BUZ: Buzzer ClockP70-P73: Port7
CL1, CL2: Main System Clock (RC)P80, P81: Port8
D0-D7: Data Bus 0-7PCL: Programmable Clock
INT0, 1, 4: External Vectored Interrupt 0, 1, 4PTO0, PTO1: Programmable Timer Output 0, 1
INT2: External Test Input 2RESET: Reset
KR0-KR7: Key Return 0-7SB0, SB1: Serial Data Bus 0, 1
MD0-MD3: Mode Selection 0-3SCK: Serial Clock
NC: No ConnectionSI: Serial Input
P00-P03: Port0SO: Serial Output
P10-P13: Port1TI0: Timer Input 0
P20-P23: Port2V
P30-P33: Port3VPP: Programming Power Supply
P40-P43: Port4V
P50-P53: Port5XT1, XT2: Subsystem Clock (Crystal)
P60-P63: Port6
DD: Positive Power Supply
SS: Ground
5
Page 6
2. BLOCK DIAGRAM
µ
PD75P0116
TI0/P13
PTO0/P20
PTO1/P21
SI/SB1/P03
SO/SB0/P02
SCK/P01
INT0/P10
INT1/P11
INT2/P12
INT4/P00
KR0/P60-
KR7/P73
BUZ/P23
BASIC INTERVAL
TIMER/
WATCHDOG
TIMER
INTBT
8-BIT
TIMER/EVENT
COUNTER #0
INTT0
8-BIT TIMER
COUNTER
CLOCKED
SERIAL
INTERFACE
INTCSI
INTERRUPT
CONTROL
8
#1
INTT1
WATCH
TIMER
INTW
RESET
TOUT0
TOUT0
PROGRAM
COUNTER (14)
PROGRAM
MEMORY
(PROM)
16384 × 8 BITS
CLOCK
OUTPUT
CONTROL
fx/2
CLOCK
DIVIDER
N
SYSTEM CLOCK
GENERATOR
ALU
DECODE
AND
CONTROL
CPU CLOCK
Φ
MAINSUB
CY
STAND BY
CONTROL
SP (8)
SBS
BANK
GENERAL
REGISTER
DATA
MEMORY
(RAM)
512 × 4 BITS
BIT SEQ.
BUFFER (16)
PORT0P00-P034
PORT1
PORT24
PORT3P30/MD0-P33/MD34
PORT4P40/D0-P43/D34
PORT5P50/D4-P53/D74
PORT6P60-P634
PORT7P70-P734
PORT8P80, P812
P10-P134
P20-P23
PCL/P22
XT1
XT2
CL2CL1
VSSVDDRESETVPP
6
Page 7
3. PIN FUNCTIONS
3.1 Port Pins
µ
PD75P0116
Pin nameI/OShared byFunction8-bitWhenI/O circuit
P00IINT4This is a 4-bit input port (PORT0).×Input<B>
P01I/OSCKare software-specifiable in 3-bit units.<F>-A
P02I/OSO/SB0<F>-B
P03I/OSI/SB1<M>-C
P10IINT0This is a 4-bit input port (PORT1).×Input<B>-C
P11INT1specifiable in 4-bit units.
P12INT2
P13TI0
P20I/OPTO0This is a 4-bit I/O port (PORT2).×InputE-B
P21PTO1specifiable in 4-bit units.
P22PCL
P23BUZ
P30I/OMD0This is a programmable 4-bit I/O port (PORT3).×InputE-B
P31MD1units. On-chip pull-up resistor connections are
P32MD2
P33MD3
Note 2
P40
Note 2
P41
Note 2
P42
Note 2
P43
Note 2
P50
Note 2
P51
Note 2
P52
Note 2
P53
P60I/OKR0This is a programmable 4-bit I/O port (PORT6).Input<F>-A
P61KR1On-chip pull-up resistor connections are softwareP62KR2
P63KR3
I/OD0This is an N-ch open-drain 4-bit I/O port (PORT4).High-
D1
D2
D3
I/OD4This is an N-ch open-drain 4-bit I/O port (PORT5).High-
D5
D6
D7
For P01 to P03, on-chip pull-up resistor connections
On-chip pull-up resistor connections are softwareP10/INT0 can select noise elimination circuit.
On-chip pull-up resistor connections are software-
Input and output can be specified in single-bit
software-specifiable in 4-bit units.
In the open-drain mode, withstands up to 13 V.impedanceM-E
In the open-drain mode, withstands up to 13 V.impedanceM-E
Input and output can be specified in single-bit units.
specifiable in 4-bit units.
I/Oresettype
Note 1
P70I/OKR4This is a 4-bit I/O port (PORT7).Input<F>-A
On-chip pull-up resistor connections are software-
P71KR5specifiable in 4-bit units.
P72KR6
P73KR7
P80I/O—This is a 2-bit I/O port (PORT8).×InputE-B
On-chip pull-up resistor connections are software-
2. Low-level input current leakage increases when input instructions or bit manipulation instructions are executed.
7
Page 8
3.2 Non-port Pins
µ
PD75P0116
Pin nameI/OShared byFunctionWhenI/O circuit
TI0IP13External event pulse input to timer/event counterInput<B>-C
PTO0OP20Timer/event counter outputInputE-B
PTO1P21Timer counter output
PCLP22Clock output
BUZP23Outputs any frequency (for buzzer or system clock trimming)
SCKI/OP01Serial clock I/OInput<F>-A
SO/SB0P02Serial data output<F>-B
INT0IP10Edge-triggered vectored interrupt input With noise eliminatorInput<B>-C
INT1P11circuit.Asynchronous
INT2P12Rising edge-triggered testable inputAsynchronous
KR0-KR3IP60-P63Falling edge-triggered testable inputInput<F>-A
KR4-KR7IP70-P73Falling edge-triggered testable inputInput<F>-A
CL1——Resistor (R) and capacitor (C) connection for main system——
CL2—
XT1I—Crystal resonator connection for subsystem clock.——
XT2—ed clock to X2. XT1 can be used as a 1-bit (test) input.
RESETI—System reset input (low level active)—<B>
MD0-MD3IP30-P33Mode selection for program memory (PROM) write/verify.InputE-B
D0-D3I/OP40-P43Data bus pin for program memory (PROM) write/verify.InputM-E
D4-D7P50-P53
Note 2
VPP
VDD——Positive power supply——
VSS——Ground potential——
——Programmable voltage supply in program memory (PROM)——
Serial data bus I/O
Serial data bus I/O
(Detects both rising and falling edges).
