Datasheet TC835CPI, TC835CKW, TC835CBU Datasheet (Microchip Technology)

TC835
Personal Computer Data Acquisition A/D Converter
Features
• Upgrade of Pin-Compatible TC7135, ICL7135
• 200kHz Operation
• Single 5V Operation With TC7660
• Multiplexed BCD Data Output
• Control Outputs for Auto-Ranging
• Input Sensitivity: 100µV
• No Sample and Hold Required
Applications
• Personal Computer Data Acquisition
• Scales, Panel Meters, Process Controls
• HP-IL Bus Instrumentation
Device Selection Table
Part Number Package Temperature Range
TC835CBU 64-PinPQFP 0°Cto+70°C
TC835CKW 44-Pin PQFP 0°Cto+70°C
TC835CPI 28-Pin PDI P 0°Cto+70°C
Note: Tape and Reel available for 44-Pin PQFP
package.
General Description
The TC835 is a low power, 4-1/2 digit (0.005% resolution), BCD analog to digital converter (ADC) that has been characterized for 200kHz clock rate opera­tion. The five conversions per second rate is nearly twice as fast as the I CL7135 or TC7135. The TC835, like the TC7135, does not use the external diode resis­tor rollover error compensation circuits required by the ICL7135.
The multiplexed BCD data output is perfectforinterfac­ing to personal computers. The low cost, greater than 14-bit high-resolution and 100µV sensitivity makes the TC835 exceptionally cost-effective.
Microprocessor-based data acquisition systems are supported by the BUSY and STROBE with the RUN/HOLD OVERRANGE, UNDERRANGE, BUSY and RUN/ HOLD control functions, plus multiplexed BCD data outputs, make the TC835 the ideal converter for µP­based scales, measurement systems and intelligent panel meters.
The TC835 interfaces with full function LCD and LED display decoder/drivers. The UNDERRANGE and OVERRANGE outputs may be used to implement an auto-ranging scheme or special display functions.
input of the TC835. The
outputs, along
2002 Microchip TechnologyInc. DS21478B-page 1
TC835
D
Package Type
V-
REF IN
ANALOG
COM
INT OUT
AZ IN
BUFF OUT
C
REF
C
REF
–INPUT
+INPUT
V+
(MSD) D5
(LSB) B1
B2
1
2
3
4
5
6
-
7
+
8
9
10
11
12
13
14
28-Pin PDIP
TC835CPI
UNDERRANGE
28
OVERRANGE
27
26
STROBE
RUN/HOLD
25
24
DIGTAL GND
23
POLARITY
22
CLOCK IN
21
BUSY
20
D1 (LSD)
19
D2
18
D3
17
D4
16
B8 (MSD)
15
B4
INT OUT
AZ IN
BUFF OUT
REF CAP–
REF CAP+
–INPUT
+INPUT
64-Pin PQFP
NCNCNC
44 43 42 41 39 3840
NC
1
2
3
4
5
6
7
8
V+
9
NC
10
NC
11
12 13 14 15 17 18
NC
NC
44-Pin PQFP
ANALOG
REF INV–UR
COMMON
TC835CKW
16
B2
B4
(LSB) B1
(MSD) D5
OR
STROBE
37 36 35 34
19 20 21 22
D4
D3
(MSB) B8
NC
NC
33
NC
32
NC
31
RUN/HOL
30
DGND
29
POLARITY
28
CLK IN
27
BUSY
26
NC
D1 (LSD)
25
D2
24
NC
23
NC
NC
OVERRANGE
UNDERRANGE
ANALOG COM
NOTES:
1. NC = No internal connection.
2. Pins 9, 25, 40 and 56 are connected to the die substrate. The potential at these pins is approximately V+. No external connections should be made.
NC
NC NC
NC
NC NC
SUB
V–
REF IN
NC
NC
NC
NC
NCNCNC
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
NC
61 60 59 58 57 56 55 545352 51 50 4964
63
62
NC
AZ IN
INT OUT
DGND
STROBE
RUN/HOLD
TC835CBU
NC
OUT
BUFF
BUF CAP–
POL
NC
SUB
SUB
D1
CLK IN
BUSY
NC
–INPUT
BUF CAP+
D2
NC
NC
NC
32
NC
+INPUT
NC
V+
48
NC
47
NC
46
NC
45
D3
44
D4
43
B3
42
B4
41
B2
40
SUB
39
B1
38
D5
37
NC
36
NC
35
NC
34
NC
33
NC
DS21478B-page 2
2002 Microchip TechnologyInc.
Typical Application
3
4
Address Bus
Control
Data Bus
TC835
+
5V
R 6522 P
PB0
Channel Selection
PA0 PA1 PA2
PA3 PA4 PA5 PA6 PA7 CA1 CA2
PB3PB2PB1
HCTS157
1Y 2Y 3Y
1B 2B 3B
1A 2A 3A
S
F
IN
V+ REF CAP
BUF
INPUT+
TC835
Analog
Common
F
IN
AZ
INT
V
Input
DGND
-
5V
POL OR UR D5 B8 B4 B2
B1 D1 D2 D3 D4 STB R/H
-15V
+15V
DG529
D
A
D
B
R
REF Voltage
WR
A1A0EN
Channel 1
Channel 2
Channel
Channel
Differential Multiplexer
2002 Microchip TechnologyInc. DS21478B-page 3
TC835
1.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings*
Positive Supply Voltage......................................... +6V
*Stresses above those listed under "Absolute Maximum Rat­ings"maycause permanentdamage to the device.These are stress ratings only and functional operation of the device at these or any other conditions above t hose indicated in the operation sections of the specifications is not implied. Expo­sure to Absolute Maximum R ating conditions for extended periodsmay affectdevice reliability.
