Please refer to "Quality Grades on NEC Semiconductor Devices" (Document No. C11531E) published by
NEC Corporation to know the specification of quality grade on the devices and its recommended applications.
In this document, the term PROM is used in parts common to one-time PROM versions and EPROM versions.
The information in this document is subject to change without notice.
Document No. U11575EJ1V0DS00 (1st edition)
(Previous No. IP-3657)
Date Published November 1996 P
Printed in Japan
Instruction execution time• 0.95, 1.91, 3.81, 15.3 µs (main system clock: during 4.19-MHz operation)
• 0.67, 1.33, 2.67, 10.7 µs (main system clock: during 6.0-MHz operation)
• 122 µs (subsystem clock: during 32.768-kHz operation)
Internal memoryPROM 16384 × 8 bits
RAM768 × 4 bits
General purpose register• 4-bit operation: 8 × 4 banks
• 8-bit operation: 4 × 4 banks
Input/CMOS input8On-chip pull-up resistors can be specified by using software: 27
output
port
*
LCD controller/driver• Segment selection:12/16/20 segments (can be changed to bit port output
Timer5 channels
Serial interface• 3-wire serial I/O mode ... MSB or LSB can be selected for transferring first bit
A/D converter8-bit resolution: 8 channels
Bit sequential buffer (BSB)16 bits
Clock output (PCL)• Φ, 524, 262, 65.5 kHz (main system clock: during 4.19-MHz operation)
Buzzer output (BUZ)• 2, 4, 32 kHz (main system clock: during 4.19-MHz operation
Vectored interruptExternal: 3, Internal: 5
Test inputExternal: 1, Internal: 1
System clock oscillator• Ceramic or crystal oscillator for main system clock oscillation
Standby functionSTOP/HALT mode
Power supply voltageVDD = 1.8 to 5.5 V
Package• 80-pin plastic QFP (14 × 14 mm)
CMOS input/output20
Bit port output8Also used for segment pins
N-ch open-drain813 V withstand voltage
3.1 Port Pins ................................................................................................................................................ 7
P00 to P03: Port0S12 to S31: Segment Output 12-31
P10 to P13: Port1COM0 to COM3 : Common Output 0-3
P20 to P23: Port2V
P30 to P33: Port3BIAS: LCD Power Supply Bias Control
P40 to P43: Port4LCDCL: LCD Clock
P50 to P53: Port5SYNC: LCD Synchronization
P60 to P63: Port6TI0 to TI2: Timer Input 0-2
P70 to P73: Port7PTO0 to PTO2: Programmable Timer Output 0-2
P80 to P83: Port8BUZ: Buzzer Clock
BP0 to BP7: Bit Port0-7PCL: Programmable Clock
KR0 to KR7: Key Return 0-7INT0, INT1, INT4 : External Vectored Interrupt 0, 1, 4
SCK: Serial ClockINT2: External Test Input 2
SI: Serial InputX1, X2: Main System Clock Oscillation 1, 2
SO: Serial OutputXT1, XT2: Subsystem Clock Oscillation 1, 2
SB0, SB1: Serial Bus 0,1RESET: Reset
REF: Analog ReferenceVPP: Programming Power Supply
AV
SS: Analog GroundVDD: Positive Power Supply
AV
AN0-AN7: Analog Input 0-7V
MD0 to MD3: Mode Selection 0-3
D0 to D7: Data Bus 0-7
(detected edge is selectable)circuit
INT0/P10 can select noise elimination /asynchronous
circuit.is selectable
INT1P11Asynchronous
INT2InputP12Rising edge detection test inputAsynchonousInput<B>-C
KR0 to KR3InputP60 to P63Parallel falling edge detection test inputInput<F>-A
KR4 to KR7InputP70 to P73Parallel falling edge detection test inputInput<F>-A
X1Input—Ceramic/crystal oscillation circuit connection for main system——
clock. If using an external clock, input to X1 and input
X2——inverted phase to X2.
XT1Input—Crystal oscillation circuit connection for subsystem clock.——
If using an external clock, input to XT1 and input inverted
XT2——phase to XT2.
RESETInput—System reset input (low level active)—<B>
MD0I/OP30/LCDCLMode selection for program memory (PROM) write/verifyInputE-B
MD1P31/SYNC
MD2, MD3P32, P33
D0 to D3I/OP40 to P43Data bus for program memory (PROM) write/verifyInputM-E
D4 to D7P50 to P53
V
PP——Programmable power supply voltage for program memory——
(PROM) write/verify.
For normal operation, connect to VDD.
Apply +12.5 V for PROM write/verify.
V
DD——Positive power supply——
VSS——Ground——
XT1 can be used as a 1-bit (test) input.
Note
Note Circuit types enclosed in brackets indicate Schmitt trigger input.
9
Page 10
µ
PD75P3036
3.2 Non-port Pins (2/2)
Pin nameI/OAlternateFunctionStatusI/O circuit
functionafter resettype
S12 to S23Output—Segment signal outputNote 1G-A
S24 to S31Output BP0 to BP7Segment signal outputNote 1H-A
COM0 to COM3
V
LC0 to VLC2——Power source for LCD driver——
BIASOutput—Output for external split resistor cutHigh—
LCDCL
Note 2
SYNC
AN0 to AN5Input—Analog signal input for A/D converterInputY
AN6P82Y-B
AN7P83
AV
REF——A/D converter reference voltage—Z-N
AV
SS——A/D converter reference GND potential—Z-N
Output—Common signal outputNote 1G-B
impedance
Note 2
Output P30/MD0Clock output for driving external expansion driverInputE-B
Output P31/MD1Clock output for synchronization of external expansion driverInputE-B
Notes 1. The VLCX (X = 0, 1, 2) shown below are selected as the input source for the display outputs.
S12 to S31: V
LC1, COM0 to COM2: VLC2, COM3: VLC0
2. These pins are provided for future system expansion. Currently, only P30 and P31 are used.
10
Page 11
3.3 Pin Input/Output Circuits
µ
The input/output circuits for the
TYPE ATYPE D
PD75P3036’s pins are shown in schematic form below.
µ
PD75P3036
(1/3)
VDD
P-ch
IN
N-ch
CMOS standard input buffer
IN
VDD
data
output
disable
Push-pull output that can be set to output high-impedance
(with both P-ch and N-ch OFF).
