Datasheet TGA8035-SCC Datasheet (TriQuint Semiconductor)

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T R I Q U I N T S E M I C O N D U C T O R , I N C .
TGA8035-SCC Gain Block Amplifier
8035
6 to 18-GHz Frequency Range
13-dB Typical Gain
2.2:1 Typical Input/Output SWR
5-dB Typical Noise Figure
2,4892 x 2,0574 x 0,1143 mm (0.098 x 0.081 x 0.0045 in.)
PHOTO ENLARGEMENT
DESCRIPTION
The TriQuint TGA8035 - SCC is a two - stage GaAs monolithic amplifier designed for use as a broadband general-purpose gain block. T wo 300 - µm gate - width FETs provide a 13- dB typical gain and a 5- dB noise figure from 6 to 18- GHz. Typical output power at 1- dB gain compression is 12.5 - dBm. Shunt feedback is used around each active device to improve gain flatness and standing- wave ratio (SWR). Ground is provided to the circuitry through vias to the backside metallization.
The TGA8035-SCC amplifier is suitable for a variety of broadband electronic warfare (EW) applications. The combination of gain, power, and noise figure makes this device an exceptional post amplifier following a low-noise amplifier.
Bond pad and backside metallization is gold plated for compatibility with eutectic alloy attachment methods as well as thermocompression and thermosonic wire- bonding processes. The TGA8035 - SCC is supplied in chip form and is readily assembled using automated equipment.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TGA8035-SCC
TYPICAL SMALL-SIGNAL POWER GAIN
TYPICAL NOISE FIGURE
20 18
16
14
12
10
8
Gain (dB)
6
4
2
0
6 7 8 9 10 11 12 13 14 15 16 17 18
Frequency (GHz)
8
7
6
5
4
VD1, VD2= 5 V
V D1, V D2= 5 V
= 50% I
I
D1
= 50% I
I
D1
ID2= 50% I
I D2= 50% I
TA= 25°C
T A= 25° C
VD1, VD2= 5 V
V D1, V D2= 5 V
= 50% I
I
= 50% I
I
D1
D1
ID2= 50% I
I D2= 50% I T A= 25° C
TA= 25°C
DSS1
DSS2
DSS1
DSS2
DSS1
DSS1
DSS2
DSS2
TYPICAL OUTPUT POWER
P
1dB
3
Noise Figure (dB)
2
1
0
6 7 8 9 10 11 12 13 14 15 16 17 18
Frequency (GHz)
20
18
16
14
12
10
8
6
Output Power (dBm)
4
2
0
6 7 8 9 10 11 12 13 14 15 16 17 18
Frequency (GHz
V D1, V D2= 5 V
VD1, VD2= 5 V
= 50% I
I
D1
= 50% I
I
D1
I D2= 50% I
ID2= 50% I
T A= 25° C
TA= 25°C
DSS1
DSS1
DSS2
DSS2
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TGA8035-SCC
TYPICAL RETURN LOSS
ABSOLUTE MAXIMUM RATINGS
0
2
VD1, VD2= 5 V
V D1, V D2= 5 V
= 50% I
I
D1
= 50% I
I
D1
ID2= 50% I
I D1= 50% I
TA= 25°C
T A= 25° C
DSS
DSS
DSS1
DSS2
4
6
8
10
Return Loss (dB)
12
14
Input
Input
Output
Output
6 7 8 9 10 11 12 13 14 15 16 17 18
Frequency (GHz)
Drain supply voltage, VD1, V Drain supply voltage range with respect to negative supply voltage, VD1­Negative supply voltage range, V Positive supply current, I Positive supply current, I
................................................................................................................ 8 V
D2
VG1, VD2-
, V
...................................................................................... 0 V to -5 V
G1
G2
.................................................................................................................. I
D1
