Datasheet TGC1430G Datasheet (TriQuint Semiconductor)

Page 1
Advance Product Information
August 29, 2000
20 - 40 GHz X3 Frequency Multiplier TGC1430G
Key Features and Performance
0.25um pHEMT Technology
20 - 40 GHz Output Frequencies
-15 +/- 2dB Conversion Gain
18 dBm Input Drive Optimum
15dB Fundamental Isolation
30dB 2nd Harmonic Isolation
Primary Applications
Chip Dimensions 1.50 mm x 2.0 mm
Point-to-Point Radio
Point-to-Multipoint Communications
0
-5
-10
-15
-20
-25
-30
Conversion Gain (dB)
-35
6 8 10 12 14
Input Frequency (GHz)
Conversion Gain vs Input Frequency (Input @ 18dBm) Fundamental Isolation
0
-10
-20
-30
-40
-50
-60
2nd Harmonic Suppression (dB)
-70
6 8 10 12 14
Input Frequency (GHz)
+18dBm
0
-5
-10
-15
-20
Isolation (dB)
-25
-30
-35
6 8 10 12 14
Input Frequency (GHz)
+18dBm
2nd Harmonic Suppression
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications subject to change without notice
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
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Page 2
Advance Product Information
August 29, 2000
TGC1430G
TGC1430G - Recommended Assembly Drawing
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications subject to change without notice
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
Page 3
Advance Product Information
Assembly Process Notes
Reflow process assembly notes:
=
AuSn (80/20) solder with limited exposure to temperatures at or above 300ΓC
=
alloy station or conveyor furnace with reducing atmosphere
=
no fluxes should be utilized
=
coefficient of thermal expansion matching is critical for long-term reliability
=
storage in dry nitrogen atmosphere
Component placement and adhesive attachment assembly notes:
=
vacuum pencils and/or vacuum collets preferred method of pick up
=
avoidance of air bridges during placement
=
force impact critical during auto placement
=
organic attachment can be used in low-power applications
=
curing should be done in a convection oven; proper exhaust is a safety concern
=
microwave or radiant curing should not be used because of differential heating
=
coefficient of thermal expansion matching is critical
August 29, 2000
TGC1430G
Interconnect process assembly notes:
=
thermosonic ball bonding is the preferred interconnect technique
=
force, time, and ultrasonics are critical parameters
=
aluminum wire should not be used
=
discrete FET devices with small pad sizes should be bonded with 0.0007-inch wire
=
maximum stage temperature: 200ΓC
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should be observed during handling, assembly and test.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice.
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
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