TYPE E-BTYPE B
P.U.R.
enable
data
Type D
output
disable
P-ch
N-ch
VDD
P.U.R.
P-ch
IN/OUT
OUT
Schmitt trigger input with hysteresis characteristics.
TYPE B-CTYPE E-E
VDD
P.U.R.
data
output
disable
P-ch
IN
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Type A
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Type D
Type A
Type B
P.U.R. : Pull-Up Resistor
VDD
P.U.R.
P-ch
IN/OUT
11
Page 12
TYPE F-ATYPE G-B
VDD
P.U.R.
µ
PD75P3036
(2/3)
*
V
LC0
output
disable
output
disable
(P)
data
output
disable
data
P.U.R.
enable
Type D
Type B
P.U.R. : Pull-Up Resistor
P.U.R.
enable
output
disable
(N)
VDD
P-ch
P-ch
N-ch
IN/OUT
VDD
P.U.R.
P-ch
IN/OUT
VLC1
COM or SEG
TYPE H-ATYPE F-B
V
SEG
data
Bit Port
data
output
disable
data
LC2
*
N-ch
Type G-A
Type E-B
P-ch
N-ch
N-ch
OUT
P-ch
IN/OUT
P.U.R. : Pull-Up Resistor
TYPE G-ATYPE M-C
*
LC0
V
VLC1
SEG
data
V
LC2
N-chP-ch
OUT
N-ch
N-ch
12
data
output
disable
P.U.R.
enable
N-ch
P.U.R. : Pull-Up Resistor
VDD
P.U.R.
P-ch
IN/OUT
Page 13
TYPE M-ETYPE Y-B
*
IN/OUT
µ
PD75P3036
VDD
(3/3)
data
output
disable
input
instruction
Note
IN
N-ch
(+13 V
withstand
V
DD
P-ch
P.U.R.
The pull-up resistor operates only when an input
instruction is executed (current flows from V
the pin when the pin is low).
P-ch
N-ch
V
DD
SS
AV
input
enable
voltage)
Note
Voltage limitation
circuit
Sampling C
reference voltage
(from voltage tap of
series resistor string)
(+13 V withstand
voltage)
DD to
VDD
+
–
AVSS
TYPE Z-NTYPE Y
data
output
disable
Note
port
input
P.U.R. : Pull-Up Resistor
*
AVREF
P.U.R.
enable
Type D
Type A
Type Y
N-chADEN
P-ch
IN/OUT
reference
voltage
Note Becomes active when an input instruction is executed.
AVSS
13
Page 14
3.4 Recommended Connection of Unused Pins
*
PinRecommended connection
P00/INT4Connect to VSS or VDD
P01/SCKConnect to VSS or VDD via a resistor individually
P02/SO/SB0
P03/SI/SB1Connect to V
P10/INT0 to P12/INT2
P13/TI0
P20/PTO0Input status : connect to V
P21/PTO1Output status: open
P22/PTO2/PCL
P23/BUZ
P30/LCDCL
P31/SYNC
P32, P33
P40 to P43Connect to V
P50 to P53
P60/KR0 to P63/KR3
P70/KR4 to P73/KR7
P80/TI1
P81/TI2
P82/AN6
P83/AN7
S12 to S23Open
S24/BP0 to S31/BP7
COM0 to COM3
V
LC0 to VLC2Connect to VSS
BIASConnect to VSS only when VLC0 to VLC2 are all not used.
Note
XT1
Note
XT2
AN0 to AN5Connect to V
VPPConnect to VDD directly
Connect to VSS or VDD
Input status : connect to VSS or VDDvia a resistor individually.
Output status: open
In other cases, leave open.
Connect to VSS or VDD
Open
SS
SS
SS or VDD
SS or VDDvia a resistor individually.
µ
PD75P3036
14
Note When the subsystem clock is not used, set SOS.0 to 1 (so as not to use
the internal feedback resistor).
Page 15
µ
PD75P3036
4. Mk I MODE AND Mk II MODE SELECTION FUNCTION
Setting a stack bank selection (SBS) register for the µPD75P3036 enables the program memory to be switched between
µ
Mk I mode and Mk II mode. This function is applicable when using the
PD75P3036 to evaluate the µPD753036.
When the SBS bit 3 is set to 1 : sets Mk I mode (supports Mk I mode for
When the SBS bit 3 is set to 0 : sets Mk II mode (supports Mk II mode for
4.1 Difference between Mk I Mode and Mk II Mode
Table 4-1 lists points of difference between the Mk I mode and the Mk II mode for the
Table 4-1. Difference between Mk I Mode and Mk II Mode
ItemMk I ModeMk II Mode
Program counterPC
Program memory (bytes)16384
Data memory (bits)768 x 4
StackStack bankSelectable via memory banks 0 to 2
CALLA !addr1 instruction
InstructionCALL !addr instruction3 machine cycles4 machine cycles
execution time CALLF !faddr instruction2 machine cycles3 machine cycles
Supported mask ROM versionsWhen set to Mk I mode for
13-0
µ
µ
PD753036)
µ
PD753036)
µ
PD75P3036.
PD753036When set to Mk II mode for µPD753036
*
Caution The Mk II mode supports a program area exceeding 16 Kbytes for the 75X and 75XL series.
Therefore, this mode is effective for enhancing software compatibility with products exceeding 16
Kbytes.
When the Mk II mode is selected, the number of stack bytes used during execution of subroutine
call instructions increases by one byte per stack compared to the Mk I mode. When the CALL !addr
and CALLF !faddr instructions are used, the machine cycle becomes longer by one machine cycle.
Therefore, use the Mk I mode if the RAM efficiency and processing performance are more important
than software compatibility.
15
Page 16
µ
PD75P3036
4.2 Setting of Stack Bank Selection Register (SBS)
Use the stack bank selection register to switch between Mk I mode and Mk II mode. Figure 4-1 shows the format for doing
this.
The stack bank selection register is set using a 4-bit memory manipulation instruction. When using the Mk I mode, be
Note
sure to initialize the stack bank selection register to 10xxB
Note
be sure to initialize it to 00xxB
.
at the beginning of the program. When using the Mk II mode,
Note Set the desired value for xx.
