The TC835 is a low power, 4-1/2 digit (0.005%
resolution), BCD analog to digital converter (ADC) that
has been characterized for 200kHz clock rate operation. The five conversions per second rate is nearly
twice as fast as the I CL7135 or TC7135. The TC835,
like the TC7135, does not use the external diode resistor rollover error compensation circuits required by the
ICL7135.
The multiplexed BCD data output is perfectforinterfacing to personal computers. The low cost, greater than
14-bit high-resolution and 100µV sensitivity makes the
TC835 exceptionally cost-effective.
Microprocessor-based data acquisition systems are
supported by the BUSY and STROBE
with the RUN/HOLD
OVERRANGE, UNDERRANGE, BUSY and RUN/
HOLD control functions, plus multiplexed BCD data
outputs, make the TC835 the ideal converter for µPbased scales, measurement systems and intelligent
panel meters.
The TC835 interfaces with full function LCD and LED
display decoder/drivers. The UNDERRANGE and
OVERRANGE outputs may be used to implement an
auto-ranging scheme or special display functions.
input of the TC835. The
outputs, along
2002 Microchip TechnologyInc.DS21478B-page 1
TC835
D
Package Type
V-
REF IN
ANALOG
COM
INT OUT
AZ IN
BUFF OUT
C
REF
C
REF
–INPUT
+INPUT
V+
(MSD) D5
(LSB) B1
B2
1
2
3
4
5
6
-
7
+
8
9
10
11
12
13
14
28-Pin PDIP
TC835CPI
UNDERRANGE
28
OVERRANGE
27
26
STROBE
RUN/HOLD
25
24
DIGTAL GND
23
POLARITY
22
CLOCK IN
21
BUSY
20
D1 (LSD)
19
D2
18
D3
17
D4
16
B8 (MSD)
15
B4
INT OUT
AZ IN
BUFF OUT
REF CAP–
REF CAP+
–INPUT
+INPUT
64-Pin PQFP
NCNCNC
44 43 42 4139 3840
NC
1
2
3
4
5
6
7
8
V+
9
NC
10
NC
11
12 13 14 1517 18
NC
NC
44-Pin PQFP
ANALOG
REF INV–UR
COMMON
TC835CKW
16
B2
B4
(LSB) B1
(MSD) D5
OR
STROBE
37 36 35 34
19 20 21 22
D4
D3
(MSB) B8
NC
NC
33
NC
32
NC
31
RUN/HOL
30
DGND
29
POLARITY
28
CLK IN
27
BUSY
26
NC
D1 (LSD)
25
D2
24
NC
23
NC
NC
OVERRANGE
UNDERRANGE
ANALOG COM
NOTES:
1. NC = No internal connection.
2. Pins 9, 25, 40 and 56 are connected to the die substrate. The potential at these pins is approximately V+.
No external connections should be made.
*Stresses above those listed under "Absolute Maximum Ratings"maycause permanentdamage to the device.These are
stress ratings only and functional operation of the device at
these or any other conditions above t hose indicated in the
operation sections of the specifications is not implied. Exposure to Absolute Maximum R ating conditions for extended
periodsmay affectdevice reliability.
Display Reading with Zero Volt Input-0.0000 ±0.0000 +0.0000 DisplayReading Note 3, Note 4
ZeroReading TemperatureCoefficient—0.52µV/°CVIN=0V,(Note 5)
TC
Z
Full-Scale Temperature Coefficient——5ppm/°CVIN=2V;
TC
FS
NLNonlinearity Error—0.51CountNote 7
DNLDifferential Linearity Error—0.01—LSBNote 7
Display Reading in Ratiometric Operation+0.9996 +0.9998 +1.0000 Display Reading V
±FSE± Full Scale Symmetry Error (Rollover Error)—0.51Count–V
Input Leakage Current—110pANote 4
I
IN
Noise—15—µV
e
N
Digital
Input Low Current—10100µAV
I
IL
Input High Current—0.0810µAV
I
IH
Output Low Voltage—0.20.4VIOL=1.6mA
V
OL
Output High Voltage;
V
OH
f
CLK
Note 1: Functional operation is not implied.
2: Limit input current to under 100 µA if input voltages exceed supply voltage.
3: Full scale voltage = 2V.
4: V
5: 0°C ≤ T
6: Externalreference temperature coefficient less than 0.01ppm/°C.
7: -2V ≤ V
8: |V
9: Test circuit shown in Figure 1-1.
10: Specification relatedtoclock frequency range over which the TC835 correctly performs its various functions.Increased
B
1,B2,B4,B8,D1–D5
Busy, Polarity,Overrange,
Underrange, Strobe
ClockFrequency02001200kHzNote 10
=0V.
IN
≤ +70°C.
A
≤ +2V. Error of readingfrom best fit straightline.
2: Limit input current to under 100 µA if input voltages exceed supply voltage.
3: Full scale voltage = 2V.
4: V
=0V.
IN
5: 0°C ≤ T
6: Externalreference temperature coefficient less than 0.01ppm/°C.
7: -2V ≤ V
8: |V
9: Test circuit shown in Figure 1-1.
