Datasheet TPC8207 Datasheet (TOSHIBA)

Page 1
查询TPC8207供应商
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOSIII)
TPC8207
TPC8207
Lithium Ion Battery Applications
Notebook PC Applications
Small footprint due to small and thin package
Low drain-source ON resistance: R
High forward transfer admittance: |Y
Low leakage current: I
Enhancement-mode: V
= 10 µA (max) (VDS = 20 V)
DSS
= 0.5~1.2 V (VDS = 10 V, ID = 200 µA)
th
Maximum Ratings
Characteristics Symbol Rating Unit
Drain-source voltage V
Drain-gate voltage (RGS = 20 kΩ) V
Gate-source voltage V
Drain current
dissipation (t = 10 s)
(Note 2a)
dissipation (t = 10 s)
(Note 2b)
Single pulse avalanche energy (Note 4)
Avalanche current IAR 6 A
Repetitive avalanche energy Single-device value at dual operation
(Note 2a, 3b, 5)
Channel temperature Tch 150 °C
Storage temperature range T
(Ta = 25°C)
DC (Note 1) ID 6
Pulse (Note 1) I
Single-device operation (Note 3a)
Single-device value at dual operation (Note 3b)
Single-device operation (Note 3a)
Single-device value at dual operation (Note 3b)
= 16 m (typ.)
DS (ON)
| = 11 S (typ.)
fs
20 V
DSS
20 V
DGR
±12 V
GSS
24
DP
P
1.5 Drain power
D (1)
P
1.1
D (2)
0.75 Drain power
P
D (1)
P
0.45
D (2)
46.8 mJ
E
AS
E
0.1 mJ
AR
stg
55~150 °C
A
W
W
Unit: mm
JEDEC
JEITA
TOSHIBA 2-6J1E
Weight: 0.08 g (typ.)
Circuit Configurati on
8 7 6 5
1 2 3 4
Note 1, Note 2, Note 3, Note 4 and Note 5: See the next page.
This transistor is an electrostatic-sensitive device. Please handle with caution.
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Thermal Characteristics
Characteristics Symbol Max Unit
TPC8207
Thermal resistance, channel to ambient
10 s) (Note 2a)
(t
=
Thermal resistance, channel to ambient
= 10 s) (Note 2b)
(t
Single-device operation
(Note 3a)
Single-device value at dual operation
(Note 3b)
Single-device operation
(Note 3a)
Single-device value at dual operation
(Note 3b)
R
th (ch-a) (1)
R
th (ch-a) (2)
R
th (ch-a) (1)
R
th (ch-a) (2)
83.3
°C/W
114
167
°C/W
278
Marking
(Note 6)
TPC8207
Part No. (or abbreviation code) Lot No.
A line indicates lead (Pb)-free package or lead (Pb)-free finish.
Note 1: Ensure that the channel temperature does not exceed 150°C.
Note 2:
a) Device mounted on a glass-epoxy board (a) b) Device mounted on a glass-epoxy board (b)
FR-4
× 25.4 × 0.8
25.4 (Unit: mm)
(a)
(b)
Note 3:
a) The power dissipation and thermal resistance values are shown for a single device
(During single-device operation, power is only applied to one device.).
b) The power dissipation and thermal resistance values are shown for a single device
(During dual operation, power is evenly applied to both devices.).
Note 4: V
= 16 V, Tch = 25°C (initial), L = 1.0 mH, RG = 25 Ω, IAR = 6 A
DD
Note 5: Repetitive rating: pulse width limited by max channel temperature.
Note 6: • on lower right of the marking indicates Pin 1.
Weekly code: (Three digits)
Week of manufacture (01 for the first week of a year, : sequential number up to 52 or 53)
Year of manufacture (The last digit of a year)
FR-4
× 25.4 × 0.8
25.4 (Unit: mm)
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TPC8207
Electrical Characteristics
Characteristics Symbol Test Condition Min Typ. Max Unit
Gate leakage current I
Drain cut-OFF current I
Drain-source breakdown voltage
Gate threshold voltage Vth VDS = 10 V, ID = 200 µA 0.5
Drain-source ON resistance R
Forward transfer admittance |Yfs| VDS = 10 V, ID = 3.0 A 5.5 11 S
Input capacitance C
Reverse transfer capacitance C
Output capacitance C
Rise time tr 6
Turn-ON time ton
Switching time
Fall time tf 22
Turn-OFF time t
Total gate charge (gate-source plus gate-drain)
Gate-source charge 1 Q
Gate-drain (“miller”) charge Qgd
(Ta = 25°C)
VGS = ±10 V, VDS = 0 V ±10 µA
GSS
VDS = 20 V, VGS = 0 V 10 µA
DSS
V
(BR) DSSID
V
(BR) DSXID
DS (ON)
iss
rss
oss
off
22
Q
g
gs1
= 10 mA, VGS = 0 V 20
= 10 mA, VGS = −12 V 8
VGS = 2.0 V, ID = 4.2 A
VGS = 2.5 V, ID = 4.2 A 19 30
V
= 4.0 V, ID = 4.8 A 16 20
GS
2010
= 10 V, VGS = 0 V, f = 1 MHz
V
210
DS
5 V
V
GS
0 V
1%, tw = 10 µs
