Datasheet TICPAL22V10Z-25CFN, TICPAL22V10Z-25CNT Datasheet (Texas Instruments)

Page 1
TICPAL22V10Z-25C, TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
24-Pin Advanced CMOS PLD
Virtually Zero Standby Power
Propagation Delay Time:
I, I/O to I/O in the Turbo Mode
-25C . . . 25 ns Max
-30I . . . 30 ns Max
I, I/O to I/O in the Zero-Power Mode
-25C . . . 35 ns Max
-30I . . . 40 ns Max
CLK to Q
-25C . . . 15 ns Max
-30I . . . 20 ns Max
Variable Product Term Distribution Allows
More Complex Functions to Be Implemented
Each Output Is User-Programmable for
Registered or Combinatorial Operation, Polarity, and Output Enable Control
Extra Terms Provide Logical Synchronous
Set and Asynchronous Reset Capability
Preload Capability on All Registered
Outputs Allow for Improved Device Testing
UV Light Erasable Cell Technology Allows
for:
Reconfigurable Logic Reprogrammable Cells Full Factory Testing for High
Programming Yield
Programmable Design Security Bit
Prevents Copying of Logic Stored in Device
JTL AND NT PACKAGE
(TOP VIEW)
NC
24 23 22 21 20 19 18 17 16 15 14 13
V
I
CC
V
CC
I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I
I/O/Q
25 24 23 22 21 20 19
I/O/Q
I/O/Q
CLK/I
GND
I I I
NC
I I I
1
I
2
I
3
I
4
I
5
I
6
I
7
I
8
I
9
I
10
I
11 12
FN PACKAGE
(TOP VIEW)
I
I
CLK/INCI/O/Q
3212827
426
5 6 7 8 9
10
11
12 13
14 15 16 1718
I
I
GND
No internal connection
NC Pin assignments in operating mode
I/O/Q I/O/Q I/O/Q NC I/O/Q I/O/Q I/O/Q
Package Options Include Plastic
Dual-In-Line and Clip Carrier [for One-Time-Programmable (OTP) Devices] and Ceramic Dual-In-Line Windowed Package
.
T
A
RANGE
0°C to 75°C TICPAL22V10Z-25CJTL TICPAL22V10Z-25CNT TICPAL22V10Z-25CFN
–40°C to 85°C NA TICPAL22V10Z-30INT TICPAL22V10Z-30IFN
These devices are covered by U.S. Patent 4,410,987. EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
CERAMIC WINDOWED
DUAL-IN-LINE
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
AVAILABLE OPTIONS
(JTL)
PACKAGE TYPE
PLASTIC
DUAL-IN-LINE
(NT)
PLASTIC
CHIP CARRIER
(FN)
Copyright 1992, Texas Instruments Incorporated
1
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TICPAL22V10Z-25C, TICPAL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
description
The CMOS PLD devices feature variable product terms, flexible outputs, and virtually zero standby power. It combines TI’s EPIC (Enhanced Processed Implanted CMOS) process with ultraviolet-light-erasable EPROM technology. Each output has an output logic macrocell (OLM) configuration allowing for user definition of the output type. This device provides reliable, low-power substitutes for numerous high-performance TTL PLDs with gate complexities between 300 and 800 gates.
The TICPAL22V10Z has 12 dedicated inputs and 10 user-definable outputs. Individual outputs can be programmed as registered or combinational and inverting or noninverting as shown in the OLM diagram. These ten outputs are enabled through the use of individual product terms
The variable product-term distribution on this device removes rigid limitation to a maximum of eight product terms per output. This technique allocates from 8 to 16 logical product terms to each output for an average of 12 product terms per output. The variable allocation of product terms allows for far more complex functions to be implemented in this device than in previously available devices.
With features such as the programmable OLMs and the variable product-term distribution, the TICP AL22V10Z offers quick design and development of custom LSI functions. Since each of the ten output pins may be individually configured as inputs on either a temporary or permanent basis, functions requiring up to 21 inputs and a single output or down to 12 inputs and 10 outputs can be implemented with this device.
Design complexity is enhanced by the addition of synchronous set and asynchronous reset product terms. These functions are common to all registers. When the synchronous set product term is a logic 1, the output registers are loaded with a logic 1 on the next low-to-high clock transition. When the asynchronous reset product term is a logic 1, the output registers are loaded with a logic 0 independently of the clock. The output logic level after set or reset will depend on the polarity selected during programming.
