TQ2059
3
SYSTEM TIMING
PRODUCTS
For additional information and latest specifications, see our website: www.triquint.com
Absolute Maximum Ratings
Storage Temperature –65°C to +150°C
Ambient temperature with power applied –55°C to +110°C
Supply voltage to ground potential –0.5 V to +7.0 V
DC input voltage –0.5 V to (VDD + 0.5) V
DC input current –30 mA to +5 mA
Package thermal resistance (MQuad) θJA = 45°C/W
Die junction temperature TJ = 150°C
Note: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device.
The device should be operated only under the DC and AC conditions shown below.
Limits
1
Symbol Description Test Conditions Min Typ Max Unit
V
OH
Output HIGH voltage VCC = Min PECL load VCC–1.20 VCC–0.50 V
V
OL
Output LOW voltage VCC = Min PECL load VCC–2.00 VCC–1.60 V
V
CMO
Output common PECL VCC–1.60 VCC–1.20 V
mode voltage
∆ V
OUT
Output differential voltage PECL 0.6 1.2 V
V
IH
2
Input HIGH level Guaranteed input logical 2.0 V
HIGH Voltage for all inputs
V
IL
2
Input LOW level Guaranteed input logical 0.8 V
LOW Voltage for all inputs
I
IL
Input LOW current VDD = Max VIN = 0.40 V –150 –400
µ
A
I
IH
Input HIGH current VDD = Max VIN = 2.7 V 0 25
µ
A
I
I
Input HIGH current VDD = Max VIN = 5.3 V 2 1000
µ
A
I
DDS
3
Power supply current VDD = Max 85 120 mA
V
I
Input clamp voltage VDD = Min IIN = –18 mA –0.70 –1.2 V
DC Characteristics (VDD = +5 V + 5%, TA = 0 °C to +70 °C)
1
Symbol Description Test Conditions Min Typ Max Unit
C
IN
Input Capacitance VIN = 2.0 V at f = 1 MHz 6 pF
C
OUT
Output Capacitance V
OUT
= 2.0 V at f = 1 MHz 9 pF
Capacitance
Notes: 1. Typical limits are at VDD = 5.0 V and TA = 25˚C.
2. These are absolute values with respect to device ground and include all overshoots due to system or tester noise.
3. This parameter is measured with device not switching and unloaded.