Low Power Consumption: 90 mW Typ
Using External References
D
Wide Analog Input Bandwidth: 600 MHz Typ
D
3.3-V Single-Supply Operation
D
3.3-V TTL/CMOS-Compatible Digital I/O
D
Internal Bottom and Top Reference
Voltages
D
Adjustable Reference Input Range
D
Power-Down (Standby) Mode
D
Separate Power Down for Internal Voltage
References
D
Three-State Outputs
D
28-Pin Thin Shrink SOP (TSSOP) Packages
D
Applications
– Digital Communications (IF Sampling)
– High-Speed DSP Front-End
(TMS320C6000)
– Medical Imaging
– Video Processing (Scan Rate/Format
Conversion)
– DVD Read Channel Digitization
description
DRV
DRV
DV
DV
PW PACKAGE
(TOP VIEW)
DD
D0
D1
D2
D3
D4
D5
D6
D7
SS
SS
CLK
OE
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
AV
28
AV
27
AIN
26
CML
25
PWDN_REF
24
AV
23
REFBO
22
REFBI
21
REFTI
20
REFTO
19
AV
18
BG
17
AV
16
15
STBY
SS
DD
SS
SS
DD
The TLV5535 is an 8-bit, 35 MSPS, high-speed A/D converter. It converts the analog input signal into 8-bit
binary-coded digital words up to a sampling rate of 35 MHz. All digital inputs and outputs are 3.3 V
TTL/CMOS-compatible.
The device consumes very little power due to the 3.3-V supply and an innovative single-pipeline architecture
implemented in a CMOS process. The user obtains maximum flexibility by setting both bottom and top voltage
references from user-supplied voltages. If no external references are available, on-chip references are
available for internal and external use. The full-scale range is 1 V
up to 1.6 Vpp, depending on the analog
pp
supply voltage. If external references are available, the internal references can be disabled independently from
the rest of the chip, resulting in an even greater power saving.
While usable in a wide variety of applications, the device is specifically suited for the digitizing of high-speed
graphics and for interfacing to LCD panels or LCD/DMD projection modules . Other applications include DVD
read channel digitization, medical imaging, and communications. This device is suitable for IF sampling of
communication systems using sub-Nyquist sampling methods because of its high analog input bandwidth.
AVAILABLE OPTIONS
A
–40°C to 85°CTLV5535IPW
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PACKAGED DEVICES
TSSOP-28
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
The single-pipeline architecture uses 6 ADC/DAC stages and one final flash ADC. Each stage produces a
resolution of 2 bits. The correction logic generates its result using the 2-bit result from the first stage, 1 bit from
each of the 5 succeeding stages, and 1 bit from the final stage in order to arrive at an 8-bit result. The correction
logic ensures no missing codes over the full operating temperature range.
BG17OBand gap reference voltage. A 1-µF capacitor (with an optional 0.1-µF capacitor in parallel) should be
CLK12IClock input. The input is sampled on each rising edge of CLK.
CML25OCommon mode level. This voltage is equal to (A VDD – AVSS) ÷ 2. An external 0.1-µF capacitor should be
D0 – D72 – 9OData outputs. D7 is the MSB.
DRV
DD
DRV
SS
DV
DD
OE13IOutput enable. When high, the D0 – D7 outputs go in high-impedance mode.
DV
SS
PWDN_REF24IPower down for internal reference voltages. A high on this terminal disables the internal reference circuit.
REFBI21IReference voltage bottom input. The voltage at this terminal defines the bottom reference voltage for the
REFBO22OReference voltage bottom output. An internally generated reference is available at this terminal. It can be
REFTI20IReference voltage top input. The voltage at this terminal defines the top reference voltage for the ADC.
REFTO19OReference voltage top output. An internally generated reference is available at this terminal. It can be
STBY15IStandby input. A high level on this input enables power-down mode.
