Datasheet uA 79L20 Datasheet (FREI)

Page 1
Voltage Regulators
1
Publication date: December 2001 SFF00006CEB
AN79Lxx/AN79LxxM Series
3-pin negative output voltage regulator (100 mA type)
■ Overview
The AN79Lxx series and the AN79LxxM series are 3-pin, fixed negative output type monolithic voltage regulators.
Stabilized fixed output voltage is obtained from un­stable DC input voltage without using any external compo­nents. 12 types of output voltage are available: −4V, −5V,
−6V, −7V, −8V, −9V, −10V, −12V, −15V, −18V, −20V and −24V. They can be used widely in power circuits with current capacity of up to 100mA.
■ Features
• No external components
• Output voltage: −4V, −5V, −6V, −7V, −8V, −9V,−10V,
−12V, −15V, −18V, −20V, −24V
• Built-in overcurrent limit circuit
• Built-in thermal overload protection circuit
SSIP003-P-0000
AN79Lxx series Unit: mm
HSIP003-P-0000B
AN79LxxM series Unit: mm
5.0±0.2
5.1±0.213.5±0.5
(1.0)(1.0)
4.0±0.2
2.3±0.2
0.6±0.15
0.43
+0.1 –0.05
2.54
0.43
+0.1 –0.05
2 13
2.6 typ.
1.6 max.
1.8 max.
4.6 max.
3.0
1.5
1.5
3 2 1
0.48 max.
0.58 max.
0.44 max.
4.25 max.
2.6 max.
0.8 min.
■ Block Diagram (AN79Lxx series)
2
1
3
Common (1)
Output (3)
Input (2)
Starter
Voltage Reference
Error Amp.
+
−
R
1
Q
1
Pass Tr.
R
SC
Current Limiter
Thermal Protection
R
2
Note) The number in ( ) shows the pin number for the AN79LxxM series.
1 : Common 2 : Input 3 : Output
1 : Output 2 : Common 3 : Intput
Note) The packages (SSIP003-P-0000 and HSIP003-
P-0000B) of this product will be changed to
lead-free t y p e ( S S I P 0 0 3 - P - 0 0 0 0 S and
HSIP003-P-0000Q). See the new package di-
mensions section later of this datasheet.
Page 2
AN79Lxx/AN79LxxM Series
2
SFF00006CEB
■ Absolute Maximum Ratings at Ta = 25°C
■ Electrical Characteristics at Ta = 25°C
•
AN79L04 (−4V type)
V
I
P
D
T
opr
T
stg
V
V
mW
°C
°C
Parameter Symbol Rating Unit
−35
*
1
−40
*
2
650
*
3
−20 to +80
−55 to +150
−55 to +125
Input voltage
Power dissipation
Operating ambient temperature
Storage temperature
AN79Lxx series
AN79LxxM series
*
1 AN79L04, AN79L05/M, AN79L06, AN79L07, AN79L08/M, AN79L09/M, AN79L10, AN79L12/M, AN79L15/M, AN79L18
*
2 AN79L20, AN79L24
*
3 Follow the derating curve. When T
j
exceeds 150°C, the internal circuit cuts off the output.
AN79LxxM series is mounted on a standard board (
g
lass epoxy: 20mm × 20mm × t1.7mm with Cu foil of 1cm2or more).
Parameter Symbol Conditions Min Typ Max
Output voltage
V
O
V
T
j
= 25°C
Output voltage tolerance
V
O
VVI = −7 to −19V, IO = 1 to 70mA
Line regulation
REG
IN
mV
V
I
= −6 to −20V, Tj = 25°C
mV
Load regulation
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
VI = −7 to −17V, Tj = 25°C
mA
T
j
= 25°C
Note 1) The specified condition Tj = 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −9V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
I
Bias
mA
V
I
= −7 to −19V, Tj = 25°C
Bias current fluctuation to input
∆I
Bias(IN)
mA
Bias current fluctuation to load
∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
Output noise voltage
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
Ripple rejection ratio
RR
VI = −7 to −17V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
Minimum input/output voltage difference
V
DIF(min)
mA
Output short-circuit current
I
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
Output voltage temperature coefficient
∆V
O/Ta
IO = 5mA
Unit
−4.16−4
80
10
3
38
0.5
0.1
40
−4.2
60
30
5
55
−3.84
−3.8
0.8
200
− 0.4
4.5
Page 3
AN79Lxx/AN79LxxM Series
3
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L05, AN79L05M (−5V type)
•
AN79L06 (−6V type)
V
O
V
T
j
= 25°C
V
O
VVI = −9 to −21V, IO = 1 to 70mA
REG
IN
mV
V
I
= −8 to −22V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −9 to −19V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
V
I
= −9 to −21V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
RR
VI = −9 to −19V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−
6.24
−
6
120
12
3
44
0.5
0.1
60
−
6.3
60
30
5
55
−
5.76
−
5.7
0.8
200
−
0.4
5.5
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −11V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
T
j
= 25°C
V
O
VVI = −8 to −20V, IO = 1 to 70mA
REG
IN
mV
V
I
= −7 to −21V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −8 to −18V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