Figure 4-1. Format of Stack Bank Selection Register
Address3210
SBS3 SBS2 SBS1 SBS0F84H
Symbol
SBS
Stack area specification
0
0
Memory bank 0
0
1
Memory bank 1
1
0
Memory bank 2
1
1
Setting prohibited
0Be sure to enter “0” for bit 2.
Mode selection specification
01Mk II mode
Mk I mode
Cautions 1. SBS3 is set to “1” after RESET input, and consequently the CPU operates in Mk I mode. When using
instructions for Mk II mode, set SBS3 to “0” and set Mk II mode before using the instructions.
2. When using Mk II mode, execute a subroutine call instruction and an interrupt instruction after
RESET input and after setting the stack bank selection register.
16
Page 17
µ
PD75P3036
5. DIFFERENCES BETWEEN µPD75P3036 AND µPD753036
The µPD75P3036 replaces the internal mask ROM in the program memory of the µPD753036 with a one-time PROM or
µ
EPROM. The
supports the Mk II mode in the
Table 5-1 lists differences among the
products before using them with PROMs for debugging or prototype testing of application systems or, later, when using
them with a mask ROM for full-scale production.
As to CPU function and on-chip hardware, see the User’s Manual.
PD75P3036’s Mk I mode supports the Mk I mode in the µPD753036 and the µPD75P3036’s Mk II mode
µ
PD753036.
µ
PD75P3036 and the µPD753036. Be sure to check the differences among these
µ
Table 5-1. Differences between
PD75P3036 and µPD753036
Item
Program counter14 bits
Program memory (bytes)1638416384
driving power supply
Selection ofYes (can select either 2
oscillation
stabilization wait time
Selection ofYes (can select either use enabled or useNo (use enabled)
subsystem clockdisabled)
feedback resistor
Pin configuration Pin No. 29 to 32P40 to P43P40/D0 to P43/D3
Pin No. 34 to 37P50 to P53P50/D4 to P53/D7
Pin No. 50P30/LCDCLP30/LCDCL/MD0
Pin No. 51P31/SYNCP31/SYNC/MD1
Pin No. 52P32P32/MD2
Pin No. 53P33P33/MD3
Pin No. 69ICV
OtherNoise resistance and noise radiation may differ due to the different circuit sizes and mask
layouts.
µ
PD753036
17
/fX or 215/fX)
Note
µ
No (fixed to 215/fX)
PP
PD75P3036
Note
Note 217/fX is 21.8 ms during 6.0-MHz operation, and 31.3 ms during 4.19-MHz operation.
15
/fX is 5.46 ms during 6.0-MHz operation, and 7.81 ms during 4.19-MHz operation.
2
Caution Noise resistance and noise radiation are different in PROM and mask ROM versions. In transferring to
mask ROM versions from the PROM version in a process between prototype development and full
production, be sure to fully evaluate the mask ROM version’s CS (not ES).
17
Page 18
µ
PD75P3036
6. PROGRAM COUNTER (PC) AND MEMORY MAP
6.1 Program Counter (PC) ... 14 bits
This is a 14-bit binary counter that stores program memory address data.
The program memory consists of 16384 x 8-bit one-time PROM or EPROM.
• Addresses 0000H and 0001H
Vector table wherein the program start address and the values set for the RBE and MBE at the time a RESET signal is
generated are written. Reset start is possible from any address.
• Addresses 0002H to 000DH
Vector table wherein the program start address and the values set for the RBE and MBE by each vectored interrupt are
written. Interrupt processing can start from any address.
• Addresses 0020H to 007FH
Note
Table area referenced by the GETI instruction
Note The GETI instruction realizes a 1-byte instruction on behalf of any 2-byte/3-byte instruction, or two 1-byte
instructions. It is used to decrease the number of program steps.
.
18
Page 19
µ
PD75P3036
Figure 6-2 shows the addressing ranges for the program memory, branch instruction and the subroutine call instruction.
Remark For instructions other than those noted above, the BR PCDE and BR PCXA instructions can be used to branch
to addresses with changes in the PC’s lower 8 bits only.
19
Page 20
µ
PD75P3036
6.3 Data Memory (RAM) ... 768 x 4 bits
Figure 6-3 shows the data memory configuration.
Data memory consists of a data area and a peripheral hardware area. The data area consists of 768 x 4-bit static RAM.
Figure 6-3. Data Memory Map
Data area
static RAM
(768 x 4)
Display data memory
Stack area
Note
General-purpose register area
Data memory
000H
(32 x 4)
01FH
020H
256 x 4
(224 x 4)
0FFH
100H
256 x 4
(236 x 4)
1EBH
1ECH
(20 x 4)
1FFH
200H
256 x 4
Memory bank
0
1
2
2FFH
F80H
Peripheral hardware area
FFFH
Note Memory bank 0, 1, or 2 can be selected as the stack area.
Not incorporated
128 x 4
15
20
Page 21
µ
PD75P3036
7. INSTRUCTION SET
(1) Representation and coding formats for operands
In the instruction’s operand area, use the following coding format to describe operands corresponding to the instruction’s
operand representations (for further description, see the RA75X Assembler Package User’s Manual—Language(EEU-1363)). When there are several codes, select and use just one. Codes that consist of uppercase letters and + or
– symbols are key words that should be entered as they are.
For immediate data, enter an appropriate numerical value or label.
Enter register flag symbols as label descriptors instead of mem, fmem, pmem, bit, etc. (for further description, see the
User’s Manual). The number of labels that can be entered for fmem and pmem are restricted.
RepresentationCoding format
regX, A, B, C, D, E, H, L
reg1X, B, C, D, E, H, L
rpXA, BC, DE, HL
rp1BC, DE, HL
rp2BC, DE
rp’XA, BC, DE, HL, XA’, BC’, DE’, HL’
rp’1BC, DE, HL, XA’, BC’, DE’, HL’
rpaHL, HL+, HL–, DE, DL
rpa1DE, DL
n44-bit immediate data or label
n88-bit immediate data or label
mem8-bit immediate data or label
bit2-bit immediate data or label
fmemFB0H-FBFH, FF0H-FFFH immediate data or label
pmemFC0H-FFFH immediate data or label
addr0000H-3FFFH immediate data or label
addr10000H-3FFFH immediate data or label
caddr12-bit immediate data or label
faddr11-bit immediate data or label
taddr20H-7FH immediate data (however, bit0 = 0) or label
PORTnPORT0-PORT8
IEXXXIEBT, IECSI, IET0-IET2, IE0-IE2, IE4, IEW
RBnRB0-RB3
MBnMB0-MB2, MB15
Note
Note When processing 8-bit data, only even-numbered addresses can be entered.
