Datasheet TSL1410R Datasheet (TAOS)

Page 1
TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
1280 × 1 Sensor-Element Organization 400 Dot-Per-Inch (DPI) Sensor Pitch High Linearity and Uniformity Wide Dynamic Range...4000:1 (72 dB) Output Referenced to Ground Low Image Lag ... 0.5% Typ Operation to 8 MHz Single 3-V to 5-V Supply Rail-to-Rail Output Swing (AO) No External Load Resistor Required Replacement for TSL1410
Description
The TSL1410R linear sensor array consists of t w o sections of 640 photodiodes, each with associated charge amplifier circuitry, aligned to form a contiguous 1280 × 1 pixel array. The device incorporates a pixel data-hold function that provides simultaneous-integration start and stop times for all pixels. The pixels measure 63.5 µm by
55.5 µm with 63.5-µm center-to-center spacing and 8-µm spacing between pixels. Operation is simplified by internal logic that requires only a serial-input (SI) pulse and a clock.
(TOP VIEW)
1 2 3 4 5 6 7 8
9 10 11 12 13
V
PP
SI1 HOLD1 CLK1 GND AO1 SO1 SI2 HOLD2 CLK2 SO2 AO2 V
DD
The device is intended for use in a wide variety of applications including mark and code reading, OCR and contact imaging, edge detection and positioning, and optical encoding.
Functional Block Diagram (each section)
Pixel 1 (641)
3, 9
Hold
4,10
CLK 640-Bit Shift Register (2 each)
2,8
SI
Integrator
Reset
_ +
Sample/
Output
Switch Control Logic
Pixel
2
(642)
Pixel
3
(643)
Q3Q2Q1Hold
Pixel
640
(1280)
Q640 (Q1280)
Analog
Bus
Output Buffer
Gain Trim
13
6, 12
7, 11
V
DD
AO
5
GND
SO
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800 Jupiter Road, Suite 205 Plano, TX 75074 (972) 673-0759
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
Terminal Functions
TERMINAL
NAME NO.
AO1 6 O Analog output, section 1. AO2 12 O Analog output, section 2. CLK1 4 I Clock, section 1. CLK1 controls charge transfer, pixel output, and reset. CLK2 10 I Clock, section 2. CLK2 controls charge transfer, pixel output, and reset. GND 5 Ground (substrate). All voltages are referenced to GND.
HOLD1 3 I HOLD2 9 I Hold signal. HOLD2 shifts pixel data to parallel buffer. HOLD2 is normally connected to SI2 in parallel mode.
SI1 2 I Serial input (section 1). SI1 defines the start of the data-out sequence. SI2 8 I Serial input (section 2). SI2 defines the start of the data-out sequence. SO1 7 O Serial output (section 1). SO1 provides a signal to drive the SI2 input in serial mode.
SO2 11 O V
DD
V
PP
I/O DESCRIPTION
Hold signal. HOLD1 shifts pixel data to parallel buffer. HOLD1 is normally connected to SI1 and HOLD2 in serial mode and to SI1 in parallel mode.
Serial output (section 2). SO2 provides a signal to drive the SI input of another device for cascading or as an end-of-data indication.
13 Supply voltage for both analog and digital circuitry.
1 Normally grounded.
Detailed Description
The sensor consists of 1280 photodiodes, called pixels, arranged in a linear array. Light energy impinging on a pixel generates photocurrent that is then integrated by the active integration circuitry associated with that pixel.
During the integration period, a sampling capacitor connects to the output of the integrator through an analog switch. The amount of charge accumulated at each pixel is directly proportional to the light intensity on that pixel and the integration time.