(detected edge is selectable)./asynch selectable
INT0/P10 can select noise elimination
clock oscillation. External clock cannot be input.
If using an external clock, input it to XT1 and input the invert-
write/verify mode.
In normal operation mode, connect directly to VDD.
Apply +12.5 V in PROM write/verify mode.
2. During normal operation, the VPP pin will not operate normally unless connected to VDD pin.
8
Page 9
3.3 I/O Circuits for Pins
The I/O circuits for the µPD75P0116’s pin are shown in schematic diagrams below.
TYPE ATYPE D
VDD
Data
IN
CMOS standard input buffer
P-ch
N-ch
Output
disable
Push-pull output that can be set to high impedance output
(with both P-ch and N-ch OFF).
µ
PD75P0116
VDD
P-ch
OUT
N-ch
(1/2)
TYPE E-BTYPE B
IN
Output
disable
Schmitt trigger input with hysteresis characteristics.
TYPE B-CTYPE F-A
VDD
P.U.R.
P-ch
P.U.R.
enable
Data
P.U.R.
enable
Type D
P.U.R. : Pull-Up Resistor
P.U.R.
enable
VDD
P.U.R.
P-ch
IN/OUT
Type A
VDD
P.U.R.
P-ch
IN
P.U.R. : Pull-Up Resistor
Data
Output
disable
Type D
IN/OUT
Type B
P.U.R. : Pull-Up Resistor
9
Page 10
TYPE F-B
output
disable
(P)
data
output
disable
output
disable
(N)
P.U.R.
enable
V
DD
P.U.R. : Pull-Up Resistor
P-ch
N-ch
V
DD
IN/OUT
P.U.R.
P-ch
µ
TYPE M-E
data
output
disable
V
DD
Input
instruction
P-ch
P.U.R.
Note Pull-up resistor that operates only when an input
instruction has been executed. (Current flows
from V
DD
to the pins when at low level)
Note
Voltage
limitation
circuit
N-ch
(+13 V)
(+13 V)
PD75P0116
(2/2)
IN/OUT
TYPE M-C
data
output
disable
P.U.R.
enable
N-ch
P.U.R. : Pull-Up Resistor
V
DD
P.U.R.
P-ch
IN/OUT
10
Page 11
3.4 Handling of Unused Pins
P00/INT4Connect to VSS or VDD
P01/SCKIndividually connect to VSS or VDD via resistor
P02/SO/SB0
P03/SI/SB1Connect to VSS
P10/INT0-P12/INT2Connect to VSS or VDD
P13/TI0
P20/PTO0
P21/PTO1
P22/PCL
P23/BUZ
P30/MD0-P33/MD3
P40/D0-P43/D3Connect to VSS
P50/D4-P53/D7
P60/KR0-P63/KR3
P70/KR4-P73/KR7
P80, P81
Note
XT1
Note
XT2
VPPMake sure to connect directly to VDD
Table 3-1. Handling of Unused Pins
PinRecommended connection
Input mode: individually connect to VSS or VDD
via resistor
Output mode : open
Input mode: individually connect to VSS or VDD
via resistor
Output mode : open
Connect to VSS or VDD
Open
µ
PD75P0116
Note When the subsystem clock is not used, set SOS. 0 to 1 (not to use the internal feedback resistor).
11
Page 12
µ
PD75P0116
4. SWITCHING BETWEEN MK I AND MK II MODES
Setting a stack bank selection (SBS) register for the µPD75P0116 enables the program memory to be switched
between the Mk I mode and the Mk II mode. This capability enables the evaluation of the µPD750104, 750106, or 750108
using the µPD75P0116.
µ
When the SBS bit 3 is set to 1: sets Mk I mode (corresponds to Mk I mode of
When the SBS bit 3 is set to 0: sets Mk II mode (corresponds to Mk II mode of µPD750104, 750106, and 750108)
4.1 Differences between Mk I Mode and Mk II Mode
Table 4-1 lists the differences between the Mk I mode and the Mk II mode of the
Table 4-1. Differences between Mk I Mode and Mk II Mode
ItemMk I modeMk II mode
Program counterPC13-0
Program memory (bytes)16384
Data memory (bits)512 × 4
StackStack bankSelectable from memory banks 0 and 1
Stack bytes2 bytes3 bytes
InstructionBRA !addr1NoneProvided
CALLA !addr1
InstructionCALL !addr3 machine cycles4 machine cycles
execution time CALLF !faddr2 machine cycles3 machine cycles
Supported mask ROM versions andMk I mode of µPD750104, 750106, andMk II mode of µPD750104, 750106, and
mode750108750108
PD750104, 750106, and 750108)
µ
PD75P0116.
Caution The Mk II mode supports a program area which exceeds 16K bytes in the 75X and 75XL series. This
mode enhances the software compatibility with products which have more than 16K bytes.
When the Mk II mode is selected, the number of stack bytes (usable area) used in execution of a
subroutine call instruction increases by 1 per stack compared to the Mk I mode. Furthermore, when
a CALL !addr, or CALLF !faddr instruction is used, each instruction takes another machine cycle.
Therefore, when more importance is attached to RAM utilization or throughput than software
compatibility, use the Mk I mode.
12
Page 13
µ
PD75P0116
4.2 Setting of Stack Bank Selection (SBS) Register
Use the stack bank selection register to switch between the Mk I mode and the Mk II mode. Figure 4-1 shows the format
for doing this.
The stack bank selection register is set using a 4-bit memory manipulation instruction. When using the Mk I mode,
Note
be sure to initialize the stack bank selection register to 100×B
Note
II mode, be sure to initialize it to 000×B
.
at the beginning of the program. When using the Mk
Note Set the desired value for ×.
Figure 4-1. Format of Stack Bank Selection Register
Address3210
SBS3 SBS2 SBS1 SBS0F84H
Symbol
SBS
Stack area specification
0
0
Memory bank 0
0
1
Memory bank 1
1
0
Setting prohibited
1
1
0Be sure to set 0 for bit 2.
Mode selection specification
01Mk II mode
Mk I mode
Caution SBS3 is set to “1” after RESET input, and consequently the CPU operates in the Mk I mode. When using
instructions for the Mk II mode, set SBS3 to “0” to enter the Mk II mode before using the instructions.
