Datasheet VG3617161ET-8, VG3617161ET-7, VG3617161ET-6 Datasheet (VIS)

Page 1
VG3617161ET
1,048,576 x 16 - Bit
VIS
Description
The VG3617161ET is CMOS Synchronous Dynamic RAM organized as 524,288-word X 16-bit X 2-bank. It is fabricated with an advanced submicron CMOS technology and designed to operate from a single 3.3V power supply. This SDRAM is delicately designed with performance concern for current high-speed applica­tion. Programmable CAS Latency and Burst Length make it possible to be used in widely various domains. It is packaged by using JEDEC standard pinouts and standard plastic 50-pin TSOP II.
Features
• Single 3.3V +/- 0.3V power supply
• Clock frequency:166MHz, 143MHz, 125MHz
• Fully synchronous with all signals referenced to a positive clock edge
• Programmable CAS Iatency (2,3)
• Programmable burst length (1,2,4,8,& Full page)
• Programmable wrap sequence (Sequential/Interleave)
• Automatic precharge and controlled precharge
• Auto refresh and self refresh modes
• Dual internal banks controlled by A11(Bank select)
• Simultaneous and independent two bank operation
• I/O level : LVTTL interface
• Random column access in every cycle
• X16 organization
• Byte control by LDQM and UDQM
• 4096 refresh cycles/64ms
• Burst termination by burst stop and precharge command
CMOS Synchronous Dynamic RAM
Document:1G5-0189 Rev.1 Page 1
Page 2
VIS
Pin Configuration
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
50-Pin Plastic TSOP(II)(400 mil)
V
V
V
V LDQM
CAS
(BS)A
V
DD
DQ0
DQ1
SSQ
DQ2
DQ3
DDQ
DQ4 DQ5
SSQ
DQ6 DQ7
DDQ
WE
RAS
CS
A
V
DD
1 2
3 4
5 6 7 8
9 10 11 12 13 14 15 16 17 18
11
10
A
0
A
1
A
2
A
3
19 20 21 22
23 24 25
VG3617161ET
50 49
48 47
46 45 44 43 42
41 40 39 38 37
36 35 34 33 32 31 30 29 28
27 26
V
SS
DQ15 DQ14
V
SSQ DQ13 DQ12
V
DDQ DQ11
DQ10
V
SSQ DQ9 DQ8
V
DDQ
NC UDQM
CLK CKE
NC A9 A8
A7 A6
A5 A4
V
SS
Pin Description
(VG3617161ET)
Pin Name Function Pin Name Function
A0-A11 Address inputs
- Row address A0-A10
LDQM, UDQM
Lower DQ mask enable and Upper DQ mask enable
- Column address A0-A7
A11: Bank select DQ0~DQ15 Data-in/data-out CLK Clock input RAS Row address strobe CKE Clock enable CAS Column address strobe CS Chip select WE Write enable V
V
SS
V
DD
Ground V
Power
DDQ
SSQ
Supply voltage for DQ Ground for DQ
Document:1G5-0189 Rev.1 Page 2
Page 3
VIS
Block Diagram
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK CKE
Address
CS RAS CAS
WE
Clock Generator
Row Address Buffer
Mode
Register
Control Logic
Command Decoder
& Refresh Counter
Column Address Buffer
& Burst Counter
Row Decoder
Data Control Circuit DQ
Bank B
Bank A
Sense Amplifier
Column Decoder & Latch Circuit
DQM
Buffer
Latch Circuit
Input & Output
Document:1G5-0189 Rev.1 Page 3
Page 4
VIS
0VV
≤≤
µ
0VV
≤≤
µ
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Absolute Maximum Ratings
(1)
Parameter Symbol Value Unit
Voltage on any pin relative to Vss VIN,V Supply voltage relative to Vss VDD,V Short circuit output current I Power dissipation P Operating temperature T Storage temperature T
Recommended DC Operating Conditions (TA=0~70°C)
Parameter Symbol Min Typ Max Unit Note
Supply Voltage V Input High Voltage, all inputs V Input Low Voltage, all inputs V
DD
IH
IL
OUT
DDQ
OUT
D
OPT
STG
-1.0 to +4.6 V
-1.0 to +4.6 V 50 mA
1.0 W
0 to + 70 °C
-55 to + 125 °C
3.0 3.3 3.6 V
2.0 – VDD+0.3 V I
-0.3 – 0.8 V II
Note I.Overshoot limit : V II .Undershoot limit : VIL=V
DC Electrical Characteristics
Parameter Description Min. Max. Unit Note
I
IL
I
OL
V
OH
V
OL
(All other pins not under test = 0V)
IH(MAX.)=VDDQ
SSQ
INVDD
Output disable, ()
LVTTL Output ”H” Level Voltage(l
LVTTL Output ”L” Level Voltage(l
+2.0V with a pulse width < 3ns
-2.0V with a pulse width< 3ns and -1.5V with a pulse width< 5ns
Input Leakage Current
Output Leakage Current
OUTVDDQ
= -2mA) 2.4 - V
OUT
= 2mA) - 0.4 V
OUT
-5 5 A
-5 5 A
Capacitance
(TA=25°C,f=1MHZ)
Parameter Symbol Typ Max Unit
Input capacitance(CLK) C
11
2.5 4 pF
Input capacitance(all input pins except data
C
12
2.5 5 pF
pins) Data input/output capacitance C
Document:1G5-0189 Rev.1 Page 4
I/O
4.0 6.5 pF
Page 5
VG3617161ET
±
tRCt
()
≥
CKEV
IH
≥
IH
CKEV
≥
∞
≤
CKEV
≤
CKEV
≤
∞
≤
CKEV
IH
≥
≥
CKEV
IH
≥
∞
≤
CKEV
IL
≤
CKEV
IL
≤
∞
≤
tRCtRC≥
CKE0.2V
≤
VIS
IDD Specifications (VDD = 3.3V 0.3V, TA = 0 ~ 70°C)
Description/test condition Symbol
Operating Current
RCmin
Address changed once during t Burst length = 1 (One bank active)
Precharge Standby Current in non power-down mode
Input signals are changed once during 2 clocks
Precharge Standby Current in non power-down mode
Input signals are stable
Precharge Standby Current in power-down mode
, outputs open
,
CSV
(min)
, t
(min)
(max)
CK
, t
CK
IH
IL
≥
(min), tCK =tCK
CLKV
= ,
= tCK(min)
CK(min)
IL
.
(min)
(max)
I
DD1
I
DD2N
I
DD2NS
I
DD2P
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
-6 -7 -8 Unit Note
Min Max Min Max Min Max
115 105 95
40 40 40 3
35 35 35
mA
2 2 2
3,4
Precharge Standby Current in power-down mode
, t
= ,
IL
(max)
CK
CLKV
IL
(max)
I
Active Standby Current in non power-down mode
(min)
, CS V
IH(min)
, t
= t
CK
CK(min)
Input signals are changed once during 2 clocks
Active Standby Current in non power-down mode
, t
= ,
(min)
CK
CLKV
IL
(max)
I
Input signals are stable
Active Standby Current in power-down mode
, t
(max)
CK = tCK(min)
Active Standby Current in power-down mode
(max)
, t
CK =
,
CLKV
IL
(max)
I
Operating Current
(Page burst, and all banks activated) t
CCD
= t
CCD(min)
, outputs open, gapless data
Refresh Current
(t
REF
= 64ms)
(min)
Self Refresh Current I
DD2PS
I
DD3N
DD3NS
I
DD3P
DD3PS
I
DD4
I
DD5
DD6
2 2 2
50 50 50 3
40 40 40
35 35 35
35 35 35
150 140 130 4,5
100 90 80 3
1 1 1
Document:1G5-0189 Rev.1 Page 5
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VIS
0.3V
±
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
A.C Characteristics:
(6)(7)(8)(10)
(VDD=3.3V , VSS=0V, Ta=0 to 70°C)
Symbol A.C. Parameter -6 -7 -8
Unit
Note
ns
9 9
CLK CLK
ns
CLK
CLK CLK
ns
CLK
ms CLK CLK CLK
t
CH
t
CL
t
T
t
CK3
t
CK2
t
IS
t
IH
t
DS
t
DH
t
LZ
t
HZ3
t
HZ2
t
AC3
t
AC2
t
OH
t
RCD
t
RRD
t
CCD
t
DPL
t
RAS
t
RP
t
DAL3
t
DAL2
t
RC
t
RSC
t
REF
t
SRX
t
BDL
t
PDE
Min Max Min Max Min Max
Clock high time 2.5 2.5 3 Clock low time 2.5 2.5 3 Transition time (Rise and Fall) 0.5 10 0.5 10 0.5 10 Clock cycle time CL* = 3 6 7 8
CL* = 2 8 10 12
Address/Control Input setup time 1.5 1.75 2 Address/Control Input hold time 1 1 1 Data Input setup time 1.5 1.75 2 Data Input hold time 1 1 1 Data output low impedance 1 1 1 Data output high imped-
ance
Access time from CLK (positive edge)
Data output hold time 2.3 2.5 2.5 RAS to CAS delay 18 20 20 Row activate to row activate delay 12 14 16 CAS to CAS Delay time 1 1 1 Last data in to precharge 2 2 2 Row activate to precharge time 36 100,000 42 100,000 48 100,000 Precharge to refresh/row activate
command Data-in to ACT (REF) Command (CL = 3) 5 5 5
Data-in to ACT (REF) Command (CL = 2) 5 5 5 Row cycle time 54 63 72 Mode Register Set Cycle time 2 2 2 Refresh time 64 64 64 Minimum CKE ”High”for Self-Refresh exit 1 1 1 Last data in to burst STOP command 1 1 1 Power Down Exit set-up time 1 1 1
CL* = 3 5.5 5.5 6 CL* = 2 6 7 7 CL* = 3 5.5 6 6
CL* = 2 6 7 7
3 3 3
Note:
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
2. All voltages are referenced to VSS.
3. These parameters depend on the cycle rate and these values are measured by the cycle rate under the minimum value of tCK and tRC.
4. These parameters depend on the output loading. Specified values are obtained with the outputs open.
5. Assume minimum column address update cycle t
CCD
(min).
Document:1G5-0189 Rev.1 Page 6
Page 7
VG3617161ET
VIS
6. Power-up sequence is described in Note 10.
7. A.C. Test Conditions Reference Level of Output Signals 1.4V
Output Load Reference to the Under Output Load (B)
Input Signal Levels 2.4V / 0.4V
Transition Time (Rise and Fall) of Input Signals 1ns
Reference Level of Input Signals 1.4V
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
3.3V
1.2K
Ω
ZO=50
Output
30pF
LVTTL D.C. Test Load (A)
8. Transition times are measured between VIH and VIL. Transition (rise and fall) of input signals are fixed slope (1 ns).
9. tHZ defines the time at which the outputs achieve the open circuit condition and are not reference levels.
10. Power up sequence Power up must be performed in the following sequence.
1) Power must be applied to VDD and V CKE = ”H”, DQM = ”H”. The CLK signals must be started at the same time.
2) After power-up, a pause of 200u secouds minimum is required. Then, it is recommended that DQM is held “high” (VDD levels) to ensure DQ output to be in the high impedance.
870
Ω
DDQ
Output
LVTTL A.C. Test Load (B)
(simultaneously) when all input signals are held “NOP” state and
Ω
1.4V 50
30pF
Ω
3) Both banks must be precharged.
4) Mode Register Set command must be asserted to initialize the Mode Register.
5) A minimum of 8 Auto-Refresh dummy cycles must be required to stabilize the internal circuitry of the device. Sequence of 4 and 5 may be changed.
Document:1G5-0189 Rev.1 Page 7
Page 8
VG3617161ET
VIS
Basic Features and Function description
1.Simplified State Diagram
Mode
Register
Set
MRS
IDLE
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Self
Refresh
y
r
t
n
e
F
L
t
E
S
ACT
i
x
e
F
L
E
S
C
K
REF
C
K
E
E
AUTO
Refresh
Power
Down
WRITE
SUSPEND
WRITE A
SUSPEND
Write
CKE
CKE
Write with
Auto Precharge
CKE
CKE
WRITE A
WRITE
B
S
T
READ
READ A
Active Power
Down
Read
CKE
CKE
Read with
Auto Precharge
CKE
CKE
READ
SUSPEND
READ A
SUSPEND
ROW
ACTIVE
T
S
B
rite
W
A
u
t
P
R
E
(
P
r
h
t
i
w
h
e
t
d
i
r
e
r
W
p
o
t
u
A
Read
R
e
a
d
w
o
i
P
t
h
r
e
c
h
a
r
g
e
e
c
h
a
r
g
e
t
e
r
m
i
n
a
t
i
o
n
)
A
e
g
r
a
PRE
Write
A
CKE
CKE
Re
R
u
e
t
o
P
r
e
c
a
e
R
o
t
u
(
E
R
P
ad
a
d
w
i
t
h
h
a
r
g
e
h
e
t
i
g
w
r
a
d
h
c
e
r
P
)
n
o
i
t
a
n
i
m
r
e
t
e
g
r
a
h
c
e
r
P
POWER
ON
Precharge
Precharge
Automatic sequence
Manual input
Note: After the AUTO refresh operation, precharge operation is
performed automatically and enter the IDLE state
Document:1G5-0189 Rev.1 Page 8
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VG3617161ET
VIS
2.Truth Table
2.1 Command Truth Table
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CKE
FUNCTION Symbol
n-1 n
CS RAS CAS WE A11 A10
Device deselect DESL H X H X X X X X X No operation NOP H X L H H H X X X Mode register set MRS H X L L L L L L V Bank activate ACT H X L L H H Read READ H X L H L H Read with auto precharge READA H X L H L H Write WRIT H X L H L L Write with auto precharge WRITA H X L H L L Precharge select bank PRE H X L L H L
BS BS BS BS BS BS
(2)
Row Row
(2)
(2)
(2)
(2)
(2)
L H L H
L X Precharge all banks PALL H X L L H L X H X Burst stop BST H X L H H L X X X
Note: (1) Column address: A0~A7 (2) BS: Bank Select. L means Bank A and H means Bank B.
2.2 DQM Truth Table
CKE DQM
FUNCTION Symbol
n-1 n-1 UDQM LDQM Data write/output enable ENB H X L Data mask/output disable MASK H X H Upper byte write enable/output enable ENBU H X L X Lower byte write enable/output enable ENBL H X X L Upper byte write inhibit/output disable MASKU H X H X Lower byte inhibit/output disable MASKL H X X H
A9-
A0
Col Col Col Col
(1)
(1)
(1)
(1)
2.3 CKE Truth Table
Current State Function Symbol
CKE
n-1 n
CS RAS CAS WE
Add-
ress
Activating Clock suspend mode entry H L X X X X X Any Clock suspend L L X X X X X Clock suspend Clock suspend mode exit L H X X X X X Idle CBR refresh command REF H H L L L H X Idle Self refresh entry SELF H L L L L H X Self refresh Self refresh exit L H L H H H X
L H H X X X X Idle Power down entry H L X X X X X Power down Power down exit L H X X X X X
H : High level, L : Low level, X : high or Low level(Don’t care), V : Valid Data input
Document:1G5-0189 Rev.1 Page 9
Page 10
VG3617161ET
endRow
→
endRow
→
stopRow
→
endwrite
→
endWrite
→
stopRow
→
1,048,576 x 16 - Bit
VIS
2.4 Operative Command Table
Current state CS RAS CAS WE Address Command Action Notes
Idle H X X X X DESL Nop or Power down 2
L H H X X NOP or BST Nop or Power down 2 L H L H BA,CA,A10 READ/READA ILLEGAL 3 L H L L BA,CA,A10 WRIT/WRITA ILLEGAL 3 L L H H BR,RA ACT Row active L L H L BA,A10 PRE/PALL Nop L L L H X REF/SELF Refresh or Self refresh 4 L L L L Op-Code MPS Mode register access
Row active H X X X X DESL Nop
L H H X X NOP or BST Nop L H L H BA,CA,A10 READ/READA Begin read:Determine AP 5 L H L L BA,CA,A10 WRIT/WRITA Begin write:Determine AP 5 L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL Precharge 6 L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
Read H X X X X DESL
CMOS Synchronous Dynamic RAM
(1/3)
Continue burst to active
L H H H X NOP L H H L X BST L H L H BA,CA,A10 READ/READA Term burst, new read:Determine AP 7
L H L L BA,CA,A10 WRIT/WRITA Term burst, start write:Determine AP 7,8 L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL Term burst,precharging L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
Write H X X X X DESL
L H H H X NOP L H H L X BST L H L H BA,CA,A10 READ/READA Term burst, start read: determine AP 7,8
L H L L BA,CA,A10 WRIT/WRITA Term burst, new write:Determine AP 7 L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL Term burst precharging 9 L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
Continue burst to active Burst active
Continue burst to recovering Continue burst to recovering Burst active
Document:1G5-0189 Rev.1 Page 10
Page 11
VG3617161ET
endPreching
arg→endPreching
arg
→
endWrite
→
endWrite
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
1,048,576 x 16 - Bit
VIS
Current state CS RAS CA WE Address Command Action Notes Read with auto
precharge
Write with auto precharge
Precharging H X X X X DESL
Row activating H X X X X DESL
H X X X X DESL
L H H H X NOP L H H L X BST ILLEGAL L H L H BA,CA,A10 READ/READA ILLEGAL L H L L BA,CA,A10 WRIT/WRITA ILLEGAL L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL ILLEGAL 3 L L L H X PEF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
H X X X X DESL
L H H H X NOP
L H H L X BST ILLEGAL L H L H BA,CA,A10 READ/READA ILLEGAL L H L L BA,CA,A10 WRIT/WRITA ILLEGAL L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL ILLEGAL 3 L L L H X REF/SELF ILLEGAL L L L L Op-code MRS ILLEGAL
L H H H X NOP L H H L X BST L H L H BA,CA,A10 READ/READA ILLEGAL 3
