Datasheet TLV5535 Datasheet (TEXAS INSTRUMENTS)

Page 1
T
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
D
8-Bit Resolution, 35 MSPS Sampling Analog-to-Digital Converter (ADC)
D
Low Power Consumption: 90 mW Typ Using External References
D
Wide Analog Input Bandwidth: 600 MHz Typ
D
3.3-V Single-Supply Operation
D
3.3-V TTL/CMOS-Compatible Digital I/O
D
Internal Bottom and Top Reference Voltages
D
Adjustable Reference Input Range
D
Power-Down (Standby) Mode
D
Separate Power Down for Internal Voltage References
D
Three-State Outputs
D
28-Pin Thin Shrink SOP (TSSOP) Packages
D
Applications – Digital Communications (IF Sampling) – High-Speed DSP Front-End
(TMS320C6000) – Medical Imaging – Video Processing (Scan Rate/Format
Conversion) – DVD Read Channel Digitization
description
DRV
DRV
DV
DV
PW PACKAGE
(TOP VIEW)
DD
D0 D1 D2 D3 D4 D5 D6 D7
SS SS
CLK
OE
DD
1 2 3 4 5 6 7 8 9 10 11 12 13 14
AV
28
AV
27
AIN
26
CML
25
PWDN_REF
24
AV
23
REFBO
22
REFBI
21
REFTI
20
REFTO
19
AV
18
BG
17
AV
16 15
STBY
SS DD
SS
SS
DD
The TLV5535 is an 8-bit, 35 MSPS, high-speed A/D converter. It converts the analog input signal into 8-bit binary-coded digital words up to a sampling rate of 35 MHz. All digital inputs and outputs are 3.3 V TTL/CMOS-compatible.
The device consumes very little power due to the 3.3-V supply and an innovative single-pipeline architecture implemented in a CMOS process. The user obtains maximum flexibility by setting both bottom and top voltage references from user-supplied voltages. If no external references are available, on-chip references are available for internal and external use. The full-scale range is 1 V
up to 1.6 Vpp, depending on the analog
pp
supply voltage. If external references are available, the internal references can be disabled independently from the rest of the chip, resulting in an even greater power saving.
While usable in a wide variety of applications, the device is specifically suited for the digitizing of high-speed graphics and for interfacing to LCD panels or LCD/DMD projection modules . Other applications include DVD read channel digitization, medical imaging, and communications. This device is suitable for IF sampling of communication systems using sub-Nyquist sampling methods because of its high analog input bandwidth.
AVAILABLE OPTIONS
A
–40°C to 85°C TLV5535IPW
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PACKAGED DEVICES
TSSOP-28
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1999, Texas Instruments Incorporated
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
functional block diagram
SHA
+
SHA SHA SHA SHA SHA
DACADC
2222 2
Correction Logic
Output Buffers
D0(LSB)–D7(MSB)
2
ADC
The single-pipeline architecture uses 6 ADC/DAC stages and one final flash ADC. Each stage produces a resolution of 2 bits. The correction logic generates its result using the 2-bit result from the first stage, 1 bit from each of the 5 succeeding stages, and 1 bit from the final stage in order to arrive at an 8-bit result. The correction logic ensures no missing codes over the full operating temperature range.
circuit diagrams of inputs and outputs
ALL DIGITAL INPUT CIRCUITS AIN INPUT CIRCUIT
DV
DD
AV
DD
2
REFERENCE INPUT CIRCUIT D0–D7 OUTPUT CIRCUIT
AV
DD
Internal Reference Generator
AV
REFBI
or
REFTI
DD
REFTO or REFBO
D
OE
0.5 pF
DRV
DRV
DD
D_Out
SS
2
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I/O
DESCRIPTION
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
Terminal Functions
TERMINAL
NAME NO.
AIN 26 I Analog input AV
DD
AV
SS
BG 17 O Band gap reference voltage. A 1-µF capacitor (with an optional 0.1-µF capacitor in parallel) should be
CLK 12 I Clock input. The input is sampled on each rising edge of CLK. CML 25 O Common mode level. This voltage is equal to (A VDD – AVSS) ÷ 2. An external 0.1-µF capacitor should be
D0 – D7 2 – 9 O Data outputs. D7 is the MSB. DRV
DD
DRV
SS
DV
DD
OE 13 I Output enable. When high, the D0 – D7 outputs go in high-impedance mode. DV
SS
PWDN_REF 24 I Power down for internal reference voltages. A high on this terminal disables the internal reference circuit. REFBI 21 I Reference voltage bottom input. The voltage at this terminal defines the bottom reference voltage for the
REFBO 22 O Reference voltage bottom output. An internally generated reference is available at this terminal. It can be
REFTI 20 I Reference voltage top input. The voltage at this terminal defines the top reference voltage for the ADC.
REFTO 19 O Reference voltage top output. An internally generated reference is available at this terminal. It can be
STBY 15 I Standby input. A high level on this input enables power-down mode.
16, 27 I Analog supply voltage
18, 23, 28 I Analog ground
connected between this terminal and A VSS for external filtering.
connected between this terminal and A VSS.
1 I Supply voltage for digital output drivers 10 I Ground for digital output drivers 14 I Digital supply voltage
11 I Digital ground
ADC. It can be connected to REFBO or to an externally generated reference level. Sufficient filtering should be applied to this input. The use of a 0.1-µF capacitor connected between REFBI and AVSS is recommended. Additionaly, a 0.1-µF capacitor can be connected between REFTI and REFBI.
connected to REFBI or left unconnected. A 1-µF capacitor between REFBO and A VSS provides sufficient decoupling required for this output.
