•0.4-W Output Power at 1 dB Gain
Compression at Midband
•Positive Gain Slope Across Frequency
•On-Chip Input DC-Blocking Capacitor
•1.8:1 Input SWR at Midband, 1.3:1
Output SWR at Midband
•8 dB Gain with +/- 1 dB Flatness
•3.1750 x 1.8034 x 0.1524 mm (0.125 x
0.071 x 0.006 in.)
Description
The TriQuint TGA8334-SCC is a GaAs monolithic dual-gate distributed amplifier.
Small-signal gain is typically 8 dB with positive gain slope across the band. Input
and output return loss is typically greater than 9.7 dB. Five 600um gatewidth FETs
provide more than 26 dB output power at 1 dB gain compression at midband.
Ground is provided to the circuitry through vias to the backside metallization.
The TGA8334-SCC is directly cascadable with other broadband TriQuint GaAs
amplifiers, such as the TGA8300-SCC, TGA8622-SCC, and TGA8220-SCC. This
general power amplifier is suitable for a variety or wide-band applications such as
distributed networks, logging stages and oscillator buffers.
Bond pad and backside metallization is gold plated for compatibility with eutectic
alloy attachment methods as well as the thermocompression and thermosonic wire
bonding processes. The TGA8334-SCC is supplied in chip form and is readily
assembled using automated equipment.
Positive supply voltage, V+……………………………………………………………………………………9 V
Positive supply current, I+…..………………………………………………………………………………
I
DSS
Negative supply voltage range, V-……………………………………………………………………………-5 V to 0 V
Gain control voltage range, V
Gain control voltage range w ith respect to positive supply voltage, V
Pow er dissipation, P
, at (or below) 25oC base-plate temperature *…………………………………..
D
Input continuous w ave pow er, P
Operating Channel temperature, T
Mounting temperature (30 sec.), T
Storage temperature range, T
…………………………………………………………………………
CTRL
…………….……………….
CT RL
-5 V to 4 V
0 V to -10 V
7.2 W
……………………………………………………………………….
IN
**…………………………………………………………………… 150oC
CH
………………………………………………………………………. 320oC
M
………………………………………………………………………….. -65 to 150oC
STG
27 dBm
Ratings over operating channel temperature range, TCH (unles s otherw ise noted).
Stresses beyond those listed under "A bs olute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated under "RF Characteristics " is not implied. Exposure to absolute maximum rated conditions
for extended periods may af fect device reliability.
* For operation abov e 25
o
C base-plate temperature, derate linearly at the rate of 15.2 mW
o
C.
** Operating channel temperature directly af fects the device MTTF. For max imum life, it is rec ommended that
channel temperature be maintained at the low est possible level. These ratings apply to each individual FET.
The reference planes for S-parameter data include bond wires as specified in the “Recommended Assembly
Diagram.” The S-parameters are also available on floppy disk and the world wide web.