L H L L BA,CA,A10 WRIT/WRITA ILLEGAL 3 L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL
L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
L H H H X NOP L H H L X BST L H L H BA,CA,A10 READ/READA ILLEGAL 3
L H L L BA,CA,A10 WRIT/WRITA ILLEGAL 3 L L H H BA,RA ACT ILLEGAL 3,10 L L H L BA,A10 PRE/PALL ILLEGAL 3 L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
CMOS Synchronous Dynamic RAM
(2/3)
Continue burst to Continue burst to
Continue burst to recovering with auto precharge
Continue burst to recovering with auto precharge
idle after t
idle after t
idle after t
idle after t
row active after t row active after t row active after t
RP
RP
RP
RP
RCD
RCD
RCD
Document:1G5-0189 Rev.1 Page 11
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VG3617161ET
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
NopEnter
→
1,048,576 x 16 - Bit
VIS
Current state CS RAS CA WE Address Command Action Notes Write
recovering
Write recovering with auto precharge
Refreshing H X X X X DESL
Mode register accessing
H X X X X DESL
L H H H X NOP L H H L X BST L H L H BA,CA,A10 READ/READA Start read, Determine AP 8
L H L L BA,CA,A10 WRIT/WRITA New write, Determine AP L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 PRE/PALL ILLEGAL 3 L L L H X PEF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
H X X X X DESL
L H H H X NOP L H H L X BST
L H L H BA,CA,A10 READ/READA ILLEGAL 3,8 L H L L BA,CA,A10 WRIT/WRITA ILLEGAL 3 L L H H BA,RA ACT ILLEGAL 3 L L H L BA,A10 REF/PALL ILLEGAL 3 L L L H X REF/SELF ILLEGAL L L L L Op-Code MRS ILLEGAL
L H H X X NOP/BST L H L X X READ/WRIT ILLEGAL
L L H X X ACT/PRE/PALL ILLEGAL L L L X X REF/SELF/MRS ILLEGAL
H X X X X DESL
L H H H X NOP L H H L X BST ILLEGAL
L H L X X READ/WRITE ILLEGAL L L X X X ACT/PRE/PALL/
REF/SELF/MRS
CMOS Synchronous Dynamic RAM
(3/3)
row active after t row active after t
row active after t
precharge after t precharge after t
precharge after t
idle after t idle after t
idle after 2 Clocks idle after 2 Clocks
ILLEGAL
RC
RC
DPL
DPL
DPL
DPL
DPL
DPL
Note 1. All entries assume that CKE was active (High level)during the preceding clock cycle.
2. If both banks are idle, and CKE is inactive(Low level), the device will enter Power down mode. All input buffers except CKE will be disabled.
3. Illegal to bank in specified states; Function may be legal in the bank indicated by Bank Address (BA), depending on the state of that bank.
4. If both banks are idle, and CKE is inactive(Low level), the device will enter Self refresh mode. All input buffers except CKE will be disabled.
5. IIIegal if t
6. IIIegal if t
7. Must satisfy burst interrupt condition.
8. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
9. Must mask preceding data if t
10. IIIegal if t
is not satisfied.
RCD
is not satisfied.
RAS
is not satisfied.
RRD
is not satisfied.
DPL
Document:1G5-0189 Rev.1 Page 12
Page 13
VG3617161ET
PDIdle
→
VIS
2.5 Command Truth Table for CKE
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Current state
Self refresh (SR)
Self refresh recovery
Power down (PD)
Both banks idle
Any state other than listed above
CKE
RASnCS RAS
n-1
H X X X
L H H X L H L H L H L H L H L L L L X X
H H H X H H L H H H L H
H H L L H L H X H L L H H L L H H L L L
L H X X L L X X
H X X X
L H X X L L X X
H H H X
H H L H
H H L L
H H L L H H L L
H L H X
H L L H
H L L L
H L L L H L L L
L X X X
H H X X
H L X X
L H X X L L X X
CAS WE Address Action Notes
X X X INVALID,CLK(n-1)would exit S.R. X X X SR Recovery 2
H X X SR Recovery 2
L X X ILLEGAL 2 X X X ILLEGAL 2 X X X Maintain S.R. X X X Idle after t
H X X Idle after t
RC RC
L X X ILLEGAL X X X ILLEGAL X X X Begin clock suspend next cycle 5
H X X Begin clock suspend next cycle 5
L X X ILLEGAL X X X ILLEGAL X X X Exit clock suspend next cycle 2 X X X Maintain clock suspend X X INVALID, CLK(n-1) would exit P.D. X X X
EXIT
2
X X X Maintain power down mode X X Refer to operations in Operative
Command Table
X X Refer to operations in Operative
Command Table
H X Refer to operation in Operative
Command Table L H X Refresh L L Op-
Code
Refer to operations in Operative
Command Table X X Refer to operations in Operative
Command Table X X Refer to operations in Operative
Command Table
H X Refer to operations in Operative
Command Table L H X Self refresh 3 L L Op-
Code
Refer to operations in Operative
Command Table X X X Power down 3
X X X Refer to operations in Operative
Command Table X X X Begin clock suspend next cycle 4 X X X Exit clock suspend next cycle X X X Maintain clock suspend
Note 1. H : Hight level, L : low level, X : High or low level(Don't care).
2. CKE Low to High transition will re-enable CLK and other inputs asynchronously. A minimum setup time must be satisfied before any command other than EXIT.
3. Power down and Self refresh can be entered only from the both banks idle state.
4. Must be legal command as defined in Operative Command Table. 5 .IIIegal if t
Document:1G5-0189 Rev.1 Page 13
is not satisfied.
SRX
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VIS
3.Initiallization
The synchronous DRAM is initialized in the power on sequence. Once power has been applied, a 200us minimum delay is needed in which stable power and input signals are maintained. During this delay, CKE and DQM recommend to be held high.
After the 200us delay, both banks must be precharged using the precharge command. Once precharge is completed and the minimum tRP is satisfied, the mode register can be programmed.
Minimum 8 CBR refresh cycles must be performed before or after the mode register set command.
4.Programming the Mode Register
The mode register is programmed by the mode register set command using address bits A11 through
A0 as data inputs. The register retains data until it is reprogrammed or until the device loses power.
The mode register has four fields;
Options : A11 through A7 CAS latency : A6 through A4 Wrap type : A3 Burst length : A2 through A0
Following mode register programming, no command can be asserted befor at least two clock cycles
have elapsed.
CMOS Synchronous Dynamic RAM
CAS Latency
CAS latency is the most critical parameter to be set. It tells the device how many clocks must elapse before the data will be available. The SDRAM is capable of reconfiguring its internal architecture based on the value of CAS latency.
The value is determined by the frequency of the clock and the speed grade of the device. The value can be programmed as 2 or 3.
Burst Length
Burst Length is the number of words that will be output or input in read or write cycle. After a read burst
is completed, the output bus will become high impedance.
The burst length is programmable as 1,2,4,8 or full page.
Wrap Type (Burst Sequence)
The wrap type specifies the order in which the burst data will be addressed. The order is programmable
as either “Sequential” or “Interleave”. The method chosen will depend on the type of CPU in the system.
Some microprocessor cache systems are optimized for sequential addressing and others for inter­leaved addressing. Both sequences support bursts of 1,2,4 and 8. Only the sequential burst. supports the full-page length.