21
Page 22
(2) Operation legend
A: A register; 4-bit accumulator
B: B register
C: C register
D: D register
E: E register
H: H register
L: L register
X: X register
XA: Register pair (XA); 8-bit accumulator
BC: Register pair (BC)
DE: Register pair (DE)
HL: Register pair (HL)
XA’: Expansion register pair (XA’)
BC’: Expansion register pair (BC’)
DE’: Expansion register pair (DE’)
HL’: Expansion register pair (HL’)
PC: Program counter
SP: Stack pointer
CY: Carry flag; bit accumulator
PSW: Program status word
MBE: Memory bank enable flag
RBE: Register bank enable flag
PORTn : Port n (n = 0 to 8)
IME: Interrupt master enable flag
IPS: Interrupt priority selection register
IEXXX : Interrupt enable flag
RBS: Register bank selection register
MBS: Memory bank selection register
PCC: Processor clock control register
.: Delimiter for address and bit
(XX): The contents addressed by XX
XXH: Hexadecimal data
µ
PD75P3036
22
Page 23
(3) Description of symbols used in addressing area
MB = MBE • MBS
*1
MB = 0
*2
MBE = 0 :
*3
MBE = 1 :
MB = 15, fmem = FB0H-FBFH, FF0H-FFFH
*4
MB = 15, pmem = FC0H-FFFH
*5
addr = 0000H-3FFFH
*6
addr, addr1 =*7(Current PC) –15 to (Current PC) –1
1000H-1FFFH (PC13, 12 = 01B: Mk I or Mk II mode) or
2000H-2FFFH (PC13, 12 = 10B: Mk I or Mk II mode) or
3000H-3FFFH (PC13, 12 = 11B: Mk I or Mk II mode)
Caution The GETI instruction is skipped for one machine cycle.
One machine cycle equals one cycle (= t
CY) of the CPU clock Φ. Use the PCC setting to select among four cycle times.
23
Page 24
µ
PD75P3036
InstructionMnemonicOperand
group
TransferMOVA, #n411A<-n4String-effect A
reg1, #n422reg1<-n4
XA, #n822XA<-n8String-effect A
HL, #n822HL<-n8String-effect B
rp2, #n822rp2<-n8
A, @HL11A<-(HL)*1
A, @HL+12+S A<-(HL), then L<-L+1*1L=0
A, @HL–12+S A<-(HL), then L<-L–1*1L=FH
A, @rpa111A<-(rpa1)*2
XA, @HL22XA<-(HL)*1
@HL, A11(HL)<-A*1
@HL, XA22(HL)<-XA*1
A, mem22A<-(mem)*3
XA, mem22XA<-(mem)*3
mem, A22(mem)<-A*3
mem, XA22(mem)<-XA*3
A, reg122A<-reg1
XA, rp’22XA<-rp’
reg1, A22reg1<-A
rp’1, XA22rp’1<-XA
XCHA, @HL11A<->(HL)*1
A, @HL+12+S A<->(HL), then L<-L+1*1L=0
A, @HL–12+S A<->(HL), then L<-L–1*1L=FH
A, @rpa111A<->(rpa1)*2
XA, @HL22XA<->(HL)*1
A, mem22A<->(mem)*3
XA, mem22XA<->(mem)*3
A, reg111A<->reg1
TBR or TCALLreferenced
Execute (taddr)(taddr+1) instructioninstruction
Addressing
Skip
condition
- - - - - - - - - - - -
- - - - - - - - - - - -
- - - - - - - - - - - -
- - - - - - - - - - - -
Notes 1. Before executing the IN or OUT instruction, set MBE to 0 or 1 and set MBS to 15.
2. TBR and TCALL instructions are assembler pseudo-instructions for the GETI instruction’s table definitions.
3. The above operations in the double boxes can be performed only in the Mk II mode. The other operations can
be performed only in the Mk I mode.
29
Page 30
µ
PD75P3036
8. PROM (PROGRAM MEMORY) WRITE AND VERIFY
The µPD75P3036 contains a 16384 x 8-bit PROM as a program memory. The pins listed in the table below are used for
this PROM’s write/verify operations. Clock input from the X1 pin is used instead of address input as a method for updating
addresses.
PinFunction
VPPPin where program voltage is applied during program memory
write/verify (usually VDD potential)
X1, X2Clock input pins for address updating during program memory
write/verify. Input the X1 pin’s inverted signal to the
X2 pin.
MD0 to MD3Operation mode selection pin for program memory write/verify
D0/P40 to D3/P438-bit data I/O pins for program memory write/verify
(lower 4 bits)
D4/P50 to D7/P53
(upper 4 bits)
V
DDPin where power supply voltage is applied. Applies 1.8 to 5.5
V in normal operation mode and +6 V for program
memory write/verify.
Caution Pins not used for program memory write/verify should be connected to VSS.
8.1 Operation Modes for Program Memory Write/Verify
When +6 V is applied to the V
DD pin and +12.5 V to the VPP pin, the
µ
PD75P3036 enters the program memory write/verify
mode. The following operation modes can be specified by setting pins MD0 to MD3 as shown below.
Program memory can be written at high speed using the following procedure.
(1) Pull unused pins to V
(2) Supply 5 V to the V
µ
(3) Wait 10
s.
SS through resistors. Set the X1 pin low.
DD and VPP pins.
(4) Select the zero-clear program memory address mode.
(5) Supply 6 V to the V
DD and 12.5 V to the VPP pins.
(6) Write data in the 1 ms write mode.
(7) Select the verify mode. If the data is correct, go to step (8) and if not, repeat steps (6) and (7).
(8) (X : number of write operations from steps (6) and (7)) x 1 ms additional write.
(9) Apply four pulses to the X1 pin to increment the program memory address by one.
(10) Repeat steps (6) to (9) until the end address is reached.