It can be connected to REFTO or to an externally generated reference level. Sufficient filtering should be applied to this input. The use of a 0.1-µF capacitor between REFTI and AVSS is recommended. Additionaly, a 0.1-µF capacitor can be connected between REFTI and REFBI.
connected to REFTI or left unconnected. A 1-µF capacitor between REFTO and A VSS provides sufficient decoupling required for this output.
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range:AVDD to AVSS, DVDD to DVSS –0.5 V to 4.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AVDD to DVDD, AVSS to DVSS –0.5 V to 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range to DVSS –0.5 V to DVDD + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range to AVSS –0.5 V to AVDD + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital output voltage range applied from external source to DGND –0.5 V to DV Reference voltage input range to AGND: V
(REFTI)
, V
(REFTO)
, V
(REFBI)
, V
(REFBO)
–0.5 V to AVDD + 0.5 V
DD
+ 0.5 V. . . . . . . . . . . . . .
Operating free-air temperature range, TA: TLV5535I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
–55°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
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TLV5535
C
L
V
I
MHz
FS
PDPower dissipation
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
recommended operating conditions over operating free-temperature range
power supply
Supply voltage
analog and reference inputs
Reference input voltage (top), V Reference input voltage (bottom), V Reference voltage differential, V Analog input voltage, V
(AIN)
(REFTI)
(REFTI)
digital inputs
High-level input voltage, V Low-level input voltage, V Clock period, t Pulse duration, clock high, t
Pulse duration, clock low, t
c
IH
IL
w(CLKH)
w(CLKL)
(REFBI)
– V
AVDD – AV DVDD – DV DRVDD – DRV
(REFBI)
SS
SS
SS
MIN NOM MAX UNIT
(NOM) – 0.2 2 + (AVDD – 3) (NOM) + 0.2 V
0.8 1 1.2 V
V
(REFBI)
MIN NOM MAX UNIT
2.0 DV
DGND 0.2xDV
28.6 ns 13 ns
13 ns
MIN NOM MAX UNIT
3 3.3 3.6 V
1 + (AVDD – 3) V
V
(REFTI)
DD
DD
V
V V
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted)
power supply
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AV
I
DD
P
D(STBY)
DD
Operating supply current
p
Standby power STBY = H, CLK held high or low 11 15
DV DRV
DD
DD
AVDD = DVDD = 3.3 V, DRVDD = 3 V,
= 15 F,
PWDN_REF = L 106 139 PWDN_REF = H 90 113
= 1
p
, –1-dB
-
digital logic inputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
High-level input current on CLK
IH
Low-level input current on digital inputs
I
IL
(OE
, STDBY, PWDN_REF, CLK)
CIInput capacitance 5 pF
IIH leakage current on other digital inputs (OE, STDBY , PWDN_REF) is not measured since these inputs have an internal pull-down resistor of 4 K to DGND.
AVDD = DVDD = DRVDD = CLK = 3.6 V 10 µA AVDD = DVDD = DRVDD = 3.6 V,
Digital inputs at 0 V
27 34
1.5 2.6 4 6
10 µA
mA
mW
4
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Page 5
AV
DD
DV
DD
DRV
DD
V
Integral nonlinearity (INL), best-fit
Internal references (see Note 1)
DD DD DD
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted) (continued)
logic outputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
High-level output voltage
OH
V
Low-level output voltage
OL
C
Output capacitance 5 pF
O
High-impedance state output current to
I
OZH
high level High-impedance state output current to
I
OZL
low level
dc accuracy
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Differential nonlinearity (DNL) Internal references (see Note 2), TA = –40°C to 85°C –1 ±0.6 1.3 LSB Zero error Full-scale error
NOTES: 1. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero
occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond the last code transition. The
deviation is measured from the center of each particular code to the true straight line between these two endpoints.
2. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under test [i.e., (last transition level – first transition level) ÷ (2n – 2)]. Using this definition for DNL separates the effects of gain and offset error. A minimum DNL better than –1 LSB ensures no missing codes.
3. Zero error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches the ADC output from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the bottom reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels (256).
Full-scale error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches the ADC output from code 254 to code 255. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5 LSB from the top reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels (256).
AVDD = DVDD = DRVDD = 3 V at IOH = 50 µA, Digital output forced high
AVDD = DVDD = DRVDD = 3.6 V at IOL = 50 µA, Digital output forced low
=
AVDD = DVDD = 3.3 V, DRVDD = 3 V, Internal references (see Note 3)
=
= 3.6
TA = 25°C –1.5 ±0.7 1.5 LSB TA = –40°C to 85°C –2.4 ±0.7 2.4 LSB
2.8 V
0.1 V
10 µA
10 µA
5 %FS 5 %FS
analog input
C
Input capacitance 4 pF
I
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
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TLV5535
Differential phase, DP
0.6
CLK in
Differential gain, DG
20 IRE am litude vs full scale of 140 IRE
0.2%
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
electrical characteristics over recommended operating conditions, f
= 35 MSPS, external
CLK
voltage references (unless otherwise noted) (continued)
reference input (AVDD = DVDD = DRVDD = 3.6 V)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
R
Reference input resistance 400
ref
I
Reference input current 2.5 mA
ref
reference outputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
(REFTO)
V
(REFBO)
dynamic performance
Effective number of bits (ENOB)
Signal-to-noise ratio + distortion (SNRD)
Total harmonic distortion (THD)
Spurious free dynamic range (SFDR)
Analog input full-power bandwidth, BW See Note 4 600 MHz
Based on analog input voltage of – 1-dB FS referenced to a 1.3 Vpp full-scale input range and using the external voltage references at f
= 35 MSPS with AVDD = DVDD = 3.3 V and DRVDD = 3 V at 25°C.