VI = −8 to −20V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
−4.8
RR
VI = −8 to −18V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA
−5.2−5
100
11
3
40
0.5
0.1
50
−5.25
60
30
5
55
−4.75
0.8
200
− 0.4
5
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −10V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L05) and Tj = 0 to 100°C
(AN79L05M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
Page 4
AN79Lxx/AN79LxxM Series
4
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L07 (−7V type)
•
AN79L08, AN79L08M (−8V type)
V
O
V
T
j
= 25°C
V
O
VVI = −11 to −23V, IO = 1 to 70mA
REG
IN
mV
V
I
= −10 to −24V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
IO = 1 to 40mA, Tj = 25°C
V
I
= −11 to −21V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
VI = −11 to −23V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −11 to −21V, f = 120Hz, Ta = 25°C
V
Tj = 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA, Tj = 0 to 125°C
−8.32−8
160
15
3
52
0.5
0.1
80
−8.4
80
40
5
54
−7.68
−7.6
0.8
200
− 0.6
7
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −14V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L08) and Tj = 0 to 100°C
(AN79L08M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
Tj = 25°C
V
O
VVI = −10 to −22V, IO = 1 to 70mA
REG
IN
mV
VI = −9 to −23V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
VI = −10 to −20V, Tj = 25°C
mA
Tj = 25°C
I
Bias
mA
VI = −10 to −22V, Tj = 25°C
∆I
Bias(IN)
mA
∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −10 to −20V, f = 120Hz, Ta = 25°C
V
Tj = 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA
−7.28−7
140
13
3
48
0.5
0.1
70
−7.35
70
40
5
54
−6.72
−6.65
0.8
200
− 0.5
6
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, VI = −12V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
Page 5
AN79Lxx/AN79LxxM Series
5
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L09, AN79L09M (−9V type)
•
AN79L10 (−10V type)
V
O
V
T
j
= 25°C
V
O
VVI = −13 to −25V, IO = 1 to 70mA
REG
IN
mV
V
I
= −12 to −26V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −13 to −23V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
V
I
= −13 to −25V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
RR
VI = −13 to −23V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−10.4−10
160
17
3
65
0.5
0.1
80
−10.5
100
50
5
53
−9.6
−9.5
0.8
200
− 0.7
9
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −16V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
T
j
= 25°C
V
O
VVI = −12 to −24V, IO = 1 to 70mA
REG
IN
mV
V
I
= −11 to −25V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −12 to −22V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
VI = −12 to −24V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −12 to −22V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA, Tj = 0 to 125°C
−9.36−9
160
16
3
58
0.5
0.1
80
−9.45
90
50
5
53
−8.64
−8.55
0.8
200
− 0.6
8
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −15V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L09) and Tj = 0 to 100°C
(AN79L09M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
Page 6
AN79Lxx/AN79LxxM Series
6
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L12, AN79L12M (−12V type)
•
AN79L15, AN79L15M (−15V type)
V
O
V
Tj = 25°C
V
O
VVI
= −
18 to −28V, IO = 1 to 70mA
REG
IN
mV
VI = −17.5 to −33V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
IO = 1 to 40mA, Tj = 25°C
V
I
= −18 to −28V, Tj = 25°C
mA
Tj = 25°C
I
Bias
mA
VI = −18 to −30V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
RR
VI = −18 to −28V, f = 120Hz, Ta = 25°C
V
Tj = 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−15.6−15
200
25
3
90
0.5
0.1
100
−15.75
130
60
5
51
−14.4
−14.25
0.8
200
− 0.9
12
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition Tj = 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −23V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L15) and Tj = 0 to 100°C
(AN79L15M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
T
j
= 25°C
V
O
VVI = −15 to −27V, IO = 1 to 70mA
REG
IN
mV
V
I
= −14.5 to −30V, Tj = 25°C
mV
REG
L
mV
IO = 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −15 to −25V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