(11) Select the zero-clear program memory address mode.
(12) Return the V
DD and VPP pins back to 5 V.
(13) Turn off the power.
The following figure shows steps (2) to (9).
X repetitions
WriteVerify
Additional
write
Address
increment
µ
PD75P3036
VPP
VPP
VDD
VDD+ 1
VDD
V
X1
D0/P40-D3/P43
D4/P50-D7/P53
MD0/P30
MD1/P31
MD2/P32
MD3/P33
DD
Data input
Data
output
Data input
31
Page 32
8.3 Program Memory Read Procedure
*
µ
PD75P3036 can read program memory contents using the following procedure.
The
(1) Pull unused pins to V
(2) Supply 5 V to the V
µ
(3) Wait 10
s.
SS through resistors. Set the X1 pin low.
DD and VPP pins.
(4) Select the zero-clear program memory address mode.
(5) Supply 6 V to the V
DD and 12.5 V to the VPP pins.
(6) Select the verify mode. Apply four clock pulses to the X1 pin. Every four clock pulses will output the data stored
in one address.
(7) Select the zero-clear program memory address mode.
(8) Return the V
DD and VPP pins back to 5 V.
(9) Turn off the power.
The following figure shows steps (2) to (7).
VPP
VPP
VDD
µ
PD75P3036
VDD+ 1
VDD
DD
V
X1
D0/P40-D3/P43
D4/P50-D7/P53
MD0/P30
MD1/P31
MD2/P32
MD3/P33
Data outputData output
“L”
32
Page 33
*
*
µ
PD75P3036
9. PROGRAM ERASURE (µPD75P3036KK-T ONLY)
The µPD75P3036KK-T is capable of erasing (FFH) the data written in a program memory and rewriting.
To erase the programmed data, expose the erasure window to light having a wavelength shorter than about 400 nm.
Normally, irradiate ultraviolet rays of 254-nm wavelength. The amount of exposure required to completely erase the
programmed data is as follows:
2
• UV intensity x erasure time : 15 W• s/cm
• Erasure time : 15 to 20 minutes (when a UV lamp of 12000
needed because of deterioration in performance of the UV lamp, soiled erasure window, etc.)
When erasing the contents of data, set up the UV lamp within 2.5 cm from the erasure window. Further, if a filter is provided
for a UV lamp, irrradiate the ultraviolet rays after removing the filter.
10. OPAQUE FILM ON ERASURE WINDOW (µPD75P3036KK-T ONLY)
To protect from unintentional erasure by rays other than that of the lamp for erasing EPROM contents, and to protect
internal circuit other than EPROM from misoperating due to light radiation, cover the erasure window with an opaque film
when EPROM contents erasure is not performed.
or more
µ
W/cm2 is used. However, a longer time may be
11. ONE-TIME PROM SCREENING
Due to its structure, the one-time PROM versions (µPD75P3036GC-3B9, µPD75P3036GK-BE9) cannot be fully tested
before shipment by NEC. Therefore, NEC recommends that after the required data is written and the PROM is stored
under the temperature and time conditions shown below, the PROM should be verified via a screening.
Storage temperatureStorage time
125 ˚C24 hours
33
Page 34
12. ELECTRICAL SPECIFICATIONS
*
Absolute Maximum Ratings (TA = 25 °C)
ParameterSymbolConditionsRatingsUnit
Supply voltageVDD–0.3 to +7.0V
PROM supply voltageVPP–0.3 to +13.5V
Input voltageVI1Other than ports 4, 5–0.3 to V DD +0.3V
VI2Ports 4, 5N-ch open drain–0.3 to +14V
Output voltageVO–0.3 to VDD +0.3V
High-level output currentIOHPer pin–10mA
Total of all pins–30mA
Low-level output currentIOLPer pin30mA
Total of all pins200mA
Operating ambientTA–40 to +85
temperature
Storage temperatureTstg–65 to +150˚C
Note To drive LCD at 1.8 V ≤ VDD < 2.7 V, TA = –10 to +85 °C
Note
µ
PD75P3036
˚C
Caution If the absolute maximum ratings of even one of the parameters is exceeded even momentarily,
the quality of the product may be degraded. The absolute maximum ratings are therefore values
which, when exceeded, can cause the product to be damaged. Be sure that these values are
never exceeded when using the product.
Capacitance (T
ParameterSymbolConditionsMIN.TYP.MAX.Unit
Input capacitanceCINf = 1 MHz15pF
Output capacitanceCOUTUnmeasured pins returned to 0 V15pF
I/O capacitanceCIO15pF
A = 25 °C, VDD = 0 V)
34
Page 35
µ
PD75P3036
Main System Clock Oscillation Circuit Characteristics (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
Resonator
CeramicOscillation frequency1.06.0
resonator(fX)
CrystalOscillation frequency1.06.0
resonator(fX)
ExternalX1 input frequency1.06.0
clock(fX)
Recommended
Constants
X1X2
C1C2
DD
V
X1X2
C1C2
DD
V
X1X2
ParameterConditionsMIN.TYP.MAX.Unit
Note 1
OscillationAfter VDD has4ms
stabilization time
Note 1
OscillationVDD = 4.5 to 5.5 V10ms
stabilization time
Notes 1. The oscillation frequency and X1 input frequency shown above indicate characteristics of the
oscillation circuit only. For the instruction execution time, refer to AC Characteristics.
2. If the oscillation frequency is 4.19 MHz < f
clock control register (PCC) = 0011. If PCC = 0011, one machine cycle time is less than 0.95
short of the rated value of 0.95
µ
3. The oscillation stabilization time is the time required for oscillation to be stabilized after V
X≤ 6.0 MHz at 1.8 V ≤ VDD < 2.7 V, do not select the processor
s.
µ
s, falling
DD has been
applied or STOP mode has been released.
Caution When using the main system clock oscillation circuit, wire the portion enclosed in the dotted
line in the above figure as follows to prevent adverse influence due to wiring capacitance:
• Keep the wiring length as short as possible.
• Do not cross the wiring with other signal lines.
• Do not route the wiring in the vicinity of a line through which a high alternating current flows.
• Always keep the ground point of the capacitor of the oscillation circuit at the same potential
DD.
as V
• Do not ground to a power supply pattern through which a high current flows.