Document:1G5-0189 Rev.1 Page 14
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VIS
5.Mode Register
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
11
0 0
11
0
10
10
0
8
9
1
9
0
0 0 8
0 0
7
7
5
6
LTMODE
5
6
LTMODE
3
4
WT
3
4
WT
1
2
2
BL
BL
0
Burst Read and Single Write
1
0
Mode Register Set
Burst length
Wrap type
X=Don’t care
Bits2-0
000 001
010 011
100 101 110
111
01Sequential
Interleave
WT=0
1 2
4 8 R R R
Full page
WT=1
1 2
4 8
R R R
R
Latency
mode
Remark R:Reserved
Bits6-4
000 001
010 011 100 101 110
111
CAS Iatency
R R
2 3 R R R
R
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VG3617161ET
VIS
5.1 Burst Length and Sequence
(Burst Length= 2)
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Starting Address (column address A0, binary)
0 0,1 0,1 1 1,0 1,0
(Burst Length=4)
Starting Address (column address A1-A0, binary)
00 0,1,2,3 0,1,2,3 01 1,2,3,0 1,0,3,2 10 2,3,0,1 2,3,0,1 11 3,0,1,2 3,2,1,0
(Burst Length=8)
Starting Address (column address A2-A0, binary)
Sequential Addressing Sequence (decimal)
Sequential Addressing Sequence (decimal)
Sequential Addressing Sequence (decimal)
Interleave Addressing Sequence(decimal)
Interleave Addressing Sequence(decimal)
Interl eave Addressing
Sequence(decimal) 000 0,1,2,3,4,5,6,7 0,1,2,3,4,5,6,7 001 1,2,3,4,5,6,7,0 1,0,3,2,5,4,7,6 010 2,3,4,5,6,7,0,1 2,3,0,1,6,7,4,5 011 3,4,5,6,7,0,1,2 3,2,1,0,7,6,5,4 100 4,5,6,7,0,1,2,3 4,5,6,7,0,1,2,3 101 5,6,7,0,1,2,3,4 5,4,7,6,1,0,3,2 110 6,7,0,1,2,3,4,5 6,7,4,5,2,3,0,1 111 7,0,1,2,3,4,5,6 7,6,5,4,3,2,1,0
Full page burst is an extension of the above tables of sequential addressing, with the length being 256
words.
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6.Address Bits of Bank-Select and Precharge
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
A0
Row
(Activate command)
A0
Row (Precharge)
A0
Col.
(CAS strobes)
A2A1
A2A1
A2A1
A3
A3
A3
A4
A4
A4
A5
A5
A5
A6
A6
A6
A7
A7
A7
A8
A8
A8
A9
A9
A9
A10
A10
A10
A11
A11
A11
0
Select Bank A ”Activate” command
1
Select Bank B ”Activate” command
Result
A11
A10
0
0 0
1
0 1
Precharge Bank A
1
Precharge Bank B
x
Precharge All Banks
x:Don’t care
Disable Auto-Precharge (End of Burst) Enable Auto-Precharge (End of Burst)
Enable Read/Write commands for Bank A
0
Enable Read/Write commands for Bank B
1
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VIS
7.PRECHARGE
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
The PRECHARGE command can be asserted anytime after t
RAS(min)
is satisfied.
Soon after the PRECHARGE command is asserted, PRECHARGE operation is performed. The synchronous DRAM
enters the idle state after t
is satisfied. The parameter tRP is the time required to perform the PRECHARGE.
RP(min)
The earliest timing in a READ cycle that a PRECHARGE command can be asserted without losing any data in the
burst is as followed.
PRECHARGE
CLK
Command
CAS latency=2
DQ
Command
CAS latency=3
T0 T1
Read
Read
T2
T3
Q0 Q3Q2
T4 T5
PRE
Q1
PRE
T6
Hi-Z
Burst lengh=4
T7
DQ
CAS latency= 2: One clock earlier than the last output data. 3: Two clocks earlier than the last output data.
In order to write all data to the memory cell correctly, the asynchronous parameter”t
The t
DPL(MIN.)
cycle. The minimum number of clocks are calculated by dividing t
specification defines the earliest time that a PRECHARGE command can be asserted after a WRITE
DPL(min.)
Q0
Q1
” must be satisfied.
DPL
by the clock cycle time.
Q2
In summary, the PRECHARGE command can be asserted relative to the reference clock of the last valid
data. In the following table, minus means clocks before the reference, plus means time after the reference.
CAS latency READ WRITE
2 -1 +t
DPL(min.)
Q3
(t
RAS
Hi-Z
is satisfied)
3 -2 +t
DPL(min)
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VIS
8.AUTO PRECHARGE
During a READ or WRITE command cycle, A10 controls whether AUTO PRECHARGE is selected. If A10 is high in the READ or WRITE command (READ with AUTO PRECHARGE command or WRITE with AUTO PRE­CHARGE command), AUTO PRECHARGE is selected and precharging begins automatically after the burst access.
In the WRITE cycle, t
DAL(min.)
charged.
When using AUTO PRECHARGE in the READ cycle, knowing when the PRECHARGE starts is important because the t
be asserted after t
must be satisfied. Once AUTO PRECHARGE has started, an active command to the bank can
RAS
has been satisfied.
RP(min.)
The timing at which the AUTO PRECHARGE cycle begins depends both on the CAS Iatency programmed into the mode register and on whether the cycle is READ or WRITE.
8.1 READ with AUTO PRECHARGE
During a READA cycle, the AUTO PRECHARGE begins one clock earlier(CAS Iatency of 2) or two
clocks earlier(CAS Iatency of 3) than the last data word output.
must be satisfied to assert the next active command to the bank being pre-
CMOS Synchronous Dynamic RAM
READ with AUTO PRECHARGE
CLK
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
T0 T1
READA B
READA B
Burst lengh=4
QB0
T3
QB1
QB0
QB0 QB1
T4 T5
Auto precharge starts
Auto precharge starts
T2
T6
QB3QB2
QB2QB1
QB3
T7
Hi-Z
Hi-Z
T8
Remark: READA means READ with AUTO PRECHARGE
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8.2 WRITE with AUTO PRECHARGE
During a WRITA cycle, the AUTO PRECHARGE starts at t
the device
WRITE with AUTO PRECHRGE
T0 T1
CLK
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
DPL(min.)
T2
T3
after the last data word input to
T4 T5
T6
Burst lengh=4 T7
T8
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
Remark WRITA means WRITE with AUTO PRECHARGE
WRITA B
DB0
WRITA B
DB0
DB1
DB1
AUTO PRECHARGE starts
t
DPL
DB3DB2
AUTO PRECHARGE starts
t
DPL
DB3DB2
Hi-Z_
Hi-Z_
In summary, the auto precharge cycle begins relative to a reference clock that indicates the last data word is valid. In the table below, minus means clocks before the reference; plus means clocks after the reference.
CAS latency READ WRITE
2 -1 +t
3 -2 +t
DPL(min.)
DPL(min)
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9.READ/WRITE Command Interval
9.1 READ to READ command interval
When a new READ command is asserted during a READ cycle, it will be effective after the CAS latency,
even if the previous READ operation has not completed. READ will be interrupted by another READ.
A READ command can be asserted in every clock without restriction.
READ to READ Command Interval
CLK
T0 T1
T2
T3
CMOS Synchronous Dynamic RAM
T4 T5
1,048,576 x 16 - Bit
Burst lengh=4, CAS latency=2
T6
T7
T8
1 cycle
Read B
QA0
QB0
QB2QB1
Command
DQ
Read A
9.2 WRITE to WRITE Command Interval
When a new WRITE command is asserted during a WRITE cycle, the previous burst will be terminated
and the new burst will begin with the new WRITE command. WRITE will be interrupted by another WRITE.
A WRITE command can be asserted in every clock without restriction.
WRITE to WRITE Command Interval
Burst lengh=4, CAS latency=2
CLK
T0 T1
T2
T3
T4 T5
T6
QB3
Hi-Z_
T7
T8
1 cycle
Write B
QB0
QB2QB1
QB3
Hi-Z_
Command
DQ
Write A
QA0
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9.3 WRITE to READ Command Interval
The WRITE command to READ command interval is a minimum of 1 cycle. Only the WRITE data pre­ceding the READ command will be written. The data bus must be in high-impedance at least one cycle prior to the first D
WRITE to READ Command Interval
CLK
OUT
.
T0 T1
1 cycle
T2
T3
CMOS Synchronous Dynamic RAM
T4 T5
T6
1,048,576 x 16 - Bit
Burst lengh=4
T7
T8
Command
CAS latency=2
DQ
Command
CAS latency=3
DQ
WRITE A
DA0
Write A
DA0
Read B
Read B
Hi-Z
Hi-Z
QB0
QB1
QB0
QB1
9.4 READ to WRITE Command Interval
During READ cycle, READ can be interrupted by WRITE. The data bus must be in high-impedance using DQM before the WRITE command. DQM must be high at least 3 clocks prior to the WRITE command. This restriction is necessary to avoid a data bus conflict.
QB3QB2
QB2
QB3
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READ to WRITE Command Interval
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
Command
DQM
DQ
CLK
Command
T0 T1
Hi-Z
T0 T1
Read
Read
1 cycle
T2
D0
Write
CAS latency=2
T7
T8
T8
T9
D1
T3
T4 T5
T4 T5
D3D2
T6
T2
T3
T6
Burst length=8, CAS latency=2
T7
Write
DQM
DQ
CLK
Command
DQM
DQ
Q0
T0 T1
Read
The minimum command interval = (4+1) cycles
T2
Q1
Q2
Hi-Z is
necessary
T3
Q2
T4 T5
Hi-Z is
necessary
D0
example: Burst length=4, CAS latency=3
T6
Write
D0
D1
T7
D1
D2
T8
D2
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10.BURST TERMINATION
There are two methods to terminate a BURST operation other than using a READ or a WRITE command.