13
Page 14
µ
PD75P0116
5. DIFFERENCES BETWEEN µPD75P0116 AND µPD750104, 750106, AND 750108
The µPD75P0116 replaces the internal mask ROM in the µPD750104, 750106, and 750108 with a one-time PROM
and features expanded ROM capacity. The µPD75P0116’s Mk I mode supports the Mk I mode in the µPD750104, 750106,
and 750108 and the µPD75P0116’s Mk II mode supports the Mk II mode in the µPD750104, 750106, and 750108.
µ
Table 5-2 lists differences among the
differences between corresponding versions beforehand, especially when a PROM version is used for debugging or
prototype testing of application systems and later the corresponding mask ROM version is used for full-scale production.
µ
Please refer to the
PD750108 User's Manual (U11330E) for details on CPU functions and on-chip hardware.
Table 5-1. Differences between
PD75P0116 and the µPD750104, 750106, and 750108. Be sure to check the
µ
PD75P0116 and µPD750104, 750106, and 750108
Item
Program counter12-bit13-bit14-bit
Program memory (bytes)Mask ROMMask ROMMask ROMOne-time PROM
Data memory (× 4 bits)512
Mask optionsPull-up resistor forYes (On-chip/not on-chip can be specified.)No (On-chip not
port 4 and port 5possible)
Wait time whenYes (29/fCC or none)
releasing STOP mode
by interrupt generation
Feedback resistorYes (can select usable or unusable.)No (usable)
for subsystem clock
OtherNoise resistance and noise radiation may differ due to the different circuit complexities and
µ
PD750104
40966144819216384
mask layouts.
Note
µ
PD750106
µ
PD750108
µ
No (fixed at 29/fCC)
PD75P0116
Note
Note 29/fCC : 256 µs at 2.0 MHz, 512 µs at 1.0 MHz
Caution Noise resistance and noise radiation are different in PROM version and mask ROM versions. If using
a mask ROM version instead of the PROM version for processes between prototype development and
full production, be sure to fully evaluate the CS of the mask ROM version (not ES).
Remark For instructions other than those noted above, the “BR PCDE” and “BR PCXA” instructions can be used to
branch to addresses with changes in the PC’s lower 8 bits only.
15
Page 16
Figure 6-2. Data Memory Map
µ
PD75P0116
Data area
static RAM
(512 × 4)
General
register
area
Stack area
Note
000H
01FH
020H
0FFH
100H
1FFH
Data memory
(32 × 4)
256 × 4
(224 × 4)
256 × 4
Memory bank
0
1
Unimplemented
F80H
Peripheral hardware area
FFFH
128 × 4
Note For the stack area, one memory bank can be selected from memory bank 0 or 1.
15
16
Page 17
µ
PD75P0116
7. INSTRUCTION SET
(1) Representation and coding formats for operands
In the instruction’s operand area, use the following coding format to describe operands corresponding to the instruction’s
operand representations (for further description, refer to the RA75X Assembler Package User’s Manual - Language(EEU-1363)). When there are several codes, select and use just one. Upper-case letters, and + and – symbols are key
words that should be entered as they are.
For immediate data, enter an appropriate numerical value or label.
Instead of mem, fmem, pmem, bit, etc, a register flag symbol can be described as a label descriptor. (For further
µ
description, refer to the
restricted.
regX, A, B, C, D, E, H, L
reg1X, B, C, D, E, H, L
rpXA, BC, DE, HL
rp1BC, DE, HL
rp2BC, DE
rp’XA, BC, DE, HL, XA’, BC’, DE’, HL’
rp’1BC, DE, HL, XA’, BC’, DE’, HL’
rpaHL, HL+, HL–, DE, DL
rpa1DE, DL
n44-bit immediate data or label
n88-bit immediate data or label
mem8-bit immediate data or label
bit2-bit immediate data or label
fmemFB0H-FBFH, FF0H-FFFH immediate data or label
pmemFC0H-FFFH immediate data or label
addr0000H-3FFFH immediate data or label
addr10000H-3FFFH immediate data or label (in Mk II mode only)
caddr12-bit immediate data or label
faddr11-bit immediate data or label
taddr20H-7FH immediate data (however, bit0 = 0) or label
PORTnPORT0-PORT8
IEXXXIEBT, IECSI, IET0, IET1, IE0-IE2, IE4, IEW
RBnRB0-RB3
MBnMB0, MB1, MB15
PD750108 User's Manual (U11330E)) Labels that can be entered for fmem and pmem are
RepresentationCoding format
Note
Note When processing 8-bit data, only even addresses can be specified.
17
Page 18
(2) Operation legend
A: A register; 4-bit accumulator
B: B register
C: C register
D: D register
E: E register
H: H register
L: L register
X: X register
XA: Register pair (XA); 8-bit accumulator
BC: Register pair (BC)
DE: Register pair (DE)
HL: Register pair (HL)
XA’: Expansion register pair (XA’)
BC’: Expansion register pair (BC’)
DE’: Expansion register pair (DE’)
HL’: Expansion register pair (HL’)
PC: Program counter
SP: Stack pointer
CY: Carry flag; bit accumulator
PSW: Program status word
MBE: Memory bank enable flag
RBE: Register bank enable flag
PORTn : Port n (n = 0 to 8)
IME: Interrupt master enable flag
IPS: Interrupt priority select register
IE×××: Interrupt enable flag
RBS: Register bank select register
MBS: Memory bank select register
PCC: Processor clock control register
.: Delimiter for address and bit
(××): Contents of address ××
××H: Hexadecimal data
µ
PD75P0116
18
Page 19
(3) Description of symbols used in addressing area
MB = MBE • MBS
*1
MB = 0
*2
MBE = 0 :
*3
MBE = 1 :
MB = 15, fmem = FB0H-FBFH, FF0H-FFFH
*4
MB = 15, pmem = FC0H-FFFH
*5
addr = 0000H-3FFFH
*6
addr, addr1 =*7(Current PC) –15 to (Current PC) –1
Caution The GETI instruction is skipped for one machine cycle.
................. S = 2
One machine cycle equals one cycle (= t
CY) of the CPU clock Φ. Use the PCC setting to select among four cycle times.