16, 27IAnalog supply voltage
18, 23, 28IAnalog ground
connected between this terminal and A VSS for external filtering.
connected between this terminal and A VSS.
1ISupply voltage for digital output drivers
10IGround for digital output drivers
14IDigital supply voltage
11IDigital ground
ADC. It can be connected to REFBO or to an externally generated reference level. Sufficient filtering
should be applied to this input. The use of a 0.1-µF capacitor connected between REFBI and AVSS is
recommended. Additionaly, a 0.1-µF capacitor can be connected between REFTI and REFBI.
connected to REFBI or left unconnected. A 1-µF capacitor between REFBO and A VSS provides sufficient
decoupling required for this output.
It can be connected to REFTO or to an externally generated reference level. Sufficient filtering should be
applied to this input. The use of a 0.1-µF capacitor between REFTI and AVSS is recommended.
Additionaly, a 0.1-µF capacitor can be connected between REFTI and REFBI.
connected to REFTI or left unconnected. A 1-µF capacitor between REFTO and A VSS provides sufficient
decoupling required for this output.
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
†
Supply voltage range:AVDD to AVSS, DVDD to DVSS –0.5 V to 4.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AVDD to DVDD, AVSS to DVSS –0.5 V to 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range to DVSS –0.5 V to DVDD + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range to AVSS –0.5 V to AVDD + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital output voltage range applied from external source to DGND –0.5 V to DV
Reference voltage input range to AGND: V
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions over operating free-temperature range
power supply
Supply voltage
analog and reference inputs
Reference input voltage (top), V
Reference input voltage (bottom), V
Reference voltage differential, V
Analog input voltage, V
(AIN)
(REFTI)
(REFTI)
digital inputs
High-level input voltage, V
Low-level input voltage, V
Clock period, t
Pulse duration, clock high, t
Pulse duration, clock low, t
c
IH
IL
w(CLKH)
w(CLKL)
(REFBI)
– V
AVDD – AV
DVDD – DV
DRVDD – DRV
(REFBI)
SS
SS
SS
MINNOMMAXUNIT
(NOM) – 0.2 2 + (AVDD – 3)(NOM) + 0.2V
0.811.2V
V
(REFBI)
MINNOMMAXUNIT
2.0DV
DGND0.2xDV
28.6ns
13ns
13ns
MINNOMMAXUNIT
33.33.6V
1 + (AVDD – 3)V
V
(REFTI)
DD
DD
V
V
V
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted)
power supply
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
AV
I
DD
P
D(STBY)
DD
Operating supply current
p
Standby powerSTBY = H, CLK held high or low1115
DV
DRV
DD
DD
AVDD = DVDD = 3.3 V, DRVDD = 3 V,
= 15 F,
PWDN_REF = L106139
PWDN_REF = H90113
= 1
p
, –1-dB
–
-
digital logic inputs
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
I
High-level input current on CLK
IH
Low-level input current on digital inputs
I
IL
(OE
, STDBY, PWDN_REF, CLK)
CIInput capacitance5pF
†
IIH leakage current on other digital inputs (OE, STDBY , PWDN_REF) is not measured since these inputs have an internal pull-down resistor of
4 KΩ to DGND.
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted) (continued)
logic outputs
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
High-level output voltage
OH
V
Low-level output voltage
OL
C
Output capacitance5pF
O
High-impedance state output current to
I
OZH
high level
High-impedance state output current to
I
OZL
low level
dc accuracy
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Differential nonlinearity (DNL)Internal references (see Note 2),TA = –40°C to 85°C–1±0.61.3LSB
Zero error
Full-scale error
NOTES: 1. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero
occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond the last code transition. The
deviation is measured from the center of each particular code to the true straight line between these two endpoints.
2. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure
indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under
test [i.e., (last transition level – first transition level) ÷ (2n – 2)]. Using this definition for DNL separates the effects of gain and offset
error. A minimum DNL better than –1 LSB ensures no missing codes.