One is the BURST STOP command and the other is the PRECHARGE command.
10.1 BURST STOP Command
During a READ BURST. when the BURST STOP command is asserted, the BURST READ outputs are terminated and the data bus goes to high-impedance after the CAS latency from the BURST STOP command.
During a WRITE BURST. when the BURST STOP command is asserted, any data provided at that cycle will not be written. The BURST WRITE is effectively terminated and no further data can be written until a new WRITE command is asserted.
Burst Termination
CLK
T0 T1
T2
T3
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst lengh=X, CAS Intency=2,3
T4 T5
T6
T7
Command
CAS latency=1
DQ
CAS latency=2
DQ
CAS latency=3
DQ
Remark BST: Burst stop command
CLK
Read
T0 T1
Q0
T2
Q0
Q1
T3
BST
Q2
Q1
Q0
Hi-Z
Q2
Q1
T4 T5
Hi-Z
Q2
Burst lengh=X, CAS latency=1,2,3
T6
Hi-Z
T7
Command
CAS latency=1,2,3
DQ
Write
Q0
Q0
Q1
Q2
BST
Hi-Z_
Remark BST: Burst stop command
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10.2 PRECHARGE TERMINATION
10.2.1 PRECHARGE TERMINATION in READ Cycle
During a READ cycle, the BURST READ operation can be terminated by a PRECHARGE command. When the PRECHARGE command is asserted, the BURST READ operation is termi­nated and PRECHARGE starts.
Read data will remain valid until zero clock(CAS latency of 1), one clock(CAS latency of 2)or two clocks(CAS latency of 3) after the PRECHARGE command and the same bank can be acti­vated again after t
PRECHARGE TERMINATION in READ Cycle
from the PRECHARGE command.
RP(min)
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
Command
CAS latency=1
DQ
Command
CAS latency=2
DQ
command
CAS latency=3
DQ
T0 T1
Read
Read
Read PRE
T2
Q0 Q3
T3
Q1
Q0 Q3
Q2
Q1
Q0 Q3
T4 T5
PRE
PRE ACT
Q2
Q1
ACT
t
RP
t
RP
t
RP
Q2
Hi-Z
T6
t
RP
T7
Hi-Z
Burst lengh= X
T8
ACT
Hi-Z
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10.2.2 PRECHARGE TERMINATION in WRITE Cycle
During a WRITE cycle, the BURST WRITE operation can be terminated by a PRECHARGE command. when the PRECHARGE command is asserted, the BURST WRITE operation in imme­diately terminated and PRECHARGE starts.
The same bank can be activated again after tRP(min.) from the PRECHARGE command. The DQM must be high to mask invalid data in.
When CAS latency is 1, 2 or 3, the data written prior to the PRECHARGE command will be correctly stored. However, invalid data may be written at the same clock as the PRECHARGE command. To prevent this from happening, DQM must be high at the same clock as the PRE­CHARGE command. This will mask the invalid data.
PRECHARGE TERMINATION in WRITE Cycle
T0 T1
CLK
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
T2
T3
T4 T5
T6
Burst lengh = X
T7
T8
Command
CAS latency=1 DQM
DQ
Command
CAS latency=2
DQM
DQ
command
CAS latency=3
DQM
DQ
Write
D0 D3
Write
D0 D3
Write PRE ACT
D0 D3
D1
D1
D1
D2
D2
D2
PRE ACT
t
RP
D4
t
RP
PRE ACT
D4
t
RP
D4
Hi-Z
Hi-Z
Hi-Z
Document:1G5-0189 Rev.1 Page 26
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VIS
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Timing Diagram
Document:1G5-0189 Rev.1 Page 27
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VIS
Mode Register Set
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
T0
T1
T2
T3
T4
t
RSC
T5 T6
T7 T8
T9
T10
A10
A0-A9
DQM
DQ
Hi-Z
Precharge Command All Banks
t
RP
Key
Mode Register Set Command
Command
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AC Parameters for Write Timing (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
BS
t
CL
t
CH
t
t
CKS
CMS
t
CMH
t
CK2
Begin Auto Precharge Bank A
Begin Auto Precharge
(Bank D)
Bank B
t
CKH
A10
t
t
AS
AH
ADD
DQM
t
Activate Command
Bank A
RCD
t
RRD
QAa0
Write with Auto Precharge Command Bank A
t
RC
QAa1
QAa2 QAa3 QBa0
Activate Command Bank B
(Bank D)
t
DAL
QBa1
Write with Auto Precharge Command Bank B
(Bank D)
QBa2 QBa3
Activate Command Bank A
t
DS
QAb0
QAb1
Write without Auto Precharge Command Bank A
t
t
DPL
Precharge Command
Bank A
RP
Activate
Command
Bank A
Activate
Command
Bank B
(Bank D)
t
DH
QAb2
QAb3
DQ
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AC Parameters for Write Timing (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 T23
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
BS
t
CH
t
t
CKS
CL
t
CMS
t
CMH
t
CK3
Begin Auto Precharge Bank A
Begin Auto Precharge Bank B
(Bank D)
t
CKH
A10
t
t
AS
AH
ADD
DQM
t
RCD
DQ
Activate Command
Bank A
t
RRD
QAa0
Write with Auto Precharge Command Bank A
QAa1
Activate Command Bank B
(Bank D)
t
RC
QAa2
QAa3 QBa0 QBa1
t
DAL
Write with Auto Precharge Command Bank B
(Bank D)
QBa2
QBa3
Activate Command Bank A
t
DS
t
DH
QAb0 QAb1 QAb2
Write without Auto Precharge Command Bank A
QAb3
t
DPL
Precharge Command
Bank A
t
RP
Activate
Command
Bank A
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AC Parameters for Read Timing (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=2, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
A10
A0-A9
tCHt
t
CKS
CL
t
AS
RAa
t
AH
t
CK2
t
CMS
t
CMH
t
RRD
RBa
RBaCAaRAa
t
RAS
Begin Auto Precharge Bank B
CBa
t
RC
t
CKH
RAb
RAb
DQM
t
DQ
Hi-Z
Activate Command Bank A
t
RCD
Read Command Bank A
t
AC2
t
LZ
AC2
t
OH
QAa0
Activate Command Bank B
t
HZ
t
OH
QAa1
Read with
Auto Precharge
Bank B
QBa0
Precharge Command Bank A
t
RP
QBa1
t
HZ
Activate Command Bank A
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AC Parameters for Read Timing (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=2, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
A10
A0-A9
DQM
t
CH
t
CKS
t
CL
RAa
t
AS
RAa
t
t
AH
CK3
t
CMS
t
CMH
t
RRD
CAa
t
RAS
RBa
RBa
t
RC
CBa
Begin Auto Precharge Bank B
t
RP
RAb
RAb
t
CKH
t
AC3
t
OH
QAa1
t
HZ
t
OH
Read with Auto Precharge Command Bank B
Precharge Command
Bank A
QBa0
QBa1
t
HZ
Activate
Command
Bank A
DQ
Hi-Z
Activate Command Bank A
t
RCD
Read Command Bank A
t
AC3
t
LZ
Activate Command Bank B
QAa0
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Power on Sequence and Auto Refresh (CBR)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
CLK
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CKE
CS
RAS
CAS
WE
A11(BS)
A10
High level is required
Minimum of 8 Refresh Cycles are required
t
RSC
Address Key
A0~A9
DQM
High Level is Necessary
t
RP
t
RC
DQ
Inputs must
be stable for 200us
Precharge Command
All Banks
1st Auto Refresh
Command
2nd Auto Refresh Command
Mode Register Set Command
Command
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Clock Suspension During Burst Read (Using CKE) (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
Hi-Z
RAa
RAa
Activate
Command
Bank A
CAa
Read Command
Bank A
QAa0 QAa1
Suspended
Clock 1 Cycle
QAa2
Clock
Suspended
2 Cycles
QAa3
t
HZ
Clock
Suspended
3 Cycles
A10
A0~A9
DQM
DQ
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VG3617161ET
VIS
Clock Suspension During Burst Read (Using CKE) (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
Hi-Z
RAa
RAa
Activate
Command
Bank A
CAa
Read
Command
Bank A