.................................................................................................................. I
D2
VG2.................... 0 V to 8 V
DSS1
DSS2
Power dissipation at (or below) 25C base-plate temperature, PD* ...................................................... 1.4 W
Input continuous wave power, PIN.................................................................................................... 20 dBm
Operating channel temperature, TCH** .............................................................................................. 150 C
Mounting temperature (30 sec), TM .................................................................................................... 320C
Storage temperature range, T
Ratings over operating channel temperature range, TCH(unless otherwise noted)
............................................................................................-65 to 150C
STG
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “RF Characteristics” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
* For operation above 25C base - plate temperature, derate linearly at the rate of 3 mW/ C. * Operating channel temperatur e (TCH) directly affects the device MTTF. For maximum life, it is recommended
that channel temperature be maintained at the lowest possible level.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TGA8035-SCC
TYPICAL S-PARAMETERS
Frequency S
(GHz) MAG ANG(° )SMAG ANG(° ) MAG ANG(° ) MAG ANG(° ) (dB)
11
S
21
S
12 22
5.0 0.54 75 2.34 55 0.013 109 0.59 73 7.4
5.5 0.35 71 3.49 9 0.018 77 0.47 61 10.9
6.0 0.31 75 4.33 -34 0.021 46 0.39 49 12.7
6.5 0.31 62 4.89 -73 0.022 15 0.33 33 13.8
7.0 0.28 34 5.16 -108 0.022 -15 0.28 14 14.2
7.5 0.24 -7 5.28 -141 0.021 -44 0.25 -7 14.5
8.0 0.25 -53 5.27 -172 0.021 -75 0.24 -31 14.4
8.5 0.30 -91 5.05 161 0.020 -102 0.26 -52 14.1
9.0 0.37 -117 4.92 136 0.019 -124 0.30 - 71 13.8
9.5 0.42 -138 4.82 112 0.021 -144 0.34 - 88 13.7
10.0 0.46 -154 4.71 90 0.021 -164 0.38 -102 13.5
10.5 0.48 -168 4.68 69 0.020 177 0.42 -115 13.4
11.0 0.48 178 4.73 48 0.020 174 0.43 -125 13.5
11.5 0.46 166 4.91 27 0.021 161 0.45 -134 13.8
12.0 0.43 153 5.13 5 0.021 151 0.46 -144 14.2
12.5 0.38 140 5.28 -18 0.021 141 0.45 -154 14.5
13.0 0.33 129 5.42 -41 0.021 132 0.43 -164 14.7
13.5 0.27 123 5.52 -64 0.021 120 0.41 -173 14.8
14.0 0.25 118 5.68 -89 0.020 109 0.39 178 15.1
14.5 0.24 112 5.61 -113 0.017 97 0.38 167 15.0
15.0 0.24 100 5.59 -138 0.013 96 0.35 154 14.9
15.5 0.22 89 5.40 -163 0.014 94 0.32 143 14.6
16.0 0.21 81 5.10 174 0.015 80 0.31 136 14.1
16.5 0.24 67 5.05 153 0.012 47 0.33 123 14.1
17.0 0.24 46 5.12 129 0.007 44 0.32 114 14.2
17.5 0.23 27 5.06 103 0.010 28 0.34 108 14.1
18.0 0.28 - 4 5.27 78 0.005 -38 0.35 93 14.4
18.5 0.35 -48 5.49 46 0.007 -17 0.33 83 14.8
19.0 0.41 -92 4.91 9 0.012 -85 0.29 73 13.8
19.5 0.53
20.0
0.68 -149
-122
ID1= 50% I
4.01
3.37
DSS1
-23
-55
, ID2= 50% I
DSS2
0.012
0.008
, V
, VD2= 5 V, TA= 25°C
D1
-152 156
0.19
0.18
75
100
Reference planes for S-parameter data include bond wires as specified in the “Recommended Assembly Diagram.”