Output registers of this device can be preloaded to any desired state during testing, thus allowing for full logical verification during product testing.
The TICP AL22V10Z has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V ESD rating tested under MIL-STD-883C, Method 3015.6. However, care should be exercised in handling these devices, as exposure to ESD may result in a degradation of the device parametric performance.
The floating-gate programmable cells allow the devices to be fully programmed and tested before assembly to assure high field programming yield and functionality . They are then erased by ultraviolet light before packaging.
The TICPAL22V10Z-25C is characterized for operation from 0°C to 75°C. The TICPAL22V10Z-30I is characterized for operation from –40°C to 85°C.
design security
The ’PAL22V10Z contains a programmable design security cell. Programming this cell will disable the read verify and programming circuitry protecting the design from being copied. The security cell is usually programmed after the design is finalized and released to production. A secured device will verify as if every location in the device is programmed. Because programming is accomplished by storing an invisible charge instead of opening a metal link, the ’22V10Z cannot be copied by visual inspection. Once a secured device is fully erased, it can be reprogrammed to any desired configuration.
2
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EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
functional block diagram (positive logic)
TICPAL22V10Z-25C, TICPAL22V10Z-30I
CLK/I
C1 1S R
Output
Logic
Macrocell
EN
EN
EN
EN
EN
EN
EN
EN
EN
EN
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
10
10
12
14
16
16
14
12
10
Set Reset
8
8
1
10
10
&
44 x 132
22
11
I
10
22
denotes programmable cell inputs
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Page 4
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logic diagram (positive logic)
1
CLK/I
First Cell Numbers
2
I
3
I
0 481216 20 24 28
0
396
440
880
924
1452
1496
Increment
32 36 40
MACRO CELL
P = 5808 R = 5809
MACRO CELL
P = 5810 R = 5811
MACRO CELL
P = 5812 R = 5813
MACRO CELL
Asynchronous Reset (to all registers)
23
I/O/Q
22
I/O/Q
21
I/O/Q
20
I/O/Q
SRPS007C – D3323, SEPTEMBER 1989 – REVISED FEBRUARY 1992
TICPAL22V10Z-25C, TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
2112
4
I
2156
2860
5
I
P = 5814 R = 5815
MACRO CELL
P = 5816 R = 5817
19
I/O/Q
Page 5
2904
MACRO CELL
3608
6
I
3652
P = 5818 R = 5819
MACRO CELL
18
17
I/O/Q
I/O/Q
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4268
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
7
I
4312
4840
8
I
4884
5324
9
I
5368
5720
10
I
5764
11
I
P = 5820 R = 5821
MACRO CELL
P = 5822 R = 5823
MACRO CELL
P = 5824 R = 5825
MACRO CELL
P = 5826 R = 5827
16
I/O/Q
15
I/O/Q
14
I/O/Q
Synchronous Set (to all registers)
13
I
SRPS007C – D3323, SEPTEMBER 1989 – REVISED FEBRUARY 1992
TICPAL22V10Z-25C, TICPAL22V10Z-30I
5
Inside each MACROCELL the (P) cell is the polarity cell and the (R) cell is the register cell.
Programmable Cell Number = First Cell Number + Increment
Page 6
TICPAL22V10Z-25C, TICPAL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
output logic macrocell (OLM) description
A great amount of architectural flexibility is provided by the user-configurable macrocell output options. The macrocell consists of a D-type flip-flop and two select multiplexers. The D-type flip-flop operates like a standard TTL D-type flip-flop. The input data is latched on the low-to-high transition of the clock input. The Q and Q outputs are made available to the output select multiplexer. The asynchronous reset and synchronous set controls are available in all flip-flops.