Negative Supply Voltage........................................-9V
Analog Input Voltage (Pin 9 or 10) ...V+ to V– (Note 2)
Reference Input Voltage (Pin 2) .....................V+ to V–
Clock Input Voltage ........................................ 0V to V
+
Operating Temperature Range................0°C to +70°C
StorageTemperature Range............. -65°C to +150°C
Package Power Dissipation (T
70°C)
A
28-Pin Plastic DIP ............................ 1.14
44-Pin PQFP .................................... 1.00
64-Pin PQFP .................................... 1.14
TC835 ELECTRICAL SPECIFICATIONS
Electrical Characteristics: TA=+25°C,F Symbol Parameter Min Typ Max Unit Test Conditions
Analog
Display Reading with Zero Volt Input -0.0000 ±0.0000 +0.0000 DisplayReading Note 3, Note 4 ZeroReading TemperatureCoefficient 0.5 2 µV/°C VIN=0V,(Note 5)
TC
Z
Full-Scale Temperature Coefficient 5 ppm/°C VIN=2V;
TC
FS
NL Nonlinearity Error 0.5 1 Count Note 7
DNL Differential Linearity Error 0.01 LSB Note 7
Display Reading in Ratiometric Operation +0.9996 +0.9998 +1.0000 Display Reading V
±FSE ± Full Scale Symmetry Error (Rollover Error) 0.5 1 Count –V
Input Leakage Current 1 10 pA Note 4
I
IN
Noise 15 µV
e
N
Digital
Input Low Current 10 100 µAV
I
IL
Input High Current 0.08 10 µAV
I
IH
Output Low Voltage 0.2 0.4 V IOL=1.6mA
V
OL
Output High Voltage;
V
OH
f
CLK
Note 1: Functional operation is not implied.
2: Limit input current to under 100 µA if input voltages exceed supply voltage. 3: Full scale voltage = 2V. 4: V 5: 0°C T 6: Externalreference temperature coefficient less than 0.01ppm/°C. 7: -2V V 8: |V 9: Test circuit shown in Figure 1-1. 10: Specification relatedtoclock frequency range over which the TC835 correctly performs its various functions.Increased
B
1,B2,B4,B8,D1–D5
Busy, Polarity,Overrange,
Underrange, Strobe
ClockFrequency 0 200 1200 kHz Note 10
=0V.
IN
+70°C.
A
+2V. Error of readingfrom best fit straightline.
IN
| = 1.9959.
IN
errors result at higher operating frequencies.
= 200kHz, V+ = +5V, V-= -5V,unless otherwise specified.
CLOCK
2.4 4.4 5 V I
4.9 4.99 5 V I
P-P
(Note 5, Note 6
IN=VREF
Peak to Peak Value not Exceeded 95% of Time
IN IN
OH OH
,(Note 3)
=+VIN, (Note 8)
IN
=0V =+5V
=1mA =10µA
DS21478B-page 4
2002 Microchip TechnologyInc.
TC835 ELECTRICAL S P EC IFICATIONS (CONTINUED)
TC835
Electrical Characteristics: TA=+25°C,F Symbol Parameter Min Typ Max Unit Test Conditions
Power Supply
V+ Positive Supply Voltage 4 5 6 V V– Negative SupplyVoltage -3 -5 -8 V
I+ PositiveSupply Current 1 3 mA f I– Negative Supply Current 0.7 3 mA f
PD Power Dissipation 8.5 30 m f
Note 1: Functional operation is not implied.
2: Limit input current to under 100 µA if input voltages exceed supply voltage. 3: Full scale voltage = 2V. 4: V
=0V.
IN
5: 0°C T 6: Externalreference temperature coefficient less than 0.01ppm/°C. 7: -2V V 8: |V 9: Test circuit shown in Figure 1-1. 10: Specification relatedtoclock frequency range over which the TC835 correctly performs its various functions.Increased
errors result at higher operating frequencies.
+70°C.
A
+2V. Error of readingfrom best fit straightline.
IN
| = 1.9959.
IN
= 200kHz, V+ = +5V, V-= -5V,unless otherwise specified.
CLOCK
CLK CLK CLK
=0Hz =0Hz =0Hz
2002 Microchip TechnologyInc. DS21478B-page 5
TC835
2.0 PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 2-1.
TABLE 2-1: PIN FUNCTION TABLE
Pin Number 28-Pin PDIP
1 V- Negative powersupply input. 2 REF IN External reference input. 3 ANALOG COMMON Reference point for REF IN. 4 INT OUT Integrator output. Integrator capacitor connection. 5 AZ IN Auto zero input. Auto zero capacitor connection. 6 BUFF OUT Analog input buffer output. Integrator resistor connection. 7C 8C 9 -INPUT Analog input. Analoginputnegative connection.
10 +INPUT Analog input. Analog input positive connection.