VI = −15 to −27V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
IO = 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, Ta = 25°C
RR
VI = −15 to −25V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
VI = −35V, Tj = 25°C
∆VO/T
a
IO = 5mA
−12.5−12
200
20
3
75
0.5
0.1
100
−12.6
100
50
5
52
−11.5
−11.4
0.8
200
− 0.8
10
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −19V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C (AN79L12) and Tj = 0 to 100°C
(AN79L12M)
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
Page 7
AN79Lxx/AN79LxxM Series
7
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L18 (−18V type)
•
AN79L20 (−20V type)
V
O
V
T
j
= 25°C
V
O
VVI = −21 to −33V, IO = 1 to 70mA
REG
IN
mV
V
I
= −21 to −33V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
VI = −21 to −32V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
V
I
= −21 to −33V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
5
RR
VI = −22 to −32V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−18.7−18
200
30
3
110
0.5
0.1
100
−18.9
160
80
50
−17.3
−17.1
0.8
200
−1
15
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −27V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
V
O
V
T
j
= 25°C
V
O
VVI = −23 to −35V, IO = 1 to 70mA
REG
IN
mV
V
I
= −23 to −35V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
V
I
= −24 to −34V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
V
I
= −23 to −35V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
RR
VI = −24 to −34V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−20.8−20
200
35
3
135
0.5
0.1
100
−21
180
90
5
49
−19.2
−19
0.8
200
−1
17
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −29V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
Page 8
AN79Lxx/AN79LxxM Series
8
SFF00006CEB
■ Electrical Characteristics at Ta = 25°C (continued)
•
AN79L24 (−24V type)
■ Main Characteristics
V
O
V
T
j
= 25°C
V
O
VVI = −27 to −38V, IO = 1 to 70mA
REG
IN
mV
V
I
= −27 to −38V, Tj = 25°C
mV
REG
L
mV
I
O
= 1 to 100mA, Tj = 25°C
mV
I
O
= 1 to 40mA, Tj = 25°C
VI = −27 to −37V, Tj = 25°C
mA
T
j
= 25°C
I
Bias
mA
V
I
= −27 to −38V, Tj = 25°C
∆I
Bias(IN)
mA∆I
Bias(L)
µV
I
O
= 1 to 40mA, Tj = 25°C
V
no
dB
f = 10Hz to 100kHz, T
a
= 25°C
RR
VI = −28 to −38V, f = 120Hz, Ta = 25°C
V
T
j
= 25°C
V
DIF(min)
mAI
O(Short)
mV/°C
V
I
= −35V, Tj = 25°C
∆V
O/Ta
IO = 5mA
−25−24
200
40
3
170
0.5
0.1
100
−25.2
200
100
5
49
−23
−22.8
0.8
200
−1
20
Parameter Symbol Conditions Min Typ Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −33V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Unit
1.0
0.8
0.6
0.4
0.2
0
0 20 40 60 80 100 120 140 160
Ambient temperature Ta (°C)
Power dissipation P
D
(W)
PD Ta (AN79Lxx series)
−5.12
−5.08
−5.04
−5.00
−4.96
−4.92
−4.88
−4.84
−4.80
Junction temperature Tj (°C)
Output voltage V
O
(V)
VO T
j
−25 0 25 50 75 100 125
AN79L05 V
I
= −10V
I
O
= 1mA
1.0
0.8
0.6
0.4
0.2
0
0 20 40 60 80 100 120 140 160
Ambient temperature Ta (°C)
Power dissipation P
D
(W)
PD Ta (AN79LxxM series)
Independent IC without a heat sink R
th(j-a)
= 190°C/W
P
D
= 658mW (25°C)
Mounted on standard board (glass epoxy: 20 mm × 20 mm × t1.7mm with Cu foil of 1cm
2
or more)
Page 9
AN79Lxx/AN79LxxM Series
9
SFF00006CEB
■ Main Characteristics (continued)
120
100
80
60
40
20
0
10 100
AN79L05 I
O
= 5mA
1k 10k 100k
Frequency f (Hz)
Ripple rejection ratio RR (dB)
RR f
0 2 4 6 8 10
Time t (µs)
10
0
−10
−20
20
15
10
5
Output voltage fluctuation (mV)
Input voltage V
I
(V)
Input transient response
AN79L05
0 10 20 30 40 50
Time t (µs)
1
0
−1
−2
200
100
0
Output voltage fluctuation (V)
Load current I
O
(mA)
Load transient response
AN79L05
1.4
1.2
1.0
0.8
0.6
0.4
−50 0 50 100 150
Junction temperature Tj (°C)
Minimum input/output voltage difference V
DIF(min)
(V)
V
DIF(min)
T
j
IO = 100mA
I
O
=
20m
A
I
O
=
10m
A
I
O
=
1mA
AN79L05
■ Basic Regulator Circuit
C
O
C
I
Input−V
I
−V
O
Output
AN79Lxx
Common
3
1
2
−
+
−
+
Connect CI of 2µF when the input line is long. CO improves the transient response. 1µF
Page 10
AN79Lxx/AN79LxxM Series
10
SFF00006CEB
■ Usage Notes
1. Cautions for a basic circuit
CI: When a wiring from a smoothing circuit to a three-pin regulator
is long, it is likely to oscillate at output. A capacitor of 0.1µF to
0.47µF should be connected near an input pin.
