The TSA1201 is a 12-bit, 50MHz maximum
sampling frequency Analog to Digital converter
using a CMOS technology combining high
performances and very low power consumption.
The TSA1201 is based on a pipeline structure and
digital error correction to provide excellent static
linearity and achieve 10.5 effective bits at
Fs=50Msps, and Fin=15M Hz, with a global power
consumption of 150mW.
The TSA1201 features adaptative behaviour to
the application. Its architecture allows to sample
from 0.5Msps up to 50Msps, with a programmable
power consumption which makes the application
board even more optimized.
It integrates a proprietary track-and-hold structure
to ensure an high analog bandwidth of 1GHz and
enable IF-sampling.
Several features are available on the device. A
voltage reference is integrated in the circuit.
Differential or single-ended analog inputs can be
applied. The output data can be coded into two
differential formats. A Data Ready signal is raised
as the data is valid on the output and can be used
for synchronization purposes.
The TSA1201 is available in extended (-40°C to
+85°C) temperature range, in small 48 pins TQFP
package.
ORDER CODE
Part Number
TSA1201IF-40°C to +85°CTQFP48TraySA120 1I
TSA1201IFT-40°C to +85°CTQFP48Tape & ReelSA1201I
EVAL1201/AAEvaluation board
Temperature
Range
PackageConditioningMarking
PIN CONNECTIONS (top view)
GNDBE
VCCBE
VCCBI
SRC
OEB
NC
GNDBE
GNDBI
DGND
VCCBENCOR
DR
23 24
NC
37
NC
36
D0 (LSB)
35
D1
34
33
D2
32
D3
31
D4
30
D5
D6
29
D7
28
D8
27
26
D9
25
D10
D11 (MSB)
index
corner
IPOL
VREFP
VREFM
AGND
VIN
AGND
VINB
AGND
INCM
AGND
AVCC
AVCC
AVCC
AGND
AVCC
DFSB
4844 43 42 41 40 39 38
46 45
47
1
2
3
4
5
6
7
8
9
10
11
12
13 14 15 16 17 18 19 20 21 22
DVCC
DVCC
TSA1201
CLK
DGND
DGND
PACKAGE
7 x 7 mm TQFP48
APPLICATIONS
■ High speed data acquisition
■ Medical imaging and ultrasound
■ Portable instrumentation
■ High speed DSP interface
■ Digital communica t ion - IF s ampling
March 2001
1/20
Page 2
TSA1201
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValuesUnit
AVCC
DVCC
VCCBI
VCCBE
Analog Supply voltage
Digital Supply voltage
Digital buffer Supply voltage
Digital buffer Supply voltage
TstgStorage temperature+150°C
Electrical Static Discharge
ESD
- HBM
- CDM-JEDEC Standard
1. All voltages v al ues, except diffe rential vol tage, are with respect to net work ground termi nal. The m agnitude of input and outpu t volt ag es
must neve r exceed -0. 3V or VCC+0V
1IPOLAnalog bi as current input25D10Digital outp utCMOS output (2.5V/3.3V)
2VREFP To p voltage re ference1V26D9Digital outp utCMOS output (2.5V/3.3V)
3VREFM Bottom voltage refer ence0V27D8Digital outputCMOS output (2.5V/3.3V)
4AGNDAnalog ground0V 28D7Digital outputCMOS output (2.5V/3.3V)
5VINAnalog input1Vpp29D6Digital outputCMOS output (2.5V/3.3V)
6AGNDAnalog ground0V30D5Digital outputCMOS output (2.5V/3.3V)
7VINBInverted analog input1Vpp31D4Digital outputCMOS output (2.5V/3.3V)
8AGNDAnalog ground0V32D3Digital outputCMOS output (2.5V/3.3V)
9INCMInput common mode0.5V33D2Digital outputCMOS output (2.5V/3.3V)
10AGNDAnalog ground0V34D1Digital outputCMOS output (2.5V/3.3V)
11AVCCAnalog power supply2.5V35D0(LSB) Least Significant Bit output CMOS output (2.5V/3.3V)
12AVCCAnalog power supply2.5V36NCNon connected
13DVCCDigital power supply2.5V37NCNon con nected
14DVCCDigital power supply2.5V38DRData Ready outputCMOS output (2.5V/3.3V)