The output and reset of the integrators are controlled by a 640-bit shift register and reset logic. An output cycle is initiated by clocking in a logic 1 on SI. Another signal, called HOLD, is generated from the rising edge of SI1 when SI1 and HOLD1 are connected together. This causes all 640 sampling capacitors to be disconnected from their respective integrators and starts an integrator reset period. As the SI pulse is clocked through the shift register, the charge stored on the sampling capacitors is sequentially connected to a charge-coupled output amplifier that generates a voltage on analog output AO. The integrator reset period ends 18 clock cycles after the SI pulse is clocked in. Then the next integration period begins. On the 640th clock rising edge, the SI pulse is clocked out on the SO1 pin (section 1) and becomes the SI pulse for section 2 (when SO1 is connected to SI2). The rising edge of the 641st clock cycle terminates the SO1 pulse, and returns the analog output AO of section 1 to high-impedance state. Similarly, SO2 is clocked out on the 1280th clock pulse. Note that a 1281st clock pulse is needed to terminate the SO2 pulse and return AO of Section 2 to the high-impedance state. Sections 1 and 2 may be operated in parallel or in serial fashion.
AO is an op amp-type output that does not require an external pull-down resistor. This design allows a rail-to-rail output voltage swing. With V
for saturation light level. When the device is not in the output phase, AO is in a high-impedance state. The voltage developed at analog output (AO) is given by:
where:
V
out
V
drk
R E
e
t
int
is the analog output voltage for white condition is the analog output voltage for dark condition is the device responsivity for a given wavelength of light given in V/(µJ/cm2)
e
is the incident irradiance in µW/cm is integration time in seconds
= 5 V, the output is nominally 0 V for no light input, 2 V for normal white level, and 4.8 V
DD
V
out
= V
+ (Re) (Ee)(t
drk
2
int
)
A 0.1 µF bypass capacitor should be connected between VDD and ground as close as possible to the device.
2
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VDD –0.3 V to 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI –0.3 V to VDD + 0.3V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0) or (VI > VDD) –20 mA to 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VDD) –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the high impedance or power-off state, VO –0.3 V to VDD + 0.3 V. . . Continuous output current, I
(V
= 0 to VDD) –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
O
Continuous current through VDD or GND –40 mA to 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog output current range, IO –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum light exposure at 638 nm 5 mJ/cm
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
–25°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Recommended Operating Conditions
MIN NOM MAX UNIT
Supply voltage, V Input voltage, V High-level input voltage, V Low-level input voltage, V Wavelength of light source, λ 400 1100 nm Clock frequency, f Sensor integration time, Serial, t Sensor integration time, Parallel, t Setup time, serial input, t Hold time, serial input, t Operating free-air temperature, T
Load capacitance, C Load resistance, R
NOTE 1: SI must go low before the rising edge of the next clock pulse.
DD
I
IH
IL
clock
int
int
su(SI)
(see Note 1) 0 ns
h(SI)
A
L
L
3 5 5.5 V 0 V
VDD × 0.7 V
0 VDD × 0.3 V
5 8000 kHz
0.162 100 ms
0.082 100 ms 20 ns
0 70 °C
300
DD DD
330 pF
V V
2
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
Electrical Characteristics at f
= 330 , Ee = 12.5 µW/cm2 (unless otherwise noted) (see Note 2)
R
L
= 1 MHz, VDD = 5 V, TA = 25°C, λp = 640 nm, t
clock
= 5 ms,
int
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V V
Analog output voltage (white, average over 1280 pixels) See Note 3 1.6 2 2.4 V
out
Analog output voltage (dark, average over 1280 pixels) Ee = 0 0 0.1 0.3 V
drk
PRNU Pixel response nonuniformity See Note 4 ±20%
Nonlinearity of analog output voltage See Note 5 ±0.4% Output noise voltage See Note 6 1 mVrms
R
V
SE Saturation exposure DSNU Dark signal nonuniformity All pixels, E
Responsivity See Note 7 78 112
e
V
= 5 V, RL = 330 4.5 4.8
Analog output saturation voltage
sat
DD
V
= 3 V, RL = 330 2.5 2.8
DD
V
= 5 V, See Note 8 155
DD
V
= 3 V, See Note 8 90
DD
= 0, See Note 9 0.05 0.15 V
e
IL Image lag See Note 10 0.5%
V
= 5 V, E
I I
I C
C
DD
IH IL
Supply current High-level input current VI = V
Low-level input current VI = 0 10 µA Input capacitance, SI 25 pF
i
Input capacitance, CLK 25 pF
i
V
DD DD
= 3 V, E
= 0 30 45
e
= 0 25 40
e
DD
NOTES: 2. All measurements made with a 0.1 µF capacitor connected between VDD and ground.