The select multiplexers are controlled by programmable cells. The combination of these programmable cells will determine which macrocell functions are implemented. It is this user control of the architectural structure that provides the generic flexibility of this device.
output logic macrocell diagram
From Clock Buffer
Output Logic Macrocell
AR
SS
AR = asynchronous reset SS = synchronous set
R 1D
C1
1S
MUX
1
1
G1
S1
S0
MUX
2 3 0
1
0
1
G
3
0
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EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
output logic macrocell options (see Figure 1)
TICPAL22V10Z-25C, TICPAL22V10Z-30I
R 1D
C1
1S
REGISTER FEEDBACK, REGISTERED, ACTIVE-LOW OUTPUT REGISTER FEEDBACK, REGISTERED, ACTIVE-HIGH OUTPUT
I/O FEEDBACK, COMBINATIONAL, ACTIVE-LOW OUTPUT I/O FEEDBACK, COMBINATIONAL, ACTIVE-HIGH OUTPUT
S1 = 0 S0 = 0
S1 = 1 S0 = 0
R 1D
1S
C1
S1 = 0 S0 = 1
S1 = 1 S0 = 1
MACROCELL FEEDBACK AND OUTPUT FUNCTION TABLE
CELL SELECT
S1 S0
0 0 Register feedback Registered Active low 0 1 Register feedback Registered Active high 1 0 I/O feedback Combinational Active low 1 1 I/O feedback Combinational Active high
0 = erased cell, 1 = programmed cell S1 and S0 are select-function cells as shown in the output logic macrocell diagram.
FEEDBACK AND OUTPUT CONFIGURATION
Figure 1. Resultant Macrocell Feedback and Output Logic After Programming
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Page 8
TICP AL22V10Z-25C EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1) –0.5 V to VCC+0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or V Output clamp current, I
(VO < 0 or V
OK
> VCC) ± 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
> VCC) ± 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
Continuous output current, IO (VO = 0 to VCC) ± 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 in) from case for 10 seconds: FN or NT package 260°C. . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 in) from case for 10 seconds: JTL package 300°C. . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range 0°C to 75°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: These ratings apply except for programming pins during a programming cycle or during a preload cycle.
recommended operating conditions
MIN NOM MAX UNIT
V V V
I
I
t
t
t
t T
OH
OL
w
su
su
h
Supply voltage 4.75 5 5.25 V
CC
High-level input voltage 2 V
IH
Low-level input voltage 0.8 V
IL
High-level output current
Low-level output current mA
Pulse duration Clock low 10 ns
Setup time, turbo mode Asynchronous reset inactive 20 ns
Setup time, zero-power mode Asynchronous reset inactive 30 ns
Hold time Input or feedback 0 ns Operating free-air temperature 0 75 °C
A
Driving TTL –3.2 Driving CMOS –4 Driving TTL 16 Driving CMOS 4 Clock high 10
Asynchronous reset 20 Input or feedback 17
Synchronous preset inactive 20 Input or feedback 25
Synchronous preset inactive 30
mA
8
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Page 9
TICPAL22V10Z-25C
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
electrical characteristics over recommended operating free-air temperature range
PARAMETER TEST CONDITION MIN TYP†MAX UNIT
V
OH
V
OL
I
OZH
I
OZL
I
IH
I
IL
I
O
I
CC
C
i
§ I 6
I/O 10
VCC = 4.75 V, IOH = –3.2 mA for TTL 4 4.8 VCC = 4.75 V, IOH = –4 mA for CMOS 3.86 4.7 VCC = 4.75 V, IOL = 16 mA for TTL 0.25 0.5 VCC = 4.75 V, IOL = 4 mA for CMOS 0.07 0.4 VCC = 5.25 V, VO = 2.7 V 0.01 10 µA VCC = 5.25 V, VO = 0.5 V –0.01 –10 µA VCC = 5.25 V, VI = 5.25 V 0.01 10 µA VCC = 5.25 V, VI = 0.5 V –0.01 –10 µA
VCC = 5.25 V, VO = 0.5 V –30 –45 –90 mA VCC = 5.25 V,
Outputs open,
VI = 2 V, f = 1 MHz
VI = 0 or VCC, Zero-power mode
10 100 µA
switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 3)
PARAMETER
f
max
t
pd
t
pd
t
pd
t
en
t
dis
All typical values are at VCC = 5 V, TA = 25°C.
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to avoid test problems caused by test equipment ground degradation.
§
Disabled outputs are tied to GND or VCC.
f
max
Without feedback 50 66 With feedback 31.2 55 Turbo mode 16 25 Zero-power mode 21 35 Turbo mode 18 30 Zero-power mode 23 40
Turbo mode 15 25 Zero-power mode 20 35 Turbo mode 15 25 Zero-power mode 17 35
(with feedback) =
tsu)
1
tpd(CLK to Q)
FROM
(INPUT)
I, I/O O, I/O
Asynchronous
RESET
CLK Q 10 15 ns
I, I/O
I, I/O
; f
(without feedback) =
max
tw(high))tw(low)
TO
(OUTPUT)
Q
I, Q, I/O
I, Q, I/O
1
MIN TYP†MAX UNIT
V
V
pF
MHz
ns
ns
ns
ns
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Page 10
TICP AL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1) –0.5 V to VCC+0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or V Output clamp current, I
(VO < 0 or V
OK
> VCC) ± 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
> VCC) ± 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
Continuous output current, IO (VO = 0 to VCC) ± 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 in) from case for 10 seconds: FN or NT package 260°C. . . . . . . . . . . . . . . .