11 V+ Positive power supplyinput. 12 D5 Digit drive output.Most Significant Digit(MSD) 13 B1 Binary CodedDecimal (BCD) output.LeastSignificantBit(LSB) 14 B2 BCD output. 15 B4 BCD output. 16 B8 BCD output. Most Significant Bit (MSB) 17 D4 Digit drive output. 18 D3 Digit drive output. 19 D2 Digit drive output. 20 D1 Digit drive output. Least Significant Digit (LSD) 21 BUSY Busy output.At the beginning of the signal-integration phase,BUSYgoesHighand
22 CLOCK IN Clock input. Conversion clock connection. 23 POLARITY Polarity output.A positive input is indicatedby a logic High output.The polarity output is
24 DGND Digitallogic referenceinput. 25 RUN/HOLD
26 STROBE 27 OVERRANGE Over range output. A logic High indicates that the analog input exceeds the full scale input
28 UNDERRANGE Underrangeoutput. A logic High indicatesthatthe analog input is less than 9% of the full
Symbol Description
- Reference capacitor input. Reference capacitornegative connection.
REF
+ Reference capacitor input. Reference capacitor positive connection.
REF
remainsHighuntilthefirstclockpulseafter the integratorzerocrossing.
valid at the beginning of the reference integratephaseandremains valid until determined duringthenext conversion.
Run / Hold input. When at a logic High,conversions are performed continuously. A logic Low holds the current data as long as the Low condition exists.
Strobe output. The STROBE output pulses low in the center of the digit drive outputs.
range.
scaleinputrange.
DS21478B-page 6
2002 Microchip TechnologyInc.
TC835
3.0 DETAILED DESCRIPTION
(All Pin Designations Refer to 28-Pin DIP)
3.1 Dual Slope Conversion Principles
The TC835 is a dual slope, integrating analog to digital converter. An understanding of the dual slope conver­sion technique will aid in following the detailed TC835 operational theory.
The conventional dual slope converter measurement cycle has two distinct phases:
1. Input signal i ntegration
2. Referencevoltage integration (de-integration) Theinputsignalbeingconvertedisintegratedforafixed
timeperiod,witht ime beingmeasuredby countingclock pulses.An opposite polarity constantreference voltage is then integrated until the integrator output voltage returnstozero.Thereference integrationtimeisdirectly proportional to the input signal.
In a simple dual slope converter, a complete conversion requires the integrator output to "ramp-up" and "ramp-down."
A simple mathematical equation relates the input sig­nal, reference voltage and integration time:
EQUATION 3-1:
where:
1
R
INTCINT
V
REF
T
INT
T
DEINT
T
INT
VIN(T)DT =
0
= Reference voltage = Signal integration time (fixed) = Reference voltage integration time
(variable).
V
REFTDEINT
R
INTCINT
FIGURE 3-1: BASIC DUAL SLOPE
CONVERTER
Analog Input
Signal
REF
Voltage
Output
Integrator
Fixed
Signal
Integrate
Time
Integrator
-
+
Switch
Drive
Polarity Control
Display
Variable Reference Integrate Time
Phase Control
V
IN
V
IN
V
REF
1/2 V
Comparator
-
+
Control
Logic
REF
Clock
Counter
3.2 TC835 Operational Theory
The TC835 incorporates a system zero phase and integrator output voltage zero phase to the normal two phase dual slope measurement cycle. Reduced sys­tem errors, fewer calibration steps and a shorter over­range recovery time result.
The TC835 measurement cycle contains four phases:
1. System zero
2. Analog input signal integration
3. Referencevoltage integration
4. Integrator output zero Internal analog gate status for each phase is shown in
Table 3-1.
For a constant VIN:
EQUATION 3-2:
VIN=
V
REFTDEINT
t
INT
3.2.1 SYSTEM ZERO
During this phase, errors due to buffer, integrator and comparator offset voltages are compensated for by charging C ing error voltage. With a zero input voltage the
(auto zero capacitor) with a compensat-
AZ
integrator output wi ll remain at zero.
The dual slope converter accuracy is unrelated to the integrating resistor and capacitor values, as long as they are stable during a measurement cycle. An inherent benefit is noise immunity. Noise spikes are integrated, or averaged, to zero during the integration periods. Integrating ADCs are immune to the large conversion errors that plague successive approxima­tion converters in high noise environments (see Figure3-1).
2002 Microchip TechnologyInc. DS21478B-page 7
The externalinputsignal is disconnectedfromtheinter­nal circuitry by opening the two SW
switches. The
I
internal input points connect to ANALOG COMMON. The reference capacitor charges to the reference voltage potential through SW
. A feedback loop,
R
closed around the integrator and comparator, charges the C
capacitor with a voltage to compensate for
AZ
buffer amplifier, integrator and comparator offset voltages (see Figure 3-2).
TC835
A
FIGURE 3-2: SYSTEM Z ERO PHASE
Analog
SWRI+
C
REF
Input Buffer
SW
1
+
-
SWIZSW
SW
Z
C
R
INT
INT
C
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open Switch Closed
To Digital Section
+IN
REF
Analog Common
SW
I
SWRI-
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
3.2.2 ANALOG INP UT SIGNAL INTEGRATION
The TC835 integrates the differential voltage between the +INPUT and -INPUT pins. The differential voltage mustbewithinthedeviceCommonmoderange(-1V fromeithersupplyrail,typically). Theinputsignalpolarity is determined at the end of this phase (see Figure 3-3).