15DGNDDigital ground0V39VCCBE Digital Buffer po wer su pply 2.5V/3.3V
16CLKClock input2.5V compatible CMOS input40GND BE Digital Buffer ground0V
17DGNDDigital ground0V41VCCBI Digital Buff er power supply 2.5V
18NCNon connec ted42NCNon connected
19DGNDDigita l ground0V43SRCSlew ra te cont r ol input2.5V/3.3V CMOS input
20GNDBIDigital buffer ground0V44OEBOutput Enable input2.5V/3.3V CMOS input
21GNDBE Digital buffer ground0V45DFSBData Format Select input2.5V/3.3V CMOS input
22VCCBE Digital buffer power supply 2.5V/3.3V46AVCCAnalog power supply2.5V
23OROut Of Range outputCMOS output (2.5V/3.3V)47AVCCAnalog power supply2.5V
24D11(MSB) Most Significant Bit outputCMOS output (2.5V/3.3V)48AGNDAnalog ground0V
Tmin= -40°C to Tmax= 85°C. Not fully test ed over the tem perature range. Guara nted by sampli ng.
1)
2)
1)
2)
1)
2)
1)
2)
1)
2)
61.664.9dB
60.7dB
6164.4dB
60dB
1010.5bits
9.9bits
-77.2-68dBc
-67dBc
-74.3-68dB
-64dB
7/20
Page 8
TSA1201
DEFINITIONS OF SPECIFIED PARAMETERS
STATIC PARAMETERS
Static measurements are performed through
method of histograms on a 2MHz input signal,
sampled at 50Msps, which is high e nough to fully
characterize the test frequency response. The
input level is +1dBFS to saturate the signal.
Differen tial N on Li n e ari ty (DNL)
The average de viation of any output code width
from the ideal code width of 1LSB.
Integral Non linearity (INL)
An ideal c onverter pres ents a t ransf er f unct ion as
being the straight line from the starting code to the
ending code. The INL is the deviation for each
transition from this ideal curve.
DYNAMIC PARAMETERS
Dynamic measurements are performed by
spectral analysis, appl ied to an i nput sinew ave of
various frequencies and sampled at 50Msps.
Spurious Free Dynamic Range (SFDR)
The ratio between the power of the worst spurious
signal (not always an harmonic) and the amplitude
of fundamental tone (signal power) over the full
Nyquist band. It is expressed in dBc.
Total Harmonic Distortion (THD)
The ratio of the rm s sum of the first five harmo nic
distortion components to the rms value of the
fundamental line. It is expressed in dB.
Signal to Noise Ratio (SNR)
The ratio of the rms value of the fundamental
component to the rms sum of all other spectral
components in the Nyquist band (f
/2) excluding
s
DC, fundamental and the first five harmonics.
SNR is reported in dB.
Signal to Noise and Distorsion Ratio (SINAD)
Similar ratio as for SNR but including the harmonic
distortion components in the noise figure (not DC
signal). It is expressed in dB.
From the SINAD, the Effective Number of Bits
(ENOB) can easily be deduced using the formula:
SINAD= 6.02 × ENOB + 1.76 dB.
When the applied signal is not Full Scale (FS), but
has an A
The maximum analog input frequency at which the
spectral response of a full power signal is reduced
by 3dB. Higher values can be achieved with
smaller input levels.
Effective Resolution Bandwidth (ERB)
The band of input signal frequencies that the ADC
is intended to convert without loosin g linearity i.e.
the maximum analog input frequency at which the
SINAD is decreased by 3dB or t he ENOB b y 1/2
bit.
Pipeline delay
Delay between the initial sample of the analog
input and the availability of the corresponding
digital data output,on the output bus. Also called
data latency. It is expressed as a num ber of clock
cycles.