3. Zero error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches
the ADC output from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the
bottom reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by
the number of ADC output levels (256).
Full-scale error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches
the ADC output from code 254 to code 255. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5
LSB from the top reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references
divided by the number of ADC output levels (256).
AVDD = DVDD = DRVDD = 3 V at IOH = 50 µA,
Digital output forced high
AVDD = DVDD = DRVDD = 3.6 V at IOL = 50 µA,
Digital output forced low
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted) (continued)
reference input (AVDD = DVDD = DRVDD = 3.6 V)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
R
Reference input resistance400Ω
ref
I
Reference input current2.5mA
ref
reference outputs
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
(REFTO)
V
(REFBO)
dynamic performance
Effective number of bits (ENOB)
Signal-to-noise ratio + distortion (SNRD)
Total harmonic distortion (THD)
Spurious free dynamic range (SFDR)
Analog input full-power bandwidth, BWSee Note 4600MHz
†
Based on analog input voltage of – 1-dB FS referenced to a 1.3 Vpp full-scale input range and using the external voltage references at
f
= 35 MSPS with AVDD = DVDD = 3.3 V and DRVDD = 3 V at 25°C.
CLK
NOTE 4: The analog input bandwidth is defined as the maximum frequency of a –1-dB FS input sine that can be applied to the device for which
Reference top offset voltage
Reference bottom offset voltage
Absolute min/max values valid
and tested for AVDD = 3.3 V
†
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
fin = 1 MHz6.67.4
fin = 4.2 MHz6.67.4
fin = 15 MHz7
fin = 1 MHz41.546
fin = 4.2 MHz41.546
fin = 15 MHz43
fin = 1 MHz–46–55
fin = 4.2 MHz–45.5–54
fin = 15 MHz–50
fin = 1 MHz4858
fin = 4.2 MHz4858
fin = 15 MHz52
p
an extra 3-dB attenuation is observed in the reconstructed output signal.
electrical characteristics over recommended operating conditions, f
voltage references (unless otherwise noted) (continued)
timing requirements
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
CLK
t
d(o)
t
h(o)
t
d(pipe)
t
d(a)
t
j(a)
t
dis
t
en
NOTES: 5. Output timing t
Maximum conversion rate35MHz
Minimum conversion rate10kHz
Output delay time (see Figure 1)CL = 10 pF,See Notes 5 and 69ns
Output hold timeCL = 2 pF,See Note 52ns
Pipeline delay time (latency)See Note 64.54.54.5
Aperture delay time3ns
Aperture jitter
Disable time, OE rising to Hi-Z
Enable time, OE falling to valid data58ns
is measured from the 1.5 V level of the CLK input falling edge to the 10%/90% level of the digital output. The digital
output load is not higher than 10 pF.
Output hold time t
digital output is load is not less than 2 pF.
Aperture delay t
The OE signal is asynchronous.
OE timing t
not higher than 10 pF.
OE timing ten is measured from the V
levels. The digital output load is not higher than 10 pF.
6. The number of clock cycles between conversion initiation on an input sample and the corresponding output data being made
available from the ADC pipeline. Once the data pipeline is full, new valid output data is provided on every clock cycle. In order to
know when data is stable on the output pins, the output delay time t
to be added to the pipeline latency. Note that since the max t
clocked in on a rising edge of CLK at this speed. The falling edge should be used.
d(o)
is measured from the 1.5 V level of the CLK input falling edge to the 10%/90% level of the digital output. The
h(o)
is measured from the 1.5 V level of the CLK input to the actual sampling instant.
d(A)
is measured from the V
dis
level of OE to the high-impedance state of the output data. The digital output load is
IH(MIN)
level of OE to the instant when the output data reaches V
IL(MAX)
(i.e., the delay time through the digital output buffers) needs
d(o)
is more than 1/2 clock period at 35 MHz, data cannot be reliably
The TL V5535 implements a high-speed 35 MSPS converter in a cost-effective CMOS process. Powered from
3.3 V , the single-pipeline design architecture ensures low-power operation and 8-bit accuracy . Signal input and
clock signals are all single-ended. The digital inputs are 3.3-V TTL/CMOS compatible. Internal voltage
references are included for both bottom and top voltages. Therefore the converter forms a self-contained
solution. Alternatively , the user may apply externally generated reference voltages. In doing so, both input offset
and input range can be modified to suit the application.
