4V
Output LoadReference to the Under Output Load (B)
Input Signal Levels2.4V / 0.4V
Transition Time (Rise and Fall) of Input Signals1ns
Reference Level of Input Signals1.4V
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
3.3V
1.2K
Ω
ZO=50
Output
30pF
LVTTL D.C. Test Load (A)
8. Transition times are measured between VIH and VIL. Transition (rise and fall) of input signals are fixed slope (1 ns).
9. tHZ defines the time at which the outputs achieve the open circuit condition and are not reference levels.
10. Power up sequence
Power up must be performed in the following sequence.
1) Power must be applied to VDD and V
CKE = ”H”, DQM = ”H”. The CLK signals must be started at the same time.
2) After power-up, a pause of 200u secouds minimum is required. Then, it is recommended that DQM is held
“high” (VDD levels) to ensure DQ output to be in the high impedance.
870
Ω
DDQ
Output
LVTTL A.C. Test Load (B)
(simultaneously) when all input signals are held “NOP” state and
Ω
1.4V
50
30pF
Ω
3) Both banks must be precharged.
4) Mode Register Set command must be asserted to initialize the Mode Register.
5) A minimum of 8 Auto-Refresh dummy cycles must be required to stabilize the internal circuitry of the device. Sequence of
4 and 5 may be changed.
Document:1G5-0189Rev.1Page 7
Page 8
VG3617161ET
VIS
Basic Features and Function description
1.Simplified State Diagram
Mode
Register
Set
MRS
IDLE
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Self
Refresh
y
r
t
n
e
F
L
t
E
S
ACT
i
x
e
F
L
E
S
C
K
REF
C
K
E
E
AUTO
Refresh
Power
Down
WRITE
SUSPEND
WRITE A
SUSPEND
Write
CKE
CKE
Write with
Auto Precharge
CKE
CKE
WRITE A
WRITE
B
S
T
READ
READ A
Active
Power
Down
Read
CKE
CKE
Read with
Auto Precharge
CKE
CKE
READ
SUSPEND
READ A
SUSPEND
ROW
ACTIVE
T
S
B
rite
W
A
u
t
P
R
E
(
P
r
h
t
i
w
h
e
t
d
i
r
e
r
W
p
o
t
u
A
Read
R
e
a
d
w
o
i
P
t
h
r
e
c
h
a
r
g
e
e
c
h
a
r
g
e
t
e
r
m
i
n
a
t
i
o
n
)
A
e
g
r
a
PRE
Write
A
CKE
CKE
Re
R
u
e
t
o
P
r
e
c
a
e
R
o
t
u
(
E
R
P
ad
a
d
w
i
t
h
h
a
r
g
e
h
e
t
i
g
w
r
a
d
h
c
e
r
P
)
n
o
i
t
a
n
i
m
r
e
t
e
g
r
a
h
c
e
r
P
POWER
ON
Precharge
Precharge
Automatic sequence
Manual input
Note: After the AUTO refresh operation, precharge operation is
performed automatically and enter the IDLE state
Document:1G5-0189Rev.1Page 8
Page 9
VG3617161ET
VIS
2.Truth Table
2.1 Command Truth Table
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CKE
FUNCTIONSymbol
n-1n
CSRASCASWEA11A10
Device deselectDESLHXHXXXXXX
No operationNOPHXLHHHXXX
Mode register setMRSHXLLLLLLV
Bank activate ACTHXLLHH
ReadREADHXLHLH
Read with auto prechargeREADAHXLHLH
WriteWRITHXLHLL
Write with auto prechargeWRITAHXLHLL
Precharge select bankPREHXLLHL
BS
BS
BS
BS
BS
BS
(2)
RowRow
(2)
(2)
(2)
(2)
(2)
L
H
L
H
LX
Precharge all banksPALLHXLLHLXHX
Burst stopBSTHXLHHLXXX
Note: (1) Column address: A0~A7
(2) BS: Bank Select. L means Bank A and H means Bank B.
LHHXXXX
IdlePower down entryHLXXXXX
Power downPower down exitLHXXXXX
H : High level, L : Low level, X : high or Low level(Don’t care), V : Valid Data input
Document:1G5-0189Rev.1Page 9
Page 10
VG3617161ET
endRow
→
endRow
→
stopRow
→
endwrite
→
endWrite
→
stopRow
→
1,048,576 x 16 - Bit
VIS
2.4 Operative Command Table
Current stateCSRASCASWEAddressCommandActionNotes
IdleHXXXXDESLNop or Power down2
LHHXXNOP or BSTNop or Power down2
LHLHBA,CA,A10READ/READAILLEGAL3
LHLLBA,CA,A10WRIT/WRITAILLEGAL3
LLHHBR,RAACTRow active
LLHLBA,A10PRE/PALLNop
LLLHXREF/SELFRefresh or Self refresh4
LLLLOp-CodeMPSMode register access
LXXILLEGAL2
XXXILLEGAL2
XXXMaintain S.R.