8/20
Page 9
Static parameter: Integral Non Linearity
Fs=50MSPS; Fin=1MHz; Icca=45mA; N=131072pts
3
2
1
0
INL (LSBs)
-1
-2
-3
05 001000150020002500300035004000
Static parameter: Differential Non Linearity
Fs=50MSPS; Fin=1MHz; Icca=45mA; N=131072pts
2
1.5
1
0.5
0
DNL (LSBs)
-0.5
-1
-1.5
-2
05001000150020002500300035004000
TSA1201
Output Code
Output C ode
Linearity vs. VCCA
Fs=50MSPS; Icca=45mA; Fin=10MHz
67
66.5
66
65.5
65
64.5
(dB)
64
63.5
63
Dynamic parameters
62.5
62
2.252.352.452.552.65
SNR
SINAD
ENOB
VCCA (V )
12
11.8
11.6
11.4
11.2
11
10.8
10.6
10.4
10.2
10
Distortion vs. VCCA
Fs=50MSP S; Icca=45 mA ; Fin=10 MHz
-72
-73
-74
-75
-76
-77
-78
Dynamic Parameters (dB)
-79
-80
-81
-82
SFDR
2.252.352.452.552.65
VCCA (V)
ENOB (bits)
THD
9/20
Page 10
TSA1201
)
)
Linearity vs. VCCD
Fs=50MSP S; Icca=45m A ; Fin=10 MHz
66
65.5
65
64.5
64
63.5
(dB)
63
62.5
62
Dynamic parameters
61.5
61
2.252.352.452.552.65
SNR
SINAD
ENOB
VCCD (V )
Linearity vs. VCCBE
Fs=50MSP S; Icca=45m A ; Fin=10 MHz
66
65
64
63
(dB)
62
61
Dynamic parameters
60
2.252.352.452.552.65
SNR
SINAD
ENOB
VCCBE ( V)
12
11.8
11.6
11.4
11.2
11
10.8
10.6
10.4
10.2
10
12
11.8
11.6
11.4
11.2
11
10.8
10.6
10.4
10.2
10
Distortion vs. VCCD
Fs=50MSP S; Icca=45 mA ; Fin=10 MHz
-71
-73
-75
-77
-79
ENOB (bits)
-81
-83
Dynamic parameters (dB)
-85
2.252.352.452.552.65
SFDR
VCCD (V)
Distortion vs. VCCBE
Fs=50MSPS; Icca=45mA; Fin=10MHz
-72
-73
-74
-75
-76
-77
-78
ENOB (bits)
-79
-80
-81
Dynamic Parameters (dB)
-82
2.252.352.452.552.65
THD
SFDR
VCCBE (V)
THD
Linearity vs. Fs
Icca=45mA; Fin=10 MHz
70
68
66
64
62
60
58
56
54
52
Dynamic parameters (dB
50
152 53545556575
SNR
SINAD
ENOB
Fs (MHz)
12
11.5
11
10.5
10
9.5
Distortion vs. Fs
Icca=45mA; Fin=10 MHz
-50
-55
-60
-65
-70
ENOB (bits)
-75
-80
-85
Dynamic parameters (dB
-90
15253545556575
THD
SFDR
Fs (MHz)
10/20
Page 11
TSA1201
)
5
5
)
5
5
)
)
Linearity vs. Fin
Fs=50MHz; Icca=45mA
80
75
70
65
60
55
ENOB
SNR
SINAD
Dynamic parameters (dB
50
020406080
Fin (MHz)
Linearity vs.Temperatur e
Fs=49.7MSPS; Icca=45m A; Fin=15M Hz
69
67
65
63
61
59
57
Dynamic Parameters (dB
55
-401060110
SNR
SINAD
ENOB
Temperature (°C)
12
11.
11
10.
10
9.5
12
11.
11
10.