A high-speed sampling-and-hold captures the analog input signal. Multiple stages generate the output code with
a pipeline delay of 4.5 CLK cycles. Correction logic combines the multistage data and aligns the 8-bit output
word. All digital logic operates at the rising edge of CLK.
analog input
A first-order approximation for the equivalent analog input circuit of the TLV5535 is shown in Figure 12. The
equivalent input capacitance C
sample period of one half clock cycle. When a full-scale voltage step is applied, the input source provides the
charging current through the switch resistance RSW (200 Ω) of S1 and quickly settles. In this case, the input
impedance is low. Alternatively, when the source voltage equals the value previously stored on CI, the hold
capacitor requires no input current and the equivalent input impedance is very high.
is 4 pF typical. The input must charge/discharge this capacitance within the
I
TLV5535
To maintain the frequency performance outlined in the specifications, the total source impedance should be
limited to about 80 Ω, as follows from the equation with f
, the total source resistance will increase proportionally.
CLK
TLV5535
S
AIN
S1
R
SW
C
I
Figure 12. Simplified Equivalent Input Circuit
dc coupled input
For dc-coupled systems an op amp can level-shift a ground-referenced input signal. A circuit as shown in
Figure 13(a) is acceptable. Alternatively , the user might want a bipolar shift together with the bottom reference
voltage as seen in Figure 13(b). In this case the AIN voltage is given by:
AIN+2R2÷ǒR1)
V
IN
+
_
AV
DD
Ǔ
R
2
REFTI
REFTO
TLV5535
AIN
REFBI
REFBO
V
REF
–V
IN
V
V
IN
REF
R
IN
R
IN
_
R
+
1
R
2
REFTI
REFTO
TLV5535
AIN
REFBI
REFBO
(a)
(b)
Figure 13. DC-Coupled Input Circuit
ac coupled input
For many applications, especially in single supply operation, ac coupling offers a convenient way for biasing
the analog input signal at the proper signal range. Figure 14 shows a typical configuration. To maintain the
outlined specifications, the component values need to be carefully selected. The most important issue is the
positioning of the 3-dB high-pass corner point f
, which is a function of R2 and the parallel combination of
–3 dB
C1 and C2, called Ceq. This is given by the following equation:
f
–3 dB
+
1 ÷ǒ2π xR2xC
eq
Ǔ
where Ceq is the parallel combination of C1 and C2.
Since C1 is typically a large electrolytic or tantalum capacitor, the impedance becomes inductive at higher
frequencies. Adding a small ceramic or polystyrene capacitor, C2 of approximately 0.01 µF, which is not
inductive within the frequency range of interest, maintains low impedance. If the minimum expected input signal
frequency is 20 kHz, and R2 equals 1 kΩ and R1 equals 50 Ω, the parallel capacitance of C1 and C2 must be
a minimum of 8 nF to avoid attenuating signals close to 20 kHz.
The voltages on terminals REFBI and REFTI determine the TLV5535 input range. Since the device has an
internal voltage reference generator with outputs available on REFBO and REFTO respectively , corresponding
terminals can be directly connected externally to provide a contained ADC solution. Especially at higher
sampling rates, it is advantageous to have a wider analog input range. The wider analog input range is
achievable by using external voltage references (e.g., at AV
from 1 Vpp (internal reference) to 1.3 Vpp (external reference) as shown in T able 1). These voltages should not
be derived via a voltage divider from a power supply source. Instead, a bandgap-derived voltage reference
should be used to derive both references via an op amp circuit. Refer to the schematic of the TL V5535 evaluation
module for an example circuit.