10: Specification relatedtoclock frequency range over which the TC835 correctly performs its various functions.Increased
errors result at higher operating frequencies.
≤ +70°C.
A
≤ +2V. Error of readingfrom best fit straightline.
The descriptions of the pins are listed in Table 2-1.
TABLE 2-1:PIN FUNCTION TABLE
Pin Number
28-Pin PDIP
1V-Negative powersupply input.
2REF INExternal reference input.
3ANALOG COMMONReference point for REF IN.
4INT OUTIntegrator output. Integrator capacitor connection.
5AZ INAuto zero input. Auto zero capacitor connection.
6BUFF OUTAnalog input buffer output. Integrator resistor connection.
7C
8C
9-INPUTAnalog input. Analoginputnegative connection.
10+INPUTAnalog input. Analog input positive connection.
11V+Positive power supplyinput.
12D5Digit drive output.Most Significant Digit(MSD)
13B1Binary CodedDecimal (BCD) output.LeastSignificantBit(LSB)
14B2BCD output.
15B4BCD output.
16B8BCD output. Most Significant Bit (MSB)
17D4Digit drive output.
18D3Digit drive output.
19D2Digit drive output.
20D1Digit drive output. Least Significant Digit (LSD)
21BUSYBusy output.At the beginning of the signal-integration phase,BUSYgoesHighand
22CLOCK INClock input. Conversion clock connection.
23POLARITYPolarity output.A positive input is indicatedby a logic High output.The polarity output is
24DGNDDigitallogic referenceinput.
25RUN/HOLD
26STROBE
27OVERRANGEOver range output. A logic High indicates that the analog input exceeds the full scale input
28UNDERRANGEUnderrangeoutput. A logic High indicatesthatthe analog input is less than 9% of the full
remainsHighuntilthefirstclockpulseafter the integratorzerocrossing.
valid at the beginning of the reference integratephaseandremains valid until determined
duringthenext conversion.
Run / Hold input. When at a logic High,conversions are performed continuously. A logic
Low holds the current data as long as the Low condition exists.
Strobe output. The STROBE output pulses low in the center of the digit drive outputs.
range.
scaleinputrange.
DS21478B-page 6
2002 Microchip TechnologyInc.
TC835
3.0DETAILED DESCRIPTION
(All Pin Designations Refer to 28-Pin DIP)
3.1Dual Slope Conversion Principles
The TC835 is a dual slope, integrating analog to digital
converter. An understanding of the dual slope conversion technique will aid in following the detailed TC835
operational theory.
The conventional dual slope converter measurement
cycle has two distinct phases:
timeperiod,witht ime beingmeasuredby countingclock
pulses.An opposite polarity constantreference voltage
is then integrated until the integrator output voltage
returnstozero.Thereference integrationtimeisdirectly
proportional to the input signal.
In a simple dual slope converter, a complete
conversion requires the integrator output to "ramp-up"
and "ramp-down."
A simple mathematical equation relates the input signal, reference voltage and integration time:
EQUATION 3-1:
where:
1
R
INTCINT
V
REF
T
INT
T
DEINT
T
INT
VIN(T)DT =
∫
0
= Reference voltage
= Signal integration time (fixed)
= Reference voltage integration time
(variable).
V
REFTDEINT
R
INTCINT
FIGURE 3-1:BASIC DUAL SLOPE
CONVERTER
Analog Input
Signal
REF
Voltage
Output
Integrator
Fixed
Signal
Integrate
Time
Integrator
-
+
Switch
Drive
Polarity Control
Display
Variable
Reference
Integrate
Time
Phase
Control
V
IN
V
IN
≈ V
REF
≈ 1/2 V
Comparator
-
+
Control
Logic
REF
Clock
Counter
3.2TC835 Operational Theory
The TC835 incorporates a system zero phase and
integrator output voltage zero phase to the normal two
phase dual slope measurement cycle. Reduced system errors, fewer calibration steps and a shorter overrange recovery time result.
The TC835 measurement cycle contains four phases:
1.System zero
2.Analog input signal integration
3.Referencevoltage integration
4.Integrator output zero
Internal analog gate status for each phase is shown in
Table 3-1.
For a constant VIN:
EQUATION 3-2:
VIN=
V
REFTDEINT
t
INT
3.2.1SYSTEM ZERO
During this phase, errors due to buffer, integrator and
comparator offset voltages are compensated for by
charging C
ing error voltage. With a zero input voltage the
(auto zero capacitor) with a compensat-
AZ
integrator output wi ll remain at zero.
The dual slope converter accuracy is unrelated to the
integrating resistor and capacitor values, as long as
they are stable during a measurement cycle. An
inherent benefit is noise immunity. Noise spikes are
integrated, or averaged, to zero during the integration
periods. Integrating ADCs are immune to the large
conversion errors that plague successive approximation converters in high noise environments (see
Figure3-1).
2002 Microchip TechnologyInc.DS21478B-page 7
The externalinputsignal is disconnectedfromtheinternal circuitry by opening the two SW
switches. The
I
internal input points connect to ANALOG COMMON.