20
Page 21
µ
PD75P0116
GroupMnemonicOperand
TransferMOVA, # n411A ← n4String-effect A
reg1, # n422reg1 ← n4
XA, # n822XA ← n8String-effect A
HL, # n822HL ← n8String-effect B
rp2, # n822rp2 ← n8
A, @HL11A ← (HL)*1
A, @HL+12 + S A ← (HL), then L ← L + 1*1L = 0
A, @HL–12 + S A ← (HL), then L ← L – 1*1L = FH
A, @rpa111A ← (rpa1)*2
XA, @HL22XA ← (HL)*1
@HL, A11(HL) ← A*1
@HL, XA22(HL) ← XA*1
A, mem22A ← (mem)*3
XA, mem22XA ← (mem)*3
mem, A22(mem) ← A*3
mem, XA22(mem) ← XA*3
A, reg22A ← reg
XA, rp’22XA ← rp’
reg1, A22reg1 ← A
rp’1, XA22rp’1 ← XA
XCHA, @HL11A ↔ (HL)*1
A, @HL+12 + S A ↔ (HL), then L ← L + 1*1L = 0
A, @HL–12 + S A ↔ (HL), then L ← L – 1*1L = FH
A, @rpa111A ↔ (rpa1)*2
XA, @HL22XA ↔ (HL)*1
A, mem22A ↔ (mem)*3
XA, mem22XA ↔ (mem)*3
A, reg111A ↔ reg1
Notes 1. Before executing the IN or OUT instruction, set MBE to 0 or 1 and set MBS to 15.
2. TBR and TCALL are assembler directives for the GETI instruction’s table definitions.
3. Shaded areas indicate support for the Mk II mode only. Other areas indicate support for the Mk I mode only.
27
Page 28
µ
PD75P0116
8. ONE-TIME PROM (PROGRAM MEMORY) WRITE AND VERIFY
The program memory in the µPD75P0116 is a 16384 × 8-bit electronic write-enabled one-time PROM. The pins listed
in the table below are used for this PROM’s write/verify operations. Clock input from the CL1 pins is used instead of
address input as a method for updating addresses.
Pin nameFunction
VPPPin (usually VDD) where programming voltage is applied during
CL1, CL2Clock input to the CL1 pin for address updating during program
MD0/P30-MD3/P33Operation mode selection pin for program memory write/verify
D0/P40-D3/P43 (lower 4) 8-bit data I/O pin for program memory write/verify
D4/P50-D7/P53 (higher 4)
VDDPin where power supply voltage is applied. Power voltage
Caution Pins not used for program memory write/verify should be processed as follows.
• All unused pins except XT2 ...... Connect to Vss via a pull-down resistor
• XT2 pin ........................................Leave open
program memory write/verify
memory write/verify. Leave the CL2 pin open.
range for normal operation is 1.8 to 5.5 V. Apply 6.0 V for
program memory write/verify.
8.1 Operation Modes for Program Memory Write/Verify
µ
When +6 V is applied to the
PD75P0116’s VDD pin and +12.5 V is applied to its VPP pin, program write/verify modes
are in effect. Furthermore, the following detailed operation modes can be specified by setting pins MD0 to MD3 as shown
below.
High-speed program memory write can be executed via the following steps.
SS
(1) Pull down unused pins to V
via resistors. Set the CL1 pin to low.
(2) Apply +5 V to the VDD and VPP pins.
(3) Wait 10 µs.
(4) Zero-clear mode for program memory addresses.
(5) Apply +6 V to V
DD and +12.5 V power to VPP.
(6) Write data using 1-ms write mode.
(7) Verify mode. If write is verified, go to step (8) and if write is not verified, go back to steps (6) and (7).
(8) X [= number of write operations from steps (6) and (7)] × 1 ms additional write
(9) 4 pulse inputs to the CL1 pin updates (increments +1) the program memory address.
(10) Repeat steps (6) to (9) until the last address is completed.
(11) Zero-clear mode for program memory addresses.
(12) Apply +5 V to the V
DD and VPP pins.
(13) Power supply OFF
The following diagram illustrates steps (2) to (9).
29
Page 30
µ
PD75P0116
8.3 Steps in Program Memory Read Operation
The µPD75P0116 can read out the program memory contents via the following steps.
SS
(1) Pull down unused pins to V
via resistors. Set the CL1 pin to low.
(2) Apply +5 V to the VDD and VPP pins.
(3) Wait 10 µs.
(4) Zero-clear mode for program memory addresses.
(5) Apply +6 V power to V
DD and +12.5 V to VPP.
(6) Verify mode. When a clock pulse is input to the CL1 pin, data is output sequentially to one address at a time based
on a cycle of four pulse inputs.
(7) Zero-clear mode for program memory addresses.
(8) Apply +5 V power to the V
DD and VPP pins.
(9) Power supply OFF
The following diagram illustrates steps (2) to (7).
V
PP
V
PP
V
DD
VDD+ 1
V
DD
V
DD
CL1
D0/P40-D3/P43
D4/P50-D7/P53
MD0/P30
MD1/P31
MD2/P32
Data outputData output
“L”
30
MD3/P33
Page 31
µ
PD75P0116
8.4 One-Time PROM Screening
Due to its structure, the one-time PROM cannot be fully tested before shipment by NEC. Therefore, NEC recommends
the screening process, that is, after the required data is written to the PROM and the PROM is stored under the hightemperature conditions shown below, the PROM should be verified.
Storage temperatureStorage time
125 ˚C24 hours
31
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µ
PD75P0116
9. ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings (TA = 25 ˚C)
ParameterSymbolConditionsRatingsUnit
Supply voltageV DD–0.3 to + 7.0V
PROM supply voltageVPP–0.3 to + 13.5V
Input voltageVI1Other than ports 4, 5–0.3 to VDD + 0.3V
VI2Ports 4, 5 (N-ch open drain)–0.3 to + 14V
Output voltageVO–0.3 to VDD + 0.3V
High-level output currentIOHPer pin–10mA
Total of all pins–30mA
Low-level output currentIOLPer pin30mA
Total of all pins220mA
Operating ambientTA–40 to + 85˚C
temperature
Storage temperatureTstg–65 to + 150˚C
Caution If the absolute maximum rating of even one of the parameters is exceeded even momentarily,
the quality of the product may be degraded. The absolute maximum ratings are therefore values
which, when exceeded, can cause the product to be damaged. Be sure that these values are
never exceeded when using the product.
Capacitance (T
ParameterSymbolConditionsMIN.TYP.MAX.Unit
Input capacitanceCINf = 1 MHz15pF
Output capacitanceCOUTPins other than tested pins: 0 V15pF
I/O capacitanceCIO15pF
A = 25 ˚C, VDD = 0 V)
32
Page 33
µ
PD75P0116
Main System Clock Oscillation Circuit Characteristics (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
Resonator
RC oscillationOscillation frequency0.42.0MHz
Recommended
constants
CL1CL2
ParameterConditionsMIN.TYP. MAX.Unit
Note
(fCC)
Note The oscillation frequency shown above indicates characteristics of the oscillation circuit only. For the
instruction execution time and oscillation frequency characteristics, refer to AC Characteristics.