Duty
V
16 V, VGS = 5 V, ID = 6 A
DD
3.2
ID = 3 A
V
OUT
4.7
3.3
=
L
R
V
10 V
DD
4.7
1.2 V
22 45
240 ⎯
14 ⎯
94
Source-Drain Ratings and Characteristics
(Ta = 25°C)
m
pF
ns
nC
V
Characteristics Symbol Test Condition Min Typ. Max Unit
Drain reverse current Pulse (Note 1) I
Forward voltage (diode) V
DRP
IDR = 6 A, VGS = 0 V 1.2 V
DSF
3
24 A
2004-07-06
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TPC8207
10
10
8
8
(A)
D
6
2 4 6
4
Drain current I
2
0
0 0.2 0.4 0.6
Drain-source voltage VDS (V)
20
16
(A)
D
12
8
Drain current I
4
0
0 1 2 3 4 5
100
25
Gate-source voltage VGS (V)
1000.0
(S)
fs
100.0
10.0
– VDS
I
D
Common source, Ta = 25°C, Pulse test
1.7
1.65
1.6
1.55
1.5
1.4
VGS = 1.3 V
0.8 1
– VGS
I
D
Common source
VDS = 10 V
Pulse test
Ta = −55°C
| – ID
|Y
fs
Common source
VDS = 10 V
Pulse test
25
55
Ta = 100°C
– VDS
I
20
10
6
2
4
8
16
(A)
D
12
8
Drain current I
4
0
0123 4 5
Drain-source voltage VDS (V)
D
Common source
1.9
Ta = 25 °C
Pulse test
1.8
VGS = 1.3 V
1.7
1.65
1.6
1.55
1.5
1.4
– VGS
V
1.0
0.8
DS
Common source Ta = 25°C
Pulse test
(V)
DS
0.6
0.4
3
0.2
Drain-source voltage V
0
0 2 4 6 8 10 12
Gate-source voltage VGS (V)
4
ID = 6 A
DS (ON)
VGS = 2 V
– ID
Common source Ta = 25°C
Pulse test
4
2.5
6
1000
R
100
(mΩ)
DS (ON)
R
10
Drain-source ON resistance
Forward transfer admittance ⎪Y
1.0
0.1 1.0 10.0 100.0
Drain current ID (A)
1
0.1 1 10 100
Drain current ID (A)
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TPC8207
50
40
30
(mΩ)
20
DS (ON)
R
Drain-source ON resistance
10
ID = 1.5 A, 3A, 6A
0
80 40 0 40 80 120 160
Ambient temperature Ta (°C)
10000
1000
100
Capacitance C (pF)
10
0.1 1 10 100
Capacitance – V
Drain-source voltage VDS (V)
2.0
(W)
1.5
D
1.0
0.5
Drain power dissipation P
Device mounted on a glass-epoxy board (a)
(1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b)
(1)
(2)
(3)
(4)
R
– Ta
DS (ON)
VGS = 2.5 V
ID = 6 A
1.5A, 3A
ID = 1.5A, 3 A, 6A
Common source
Pulse test
VGS = 2 V
VGS = 4 V
DS
C
iss
C
oss
C
rss
Common source
Ta = 25°C
VGS = 0 V f = 1 MHz
– Ta
P
D
(Note 2a)
Device mounted on a glass-epoxy board (b)
(3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) t = 10 s
(Note 2b)
– VDS
I
100
(A)
DR
5, 10
10
1
Drain reverse current I
0.1
0 0.2 0.4 0.6 0.8 1 1.2
Drain-source voltage VDS (V)
DR
3
1
VGS = 0 V
Common source Ta = 25°C
Pulse test
– Ta
V
1.4
1.2
(V)
th
1.0
0.8
0.6
0.4
Gate threshold voltage V
0.2
0
80
40 0 40 80 120 160
th
Common source
VDS = 10 V
ID = 200 µA
Pulse test
Ambient temperature Ta (°C)
Dynamic input/output characteristics
V
DS
16
(V)
DS
12
Drain-source voltage V
8
4
8 V
4 V
V
GS
VDD = 16 V
Common source
ID = 6 A Ta = 25°C
Pulse test
8
(V)
GS
6
4
2
Gate-source voltage V
0
0 50 100 150 200
Ambient temperature Ta (°C)
0
0 8 16 24 32
0
Total gate charge Qg (nC)
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TPC8207
1000
Device mounted on a glass-epoxy board (a) (Note 2a) ( 1) Single-device operation (Note 3a)
( 2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b)
( 3) Single-device operation (Note 3a)
( 4) Single-device value at dual operation (Note 3b)
100
10
(°C/W)
th
r
1
Normalized transient thermal impedance
100
50
ID max (pulse) *
30
10
5
(A)
3
D
1
0.5
0.3
Drain current I
0.1
* Single pulse Ta = 25°C
0.05
0.03
Curves must be derated linearly with increase in temperature.
0.01
0.01 0.03 0.1 0.3 1 3 10 10030
0
0.001 0.01 0.1 1 10 100 1000
Pulse width tw (S)
Safe operating area
Single-device value at dual
operation (Note 3b)
DSS
1 ms *
max
10 ms *
V
Drain-source voltage VDS (V)
r
tw
th
(4)
(3)
(2)
(1)
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TPC8207
RESTRICTIONS ON PRODUCT USE
The information contained herein is subject to change without notice.
The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others.
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc..
The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer’s own risk.
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations.
030619EAA
7
2004-07-06
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