GAIN
12.1
10.5
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TGA8035-SCC
RF CHARACTERISTICS
DC CHARACTERISTICS
THERMAL INFORMATION
PARAMETER TEST CONDITIONS TY P UNIT
G
P
Small–signal power gain f = 6 to 18 G H z 13 dB SWR(in) Input standing–wave ratio f = 6 to 18 GHz 2.2:1 — SWR(out) Output standing–wave ratio f = 6 to 18 GHz 2.2:1 — P
1dB
Output power at 1–dB gain compression f = 6 to 18 GHz 12.5 dB m NF Noise figure f = 6 to 18 GHz 5 dB
V
D1,VD2
= 5 V, V
= - 1 V, VG2= - 1 V, TA= 25°C
G1
PARAMETER TEST CONDITIONS MIN MA X UNIT
I
Total zero–gate–voltage drain current at saturation V DS = 0.5 V to 3.5 V, 36 108 mA
DSS1
for FET1 * VGS = 0
I
Total zero–gate–voltage drain current at saturation V DS = 0.5 V to 3.5 V, 36 108 mA
DSS2
for FET2 ** V GS = 0
TA= 25°C
* V ** V
DS1
for I
DS2
is drain voltage between 0.5 V and 3.5 V at which drain current is highest at DC autoprobe.
DSS1
for I
is drain voltage between 0.5 V and 3.5 V at which drain current is highest at DC autoprobe.
DSS2
PARAMETER TEST CONDITIONS TEST CONDITIONS FET MMIC* UNIT
25°C Base, 80°C Channel** 152.5 76.3
R JCThermal resistance, I D=72 mA, V D=5V 85°C Base, 151°C Channel** 184.7 92.4 °C/W
channel–to–backside 100°C Base, 169°C Channel** 192.8 96.4
EQUIVALENT SCHEMATIC
* MMIC thermal resistance is the peak FET temperature rise divided by the total MMIC dissipated power (.72 W). **Hottest Gate Channel (Center of either FET).
RF Output
V
D2
RF Input
FET 2
FET 1
300 m
V
G1
V
D1
V
G2
300 m
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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TYPICAL BIAS NETWORK
TGA8035-SCC
RECOMMENDED ASSEMBLY DIAGRAM
RF Input
VG1,V
1
TGA8035
5
6
G2
R
Bypass
C
Bypass
2
3
4
VD1,V
D2
C
Bypass
RF Output
RF OutputRF Input
V
G1,VG2
RF connections: bond using two 1-mil diameter, 20 to 25 - mil- length gold bond wires at both RF Input and RF Output for optimum RF performance.
Close placement of external components is essential to stability.
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
0.01 F
25
0.01 F
• www.triquint.com
VD1,V
D2
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TGA8035-SCC
MECHANICAL DRAWING
1,4656
(0.0577)
0,2108
(0.0083)
0,1803
(0.0071)
1
65 43
0
0
0,4039
(0.0159)
0,9246
(0.0364)
1,8034
(0.0710)
2,3114
(0.0910)
2
2,1590
(0.0850)
2,0574 (0.081)
1,4681
(0.0578)
0,2108
(0.0083)
2,4892
(0.0980)
Units: millimeters (inches) Thickness: 0,1143 (0.045) (reference only) Chip edge to bond pad dimensions are shown to center of bond pad. Chip size tolerance: ± 0,0508 (0.002)
Bond pad #1 (RF Input): 0,0940 x 0,2362 (0.0037 x 0.0093) Bond pad #2 (RF Output): 0,0991 x 0,2413 (0.0039 x 0.0095) Bond pad #3 (VD2): 0,2286 x 0,1143 (0.0090 x 0.0045)
Bond pad #4 (V Bond pad #5 (V Bond pad #6 (V
): 0,2286 x 0,1143 (0.0090 x 0.0045)
G2
): 0,2286 x 0,1143 (0.0090 x 0.0045)
D1
): 0,2286 x 0,1143 (0.0090 x 0.0045)
G1
TriQuint Semiconductor, Inc. • Texas Facilities • (972) 995-8465
• www.triquint.com
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