CLK
NOTE 4: The analog input bandwidth is defined as the maximum frequency of a –1-dB FS input sine that can be applied to the device for which
Reference top offset voltage Reference bottom offset voltage
Absolute min/max values valid and tested for AVDD = 3.3 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
fin = 1 MHz 6.6 7.4 fin = 4.2 MHz 6.6 7.4 fin = 15 MHz 7 fin = 1 MHz 41.5 46 fin = 4.2 MHz 41.5 46 fin = 15 MHz 43 fin = 1 MHz –46 –55 fin = 4.2 MHz –45.5 –54 fin = 15 MHz –50 fin = 1 MHz 48 58 fin = 4.2 MHz 48 58 fin = 15 MHz 52
p
an extra 3-dB attenuation is observed in the reconstructed output signal.
f
= 35 MHz, fin = 4.2 MHz,
CLK
20 IRE amplitude vs full-scale of 140 IRE
2.07 2 + [(AVDD – 3) ÷ 2] 2.21 V
1.09 1 + [(AVDD – 3) ÷ 2] 1.21 V
Bits
dB
dB
dB
6
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Page 7
f
See Note 5
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
electrical characteristics over recommended operating conditions, f voltage references (unless otherwise noted) (continued)
timing requirements
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
CLK
t
d(o)
t
h(o)
t
d(pipe)
t
d(a)
t
j(a)
t
dis
t
en
NOTES: 5. Output timing t
Maximum conversion rate 35 MHz Minimum conversion rate 10 kHz Output delay time (see Figure 1) CL = 10 pF, See Notes 5 and 6 9 ns Output hold time CL = 2 pF, See Note 5 2 ns
Pipeline delay time (latency) See Note 6 4.5 4.5 4.5 Aperture delay time 3 ns
Aperture jitter Disable time, OE rising to Hi-Z Enable time, OE falling to valid data 5 8 ns
is measured from the 1.5 V level of the CLK input falling edge to the 10%/90% level of the digital output. The digital
output load is not higher than 10 pF. Output hold time t
digital output is load is not less than 2 pF. Aperture delay t The OE signal is asynchronous. OE timing t
not higher than 10 pF. OE timing ten is measured from the V
levels. The digital output load is not higher than 10 pF.
6. The number of clock cycles between conversion initiation on an input sample and the corresponding output data being made available from the ADC pipeline. Once the data pipeline is full, new valid output data is provided on every clock cycle. In order to know when data is stable on the output pins, the output delay time t to be added to the pipeline latency. Note that since the max t clocked in on a rising edge of CLK at this speed. The falling edge should be used.
d(o)
is measured from the 1.5 V level of the CLK input falling edge to the 10%/90% level of the digital output. The
h(o)
is measured from the 1.5 V level of the CLK input to the actual sampling instant.
d(A)
is measured from the V
dis
level of OE to the high-impedance state of the output data. The digital output load is
IH(MIN)
level of OE to the instant when the output data reaches V
IL(MAX)
(i.e., the delay time through the digital output buffers) needs
d(o)
is more than 1/2 clock period at 35 MHz, data cannot be reliably
d(o)
= 35 MSPS, external
CLK
1.5 ps, rms 5 8 ns
OH(min)
or V
OL(max)
CLK
cycles
output
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
PARAMETER MEASUREMENT INFORMATION
N+3
N
N+1
90% 10%
V
IH(min)
N+5
V
t
en
IL(max)
CLK
N+2
t
d(pipe)
t
j(a)
t
t
h(o)
d(a)
1.5 V
1/f
V
V
CLK
t
w(CLKH)
D0–D7 N–4 N–3 N–2 N–1 N N+1
OE
IH
(min)
t
w(CLKL)
IL
(max)
N+4
1.5 V
t
d(o)
t
dis
Figure 1. Timing Diagram
TYPICAL CHARACTERISTICS
performance plots at 25°C
V
OH(min)
V
OL(max)
0.2
0.1
0.0
DNL – LSB
–0.1
–0.2
0 50 100 150 200 250
ADC Code
Figure 2. DNL vs Input Code at 35 MSPS (with external reference, PW Package)
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8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
TYPICAL CHARACTERISTICS
performance plots at 25°C (continued)
0.4
0.3
0.2
0.1 –0.0 –0.1
INL – LSB
–0.2 –0.3 –0.4
0 50 100 150 200 250
Figure 3. INL vs Input Code at 35 MSPS (with external reference, PW package)
TLV5535
SLAS221 – JUNE 1999
ADC Code
50 45
40
35
30
25
SNRD – dB
20
15
10
5 0
0 1020304050
Analog Input Frequency – MHz
Figure 4. SNRD vs fin at 35 MSPS (external reference)
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TYPICAL CHARACTERISTICS
performance plots at 25°C (continued)
8
7
6
5
4
ENOB
3
2
1
0
0 1020304050
Analog Input Frequency – MHz
Figure 5. ENOB vs FIN, 35 MSPS (external reference)
0 –10 –20 –30 –40 –50 –60 –70
Power – dBFS
–80 –90
–100
0 5 10 15
f – Frequency – MHz
Figure 6. Spectral Plot fin = 1.0 MHz at 35 MSPS
10
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8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
TYPICAL CHARACTERISTICS
performance plots at 25°C (continued)
0 –10 –20 –30 –40 –50 –60
Power – dB
–70 –80 –90
–100
0 5 10 15
Figure 7. Spectral Plot fin = 4.2 MHz at 35 MSPS
TLV5535
SLAS221 – JUNE 1999
f – Frequency – MHz
0
–10 –20 –30 –40 –50 –60
Power – dB
–70 –80 –90
–100
0 5 10 15
f – Frequency – MHz
Figure 8. Spectral Plot fin = 15.527 MHz at 35 MSPS
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TYPICAL CHARACTERISTICS
performance plots at 25°C (continued)
120
100
80
60
Power – mV
40
20
0
0 1020304050
Input Clock Frequency – MHz
Figure 9. Power vs f
CLK
at fin = 1 MHz, –1-dB FS
2.5
2.0
1.5
1.0
Supply Current – mA
0.5
0
0 1020304050
Input Frequency – MHz
Figure 10. DRVDD Supply Current vs f
at fin = 1 MHz, –1-dB FS
CLK
0.00
–1.00
–2.00
–3.00
–4.00
Fundamental – dB
–5.00
–6.00
–7.00
1 10 100 1000
Input Frequency – MHz
Figure 11. ADC Output Power With Respect to –1-dB FS V
(internal reference, PW package)
IN
12
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8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
PRINCIPLES OF OPERATION
The TL V5535 implements a high-speed 35 MSPS converter in a cost-effective CMOS process. Powered from
3.3 V , the single-pipeline design architecture ensures low-power operation and 8-bit accuracy . Signal input and clock signals are all single-ended. The digital inputs are 3.3-V TTL/CMOS compatible. Internal voltage references are included for both bottom and top voltages. Therefore the converter forms a self-contained solution. Alternatively , the user may apply externally generated reference voltages. In doing so, both input offset and input range can be modified to suit the application.