When using external references, the full-scale ADC input range and its dc position can be adjusted. The
full-scale ADC range is always equal to V
REFT
– V
. The maximum full-scale range is dependent on A V
REFB
as shown in the specification section. In addition to the limitation on their difference, V
have limits on their useful range. These limits are also dependent on AVDD.
= 3.3 V, the full-scale range can be extended
DD
and V
REFT
REFB
DD
each also
Table 1 summarizes these limits for 3 cases.
Table 1. Recommended Operating Modes
AV
DD
3 V0.8 V1.2 V1.8 V2.2 V1 V
3.3 V0.8 V1.2 V2.1 V2.5 V1.3 V
3.6 V0.8 V1.2 V2.4 V2.8 V1.6 V
V
REFB(min)
V
REFB(max)VREFT(min)
V
REFT(max)
(V
REFT–VREFB)max
digital inputs
The digital inputs are CLK, STDBY, PWDN_REF, and OE. All of these signals, except CLK, have an internal
pulldown resistor to connect to digital ground. This provides a default active operation mode using internal
references when left unconnected.
The CLK signal at high frequencies should be considered as an analog input. Overshoot/undershoot should be
minimized by proper termination of the signal close to the TLV5535. An important cause of performance
degradation for a high-speed ADC is clock jitter. Clock jitter causes uncertainty in the sampling instant of the
ADC, in addition to the inherent uncertainty on the sampling instant caused by the part itself, as specified by
its aperture jitter. There is a theoretical relationship between the frequency (f) and resolution (2
that needs to be sampled and the maximum amount of aperture error dt
formula shows the relation:
ǒ
Ǔ
N)1
dt
+1Bƪp
max
As an example, for an 8-bit converter with a 15-MHz input, the jitter needs to be kept < 41 pF in order not to have
changes in the LSB of the ADC output due to the total aperture error.
f2
ƫ
that is tolerable. The following
max
digital outputs
The output of the TL V5535 is standard binary code. Capacitive loading on the output should be kept as low as
possible (a maximum loading of 10 pF is recommended) to provide the best performance. Higher output loading
causes higher dynamic output currents and can increase noise coupling into the analog front end of the device.
To drive higher loads, the use of an output buffer is recommended.
N
) of a signal
When clocking output data from the TL V5535, it is important to observe its timing relation to CLK. The pipeline
ADC delay is 4.5 clock cycles to which the maximum output propagation delay is added. See Note 6 in the
specification section for more details.
layout, decoupling and grounding rules
It is necessary for any PCB using the TLV5535 to have proper grounding and layout to achieve the stated
performance. Separate analog and digital ground planes that are spliced underneath the device are advisable.
The TLV5535 has digital and analog terminals on opposite sides of the package to make proper grounding
easier. Since there is no internal connection between the analog and digital grounds, they have to be joined on
the PCB. Joining the digital and analog grounds at a point in close proximity to the TLV5535 is advised.
As for power supplies, separate analog and digital supply terminals are provided on the device (A V
The supply to the digital output drivers is kept separate also (DRVDD). Lowering the voltage on this supply from
the nominal 3.3 V to 3 V improves performance because of the lower switching noise caused by the output
buffers.
Due to the high sampling rate and switched-capacitor architecture, the TLV5535 generates transients on the
supply and reference lines. Proper decoupling of these lines is essential. Decoupling as shown in the schematic
of the TLV5535 EVM is recommended.
TI provides an evaluation module (EVM) for TL V5535. The EVM also includes a 10b 80 MSPS DAC so that the
user can convert the digitized signal back to the analog domain for functional testing. Performance
measurements can be done by capturing the ADC’s output data.
The EVM provides the following additional features:
D
Provision of footprint for the connection of an onboard crystal oscillator, instead of using an external clock
input.