Caution When using the main system clock oscillation circuit, wire the portion enclosed in the dotted
line in the above figure as follows to prevent adverse influences due to wiring capacitance:
· Keep the wiring length as short as possible.
· Do not cross the wiring with other signal lines.
· Do not route the wiring in the vicinity of a line through which a high alternating current flows.
· Always keep the ground point of the capacitor of the oscillation circuit at the same potential
DD.
as V
Do not ground to a power supply pattern through which a high current flows.
· Do not extract signals from the oscillation circuit.
33
Page 34
Subsystem Clock Oscillation Circuit Characteristics (TA = –40 to +85 ˚C, VDD = 1.8 to 5.5 V)
OscillationVDD = 4.5 to 5.5 V1.02s
stabilization time
Note 1
XT1 input high-,515
low-level widths
(tXTH, tXTL)
Note 2
10s
µ
s
Notes 1. The oscillation frequency shown above indicate characteristics of the oscillation circuit only. For the
instruction execution time, refer to AC Characteristics.
2. The oscillation stabilization time is the time required for oscillation to be stabilized after V
DD has been
applied.
Caution When using the subsystem clock oscillation circuit, wire the portion enclosed in the dotted line
in the above figure as follows to prevent adverse influences due to wiring capacitance:
· Keep the wiring length as short as possible.
· Do not cross the wiring with other signal lines.
· Do not route the wiring in the vicinity of a line through which a high alternating current flows.
· Always keep the ground point of the capacitor of the oscillation circuit at the same potential
DD.
as V
Do not ground to a power supply pattern through which a high current flows.
· Do not extract signals from the oscillation circuit.
The subsystem clock oscillation circuit has a low amplification factor to reduce current
dissipation and is more susceptible to noise than the main system clock oscillation circuit.
Therefore, exercise utmost care in wiring the subsystem clock oscillation circuit.
34
Page 35
µ
PD75P0116
DC Characteristics (TA = –40 to +85 ˚C, VDD = 1.8 to 5.5 V)
Notes 1. The cycle time of the CPU clock (φ) (minimum instruction execution time) when the device operates with
the main system clock is determined by the time constant of the connected resistor (R) and capacitor
(C), and the value of the processor clock control register (PCC). When the device operates with the
φ
subsystem clock, the cycle time of the CPU clock (
) is determined by the oscillation frequency of the
connected oscillator (and external clock), and the values of the system clock control register (SCC) and
processor clock control register (PCC).
The figure on the below shows the supply voltage V
DD vs. cycle time tCY characteristics when the device
operates with the main system clock.
CY or 128/fCC depending on the setting of the interrupt mode register (IM0).
2. 2t
t
CY
vs V
DD
(with main system clock)
128
6
5
Operation guaranteed range
µ
( s)
CY
4
3
2
Cycle time t
1
0.5
0
12345.5561.8
Supply voltage V
DD
[V]
37
Page 38
Serial Transfer Operation
µ
PD75P0116
2-wire and 3-wire serial I/O modes (SCK ··· internal clock output): (T
ParameterSymbolConditionsMIN.TYP.MAX.Unit
SCK cycle timetKCY1VDD = 2.7 to 5.5 V1300ns
SCK high-, low-level widthstKL1,VDD = 2.7 to 5.5 V
tKH1
Note 1
SI
setup timetSIK1VDD = 2.7 to 5.5 V150ns
(vs. SCK ↑)500ns
Note 1
SI
hold timetKSI1VDD = 2.7 to 5.5 V400ns
(vs. SCK ↑)600ns
SCK ↓→ SO
delay timeCL = 100 pF01000ns
Note 1
outputtKSO1RL = 1 kΩ
Note 2
VDD = 2.7 to 5.5 V02 50ns
A = –40 to +85 °C, VDD = 1.8 to 5.5 V)
3800ns
tKCY1/2–50
tKCY1/2–150
Notes 1. Read as SB0 or SB1 when using the 2-wire serial I/O mode.
2. RL and CL respectively indicate the load resistance and load capacitance of the SO output line.
2-wire and 3-wire serial I/O modes (SCK ··· external clock input): (T
ParameterSymbolConditionsMIN.TYP.MAX.Unit
SCK cycle timetKCY2VDD = 2.7 to 5.5 V800ns
SCK high-, low-level widthstKL2,VDD = 2.7 to 5.5 V400ns
tKH21600ns
Note 1
SI
setup timetSIK2VDD = 2.7 to 5.5 V100ns
(vs. SCK ↑)150ns
Note 1
SI
hold timetKSI2VDD = 2.7 to 5.5 V400ns
(vs. SCK ↑)600ns
SCK ↓→ SO
delay timeCL = 100 pF01000ns
Note 1
outputtKSO2RL = 1 kΩ
Note 2
VDD = 2.7 to 5.5 V03 00ns
A = –40 to +85 °C, VDD = 1.8 to 5.5 V)
3200ns
ns
ns
Notes 1. Read as SB0 or SB1 when using the 2-wire serial I/O mode.
2. RL and CL respectively indicate the load resistance and load capacitance of the SO output line.
38
Page 39
µ
PD75P0116
SBI mode (SCK ··· internal clock output (master)): (TA = –40 to +85 °C, VDD = 1.8 to 5.5 V)
Cautions 1. Keep VPP to within +13.5 V, including overshoot.
2. Apply VDD before VPP and turn it off after VPP.
µ
A
V
AC Programming Characteristics (T
ParameterSymbolNote 1ConditionsMIN.TYP.MAX.Unit
Address setup time
(vs. MD0 ↓)
MD1 setup time (vs. MD0 ↓)tM1StOES2
Data setup time (vs. MD0 ↓)tDStDS2
Address hold time
(vs. MD0 ↑)
Data hold time (vs. MD0 ↑)tDHtDH2
MD0 ↑ → data output floattDFtDF0130ns
delay time
VPP setup time (vs. MD3 ↑)tVPStVPS2
VDD setup time (vs. MD3 ↑)tVDStVCS2
Initial program pulse widthtPWtPW0.951.01.05ms
Additional program pulse width
MD0 setup time (vs. MD1 ↑)tM0StCES2
MD0 ↓ → data output delay time
MD1 hold time (vs. MD0 ↑)tM1HtOEHtM1H + tM1R≥ 50 µs2
MD1 recovery time (vs. MD0 ↓)
Program counter reset timetPCR—10
CL1 input high-, low-level width
CL1 input frequencyfCC—4.19MHz
Initial mode set timetI—2
MD3 setup time (vs. MD1 ↑)tM3S—2
MD3 hold time (vs. MD1 ↓)tM3H—2
MD3 setup time (vs. MD0 ↓)tM3SR—When program memory is read2
Address
delay time
Address
hold time
MD3 hold time (vs. MD0 ↑)tM3HR—When program memory is read2
MD3 ↓ → data output floattDFR—When program memory is read2
delay time
Note 2
Note 2
Note 2
Note 2
→ data output tDADtACCWhen program memory is read2
→ data output tHADtOHWhen program memory is read0130ns
2. The internal address signal is incremented by one at the rising edge of the fourth CL1 input and is not
connected to a pin.