The reference capacitor charges to the reference
voltage potential through SW
. A feedback loop,
R
closed around the integrator and comparator, charges
the C
capacitor with a voltage to compensate for
AZ
buffer amplifier, integrator and comparator offset
voltages (see Figure 3-2).
TC835
A
FIGURE 3-2:SYSTEM Z ERO PHASE
Analog
SWRI+
C
REF
Input Buffer
SW
1
+
-
SWIZSW
SW
Z
C
R
INT
INT
C
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open
Switch Closed
To Digital
Section
+IN
REF
Analog
Common
–
SW
I
SWRI-
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
3.2.2ANALOG INP UT SIGNAL
INTEGRATION
The TC835 integrates the differential voltage between
the +INPUT and -INPUT pins. The differential voltage
mustbewithinthedeviceCommonmoderange(-1V
fromeithersupplyrail,typically). Theinputsignalpolarity
is determined at the end of this phase (see Figure 3-3).
FIGURE 3-3:INPUT SIGNAL
INTEGRATION PHASE
Analog
+IN
REF
nalog
Common
–
SW
I
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
Input Buffer
+
SW
-
+SWRI-
RI
SW
SW
C
REF
IZ
SW
Z
SW
1
C
R
INT
INT
C
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open
Switch Closed
To
Digital
Section
3.2.3REFERENCE VOLTAGE
INTEGRATION
FIGURE 3-4:REFERENCE VOLTAGE
INTEGRATION CYCLE
Analog
SWRI+
-
C
REF
+SWRI-
SW
1
Input Buffer
+
-
SW
IZ
SW
Z
C
R
INT
INT
C
SW
SZ
Z
-
Comparator
+
+
-
Integrator
Switch Open
Switch Closed
To Digital
Section
+IN
REF
Analog
Common
–
SW
I
SW
RI
SW
R
IN
SW
Z
SW
RI
SW
I
IN
3.2.4INTEGRATOR OUTPUT ZERO
This phase guarantees the integrator output is at 0V
when the system zero phase is entered and that the
true system offset voltages are compensated for. This
phase normally lasts 100 to 200 clock cycles. If an
overrange condition exists, the phase is extended to
6200 clock cycles ( see Figure 3-5).
FIGURE 3-5:INTEGRATOR OU TPUT
ZERO PHASE
Analog
Input Buffer
SWRI+SWRI-
C
REF
SW
1
SW
R
+
-
SW
INTCINT
C
SW
IZ
Z
SZ
Z
-
+
Integrator
Switch Open
Switch Closed
Comparator
+
-
To Digital
Section
+
REF
Analog
Common
–
SW
I
IN
SW
R
IN
SW
Z
SWRI+SWRI-
SW
I
IN
The previously charged reference capacitor is connected with the proper polarity to ramp the integrator
outputbacktozero(see Figure 3-4). The digitalreading
displayed is:
Reading = 10,000
[Differential Input]
V
REF
TABLE 3-1:INTERNAL ANALOG GATE STATUS
Conversion Cycle PhaseSWISWRI+SWRI-SWZSW
System ZeroClosedClosedClosedFigure3-2
InputSignal IntegrationClosedFigure 3-3
Reference Voltage IntegrationClosed*ClosedFigure3-4
Integrator OutputZeroClosedClosedFigure3-5
*Note:Assumes a positive polarity input signal. SW
DS21478B-page 8
would be closed for a negative input signal.
RI
SW
R
SW
1
2002 Microchip TechnologyInc.
Reference Figures
IZ
TC835
4.0ANALOG SECTION
FUNCTIONAL DESCRIPTION
(In Reference to the 28-Pin Plastic Package)
4.1Differential Inputs
(+INPUT (Pin 10) and
–INPUT (Pin 9))
The TC835 operates with differential voltages within
the input amplifier Common mode range. The input
amplifier Common mode range extends from 0.5V
below the positive supply to 1V above the negative
supply. Within this Common mode voltage range, an
86dB Common mode rejection ratio is typical.
The integrator output also follows the Common mode
voltage. The integrator output must not be allowed to
saturate. An example of a worst case condition would
be when a large positiveCommon mode voltagewith a
near full scale negative differential input voltage is
applied. The negative input signal drives the integrator
positive when most of its swing has been used up by
the positive Common mode voltage. For these critical
applications, the integrator swing can be reduced to
less than the recommended 4V full scale swing, with
the effect of reduced accuracy. The integrator output
can swing within 0.3V of either supply without loss of
linearity.
4.3Reference Voltage Input
(REF IN (Pin 2))
The REF IN input must be a positive voltage with
respect to ANALOG COMMON. A reference voltage
circuit is shown in Figure 4-1.
FIGURE 4-1:USING AN EXTERNAL
REFERENCE
V+
V+
TC835
REF
IN
ANALOG
COMMON
10k
10k
MCP1525
2.5 V
REF
1µF
Analog Ground
4.2Analog Common Input (Pin 3)
ANALOG COMMON is us ed as the -INPUT return during auto zero and de-integrate. If -INPUT is different
from ANALOG COMMON, a Common mode voltage
exists in the system. This signal is rejected by the
excellent CMRR of the converter.In most applications,
-INPUT will be set at a fixed, known voltage (power
supply common, for instance). In this application,
ANALOG COMMON should be tied to the same point,
thus removing the common-mode voltage from the
converter. The reference voltage is referenced to
ANALOG COMMON.