A high-speed sampling-and-hold captures the analog input signal. Multiple stages generate the output code with a pipeline delay of 4.5 CLK cycles. Correction logic combines the multistage data and aligns the 8-bit output word. All digital logic operates at the rising edge of CLK.
analog input
A first-order approximation for the equivalent analog input circuit of the TLV5535 is shown in Figure 12. The equivalent input capacitance C sample period of one half clock cycle. When a full-scale voltage step is applied, the input source provides the charging current through the switch resistance RSW (200 ) of S1 and quickly settles. In this case, the input impedance is low. Alternatively, when the source voltage equals the value previously stored on CI, the hold capacitor requires no input current and the equivalent input impedance is very high.
is 4 pF typical. The input must charge/discharge this capacitance within the
I
TLV5535
To maintain the frequency performance outlined in the specifications, the total source impedance should be limited to about 80 Ω, as follows from the equation with f
RStƪ1 ÷ǒ2f
CLK
CI
In(256)Ǔ–R
ƫ
The source impedance is approximatly 450 Ω.
SW
= 35 MHz, CI = 4 pF, RSW = 200 Ω:
CLK
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
PRINCIPLE OF OPERATION
analog input (continued)
So, for applications running at a lower f
R
V
S
, the total source resistance will increase proportionally.
CLK
TLV5535
S
AIN
S1
R
SW
C
I
Figure 12. Simplified Equivalent Input Circuit
dc coupled input
For dc-coupled systems an op amp can level-shift a ground-referenced input signal. A circuit as shown in Figure 13(a) is acceptable. Alternatively , the user might want a bipolar shift together with the bottom reference voltage as seen in Figure 13(b). In this case the AIN voltage is given by:
AIN+2 R2÷ǒR1)
V
IN
+ _
AV
DD
Ǔ
R
2
REFTI REFTO
TLV5535
AIN
REFBI REFBO
V
REF
–V
IN
V
V
IN
REF
R
IN
R
IN
_
R
+
1
R
2
REFTI REFTO
TLV5535
AIN
REFBI REFBO
(a)
(b)
Figure 13. DC-Coupled Input Circuit
ac coupled input
For many applications, especially in single supply operation, ac coupling offers a convenient way for biasing the analog input signal at the proper signal range. Figure 14 shows a typical configuration. To maintain the outlined specifications, the component values need to be carefully selected. The most important issue is the positioning of the 3-dB high-pass corner point f
, which is a function of R2 and the parallel combination of
–3 dB
C1 and C2, called Ceq. This is given by the following equation:
f
–3 dB
+
1 ÷ǒ2π xR2xC
eq
Ǔ
where Ceq is the parallel combination of C1 and C2. Since C1 is typically a large electrolytic or tantalum capacitor, the impedance becomes inductive at higher
frequencies. Adding a small ceramic or polystyrene capacitor, C2 of approximately 0.01 µF, which is not inductive within the frequency range of interest, maintains low impedance. If the minimum expected input signal frequency is 20 kHz, and R2 equals 1 kΩ and R1 equals 50 Ω, the parallel capacitance of C1 and C2 must be a minimum of 8 nF to avoid attenuating signals close to 20 kHz.
14
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ac coupled input (continued)
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
PRINCIPLE OF OPERATION
C1
V
IN
C2
+ –
R2
R1
V
BIAS
TLV5535
AIN
Figure 14. AC-Coupled Input Circuit
reference terminals
The voltages on terminals REFBI and REFTI determine the TLV5535 input range. Since the device has an internal voltage reference generator with outputs available on REFBO and REFTO respectively , corresponding terminals can be directly connected externally to provide a contained ADC solution. Especially at higher sampling rates, it is advantageous to have a wider analog input range. The wider analog input range is achievable by using external voltage references (e.g., at AV from 1 Vpp (internal reference) to 1.3 Vpp (external reference) as shown in T able 1). These voltages should not be derived via a voltage divider from a power supply source. Instead, a bandgap-derived voltage reference should be used to derive both references via an op amp circuit. Refer to the schematic of the TL V5535 evaluation module for an example circuit.