QAa0
QAa1
Clock
Suspended
1 Cycle
QAa2 QAa3
Clock
Suspended
2 Cycles
t
HZ
Clock
Suspended
3 Cycles
A10
A0~A9
DQM
DQ
Document:1G5-0189 Rev.1 Page 35
Page 36
VG3617161ET
VIS
Clock Suspension During burst Write (Using CKE) (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
CAa
DQM
DQ
Hi-Z
Activate
Command
Bank A
QAa0 QAa1
Clock
Suspended
1 Cycle
Write
Command Bank A
Clock
Suspended
2 Cycles
QAa2
Clock
Suspended
3 Cycles
QAa3
Document:1G5-0189 Rev.1 Page 36
Page 37
VG3617161ET
VIS
Clock suspension during Burst write (Using CKE) (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
Hi-Z
RAa
RAa
Activate
Command
Bank A
QAa0
Suspended
Write
Command Bank A
CAa
QAa1 QAa2
Clock 1 Cycle
Suspended
Clock 2 Cycles
Clock
Suspended
3 Cycles
t
QAa3
A10
A0~A9
DQM
DQ
Document:1G5-0189 Rev.1 Page 37
Page 38
VG3617161ET
VIS
Power Down Mode and Clock Mask
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
BS
t
CK2
t
CKS
t
CKH
VALID
t
CKS
RAa
Hi-Z
RAa
RAa
Activate
Command
Bank A
Power Down
Mode Entry
ACTIVE
STANDBY
CAa
Read Command Bank A
Power Down Mode Exit
QAa0
QAa1
Clock Mask
Start
QAa2
Clock Mask
End
t
HZ
QAa3
Precharge
Command
Power Down
Mode Entry
Precharge Standby
Power
Down
Mode Exit
Command
A10
A0~A9
DQM
DQ
Document:1G5-0189 Rev.1 Page 38
Page 39
VIS
Auto Refresh (CBR)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
CLK
t
CKE
CS
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CK2
RAS
CAS
WE
BS
A10
ADD
DQM
DQ
Hi-Z
RAa
RAa
t
RP
t
RC
t
RC
CAa
Q0
Q1
Q2
Q3
Precharge
Command
All Banks
CBR Refresh Command
CBR Refresh
Command
Activate Command
Write
Command
Document:1G5-0189 Rev.1 Page 39
Page 40
VG3617161ET
VIS
Self Refresh (Entry and Exit)
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
CLK
CKE
CS
RAS
CAS
WE
CLK can be Stopped
*
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
t
CKS
t
SRX
t
SRX
t
CKS
BS
A10
ADD
DQM
DQ
Hi-Z
All Banks must be idle
Self refresh
Entry
Self Refresh
Exit
t
RC
Self Refresh
Entry
Self Refresh
Exit
t
RC
Activate
Command
* Clock can be stopped at CKE=Low. If clock is stopped, it must be restarted/stable for 4 clock cycles before CKE=High
Document:1G5-0189 Rev.1 Page 40
Page 41
VG3617161ET
VIS
Random Column Read (Page Within same Bank)(1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
CAa
CAb
CAc
RAa
RAd
RAd
CAd
DQM
DQ
Hi-Z
Active
Command
Bank A
Read
Command
Bank A
QAa0 QAa1
QAa2 QAa3
Read
Command
Bank A
QAb0
QAb1
Read
Command
Bank A
QAc0
QAc1
Precharge
Command
Bank A
QAc2
QAc3
Activate
Command
Bank A
Read
Command
Bank A
QAd0
QAd1
QAd2
Document:1G5-0189 Rev.1 Page 41
QAd3
Page 42
VG3617161ET
VIS
Random Column Read (Page Within same Bank)(2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
A10
A0~A9
RAa
RAa
CAa
CAb
CAc RAd
RAd
CAd
DQM
DQ
Hi-Z
Activate
Command
Bank A
Read
Command
Bank A
QAa0 QAa1
Read
Command
Bank A
QAa2
QAa3
Read
Command
Bank A
QAb0
QAb1
QAc0
QAc1
Precharge
Command
Bank A
QAc2 QAc3
Activate
Command
Bank A
Read
Command
Bank A
Document:1G5-0189 Rev.1 Page 42
Page 43
VG3617161ET
VIS
Random Column Write (Page Within same Bank) (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RBa
CBa
CBb
CBc RBd
RAd
CBd
DQM
DQ
Hi-Z
Activate
Command
Bank B
DBa0
Write
Command
Bank B
DBa1
DBa2
DBb0
DBa3
Write
Command
Bank B
DBb1
Write
Command
Bank B
DBc0
DBc1
DBc2 DBc3
Precharge
Command
Bank B
Activate
Command
Bank B
DBd0
DBd1
Write
Command
Bank B
DBd2
DBd3
Document:1G5-0189 Rev.1 Page 43
Page 44
VG3617161ET
VIS
Random Column Write (Page Within same Bank) (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
A10
A0~A9
RBa
RBa
CBa
CBb
RBd
CBc RBd
CBd
DQM
DQ
Hi-Z
Activate
Command
Bank B
DBa0
Write
Command
Bank B
DBa1
DBa2
DBb0
DBa3
Write
Command
Bank B
DBb1
DBc0
Write
Command
Bank B
DBc1
DBc2
DBc3
Precharge
Command
Bank B
Activate
Command
Bank B
DBd0
DBd1
Write
Command
Bank B
Document:1G5-0189 Rev.1 Page 44
DBd2
Page 45
VG3617161ET
VIS
Random Row Read (Interleaving Banks) (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=8, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
A10
A0~A9
RBa
RBa
t
RCD
CBa
t
AC2
RAa
RAa
CAa
t
RP
RBb
RBb
CBb
DQM
DQ
Hi-Z
Activate
Command
Bank B
Read
Command
Bank B
QBa0
QBa1
QBa2
QBa4
QBa3
Activate
Command
Bank A
QBa5
QBa6
Read
Command
Bank A
QBa7
Precharge
Command
Bank B
QAa0
Active
Command
Bank B
QAa1
QAa2
QAa3
QAa4
QAa5
QAa6
QAa7
Read
Command
Bank B
QBb0
Document:1G5-0189 Rev.1 Page 45
QBb1
Page 46
VG3617161ET
VIS
Random Row Read (Interleaving Banks) (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=8, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
A10
A0~A9
RBa
RBa
t
RCD
CBa
t
AC3
RAa
RAa
CAa
RBb
RBb
t
RP
CBb
DQM
DQ
Hi-Z
Activate
Command
Bank B
Read
Command
Bank B
QBa0
QBa2
QBa1
Activate
Command
Bank A
QBa3
QBa5
QBa4
Read
Command
Bank A
QBa6
Precharge
Command
Bank B
QBa7
QAa0
QAa1
QAa2
Activate
Command
Bank B
QAa3
QAa4
QAa6
QAa5
Read
Command
Bank B
QAa7
Precharge
Command
Bank B
Document:1G5-0189 Rev.1 Page 46
QBb0
Page 47
VG3617161ET
VIS
Random Row Write (Interleaving Banks) (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=8, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
t
RCD
QAa0
Write
Command
Bank A
CAa
QAa1 QAa2
QAa3
QAa4
RBa
RBa
QAa5
QAa6
Activate
Command
Bank B
t
DPL
QAa7
QBa0 QBa1
Write
Command
Bank B
CBa
Precharge
Command
Bank A
t
RP
QBa2
Command
Bank A
RAb
RAb
QBa3 QBa4
Active
QBa5
QBa6 QBa7
Command
DAb0 DAb1
Write
Bank A
CAb
t
DPL
DAb2
Precharge
Command
Bank B
DAb3
Document:1G5-0189 Rev.1 Page 47
DAb4
Page 48
VG3617161ET
VIS
Random Row Write (Interleaving Banks) (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=8, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
t
RCD
CAa
DAa0 DAa1
Write
Command
Bank A
DAa2
DAa3
RBa RAb
RBa
RBa RAb CBa
t
DPL
DAa4
DAa5
Activate
Command
Bank B
DAa6
DBa0
DAa7
Write
Command
Bank B
DBa1
Precharge
Command
DBa2 DBa3
Bank A
t
RP
DBa4
QBa5 DBa6
Activate
Command
Bank A
CAb
DBb7 DAb0
Write
Command
Bank A
t
DPL
DAb1
Precharge
Command
DAb2
Bank B
Document:1G5-0189 Rev.1 Page 48
DAb3
Page 49
VG3617161ET
VIS
Read and Write Cycle (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
CAa
CAb
CAc
DQM
DQ
Hi-Z
Activate
Command
Bank A
Read
Command
Bank A
QAa0 QAa1
QAa2
QAa3
DAb0
Write
Command
Bank A
DAb1
The Write Data
is Masked with a
Zero Clock
latency
DAb3
Read
Command
Bank A
QAc0
QAc1
The Read Data
is Masked with
QAc3
Two Clocks
Latency
Document:1G5-0189 Rev.1 Page 49
Page 50
VG3617161ET
VIS
Read and Write Cycle (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
A10
A0~A9
RAa
RAa
CAa
CAb
CAc
DQM
DQ
Hi-Z
Activate
Command
Bank A
Read
Command
Bank A
QAa0
QAa1
QAa2
QAa3
DAb0
Write
Command
Bank A
DAb1
The Write Data
is Masked with a
Zero Clock
latency
DAb3
Read
Command
Bank A
QAc0
QAc1
The Read Data
is Masked with
Two Clock
Latency
Document:1G5-0189 Rev.1 Page 50
QAc3
Page 51
VG3617161ET
VIS
Interleaved Column Read Cycle (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
DQM
DQ
Hi-Z
RAa
RAa
t
Activate
Command
Bank A
RCD
Read
Command