44
Page 45
Program Memory Write Timing
t
VPS
V
PP
V
VDD+1
DD
V
CL1
MD0/P30
MD1/P31
MD2/P32
PP
DD
t
VDS
DD
t
I
t
PCR
t
M3S
V
V
D0/P40-D3/P43
D4/P50-D7/P53
Data input
t
DS
t
PW
t
M1S
t
t
DH
M1H
t
M1R
Data output
t
DV
t
DF
t
M0S
Data inputData input
t
DS
t
OPW
µ
PD75P0116
t
XH
t
XL
t
DH
t
AH
t
AS
t
M3H
MD3/P33
Program Memory Read Timing
V
PP
V
VDD+1
DD
V
CL1
MD0/P30
MD1/P31
PP
DD
DD
t
I
V
V
D0/P40-D3/P43
D4/P50-D7/P53
t
VPS
t
VDS
t
XH
t
XL
Data output
t
DV
t
HAD
t
DAD
Data output
t
M3HR
t
DFR
MD2/P32
MD3/P33
t
PCR
t
M3SR
45
Page 46
10. CHARACTERISTICS CURVES (REFERENCE VALUE)
DD
vs VDD (Main system clock : 1.0 MHz RC oscillation)
I
10
5.0
µ
PD75P0116
(T
A
= 25 °C)
1.0
0.5
(mA)
DD
0.1
Supply Current I
0.05
PCC = 0011
PCC = 0010
PCC = 0001
PCC = 0000
Main system clock HALT mode
+32-kHz oscillation
Subsystem clock operation mode
(Low voltage)
Subsystem clock HALT mode
(SOS.1 = 0) and main system
clock STOP mode +32-kHz
oscillation (SOS.1 = 0)
Subsystem clock HALT mode
(SOS.1 = 1) and main system
clock STOP mode +32-kHz
oscillation (SOS.1 = 1)
46
0.01
0.005
0.001
01234
Supply Voltage V
CL1
CL2 XT1XT2
RC
oscillation
22 kΩ
Crystal
resontor
32.768 kHz
220 kΩ
22 pF33 pF33 pF
5678
DD
(V)
Page 47
µ
PD75P0116
11. RC OSCILLATION FREQUENCY CHARACTERISTICS EXAMPLES (REFERENCE VALUE)
CC
vs VDD (RC oscillation, R = 22kΩ, C = 22 pF)
f
A
= –40 °C)
2.0
(MHz)
CC
1.0
CL1CL2
22 kΩ
22 pF
Sample A
(T
Main system clock frequency f
0.5
0
Sample B
Sample C
1234
2.0
CL1CL2
(MHz)
CC
22 pF
22 kΩ
1.0
Sample A
Sample B
Sample C
Main system clock frequency f
0.5
0
1234
2.0
Supply voltage VDD (V)
Supply voltage VDD (V)
5678
(T
A
= 25 °C)
5678
(T
A
= 85 °C)
CL1CL2
(MHz)
CC
1.0
22 pF
22 kΩ
Sample A
Sample B
or Sample C
Main system clock frequency f
0.5
0
1234
Supply voltage VDD (V)
5678
47
Page 48
fCC vs TA (RC oscillation, R = 22kΩ, C = 22 pF)
µ
PD75P0116
2.0
(MHz)
CC
CL1
22 pF
CL2
22 kΩ
1.0
Main system clock frequency f
0.5
–60
–40–200+20
2.0
CL1CL2
(MHz)
CC
22 pF
22 kΩ
+40+60+80+100
Operating ambient temperature TA (°C)
(Sample A)
VDD = 5.0 V
V
DD
= 3.0 V
DD
= 2.2 V
V
DD
= 1.8 V
V
(Sample B)
1.0
Main system clock frequency f
0.5
–60
–40–200+20
2.0
CL1CL2
(MHz)
CC
22 pF
22 kΩ
1.0
+40+60+80+100
Operating ambient temperature TA (°C)
DD
= 5.0 V
V
DD
= 3.0 V
V
DD
= 2.2 V
V
VDD = 1.8 V
(Sample C)
DD
= 5.0 V
V
DD
= 3.0 V
V
VDD = 2.2 V
VDD = 1.8 V
48
Main system clock frequency f
0.5
–60
–40–200+20
+40+60+80+100
Operating ambient temperature TA (°C)
Page 49
12. PACKAGE DRAWINGS
42PIN PLASTIC SHRINK DIP (600 mil)
µ
PD75P0116
42
1
22
21
A
K
L
I
J
H
G
F
D
M
N
B
C
M
R
NOTES
1) Each lead centerline is located within 0.17 mm (0.007 inch) of
its true position (T.P.) at maximum material condition.
2) Item "K" to center of leads when formed parallel.
ITEM MILLIMETERSINCHES
A
39.13 MAX.
B
1.78 MAX.
C
1.778 (T.P.)
D0.50±0.100.020
F
G
H
I
J
K
L13.20.520
M0.250.010
N
R
0.9 MIN.
3.2±0.3
0.51 MIN.
4.31 MAX.
5.08 MAX.
15.24 (T.P.)
+0.10
–0.05
0.17
0~15°0~15°
1.541 MAX.
0.070 MAX.
0.070 (T.P.)
+0.004
–0.005
0.035 MIN.
0.126±0.012
0.020 MIN.
0.170 MAX.
0.200 MAX.
0.600 (T.P.)
+0.004
–0.003
0.007
P42C-70-600A-1
49
Page 50
44 PIN PLASTIC QFP ( 10)
A
B
µ
PD75P0116
34
33
23
22
CD
44
1
11
12
F
J
G
H
M
I
K
P
N
NOTE
Each lead centerline is located within 0.16 mm (0.007 inch) of
its true position (T.P.) at maximum material condition.