When using external references, the full-scale ADC input range and its dc position can be adjusted. The full-scale ADC range is always equal to V
REFT
– V
. The maximum full-scale range is dependent on A V
REFB
as shown in the specification section. In addition to the limitation on their difference, V have limits on their useful range. These limits are also dependent on AVDD.
= 3.3 V, the full-scale range can be extended
DD
and V
REFT
REFB
DD
each also
Table 1 summarizes these limits for 3 cases.
Table 1. Recommended Operating Modes
AV
DD
3 V 0.8 V 1.2 V 1.8 V 2.2 V 1 V
3.3 V 0.8 V 1.2 V 2.1 V 2.5 V 1.3 V
3.6 V 0.8 V 1.2 V 2.4 V 2.8 V 1.6 V
V
REFB(min)
V
REFB(max)VREFT(min)
V
REFT(max)
(V
REFT–VREFB)max
digital inputs
The digital inputs are CLK, STDBY, PWDN_REF, and OE. All of these signals, except CLK, have an internal pulldown resistor to connect to digital ground. This provides a default active operation mode using internal references when left unconnected.
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
PRINCIPLE OF OPERATION
digital inputs (continued)
The CLK signal at high frequencies should be considered as an analog input. Overshoot/undershoot should be minimized by proper termination of the signal close to the TLV5535. An important cause of performance degradation for a high-speed ADC is clock jitter. Clock jitter causes uncertainty in the sampling instant of the ADC, in addition to the inherent uncertainty on the sampling instant caused by the part itself, as specified by its aperture jitter. There is a theoretical relationship between the frequency (f) and resolution (2 that needs to be sampled and the maximum amount of aperture error dt formula shows the relation:
ǒ
Ǔ
N)1
dt
+1Bƪp
max
As an example, for an 8-bit converter with a 15-MHz input, the jitter needs to be kept < 41 pF in order not to have changes in the LSB of the ADC output due to the total aperture error.
f2
ƫ
that is tolerable. The following
max
digital outputs
The output of the TL V5535 is standard binary code. Capacitive loading on the output should be kept as low as possible (a maximum loading of 10 pF is recommended) to provide the best performance. Higher output loading causes higher dynamic output currents and can increase noise coupling into the analog front end of the device. To drive higher loads, the use of an output buffer is recommended.
N
) of a signal
When clocking output data from the TL V5535, it is important to observe its timing relation to CLK. The pipeline ADC delay is 4.5 clock cycles to which the maximum output propagation delay is added. See Note 6 in the specification section for more details.
layout, decoupling and grounding rules
It is necessary for any PCB using the TLV5535 to have proper grounding and layout to achieve the stated performance. Separate analog and digital ground planes that are spliced underneath the device are advisable. The TLV5535 has digital and analog terminals on opposite sides of the package to make proper grounding easier. Since there is no internal connection between the analog and digital grounds, they have to be joined on the PCB. Joining the digital and analog grounds at a point in close proximity to the TLV5535 is advised.
As for power supplies, separate analog and digital supply terminals are provided on the device (A V The supply to the digital output drivers is kept separate also (DRVDD). Lowering the voltage on this supply from the nominal 3.3 V to 3 V improves performance because of the lower switching noise caused by the output buffers.
Due to the high sampling rate and switched-capacitor architecture, the TLV5535 generates transients on the supply and reference lines. Proper decoupling of these lines is essential. Decoupling as shown in the schematic of the TLV5535 EVM is recommended.
/DVDD).
DD
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8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
TLV5535 evaluation module
TI provides an evaluation module (EVM) for TL V5535. The EVM also includes a 10b 80 MSPS DAC so that the user can convert the digitized signal back to the analog domain for functional testing. Performance measurements can be done by capturing the ADC’s output data.
The EVM provides the following additional features:
D
Provision of footprint for the connection of an onboard crystal oscillator, instead of using an external clock input.
D
Use of TLV5535 internal or external voltage references. In the case of external references, an onboard circuit is used that derives adjustable bottom and top reference voltages from a bandgap reference. Two potentiometers allow for the independent adjustments of both references. The full scale ADC range can be adjusted to the input signal amplitude.
D
All digital output, control signal I/O (output enable, standby, reference powerdown) and clock I/O are provided on a single connector. The EVM can thus be part of a larger (DSP) system for prototyping.
D
Onboard prototyping area with analog and digital supply and ground connections.
TLV5535
Figure 15 shows the EVM schematic. The EVM is factory shipped for use in the following configuration:
D
Use of external (onboard) voltage references
D
External clock input
analog input
A signal in the range between V J10. This signal is onboard terminated with 50. There is no onboard biasing of the signal. When using external (onboard) references, these levels can be adjusted with R7 (V both references to shift. R6 only impacts the bottom reference. The range of these signals for which the device is specified depends on AV
Internally generated reference levels are also dependent on AV section.
(REFBI)
and is shown in the
DD
and V
(REFTI)
should be applied to avoid overflow/underflow on connector
(REFTI)
Recommended Operating Conditions
) and R6 (V
as shown in the electrical characteristics
DD
(REFBI)
). Adjusting R7 causes
.
clock input
A clock signal should be applied with amplitudes ranging from 0 to A VDD with a frequency equal to the desired sampling frequency on connector J9. This signal is onboard terminated with 50 . Both ADC and DAC run of f the same clock signal. Alternatively the clock can be applied from terminal 1 on connector J11. A third option is using a crystal oscillator. The EVM board provides the footprint for a crystal oscillator that can be populated by the end-user, depending on the desired frequency. The footprint is compatible with the Epson EG-8002DC series of programmable high-frequency crystal oscillators. Refer to the TLV5535 EVM Settings for selecting between the different clock modes.