2002 Microchip TechnologyInc.DS21478B-page 9
TC835
5.0DIGITAL SECTION
FUNCTIONAL DESCRIPTION
The major digital subsystems within the TC835 are
illustrated in Figure 5-1, with timing relationships
shown in Figure 5-2. The multiplexed BCD output data
can be displayed on LCD or LED. The digital section is
best described through a discussion of the control signals and data outputs.
FIGURE 5-1:DIGITAL SE CTION FUNCTIONAL DIAGRAM
Polarity
From
Analog
Section
Polarity
FF
Zero
Cross
Detect
24222527282621
DGNDClockInRUN/
D5D4D3D2D1
MSBDigitDriveSignalLSB
Multiplexer
LatchLatchLatchLatchLatch
Counters
Control Logic
HOLD
OverrangeSTROBEBusyUnderrange
Data
Output
13 B1
14 B2
15 B4
16 B8
DS21478B-page 10
2002 Microchip TechnologyInc.
TC835
FIGURE 5-2:TIMING DIAGRAMS FO R
OUTPUTS
Integrator
Output
Busy
Overrange when
Applicable
Underrange when
Applicable
Digit Scan
STROBE
Digit Scan
for Overrange
Signal
Integrate
System
10,000
Zero
Counts
10,001
(Fixed)
Counts
Full Measurement Cycle
40,002 Counts
Expanded Scale Below
100
Counts
Auto Zero
*
D5
D4
D3
D2
D1
Reference
Integrate
20,001
Counts (Max)
D5
D4
D3
D2
D1
First D5 of System Zero and
*
Reference Integrate One Count
Longer
*
Reference
Integrate
Signal
Integrate
5.1RUN/HOLD Input (Pin 25)
When left open, this pin assumes a logic "1" level.With
a RUN/HOLD
continuously,withanew measurement cycle beginning
every 40,002 clock pulses.
When RUN/HOLD
ment cyclein progresswillbecompleted,anddataheld
and displayed as long as the logic "0" condition exists.
A positive pulse (>300nsec) at RUN/HOLD
new measurement cycle. The measurement cycle in
progress when RUN/HOLD
"0" state must be completed before t he positive pulse
can be recognized as a single conversion run
command.
The new measurement cycle begins with a 10,001count auto zero phase. At the end of this phase, the
busy signal goes high.
= 1, the TC835 performs conversions
changestoa logic "0," the measure-
initiates a
initially assumed the logic
5.2STROBE Output (Pin 26)
During the measurement cycle, the STROBE control
line is pulsed low five times. The five low pulses occur
in the center of the digit drive signals (D
1,D2,D3,D5
(see Figure 5-3).
D
(MSD) goes high for 201 counts when the measure-
5
ment cycles end. In the center of the D
pulse, 101
5
clock pulses after the end of the measurement cycle,
the first STROBE
the D
digit strobe, D4goes high for 200 clock pulses.
5
The STROBE
high. This continues through the D
occurs for one-half clock pulse. After
goes low 100 clock pulses after D4goes
digit drive pulse.
1
The digit drive signals will continue to permit display
scanning.STROBE
pulsesarenotrepeateduntilanew
measurement is completed. The digit drive signals will
not continue if the previous signal resulted in an
overrange condition.
TheactivelowSTROBE
pulses aid BCD data transfer
to UARTs, processors and external latches.
FIGURE 5-3:STROBE SIGNAL L OW
FIVE TIMES PER
CONVERSION
TC835
Outputs
Busy
B1–B8
STROBE
D5
D4
D3
D2
D1
*Delay between Busy going Low and First STROBE pulse is
dependent on Analog Input.
End of Conversion
*
D5 (MSD)
Data
200
Counts
201
Counts
D4
Data
200
Counts
D3
DataD2Data
200
Counts
200
Counts
D1 (LSD)
DataD5Data
Note Absence of
STROBE
Counts
200
Counts
200
5.3BUSY Output
At the beginning of the signal integration phase, BUSY
goes hi gh and remains high until the first clock pulse
after the integrator zero crossing. BUSY returns to the
logic "0" state after the measurement cycle ends in an
overrange condition. The internal display latches are
loaded during the first clock pulse after BUSY and are
latched at the clock pulse end. The BUSY signal does
not go high at the beginningof the measurement cycle,
which starts with the auto zero cycle.
)
2002 Microchip TechnologyInc.DS21478B-page 11
TC835
5.4OVERRANGE Output
If the input signal causes the reference voltageintegration time to exceed 20,000 clock pulses, the
OVERRANGE output i s set to a logic "1." The overrange output register is set when BUSY goes l ow, and
is reset at the beginning of the next reference
integration phase.
5.5UNDERRANGE Output
If the output count is 9% of full scale or less (-1800
counts), the underrange register bit is set at the end of
BUSY. The bit is set low at the next signal integration
phase.
5.6POLARITY Output
A positive input is registered by a logic "1" polarity
signal. The POLARITY bit is valid at the beginning of
ReferenceIntegrateandremainsvaliduntildetermined
during the next conversion.