FIGURE 3-3: INPUT SIGNAL
INTEGRATION PHASE
Analog
+IN
REF
nalog
Common
SW
I
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
Input Buffer
+
SW
-
+SWRI-
RI
SW
SW
C
REF
IZ
SW
Z
SW
1
C
R
INT
INT
C
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open Switch Closed
To Digital Section
3.2.3 REFERENCE VOLTAGE INTEGRATION
FIGURE 3-4: REFERENCE VOLTAGE
INTEGRATION CYCLE
Analog
SWRI+
-
C
REF
+SWRI-
SW
1
Input Buffer
+
-
SW
IZ
SW
Z
C
R
INT
INT
C
SW
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open Switch Closed
To Digital Section
+IN
REF
Analog Common
SW
I
SW
RI
SW
R
IN
SW
Z
SW
RI
SW
I
IN
3.2.4 INTEGRATOR OUTPUT ZERO
This phase guarantees the integrator output is at 0V when the system zero phase is entered and that the true system offset voltages are compensated for. This phase normally lasts 100 to 200 clock cycles. If an overrange condition exists, the phase is extended to 6200 clock cycles ( see Figure 3-5).
FIGURE 3-5: INTEGRATOR OU TPUT
ZERO PHASE
Analog
Input Buffer
SWRI+SWRI-
C
REF
SW
1
SW
R
+
-
SW
INTCINT
C
SW
IZ
Z
SZ
Z
-
+
Integrator
Switch Open Switch Closed
Comparator
+
-
To Digital Section
+
REF
Analog Common
SW
I
IN
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
The previously charged reference capacitor is con­nected with the proper polarity to ramp the integrator outputbacktozero(see Figure 3-4). The digitalreading displayed is:
Reading = 10,000
[Differential Input]
V
REF
TABLE 3-1: INTERNAL ANALOG GATE STATUS
Conversion Cycle Phase SWISWRI+SWRI-SWZSW
System Zero Closed Closed Closed Figure3-2 InputSignal Integration Closed Figure 3-3 Reference Voltage Integration Closed* Closed Figure3-4 Integrator OutputZero Closed Closed Figure3-5
*Note: Assumes a positive polarity input signal. SW
DS21478B-page 8
would be closed for a negative input signal.
RI
SW
R
SW
1
2002 Microchip TechnologyInc.
Reference Figures
IZ
TC835
4.0 ANALOG SECTION FUNCTIONAL DESCRIPTION
(In Reference to the 28-Pin Plastic Package)
4.1 Differential Inputs (+INPUT (Pin 10) and –INPUT (Pin 9))
The TC835 operates with differential voltages within the input amplifier Common mode range. The input amplifier Common mode range extends from 0.5V below the positive supply to 1V above the negative supply. Within this Common mode voltage range, an 86dB Common mode rejection ratio is typical.
The integrator output also follows the Common mode voltage. The integrator output must not be allowed to saturate. An example of a worst case condition would be when a large positiveCommon mode voltagewith a near full scale negative differential input voltage is applied. The negative input signal drives the integrator positive when most of its swing has been used up by the positive Common mode voltage. For these critical applications, the integrator swing can be reduced to less than the recommended 4V full scale swing, with the effect of reduced accuracy. The integrator output can swing within 0.3V of either supply without loss of linearity.
4.3 Reference Voltage Input (REF IN (Pin 2))
The REF IN input must be a positive voltage with respect to ANALOG COMMON. A reference voltage circuit is shown in Figure 4-1.
FIGURE 4-1: USING AN EXTERNAL
REFERENCE
V+
V+
TC835
REF
IN
ANALOG
COMMON
10k
10k
MCP1525
2.5 V
REF
1µF
Analog Ground
4.2 Analog Common Input (Pin 3)
ANALOG COMMON is us ed as the -INPUT return dur­ing auto zero and de-integrate. If -INPUT is different from ANALOG COMMON, a Common mode voltage exists in the system. This signal is rejected by the excellent CMRR of the converter.In most applications,
-INPUT will be set at a fixed, known voltage (power supply common, for instance). In this application, ANALOG COMMON should be tied to the same point, thus removing the common-mode voltage from the converter. The reference voltage is referenced to ANALOG COMMON.
2002 Microchip TechnologyInc. DS21478B-page 9
TC835
5.0 DIGITAL SECTION FUNCTIONAL DESCRIPTION
The major digital subsystems within the TC835 are illustrated in Figure 5-1, with timing relationships shown in Figure 5-2. The multiplexed BCD output data can be displayed on LCD or LED. The digital section is best described through a discussion of the control sig­nals and data outputs.