XXXIdle after t
HXXIdle after t
RC
RC
LXXILLEGAL
XXXILLEGAL
XXXBegin clock suspend next cycle5
HXXBegin clock suspend next cycle5
LXXILLEGAL
XXXILLEGAL
XXXExit clock suspend next cycle2
XXXMaintain clock suspend
XXINVALID, CLK(n-1) would exit P.D.
XXX
EXIT
2
XXXMaintain power down mode
XXRefer to operations in Operative
Command Table
XXRefer to operations in Operative
Command Table
HXRefer to operation in Operative
Command Table
LHXRefresh
LLOp-
Code
Refer to operations in Operative
Command Table
XXRefer to operations in Operative
Command Table
XXRefer to operations in Operative
Command Table
HXRefer to operations in Operative
Command Table
LHXSelf refresh3
LLOp-
Code
Refer to operations in Operative
Command Table
XXXPower down3
XXXRefer to operations in Operative
Command Table
XXXBegin clock suspend next cycle4
XXXExit clock suspend next cycle
XXXMaintain clock suspend
Note 1. H : Hight level, L : low level, X : High or low level(Don't care).
2. CKE Low to High transition will re-enable CLK and other inputs asynchronously. A minimum setup time must be satisfied
before any command other than EXIT.
3. Power down and Self refresh can be entered only from the both banks idle state.
4. Must be legal command as defined in Operative Command Table.
5 .IIIegal if t
Document:1G5-0189Rev.1Page 13
is not satisfied.
SRX
Page 14
VG3617161ET
1,048,576 x 16 - Bit
VIS
3.Initiallization
The synchronous DRAM is initialized in the power on sequence. Once power has been applied, a
200us minimum delay is needed in which stable power and input signals are maintained. During this delay,
CKE and DQM recommend to be held high.
After the 200us delay, both banks must be precharged using the precharge command. Once precharge
is completed and the minimum tRP is satisfied, the mode register can be programmed.
Minimum 8 CBR refresh cycles must be performed before or after the mode register set command.
4.Programming the Mode Register
The mode register is programmed by the mode register set command using address bits A11 through
A0 as data inputs. The register retains data until it is reprogrammed or until the device loses power.
The mode register has four fields;
Options : A11 through A7
CAS latency : A6 through A4
Wrap type : A3
Burst length : A2 through A0
Following mode register programming, no command can be asserted befor at least two clock cycles
have elapsed.
CMOS Synchronous Dynamic RAM
CAS Latency
CAS latency is the most critical parameter to be set. It tells the device how many clocks must elapse
before the data will be available. The SDRAM is capable of reconfiguring its internal architecture based
on the value of CAS latency.
The value is determined by the frequency of the clock and the speed grade of the device. The value
can be programmed as 2 or 3.
Burst Length
Burst Length is the number of words that will be output or input in read or write cycle. After a read burst
is completed, the output bus will become high impedance.
The burst length is programmable as 1,2,4,8 or full page.
Wrap Type (Burst Sequence)
The wrap type specifies the order in which the burst data will be addressed. The order is programmable
as either “Sequential” or “Interleave”. The method chosen will depend on the type of CPU in the system.
Some microprocessor cache systems are optimized for sequential addressing and others for interleaved addressing. Both sequences support bursts of 1,2,4 and 8. Only the sequential burst. supports the
full-page length.
Full page burst is an extension of the above tables of sequential addressing, with the length being 256
words.
Document:1G5-0189Rev.1Page 16
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VG3617161ET
VIS
6.Address Bits of Bank-Select and Precharge
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
A0
Row
(Activate command)
A0
Row
(Precharge)
A0
Col.
(CAS strobes)
A2A1
A2A1
A2A1
A3
A3
A3
A4
A4
A4
A5
A5
A5
A6
A6
A6
A7
A7
A7
A8
A8
A8
A9
A9
A9
A10
A10
A10
A11
A11
A11
0
Select Bank A ”Activate” command
1
Select Bank B ”Activate” command
Result
A11
A10
0
0
0
1
0
1
Precharge Bank A
1
Precharge Bank B
x
Precharge All Banks
x:Don’t care
Disable Auto-Precharge (End of Burst)
Enable Auto-Precharge (End of Burst)
Enable Read/Write commands for Bank A
0
Enable Read/Write commands for Bank B
1
Document:1G5-0189Rev.1Page 17
Page 18
VIS
7.PRECHARGE
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
The PRECHARGE command can be asserted anytime after t
RAS(min)
is satisfied.