Operating free-air temperature range –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: These ratings apply except for programming pins during a programming cycle or during a preload cycle.
recommended operating conditions
MIN NOM MAX UNIT
V V V
I
I
t
t
t
t T
OH
OL
w
su
su
h
Supply voltage 4.5 5 5.5 V
CC
High-level input voltage 2 V
IH
Low-level input voltage 0.8 V
IL
High-level output current
Low-level output current mA
Pulse duration Clock low 12 ns
Setup time, turbo mode Asynchronous reset inactive 25 ns
Setup time, zero-power mode Asynchronous reset inactive 35 ns
Hold time Input or feedback 0 ns Operating free-air temperature –40 85 °C
A
Driving TTL –3.2 Driving CMOS –4 Driving TTL 16 Driving CMOS 4 Clock high 12
Asynchronous reset 30 Input or feedback 22
Synchronous preset inactive 25 Input or feedback 30
Synchronous preset inactive 35
mA
10
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Page 11
TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
electrical characteristics over recommended operating free-air temperature range
PARAMETER TEST CONDITION MIN TYP†MAX UNIT
V
OH
V
OL
I
OZH
I
OZL
I
IH
I
IL
I
O
I
CC
C
i
§ I 6
I/O 10
VCC = 4.5 V, IOH = –3.2 mA for TTL 4 4.8 VCC = 4.5 V, IOH = –4 mA for CMOS 3.86 4.7 VCC = 4.5 V, IOL = 16 mA for TTL 0.25 0.5 VCC = 4.5 V, IOL = 4 mA for CMOS 0.07 0.4 VCC = 5.5 V, VO = 2.7 V 0.01 10 µA VCC = 5.5 V, VO = 0.5 V –0.01 –10 µA VCC = 5.5 V, VI = 5.5 V 0.01 10 µA VCC = 5.5 V, VI = 0.5 V –0.01 –10 µA
VCC = 5.5 V, VO = 0.5 V –30 –45 –90 mA VCC = 5.5 V,
Outputs open,
VI = 2 V, f = 1 MHz
VI = 0 or VCC, Zero-power mode
10 100 µA
switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 3)
PARAMETER
f
max
t
pd
t
pd
t
pd
t
en
t
dis
All typical values are at VCC = 5 V, TA = 25°C.
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to avoid test problems caused by test equipment ground degradation.
§
Disabled outputs are tied to GND or VCC.
f
max
Without feedback 41.6 66 With feedback 23.8 55 Turbo mode 16 30 Zero-power mode 21 40 Turbo mode 18 35 Zero-power mode 23 45
Turbo mode 15 30 Zero-power mode 20 40 Turbo mode 15 30 Zero-power mode 17 40
(with feedback) =
tsu)
1
tpd(CLK to Q)
FROM
(INPUT)
I, I/O O, I/O
Asynchronous
RESET
CLK Q 10 20 ns
I, I/O
I, I/O
; f
(without feedback) =
max
tw(high))tw(low)
TO
(OUTPUT)
Q
I, Q, I/O
I, Q, I/O
1
MIN TYP†MAX UNIT
V
V
pF
MHz
ns
ns
ns
ns
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Page 12
TICPAL22V10Z-25C, TICPAL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
preload procedure for registered outputs (see Notes 2 and 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be tested without having to setup through the entire state-machine sequence. Each register is preloaded individually by following the steps given below. The output level depends on the polarity selected during programming.
Step 1. With VCC at 5 V and pin 1 at VIL, raise pin 8 to V Step 2. Apply either V
or VIH to the output corresponding to the register to be preloaded.
IL
IHH
.
Step 3. Pulse pin 1, clocking in preload data. Step 4. Remove output voltage, then lower pin 8 to V
. Preload can be verified by observing the voltage level
IL
at the output pin.