Bank A
CAa
RBa
RBa
t
AC2
QAa0 QAa1
Activate
Command
Bank B
CBa CBb CBc CAb CBd
QAa3
QAa2
Read
Command
Bank B
QBa0
QBa1
Read
Command
Bank B
QBb0 QAb0
Read
Command
Bank B
QBc0
Read
Command
Bank A
QBc1
QBb1 QBd0
Read
Command
Bank B
Precharge Command
Bank A
QAb1
QBd1
QBd2
QBd3
Precharge Command
Bank B
Document:1G5-0189 Rev.1 Page 51
Page 52
VG3617161ET
VIS
Interleaved Column Read Cycle (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
A10
A0~A9
DQM
DQ
Hi-Z
RAa
RAa
Activate
Command
Bank A
t
RCD
t
RRD
Command
CAa
Read Bank A
Activate
Command
RBa
RBa
Bank B
t
AC3
QAa0
CBa CBb
QAa1
QAa2
Read
Command
Bank B
QBa0
QAa3
Read
Command
Bank B
CBc
QBa1 QAb3
Read
Command
Bank B
CAb
QBb0 QAb0
QBc0
QBb1
Read
Command
Bank A
QBc1
Precharge
Command
Bank B
QAb2
QAb1
Precharge Command
Bank A
Document:1G5-0189 Rev.1 Page 52
Page 53
VG3617161ET
VIS
Interleaved Column Write Cycle (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
t
RCD
CAa
RBa
RBa
CBa CBb
CBc
CAb
CBd
t
t
RP
DPL
DQM
t
RRD
DQ
Hi-Z
Activate
Command
Bank A
DAa0 DAa1
Write
Command
Bank A
DAa3
DAa2
Activate
Command
Bank B
DBa0
Write
Command
Bank B
DBb0 DAb0
DBa1 DBd1
Write
Command
Bank B
DBb1
DBc0
Write
Command
Bank B
DBc1
Command
Bank A
Write
DAb1
DBd0
Precharge
Command
Bank A
Write
Command
Bank B
DBd2 DBd3
Precharge Command
Bank B
Document:1G5-0189 Rev.1 Page 53
Page 54
VG3617161ET
VIS
Interleaved Column Write Cycle (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK3
A10
A0~A9
RAa
RAa
t
RCD
CAa
RBa
RBa
CBa CBb
CBc
CAb
t
DPL
CBd
t
DPL
DQM
DQ
Hi-Z
Activate
Command
Bank A
t
RRD
DAa0 DAa1
Write
Command
Bank A
Activate
Command
Bank B
DAa2
DAa3
Command
DBa0
Write
Bank B
DBa1
DBb0 DAb0
Write
Command
Bank B
DBc0
DBb1 DAd0
Write
Command
Bank B
DBc1
Command
Write
Bank A
DAb1
Write
Command
Bank B
Precharge Command
Bank A
QAd1
t
RP
QAd2 QAd3
Precharge Command
Bank B
Document:1G5-0189 Rev.1 Page 54
Page 55
VG3617161ET
VIS
Auto Precharge after Read Burst (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
Start Auto Precharge Bank B
Start Auto Precharge Bank A
Start Auto Precharge Bank B
A10
A0~A9
RAa
RAa
CAa
RBa
RBa
CBa CAb
RBb RAc
RBb
CBb
RAc
CAc
DQM
DQ
Hi-Z
Activate
Command
Bank A
Read
Command
Bank A
QAa0
Activate
Command
Bank B
QAa1
QAa2
Read with
Auto Precharge
Command
Bank A
QAa3
QBa0
QBa2 QAb2
QBa1 QBb1
Read with
Auto Precharge
Command
Bank A
QBa3
QAb0
QAb1
Activate
Command
Bank B
QAb3
Read with
Auto Precharge
Command
Bank B
QBb0
Activate
Command
Bank A
Auto Precharge
QBb2 QBb3
Read with
Command
Bank A
QAc1
QAc0 QAc2
Document:1G5-0189 Rev.1 Page 55
Page 56
VG3617161ET
VIS
Auto Precharge after Read Burst (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
Start Auto Precharge Bank B
Start Auto Precharge
Bank A
Start Auto Precharge Bank B
A10
A0~A9
RAa
RAa
RBa
RBa
CBa
CAb
RBb
RBb
CBbCAa
DQM
DQ
Hi-Z
Activate
Command
Bank A
Read
Command
Bank A
Activate
Command
Bank B
QAa0 QAa1
Read with Auto Precharge Command
Bank B
QAa2
QAa3
QBa0
QBa1
QBa2 QAb2
Read with
Auto Precharge
Command
Bank A
Activate Command
QAb0
QBa3 QBb0
Bank B
QAb1
Read with
Auto Precharge
Command
Bank B
QAb3
QBb1
QBb2 QBb3
Document:1G5-0189 Rev.1 Page 56
Page 57
VG3617161ET
VIS
Auto Precharge after Write Burst (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
Start Auto Precharge
Bank B
Start Auto Precharge Bank A
Start Auto Precharge Bank B
A10
A0~A9
RAa
RAa
RBa
RBa
CBa
CAb
RBb
RBb
CBbCAa
RAc
RAc CAc
DQM
DQ
Hi-Z
Activate
Command
Bank A
DAa0
Write
Command
Bank A
DAa1
DAa2
Activate
Command
Bank B
DBa0
DAa3
Write with
Auto Precharge
Command
Bank B
DBa2 DAb2
DBa1 DBb1
DAb0
Write with Command
Bank A
DAb1
DBa3
Auto Precharge
DAb3
Activate
Command
Bank B
Auto Precharge
DBb0
Write with
Command
Bank B
DBb2 DBb3
Activate
Command
Bank A
DAc0 DAc1 DAc2 DAc3
Write with
Auto Precharge
Bank A
Start Auto
Precharge
Document:1G5-0189 Rev.1 Page 57
Bank A
Page 58
VG3617161ET
VIS
Auto Precharge after Write Burst (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
Start Auto Precharge Bank B
Start Auto Precharge Bank A
Start Auto Precharge Bank B
A10
A0~A9
RAa
RAa
CAa
RBa
RBa
CBa
CAb
RBb
RBb
CBb
DQM
DQ
Hi-Z
Activate
Command
Bank A
DAa0 DAa1
Activate
Command
Bank B
Write
Command
Bank A
DAa2
DBa0
DAa3
Write with
Auto Precharge
Command
Bank B
DBa1
DBa2 DAb2
DAb0
DBa3
Write with
Auto Precharge
Command
Bank A
DAb1
DAb3
Command
Activate
Bank B
DBb1
DBb0
Write with
Auto precharge
Command
Bank B
DBb2
DBb3
Document:1G5-0189 Rev.1 Page 58
Page 59
VG3617161ET
VIS
Full Page Read Cycle (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
CAa
Read
Command
Bank A
RBa
RBa
QAa
Activate
Command
Bank B
QAa+1
QAa+2
The burst counter wraps from the highest order page address back to zero during this time interval
QAa-2
QAa-1
CBa
QAa
Read
Command
Bank B
QAa+1
QBa QBa+1
Full page burst operation does not terminate when the burst length is satisfied; the burst counter increases and continues bursting beginning with the starting address
QBa+2
QBa+3
QBa+4
QBa+51
Precharge Command Bank B
Burst Stop Command
QBa+6
t
RP
RBb
RBb
Activate
Command
Bank B
Document:1G5-0189 Rev.1 Page 59
Page 60
VG3617161ET
VIS
Full Page Read Cycle (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
CAa
Read
Command
Bank A
RBa
RBa
Activate
Command
Bank B
QAa
QAa+2
QAa+1
The burst counter wraps from the highest order page address back to zero during this time interval
QAa-2
Read
Command
Bank B
CBa
QAa+1
QAa
QAa-1
Full page burst operation does not teminate when the burst length is satisfied; the burst counter increases and continues bursting beginning with the starting address
QBa0
QBa+1
QBa+2
QBa+3
Precharge Command Bank B
Burst Stop Command
QBa+4
t
RP
QBa+5
RBb
RBb
Activate
Command
Bank B
Document:1G5-0189 Rev.1 Page 60
Page 61
VG3617161ET
VIS
Full Page Write Cycle (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
RBa
CAa RBb
DAa
Write
Command
Bank A
RBa
DAa+1
DAa+2
DAa+3
Activate
Command
Bank B
The burst counter wraps from the highest order page address back to zero during this time interval
DAa-1
DAa
DAa+1
CBa
DBa+1
DBa
Write
Command
Bank B
DBa+2
Full page burst operation does not terminate when the burst length is satisfied; the burst counter increases and continues bursting beginning with the starting address
DBa+3
DBa+4
Data is ignored
DBa+5
DBa+6
t
BDL
Precharge Command Bank B
Burst Stop Command
RBb
Activate
Command
Bank B
Document:1G5-0189 Rev.1 Page 61
Page 62
VG3617161ET
VIS
Full Page Write Cycle (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
CAa
DAa
Write
Command
Bank A
RBa
RBa
DAa+1
DAa+2
DAa+3
Activate
Command
Bank B
The burst counter wraps from the highest order page address back to zero during this time interval
DAa-1
DAa
DAa+1
Command
Bank B
CBa
DBa+1
DBa
Write
DBa+2
Full page burst operation does not terminate when the burst length is satisfied; the burst counter increases and continues bursting beginning with the starting address
DBa+3
DBa+4
DBa+5
t
BDL
Burst Stop Command
Data is ignored.