The POLARITY bit is valid even for a zero reading.
Signals less than the converter's LSB will have the signal polarity determined correctly. This is useful in null
applications.
5.7Digit Drive Outputs
Digit drive signals are positive going signals. The scan
sequence is D
pulseswide,exceptD
Allfive digitsarescannedcontinuously,unless an overrange condition occurs. In an overrange condition, all
digit drives are held low from the final STROBE
until the beginning of the next reference integrate
phase. The scanning sequence is then repeated. This
provides a blinking v isual display indication.
to D1. All positive pulses are 200 clock
5
, which is 201 clock pulses wide.
5
pulse
6.0TYPICAL APPLICATIONS
6.1Component Value Selection
The integrating resistor is determined by the full-scale
input voltage and the output current of the buffer used
to charge the integrator capacitor. Both the buffer
amplifier and the integrator have a class A output
stage, with 100µA of quiescent current. A 20µAdrive
current gives negligible linearity errors. Values of 5µA
to 40µA gi ve good results. The exact value of an
integrating resistor for a 20µA current is easily calculated.
EQUATION 6-1:
Full scale voltage
=
R
INT
6.1.1INTEGRATING CAPACITOR
The productof integratingresistor and capacitorshould
be selected to give the maximum voltage swing that
ensures the tolerancebuildupwill not s aturate the integrator swing (approximately 0.3V from either supply).
For ±5Vsupplies and ANALOG COMMON tied to supply ground, a ±3.5V to ±4Vfull-scaleintegrator swing is
adequate. A 0.10µFto0.47µF is recommended. In
general, the value of C
EQUATION 6-2:
C
INT
[10,000 x clock period] x I
=
Integrator output voltage swing
(10,000) (clock period) (20µA)
=
Integrator output voltage swing
20µA
is given by:
INT
INT
5.8BCD Data Outputs
The binary coded decimal (BCD) bits B8,B4,B2,B1are
positive-true logicsignals. The data bits become active
simultaneously with the digit drive signals. In an
overrangecondition, all data bitsareata logic "0" state.
DS21478B-page 12
A very importantcharacteristicof the integratingcapacitor is t hat it has low dielectric absorption to pr event
rollover or ratiometric errors. A good test for dielectric
absorption would be to use the capacitor with the input
tied to the reference. This ratiometric condition should
read half scale 0.9999, with any deviationprobablydue
to dielectric absorption. Polypropylene capacitors give
undetectable errors at reasonable cost. Polystyrene
and polycarbonate capacitorsmay also be used in less
critical applications.
6.1.2AUTO ZERO AND REFERENCE
CAPACITORS
The size of the auto zero capacitorhas some influence
on the noise of the system. A large capacitor reduces
the noise. The reference capacitor should be large
enough such that stray capacitance to ground from i ts
nodes is negligible.
The dielectricabsorption of the reference capacitorand
auto zero capacitor are only important at power-on or
when the circuit i s recovering from an overload.
2002 Microchip TechnologyInc.
TC835
Smaller or cheaper capacitors can be used if accurate
readings are not required for the first few seconds of
recovery.
6.1.3REFERENCE VOLTAGE
he analog input r equired to generate a full scale out-
T
put is V
IN
=2V
REF
.
The stabilityofthereferencevoltageisa major factorin
the overall absolute accuracy of the converter. For this
reason,itisrecommendedthatahigh-quality reference
be used w here high-accuracy absolute measurements
are being made.
6.2Conversion Timing
6.2.1LINE FREQUENCY REJECTION
A signal integrationperiod at a multipleof the 60Hz line
frequency will maximize 60Hz "line noise" rejection. A
200kHz clock frequency will reject 60Hz and 400Hz
noise. This corresponds to five readings per second
(see Table 6-1 and Table 6-2).
TABLE 6-1:CONVERSION RATE VS.
CLOCK FREQUENCY
Oscillator Frequency
(kHz)
1002.5
1203
2005
3007.5
40010
80020
120030
TABLE 6-2:LINE FREQUENCY VS.
CLOCK FREQUENCY
Oscillator Frequency
(kHz)
50.000•••
53.333——•
66.667•—•
80.000——•
83.333—••
100.000•••
125.000—••
133.333——•
166.667——•
200.000•—•
250.000
Conversion Rate
(Conv./Sec.)
Line Frequency Rejection
60Hz50Hz400Hz
The c onversion rate is easily calculated:
EQUATION 6-3:
Reading 1/sec =
Clock Frequency (Hz)
4000
6.3Power Supplies and Grounds
6.3.1POWER SUPPLIES
The TC835 is designed to work from ±5V supplies. For
single +5V operation, a TC7660 can provide a
–5V supply.
6.3.2GROUNDING
Systems should use separate digital and analog
ground systems to avoid loss of accuracy.
