LCKTC1carrier lock time constant
LCKO2carrier lock output
LCKTH3carrier lock threshold voltage
LCKIO4carrier lock indicator output
V
DD(A)
5supply voltage for operational
amplifiers
V
SS(A)
6negative supply voltage for
operational amplifiers
V
ref(pos)
7positive reference voltage for
converters
V
ref(mid)
8middle reference voltage for
converters
V
ref(neg)
9negative reference voltage for
converters
AFC2O10AFC 2 output
V
SS2
11negative supply voltage 2
AGCTC12automatic gain control time
constant
AGCO13automatic gain control output
SWPO14sweep current output
CARTC15carrier recovery time constant
CARO16carrier recovery output
V
SSA(C)
17analog negative supply voltage for
converters
I
ana
Q
ana
V
DDA(C)
18analog input I
19analog input Q
20analog supply voltage for
converters
CLKRTC21clock recovery time constant
CLKRO22clock recovery output
CLKIX23clock input from crystal circuit
(at double symbol rate)
SYMBOLPINDESCRIPTION
V
SS1
24negative supply voltage 1
CLKSR25clock output at symbol rate
QDO226Q digital output (bit 2)
QDO127Q digital output (bit 1)
QDO028Q digital output (bit 0)
V
SS(I/O)
29negative supply voltage for digital
inputs/outputs
V
DD(I/O)
30supply voltage for digital
inputs/outputs
IDO231I digital output (bit 2)
IDO132I digital output (bit 1)
IDO033I digital output (bit 0)
V
0=off)
TEST40test control switch (1 = on; 0 = off)
I
bias
V
DD(C)
41input bias current for analog blocks
42supply voltage for digital part of
ADC and DAC
V
SS(C)
43negative supply voltage for digital
part of ADC and DAC
LCKDAC44carrier lock DAC output
November 19944
Page 5
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
handbook, full pagewidth
LCKTC
LCKO
LCKTH
LCKIO
V
DD(A)
V
SS(A)
V
ref(pos)
V
ref(mid)
V
ref(neg)
AFC2O
V
SS2
DD(C)
SS(C)
bias
V
V
43
13
AGCO
I
42
14
SWPO
41
TDA8041H
15
CARTC
LCKDAC
44
1
2
3
4
5
6
7
8
9
10
11
12
AGCTC
TEST
40
16
CARO
BQN
SWEEP
39
38
17
18
ana
I
SSA(C)
V
Q
AFC2
37
19
ana
V
AFC1
36
20
DDA(C)
V
DDD
V
35
34
21
22
CLKRO
CLKRTC
33
32
31
30
29
28
27
26
25
24
23
IDO0
IDO1
IDO2
V
DD(I/O)
V
SS(I/O)
QDO0
QDO1
QDO2
CLKSR
V
SS1
CLKIX
MBE166
SSD
Fig.2 Pin configuration.
November 19945
Page 6
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
GENERAL DESCRIPTION
The quadrature demodulator controller TDA8041H,
generates all control signals required for demodulation of
BPSK and QPSK modulated signals. This device is
specially designed to be used in conjunction with the
quadrature demodulator IC, TDA8040T.
The quadrature demodulator controller generates the
following signals:
• Symbol clock recovery control signal; this signal locks
the VCXO to the received symbol clock. The clock
recovery algorithm used in this device operates
independently from the other loops.
• Carrier recovery control signal; depending on the
selected mode (BPSK or QPSK), this signal will adjust
the phase of the I and Q input signal. This adjustment
will be such that the constellation points are as defined
in Fig.4.
• Frequency control signals (AFC1 and AFC2); to serve a
broad range of applications, two different AFC detectors
and a sweep function are built-in:
– AFC1: this is a robust detector which forces the offset
frequency in the I and Q branch to zero. This detector
can handle frequency offset up to 1/8 × symbol rate.
– AFC2: this detector can handle frequency offsets
greater than 1/8 × symbol frequency. However this
AFC algorithm will bring the offset frequency only
close to zero.
– Sweep: this signal generates a triangular current
output which can tune a VCO over its complete
frequency range. Sweeping must be switched off as
soon as the logical output of the lock detect function
becomes positive. The value of the sweep current is
set by an external resistor.
• Amplitude control signals (AGC); this signal adjusts a
variable gain amplifier so that the amplitude of the I and
Q signals is in accordance with the specified
constellation points of Fig.4.
• Lock detect signal; this signal is related to the E
the incoming I and Q signals. This lock detect signal can
be used for two purposes:
– Lock detection by comparing the lock detect signal
with an external set reference voltage, one can obtain
a logical signal indicating lock detect.