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
power supplies
The board provides seven power supply connectors (see T able 2). For optimum performance, analog and digital supplies should be kept separate. Using separate supplies for the digital logic portion of TL V5535 (DVDD) and its output drivers (DRVDD) benefits dynamic performance, especially when DRVDD is put at the minimum required voltage (3 V), while DVDD might be higher (up to 3.6 V). This lowers the switching noise on the die caused by the output drivers.
Table 2. Power Supplies
SIGNAL
NAME
DRV3 J1 3DRV 3.3 V digital supply for TLV5535 (digital output drivers)
DV3 J2 3VD 3.3 V digital supply for TLV5535 (digital logic) and peripherals DV5 J3 5VD 5 V digital supply for D/A converter and peripherals
AV3 J4 3VA 3.3 V analog supply for TLV5535 AV5 J5 5VA 5 V analog supply for onboard reference circuit and D/A converter. Can be left unconnected if
AV+12 J6 12VA 12 V analog supply for onboard reference circuit. Can be left unconnected if internal references
AV–12 J7 –12VA –12 V analog supply for onboard reference circuit. Can be left unconnected if internal
CONNECTOR
BOARD
LABEL
DESCRIPTION
internal references are used and no D/A conversion is required.
are used.
references are used.
voltage references
SW1 and SW2 switch between internal and external top and bottom references respectively. The external references are onboard generated from a stable bandgap-derived 3.3 V signal (using TI’s TPS7133 and quad-opamp TLE2144). They can be adjusted via potentiometers R6 (V
(REFBI)
) and R7 (V
(REFTI)
). It is advised
to power down the internal voltage references by asserting PWN_REF when onboard references are used. The references are measured at test points TP3 (V
(REFB)
) and TP4 (V
(REFT)
).
DAC output
The onboard DAC is a 10-bit 80 MSPS converter. It is connected back-to-back to the TLV5535. While the user could use its analog output for measurements, the DAC output is directly connected to connector J8 and does not pass through an analog reconstruction filter. So mirror spectra from aliased signal components feed through into the analog output.
For this reason and to separate ADC and DAC contributions, performance measurements should be made by capturing the ADC output data available on connector J11 and not by evaluating the DAC output.
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TLV5535 EVM settings
clock input settings
REFERENCE
DESIGNATOR
W1 Clock selection switch
W2 Clock source switch
W3 Clock output switch
reference settings
REFERENCE
DESIGNATOR
SW1 REFT external/internal switch
SW2 REFB external/internal switch
1–2 J11: clock from pin1 on J11 connector 2–3 J9: clock from J9 SMA connector
J
XTL: clock from onboard crystal oscillator
j
CLK: clock from pin 1 on J11 connector (if W1/1–2) or J9 SMA connector (if W1/2–3) NOTE: If set to XTL and a XTL oscillator is populated, no clock signal should be applied to J9 or J1 1, depending on the W1 setting.
1–2 Rising: clock output on J1 1 connector is the same phase as the clock to the digital output buffer . Data changes on rising CLK edge. 2–3 Falling: clock output on J1 1 connector is the opposite phase as the digital output buffer. Data changes on falling CLK edge.
Jj
REFT internal: REFT from TLV5535 internal reference
jJ
REFT external: REFT from onboard voltage reference circuit
Jj
REFB internal: REFB from TLV5535 internal reference
jJ
REFB external: REFB from onboard voltage reference circuit
TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
FUNCTION
FUNCTION
control settings
REFERENCE
DESIGNATOR
W4 TL V5535 and digital output buf fer output enable control (1)
W5 TL V5535 and digital output buf fer output enable control (2)
W6 TL V5535 STDBY control
J
5535-574 OE
board-external OE
j
5535-574 OE
buffer needs to be pulled low from pin 5 on J1 1 connector to enable. The OE pin 7 on J11 connector (W5 open) or is permanently enabled if W5 is closed.
J
5535 OE
-connected.
OE
j
5535 OE
the output can be disabled.
J
Stdby: STDBY is active (high).
j
Active: STDBY is low, via internal pulldown. STDBY can be taken high from pin 9 on J11 connector to enable standby
mode.
-connected: Connects OEs of TLV5535 and digital output buffer (574 buffer). Use this when no is used. In addition, close W5 to have both OEs permanently enabled.
-disconnected: Disconnects OEs of TL V5535 and digital output buffer (574 buffer). The OE for the output
to GND: Connects OEs of TL V5535 to GND. Additionally connects OE of 74ALS574 to GND if W4 is 5535-574
external: Enables control of OE of TL V5535 via pin 7 on J1 1 connector . When taken high (internal pulldown)
FUNCTION
for TLV5535 is independently controlled from
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
control settings (continued)
REFERENCE
DESIGNATOR
W7 TL V5535 PWDN REF control
W8 DAC enable
J
Pwdn_ref: PWDN_REF is active (high).
j
Active: PWDN_REF is low , via internal pulldown. PWDN_REF can be taken high from pin 10 on J11 connector to enable
pwdn_ref mode.