6.4High-Speed Operation
The maximum conversion rate of most dual-slope A/D
converters i s limited by the frequency response of the
comparator. The comparator in this circuit follows the
integrator ramp with a 3µsec delay, and at a clock frequency of 200kHz (5µsec period), half of the first reference integrate clock period is lost in delay. This means
that the meter reading will change from 0 to 1 with a
50µVinput, 1 to 2 with 150µV,2to3at250µV, etc. This
transition at midpoint is considered desirable by most
users, however, if the clock frequency is increased
appreciablyabove200kHz,the instrumentwill flash "1"
on noise peaks even when the input is shorted.
For many dedicated applicationswheretheinput signal
is always of one polarity, the delay of the comparator
need not be a limitation. Since t he nonlinearity and
noise do not increase substantially with f requency,
clock rates of up to ~1MHz may be used. For a fixed
clock frequency, the extra count or counts caused by
comparator delay will be a constant and can be
subtracted out digitally.
The clock frequency may be extended above 200kHz
without this error, however, by using a low-value resistor in series with t he integrating capacitor. The effectof
theresistoristointroduce a small pedestalvoltage onto
the integrator output at the beginning of the reference
integrate phase. By careful selection of the ratio
between this resistor and the integrating resistor (a few
tens of ohms in the recommended circuit), the comparator delay can be compensated and the maximum
clock frequency extended by approximately a factor of
3. At higher frequencies, ringing and second-order
breaks will cause significant nonlinearities in the first
few counts of the instrument.
The minimum clock frequency is established by leakage on the auto zero and reference capacitors. With
most devices, measurement cycles as long as 10 seconds give no measurable leakage error.
2002 Microchip TechnologyInc.DS21478B-page 13
TC835
The clock used should be free from significant phase or
frequency jitter. Several suitable low-cost oscillators
are shown in Section 6.0, Typical Applications. The
multiplexed output means that if the display takes significant current from the logic supply, the cl ock should
have good PSRR.
6.5Zero Crossing Flip-Flop
The flip flop interrogates the data once every clock
pulse after the transients of the previous clock pulse
and half-clock pulse have died down. False zero crossings caused by clock pulses are not recognized. Of
course, the flip flop delays the true zero crossing by up
to one count in every instance.If a correction were not
made, the display would always be one count too high.
Therefore, the counter is disabled for one clock pulse
at the beginning of the reference integrate (de-integrate) phase. This one-count delay compensates for
the delay of the zero crossing flip flop and allows the
correct number to be latched into the display.Similarly,
a one-count delay at the beginning of auto zero gives
an overload display of 0000 instead of 0001. No delay
occurs during signal integrate, so that t rue ratiometric
readings result.
FIGURE 6-1:4-1/2 DIGIT ADC MULTIPLEXED COMMON ANODE LED DISP LAY
20 19 18 17 12
D1 D2 D3 D4 D5
4
0.33µF
200kHz
+
Analog
Input
–
100kΩ
100kΩ
1µF
1µF
5
6
22
10
9
3
–5V
INT OUT
AZ IN
BUFF
OUT
TC835
F
IN
+INPUT
–INPUT
ANALOG
COMMON
REF
V–
IN
21
100kΩ
POL
C
REF
C
REF
MCP1525
1µF
B8
B4
B2
B1
V+
+
11
4.7kΩ
23
7
-
1µF
8
16
15
14
13
V+
Blank MSD On Zero
bc
6
D
2
C
1
B
7
A
7777
X7
9–15
5
RBI
DM7447A
16
+5V
+5V
DS21478B-page 14
2002 Microchip TechnologyInc.
TC835
V
FIGURE 6-2:RC OSCILLATOR CIRCUITFIGURE 6-3:COMPARATOR CLO CK
CIRCUITS
R
2
C
R
1
F
O
16kΩ
+5V
1kΩ
56kΩ
Gates are 74C04
1. fO=
2C(0.41R
1
+0.7R1)
P
a. If R1=R2=R1,F≅ 0.55/RC
b. If R
>> R1,f≅ 0.45/R1C
2
c. If R
<< R1,f≅ 0.72/R1C
2
,R
0.22µF
R1R
=
P
2
R1+R
2
16kΩ
R2
100kΩ
2
3
+5V
+