3. The array is uniformly illuminated with a diffused LED source having a peak wavelength of 640 nm.
4. PRNU is the maximum difference between the voltage from any single pixel and the average output voltage from all pixels of the device under test when the array is uniformly illuminated at the white irradiance level. PRNU includes DSNU.
5. Nonlinearity is defined as the maximum deviation from a best-fit straight line over the dark-to-white irradiance levels, as a percent of analog output voltage (white).
6. RMS noise is the standard deviation of a single-pixel output under constant illumination as observed over a 5-second period.
7. R
8. SE(min) = [V
e(min)
= [V
out(min)
sat(min)
– V
– V
drk(max)
drk(min)
] ÷ (Ee × t
] ×〈Ee × t
int
)
int
) ÷[V
out(max)
– V
drk(min)
]
9. DSNU is the difference between the maximum and minimum output voltage for all pixels in the absence of illumination.
10. Image lag is a residual signal left in a pixel from a previous exposure. It is defined as a percent of white-level signal remaining after a pixel is exposed to a white condition followed by a dark condition:
IL
V
V
out (white)
out (IL)
V
V
drk
100
drk
V/
J/cm2)
nJ/cm
mA
10 µA
V
2
Timing Requirements (see Figure 1 and Figure 2)
t t t t tr, t
NOTES: 11. Input pulses have the following characteristics: tr = 6 ns, tf = 6 ns.
4
Setup time, serial input (see Note 11) 20 ns
su(SI)
Hold time, serial input (see Note 11 and Note 12) 0 ns
h(SI)
Propagation delay time, SO 50 ns
pd(SO)
Pulse duration, clock high or low 50 ns
w
Input transition (rise and fall) time 0 500 ns
f
12. SI must go low before the rising edge of the next clock pulse.
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MIN NOM MAX UNIT
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
Dynamic Characteristics over recommended ranges of supply voltage and operating free-air temperature (see Figures 7 and 8)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t t
Analog output settling time to ±1% RL = 330 Ω, CL = 50 pF 120 ns
s
Propagation delay time, SO1, SO2 50 ns
pd(SO)
TYPICAL CHARACTERISTICS
CLK
SI1
Internal
Reset
18 Clock Cycles
tint
Integration
CLK
t
SI
SO
Not Integrating Integrating
1281 Clock Cycles
AO
Hi-Z Hi-Z
Figure 1. Timing Waveforms (serial connection)
t
w
1 2 640 641
su(SI)
50%
t
h(SI)
t
s
t
pd(SO)
t
pd(SO)
2.5 V
5 V
0 V
5 V
0 V
AO
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Pixel 1
Pixel 640
Figure 2. Operational Waveforms (Each Section)
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
TYPICAL CHARACTERISTICS
PHOTODIODE SPECTRAL RESPONSIVITY
1
TA = 25°C
0.8
0.6
0.4
NORMALIZED IDLE SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
2
1.5
1
Normalized Responsivity
0.2
0 300 500 700 900
λ – Wavelength – nm
Figure 3
WHITE OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
2
VDD = 5 V t
= 0.5 ms to 15 ms
int
1.5
1
— Output Voltage — V
out
V
0.5
0.5
— Normalized Idle Supply Current
DD
I
1100400 600 800 1000
0
010 3040 7060
20
TA – Free-Air Temperature – °C
50
Figure 4
DARK OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
0.10 t
= 0.5 ms
int
t
int
t
= 15 ms
int
t
int
t
= 2.5 ms
int
= 1 ms
= 5 ms
0.09
0.08
— Output Voltage
out
V
0.07
VDD = 5 V
0
010 3040 706020
TA – Free-Air Temperature – °C
6
Figure 5
50
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0.06
010 3040 706020
50
TA – Free-Air Temperature – °C
Figure 6
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1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TYPICAL CHARACTERISTICS
TSL1410R
TAOS043 – AUGUST 2002
SETTLING TIME
vs.