Soon after the PRECHARGE command is asserted, PRECHARGE operation is performed. The synchronous DRAM
enters the idle state after t
is satisfied. The parameter tRP is the time required to perform the PRECHARGE.
RP(min)
The earliest timing in a READ cycle that a PRECHARGE command can be asserted without losing any data in the
burst is as followed.
PRECHARGE
CLK
Command
CAS latency=2
DQ
Command
CAS latency=3
T0T1
Read
Read
T2
T3
Q0Q3Q2
T4T5
PRE
Q1
PRE
T6
Hi-Z
Burst lengh=4
T7
DQ
CAS latency=
2: One clock earlier than the last output data.
3: Two clocks earlier than the last output data.
In order to write all data to the memory cell correctly, the asynchronous parameter”t
The t
DPL(MIN.)
cycle. The minimum number of clocks are calculated by dividing t
specification defines the earliest time that a PRECHARGE command can be asserted after a WRITE
DPL(min.)
Q0
Q1
” must be satisfied.
DPL
by the clock cycle time.
Q2
In summary, the PRECHARGE command can be asserted relative to the reference clock of the last valid
data. In the following table, minus means clocks before the reference, plus means time after the reference.
CAS latencyREADWRITE
2-1+t
DPL(min.)
Q3
(t
RAS
Hi-Z
is satisfied)
3-2+t
DPL(min)
Document:1G5-0189Rev.1Page 18
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VG3617161ET
1,048,576 x 16 - Bit
VIS
8.AUTO PRECHARGE
During a READ or WRITE command cycle, A10 controls whether AUTO PRECHARGE is selected. If A10 is
high in the READ or WRITE command (READ with AUTO PRECHARGE command or WRITE with AUTO PRECHARGE command), AUTO PRECHARGE is selected and precharging begins automatically after the burst
access.
In the WRITE cycle, t
DAL(min.)
charged.
When using AUTO PRECHARGE in the READ cycle, knowing when the PRECHARGE starts is important
because the t
be asserted after t
must be satisfied. Once AUTO PRECHARGE has started, an active command to the bank can
RAS
has been satisfied.
RP(min.)
The timing at which the AUTO PRECHARGE cycle begins depends both on the CAS Iatency programmed
into the mode register and on whether the cycle is READ or WRITE.
8.1 READ with AUTO PRECHARGE
During a READA cycle, the AUTO PRECHARGE begins one clock earlier(CAS Iatency of 2) or two
clocks earlier(CAS Iatency of 3) than the last data word output.
must be satisfied to assert the next active command to the bank being pre-
CMOS Synchronous Dynamic RAM
READ with AUTO PRECHARGE
CLK
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
T0T1
READA B
READA B
Burst lengh=4
QB0
T3
QB1
QB0
QB0QB1
T4T5
Auto precharge starts
Auto precharge starts
T2
T6
QB3QB2
QB2QB1
QB3
T7
Hi-Z
Hi-Z
T8
Remark: READA means READ with AUTO PRECHARGE
Document:1G5-0189Rev.1Page 19
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VG3617161ET
VIS
8.2 WRITE with AUTO PRECHARGE
During a WRITA cycle, the AUTO PRECHARGE starts at t
the device
WRITE with AUTO PRECHRGE
T0T1
CLK
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
DPL(min.)
T2
T3
after the last data word input to
T4T5
T6
Burst lengh=4
T7
T8
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
Remark WRITA means WRITE with AUTO PRECHARGE
WRITA B
DB0
WRITA B
DB0
DB1
DB1
AUTO PRECHARGE starts
t
DPL
DB3DB2
AUTO PRECHARGE starts
t
DPL
DB3DB2
Hi-Z_
Hi-Z_
In summary, the auto precharge cycle begins relative to a reference clock that indicates the last data word is
valid.
In the table below, minus means clocks before the reference; plus means clocks after the reference.
CAS latencyREADWRITE
2-1+t
3-2+t
DPL(min.)
DPL(min)
Document:1G5-0189Rev.1Page 20
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VG3617161ET
VIS
9.READ/WRITE Command Interval
9.1 READ to READ command interval
When a new READ command is asserted during a READ cycle, it will be effective after the CAS latency,
even if the previous READ operation has not completed. READ will be interrupted by another READ.