– The relationship between Eb/No can be used to
display the Eb/No for antenna adjustment.
b/No
of
FUNCTIONAL DESCRIPTION
The TDA8041H has a 3-bit-wide digital I and Q output for
soft error correction. These 3-bit outputs represent the
main symbols only. The relationship between the 4-bits
ADC signals and the 3-bit output signals is illustrated in
Fig.3.
Fig.3I and Q output levels for soft error
decision FEC.
November 19946
Page 7
Philips SemiconductorsPreliminary specification
BB
B
BB
BB
Quadrature demodulator controllerTDA8041H
B
Fig.4 Constellation points.
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
DD(A)
V
DDA(C)
V
DD(I/O)
V
DDD
V
DD(C)
V
n(max)
P
tot
T
stg
T
j
T
amb
THERMAL CHARACTERISTICS
SYMBOLPARAMETERVALUEUNIT
R
th j-a
supply voltage for operational amplifiers (pin 5)−0.5+6.5V
analog supply voltage for converters (pin 20)−0.5+6.5V
supply voltage for digital inputs/outputs (pin 30)−0.5+6.5V
supply voltage for digital section (pin 35)−0.5+6.5V
supply voltage for digital part of ADC and DAC (pin 42)−0.5+6.5V
maximum voltage on all pins0V
total power dissipationT
storage temperature−55+150°C
junction temperature−+150°C
operating ambient temperature0+70°C
thermal resistance from junction to ambient in free air75K/W
=70°C−500mW
amb
DD
V
HANDLING
Inputs and outputs are protected against electrostatic discharge in normal handling. However, to be totally safe, it is
desirable to take normal precautions appropriate to handling MOS devices.
November 19947
Page 8
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
CHARACTERISTICS
= 4.75 to 5.25 V; R
V
DD
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Digital outputs (pins 26 to 28 and 31 to 33)
V
OL
V
OH
t
d
t
h
LOW level output voltage0−0.1V
HIGH level output voltagesee Fig.60.9V
delay timesee Fig.6t
hold time8−t
Digital inputs
V
IL
V
IH
C
I
LOW level input voltage0−0.3V
HIGH level input voltage0.7V
input capacitance−−10pFClock output (pins 22 and 25); see Fig.5
V
OL
V
OH
T
cy
t
W
t
r
t
f
LOW level output voltage0−0.1V
HIGH level output voltage0.9V
cycle time33−−ns
pulse widthduty cycle 40/6013.2−−ns
rise timeCL=30pF−−6ns
fall timeCL=30pF−−6ns
Clock input (pin 23)
R
f
s
source
source resistance−−50Ω
sampling frequency−−60MHz
Analog inputs (pins 18 and 19)
R
sym
V
ref(pos)
V
ref(mid)
V
ref(neg)
I
L
V
i(I,Q)
V
I,Q(op)
R
I
C
I
I
bias
symbol rate−−30 × 106symbols/s
positive reference voltageIO=0−0.48V
middle reference voltageIO= 0−0.38V
negative reference voltage IO= 0−0.28V
load current at pin 8note 1−5−+5mA
I and Q input voltage0−V
I and Q operating voltage0.28V
input resistance50−−kΩ
input capacitance−−20pF
input bias currentRL= 100 kΩ−−37−mA
DAC outputs (pins 10, 12, 15 and 21)
I
o(av)
D
Io
average output currentV
matching of positive and
negative output currents
I
o
zero output current−25−+25nA
=30×106 symbols/s; T
sym
=25°C; unless otherwise specified.
amb
DAC=Vref(mid)
V
DAC=Vref(mid)
V
DD
DD
h
DD
DD
−V
−22ns
−V
−V
DD
DD
DD
−0.48V
DD
DD
d
DD
DD
−V
−V
−V
DD
DD
DD
DD
V
ns
V
V
V
V
V
V
; note 2−100−mA
; note 2−7−+7%
November 19948
Page 9
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Sweep current (pin 14)
V
OH
V
OL
Z
O
V
CARO(min)
V
CARO(max)
Loop amplifiers
V
o
G
v
G
B
R
L
Notes
1. V
is usually open-circuit. However, this pin may also be used as a reference output for an external buffer.
ref(mid)
HIGH level output voltage−2V
ref(mid)
LOW level output voltage−0−V
output impedanceSWEEP = 1−2−kΩ
SWEEP = 010−−MΩ
LOW switching level0.1V
HIGH switching level0.8V
output voltage0.1V
DD
DD
DD
−0.2V
−0.9V
−0.9V
open loop gain−.60−dB
gain bandwidth−1−MHz
load resistance5−−kΩ
−V
DD
DD
DD
V
V
V
I
–()
2.;
I
oav()
posIneg
=D
-------------------------------2
I
+()
100
lo
posIneg
×=
-------------------------------- I
–()
posIneg
November 19949
Page 10
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
Fig.5 Timing of CLKO.