LOAD
600
500
400
300
200
Settling Time to 1% — ns
100
VDD = 3 V
V
= 1 V
out
0
0 200 400 600 800 1000
RL — Load Resistance –
Figure 7
470 pF
220 pF
100 pF
10 pF
SETTLING TIME
vs.
LOAD
600
500
400
300
200
Settling Time to 1% — ns
100
VDD = 5 V V
= 1 V
out
0
0 200 400 600 800 1000
RL — Load Resistance –
Figure 8
470 pF
220 pF
100 pF
10 pF
APPLICATION INFORMATION
1 2
3 4
5 6
7 8 9
10 11 12
13
SERIAL PARALLEL
V
DD
SI1/HOLD1/HOLD2
CLK1 and CLK2
SO1 SI2
SO2 AO1/AO2
Figure 9. Operational Connections
1 2
3 4
5 6
7 8
9 10 11 12
13
SI1/HOLD1
CLK1 and CLK2
AO1 SO1 SI2/HOLD2
SO2 AO2
V
DD
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
MECHANICAL DATA
TOP VIEW
0.100 (2,54) x 12 = 1.2 (30,48)) (Tolerance Noncumulative)
0.270 (0,69)
0.158 (4,01)
0.150 (3,81) To Pixel 1
0.242 (6,15)
0.222 (5,64)
0.090 (2,28)
DIA (2 Places)
0.121 (0,53) 13 Places
DETAIL A
0.100 (2,54) BSC
113
3.535(89,79)
3.525 (89,54)
3.705 (94,11)
3.695 (93,85)
0.075 (0,191)
Centerline of Pixels is on the
Centerline of Mounting Holes
1.170 (29,72)
1.160 (29,46)
0.510 (12,95)
0.490 (12,45)
0.130 (3,30)
0.120 (3,05)
(Index of Refraction = 1.52)
Linear Array
0.048 (1,22)
0.038 (0,97)
Bonded Chip
Bypass Cap
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Pixel centers are in line with center line of mounting holes.
Cover Glass
Cover Glass
DETAIL A
Figure 10. TSL1410R Mechanical Specifications
0.015 (0,38) Typical Free Area
0.027 (0,690)
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
PRODUCTION DATA — information in this document is current at publication date. Products conform to specifications in accordance with the terms of Texas Advanced Optoelectronic Solutions, Inc. standard warranty. Production processing does not necessarily include testing of all parameters.
NOTICE
Texas Advanced Optoelectronic Solutions, Inc. (TAOS) reserves the right to make changes to the products contained in this document to improve performance or for any other purpose, or to discontinue them without notice. Customers are advised to contact TAOS to obtain the latest product information before placing orders or designing TAOS products into systems.
TAOS assumes no responsibility for the use of any products or circuits described in this document or customer product design, conveys no license, either expressed or implied, under any patent or other right, and makes no representation that the circuits are free of patent infringement. TAOS further makes no claim as to the suitability of its products for any particular purpose, nor does TAOS assume any liability arising out of the use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages.
TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS, INC. PRODUCTS ARE NOT DESIGNED OR INTENDED FOR USE IN CRITICAL APPLICATIONS IN WHICH THE FAILURE OR MALFUNCTION OF THE TAOS PRODUCT MAY RESUL T I N PERSONAL INJURY OR DEATH. USE OF TAOS PRODUCTS IN LIFE SUPPORT SYSTEMS IS EXPRESSLY UNAUTHORIZED AND ANY SUCH USE BY A CUSTOMER IS COMPLETELY AT THE CUSTOMER’S RISK.
LUMENOLOGY is a registered trademark, and TAOS, the TAOS logo, and Texas Advanced Optoelectronic Solutions are trademarks of Texas Advanced Optoelectronic Solutions Incorporated.
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TSL1410R
1280 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS043 – AUGUST 2002
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