J
Active: D/A on
j
Standby: D/A off
FUNCTION
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
.1 µF
C33
STDBY
DV3
.1 µF
GND
OUT
2OUT
6
2IN
R15
.1 µF
TLV5535PW
C35
.1 µF
W2
J9
7
U4B
+
5
2IN
1 k
AV +12
W5
U2D
R28
TLE2144CDW
C31
.1 µF
4
W7
W6
20
R13
11
12
13
W1
321
49.9
R29
SN74ALVC00
EXT_REFB
R26
1OUT
U4A
2
3
1IN
1IIN
R5
REF3V
DV3
20
U2C
10
1
+
R6 5 k
2.1 k
R17
8
9
C32
.1 µF
AV –12
13
R9
1 k
R10
Q(0–7)
Q7Q6Q5Q4Q3Q2Q1
6
U2B
4
20
SN74ALVC00
10
EXT_REFT
10
R27
4OUT
16
TLE2144CDW
U4D
R16
1 k
+
15
14
4IN
4IN
R12
1 k
3OUT
10
U4C
1 k
+
11
12
3IN
3IN
1 k
R7
R8
1 k
REF3V
Q0
CLK_OUT
20
R37
SN74ALVC00
5
W3
3
U2A
1
CLK_IN
SN74ALVC00
2
TP3 TP4
REFTI
REFBI
SW2 SW1
EXT_REFB EXT_REFT
26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11
10 9 8 7 6 5 4 3 2 1
TP1 TP2
REFTO
C40
REFBO
J11
R2
C44
10µ F
+
C43
.01 µF
.1 µF
C37
.1 µF
C38
10µ F
+
C39
.1 µF
C36
.01 µF
0
C23
REF3V
10µ F
+
8
6
5
7
PG
OUT
OUT
SENSE
ININEN
U1
342
C27
AV5
J10
DRV3
DV5
R11
10 k
W8
C29
C41
DV5
.1 µF
R14
10 k
9
NC
NC
BLK
CLK
8
D9
7
D8
6
D7
5
D6
4
D5
3
D4
2
D3
1
32
.1 µF
.1 µF
C28
DV5
11161514131210
U3
R4
3.24 k
.1 µF
C26
C25
.1 µF
AV5
17 18
19 20 21 22 23 24
R3
200
J8
VB
CE
NC
IREF
DVSS
SREF VREF AVDD AVDD
VG IO IO
AVSSNCDVSS
DVDDNCD0D1D2
25262728293031
DV5
DVDD
C30
R1
.1 µF
C22
10µ F
+
R34
ANALOG IN
AV3
C45
R40
10 k
U5
.1 µF
20
DV3
CXD2306Q
R18 R19 R20
R21 R22 R23 R25
20
R24
10 k
49.9
.1 µF
GND
TPS7133QD
1
C42
C46
.1 µF
28
27262524232221201918171615
AIN
CML
AVSS
DRVDD
U6
1
W4
1123456789
1
OC
CLK
DV3
20 20 20 20
20 20
20
AVSS
AVDD
PWDN_REF
D0D1D2D3D4D5D6D7DRVSS
2345678
20202020202020
R39
R38
R36
R35
R33
R32
1D2D3D4D5D6D7D
1Q2Q3Q4Q5Q6Q7Q
19181716151413
10 k
10 k
10 k
10 k
10 k
10 k
R48
R47
R46
R45
R44
R43
.1 µF
REFBI
REFBO
9
R31
12
10 k
R42
AVSS
REFTI
REFTO
DVSS
1011121314
20
R30
8D
SN74LVT574DW
DGND
10
8Q
DV5DV5
X1
10 k
R41
C34
AV3
BG
AVDD
CLKOEDVDD
C24
VCC
OE
DAC_OUT
DV5
CLOCK IN
Figure 15. EVM Schematic
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Analog +12 V J6
1
C11
1 µF
2
Analog –12 V J7
1
C13
1 µF
2
Analog +5 V J5
1
C9 1 µF
2
Analog +3.3 V J4
1
C7 1 µF
2
+
4.7 µH
+
C12
10 µF
4.7 µH
C14
10 µF
4.7 µH
+
C10
10 µF
4.7 µH
+
C8
10 µF
L6
L7
L5
L4
+
+
C20
10 µF
C21
10 µF
+
C19
10 µF
+
C18
10 µF
AV +12 V
AV –12 V
AV5
AV3
Digital +5 V
J3
1
C5 1 µF
2
Digital +3.3 V (DVDD)
J2
1
C3 1 µF
2
Digital +3.3 V (DRVDD)
J1
1
C1 1 µF
2
+
10 µF
+
10 µF
+
10 µF
L3
4.7 µH
C6
L2
4.7 µH
C4
L1
4.7 µH
C2
+
C17
10 µF
+
C16
10 µF
+
C15
10 µF
DV5
DV3
DRV3
Figure 15. EVM Schematic (continued)
22
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Figure 16. EVM Board Layout, Top Overlay
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Figure 17. EVM Board Layout, Top Layer
24
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Figure 18. EVM Board Layout, Internal Plane 1
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Figure 19. EVM Board Layout, Internal Plane 2
26
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
3350 (mil)
4200 (mil)
Figure 20. EVM Board Layout, Drill Drawing for Through Hole
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Figure 21. EVM Board Layout, Bottom Layer
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Table 3. TLV5535EVM Bill of Material
QTY. REFERENCE DESIGNATOR VALUE SIZE DESCRIPTION
7 C1, C11, C13, C3, C5, C7, C9 1 µF 1206 ceramic multilayer capacitor Any
18 C10, C12, C14, C15, C16,
C17, C18, C19, C2, C20, C21, C22, C23, C4, C6, C8, C38, C44
2 C36, C43 0.01 µF 805 Ceramic multilayer Any
19 C24, C25, C26, C27, C28,
C29, C30, C31, C32, C33, C34, C35, C37, C39, C40, C41, C42, C45, C46
7 J1, J2, J3, J4, J5, J6, J7 Screw Con 2 terminal screw connector Lumberg
3 J10, J8, J9 SMA PCM mount, SMA Jack Johnson Components
1 J11 IDC26 13I × 2.025I square pin header Samtec
7 L1, L2, L3, L4, L5, L6, L7 4.7 µH 4.7 µH DO1608C-472-Coil Craft Coil Craft
1 R2 0 1206 Chip resistor Any 2 R26, R27 10 1206 Chip resistor Any
12 R1, R11, R14, R40, R41, R42,
R43, R44, R45, R46, R47, R48 6 R10, R12, R15, R16, R8, R9 1 K 1206 Chip resistor Any 1 R5 2.1 K 1206 Chip resistor Any
20 R13, R17, R18, R19, R20,
R21, R22, R23, R24, R25,
R29, R30, R31, R32, R33,
R35, R36, R37, R38, R39 1 R3 200 1206 Chip resistor Any 1 R4 3.24 K 1206 Chip resistor Any 2 R28, R34 49.9 1206 Chip resistor Any 1 R6 5 K 4 mm SM pot-top adjust Bourns
1 R7 1 K 4 mm SM pot-top adjust Bourns
2 SW1, SW2 SPDT C&K tiny series–slide switch C&K
4 TP1, TP2, TP3, TP4 TP Test point, single 0.025I pin Samtec
1 U3 CXD2306Q Sony
1 U2 SN74ALVC00D 14-SOIC (D) Quad 2-input positive NAND Texas Instruments
1 U5 SN74LVT574DW 20-SOP (DW) Texas Instruments
Manufacturer and part number data for reference only. Equivalent parts might be substituted on the EVM.
