Designed for general−purpose switching and amplifier applications.
Features
• DC Current Gain −
h
= 20−70 @ IC
FE
= 4.0 Adc
• Collector−Emitter Saturation Voltage −
V
• Excellent Safe Operating Area
• These are Pb−Free Devices*
MAXIMUM RATINGS
Collector − Emitter VoltageV
Collector − Emitter VoltageV
Collector − Base VoltageV
Emitter − Base VoltageV
Collector Current − ContinuousI
Base CurrentI
Total Power Dissipation @ TC = 25°C
Derate above 25°C
Operating and Storage Junction
Temperature Range
= 1.1 Vdc (Max) @ IC
CE(sat)
= 4.0 Adc
RatingSymbolValueUnit
CEO
CER
P
TJ, T
CB
EB
C
B
D
stg
60Vdc
70Vdc
100Vdc
7.0Vdc
1 5Adc
7.0Adc
90
0.72
–65 to
+150
W/°C
W
°C
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15 AMPERE
POWER TRANSISTORS
COMPLEMENTARY SILICON
60 VOLTS, 90 WATTS
SOT−93 (TO−218)
CASE 340D
STYLE 1
TO−247
CASE 340L
STYLE 3
THERMAL CHARACTERISTICS
CharacteristicSymbolMaxUnit
Thermal Resistance, Junction−to−Case
Thermal Resistance, Junction−to−Ambient
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
SECONDARY BREAKDOWN LIMIT
BONDING WIRE LIMIT
THERMAL LIMIT @ T
TJ = 150°C
VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
dc
= 25°C
C
100
, DC CURRENT GAIN
FE
h
10
0.20.5 0.73.05.0
0.1
IC, COLLECTOR CURRENT (AMP)
1.02.00.37.0 10
Figure 1. DC Current Gain
a transistor: average junction temperature and second
breakdown. Safe operating area curves indicate I
1.0ms
300 ms
10ms
limits of the transistor that must be observed for reliable
operation; i.e., the transistor must not be subjected to greater
dissipation than the curves indicate.
variable depending on power level. Second breakdown
pulse limits are valid for duty cycles to 10% but must be
derated for temperature.
4060
TIP3055
TIP2955
There are two limitations on the power handling ability of
− V
C
CE
The data of Figure 2 is based on T
= 25°C; T
C
J(pk)
is
Figure 2. Maximum Rated Forward Bias
Safe Operating Area
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4
Page 5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOT−93 (TO−218)
CASE 340D−02
ISSUE EDATE 01/03/2002
SCALE 1:1
C
B
U
L
S
K
4
123
Q
E
A
D
J
H
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
A= Assembly Location
Y= Year
WW= Work Week
xxxxx= Device Code
DOCUMENT NUMBER:
DESCRIPTION:
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
www.onsemi.com
Page 6
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TO−247
CASE 340L−02
ISSUE F
DATE 26 OCT 2011
N
A
K
F
2 PL
STYLE 1:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
STYLE 5:
PIN 1. CATHODE
2. ANODE
3. GATE
4. ANODE
SCALE 1:1
−B−
123
G
D
3 PL
0.25 (0.010)MYQ
STYLE 2:
STYLE 6:
U
P
−Y−
W
PIN 1. ANODE
2. CATHODE (S)
3. ANODE 2
4. CATHODES (S)
PIN 1. MAIN TERMINAL 1
2. MAIN TERMINAL 2
3. GATE
4. MAIN TERMINAL 2
−T−
C
E
L
4
−Q−
0.63 (0.025)MTB
J
H
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
DIM MINMAXMINMAX
A 20.32 21.08 0.8008.30
B 15.75 16.26 0.620 0.640
C4.705.30 0.185 0.209
D1.001.40 0.040 0.055
XXXXX = Specific Device Code
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
Electronic versions are uncontrolled except when
accessed directly from the Document Repository. Printed
versions are uncontrolled except when stamped
“CONTROLLED COPY” in red.
Case Outline Number:
PAGE 1 OF 2
XXX
Page 7
DOCUMENT NUMBER:
98ASB15080C
PAGE 2 OF 2
ISSUEREVISIONDATE
DCHANGE OF OWNERSHIP FROM MOTOROLA TO ON SEMICONDUCTOR. DIM A
25 AUG 2000
WAS 20.80−21.46/0.819−0.845. DIM K WAS 19.81−20.32/0.780−0.800. UPDATED
STYLE 1, ADDED STYLES 2, 3, & 4. REQ. BY L. HAYES.
EDIM E MINIMUM WAS 2.20/0.087. DIM K MINIMUM WAS 20.06/0.790. ADDED
26 FEB 2010
GENERIC MARKING DIAGRAM. REQ. BY S. ALLEN.
FADDED STYLES 5 AND 6. REQ. BY J. PEREZ.26 OCT 2011
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expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
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literature is subject to all applicable copyright laws and is not for resale in any manner.
. ON Semiconductor reserves the right to make changes without further notice to any products herein.
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