> 17 dB nom, 34 - 35.2 GHz
> 17 dB nom, 33 - 36 GHz
~ 5 dB nom, 34 - 35.2 GHz
~ 5 dB nom. 33 – 36 GHz
> 8 dB nom, 34 - 35.2 GHz
> 7 dB nom, 33 - 36 GHz
32.3dBm min. 34 –35.2 GHz
31.5dBm min, 34 – 35.2 GHz
over temp.
> 20% +25C
Tested under –26, +25, &
+100C
Predict: -43C
< 1.5 A max over operating
frequency and Temp. range
+ 6 V
4.134 mm x 3.300 mm
13.6mm
2
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.
Freq (GHz)min Poutmean Poutmin Poutmean Poutmin Poutmean Pout
34333332.732.831.932
34.632.832.932.532.631.731.8
35.232.532.732.332.431.531.6
Ave. Pout (dBm)32.832.932.532.631.731.8
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.
AuSn (80/20) solder with limited exposure to temperatures at or above 300ΓC
•=
alloy station or conveyor furnace with reducing atmosphere
•=
no fluxes should be utilized
•=
coefficient of thermal expansion matching is critical for long-term reliability
•=
storage in dry nitrogen atmosphere
Component placement and adhesive attachment assembly notes:
•=
vacuum pencils and/or vacuum collets preferred method of pick up
•=
avoidance of air bridges during placement
•=
force impact critical during auto placement
•=
organic attachment can be used in low-power applications
•=
curing should be done in a convection oven; proper exhaust is a safety concern
•=
microwave or radiant curing should not be used because of differential heating
•=
coefficient of thermal expansion matching is critical
Feb 4, 2000
Interconnect process assembly notes:
•=
thermosonic ball bonding is the preferred interconnect technique
•=
force, time, and ultrasonics are critical parameters
•=
aluminum wire should not be used
•=
discrete FET devices with small pad sizes should be bonded with 0.0007-inch wire
•=
maximum stage temperature: 200ΓC
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.