• Do not extract signals from the oscillation circuit.
35
Page 36
Subsystem Clock Oscillation Circuit Characteristics (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
OscillationVDD = 4.5 to 5.5 V1.02s
stabilization time
Note 1
XT1 input high-,515
low-level widths
(tXTH, tXTL)
Note 2
10
µ
s
Notes 1. The oscillation frequency shown above indicate characteristics of the oscillation circuit only. For the
instruction execution time, refer to AC Characteristics.
2. The oscillation stabilization time is the time required for oscillation to be stabilized after V
DD has been
applied.
Caution When using the subsystem clock oscillation circuit, wire the portion enclosed in the dotted line
in the above figure as follows to prevent adverse influence due to wiring capacitance:
• Keep the wiring length as short as possible.
• Do not cross the wiring with other signal lines.
• Do not route the wiring in the vicinity of a line through which a high alternating current flows.
• Always keep the ground point of the capacitor of the oscillation circuit at the same potential
DD.
as V
• Do not ground to a power supply pattern through which a high current flows.
• Do not extract signals from the oscillation circuit.
The subsystem clock oscillation circuit has a low amplification factor to reduce current
dissipation and is more susceptible to noise than the main system clock oscillation circuit.
Therefore, exercise utmost care in wiring the subsystem clock oscillation circuit.
36
Page 37
µ
PD75P3036
DC Characteristics (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
Low-level outputIOLPer pin15mA
currentTotal of all pins120mA
High-level inputVIH1Ports 2, 3, P82, P832.7 V ≤ VDD≤ 5.5 V 0.7 V DDVDDV
voltage1.8 V ≤ VDD < 2.7 V 0.9 V DDVDDV
VIH2Ports 0, 1, 6, 7, P80, P81,2.7 V ≤ VDD≤ 5.5 V 0.8 V DDVDDV
RESET1.8 V ≤ VDD < 2.7 V 0.9 V DDVDDV
VIH3Ports 4, 5N-ch open drain2.7 V ≤ VDD≤ 5.5 V 0.7 V DD13V
1.8 V ≤ VDD < 2.7 V 0.9 V DD13V
VIH4X1, XT1
Low-level inputVIL1Ports 2, 3, 4, 5, P82, P832.7 V ≤ VDD≤ 5.5 V00.3 V DDV
voltage1.8 V ≤ VDD < 2.7 V00.1 VDDV
VIL2Ports 0, 1, 6, 7, P80, P81,2.7 V ≤ VDD≤ 5.5 V00.2 V DDV
RESET1.8 V ≤ VDD < 2.7 V00.1 VDDV
VIL3X1, XT100.1V
High-level outputVOHSCK, SO, ports 2, 3, 6, 7, 8, BP0 to BP7VDD–0.5V
voltageIOH = –1 mA
Low-level outputVOL1SCK, SO, ports 2 to 8,IOL = 15 mA0.22.0V
voltageBP0 to BP7VDD = 4.5 to 5.5 V
IOL = 1.6 mA0.4V
VOL2SB0, SB1N-ch open drain0.2 VDDV
Pull-up resistor ≥ 1 kΩ
High-level inputILIH1VIN = VDDPins other than X1, XT13
leakage currentILIH2X1, XT120
ILIH3VIN = 13 V Ports 4, 5 (N-ch open drain)20
Low-level inputILIL1VIN = 0 VPins other than ports 4, 5, X1, XT1–3
leakage currentILIL2X1, XT1–20
Ports 4, 5 (N-ch open drain)–3
When input instruction is not executed
determined by the oscillation frequency
of the connected resonator (and external clock), the system clock control
register (SCC), and processor clock
control register (PCC).
The figure on the right shows the supply voltage V
DD vs. cycle time tCY char-
acteristics when the device operates
64
60
6
5
4
µ
3
Operation guaranteed range
with the main system clock.
CY or 128/fX depending on the setting
2. 2t
of the interrupt mode register (IM0).
2
Cycle time tCY [ s]
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
1
0.5
0123456
Supply voltage VDD [V]
39
Page 40
Serial transfer operation
µ
PD75P3036
2-wire and 3-wire serial I/O modes (SCK ··· internal clock output): (T
A = –40 to +85 °C, VDD = 1.8 to 5.5 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
SCK cycle timetKCY1VDD = 2.7 to 5.5 V1300ns
3800ns
SCK high-, low-level widthstKL1,VDD = 2.7 to 5.5 V
tKH1
Note 1
SI
setup time (to SCK ↑)tSIK1VDD = 2.7 to 5.5 V150ns
tKCY1/2–50
tKCY1/2–150
500ns
Note 1
SI
hold timetKSI1VDD = 2.7 to 5.5 V400ns
(from SCK ↑)600ns
SCK ↓→ SO
Note 1
outputt KSO1RL = 1 kΩ,VDD = 2.7 to 5.5 V0250ns
Note 2
delay timeCL = 100 pF01000ns
Notes 1. Read as SB0 or SB1 when using the 2-wire serial I/O mode.
L and CL respectively indicate the load resistance and load capacitance of the SO output line.
2. R
2-wire and 3-wire serial I/O modes (SCK ··· external clock input): (T
ParameterSymbolConditionsMIN.TYP.MAX.Unit
SCK cycle timetKCY2VDD = 2.7 to 5.5 V800ns
SCK high-, low-level widthstKL2,VDD = 2.7 to 5.5 V400ns
tKH21600ns
Note 1
SI
setup time (to SCK ↑)tSIK2VDD = 2.7 to 5.5 V100ns
Note 1
SI
hold timetKSI2VDD = 2.7 to 5.5 V400ns
(from SCK ↑)600ns
SCK ↓→ SO
Note 1
outputt KSO2RL = 1 kΩ,VDD = 2.7 to 5.5 V0300ns
delay timeCL = 100 pF01000ns
Note 2
A = –40 to +85 °C, VDD = 1.8 to 5.5 V)
3200ns
150ns
ns
ns
Notes 1. Read as SB0 or SB1 when using the 2-wire serial I/O mode.
L and CL respectively indicate the load resistance and load capacitance of the SO output line.