L
detail of lead end
S
R
Q
M
ITEM MILLIMETERSINCHES
A13.2±0.20.520
B10.0±0.2
C10.0±0.2
D13.2±0.2
F
1.0
G
1.0
H
I
J
K
L0.8±0.2
M0.170.007
N
P
Q0.125±0.075
R3°3°
S
+0.08
0.37
–0.07
0.16
0.8 (T.P.)
1.6±0.2
+0.06
–0.05
0.10
2.7
+7°
–3°
3.0 MAX.
+0.008
–0.009
+0.008
0.394
–0.009
+0.008
0.394
–0.009
+0.008
0.520
–0.009
0.039
0.039
+0.003
0.015
–0.004
0.007
0.031 (T.P.)
0.063±0.008
+0.009
0.031
–0.008
+0.002
–0.003
0.004
0.106
0.005±0.003
+7°
–3°
0.119 MAX.
S44GB-80-3BS
50
Page 51
µ
PD75P0116
13. RECOMMENDED SOLDERING CONDITIONS
Solder the µPD75P0116 under the following recommended conditions.
For the details on the recommended soldering conditions, refer to Information Document Semiconductor
Device Mounting Technology Manual (C10535E).
For the soldering methods and conditions other than those recommended, consult NEC.
Table 13-1. Soldering Conditions of Surface Mount Type
µ
PD75P0116GB-3BS-MTX: 44-pin plastic QFP (10 × 10 mm, 0.8-mm pitch)
Caution Apply wave soldering to the pins only. Be careful not to allow solder jet to come into direct
contact with the body of the chip.
51
Page 52
µ
PD75P0116
APPENDIX A. FUNCTION LIST OF µPD750008, 750108, AND 75P0116
Parameter
Program memoryMask ROMOne-time PROM
Data memory000H-1FFH
CPU75XL CPU
General register(4 bits × 8 or 8 bits × 4) × 4 banks
Main system clock oscillation circuit Crystal/ceramic oscillation RC oscillation circuit (external resistor and capacitor)
Start-up time after reset217/fX, 215/fX56/fCC fixed
Wait time after releasing STOP220/fX, 217/fX, 215/fX, 213/fX29/fCC, no wait29/fCC fixed
mode due to interrupt occurrence(Selected by setting BTM) (Selected by mask option)
When subsystem122 µs (at 32.768 kHz operation)
clock is selected
I/O portCMOS input8 (on-chip pull-up resistors can be specified in software: 7)
CMOS input/output18 (on-chip pull-up resistors can be specified in software)
N-ch open drain8 (on-chip pull-up resistors can be specified in8 (no mask option)
input/outputsoftware), Withstand voltage is 13 VWithstand voltage is 13 V.
Total34
• 3-wire serial I/O mode ... MSB/LSB can be selected for transfer top bit
• 2-wire serial I/O mode
• SBI mode
(Main system clock: (main system clock: at 1.0-MHz operation)
at 4.19-MHz operation)• Φ, 250, 125, 31.3 kHz
• Φ, 750, 375, 93.8 kHz (main system clock: at 2.0-MHz operation)
(Main system clock:
at 6.0-MHz operation)
(Main system clock: (Subsystem clock: at 32.768-kHz operation)
at 4.19-MHz operation• 0.488, 0.977, 7.813 kHz
or subsystem clock: (Main system clock: at 1.0-MHz operation)
at 32.768-kHz operation) • 0.977, 1.953, 15.625 kHz
• 2.93, 5.86, 46.9 kHz (Main system clock: at 2.0-MHz operation)
(Main system clock:
at 6.0-MHz operation)
µ
PD750108
µ
PD75P0116
(1/2)
52
Page 53
Parameter
Vectored interruptExternal: 3, internal: 4
Test inputExternal: 1, internal: 1
Operation supply voltageVDD = 2.2 to 5.5 VVDD = 1.8 to 5.5 V
Operating ambient temperatureTA = –40 to +85 ˚C
Package• 42-pin plastic shrink DIP (600 mil, 1.778-mm pitch)
The following development tools are provided for system development using the µPD75P0116. The 75XL series uses
a common relocatable assembler, in combination with a device file matching each machine.
RA75X relocatable assemblerHost machinePart number
OSSupply medium(product name)
PC-9800 seriesMS-DOS
IBM PC/AT
or compatibleIBM PCs5" 2HC
Device fileHost machinePart number
PC-9800 seriesMS-DOS3.5" 2HD
IBM PC/ATRefer to OS for3.5" 2HC
or compatibleIBM PCs5" 2HC
TM
Refer to OS for3.5" 2HC
TM
Ver.3.30 to5" 2HD
Note
Ver.6.2
OSSupply medium(product name)
Ver.3.30 to5" 2HD
Note
Ver.6.2
3.5" 2HD
µ
S5A13RA75X
µ
S5A10RA75X
µ
S7B13RA75X
µ
S7B10RA75X
µ
S5A13DF750008
µ
S5A10DF750008
µ
S7B13DF750008
µ
S7B10DF750008
Note Ver. 5.00 and the upper versions of Ver. 5.00 are provided with a task swap function, but it does not work with this
software.
Remark The operation of the assembler and device file is guaranteed only on the above host machines and OSs.
54
Page 55
µ
PD75P0116
PROM Write Tools
HardwarePG-1500A stand-alone system can be configured of a single-chip microcomputer with on-chip PROM
when connected to an auxiliary board (companion product) and a programmer adapter
(separately sold). Alternatively, a PROM programmer can be operated on a host machine for
programming.
In addition, typical PROMs in capacities ranging from 256 K to 4 M bits can be programmed.
PA-75P008CUThis is a PROM programmer adapter for the µPD75P0116CU/GB. It can be used when
connected to a PG-1500.
SoftwarePG-1500 controllerEstablishes serial and parallel connections between the PG-1500 and a host machine for host-
machine control of the PG-1500.
Host machinePart number
OSSupply medium(product name)
PC-9800 SeriesMS-DOS3.5" 2HD
Ver.3.30 to5" 2HD
Note
Ver.6.2
IBM PC/ATRefer to OS for3.5" 2HD
or compatibleIBM PCs5" 2HC
Note Ver. 5.00 and the upper versions of Ver. 5.00 are provided with a task swapping function, but it does not work with
this software.