FIGURE 5-1: DIGITAL SE CTION FUNCTIONAL DIAGRAM
Polarity
From
Analog
Section
Polarity
FF
Zero Cross Detect
24 22 25 27 28 26 21
DGND ClockInRUN/
D5 D4 D3 D2 D1
MSB Digit Drive Signal LSB
Multiplexer
Latch Latch Latch Latch Latch
Counters
Control Logic
HOLD
Overrange STROBE BusyUnderrange
Data
Output
13 B1 14 B2
15 B4 16 B8
DS21478B-page 10
2002 Microchip TechnologyInc.
TC835
FIGURE 5-2: TIMING DIAGRAMS FO R
OUTPUTS
Integrator
Output
Busy
Overrange when
Applicable
Underrange when
Applicable
Digit Scan
STROBE
Digit Scan
for Overrange
Signal
Integrate
System
10,000
Zero
Counts
10,001
(Fixed)
Counts
Full Measurement Cycle
40,002 Counts
Expanded Scale Below
100
Counts
Auto Zero
*
D5
D4
D3
D2
D1
Reference
Integrate
20,001
Counts (Max)
D5
D4
D3 D2
D1
First D5 of System Zero and
*
Reference Integrate One Count Longer
*
Reference Integrate
Signal
Integrate
5.1 RUN/HOLD Input (Pin 25)
When left open, this pin assumes a logic "1" level.With a RUN/HOLD continuously,withanew measurement cycle beginning every 40,002 clock pulses.
When RUN/HOLD ment cyclein progresswillbecompleted,anddataheld and displayed as long as the logic "0" condition exists.
A positive pulse (>300nsec) at RUN/HOLD new measurement cycle. The measurement cycle in progress when RUN/HOLD "0" state must be completed before t he positive pulse can be recognized as a single conversion run command.
The new measurement cycle begins with a 10,001­count auto zero phase. At the end of this phase, the busy signal goes high.
= 1, the TC835 performs conversions
changestoa logic "0," the measure-
initiates a
initially assumed the logic
5.2 STROBE Output (Pin 26)
During the measurement cycle, the STROBE control line is pulsed low five times. The five low pulses occur in the center of the digit drive signals (D
1,D2,D3,D5
(see Figure 5-3). D
(MSD) goes high for 201 counts when the measure-
5
ment cycles end. In the center of the D
pulse, 101
5
clock pulses after the end of the measurement cycle, the first STROBE the D
digit strobe, D4goes high for 200 clock pulses.
5
The STROBE high. This continues through the D
occurs for one-half clock pulse. After
goes low 100 clock pulses after D4goes
digit drive pulse.
1
The digit drive signals will continue to permit display scanning.STROBE
pulsesarenotrepeateduntilanew measurement is completed. The digit drive signals will not continue if the previous signal resulted in an overrange condition.
TheactivelowSTROBE
pulses aid BCD data transfer
to UARTs, processors and external latches.
FIGURE 5-3: STROBE SIGNAL L OW
FIVE TIMES PER CONVERSION
TC835 Outputs
Busy
B1–B8
STROBE
D5
D4
D3
D2
D1
*Delay between Busy going Low and First STROBE pulse is dependent on Analog Input.
End of Conversion
*
D5 (MSD)
Data
200
Counts
201
Counts
D4
Data
200
Counts
D3
DataD2Data
200
Counts
200
Counts
D1 (LSD)
DataD5Data
Note Absence of STROBE
Counts
200
Counts
200
5.3 BUSY Output
At the beginning of the signal integration phase, BUSY goes hi gh and remains high until the first clock pulse after the integrator zero crossing. BUSY returns to the logic "0" state after the measurement cycle ends in an overrange condition. The internal display latches are loaded during the first clock pulse after BUSY and are latched at the clock pulse end. The BUSY signal does not go high at the beginningof the measurement cycle, which starts with the auto zero cycle.
)
2002 Microchip TechnologyInc. DS21478B-page 11
TC835
5.4 OVERRANGE Output
If the input signal causes the reference voltageintegra­tion time to exceed 20,000 clock pulses, the OVERRANGE output i s set to a logic "1." The over­range output register is set when BUSY goes l ow, and is reset at the beginning of the next reference integration phase.
5.5 UNDERRANGE Output
If the output count is 9% of full scale or less (-1800 counts), the underrange register bit is set at the end of BUSY. The bit is set low at the next signal integration phase.
5.6 POLARITY Output
A positive input is registered by a logic "1" polarity signal. The POLARITY bit is valid at the beginning of ReferenceIntegrateandremainsvaliduntildetermined during the next conversion.
The POLARITY bit is valid even for a zero reading. Signals less than the converter's LSB will have the sig­nal polarity determined correctly. This is useful in null applications.
5.7 Digit Drive Outputs
Digit drive signals are positive going signals. The scan sequence is D pulseswide,exceptD
Allfive digitsarescannedcontinuously,unless an over­range condition occurs. In an overrange condition, all digit drives are held low from the final STROBE until the beginning of the next reference integrate phase. The scanning sequence is then repeated. This provides a blinking v isual display indication.
to D1. All positive pulses are 200 clock
5
, which is 201 clock pulses wide.
5
pulse
6.0 TYPICAL APPLICATIONS
6.1 Component Value Selection
The integrating resistor is determined by the full-scale input voltage and the output current of the buffer used to charge the integrator capacitor. Both the buffer amplifier and the integrator have a class A output stage, with 100µA of quiescent current. A 20µAdrive current gives negligible linearity errors. Values of 5µA to 40µA gi ve good results. The exact value of an integrating resistor for a 20µA current is easily calcu­lated.