10
9.5
9
8.5
8
7.5
7
Distortion vs. Fin
Fs=50MHz; Icca=45mA
-60
-65
-70
-75
-80
-85
THD
SFDR
Dynamic parameters (dB
-90
0 20406080
Fin (MHz)
Distortion vs. Temperature
Fs=49.7MSPS; Icca=45m A; Fin=15M Hz
90
85
80
75
70
65
60
55
Dynamic Parameters (dB
50
-401060110
THD
SFDR
Temp e ratu r e (°C)
Single- tone 16K FF T at 50 Msps
Fin=94.5MHz; Icca=45mA, Vin@-0.5dBFS
0
-20
-40
-60
-80
-100
-120
P o wer Spectru m (dB )
-140
Frequency (MHz)
151050
20
11/20
Page 12
TSA1201 APPLICATION NOTE
DETAILED INFORMATION
The TSA1201 is a High Speed analog to digital
converter based on a pipeline architecture and the
latest deep submicron CMOS process to achieve
the best performances in terms of linearity and
power consumption.
The pipeline structure consists of 11 internal
conversion stages in which the analog signal is
fed and sequencially converted into digital data.
Each 10 first stages consists of an Analog to
Digital converter, a Digital to Analog converter, a
Sample and Hold and a gain of 2 amplifier. A
1.5-bit conversion resolution is achieved in each
stage. The latest stage simply is a comparator.
Each resulting LSB-MSB couple is then time
shifted to recover from the delay caused by
conversion. Digital data correction completes the
processing by recov ering from the redunda ncy of
the (LSB-MSB) couple for each stage. The
OPERATIONAL MODES DESCRIPTION
InputsOutputs
Analog input differential levelDFSB OEBSRCORD RMost Significant Bit (MSB)
corrected data are outputed through the digital
buffers.
Signal input is sampled on the rising edge of the
clock while digital outputs are delivered on the
falling edge of the clock.
The advantages of such a convert er reside in the
combination of pipeline architec ture and the most
advanced technologies. The highest dynamic
performances are achieved while consumption
remains at the lowest level.
Some functionalites have been added in order to
simplify as much as possible the application
board. These operational m odes are described in
the following table.
The TSA1201 is pin to pin compatible with the
8bits/40Msps TSA0801, the 10bits/25Msps
TSA1001 and t he 10bits/50Msps TSA1002. T his
ensures a conformity with the product family and
above all, an easy upgrade of the application
Data Format Select (DFSB)
When set to low level (VIL), the digital input DFSB
provides a tw o’s complement d igital output MSB.
This can be of interest when performing some
further signal processing.
When set to high level (VIH), DFSB provides a
standard binary output coding.
12/20
Output Enable (OEB)
When set to low level (VIL), all digital outputs
remain active and are in low impedance state.
When set to high level (VIH), all digital outputs
buffers are in high impedance state while the
converter goes on sampling. When OEB is set to a
low level again, t he data are then present on the
output with a very short Ton delay.
Therefore, this allows the chip select of the device.
The timing diagram summarizes this functionality.
Page 13
TSA1201
Slew Rate Control (SRC)
When set to high level (VIH), all digital outputs
currents are limited to a clamp value so that digital
noise power is reduced to its min imum. Rise and
fall times just match 25MHz sampling rate
assuming the load capacitance on each digital
output remains below 10pF.
When set to low level (VIL), the maximum digital
output current increases so that rise and fall times
just match the 50MHz sampling rate assuming the
load capacitance o n each digital output remains
below 10pF.
Out of Range (OR)
This function is im plemented on the output stage
in order to set up an "Out of Range" flag whenever
the digital data is over the full scale range.
Typically, there is a detection of all the dat a bei ng
at ’0’ or all the data being at ’1’. This ends up with
an output signal OR which is in low level state
(VOL) when the data stay within in the range, or in
high level state (VOH) when the data are out of the
range.
Data Ready (DR)
The Data Ready output is an image of the clock
being synchronized on the output data (D0 to
D11). This is a very helpful signal that simplifes
the synchronization of the measurement
equipment or the controling DSP.
As digital output, DR goes into high impedance
state when OEB is asserted to high level as
described in the timing diagram.
DRIVING THE ANALOG INPUT
Differentia l inp u t s
The TSA1201 has been designed to obtain
optimum performances when being differentially
driven. An RF transformer is a good way to
achieve such performances.
Figure 1 describes the schematics. The input
signal is fed to the primary of the transformer,
while the secondary drives both ADC inputs. The
common mode voltage of the ADC (INCM) is
connected to the center-tap of the secondary of
the transformer in order to bias the input signal
around this common voltage, internally set to
0.56V. It determines the DC component of the
analog signal. As being an high impedance inp ut,
it acts as an I /O and can be externally driven to
adjust this DC component. The INCM is
decoupled to maintain a low noise level on this
node. Our evaluat ion board i s m ount ed with a 1: 1
ADT1-1 transformer from Minicircuits. You might
also use a higher impedance ratio (1:2 or 1:4) to
reduce the driving requirement on the analog
signal source.
Each analog input can drive a 1Vpp amplitude
input signal, so the resultant differential amplitude
is 2Vpp.
Figure 1 : Differential input configuration
Analog source
50Ω
ADT1-1
1:1
330pF
100pF
10nF
VIN
TSA1201
VINB
INCM
470nF
Single-ended input configuration
Some applications may require a single-ended
input. This is easily achieved with the
configuration reported on Figure 2 for an
AC-coupled input or on Figure 3 and 4 for a
DC-coupled input..
In the case of AC-coupled analog input, it is
recommended to connect the other analog input to
the common mode voltage of the circuit (INCM) so
as to properly bias the ADC. The INCM may
remain at the same internal level (0.56V) thus
driving only a 1Vpp input ampl itude, or it mus t be
increased to 1V to drive a 2Vpp input amplitude.
Figure 2 : AC-coupled Single-ended input
Signal so urce
50Ω
100nF
330pF
VIN
TSA1201
VINB
INCM
10nF
470nF
1V
In the case of DC-coupled analo g input, Figure 3
shows the configuration for a 2Vpp input signal.
The DC component is driven by V REFP which is
connected to INCM and VINB and therefore
imposes its voltage. VREFM being connected to
ground, a dynamic of 2Vpp is achievable.
Figure 4 describes the configuration for a 1Vpp
analog signal. In this case, VREFM is connect ed
13/20
Page 14
TSA1201
to VINB and INCM. The latest imposes its voltage.
VREFP being internal ly set to 1V, the dynamic is
then 1Vpp.
Figure 3 : DC-coupled 2Vpp analog input
Analog
DC
Analog+DC
330pF
VIN
TSA1201
VINB
INCM
10nF
VREFP
VREFM
470nF
Figure 4 : DC-coupled 1Vpp analog input
Analog
DC
Analog+DC
VIN
TSA1201
VINB
INCM
VREFM
REFERENCE CONNECTION
Inte rnal re f erence
In the standard configuration, the ADC is bi ased
with the internal reference voltage. VREFM pin is
connected to Analog Ground while VREFP is
internally set to a voltage of 1.0V. It is
recommended to d ecouple the V RE F P in order t o
minimize low and high frequency noise. Refer to
Figure 5 for the schematics.
Figure 5 : Internal reference setting
VIN
1.0V
VREFP
330pF
10nF
470nF
TSA1201
VINB
VREFM
External re fere nce
330pF
10nF
470nF
IF-sampling
Software radio has become a common mode for
receiving data through RF receivers. Its main
advantage being to di gitally implement what was
originally done with analog functions such as
discriminators, demodulation and filtering.
Originally, bipolar process was mainly used
because they provided high transistor transit
frequency, while pure CMOS technol ogy showed
a lower one. With new CMOS process and c ircuit
topology, higher frequencies are now achieved.
The TSA1201 has been specifically designed to
meet the requirement of sampling at Intermediate
Frequency. For this purpose, the Track-and-Hold
of the first pipeline s tage has been b uilt to ensure
the global linearity of the overall ADC to p erform
the right characteristics.
Our proprietary Track-and-Hold has a patented
switch control system to enable the pe rformances
not to be degraded as input signal frequency
increases.
As a result, an analog bandwidth of 1GHz is
achieved.
It is possible to use an external reference vo ltage
instead of the internal one for specific applications
requiring even better linearity or enhanced
temperature behaviour. In this case, the amplitude
of the external voltage mu st be at least equal to
the internal one (1.0V). Using the
STMicroelectronics Vref TS8 21 leads to optimum
performances when configured as shown on
Figure 6.
Figure 6 : External reference setting
1k
Ω
10nF
470nF
VCCA
VIN
TSA 1201
VINB
VREFP
VREFM
330pF
TS821
external
reference
This can be very helpful for example for
multichannel application to kee p a good matching
over the sampling frequency range.
14/20
Page 15
Clock input
The quality of your converter is very dependant on
your clock input accuracy, in terms of aperture
jitter; the use of low jitter crystal controlled
oscillator is recommended.
The duty cycle must be between 45% and 55%.
The clock power supplies must be separated from
the ADC output ones to avoid digital noise
modulation at the output.
It is recommended to always keep the circuit
clocked, even at the lowest specified sampling
frequency of 0.5Msps, bef ore applying the supply
voltages.
Power co nsumption op tim i za tio n
The internal architecture of the TSA1 201 enables
to optimize the power consumption according to
the sampling frequency of. For this purpose, a
resistor is placed between IPOL and the analog
Ground pins. Therefore, the total dissipation is
adjustable from 0.5Msps up to 50Msps. This
feature is of highest importance when power
saving conditions the application.
The TSA1201 will com bine highest pe rformances
and lowest consumption at 50Msps when Rpol is
equal to 12kΩ.
At lower sampling frequency range, this value of
resistor may be adjusted in order to decrease the
analog current without any degradation of
dynamic performances.
As an example, 40mW total power consumption is
achieved at 5 Msps with Rpol equal to 190kΩ and
35mW is dissipated at 1Msps with Rpol equal to
350kΩ.
The table below sums up the relevant data.
Figure 7 describes the behaviour of the converter
as sampling frequency increases and shows the
optimum in terms of analog current and
polarization resistor.
Total power consumption optimization
dependi ng on Rpol value
Fs (Msps)53550
Rpol (
kΩ)
Optimized
power (mW)
1902912
40100150
TSA1201
Figure 7 : Optimized power consumption
Fin=1MHz
200
180
160
140
120
100
80
Rpol(kOhms)
60
40
20
0
5 25456585
ICCA
RPOL
Fs(MHz)
Layout precautions
To use the ADC circuits in the best manner at high
frequencies, some precautions have to be taken
for power supplies:
- First of all, the implementation of 4 separate
proper supplies and ground planes (analog,
digital, internal and external buffer ones) on the
PCB is mandatory for high speed circuit
applications to provide low inductance and low
resistance common return.
The separation of the analog signal from the
digital part is essential to prevent noise from
coupling onto the input signal.
- Power supply bypass capacitors must be placed
as close as possible to the IC pins in order to
improve high frequency bypassing and reduce
harmonic distortion.
- Proper termination of all inputs and outputs must
be incorporated with output termination resistors;
then the amplifier load wi ll be only resistive and
the stability of the amplifier will be improved. All
leads must be wide and as short as possible
especially for the analog input in order to decrease
parasitic capacitance and inductance.
- To keep the capacitive loading as low as
possible at digital outputs, short lead lengths of
routing are essential to minimize currents when
the output changes. To minimize this output
capacitance, buffers or latches close to the output
pins will relax this constraint.
- Choose component sizes as small as possible
(SMD).
70
60
50
40
30
Icca(mA)
20
10
0
15/20
Page 16
TSA1201
EVAL1201 evaluation board
The characterization of the board has been made
with a fully ADC devoted test bench as shown on
Figure 8. The analog signal must be filtered to be
very pure.
The dataready signal is the acquisition clock of the
logic analyzer.
The ADC digital outputs are latched by the octal
buffers 74LCX573.
All characterization measurements have been
made with:
- SFSR=+0.5dB for static parameters.
- SFSR=-0.5dB for dynamic parameters.
Figure 8 : Analog to Digital Converter characterization bench
Information furnished is bel ieved to be accurate and reliable. However, STMicroe lectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No li cense is granted by i mp lication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication ar e subject to change without notice. This publication supersedes and replaces all information
previously supplied. S TMicroelectronics products are not authorized for use as critica l components in life suppo rt devices or
systems without express written approval of STMicroelectronics.
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