A READ command can be asserted in every clock without restriction.
READ to READ Command Interval
CLK
T0T1
T2
T3
CMOS Synchronous Dynamic RAM
T4T5
1,048,576 x 16 - Bit
Burst lengh=4, CAS latency=2
T6
T7
T8
1 cycle
Read B
QA0
QB0
QB2QB1
Command
DQ
Read A
9.2 WRITE to WRITE Command Interval
When a new WRITE command is asserted during a WRITE cycle, the previous burst will be terminated
and the new burst will begin with the new WRITE command. WRITE will be interrupted by another WRITE.
A WRITE command can be asserted in every clock without restriction.
WRITE to WRITE Command Interval
Burst lengh=4, CAS latency=2
CLK
T0T1
T2
T3
T4T5
T6
QB3
Hi-Z_
T7
T8
1 cycle
Write B
QB0
QB2QB1
QB3
Hi-Z_
Command
DQ
Write A
QA0
Document:1G5-0189Rev.1Page 21
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VG3617161ET
VIS
9.3 WRITE to READ Command Interval
The WRITE command to READ command interval is a minimum of 1 cycle. Only the WRITE data preceding the READ command will be written. The data bus must be in high-impedance at least one cycle prior
to the first D
WRITE to READ Command Interval
CLK
OUT
.
T0T1
1 cycle
T2
T3
CMOS Synchronous Dynamic RAM
T4T5
T6
1,048,576 x 16 - Bit
Burst lengh=4
T7
T8
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
WRITE A
DA0
Write A
DA0
Read B
Read B
Hi-Z
Hi-Z
QB0
QB1
QB0
QB1
9.4 READ to WRITE Command Interval
During READ cycle, READ can be interrupted by WRITE. The data bus must be in high-impedance
using DQM before the WRITE command. DQM must be high at least 3 clocks prior to the WRITE command.
This restriction is necessary to avoid a data bus conflict.
QB3QB2
QB2
QB3
Document:1G5-0189Rev.1Page 22
Page 23
VG3617161ET
VIS
READ to WRITE Command Interval
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
Command
DQM
DQ
CLK
Command
T0T1
Hi-Z
T0T1
Read
Read
1 cycle
T2
D0
Write
CAS latency=2
T7
T8
T8
T9
D1
T3
T4T5
T4T5
D3D2
T6
T2
T3
T6
Burst length=8, CAS latency=2
T7
Write
DQM
DQ
CLK
Command
DQM
DQ
Q0
T0T1
Read
The minimum command interval = (4+1) cycles
T2
Q1
Q2
Hi-Z is
necessary
T3
Q2
T4T5
Hi-Z is
necessary
D0
example: Burst length=4, CAS latency=3
T6
Write
D0
D1
T7
D1
D2
T8
D2
Document:1G5-0189Rev.1Page 23
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VG3617161ET
VIS
10.BURST TERMINATION
There are two methods to terminate a BURST operation other than using a READ or a WRITE command.
One is the BURST STOP command and the other is the PRECHARGE command.
10.1 BURST STOP Command
During a READ BURST. when the BURST STOP command is asserted, the BURST READ outputs
are terminated and the data bus goes to high-impedance after the CAS latency from the BURST STOP
command.
During a WRITE BURST. when the BURST STOP command is asserted, any data provided at that
cycle will not be written. The BURST WRITE is effectively terminated and no further data can be written
until a new WRITE command is asserted.
Burst Termination
CLK
T0T1
T2
T3
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst lengh=X, CAS Intency=2,3
T4T5
T6
T7
Command
CAS latency=1
DQ
CAS latency=2
DQ
CAS latency=3
DQ
Remark BST: Burst stop command
CLK
Read
T0T1
Q0
T2
Q0
Q1
T3
BST
Q2
Q1
Q0
Hi-Z
Q2
Q1
T4T5
Hi-Z
Q2
Burst lengh=X, CAS latency=1,2,3
T6
Hi-Z
T7
Command
CAS latency=1,2,3
DQ
Write
Q0
Q0
Q1
Q2
BST
Hi-Z_
Remark BST: Burst stop command
Document:1G5-0189Rev.1Page 24
Page 25
VG3617161ET
VIS
10.2 PRECHARGE TERMINATION
10.2.1 PRECHARGE TERMINATION in READ Cycle
During a READ cycle, the BURST READ operation can be terminated by a PRECHARGE
command. When the PRECHARGE command is asserted, the BURST READ operation is terminated and PRECHARGE starts.