LM311
-
4
8
1
R4
2kΩ
7
30kΩ
390pF
2. Examples:
a. f = 120kHz, C = 420pF
1=R2
≈ 10.9kΩ
R
b. f = 120kHz, C = 420pF, R
R
= 8.93k Ω
1
c. f = 120kHz, C = 220pF, R
= 27.3kΩ
R
1
= 50kΩ
2
=5kΩ
2
R2
100kΩ
C1
0.1µF
2
3
+
LM311
-
1
C2
6
10pF
7
4
R3
50kΩ
FIGURE 6-4:4-1/2 DIGIT ADC WITH MULTIPLEXED COMMON CATHODE LED DISPLAY
150Ω
+5V
150Ω
10
11
12
13
14
15
16
17
18
MC14513
9
8
7
6
5
4
3
2
1
+5V
MCP1525
SIG
IN
1µF
0.33µF
100
kΩ
+
–
100
Analog
GND
0.1
µF
kΩ
1µF
100 kΩ
1µF
+5V
SET V
–5V
1
2
3
4
5
6
7
8
9
10
11
12
13
14
= 1V
REF
V-
TC835
REF IN
ANALOG
GND
INT
OUT
AZ IN
BUFF
OUT
+
C
REF
-
C
REF
–INPUT
+INPUT
V+
D5 (MSD)
B1 (LSB)
B2
UR
OR
STROBE
RUN/HOLD
DGND
POLARITY
CLK IN
BUSY
(LSD) D1
D2
D3
D4
(MSB) B8
B4
28
27
26
47
kΩ
25
24
23
22
21
20
19
18
17
16
15
V
V
OUT
OUT
+5
F
= 200kHz
OSC
2002 Microchip TechnologyInc.DS21478B-page 15
TC835
z
FIGURE 6-5:TEST CIRCUIT
V
REF
0.47
5V
µF
REF
IN
= 1V
100kΩ
100 kΩ
100
kΩ
0.1µF
SET V
ANALOG GND
Signal
Input
+
–5V
1µF
1µF
1
2
3
4
5
6
7
8
9
10
11
12
13
14
TC835
V-
UNDERRANGE
REF IN
ANALOG
COMMON
INT OUT
AZ IN
BUFF OUT
-
C
REF
C
+
REF
–INPUT
+INPUT
V+
D5 (MSD)
B1 (LSB)
B2
OVERRANGE
STROBE
RUN/HOLD
DIGTAL GND
POLARITY
CLOCK IN
BUSY
(LSD) D1
(MSB) B8
D2
D3
D4
B4
28
27
26
25
24
23
Clock
22
Input
120kH
21
20
19
18
17
16
15
DS21478B-page 16
2002 Microchip TechnologyInc.
7.0PACKAGING INFORMATION
7.1Package Marking Information
Package marking data not available at this time.
7.2Taping Forms
Component Taping Orientation for 64-Pin PQFP Devices
User Direction of Feed
Standard Reel Component Orientation
for TR Suffix Device
Carrier Tape, Number of Components Per Reel and Reel Size
Package Carrier Width (W) Pitch (P) Part Per Full Reel Reel Size
64-Pin PQFP 32 mm 24 mm 250 13 in
NOTE: Drawing does not represent total number of pins.
TC835
PIN 1
W
P
Component Taping Orientation for 44-Pin PQFP Devices
User Direction of Feed
PIN 1
W
P
Standard Reel Component Orientation
for TR Suffix Device
Carrier Tape, Number of Components Per Reel and Reel Size
Package Carrier Width (W) Pitch (P) Part Per Full Reel Reel Size
44-Pin PQFP 24 mm 16 mm 500 13 in
NOTE: Drawing does not represent total number of pins.
2002 Microchip TechnologyInc.DS21478B-page 17
TC835
)
7.3Package Dimensions
28-Pin PDIP (Wide)
.200 (5.08)
.140 (3.56)
.150 (3.81)
.115 (2.92)
.110 (2.79)
.090 (2.29)
44-Pin PQFP
1.465 (37.21)
1.435 (36.45)
.070 (1.78)
.045 (1.14)
.022 (0.56)
.015 (0.38)
PIN 1
.555 (14.10)
.530 (13.46)
.040 (1.02)
.020 (0.51)
.015 (0.38)
.008 (0.20)
.610 (15.49)
.590 (14.99)
.700 (17.78)
.610 (15.50)
Dimensions: inches (mm)
7
˚
MAX.
3
˚
MIN.
PIN 1
.018 (0.45)
.012 (0.30)
.031 (0.80) TYP.
.398 (10.10)
.390 (9.90)
.557 (14.15)
.537 (13.65)
.398 (10.10)
.390 (9.90)
.557 (14.15)
.537 (13.65)
.009 (0.23)
.005 (0.13)
.096 (2.45) MAX.
.041 (1.03)
.026 (0.65)
.010 (0.25) TYP.
.083 (2.10)
.075 (1.90)
Dimensions: inches (mm
DS21478B-page 18
2002 Microchip TechnologyInc.
7.3Package Dimensions (Continued)
)
64-Pin PQFP
˚
MAX.
7
TC835
.018 (0.45)
.012 (0.30)
.031 (0.80) TYP.
PIN 1
.555 (14.10)
.547 (13.90)
.687 (17.45)
.667 (16.95)
.555 (14.10)
.547 (13.90)
.687 (17.45)
.667 (16.95)
.009 (0.23)
.005 (0.13)
.130 (3.30) MAX.
Dimensions: inches (mm
.041 (1.03)
.031 (0.78)
.010 (0.25) TYP.
.120 (3.05)
.100 (2.55)
2002 Microchip TechnologyInc.DS21478B-page 19
TC835
NOTES:
DS21478B-page 20
2002 Microchip TechnologyInc.
TC835
SALES AND SUPPORT
Data Sheets
Products supportedby a preliminaryData Sheet may have an errata sheet describingminor operationaldifferences and recommendedworkarounds.To determine if an erratasheetexists for a particulardevice, please contactone of the following:
1.Your local Microchip sales office
2.The MicrochipCorporate Literature Center U.S. FAX:(480) 792-7277
3.The Microchip Worldwide Site (www.microchip.com)
Pleasespecify which device, revision of silicon and Data Sheet (includeLiterature #) you are using.