V
V
V
V
V
V
IHH
IL
IH
IL
OH
OL
Pin 8
t
t
d
CLK/I
Registered I/O Input Output
su
t
w
t
d
V
IH
V
IL
Figure 2. Preload Waveforms
NOTES: 2. Pin numbers shown are for the JTL and NT packages only. If chip-carrier socket adapter is not used, pin numbers must be changed
accordingly.
3.
t
= t
d
=
tw = 100 ns to 1000 ns. V
su
= 10.25 V to 10.75 V.
IHH
programming information
Texas Instruments programmable logic devices can be programmed using widely available software and inexpensive device programmers.
Complete programming specifications, algorithms, and the latest information on hardware, software, and firmware are available upon request. Information on programmers capable of programming T exas Instruments programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI distributor, or by calling Texas Instruments at (214) 997-5666.
12
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Page 13
TICPAL22V10Z-25C, TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
PARAMETER MEASUREMENT INFORMATION
5 V
(see Note D)
S1
300
From Output
Under Test
Test
Point
CLK
t
Data
Input
Input
t
pd
In-Phase
Output
t
pd
Out-of-Phase
Output
(see Note D)
PROPAGATION DELAY TIMES
1.5 V
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V 1.5 V
1.5 V
1.5 V 1.5 V
VOLTAGE WAVEFORMS
(see Note A)
t
h
1.5 V
t
pd
1.5 V
t
pd
V
V
V
V
C
L
LOAD CIRCUIT FOR
3-STATE OUTPUTS
3 V
0
3 V
0 (see Note B)
3 V
0
OH
OL
OH
OL
390
High-Level
Pulse
Low-Level
Pulse
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note C)
Waveform 2
S1 Open
(see Note C)
1.5 V 1.5 V
t
w
1.5 V 1.5 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.5 V 1.5 V
t
en
t
en
t
1.5 V
1.5 V
t
dis
dis
3 V
0
3 V
0 (see Note B)
3 V
0 (see Note B)
3.3 V
VOL + 0.5 V
V
OL
V
OH
VOH – 0.5 V
0 V
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. All input pulses have the following characteristics: PRR 1 MHz, Zo = 50 Ω, tr = tf = 2 ns, duty cycle = 50%. C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2
is for an output with internal conditions such that the output is high except when disabled by the output control. D. When measuring propagation delay times of 3-state outputs, switch S1 is closed. E. Equivalent loads may be used for testing.
Figure 3. Load Circuit and Voltage Waveforms
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VOLTAGE WAVEFORMS
.
dis
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TICPAL22V10Z-25C, TICPAL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
special design features
True CMOS Outputs: Each TICPAL22V10Z output is designed with a P-channel pull-up transistor and an
N-channel pull-down transistor, a true CMOS output with rail-to-rail output switching. This provides direct interface to CMOS logic, memory, or ASIC devices without the need for a pull-up resistor. The CMOS output has 16-mA drive capability , which makes the TICPAL22V10Z an ideal substitute for bipolar PLDs. The electrical characteristics of this device show the output under both CMOS and TTL conditions.
Simultaneous Switching: High-performance CMOS devices often have output glitches on nonswitched outputs when a large number of outputs are switched simultaneously. This glitch is commonly referred to as
(low-level output voltage). Ground bounce is
”ground bounce” and is most noticeable on outputs held at V caused by the voltage drop across the inductance in the package lead when current is switched (dv α I x di/dt).
One solution is to restrict the number of outputs that can switch simultaneously . Another solution is to change the device pinout such that the ground is located on a low-inductance package pin. TI opted for a third option in order to maintain pinout compatibility and eliminate functional constraints. This option controls the output transistor turn-on characteristics and puts a limit on the instantaneous current available to the load, much like the I
resistor in a TTL circuit.
OS
Wake-Up Features: The TICP AL22V10Z employs input signal transition detection techniques to power up the device from the standby-power mode. The transition detector monitors all inputs, I/Os, and feedback paths. Whenever a transition is sensed, the detector activates the power-up mode. The device will remain in the power-up mode until the detector senses that the inputs and outputs have been static for about 40 ns; thereafter, the device returns to the standby mode.
