Datasheet TS1220-600B Datasheet (SGS Thomson Microelectronics)

Page 1
®
FEATURES
I
= 12A
T(RMS)
V
DRM/VRRM
= 600V IGT < 200µA HIGH I
= 110A (tp = 10ms)
TSM
DESCRIPTION
TS1220-600B
SENSITIVE SCR
A
A
G
K
The TS1220-600B is us ing a high performance TOPGLASS PNPN technology and is intended for
DPAK
(Plastic)
applications requiring high surge capability (like power tools, crowbar protection, capacitive dis­charge ignition...).
ABSOLUTE RATINGS
(limiting values)
Symbol Parameter Value Unit
V
DRM
V
RRM
I
T(RMS)
= 125°C RGK = 220
T
j
RMS on-state current
600 V
Tc= 105°C12 A
(180° conduction angle)
I
T(AV)
Average on-state current
Tc= 105°C8 A
(180° conduction angle)
I
TSM
Non repetitive surge peak on-state current (T
initial = 25°C )
j
tp = 10 m s 110 A
tp = 8.3 ms 115
2
I
t
2
I
t Value for fusing
tp = 10 m s 40 A
2
s
dI/dt Critical rate of rise of on-state current
= 10 mA dIG /dt = 0.1 A/µs.
I
G
T
stg
T
j
T
May 1998 - Ed: A3
Storage junction temperature range Operating junction temperature range
Maximum temperature for soldering dur ing 10s
50 A/µs
- 40 to + 150
- 40 to + 125 260
°
C
°
C
1/5
Page 2
TS1220-600B
THERMAL RESISTANCES
Symbol Parameter Value Unit
Rth(j-c) Rth(j-a) Junction to ambient (S = 0.5 cm
GATE CHARACTE RIST ICS
P
= 0.2W PGM = 3 W (tp = 20 µs) IGM = 1.2 A (tp = 20 µs)
G (AV)
Junction to case for D.C
(maximum values)
1.5
2
)70
ELECTRICAL CHARACTERI STICS
Symbol Test Conditions Type Value Unit
I
GT
V
GT
V
GD
V
RG
I
H
V
TM
I
DRM
VD=12V RL=140 VD=12V RL=140 VD=12V(DC) RL=33 IRG = 10µA Tj= 25°C MIN 8 V IT=50mA IG=5mA RGK = 1k ITM= 24A tp= 380µs Tj= 25°CMAX 1.6 V VD= V
DRM RGK
= 220
Tj= 25°C MAX 200 Tj= 25°C MAX 0.8 V Tj= 25°C MAX 0.1 V
Tj= 25°C MAX 5 mA
Tj= 25°C MAX 10
°
C/W
°
C/W
µ
A
µ
A
I
RRM
dV/dt V
VR= V
=67%V
D
RGK = 220
RRM
RGK = 220
DRM
ORDERING INFORMATION
TS 12 20 - 600 B
THYRISTOR SENSITIVE
CURRENT
Tj= 125°C MAX 2 mA Tj= 125°CMIN 5 V/µs
Add "-TR" suffix for Tape and Reel shipment
VOLTAGE
S ENSITIVITY
PACKAGE B = DPAK
2/5
Page 3
TS1220-600B
Fig 1:
Maximum average power dissipation versus
average on-state current.
P(W)
14 12 10
8
α
α
α
α
α
6 4 2
I (A)
0
0123456789101112
Fig 3-1:
Average and D.C. on-state current versus
T(AV)
180°
α
α
case temperature.
I (A)
T(AV)
13 12 11 10
9 8 7 6 5 4 3 2 1 0
0 25 50 75 100 125
D.C.
α
Tcase(°C)
Fig 2:
Correlation between maximum average power dissipation and maximum allowable tem­peratures (Tamb and Tcase).
Note: Rth=0°C/W is infinite heatsink.
Rth=0°C/W
Tcase (°C)
105
110
115
120
125
P(W)
14
α
13 12 11 10
9 8 7 6 5
Rth(j-a)=37°C/W
4 3 2 1 0
0 25 50 75 100 125
Fig 3-2:
Average and D.C. on-state current versus
Rth(j-a)=80°C/W
Tamb(°C)
ambient temperature (device mounted on FR4 with recommended pad layout).
I (A)
T(AV)
2.0
1.8
1.6
1.4
α
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0 25 50 75 100 125
T amb(°C)
Fig 4:
Relative variation of thermal impedance
junction to case versus pulse duration.
K=[Zth(j-c)/Rth(j-c)]
1.0
0.5
0.2
0.1 1E-3 1E-2 1E-1 1E+0
tp(s)
Fig 4-2:
Relative variation of thermal impedance junction to ambient versus pulse duration (re­comended pad layout).
K=[Zth(j-a)/Rth(j-a)]
1.00
0.10
tp(s)
0.01
1E-2 1E-1 1E+0 1E+1 1E+2 5E+2
3/5
Page 4
TS1220-600B
Fig 5:
Relative variation of gate trigger current and
holding current versus junction temperature.
I ,I [Tj]/I ,I [Tj=25°C]
GT H GT H
2.0
1.8
1.6
I
GT
1.4
1.2
I
H
1.0
0.8
0.6
0.4
0.2
0.0
-40 -20 0 20 40 60 80 100 120 140
Fig 7:
Non repetitive surge peak on-state current
Tj(°C)
versus number of cycles.
IA)
TSM(
120 110 100
90 80 70 60 50 40 30 20 10
0
1 10 100 1000
Number of cycles
Tj initial=25°C F=50Hz
Fig 6:
Relative variation of holding current versus
gate-cathode resistance (typical values).
I [R ] / I [R =1k ]
HGK H GK
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0 1E+1 1E+2 1E+3 1E+4
Fig 8:
Non repetitive surge peak on-state current for a sinusoidal pulse with width tp<10ms, and cor ­responding value of I
I (A),I²t(A²s)
TSM
500
100
10
12 510
R ( )
GK
2
t.
I²t
tp(ms)
I
Tj=25°C
Tj initial=25°C
TSM
Fig 9:
On-state characteristics (maximum values).
I (A)
10.0
TM
Tj max.: Vto=0.85V Rt=31m
Tj=Tj max.
Tj=25°C
100.0
1.0
V (V)
0.1
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
TM
4/5
Fig 10:
Thermal resistance junction to ambient versus copper surface under tab (Epoxy printed circuit board FR4, copper thickness: 35µm).
Rth(j-a) (°C/W)
100
80
60
40
20
S(Cu) (cm²)
0
0 2 4 6 8 101214161820
Page 5
PACKAGE ME CHANICAL D AT A
DPAK (P last ic)
TS1220-600B
DIMENSIONS
REF.
A 2.20 2.40 0.086 0. 094 A1 0.90 1.10 0.035 0.043 A2 0.03 0.23 0.001 0.009
B 0.64 0.90 0.025 0.035 B2 5.20 5.40 0.204 0.212
C 0.45 0.60 0.017 0.023 C2 0.48 0.60 0.018 0.023
D 6.00 6.20 0.236 0.244
E 6.40 6.60 0.251 0.259
G 4.40 4.60 0.173 0.181
H 9.35 10.10 0.368 0.397
L2 0.80 0.031 L4 0.60 1.00 0.023 0.039
V2
Millimeters Inches
Min. Typ. Max Min. Typ. Max.
MARKING
FOOT PRINT DIMENSIONS
(in millimeters)
6.7
TYPE MARKING
TS1220-600B
TS
1220
6.7
6.7
3
1.61.6
2.32.3
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise und er any pa tent or patent rights of STMicroel ectronics. S pecification mentioned in this publ ication are subject to change without notice. This publication supersedes and repl aces all information prev iously supplied. STMicroelec tronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademark of STMicroelectronics
© 1998 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.
6
5/5
Loading...