µ
S5A13PG1500
µ
S5A10PG1500
µ
S7B13PG1500
µ
S7B10PG1500
Remark Operation of the PG-1500 controller is guaranteed only on the above host machine and OSs.
55
Page 56
µ
PD75P0116
Debugging Tools
In-circuit emulators (IE-75000-R and IE-75001-R) are provided as program debugging tools for the µPD75P0116.
Various system configurations using these in-circuit emulators are listed below.
HardwareIE-75000-R
IE-75001-RThe IE-75001-R is an in-circuit emulator to be used for hardware and software debugging during
IE-75300-R-EMThis is an emulation board for evaluating application systems that use the µPD750108
EP-75008CU-RThis is an emulation probe for the µPD75P0116CU.
EP-75008GB-RThis is an emulation probe for the µPD75P0116GB.
EV-9200G-44When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
SoftwareIE control programThis program can control the IE-75000-R or IE-75001-R on a host machine when connected to
Note 1
The IE-75000-R is an in-circuit emulator to be used for hardware and software debugging during
development of application systems that use 75X or 75XL Series products. For development
of the µPD750108 subseries, the IE-75000-R is used with a separately sold emulation board IE75300-R-EM and emulation probe EP-75008CU-R or EP-75008GB-R.
These products can be applied for highly efficient debugging when connected to a host machine
and PROM programmer.
The IE-75000-R can include a connected emulation board (IE-75000-R-EM).
development of application systems that use 75X or 75XL Series products. The IE-75001-R is
used with a separately sold emulation board IE-75300-R-EM and emulation probe EP75008CU-R or EP-75008GB-R.
These products can be applied for highly efficient debugging when connected to a host machine
and PROM programmer.
subseries. It is used in combination with the IE-75000-R or IE-75001-R in-circuit emulator.
When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
It includes a 44-pin conversion socket EV-9200G-44 to facilitate connections with various target
systems.
the IE-75000-R or IE-75001-R via an RS-232-C or Centronics I/F.
Host machinePart number
OSSupply medium(product name)
PC-9800 seriesMS-DOS3.5" 2HD
Ver.3.30 to5" 2HD
Note 2
Ver.6.2
IBM PC/ATRefer to OS for3.5" 2HC
or compatibleIBM PCs5" 2HC
µ
S5A13IE75X
µ
S5A10IE75X
µ
S7B13IE75X
µ
S7B10IE75X
Notes 1. This is a service part provided for maintenance purpose only.
2. Ver. 5.00 and the upper versions of Ver. 5.00 are provided with a task swapping function, but it does not work
with this software.
Remarks 1. Operation of the IE control program is guaranteed only on the above host machine and OSs.
µ
2. The
PD750108 subseries consists of the µPD750104, 750106, 750108 and 75P0116.
56
Page 57
µ
PD75P0116
OS for IBM PCs
The following operating systems for the IBM PC are supported.
OSVersion
PC DOS
MS-DOSVer.5.0 to Ver.6.22
IBM DOS
Note Supports English version only.
Caution Ver 5.0 and above include a task swapping function, but this software is not able to use that function.
TM
TM
Ver.3.1 to Ver.6.3
Note
J6.1/V
5.0/V
J5.02/V
Note
Note
to J6.3/V
to J6.2/V
Note
Note
57
Page 58
µ
PD75P0116
APPENDIX C. RELATED DOCUMENTS
Some of the following related documents are preliminary. This document, however, is not indicated as
IC Package ManualC10943X
Semiconductor Device Mounting Technology ManualC10535JC10535E
Quality Grades on NEC Semiconductor DevicesC11531JC11531E
NEC Semiconductor Device Reliability/Quality Control SystemC10983JC10983E
Static Electricity Discharge (ESD) TestMEM-539–
Semiconductor Devices Quality Guarantee GuideC11893JMEI-1202
Guide for Products Related to Microcomputer : Other CompaniesC11416J–
JapaneseEnglish
Document No.
Caution The above related documents are subject to change without notice. For design purpose, etc.,
be sure to use the latest documents.
58
Page 59
[MEMO]
µ
PD75P0116
59
Page 60
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction
of the gate oxide and ultimately degrade the device operation. Steps must be
taken to stop generation of static electricity as much as possible, and quickly
dissipate it once, when it has occurred. Environmental control must be
adequate. When it is dry, humidifier should be used. It is recommended to
avoid using insulators that easily build static electricity. Semiconductor
devices must be stored and transported in an anti-static container, static
shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be
grounded using wrist strap. Semiconductor devices must not be touched with
bare hands. Similar precautions need to be taken for PW boards with
semiconductor devices on it.
µ
PD75P0116
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input
level may be generated due to noise, etc., hence causing malfunction. CMOS
device behave differently than Bipolar or NMOS devices. Input levels of CMOS
devices must be fixed high or low by using a pull-up or pull-down circuitry.
Each unused pin should be connected to VDD or GND with a resistor, if it is
considered to have a possibility of being an output pin. All handling related
to the unused pins must be judged device by device and related specifications
governing the devices.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production
process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset
function have not yet been initialized. Hence, power-on does not guarantee
out-pin levels, I/O settings or contents of registers. Device is not initialized
until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function.
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Regional Information
Some information contained in this document may vary from country to country. Before using any NEC
product in your application, please contact the NEC office in your country to obtain a list of authorized
representatives and distributors. They will verify:
• Device availability
• Ordering information
• Product release schedule
• Availability of related technical literature
• Development environment specifications (for example, specifications for third-party tools and
components, host computers, power plugs, AC supply voltages, and so forth)
• Network requirements
In addition, trademarks, registered trademarks, export restrictions, and other legal issues may also vary
from country to country.
NEC Electronics Inc. (U.S.)
Santa Clara, California
Tel: 800-366-9782
Fax: 800-729-9288
Seoul Branch
Seoul, Korea
Tel: 02-528-0303
Fax: 02-528-4411
NEC Electronics Singapore Pte. Ltd.
United Square, Singapore 1130
Tel:253-8311
Fax: 250-3583
NEC Electronics Taiwan Ltd.
Taipei, Taiwan
Tel: 02-719-2377
Fax: 02-719-5951
NEC do Brasil S.A.
Sao Paulo-SP, Brasil
Tel: 011-889-1680
Fax: 011-889-1689
J96. 8
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[MEMO]
MS-DOS is either a registered trademark or a trademark of Microsoft Corporation in the United States
and/or other countries.
IBM DOS, PC/AT, and PC DOS are trademarks of IBM Corporation.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
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