2. R
40
Page 41
µ
PD75P3036
SBI mode (SCK ··· internal clock output (master)): (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
SCK cycle timetKCY3VDD = 2.7 to 5.5 V1300ns
3800ns
SCK high-, low-level widthstKL3,VDD = 2.7 to 5.5 V
Each lead centerline is located within 0.10 mm (0.004 inch) of
its true position (T.P.) at maximum material condition.
detail of lead end
C
S
D
Q
R
M
ITEM MILLIMETERSINCHES
A14.0±0.20.551
B12.0±0.20.472
C12.0±0.20.472
D14.0±0.20.551
F
1.25
G1.25
0.10
+0.05
–0.04
+0.055
–0.045
H0.220.009±0.002
I
J0.5 (T.P.)
K1.0±0.20.039
L0.5±0.20.020
M0.1450.006±0.002
N0.100.004
P1.050.041
Q0.05±0.05
R5°±5°5°±5°
S1.27 MAX.0.050 MAX.
+0.009
–0.008
+0.009
–0.008
+0.009
–0.008
+0.009
–0.008
0.049
0.049
0.004
0.020 (T.P.)
+0.009
–0.008
+0.008
–0.009
0.002±0.002
P80GK-50-BE9-4
52
Page 53
*
80 PIN CERAMIC WQFN
µ
PD75P3036
A
B
T
U1
U
NOTE
Each lead centerline is located within 0.06
mm (0.003 inch) of its true position (T.P.) at
maximum material condition.
K
C
D
W
G
F
Z
ITEMMILLIMETERSINCHES
A
B
C
D
F
G
H
I
J
K
Q
R
S
TR 2.0R 0.079
U
U12.10.083
W
Z0.100.004
14.0±0.2
13.6
13.6
14.0±0.2
1.84
3.6 MAX.
0.45±0.10
0.06
0.65 (T.P.)
1.0±0.15
C 0.3
0.825
0.825
9.0
0.75±0.15
M
IH
J
X80KW-65A-1
0.551±0.008
0.535
0.535
0.551±0.008
0.072
0.142 MAX.
+0.004
0.018
–0.005
0.003
0.024 (T.P.)
+0.007
0.039
–0.006
C 0.012
0.032
0.032
0.354
+0.006
0.030
–0.007
Q
80
1
S
R
53
Page 54
µ
PD75P3036
15. RECOMMENDED SOLDERING CONDITIONS
*
Solder the µPD75P3036 under the following recommended conditions.
For the details on the recommended soldering conditions, refer to Information Document Semiconductor DeviceMounting Technology Manual (C10535E).
For the soldering methods and conditions other than those recommended, consult NEC.
Table 15-1. Soldering Conditions of Surface Mount Type
The number of days for storage after the dry pack has been opened. The storage conditions are 25 ˚C, 65 % RH max.
Package peak temperature: 235 ˚C, Reflow time: 30 seconds or below (210 ˚C
or higher), Number of reflow processes: 3 max., Exposure limit: 7 days
(After that, prebaking is necessary at 125 ˚C for 10 hours.)
Package peak temperature: 215 ˚C, Reflow time: 40 seconds or below (200 ˚C
or higher), Number of reflow processes: 3 max., Exposure limit: 7 days
(After that, prebaking is necessary at 125 ˚C for 10 hours.)
Solder temperature: 260 ˚C or below, Flow time: 10 seconds or below,
Number of flow processes: 1,
Preheating temperature: 120 ˚C or below (package surface temperature)
Exposure limit: 7 days
hours.)
Pin temperature: 300 ˚C or below, Time: 3 seconds or below (per side of device)
Note
(After that, prebaking is necessary at 125 ˚C for 10
Note
Note
Caution Do not use two or more soldering methods in combination (except the pin partial heating method).
54
Page 55
µ
PD75P3036
APPENDIX A. FUNCTION LIST OF µPD75336, 753036, AND 75P3036
The following development tools have been provided for system development using the µPD75P3036. Use the common
relocatable assembler for the series together with the device file according to the model.
IBM PC/ATRefer to "OS for3.5-inch 2HC
or compatibleIBM PCs"5-inch 2HC
TM
Refer to "OS for3.5-inch 2HC
OSSupply medium
TM
Ver.3.30 to5-inch 2HD
Note
Ver.6.2
Ver.3.30 to5-inch 2HD
Note
Ver.6.2
3.5-inch 2HD
µ
S5A13RA75X
µ
S5A10RA75X
µ
S7B13RA75X
µ
S7B10RA75X
µ
S5A13DF753036
µ
S5A10DF753036
µ
S7B13DF753036
µ
S7B10DF753036
Note Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remark Operations of the assembler and device file are guaranteed only when using the host machine and OS
described above.
56
Page 57
*
*
µ
PD75P3036
PROM Write Tools
Hardware PG-1500This is a PROM programmer that can program single-chip microcontroller with PROM in stand
alone mode or under control of host machine when connected with supplied accessory board
and optional programmer adapter.
It can also program typical PROMs in capacities ranging from 256 K to 4 Mbits.
PA-75P328GCThis is a PROM programmer adapter for the
PA-75P336GKThis is a PROM programmer adapter for the µPD75P3036GK used by connecting to a PG-1500.
PA-75P3036KK-T
SoftwarePG-1500 controllerConnects PG-1500 to host machine with serial and parallel interface and controls PG-1500 on
Note 1
This is a PROM programmer adapter for the µPD75P3036KK-T used by connecting to a PG-
1500.
host machine.
Host machinePart No. (name)
OSSupply medium
PC-9800 SeriesMS-DOS3.5-inch 2HD
Ver.3.30 to5-inch 2HD
Ver.6.2
IBM PC/ATRefer to "OS for3.5-inch 2HD
or compatibleIBM PCs"5-inch 2HC
Note 2
µ
PD75P3036GC used by connecting to a PG-1500.
µ
S5A13PG1500
µ
S5A10PG1500
µ
S7B13PG1500
µ
S7B10PG1500
Notes 1. Under development
2. Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remark Operation of the PG-1500 controller is guaranteed only when using the host machine and OS described above.
57
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Debugging Tools
In-circuit emulators (IE-75000-R and IE-75001-R) are provided as program debugging tools for the
Various system configurations using these in-circuit emulators are listed below.
µ
PD75P3036
µ
PD75P3036.