EQUATION 6-1:
Full scale voltage
=
R
INT
6.1.1 INTEGRATING CAPACITOR
The productof integratingresistor and capacitorshould be selected to give the maximum voltage swing that ensures the tolerancebuildupwill not s aturate the inte­grator swing (approximately 0.3V from either supply). For ±5Vsupplies and ANALOG COMMON tied to sup­ply ground, a ±3.5V to ±4Vfull-scaleintegrator swing is adequate. A 0.10µFto0.47µF is recommended. In general, the value of C
EQUATION 6-2:
C
INT
[10,000 x clock period] x I
=
Integrator output voltage swing (10,000) (clock period) (20µA)
=
Integrator output voltage swing
20µA
is given by:
INT
INT
5.8 BCD Data Outputs
The binary coded decimal (BCD) bits B8,B4,B2,B1are positive-true logicsignals. The data bits become active simultaneously with the digit drive signals. In an overrangecondition, all data bitsareata logic "0" state.
DS21478B-page 12
A very importantcharacteristicof the integratingcapac­itor is t hat it has low dielectric absorption to pr event rollover or ratiometric errors. A good test for dielectric absorption would be to use the capacitor with the input tied to the reference. This ratiometric condition should read half scale 0.9999, with any deviationprobablydue to dielectric absorption. Polypropylene capacitors give undetectable errors at reasonable cost. Polystyrene and polycarbonate capacitorsmay also be used in less critical applications.
6.1.2 AUTO ZERO AND REFERENCE CAPACITORS
The size of the auto zero capacitorhas some influence on the noise of the system. A large capacitor reduces the noise. The reference capacitor should be large enough such that stray capacitance to ground from i ts nodes is negligible.
The dielectricabsorption of the reference capacitorand auto zero capacitor are only important at power-on or when the circuit i s recovering from an overload.
2002 Microchip TechnologyInc.
TC835
Smaller or cheaper capacitors can be used if accurate readings are not required for the first few seconds of recovery.
6.1.3 REFERENCE VOLTAGE
he analog input r equired to generate a full scale out-
T
put is V
IN
=2V
REF
.
The stabilityofthereferencevoltageisa major factorin the overall absolute accuracy of the converter. For this reason,itisrecommendedthatahigh-quality reference be used w here high-accuracy absolute measurements are being made.
6.2 Conversion Timing
6.2.1 LINE FREQUENCY REJECTION
A signal integrationperiod at a multipleof the 60Hz line frequency will maximize 60Hz "line noise" rejection. A 200kHz clock frequency will reject 60Hz and 400Hz noise. This corresponds to five readings per second (see Table 6-1 and Table 6-2).
TABLE 6-1: CONVERSION RATE VS.
CLOCK FREQUENCY
Oscillator Frequency
(kHz)
100 2.5 120 3 200 5 300 7.5 400 10 800 20
1200 30
TABLE 6-2: LINE FREQUENCY VS.
CLOCK FREQUENCY
Oscillator Frequency
(kHz)
50.000
53.333
66.667
80.000
83.333
100.000
125.000
133.333
166.667
200.000
250.000
Conversion Rate
(Conv./Sec.)
Line Frequency Rejection
60Hz 50Hz 400Hz
The c onversion rate is easily calculated:
EQUATION 6-3:
Reading 1/sec =
Clock Frequency (Hz)
4000
6.3 Power Supplies and Grounds
6.3.1 POWER SUPPLIES
The TC835 is designed to work from ±5V supplies. For single +5V operation, a TC7660 can provide a –5V supply.
6.3.2 GROUNDING
Systems should use separate digital and analog ground systems to avoid loss of accuracy.
6.4 High-Speed Operation
The maximum conversion rate of most dual-slope A/D converters i s limited by the frequency response of the comparator. The comparator in this circuit follows the integrator ramp with a 3µsec delay, and at a clock fre­quency of 200kHz (5µsec period), half of the first refer­ence integrate clock period is lost in delay. This means that the meter reading will change from 0 to 1 with a 50µVinput, 1 to 2 with 150µV,2to3at250µV, etc. This transition at midpoint is considered desirable by most users, however, if the clock frequency is increased appreciablyabove200kHz,the instrumentwill flash "1" on noise peaks even when the input is shorted.
For many dedicated applicationswheretheinput signal is always of one polarity, the delay of the comparator need not be a limitation. Since t he nonlinearity and noise do not increase substantially with f requency, clock rates of up to ~1MHz may be used. For a fixed clock frequency, the extra count or counts caused by comparator delay will be a constant and can be subtracted out digitally.
The clock frequency may be extended above 200kHz without this error, however, by using a low-value resis­tor in series with t he integrating capacitor. The effectof theresistoristointroduce a small pedestalvoltage onto the integrator output at the beginning of the reference integrate phase. By careful selection of the ratio between this resistor and the integrating resistor (a few tens of ohms in the recommended circuit), the compar­ator delay can be compensated and the maximum clock frequency extended by approximately a factor of
3. At higher frequencies, ringing and second-order breaks will cause significant nonlinearities in the first few counts of the instrument.
The minimum clock frequency is established by leak­age on the auto zero and reference capacitors. With most devices, measurement cycles as long as 10 sec­onds give no measurable leakage error.
2002 Microchip TechnologyInc. DS21478B-page 13
TC835
The clock used should be free from significant phase or frequency jitter. Several suitable low-cost oscillators are shown in Section 6.0, Typical Applications. The multiplexed output means that if the display takes sig­nificant current from the logic supply, the cl ock should have good PSRR.
