Datasheet TGA8810-SCC Datasheet (TriQuint Semiconductor)

Page 1
TGA8810-SCC Gain Block Amplifier
2 to 10-GHz Frequency Range
Operates from Single 5 -V Supply
Unconditionally Stable
Typical ± 0.6-dB Gain Flatness
1,8796 x 1,6510 x 0,1524 mm (0.074 x 0.065 x 0.006 in.)
O R , I N C .T R I Q U I N T S E M I C O N D U C T
8810
PHOTO ENLARGEMENT
DESCRIPTION
The TriQuint TGA8810 employ shunt feedback to pr oduce flat gain to 10 -GHz. Output power at 1- dB gain compression is typically 17-dBm and noise figur e is 6-dB. The TGA8810-SCC uses on -chip DC blocks to allow dir ect cascading. Three dif ferent on-chip self-bias resistors provide the flexibility of selecting bias cur rent and RF per formance.
-SCC is a self-biased general purpose amplifier. Two gain stages
The TGA8810-SCC is available in chip for m and is readily assembled using automated equipment. Bond pad and backside metallization is gold plated for compatibil ity with eutectic alloy attachment methods as well as the ther mocompression and thermosonic wire-bonding processes.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TGA8810-SCC
TYPICAL SMALL SIGNAL POWER GAIN
TYPICAL NOISE FIGURE
20
19
18
17
16
15
Gain (dB)
14
13
12
11
10
23 4567 8910
Frequency (GHz)
7
6
5
4
3
V D1= 5 V
= 5 V
V
D2
= 25° C
T
A
V D1= 5 V
= 5 V
V
D2
= 25° C
T
A
TYPICAL OUTPUT POWER
P
1dB
Noise Figure (dB)
2
1
0
2345678910
Frequency (GHz)
20
19
18
17
16
15
Output Power (dBm)
14
13
12
23 4567 8910
Frequency (GHz)
V D1= 5 V
= 5 V
V
D2
= 25° C
T
A
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
2
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TGA8810-SCC
TYPICAL RETURN LOSS
ABSOLUTE MAXIMUM RATINGS
0
10
20
30
V D1= 5 V
= 5 V
V
D2
= 25° C
T
A
Return Loss (dB)
40
Input
50
23 4567 8910
Output
Frequency (GHz)
Positive supply voltage, V
, VD2........................................................................................................ 8.5 V
D1
Power dissipation at (or below) 25°C base -plate temperature, PD* ...................................................... 2.4 W
Operating channel temperature, TCH** .............................................................................................. 150°C
Mounting temperature (30 sec), TM.................................................................................................. 320°C
Storage temperature range, T
Ratings over channel temperature range, TCH(unless otherwise noted)
............................................................................................-65 to 150°C
STG
Stresses beyond those listed under “Absolute Maximum Ratings” m ay cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any oth er conditions beyond those indicated under “RF Characteristics” is not implied. E xposure to absolute maximum rated conditions for extended periods may af fect device r eliability.
* For operation above 25°C base -plate temperature, derate linearly at the rate of 5 mW/°C.
** Operating channel temperature, T
, directly af fects the device MTTF. For maximum life, it is r ecommended
CH
that channel temperature be maintained at the lowest possible level.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
3
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TGA8810-SCC
TYPICAL S-PARAMETERS
Frequency S
(GHz) MAG ANG(°) MAG ANG(°) MAG ANG(°) MAG ANG(°) (dB)
11
S
21
S
12
S
22
0.5 0.38 -104 0.03 -148 0.001 -13 0.92 -130 -30.8
1.0 0.29 -125 0.99 -177 0.003 180 0.79 165 -0.1
1.5 0.36 -134 4.24 114 0.009 122 0.48 111 12.5
2.0 0.40 -156 6.88 42 0.011 72 0.07 125 16.8
2.5 0.36 -169 7.49 -8 0.009 43 0.21 180 17.5
3.0 0.33 -173 7.58 -45 0.007 27 0.27 164 17.6
3.5 0.31 -175 7.59 -77 0.006 10 0.29 150 17.6
4.0 0.30 -175 7.53 -106 0.004 9 0.28 137 17.5
4.5 0.30 -176 7.36 -133 0.002 5 0.26 126 17.3
5.0 0.29 179 7.10 -157 0.002 2 0.22 115 17.0
5.5 0.31 -178 7.02 179 0.001 -53 0.17 109 16.9
6.0 0.33 179 6.98 156 0.001 -152 0.12 110 16.9
6.5 0.33 173 6.86 134 0.002 -178 0.07 111 16.7
7.0 0.32 166 6.90 113 0.003 169 0.04 120 16.8
7.5 0.29 156 7.01 90 0.004 173 0.02 140 16.9
8.0 0.23 140 7.22 67 0.005 168 0.00 2 17.2
8.5 0.15 110 7.48 43 0.007 177 0.02 0 17.5
9.0 0.11 33 7.75 15 0.009 175 0.03 24 17.8
9.5 0.24 -37 7.87 -15 0.011 170 0.06 52 17.9
10.0
10.5
0.44
0.64
-75
-106
7.39
6.34
-49
-83
VD1= VD2= 5 V, TA= 25°C
0.013
0.016
162 153
0.09
0.11
58 51
Reference planes for S -parameter data include bondwir es as specified in the “Recommended Assembly Diagram”.