November 199410
Fig.6 Timing definition of digital outputs.
Page 11
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
APPLICATION INFORMATION
10
560
56
nF
Ω
pF
5 V
5 V
10
nF
BFS17A
10
56
kΩ
100 pF
0 Ω
pF
390 nH
Ω
50
10 Ω
kΩ
4.7
5 V
book, full pagewidth
5 V
100 nF
kΩ
100
100 nF
4443424140393837363534
22
33
SSD
V
LCKDAC
1
kΩ
I0
32
IDO0
DDD
V
AF C1
AF C2
BQN
SWEEP
TEST
bias
I
DD(C)
V
SS(C)
V
LCKTC
2
I1
IDO1
LCKO
I2
31
IDO2
LCKTH
3
30
DD(I/O)
V
LCKIO
4
100 nF
29
SS(I/O)
V
DD(A)
V
5
Q0
Q1
27
28
QDO1
QDO0
TDA8041H
SS(A)
ref(pos)
V
V
6
7
Q2
26
QDO2
ref(mid)
V
8
clock output
24
25
SS1
CLKSR
V
ref(neg)
V
AFC2O
9
10
23
CLKIX
SS2
V
11
CLKRO
CLKRTC
DDA(C)
V
ana
Q
ana
I
SSA(C)
V
CARO
CARTC
SWPO
AGCO
AGCTC
49.7 MHz
BB620
27
kΩ
pF
100
10
nF
82
kΩ
5 V
nF
100
pF
330
pF
330
Q from TDA8040
I from TDA8040
1
10
nF
kΩ
MBE168
Fig.7 Application diagram.
820
kΩ
1213141516171819202122
100 Ω
100 nF
270
pF
22
56
5 V
33
kΩ
5 V
10
November 199411
100 nF
100 nF
AFC2 current
AGC voltage
carrier voltage
kΩ
nF
8.2
100 nF
kΩ
lock indicator
nF
33
nF
kΩ
100
10
kΩ
100 nF
5 V
Page 12
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
PACKAGE OUTLINE
seating
plane
0.15 S
12.9
12.3
44
1
pin 1 index
11
12
34
22
S
1.2
(4x)
0.8
33
0.8
0.40
0.20
23
B
10.1
9.9
12.9
12.3
B
0.15 M
1.2
0.50
0.20
0.8
(4x)
A
detail X
0.95
0.55
0.85
0.75
X
0.25
0.14
0 to 10
2.35
1.85
o
Dimensions in mm.
0.8
0.40
0.20
10.1
9.9
0.15 M A
1.85
1.65
MBC864 - 2
Fig.8Plastic quad flat package; 44 leads (lead length 1.3 mm); body 10 × 10 × 1.75 mm; high stand-off height
(QFP44; SOT307-1).
November 199412
Page 13
Philips SemiconductorsPreliminary specification
Quadrature demodulator controllerTDA8041H
SOLDERING
Plastic quad flat-packs
YWAVE
B
During placement and before soldering, the component
must be fixed with a droplet of adhesive. After curing the
adhesive, the component can be soldered. The adhesive
can be applied by screen printing, pin transfer or syringe
dispensing.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder bath is
10 s, if allowed to cool to less than 150 °C within 6 s.
Typical dwell time is 4 s at 250 °C.
A modified wave soldering technique is recommended
using two solder waves (dual-wave), in which a turbulent
wave with high upward pressure is followed by a smooth
laminar wave. Using a mildly-activated flux eliminates the
need for removal of corrosive residues in most
applications.
Y SOLDER PASTE REFLOW
B
Reflow soldering requires the solder paste (a suspension
of fine solder particles, flux and binding agent) to be
applied to the substrate by screen printing, stencilling or
pressure-syringe dispensing before device placement.
Several techniques exist for reflowing; for example,
thermal conduction by heated belt, infrared, and
vapour-phase reflow. Dwell times vary between 50 and
300 s according to method. Typical reflow temperatures
range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate
the binding agent. Preheating duration: 45 min at 45 °C.
EPAIRING SOLDERED JOINTS (BY HAND-HELD SOLDERING
R
IRON OR PULSE
-HEATED SOLDER TOOL)
Fix the component by first soldering two, diagonally
opposite, end pins. Apply the heating tool to the flat part of
the pin only. Contact time must be limited to 10 s at up to
300 °C. When using proper tools, all other pins can be
soldered in one operation within 2 to 5 s at between 270
and 320 °C. (Pulse-heated soldering is not recommended
for SO packages.)
For pulse-heated solder tool (resistance) soldering of VSO
packages, solder is applied to the substrate by dipping or
by an extra thick tin/lead plating before package
placement.
DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
November 199413
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