OL
T urbo Mode or Zero-Power Mode: When the turbo cell is programmed, the device will be set to the power-up mode. Therefore, the delay associated with its transition detection and power up will be eliminated. This is how the faster propagation delays and shorter setup times are obtained in the turbo mode. The turbo mode and the associated speed increase can be effectively simulated with the turbo cell erased, if a series of adjacent input, I/O, or feedback edges occur with an interval of about 25 ns or less between these adjacent edges. Under these conditions, the TICPAL22V10Z will never have the opportunity to power down due to the frequency of the adjacent edges.
Power Up: The TICP AL22V10Z device configuration bits (power mode, and macrocell configuration) are read at the first input transition after a monotonic power up. When completed, the TICP AL22V10Z is in its designed configuration. The use of an initializing device reset is necessary in applications where registered feedback is used to ensure the TICPAL22V10Z is in a known state at the beginning of system operation.
Power Dissipation: Power dissipation of the TICP AL22V10Z is defined by three contributing factors, and the total power dissipation is the sum of all three.
Standby Power: The product of V
and the standby ICC. The standby current is the reverse current
CC
through the diodes that are reversed biased. This current is very small, and for circuits that remain in static condition for a long time, this low amount of current can become a major performance advantage.
Dynamic Power: The product of VCC and the dynamic current. This dynamic current flows through the device only when the transistors are switching from one logic level to the other. The total dynamic current for the TICPAL22V10Z is dependent upon the users’ configuration of the device and the operating frequency. Output loading can be a source of additional power dissipation.
Interface Power: The product of I
(interface) and VCC. The total interface power is dependent on the
CC
number of inputs at the TTL VOH level. The interface power can be eliminated by the addition of a pull-up resistor.
14
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Page 15
TICPAL22V10Z-25C, TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
Even though power dissipation is a function of the user’s device configuration and the operating frequency, the TICPAL22V10Z is a lower powered solution than either the quarter-powered or half-powered bipolar devices. The virtually zero standby power feature makes the TICPAL22V10Z the device of choice for low-duty-cycle applications.
programming and erasability
Programming of the TICPAL22V10Z is achieved through floating-gate avalanche injection techniques. The charge trapped on the floating gate remains after power has been removed, allowing for the nonvolatility of the programmed data. The charge can be removed by exposure to light with wavelengths of less than 400 nm (4000 Å). The recommended erasure wavelength is 253.7 nm (2537 Å), with erasure time of 60 to 90 minutes, using a light source with a power rating of 12000 µW/cm
The TICP AL22V10Z is designed for programming endurance of 1000 write/erase cycles with a data retention of ten years. T o guarantee maximum data retention, the window on the device should be covered by an opaque label. The fluorescent light in a room can erase a unit in three years or, in the case of a direct sunlight, erasure can be complete in one week.
2
placed within 2.5 cm (one inch) of the device.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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TICPAL22V10Z-25C, TICPAL22V10Z-30I EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
TYPICAL CHARACTERISTICS
OUTPUT CURRENT
vs
OUTPUT VOLTAGE
400
VCC = 5 V TA = 25°C
200
I
100
70 40
–I
20
10
7
– Output Current – mA
O
I
4
2
0123 5
OH
VO – Output Voltage – V
OL
4
Figure 4
1.4
= 25 °C
1.3
A
T
1.2
= 5 V,V
CC
V
1.1
1
0.9
0.8
CL = 50 pF f Duty Cycle = 50%
0.7
Normalized Supply Current at
–50 –25 0
NORMALIZED SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
(10-BIT COUNTER)
= 23.8 MHz
clock
25 50 75
TA – Free-Air Temperature – °C
Figure 5
VCC = 4.5 V VCC = 4.75 V VCC = 5 V VCC = 5.25 V VCC = 5.5 V
100
CLOCK FREQUENCY
100
VCC = 5 V TA = 25°C CL = 50 pF Duty cycle = 50%
80
60
40
– Supply Current – mA
CC
I
20
Turbo Bit off
0
100 1 k 10 k 100 k
f
clock
SUPPLY CURRENT
vs
(10-BIT COUNTER)
Turbo Bit on
1 M 10 M
– Clock Frequency – Hz
Figure 6
100 M
NORMALIZED PROPAGATION DELAY TIME
1.15
= 5 V
CC
1.05
0.95
Normalized Propagation Delay Time at
CLK to Q and Turbo Mode
1.1
1
TA = 25 °C CL = 50 pF R1 = 300 R2 = 390
0.9
4.5 5
vs
SUPPLY VOLTAGE
Zero-Power Mode
4.75 VCC – Supply Voltage – V
Figure 7
5.25
5.5
16
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Page 17
TICPAL22V10Z-25C, TICPAL22V10Z-30I
EPICCMOS PROGRAMMABLE ARRAY LOGIC CIRCUITS
TYPICAL CHARACTERISTICS
CHANGE IN
NORMALIZED PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
1.2 VCC = 5 V
CL = 50 pF
= 25 °C
A
T
R1 = 300 R2 = 390
1.1
30
25
20
PROPAGATION DELAY TIME
vs
LOAD CAPACITANCE
VCC = 5 V TA = 25 °C R1 = 300 R2 = 390
1
0.9
Normalized Propagation Delay Time at
0.8
–50 –25 0
= CLK to Q = Zero-Power Mode = Turbo Mode
25 50 75
TA – Free-Air Temperature –°C
Figure 8
PROPAGATION DELAY TIME
NUMBER OF OUTOUTS SWITCHING
1.5 VCC = 5 V
TA = 25 °C CL = 50 pF R1 = 300 R2 = 390 Registered Macrocell
1
100
CHANGE IN
vs
15
10
5
Change in Propagation Delay Time – ns
0
0 100 200 300 400 500
CL – Load Capacitance – pF
Figure 9
t
PHL
t
PLH
600 700 800
0.5
Change in Propagation Delay Time – ns
0
1234567
Number of Outputs Switching
Figure 10
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
t
PHL
t
PLH
8910
17
Page 18
Page 19
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*Not authorized for TI military products
1992 T exas Instruments Incorporated
B0892
Page 20
TI North American Sales Offices
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Hall-Mark (216) 349-4632; Marshall (216) 248-1788.
Columbus: Hall-Mark (614) 888-3313. Dayton: Arrow/Schweber (513) 435-5563; Marshall (513)
898-4480; Zeus (513) 293-6162. OKLAHOMA: Arrow/Schweber (918) 252-7537; Hall-Mark
(918) 254-6110. OREGON: Almac/Arrow (503) 629-8090; Anthem (503)
643-1114; Marshall (503) 644-5050; Wyle (503) 643-7900. PENNSYLVANIA: Anthem (215) 443-5150;
Arrow/Schweber (215) 928-1800; GRS (215) 922-7037; (609) 964-8560; Marshall (412) 788-0441.
TEXAS: Austin: Arrow/Schweber (512) 835-4180; Hall-Mark (512) 258-8848; Marshall (512) 837-1991; Wyle (512) 345-8853;
Dallas: Anthem (214) 238-7100; Arrow/Schweber (214) 380-6464; Hall-Mark (214) 553-4300; Marshall (214) 233-5200; Wyle (214) 235-9953; Zeus (214) 783-7010;
Houston: Arrow/Schweber (713) 530-4700; Hall-Mark (713) 781-6100; Marshall (713) 467-1666; Wyle (713) 879-9953.
UTAH: Anthem (801) 973-8555; Arrow/Schweber (801) 973-6913; Marshall (801) 973-2288; Wyle (801) 974-9953.
WASHINGTON: Almac/Arrow (206) 643-9992, Anthem (206) 483-1700; Marshall (206) 486-5747; Wyle (206) 881-1150.
WISCONSIN: Arrow/Schweber (414) 792-0150; Hall-Mark (414) 797-7844; Marshall (414) 797-8400.
CANADA: Calgary: Future (403) 235-5325; Edmonton: Future (403) 438-2858; Montreal: Arrow/Schweber (514) 421-7411; Future (514)
694-7710; Marshall (514) 694-8142 Ottawa: Arrow/Schweber (613) 226-6903; Future (613) 820-8313.
Quebec: Future (418) 897-6666. Toronto: Arrow/Schweber (416) 670-7769;
Future (416) 612-9200; Marshall (416) 458-8046. Vancouver: Arrow/Schweber (604) 421-2333;
Future (604) 294-1166.
TI Die Processors
Chip Supply (407) 298-7100 Elmo Semiconductor (818) 768-7400 Minco T echnology Labs (512) 834-2022
Customer Response Center
TOLL FREE: (800) 336-5236 OUTSIDE USA: (214) 995-6611
(8:00 a.m. – 5:00 p.m. CST)
1992 T exas Instruments Incorporated
D0892
SRPS007C
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IMPORTANT NOTICE
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Copyright 1998, Texas Instruments Incorporated
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