Precharge Command Bank B
RBb
RBb
Activate
Command
Bank B
Document:1G5-0189 Rev.1 Page 62
Page 63
VIS
Byte Write Operation
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
A10
High
RAa
t
CK2
A0~A9
RAa
CAa
CAb
CAz
LDQM
UDQM
DQ0~DQ7
Hi-Z
DQ8~DQ15
Hi-Z
Activate Command
Bank A
Read
Command
Bank A
Upper Byte is masked
Lower Byte is masked
Write
Command
Bank A
Write Upper is masked
Read
Command
Bank A
Lower Byte is masked
Lower Byte is masked
Document:1G5-0189 Rev.1 Page 63
Page 64
VG3617161ET
VIS
Burst Read and Single Write Operation
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
A10
High
RAa
t
CK2
A0~A9
RAa
CAa
CAb
CAc
CAd
CAe
LDQM
UDQM
DQ0~DQ7
Hi-Z
DQ8~DQ15
Hi-Z
Activate Command
Bank A
Read
Command
Bank A
Single Write Command Bank A
Single Write Command Bank A
Read
Command
Bank A
Lower Byte is masked
Upper Byte is masked
Single Write Command Bank A
Document:1G5-0189 Rev.1 Page 64
Lower Byte is masked
Page 65
VG3617161ET
VIS
Full Page Random Column Read
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
RBa
RBa CAa CBa
CAb CBb
CBc CAc
RBb
RBb
t
RP
DQM
DQ
Hi-Z
Activate
Command
Bank A
Activate
Command
Bank B
Command
Read
Bank A
Read
Command
Bank B
Command
QAa0
Read
Bank A
QBa0
Read
Command
Bank B
QAb0
QAb1
Command
Bank A
QBb0
Read
QBb1 QAc0
QAc1
Read
Command
Bank B
QAc2
QBc1 QBc2
QBc0
Precharge
Command Bank B
(Precharge Termination)
Activate
Command
Bank B
Document:1G5-0189 Rev.1 Page 65
Page 66
VG3617161ET
VIS
Full Page Random Column Write
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=Full Page, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
t
CK2
A10
A0~A9
RAa
RAa
RBa
RBa CAa CBa
CAb CBb
CBc CAc
RBb
RBb
t
RP
DQM
DQ
Hi-Z
Activate
Command
Bank A
Activate
Command
Bank B
Command
QAa0
Write
Bank A
QBa0
Write
Command
Bank B
Command
QAb0
Write
Bank A
QAb1
Write
Command
Bank B
QBb0 QBb1
QAc0
Write
Command
Bank A
QAc1
QAc2
Write
Command
Bank B
QBc0
QBc1
QBc2
Precharge
Command Bank B
(Precharge Termination)
Write Data is masked
Command
Activate
Bank B
Document:1G5-0189 Rev.1 Page 66
Page 67
VG3617161ET
VIS
Precharge Termination of a Burst (1 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4,8 or Full Page, CAS Latency=2
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK2
A10
A0~A9
RAa
RAa
CAa
t
DPL
t
RAb
RAb
RP
RAc
RAc CAb
t
RP
CAc
t
RP
DQM
DQ
Hi-Z
Activate
Command
Bank A
QAa0
QAa1
Write
Command
Bank A
Precharge Termination
of a Write Burst. Write
data is masked.
QAa2
Da3
Precharge Command Bank A
Activate
Command
Bank A
Read
Command
Bank A
QAb1
QAb0
Precharge
Command
Bank A
Precharge Termination
of a Read Burst.
QAb2
Activate
Command
Bank A
Read
Command
Bank A
QAc0
Precharge Command
QAc1
Bank A
QAc2
Document:1G5-0189 Rev.1 Page 67
Page 68
VG3617161ET
VIS
Precharge Termination of a Burst (2 of 2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
Burst Length=4,8 or Full Page, CAS Latency=3
CLK
CKE
CS
RAS
CAS
WE
A11(BS)
High
t
CK3
A10
A0~A9
DQM
DQ
RAa
RAa
Hi-Z
Activate
Command
Bank A
t
RCD
CAa
Write
Command
Bank A
Write Data is masked
t
DPL
DAa1DAa0
Precharge Command Bank A
Precharge Termination
t
RP
Command
Bank A
of a Write Burst.
RAb
RAb
Activate
CAb
t
Read
Command
Bank A
RAS
QAb0
Activate
Command
Bank A
QAb1
QAb2
Precharge Termination of a Read Burst.
t
RP
QAb3
Command
RAc
RAc
Activate
Bank A
Document:1G5-0189 Rev.1 Page 68
Page 69
VIS
Ordering information
Part Number Frequency@CL3 Package
VG3617161ET
1,048,576 x 16 - Bit
CMOS Synchronous Dynamic RAM
VG3617161ET-6 VG3617161ET-7 VG3617161ET-8
166MHz 143MHz 125MHz
VG3617161ET- 6
• VG • VIS Memory Product
• 36 • Technology/Design Rule
• 17161 • Device Type/Configuration
• E • Mask/Design Version
• T • Package Type, T: TSOP
• 6 • Cycle time, 6: 6ns, 7: 7ns, 8: 8ns
Packaging Information
• 400mil, 50-Pin Plastic TSOP
MILLIMETERS
DIM
MIN.
A ---
0.05A1
0.95
A2 b 0.30 b1 0.30
0.12c
c1 0.11
20.82D
ZD
e
11.56
E E1 10.03 L 0.40
0.11
R
0.11
R1
NOTE:
1. CONTROLLING DIMENSION : MILLIMETERS
2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION. MOLD PROTRUSION SHALL NOT EXCEED 0.15mm(0.006") PER SIDE.
DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION.
INTERLEAD PROTRUSION SHALL NOT EXCEED 0.25mm(0.01") PER SIDE.
3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSIONS/INTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD TO BE WIDER THAN THE MAX b DIMENSION BY MORE THAN 0.13mm. DAMBAR INTRUSION SHALL NOT CAUSE THE LEAD TO BE NARROWER THAN THE MIN b DIMENSION BY MORE THAN 0.07mm.
MAX.NOM. MIN.
1.20
---
0.15---
1.05
1.00
0.45
---
0.40
---
0.21
---
0.16
---
21.08
20.95
0.875 REF.
0.80 BASIC
11.9611.76 0.455
10.29
10.16
0.60
0.50
---
---
--- 0.004 ---
---
0.002
0.037
0.012
0.012
0.005
0.0045
0.820
0.0344 REF.
0.0315 BASIC
0.395
0.016
INCHES
NOM.
---
---
0.039
---
---
---
---
0.825
0.400
0.020
---
---
MAX.
0.047
0.006
0.041
0.018
0.016
0.008
0.006
0.830
0.4710.463
0.405
0.024
0.0100.0040.25
50
1 25
ZD
400mil 50-Pin
Plastic TSOPII
26
D
48- eb
0.100(0.004)
E1
A2
A1
DETAIL A
b
b1
A
SEATING PLANE
RAD R1
L
SECTION B-B
c1
BASE METAL
WITH PLATING
DETAIL A
E
RAD R
c
B
B
0°~5°
c
Document:1G5-0189 Rev.1 Page 69
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