D
Use of TLV5535 internal or external voltage references. In the case of external references, an onboard
circuit is used that derives adjustable bottom and top reference voltages from a bandgap reference. Two
potentiometers allow for the independent adjustments of both references. The full scale ADC range can be
adjusted to the input signal amplitude.
D
All digital output, control signal I/O (output enable, standby, reference powerdown) and clock I/O are
provided on a single connector. The EVM can thus be part of a larger (DSP) system for prototyping.
D
Onboard prototyping area with analog and digital supply and ground connections.
TLV5535
Figure 15 shows the EVM schematic.
The EVM is factory shipped for use in the following configuration:
D
Use of external (onboard) voltage references
D
External clock input
analog input
A signal in the range between V
J10. This signal is onboard terminated with 50Ω. There is no onboard biasing of the signal. When using external
(onboard) references, these levels can be adjusted with R7 (V
both references to shift. R6 only impacts the bottom reference. The range of these signals for which the device
is specified depends on AV
Internally generated reference levels are also dependent on AV
section.
(REFBI)
and is shown in the
DD
and V
(REFTI)
should be applied to avoid overflow/underflow on connector
(REFTI)
Recommended Operating Conditions
) and R6 (V
as shown in the electrical characteristics
DD
(REFBI)
). Adjusting R7 causes
.
clock input
A clock signal should be applied with amplitudes ranging from 0 to A VDD with a frequency equal to the desired
sampling frequency on connector J9. This signal is onboard terminated with 50 Ω. Both ADC and DAC run of f
the same clock signal. Alternatively the clock can be applied from terminal 1 on connector J11. A third option
is using a crystal oscillator. The EVM board provides the footprint for a crystal oscillator that can be populated
by the end-user, depending on the desired frequency. The footprint is compatible with the Epson EG-8002DC
series of programmable high-frequency crystal oscillators. Refer to the TLV5535 EVM Settings for selecting
between the different clock modes.
The board provides seven power supply connectors (see T able 2). For optimum performance, analog and digital
supplies should be kept separate. Using separate supplies for the digital logic portion of TL V5535 (DVDD) and
its output drivers (DRVDD) benefits dynamic performance, especially when DRVDD is put at the minimum
required voltage (3 V), while DVDD might be higher (up to 3.6 V). This lowers the switching noise on the die
caused by the output drivers.
Table 2. Power Supplies
SIGNAL
NAME
DRV3J13DRV3.3 V digital supply for TLV5535 (digital output drivers)
DV3J23VD3.3 V digital supply for TLV5535 (digital logic) and peripherals
DV5J35VD5 V digital supply for D/A converter and peripherals
AV3J43VA3.3 V analog supply for TLV5535
AV5J55VA5 V analog supply for onboard reference circuit and D/A converter. Can be left unconnected if
AV+12J612VA12 V analog supply for onboard reference circuit. Can be left unconnected if internal references
AV–12J7–12VA–12 V analog supply for onboard reference circuit. Can be left unconnected if internal
CONNECTOR
BOARD
LABEL
DESCRIPTION
internal references are used and no D/A conversion is required.
are used.
references are used.
voltage references
SW1 and SW2 switch between internal and external top and bottom references respectively. The external
references are onboard generated from a stable bandgap-derived 3.3 V signal (using TI’s TPS7133 and
quad-opamp TLE2144). They can be adjusted via potentiometers R6 (V
(REFBI)
) and R7 (V
(REFTI)
). It is advised
to power down the internal voltage references by asserting PWN_REF when onboard references are used.
The references are measured at test points TP3 (V
(REFB)
) and TP4 (V
(REFT)
).
DAC output
The onboard DAC is a 10-bit 80 MSPS converter. It is connected back-to-back to the TLV5535. While the user
could use its analog output for measurements, the DAC output is directly connected to connector J8 and does
not pass through an analog reconstruction filter. So mirror spectra from aliased signal components feed through
into the analog output.
