high-current Darlington transistor array. The
device consists of seven npn Darlington pairs that
feature high-voltage outputs with common-cathode clamp diodes for switching inductive loads. The
collector-current rating of a single Darlington pair is 500 mA. The Darlington pairs may be paralleled for higher
current capability. Applications include relay drivers, hammer drivers, lamp drivers, display drivers (LED and
gas discharge), line drivers, and logic buffers. The ULQ2003A has a 2.7-kΩ series base resistor for each
Darlington pair for operation directly with TTL or 5-V CMOS devices.
The ULQ2003A is offered in standard 16-pin dual in-line (N) and surface-mount (D) packaging. The device is
characterized for operation over the junction temperature range of –40°C to 105°C.
logic symbol
†
logic diagram (positive logic)
9
CLAMP
1
1B
2
2B
3
3B
4
4B
5
5B
6
6B
7
7B
†
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
×
16
15
14
13
12
10
COM
1C
2C
3C
4C
5C
11
6C
7C
1B
2B
3B
4B
5B
6B
7B
9
1
2
3
4
5
6
7
16
15
14
13
12
10
COM
1C
2C
3C
4C
5C
11
6C
7C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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Copyright 1996, Texas Instruments Incorporated
1
Page 2
ULQ2003A
PACKAGE
A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
schematics (each Darlington pair)
COM
2.7 kΩ
Input B
7.2 kΩ
All resistor values shown are nominal.
3 kΩ
absolute maximum ratings over operating temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to the emitter/substrate terminal E, unless otherwise noted.
DISSIPATION RATING TABLE
T
= 25°CDERATING FACTORT
POWER RATINGABOVE TA = 25°CAPOWER RATING
D950 mW7.6 mW/°C494 mW
N1150 mW9.2 mW/°C598 mW
= 85°C
2
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Page 3
()
See Figure 5
See Figure 8
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
electrical characteristics over operating junction temperature range, TJ = – 40°C to 105°C
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
IC = 200 mA2.7
IC = 250 mA2.9
IC = 300 mA3
IC = 100 mA,
IC = 200 mA,
IC = 350 mA,
II = 0,
IC = 500 µA,
0.91.2
11.4
1.21.7
100µA
3065µA
V
I(on)
V
CE(sat)
I
CEX
V
F
I
I(off)
I
I
I
R
C
i
On-state input voltage
Collector-emitter saturation voltage
Collector cutoff current
Clamp forward voltageIF = 350 mA, See Figure 71.72.2V
Off-state input current
Input currentVI = 3.85 V,See Figure 30.931.35mA
switching characteristics over operating junction temperature, TJ = – 40°C to 105°C
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
t
Propagation delay time, low-to-high-level output
PLH
t
Propagation delay time, high-to-low-level output
PHL
V
High-level output voltage after switching
OH
VS = 50 V,
See Figure 9
IO ≈ 300 mA,
VS–500mV
110µs
110µs
PARAMETER MEASUREMENT INFORMATION
Open
V
CE
I
I(off)
Figure 2. I
Test Circuit
I(off)
I
C
Open
Figure 1. I
Open
Test Circuit
CEX
I
CEX
V
CE
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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3
Page 4
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
PARAMETER MEASUREMENT INFORMATION
Open
I
I(on)
V
I
Open
Open
V
I
I
CE
I
C
Figure 3. I
V
I(on)
Figure 5. V
Test Circuit
I
Open
V
Test Circuit
I(on)
CE
I
C
Open
Figure 7. VF Test Circuit
V
F
Figure 4. V
Open
Figure 6. I
I
F
CE(sat)
Test Circuit
R
Test Circuit
V
R
I
R
Input
Output
50%50%
t
PHL
50%50%
VOLTAGE WAVEFORMS
t
PLH
Figure 8. Propagation Delay Time Waveforms
4
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Page 5
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
PARAMETER MEASUREMENT INFORMATION
V
S
Input
Pulse
Generator
(see Note A)
TEST CIRCUIT
≤ 5 ns
Input
10%10%
Output
NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω.
B. CL includes probe and jig capacitance.
C. VIH = 3 V
90%90%
1.5 V1.5 V
40 µs
VOLTAGE WAVEFORMS
Open
1N3064
CL = 15 pF
(see Note B)
≤ 10 ns
2 mH
200 Ω
Output
V
IH
(see Note C)
0 V
V
OH
V
OL
Figure 9. Latch-Up Test Circuit and Voltage Waveforms
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5
Page 6
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
TYPICAL CHARACTERISTICS
COLLECTOR-EMITTER SATURATION VOLTAGE
vs
COLLECTOR CURRENT
(ONE DARLINGTON)
2.5
2
II = 250 µA
II = 350 µA
1.5
1
0.5
0
CE(sat)
0
V
VCE(sat) – Collector-Emitter Saturation Voltage – V
100200300400 500 600700
IC – Collector Current – mA
II = 500 µA
Figure 10
800
COLLECTOR-EMITTER SATURATION VOLTAGE
vs
TOTAL COLLECTOR CURRENT
(TWO DARLINGTONS PARALLELED)
2.5
II = 250 µA
2
II = 350 µA
1.5
II = 500 µA
1
0.5
0
CE(sat)
VCE(sat) – Collector-Emitter Saturation Voltage – VV
0
I
– Total Collector Current – mA
C(tot)
700600500400300200100
Figure 11
800
COLLECTOR CURRENT
INPUT CURRENT
500
RL = 10 Ω
450
400
350
300
250
200
150
C
IC – Collector Current – mA
I
100
50
0
VS = 10 V
0
255075100125150 175
II – Input Current – µA
Figure 12
vs
VS = 8 V
200
6
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• HOUSTON, TEXAS 77251–1443
Page 7
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
THERMAL INFORMATION
D PACKAGE
MAXIMUM COLLECTOR CURRENT
vs
DUTY CYCLE
600
500
400
300
N = 6
200
N = 7
N = 5
100
C
I
IC – Maximum Collector Current – mA
TA = 70°C
N = Number of Outputs
0
Conducting Simultaneously
0
1020 304050 607080 90
N = 4
N = 3
Duty Cycle – %
Figure 13
N = 2
N = 1
100
N PACKAGE
MAXIMUM COLLECTOR CURRENT
vs
DUTY CYCLE
600
500
N = 2
400
300
N = 5
N = 6
N = 7
200
100
C
IC – Maximum Collector Current – mA
I
TA = 85°C
N = Number of Outputs
0
Conducting Simultaneously
0
Duty Cycle – %
Figure 14
N = 3
N = 4
N = 1
908070605040302010
100
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• HOUSTON, TEXAS 77251–1443
7
Page 8
ULQ2003A
DARLINGTON TRANSISTOR ARRAY
SLIS072 – DECEMBER 1996
APPLICATION INFORMATION
TTL
Output
V
CC
V
CC
1
2
3
4
5
6
7
8
Figure 15. TTL to Load
V
16
15
14
13
12
11
10
9
Lamp
Test
V
R
P
TTL
Output
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
Figure 16. Use of Pullup Resistors to Increase Drive Current
8
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• HOUSTON, TEXAS 77251–1443
Page 9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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