6.5 Zero Crossing Flip-Flop
The flip flop interrogates the data once every clock pulse after the transients of the previous clock pulse and half-clock pulse have died down. False zero cross­ings caused by clock pulses are not recognized. Of
course, the flip flop delays the true zero crossing by up to one count in every instance.If a correction were not made, the display would always be one count too high.
Therefore, the counter is disabled for one clock pulse at the beginning of the reference integrate (de-inte­grate) phase. This one-count delay compensates for the delay of the zero crossing flip flop and allows the correct number to be latched into the display.Similarly, a one-count delay at the beginning of auto zero gives an overload display of 0000 instead of 0001. No delay occurs during signal integrate, so that t rue ratiometric readings result.
FIGURE 6-1: 4-1/2 DIGIT ADC MULTIPLEXED COMMON ANODE LED DISP LAY
20 19 18 17 12
D1 D2 D3 D4 D5
4
0.33µF
200kHz
+
Analog
Input
100k
100k
1µF
1µF
5
6
22
10
9
3
–5V
INT OUT
AZ IN
BUFF OUT
TC835
F
IN
+INPUT
–INPUT
ANALOG COMMON
REF
V–
IN
21
100k
POL
C
REF
C
REF
MCP1525
1µF
B8 B4
B2 B1
V+
+
11
4.7k
23
7
-
1µF
8
16 15 14 13
V+
Blank MSD On Zero
bc
6
D
2
C
1
B
7
A
7777
X7
9–15
5
RBI
DM7447A
16
+5V
+5V
DS21478B-page 14
2002 Microchip TechnologyInc.
TC835
V
FIGURE 6-2: RC OSCILLATOR CIRCUIT FIGURE 6-3: COMPARATOR CLO CK
CIRCUITS
R
2
C
R
1
F
O
16k
+5V
1k
56k
Gates are 74C04
1. fO= 2C(0.41R
1
+0.7R1)
P
a. If R1=R2=R1,F≅ 0.55/RC b. If R
>> R1,f0.45/R1C
2
c. If R
<< R1,f0.72/R1C
2
,R
0.22µF
R1R
=
P
2
R1+R
2
16k
R2
100k
2
3
+5V
+
LM311
-
4
8
1
R4
2k
7
30k
390pF
2. Examples: a. f = 120kHz, C = 420pF
1=R2
10.9k
R
b. f = 120kHz, C = 420pF, R
R
= 8.93k
1
c. f = 120kHz, C = 220pF, R
= 27.3k
R
1
= 50k
2
=5k
2
R2
100k
C1
0.1µF
2
3
+
LM311
-
1
C2
6
10pF
7
4
R3 50k
FIGURE 6-4: 4-1/2 DIGIT ADC WITH MULTIPLEXED COMMON CATHODE LED DISPLAY
150
+5V
150
10
11
12
13
14
15
16
17
18
MC14513
9
8
7
6
5
4
3
2
1
+5V
MCP1525
SIG
IN
1µF
0.33µF
100
k
+
100
Analog
GND
0.1 µF
k
1µF
100 k
1µF
+5V
SET V
–5V
1
2
3
4
5
6
7
8
9
10
11
12
13 14
= 1V
REF
V-
TC835
REF IN
ANALOG GND
INT OUT
AZ IN BUFF
OUT
+
C
REF
-
C
REF
–INPUT
+INPUT
V+
D5 (MSD)
B1 (LSB) B2
UR
OR
STROBE
RUN/HOLD
DGND
POLARITY
CLK IN
BUSY
(LSD) D1
D2
D3
D4
(MSB) B8
B4
28
27
26
47 k
25
24
23
22
21
20
19
18
17
16 15
V
V
OUT
OUT
+5
F
= 200kHz
OSC
2002 Microchip TechnologyInc. DS21478B-page 15
TC835
z
FIGURE 6-5: TEST CIRCUIT
V
REF
0.47
5V
µF
REF
IN
= 1V
100k
100 k
100 k
0.1µF
SET V
ANALOG GND
Signal Input
+
–5V
1µF
1µF
1
2
3
4
5 6
7 8 9
10 11 12
13
14
TC835
V-
UNDERRANGE
REF IN ANALOG
COMMON
INT OUT
AZ IN BUFF OUT
-
C
REF
C
+
REF
–INPUT
+INPUT V+ D5 (MSD)
B1 (LSB)
B2
OVERRANGE
STROBE
RUN/HOLD
DIGTAL GND
POLARITY
CLOCK IN
BUSY
(LSD) D1
(MSB) B8
D2
D3
D4
B4
28
27
26
25
24
23
Clock
22
Input 120kH
21
20
19
18
17
16
15
DS21478B-page 16
2002 Microchip TechnologyInc.
7.0 PACKAGING INFORMATION
7.1 Package Marking Information
Package marking data not available at this time.
7.2 Taping Forms
Component Taping Orientation for 64-Pin PQFP Devices
User Direction of Feed
Standard Reel Component Orientation for TR Suffix Device
Carrier Tape, Number of Components Per Reel and Reel Size
Package Carrier Width (W) Pitch (P) Part Per Full Reel Reel Size
64-Pin PQFP 32 mm 24 mm 250 13 in
NOTE: Drawing does not represent total number of pins.