C
O
: Deadly needed to prevent from oscillation (0.33µF to 1.0µF). It
is recommended to use a capacitor of a small internal imped­ance (ex. tantalum capacitor) when using it under a low tem­perature. When any sudden change of load current is likely to occur, con­nect an electrolytic capacitor of 10µF to 100µF to improve a transitional response of output voltage.
D
i
: Normally unnecessary. But add it in the case that there is a
residual voltage at the output capacitor Co even after switching off the supply power because a current is likely to flow into an output pin of the IC and damage the IC.
2. Other caution items
1) Short-circuit between the input pin and GND pin
If the input pin is short-circuitted to GND or is cut off when a large capacitance capacitor has been con­nected to the IC's load, a voltage of a capacitor con­nected to an output pin is applied between input/out­put of the IC and this likely results in damage of the IC. It is necessary, therefore, to connect a diode, as shown in figure 2, to counter the reverse bias between input/output pins.
2) Floating of GND pin
If a GND pin is made floating in an operating mode, an unstabilized input voltage is outputted. In this case, a thermal protection circuit inside the IC does not normally operate. In this state, if the load is short-circuited or overloaded, it is likely to damage the IC.
■ Application Circuit Example
Figure 1
C
O
V
O
C
I
V
I
D
i
1
3
2
In
GND
Out
Figure 2
C
O
Output
1
3
2
− +
−V
O
2µF
1µF
I
Bias
AN79Lxx
3
1
2
R
2
R
1
VO'
−V
I
Input
Common
Output
|VO | = VO' 1 + + IQR
1
R
2
R
1
−
+
−
+
Note) VO varies due to sample to sample variation of I
Bias
.
Never fail to adjust individually with R1 .
Page 11
AN79Lxx/AN79LxxM Series
11
SFF00006CEB
■ New Package Dimensions (Unit: mm)
•
SSIP003-P-0000S (Lead-free package)
•
HSIP003-P-0000Q (Lead-free package)
(1.00)
(1.00)
31
5.00±0.20
4.00±0.20
2.30±0.20
0.60±0.15
0.40±0.10
5.00±0.20
13.30±0.50
0.40
+0.10
-
0.05
1.27 1.27
31
0.42
+0.10
-
0.05
1.00
+0.10
-
0.20
0.40
+0.10
-
0.05
4.00
+0.25
-
0.20
2.50
±0.10
4.50
±0.10
1.55
±0.20
2.65
±0.10
(0.40)
1.50
±0.10
(0.75)
3.00
1.50
M
0.15
0.10
0.50
+0.10
-
0.05
0.40
+0.10
-
0.05
Page 12
Please read the following notes before using the datasheets
A. These materials are intended as a reference to assist customers with the selection of Panasonic
semiconductor products best suited to their applications. Due to modification or other reasons, any information contained in this material, such as available product types, technical data, and so on, is subject to change without notice. Customers are advised to contact our semiconductor sales office and obtain the latest information before starting precise technical research and/or purchasing activities.
B. Panasonic is endeavoring to continually improve the quality and reliability of these materials but
there is always the possibility that further rectifications will be required in the future. Therefore, Panasonic will not assume any liability for any damages arising from any errors etc. that may ap­pear in this material.
C. These materials are solely intended for a customer's individual use.
Therefore, without the prior written approval of Panasonic, any other use such as reproducing, selling, or distributing this material to a third party, via the Internet or in any other way, is prohibited.
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
(1) An export permit needs to be obtained from the competent authorities of the Japanese Govern-
ment if any of the products or technologies described in this material and controlled under the "Foreign Exchange and Foreign Trade Law" is to be exported or taken out of Japan.
(2) The technical information described in this material is limited to showing representative character-
istics and applied circuit examples of the products. It does not constitute the warranting of industrial property, the granting of relative rights, or the granting of any license.
(3) The products described in this material are intended to be used for standard applications or gen-
eral electronic equipment (such as office equipment, communications equipment, measuring in­struments and household appliances). Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly jeopardize life or harm the human body.
• Any applications other than the standard applications intended.
(4) The products and product specifications described in this material are subject to change without
notice for reasons of modification and/or improvement. At the final stage of your design, purchas­ing, or use of the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the guaranteed values, in particular those of maxi-
mum rating, the range of operating power supply voltage and heat radiation characteristics. Other­wise, we will not be liable for any defect which may arise later in your equipment. Even when the products are used within the guaranteed values, redundant design is recommended, so that such equipment may not violate relevant laws or regulations because of the function of our products.
(6) When using products for which dry packing is required, observe the conditions (including shelf life
and after-unpacking standby time) agreed upon when specification sheets are individually exchanged.
(7) No part of this material may be reprinted or reproduced by any means without written permission
from our company.
2001 MAR
Loading...