TQ8017
For additional information and latest specifications, see our website: www.triquint.com
4
Symbol Parameter Min Max Units Test Cond. Notes
V
IH
PECL Input Voltage High V
CC
–1.1 V
CC
– 0.5 V
V
IL
PECL Input Voltage Low V
TT
V
CC
– 1.5 V
I
IH
PECL Input Current High +30 µ A VIH = V
CC
– 0.7 V
I
IL
PECL Input Current Low –30 µA VIL = V
CC
– 2.0 V
V
ICM
PECL Input Common Mode Voltage V
CC
– 1.5 V
CC
–1.1 V
V
IDIF
PECL Input Differential Voltage (pk-pk) 400 1200 mV
V
IH
CMOS/TTL Input Voltage High 3.5/2.0 VCC/V
CC
V2
V
IL
CMOS/TTL Input Voltage Low 0/0 1.5/0.8 V 2
I
IH
CMOS/TTL Input Current High +200 µAV
IH
= V
CC
2
I
IL
CMOS/TTL Input Current Low –100 µAV
IL
= 0 V 2
V
OCM
PECL Output Common Mode V
CC
– 1.5 V
CC
–1.1 V
V
ODIF
PECL Output Differential Voltage 600 mV
V
OH
PECL Output Voltage High V
CC
–1.0 V
CC
– 0.6 V
V
OL
PECL Output Voltage Low V
TT
V
CC
– 1.6 V
I
OH
PECL Output Current High 20 27 mA
I
OL
PECL Output Current Low 0 8 mA
I
CC
Power Supply Current (+) 970 mA
Table 4. DC Characteristics
1,2
– Within recommended operating conditions, unless otherwise indicated.
Notes: 1. Test conditions unless otherwise indicated: VTT = VCC – 2.0 V, R
LOAD
= 50 Ω to V
TT.
2. Input level is selected by the CNTRL LVL input. Tying CNTRL LVL to GND selects TTL levels, leaving CNTRL LVL OPEN selects
CMOS levels.
Table 5. AC Characteristics1 – Within recommended operating conditions, unless otherwise indicated.
Symbol Parameter Min Typ Max Units Notes
Maximum Data Rate/Port 1.25 Gb/s 1,2
Jitter 150 ps pk-pk 1
T
1
Channel Propagation Delay 2000 ps 3
T
2
Ch-to-Ch Propagation Delay Skew 500 ps
T
3
CONFIG to Data Out (Oi) Delay 5 ns
T
4
LOAD Pulse Width 7 ns
T
5
CONFIG Pulse Width 7 ns
T
6
IAi to LOAD High Setup Time 0 ns
T
7
LOAD to IAi Low Hold Time 3 ns
T
8
OAi to LOAD High Setup Time 0 ns
T
9
LOAD to OAi Low Hold Time 3 ns
T
10
Load ↑ to CONFIG ↑ 0ns
T
11
RESET Pulse Width 10 ns
T
R,F
Output Rise or Fall Time 250 400 ps 3
Notes: 1. Test conditions: V
CC
= 5.0 V; V
TT
= 3.0 V, R
LOAD
= 50 Ω to VTT; PECL inputs: VIH = 3.9 V; VIL = 3.5 V; CMOS inputs: VIH = 3.5 V,
V
IL
= 1.5 V; PECL outputs: VOH > 4.0 V, VOL < 3.4 V; PECL inputs rise and fall times < 1 ns; CMOS inputs rise and fall times
< 20 ns. A bit error rate of 1E–13 BER or better for 223–1PRBS pattern, jitter and rise/fall times are guaranteed through characterization.
2. 1.2 Gb/s Non-Return-Zero (NRZ) data equivalent to 600 MHz clock signal.
3. Rise and fall times are measured at the 20% and 80% points of the transition from V
OL
max to VOL min.