Read data will remain valid until zero clock(CAS latency of 1), one clock(CAS latency of 2)or
two clocks(CAS latency of 3) after the PRECHARGE command and the same bank can be activated again after t
PRECHARGE TERMINATION in READ Cycle
from the PRECHARGE command.
RP(min)
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
Command
CAS latency=1
DQ
Command
CAS latency=2
DQ
command
CAS latency=3
DQ
T0T1
Read
Read
ReadPRE
T2
Q0Q3
T3
Q1
Q0Q3
Q2
Q1
Q0Q3
T4T5
PRE
PREACT
Q2
Q1
ACT
t
RP
t
RP
t
RP
Q2
Hi-Z
T6
t
RP
T7
Hi-Z
Burst lengh= X
T8
ACT
Hi-Z
Document:1G5-0189Rev.1Page 25
Page 26
VG3617161ET
VIS
10.2.2 PRECHARGE TERMINATION in WRITE Cycle
During a WRITE cycle, the BURST WRITE operation can be terminated by a PRECHARGE
command. when the PRECHARGE command is asserted, the BURST WRITE operation in immediately terminated and PRECHARGE starts.
The same bank can be activated again after tRP(min.) from the PRECHARGE command. The
DQM must be high to mask invalid data in.
When CAS latency is 1, 2 or 3, the data written prior to the PRECHARGE command will be
correctly stored. However, invalid data may be written at the same clock as the PRECHARGE
command. To prevent this from happening, DQM must be high at the same clock as the PRECHARGE command. This will mask the invalid data.
The burst counter wraps
from the highest order
page address back to zero
during this time interval
QAa-2
QAa-1
CBa
QAa
Read
Command
Bank B
QAa+1
QBa QBa+1
Full page burst operation does not
terminate when the burst length is
satisfied; the burst counter
increases and continues bursting
beginning with the starting address
The burst counter wraps
from the highest order
page address back to zero
during this time interval
QAa-2
Read
Command
Bank B
CBa
QAa+1
QAa
QAa-1
Full page burst operation
does not teminate when
the burst length is satisfied;
the burst counter increases
and continues bursting
beginning with the starting
address
The burst counter wraps
from the highest order
page address back to zero
during this time interval
DAa-1
DAa
DAa+1
CBa
DBa+1
DBa
Write
Command
Bank B
DBa+2
Full page burst operation
does not terminate when
the burst length is satisfied;
the burst counter increases
and continues bursting
beginning with the starting
address
The burst counter wraps
from the highest order
page address back to zero
during this time interval
DAa-1
DAa
DAa+1
Command
Bank B
CBa
DBa+1
DBa
Write
DBa+2
Full page burst operation
does not terminate when
the burst length is satisfied;
the burst counter increases
and continues bursting
beginning with the starting
address
2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION.
MOLD PROTRUSION SHALL NOT EXCEED 0.15mm(0.006") PER SIDE.
DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION.
INTERLEAD PROTRUSION SHALL NOT EXCEED 0.25mm(0.01") PER SIDE.
3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSIONS/INTRUSION.
ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD TO
BE WIDER THAN THE MAX b DIMENSION BY MORE THAN 0.13mm.
DAMBAR INTRUSION SHALL NOT CAUSE THE LEAD TO BE NARROWER
THAN THE MIN b DIMENSION BY MORE THAN 0.07mm.
MAX.NOM.MIN.
1.20
---
0.15---
1.05
1.00
0.45
---
0.40
---
0.21
---
0.16
---
21.08
20.95
0.875 REF.
0.80 BASIC
11.9611.760.455
10.29
10.16
0.60
0.50
---
---
---0.004---
---
0.002
0.037
0.012
0.012
0.005
0.0045
0.820
0.0344 REF.
0.0315 BASIC
0.395
0.016
INCHES
NOM.
---
---
0.039
---
---
---
---
0.825
0.400
0.020
---
---
MAX.
0.047
0.006
0.041
0.018
0.016
0.008
0.006
0.830
0.4710.463
0.405
0.024
0.0100.0040.25
50
125
ZD
400mil
50-Pin
Plastic TSOPII
26
D
48- eb
0.100(0.004)
E1
A2
A1
DETAIL A
b
b1
A
SEATING PLANE
RAD R1
L
SECTION B-B
c1
BASE METAL
WITH PLATING
DETAIL A
E
RAD R
c
B
B
0°~5°
c
Document:1G5-0189Rev.1Page 69
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