AN79Lxx/AN79LxxM Series
4
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L07 (−7V type)
•
AN79L08, AN79L08M (−8V type)
V
O
V
T
j
= 25°C
V
O
VVI = −11 to −23V, IO = 1 to 70mA
REG
IN
mV
V
I
= −10 to −24V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
IO = 1 to 40mA, Tj = 25°C
V
I
= −11 to −21V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
VI = −11 to −23V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −11 to −21V, f = 120Hz, Ta = 25°C
V
Tj = 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA, Tj = 0 to 125°C
−8.32−8
160
15
3
52
0.5
0.1
80
−8.4
80
40
5
54
−7.68
−7.6
0.8
200
− 0.6
7
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −14V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L08) and Tj = 0 to 100°C
(AN79L08M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
Tj = 25°C
V
O
VVI = −10 to −22V, IO = 1 to 70mA
REG
IN
mV
VI = −9 to −23V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
VI = −10 to −20V, Tj = 25°C
mA
Tj = 25°C
I
Bias
mA
VI = −10 to −22V, Tj = 25°C
∆I
Bias(IN)
mA
∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −10 to −20V, f = 120Hz, Ta = 25°C
V
Tj = 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA
−7.28−7
140
13
3
48
0.5
0.1
70
−7.35
70
40
5
54
−6.72
−6.65
0.8
200
− 0.5
6
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, VI = −12V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit