These programmable array logic devices feature
high speed and functional equivalency when
compared with currently available devices. These
IMP ACT-X circuits combine the latest Advanced
Low-Power Schottky technology with proven
titanium-tungsten fuses to provide reliable,
high-performance substitutes for conventional
TTL logic. Their easy programmability allows for
quick design of custom functions and typically
results in a more compact circuit board. In
addition, chip carriers are available for futher
reduction in board space.
The TIBPAL16’ M series is characterized for
operation over the full military temperature range
of –55°C to 125°C.
I/O
PORTS
TIBPAL16L8’
J OR W PACKAGE
(TOP VIEW)
I
I
I
I
I
I
I
I
I
GND
FK PACKAGE
3 2 1 20 19
I
4
I
5
I
6
I
7
I
8
910111213
1
2
3
4
5
6
7
8
9
10
TIBPAL16L8’
(TOP VIEW)
I
I
I
V
20
CC
O
19
I/O
18
I/O
17
I/O
16
15
I/O
14
I/O
13
I/O
12
O
11
I
CC
I
O
V
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I
O
I/O
GND
Pin assignments in operating mode
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
IMPACT is a trademark of Texas Instruments Incorporated.
PAL is a registered trademark of Advanced Micro Devices Inc.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1996, Texas Instruments Incorporated
1
Page 2
TIBPAL16L8-15M, TIBPAL16R4-15M, TIBPAL16R6-15M, TIBPAL16R8-15M
HIGH-PERFORMANCE IMPACT PAL
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: These ratings apply except for programming pins during a programming cycle.
recommended operating conditions
MINNOMMAXUNIT
V
CC
V
IH
V
IL
I
OH
I
OL
f
clock
t
su
t
h
T
A
NOTE 2: The total clock period of clock high and clock low must not exceed clock frequency, f
Low10
Setup time, input or feedback before clock↑15ns
Hold time, input or feedback after clock↑0ns
Operating free-air temperature–5525125°C
. The minimum pulse durations specified are
only for clock high or low, but not for both simultaneously.
clock
†
electrical characteristics over recommended operating free-air temperature range
TIBPAL16R4-15M
MIN TYP‡MAX
V
IK
V
OH
V
OL
OZH
OZL
I
I
IH
I
IL
I
OS
I
CC
‡
All typical values are at VCC = 5 V, TA = 25°C.
§
Not more than one output should be shorted at a time and the duration of the short circuit should not exceed one second. Set VO at 0.5 V to avoid
test equipment degradation.
Outputs
I/O ports
Outputs
I/O ports
Pin 1, 11
All others
Pin 1, 1150
I/O ports
All others25
electrical characteristics over recommended operating free-air temperature range
TIBPAL16L8-15M
TIBPAL16R6-15M
TIBPAL16R8-15M
MIN TYP†MAX
V
IK
V
OH
V
OL
OZH
OZL
I
I
IH
IL
I
OS
I
CC
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
Not more than one output should be shorted at a time and the duration of the short circuit should not exceed one second. Set VO at 0.5 V to avoid
test equipment degradation.
Outputs
I/O ports
Outputs
I/O ports
Pin 1, 11
All others
Pin 1, 1150
I/O ports
All others20
I/O ports
All others
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
§
f
max
t
pd
t
pd
t
en
t
dis
t
en
t
dis
†
All typical values are at VCC = 5 V, TA = 25°C.
§
Maximum operating frequency and propagation delay are specified for the basic building block. When using feedback, limits must be calculated
accordingly.
FROM
(INPUT)
I, I/OO, I/O
CLK↑QR1 = 390 Ω,712ns
OE↓QR2 = 750 Ω,812ns
OE↑QSee Figure 1712ns
I, I/OO, I/O815ns
I, I/OO, I/O815ns
Texas Instruments programmable logic devices can be programmed using widely available software and
inexpensive device programmers.
The TIBPAL16R4-15M with date codes prior to 9616A must be programmed according to programming
algorithms/specifications corresponding to the TIBP AL16R4-12C. The TIBPAL16R4-15M with date code 9616A
or newer must be programmed according to programming algorithms/specifications corresponding to the
TIBPAL16R4-10C.
Regardless of date code, the TIBPAL16L8-15M, TIBPAL16R6-15M, and TIBPAL16R8-15M must be
programmed according to programming algorithms/specifications corresponding to the TIBPAL16L8-12C,
TIBPAL16R6-12C, and TIBPAL16R8-12C, respectively. Failure to do so may damage the devices.
Complete programming specifications, algorithms, and the latest information on hardware, software, and
firmware are available upon request. Information on programmers capable of programming T exas Instruments
programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI
distributor, or by calling Texas Instruments at (214) 997-5666.
Table 1. Programming Reference Table
(see Note 3)
DEVICE
TIBPAL16L8-15MJB5962-8515509RA9A/17
TIBPAL16L8-15MFKB5962-85155092A9A/717
TIBPAL16L8-15MWB5962-8515509SA9A/17
TIBPAL16R4-15MJB5962-8515512RAA1/24
TIBPAL16R4-15MFKB5962-85155122A0A1/724
TIBPAL16R4-15MWB5962-8515512SAA1/24
TIBPAL16R6-15MJB5962-8515511RA9A/24
TIBPAL16R6-15MFKB5962-85155112A9A/724
TIBPAL16R6-15MWB5962-8515511SA9A/24
TIBPAL16R8-15MJB5962-8515510RA9A/24
TIBPAL16R8-15MFKB5962-85155102A9A/724
TIBPAL16R8-15MWB5962-8515510SA9A/24
NOTE 3: Programming information for TIBPAL16R4-15M with date codes
9616A or newer. Programming information for TIBPAL16L8-15M,
TIBPAL16R6-15M, and TIBPAL16R8-15M regardless of date code.
DESC SMD
NUMBER
FAMILY/PINOUT
CODE
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
11
Page 12
TIBPAL16L8-15M, TIBPAL16R4-15M, TIBPAL16R6-15M, TIBPAL16R8-15M
HIGH-PERFORMANCE IMPACT PAL
CIRCUITS
SRPS018A – D3338, JANUARY 1986 – REVISED MAY 1996
PARAMETER MEASUREMENT INFORMATION
5 V
S1
R1
From Output
Under Test
Test
Point
Timing
Input
t
Data
Input
Input
t
pd
In-Phase
Output
t
pd
Out-of-Phase
Output
(see Note D)
PROPAGATION DELAY TIMES
1.5 V
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
(see Note A)
t
h
1.5 V
t
pd
1.5 V
t
pd
C
L
LOAD CIRCUIT FOR
3-STATE OUTPUTS
3 V
0
3 V
0
3 V
0
V
OH
V
OL
V
OH
V
OL
R2
High-Level
Pulse
Low-Level
Pulse
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
1.5 V1.5 V
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.5 V1.5 V
t
en
t
en
1.5 V
1.5 V
t
t
dis
dis
3 V
0
3 V
0
3 V
0
≈ 3.3 V
VOL + 0.5 V
V
OL
V
OH
VOH – 0.5 V
≈ 0 V
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses have the following characteristics: PRR ≤ 10 MHz, tr and tf ≤ 2 ns, duty cycle = 50%.
D. When measuring propagation delay times of 3-state outputs, switch S1 is closed.
E. Equivalent loads may be used for testing.
Figure 1. Load Circuit and Voltage Waveforms
12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
VOLTAGE WAVEFORMS
.
dis
Page 13
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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