HardwareIE-75000-R
IE-75001-RThe IE-75001-R is an in-circuit emulator to be used for hardware and software debugging during
IE-75300-R-EM
EP-75336GC-RThis is an emulation probe for the
EP-75336GK-RThis is an emulation probe for the
SoftwareIE control programThis program can control the IE-75000-R or IE-75001-R on a host machine when connected to
*
Note 1
EV-9200GC-80 It includes an 80-pin conversion socket (EV-9200GC-80) to facilitate connections with target
EV-9500GK-80It includes an 80-pin conversion adapter (EV-9500GK-80) to facilitate connections with target
The IE-75000-R is an in-circuit emulator to be used for hardware and software debugging during
development of application systems using the 75X or 75XL Series products.
For development of the µPD75P3036, the IE-75000-R is used with optional emulation board (IE75300-R-EM) and emulation probe (EP-753036GC-R or EP-753036GK-R).
Highly efficient debugging can be performed when connected to host machine and PROM
programmer.
The IE-75000-R includes a connected emulation board (IE-75000-R-EM).
development of application systems using the 75X or 75XL Series products.
The IE-75001-R is used with optional emulation board (IE-75300-R-EM) and emulation probe
(EP-753036GC-R or EP-753036GK-R).
Highly efficient debugging can be performed when connected to host machine and PROM
programmer.
Note 2
This is an emulation board for evaluating application systems using the µPD75P3036.
It is used in combination with the IE-75000-R or IE-75001-R.
µ
PD75P3036GC.
When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
system.
µ
PD75P3036GK.
When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
system.
the IE-75000-R or IE-75001-R via an RS-232-C and Centronics interface.
Host machinePart No. (name)
OSSupply medium
PC-9800 SeriesMS-DOS3.5-inch 2HD
Ver.3.30 to5-inch 2HD
Note 3
Ver.6.2
IBM PC/ATRefer to "OS for3.5-inch 2HC
or compatibleIBM PCs"5-inch 2HC
µ
S5A13IE75X
µ
S5A10IE75X
µ
S7B13IE75X
µ
S7B10IE75X
Notes 1. This is a maintenance product.
2. The IE-75300-R-EM is sold separately.
3. Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remarks 1. Operation of the IE control program is guaranteed only when using the host machine and OS described
above.
µ
2. The
PD753036 and 75P3036 are commonly referred to as the µPD753036 Subseries.
58
Page 59
*
*
µ
PD75P3036
OS for IBM PCs
The following operating systems for the IBM PC are supported.
OSVersion
PC DOS
MS-DOSVer.5.0 to Ver.6.22
IBM DOS
Caution Ver. 5.0 or later includes a task swapping function, but this software is not able to use that function.
TM
TM
Ver.5.02 to Ver.6.3
J6.1/V to J6.3/V
5.0/V to 6.2/V
J5.02/V
59
Page 60
µ
PD75P3036
APPENDIX C. RELATED DOCUMENTS
*
The related documents indicated in this publication may include preliminary versions. However, preliminary versions are
not marked as such.
Documents Related to Device
DocumentDocument No.
JapaneseEnglish
µ
PD75P3036 Data SheetU11575JU11575E (this document)
(MS-DOS) base
IBM PC SeriesEEU-5008U10540E
(PC DOS) base
Other Related Documents
DocumentDocument No.
JapaneseEnglish
IC Package ManualC10943X
Semiconductor Device Mounting Technology ManualC10535JC10535E
Quality Grades on NEC Semiconductor DevicesC11531JC11531E
NEC Semiconductor Device Reliability/Quality Control SystemC10983JC10983E
Electrostatic Discharge (ESD) TestMEM-539—
Guide to Quality Assurance for Semiconductor DevicesMEI-603MEI-1202
Microcomputer – Related Product Guide – Third Party Products –MEI-604—
Caution The related documents listed above are subject to change without notice. Be sure to use the latest
documents for designing, etc.
60
Page 61
[MEMO]
µ
PD75P3036
61
Page 62
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of
the gate oxide and ultimately degrade the device operation. Steps must be taken
to stop generation of static electricity as much as possible, and quickly dissipate
it once, when it has occurred. Environmental control must be adequate. When
it is dry, humidifier should be used. It is recommended to avoid using insulators
that easily build static electricity. Semiconductor devices must be stored and
transported in an anti-static container, static shielding bag or conductive
material. All test and measurement tools including work bench and floor should
be grounded. The operator should be grounded using wrist strap. Semiconductor
devices must not be touched with bare hands. Similar precautions need to be
taken for PW boards with semiconductor devices on it.
µ
PD75P3036
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level
may be generated due to noise, etc., hence causing malfunction. CMOS devices
behave differently than Bipolar or NMOS devices. Input levels of CMOS devices
must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to VDD or GND with a resistor, if it is considered to have
a possibility of being an output pin. All handling related to the unused pins must
be judged device by device and related specifications governing the devices.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production
process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset function
have not yet been initialized. Hence, power-on does not guarantee out-pin
levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after
power-on for devices having reset function.
62
Page 63
µ
PD75P3036
Regional Information
Some information contained in this document may vary from country to country. Before using any NEC
product in your application, please contact the NEC office in your country to obtain a list of authorized
representatives and distributors. They will verify:
• Device availability
• Ordering information
• Product release schedule
• Availability of related technical literature
• Development environment specifications (for example, specifications for third-party tools and
components, host computers, power plugs, AC supply voltages, and so forth)
• Network requirements
In addition, trademarks, registered trademarks, export restrictions, and other legal issues may also vary
from country to country.
NEC Electronics Inc. (U.S.)
Santa Clara, California
Tel: 800-366-9782
Fax: 800-729-9288
United Square, Singapore 1130
Tel:253-8311
Fax: 250-3583
NEC Electronics Taiwan Ltd.
Taipei, Taiwan
Tel: 02-719-2377
Fax: 02-719-5951
NEC do Brasil S.A.
Sao Paulo-SP, Brasil
Tel: 011-889-1680
Fax: 011-889-1689
J96. 8
63
Page 64
µ
PD75P3036
MS-DOS is a trademark of Microsoft Corporation.
IBM DOS, PC DOS, and PC/AT are trademarks of International Business Machines Corporation.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
64
M4 96.5
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