TC835
PIN 1
W
P
Component Taping Orientation for 44-Pin PQFP Devices
User Direction of Feed
PIN 1
W
P Standard Reel Component Orientation for TR Suffix Device
Carrier Tape, Number of Components Per Reel and Reel Size
Package Carrier Width (W) Pitch (P) Part Per Full Reel Reel Size
44-Pin PQFP 24 mm 16 mm 500 13 in
NOTE: Drawing does not represent total number of pins.
2002 Microchip TechnologyInc. DS21478B-page 17
TC835
)
7.3 Package Dimensions
28-Pin PDIP (Wide)
.200 (5.08) .140 (3.56)
.150 (3.81) .115 (2.92)
.110 (2.79) .090 (2.29)
44-Pin PQFP
1.465 (37.21)
1.435 (36.45)
.070 (1.78) .045 (1.14)
.022 (0.56) .015 (0.38)
PIN 1
.555 (14.10) .530 (13.46)
.040 (1.02) .020 (0.51)
.015 (0.38) .008 (0.20)
.610 (15.49) .590 (14.99)
.700 (17.78) .610 (15.50)
Dimensions: inches (mm)
7
˚
MAX.
3
˚
MIN.
PIN 1
.018 (0.45) .012 (0.30)
.031 (0.80) TYP.
.398 (10.10)
.390 (9.90)
.557 (14.15) .537 (13.65)
.398 (10.10)
.390 (9.90)
.557 (14.15) .537 (13.65)
.009 (0.23) .005 (0.13)
.096 (2.45) MAX.
.041 (1.03) .026 (0.65)
.010 (0.25) TYP.
.083 (2.10) .075 (1.90)
Dimensions: inches (mm
DS21478B-page 18
2002 Microchip TechnologyInc.
7.3 Package Dimensions (Continued)
)
64-Pin PQFP
˚
MAX.
7
TC835
.018 (0.45) .012 (0.30)
.031 (0.80) TYP.
PIN 1
.555 (14.10) .547 (13.90)
.687 (17.45) .667 (16.95)
.555 (14.10) .547 (13.90)
.687 (17.45) .667 (16.95)
.009 (0.23) .005 (0.13)
.130 (3.30) MAX.
Dimensions: inches (mm
.041 (1.03) .031 (0.78)
.010 (0.25) TYP.
.120 (3.05) .100 (2.55)
2002 Microchip TechnologyInc. DS21478B-page 19
TC835
NOTES:
DS21478B-page 20
2002 Microchip TechnologyInc.
TC835
SALES AND SUPPORT
Data Sheets
Products supportedby a preliminaryData Sheet may have an errata sheet describingminor operationaldifferences and recom­mendedworkarounds.To determine if an erratasheetexists for a particulardevice, please contactone of the following:
1. Your local Microchip sales office
2. The MicrochipCorporate Literature Center U.S. FAX:(480) 792-7277
3. The Microchip Worldwide Site (www.microchip.com) Pleasespecify which device, revision of silicon and Data Sheet (includeLiterature #) you are using.
New Customer Notification System
Register on our web site (www.microchip.com/cn) to receive the most currentinformationon our products.
2002 Microchip Technology Inc. DS21478B-page21
TC835
NOTES:
DS21478B-page 22 2002 Microchip Technology Inc.
TC835
Information contained in this publication regarding device applications and the like is intended through suggestion only and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. No representation or warranty is given and no liability is assumed by Microchip Technology Incorporated with respect to the accuracy or use of such information,or infringement of patents or other intellectual property rights arising from such use or otherwise. Use of Microchip’s products as critical com­ponents in life support systems is not authorized except with express written approval by Microchip. No licenses are con­veyed, implicitly or otherwise, under any intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, FilterLab, K
EELOQ,microID,MPLAB,PIC,PICmicro,PICMASTER,
PICSTART, PRO MATE, SEEVAL and The Embedded Control
SolutionsCompany areregiste red trademarksof MicrochipTech­nologyIncorp or ated in the U.S.A. and other countries .
dsPIC, ECONOMONITOR, FanSense, FlexROM, fuzzyLAB, In-Circuit Serial Programming, ICSP, ICEPIC, microPort, Migratable Memory, MPASM, MPLIB, MPLINK, MPSIM, MXDEV, PICC, PICDEM, PICDEM.net, rfPIC, Select Mode and TotalEndurancearetrademarksofMicrochipTechnology Incorporated in the U.S.A.
Serialized Quick Turn Programming (SQTP) is a service mark of Microchip TechnologyIncorporated in t he U.S.A.
All other trademarks mentioned herein are property of their respective companies.
© 2002, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved.
Printed on recycled paper.
Microchip received QS-9000 quality system certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona in July 1999 and Mountain View, California in March 2002. The Company’s quality system processes and procedures are QS-9000 compliant for its
®
PICmicro devices, Serial EEPROMs, microperipherals, non-volatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systemsisISO 9001certified.
2002 Microchip TechnologyInc. DS21478B-page 23
8-bit MCUs, KEELOQ®code hopping
WORLDWIDE SALES AND SERVICE
AMERICAS
Corporate Office
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Microchip Ltd. 505 Eskdale Road Winnersh Triangle Wokingham Berkshire, EnglandRG41 5TU Tel: 44 118 921 5869 Fax: 44-118 921-5820
04/20/02
DS21478B-page 24
*DS21478B*
2002 Microchip Technology Inc.
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