For this reason and to separate ADC and DAC contributions, performance measurements should be made by
capturing the ADC output data available on connector J11 and not by evaluating the DAC output.
18
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 19
TLV5535 EVM settings
clock input settings
REFERENCE
DESIGNATOR
W1Clock selection switch
W2Clock source switch
W3Clock output switch
reference settings
REFERENCE
DESIGNATOR
SW1REFT external/internal switch
SW2REFB external/internal switch
1–2 J11: clock from pin1 on J11 connector
2–3 J9: clock from J9 SMA connector
J
XTL: clock from onboard crystal oscillator
j
CLK: clock from pin 1 on J11 connector (if W1/1–2) or J9 SMA connector (if W1/2–3)
NOTE: If set to XTL and a XTL oscillator is populated, no clock signal should be applied to J9 or J1 1, depending on the W1
setting.
1–2 Rising: clock output on J1 1 connector is the same phase as the clock to the digital output buffer . Data changes on rising
CLK edge.
2–3 Falling: clock output on J1 1 connector is the opposite phase as the digital output buffer. Data changes on falling CLK edge.
Jj
REFT internal: REFT from TLV5535 internal reference
jJ
REFT external: REFT from onboard voltage reference circuit
Jj
REFB internal: REFB from TLV5535 internal reference
jJ
REFB external: REFB from onboard voltage reference circuit
W4TL V5535 and digital output buf fer output enable control (1)
W5TL V5535 and digital output buf fer output enable control (2)
W6TL V5535 STDBY control
J
5535-574 OE
board-external OE
j
5535-574 OE
buffer needs to be pulled low from pin 5 on J1 1 connector to enable. The OE
pin 7 on J11 connector (W5 open) or is permanently enabled if W5 is closed.
J
5535 OE
-connected.
OE
j
5535 OE
the output can be disabled.
J
Stdby: STDBY is active (high).
j
Active: STDBY is low, via internal pulldown. STDBY can be taken high from pin 9 on J11 connector to enable standby
mode.
-connected: Connects OEs of TLV5535 and digital output buffer (574 buffer). Use this when no
is used. In addition, close W5 to have both OEs permanently enabled.
-disconnected: Disconnects OEs of TL V5535 and digital output buffer (574 buffer). The OE for the output
to GND: Connects OEs of TL V5535 to GND. Additionally connects OE of 74ALS574 to GND if W4 is 5535-574
external: Enables control of OE of TL V5535 via pin 7 on J1 1 connector . When taken high (internal pulldown)
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.
D. Falls within JEDEC MO-153
8
3,10
2,90
14
5,10
4,90
16
5,10
20
6,60
6,404,90
24
7,90
7,70
28
9,80
9,60
4040064/E 08/96
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
31
Page 32
PACKAGE OPTION ADDENDUM
www.ti.com
18-Jul-2006
PACKAGING INFORMATION
Orderable DeviceStatus
(1)
Package
Type
Package
Drawing
Pins Package
Qty
Eco Plan
TLV5535IPWACTIVETSSOPPW2850Green (RoHS &
no Sb/Br)
TLV5535IPWG4ACTIVETSSOPPW2850Green (RoHS &
no Sb/Br)
TLV5535IPWRACTIVETSSOPPW282000 Green (RoHS &
no Sb/Br)
TLV5535IPWRG4ACTIVETSSOPPW282000 Green (RoHS &
no Sb/Br)
(1)
The marketing status values are defined asfollows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the devicewill be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but isnot in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production ofthe device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information andadditional product content details.
TBD: The Pb-Free/Green conversion plan has notbeen defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products aresuitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed0.1% by weight in homogeneous material)
(2)
Lead/Ball Finish MSL Peak Temp
CU NIPDAULevel-1-260C-UNLIM
CU NIPDAULevel-1-260C-UNLIM
CU NIPDAULevel-1-260C-UNLIM
CU NIPDAULevel-1-260C-UNLIM
(3)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.