10 µF 3216 16 V, 10 µF, tantalum capacitor Any
0.1 µF 805 Ceramic multilayer capacitor Any
10 K 1206 Chip resistor Any
20 1206 Chip resistor Any
MANUFACTURER/
PART NUMBER
KRMZ2
142-0701-206
TSW-113-07-L-D
DO1608-472
3214W-5K
3214W-1K
TS01CLE
TSW-101-07-L-S or equivalent
CXD2306Q
SN74ALVC00D
SN74LVT574DW
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TLV5535 8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
TLV5535 EVALUA TION MODULE
Table 3. TLV5535EVM Bill of Material (Continued)
QTY. REFERENCE DESIGNATOR VALUE SIZE DESCRIPTION
1 U4 TLE2144CDW 16-SOP(D) Quad op amp Texas Instruments
1 U6 TLV5535PW 28-TSSOP (PW) Texas Instruments
1 U1 TPS7133 8-SOP(D) Low-dropout voltage regulator Texas Instruments
6 W2, W4, W5, W6, W7, W8 SPST 2 position jumper , 0.1I spacing Samtec
2 W1, W3 DPFT 3 position jumper, 0.1I spacing Samtec
1 X1 NA Crystal oscillator Epson
Manufacturer and part number data for reference only. Equivalent parts might be substituted on the EVM.
MANUFACTURER/
PART NUMBER
TLE2144CDW/ TLE2144IDW
TLV5535PW
TPS7133QD
TSW-102-07-L-S or equivalent
TSW-103-07-L-S or equivalent
SG-8002DC series
30
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TLV5535
8-BIT, 35 MSPS, LOW -POWER ANALOG-TO-DIGITAL CONVERTER
SLAS221 – JUNE 1999
MECHANICAL DATA
PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
0,65
14
1
1,20 MAX
0,30 0,19
8
4,50 4,30
7
A
0,15 0,05
6,60 6,20
M
0,10
Seating Plane
0,10
0,15 NOM
Gage Plane
0,25
0°–8°
0,75 0,50
PINS **
DIM
A MAX
A MIN
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion not to exceed 0,15. D. Falls within JEDEC MO-153
8
3,10
2,90
14
5,10
4,90
16
5,10
20
6,60
6,404,90
24
7,90
7,70
28
9,80
9,60
4040064/E 08/96
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31
Page 32
PACKAGE OPTION ADDENDUM
www.ti.com
18-Jul-2006
PACKAGING INFORMATION
Orderable Device Status
(1)
Package
Type
Package Drawing
Pins Package
Qty
Eco Plan
TLV5535IPW ACTIVE TSSOP PW 28 50 Green (RoHS &
no Sb/Br)
TLV5535IPWG4 ACTIVE TSSOP PW 28 50 Green (RoHS &
no Sb/Br)
TLV5535IPWR ACTIVE TSSOP PW 28 2000 Green (RoHS &
no Sb/Br)
TLV5535IPWRG4 ACTIVE TSSOP PW 28 2000 Green (RoHS &
no Sb/Br)
(1)
The marketing status values are defined asfollows:
ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the devicewill be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but isnot in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production ofthe device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information andadditional product content details.
TBD: The Pb-Free/Green conversion plan has notbeen defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products aresuitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed0.1% by weight in homogeneous material)
(2)
Lead/Ball Finish MSL Peak Temp
CU NIPDAU Level-1-260C-UNLIM
CU NIPDAU Level-1-260C-UNLIM
CU NIPDAU Level-1-260C-UNLIM
CU NIPDAU Level-1-260C-UNLIM
(3)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
Page 33
PACKAGE MATERIALS INFORMATION
www.ti.com
TAPE AND REEL INFORMATION
11-Mar-2008
*All dimensions are nominal
Device Package
TLV5535IPWR TSSOP PW 28 2000 330.0 16.4 6.9 10.2 1.8 12.0 16.0 Q1
Type
Package
Drawing
Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0 (mm) B0 (mm) K0 (mm) P1
(mm)W(mm)
Pin1
Quadrant
Pack Materials-Page 1
Page 34
PACKAGE MATERIALS INFORMATION
www.ti.com
11-Mar-2008
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TLV5535IPWR TSSOP PW 28 2000 346.0 346.0 33.0
Pack Materials-Page 2
Page 35
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