GAIN
17.4
16.0
RF CHARACTERISTICS
G
P
Small–signal power gain f = 2 to 10 GHz 17 dB
PARAMETER TEST CONDITIONS TYP UNIT
SWR(in) Input standing wave ratio f = 2 to 10 GHz 1.9:1 ­ SWR(out) Output standing wave ratio f = 2 to 10 GHz 1.2:1 ­ P
1dB
Output power at 1–dB gain compression f = 2 to 10 GHz 17 dBm
NF Noise figure f = 2 to 10 GHz 6 dB
∆G
Gain flatness f = 2 to 10 GHz ±0.6 dB
p
Gain temperature coefficient T BP = -40°C to 90°C f = 6 GHz -0.02 dB/°C
IP
3
Output third–order intercept point f = 5 GHz 26 dBm
VD1= VD2= 5 V, TA= 25°C (assembled per Equivalent Schematic unless other wise noted)
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
f = 2 GHz -0.01
f = 10 GHz -0.02 f = 2 GHz 24
f = 8 GHz 25
4
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TGA8810-SCC
DC CHARACTERISTICS
EQUIVALENT SCHEMATIC
PARAMETER TEST CONDITIONS TYP UNIT
I D = I D1+ I D2Total positive supply current V D1 = V D2 = 5 V 90 mA
TA= 25°C
Bond Pad #2
V
D1
Bond Pad #3
V
D2
RF Output
FET 2 500 m
RF Input
C
C
0.1 pF
1
2
0.2 pF
FET 1 500 m
5
5
9
9
6
6
R
S12RS13RS11
R
, R
, R
, R
, R
S11
S12
C
can be used in tuning for impr oved input match. For best r esults, use the assembly configuration shown in
2
S13
S21
S22
, and R
provide the flexibility of selecting bias cur rent and RF per formance. C1and
S23
R
S21RS23RS22
the “Recommended Assembly Diagram” on page 6.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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RECOMMENDED ASSEMBLY DIAGRAM
68 pF
TGA8810-SCC
V
D2
RF Input
T.I.P.N. 3022039-1
~2.3nH
T.I.P.N. 3022039-1
~2.3nH
68 pF
RF Output
V
D1
RF connections: bond using two 1 -mil diameter, 20 to 25 -mil-length gold bond wir es at both RF Input and RF Output for optimum RF per formance.
Close placement of external components is essential to stability .
Bond using 0 .7-mil diameter wir es on bond pads 7, 11, 13, and 14 since they ar e less than the .004 x .004 needed for 1-mil diameter wire.
Two on-chip to on -chip wire bonds are needed for bond pads 1, 2, 3, and 13.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
6
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TGA8810-SCC
MECHANICAL DRAWING
1,6510
(0.0650)
0,9881
(0.0389)
0,7620
(0.0300)
0,6223
(0.0245)
0,1600
(0.0063)
8
1,3208
(0.0520)
7
0,9855
(0.0388)
6
1,1379
(0.0448)
1,3970
(0.0550)
2
3
1,7501
(0.0689)
1,7475
(0.0688)
4
5
(0.0600)
(0.0581)
(0.0518)
(0.0401)
(0.0059)
(0.0740)
1,5240
1,4757
1,3157
1,0185
0,1499
0,1245
(0.0049)
1
14
13
12
0
0,1854
(0.0073)
0
0,1118
(0.0044)
0,3378
(0.0133)
11
10
0,4953
(0.0195)
9
0,6604
(0.0260)
0,8306
(0.0327)
Units: millimeters (inches) Thickness: 0,1524 (0.006) (reference only) Chip-edge-to-bond-pad dimensions are shown to center of bond pad. Chip size tolerance: ± 0,0508 (0.002)
Bond pad #1 (RF Input): 0,1016 x 0,1778 (0.0040 x 0.0070) Bond pad #2 : 0,1016 x 0,1016 (0.0040 x 0.0040) Bond pad #3 : 0,1016 x 0,1016 (0.0040 x 0.0040) Bond pad #4 (V
): 0,1016 x 0,1016 (0.0040 x 0.0040)
D2
Bond pad #5 (RF Output): 0,0940 x 0,2540 (0.0037 x 0.0100) Bond pad #6 (R Bond pad #7 (R Bond pad #8 (R Bond pad #9 (V Bond pad #10 (R Bond pad #11 (R Bond pad #12 (R
): 0,1016 x 0,1016 (0.0040 x 0.0040)
S22
): 0,1016 x 0,0787 (0.0040 x 0.0031)
S23
): 0,1067 x 0,1016 (0.0042 x 0.0040)
S21
): 0,1016 x 0,1041 (0.0040 x 0.0041)
D1
): 0,1067 x 0,1016 (0.0042 x 0.0040)
S11
): 0,1016 x 0,0787 (0.0040 x 0.0031)
S13
): 0,1016 x 0,1016 (0.0040 x 0.0040)
S12
Bond pad #13 (C2): 0,0762 x 0,0762 (0.0030 x 0.0030) Bond pad #14 (C1): 0,0762 x 0,0762 (0.0030 x 0.0030)
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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