New Customer Notification System
Register on our web site (www.microchip.com/cn) to receive the most currentinformationon our products.
2002 Microchip Technology Inc.DS21478B-page21
TC835
NOTES:
DS21478B-page 22 2002 Microchip Technology Inc.
TC835
Information contained in this publication regarding device
applications and the like is intended through suggestion only
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
No representation or warranty is given and no liability is
assumed by Microchip Technology Incorporated with respect
to the accuracy or use of such information,or infringement of
patents or other intellectual property rights arising from such
use or otherwise. Use of Microchip’s products as critical components in life support systems is not authorized except with
express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property
rights.
Trademarks
The Microchip name and logo, the Microchip logo, FilterLab,
K
EELOQ,microID,MPLAB,PIC,PICmicro,PICMASTER,
PICSTART, PRO MATE, SEEVAL and The Embedded Control
SolutionsCompany areregiste red trademarksof MicrochipTechnologyIncorp or ated in the U.S.A. and other countries .
dsPIC, ECONOMONITOR, FanSense, FlexROM, fuzzyLAB,
In-Circuit Serial Programming, ICSP, ICEPIC, microPort,
Migratable Memory, MPASM, MPLIB, MPLINK, MPSIM,
MXDEV, PICC, PICDEM, PICDEM.net, rfPIC, Select Mode
and TotalEndurancearetrademarksofMicrochipTechnology
Incorporated in the U.S.A.
Serialized Quick Turn Programming (SQTP) is a service mark
of Microchip TechnologyIncorporated in t he U.S.A.
All other trademarks mentioned herein are property of their
respective companies.
Microchip received QS-9000 quality system
certification for its worldwide headquarters,
design and wafer fabrication facilities in
Chandler and Tempe, Arizona in July 1999
and Mountain View, California in March 2002.
The Company’s quality system processes and
procedures are QS-9000 compliant for its
®
PICmicro
devices, Serial EEPROMs, microperipherals,
non-volatile memory and analog products. In
addition, Microchip’s quality system for the
design and manufacture of development
systemsisISO 9001certified.
2002 Microchip TechnologyInc.DS21478B-page 23
8-bit MCUs, KEELOQ®code hopping
WORLDWIDE SALESAND SERVICE
AMERICAS
Corporate Office
2355 West Chandler Blvd.
Chandler, AZ 85224-6199
Tel: 480-792-7200 Fax: 480-792-7277
Technical Support: 480-792-7627
Web Address: http://www.microchip.com
Rocky Mountain
2355 West Chandler Blvd.
Chandler, AZ 85224-6199
Tel: 480-792-7966 Fax: 480-792-7456
Atlanta
500 Sugar Mill Road, Suite 200B
Atlanta, GA 30350
Tel: 770-640-0034 Fax: 770-640-0307
Boston
2 Lan Drive, Suite 120
Westford, MA 01886
Tel: 978-692-3848 Fax: 978-692-3821
Chicago
333 Pierce Road, Suite 180
Itasca, IL 60143
Tel: 630-285-0071 Fax: 630-285-0075
Microchip Technology Australia Pty Ltd
Suite 22, 41 Rawson Street
Epping 2121, NSW
Australia
Tel: 61-2-9868-6733 Fax: 61-2-9868-6755
China - Beijing
Microchip Technology Consulting (Shanghai)
Co., Ltd., Beijing Liaison Office
Unit 915
Bei Hai Wan Tai Bldg.
No. 6 Chaoyangmen Beidajie
Beijing, 100027, No. China
Tel: 86-10-85282100 Fax: 86-10-85282104
China - Chengdu
Microchip Technology Consulting (Shanghai)
Co., Ltd., Chengdu Liaison Office
Rm. 2401, 24th Floor,
Ming Xing Financial Tower
No. 88 TIDU Street
Chengdu 610016, China
Tel: 86-28-86766200 Fax: 86-28-86766599
China - Fuzhou
Microchip Technology Consulting (Shanghai)
Co., Ltd., Fuzhou Liaison Office
Unit 28F, World Trade Plaza
No. 71 Wusi Road
Fuzhou 350001, China
Tel: 86-591-7503506 Fax: 86-591-7503521
China - Shanghai
Microchip Technology Consulting (Shanghai)
Co., Ltd.
Room 701, Bldg. B
Far East International Plaza
No. 317 Xian Xia Road
Shanghai, 200051
Tel: 86-21-6275-5700 Fax: 86-21-6275-5060
China - Shenzhen
Microchip Technology Consulting (Shanghai)
Co., Ltd., Shenzhen Liaison Office
Rm. 1315, 13/F , Shenzhen Kerry Centre,
Renminnan Lu
Shenzhen 518001, China
Tel: 86-755-2350361 Fax: 86-755-2366086
China - Hong Kong SAR
Microchip Technology Hongkong Ltd.
Unit 901-6, Tower 2, Metroplaza
223 Hing Fong Road
Kwai Fong, N.T., Hong Kong
Tel: 852-2401-1200 Fax: 852-2401-3431
India
Microchip Technology Inc.
India Liaison Office
Divyasree Chambers
1 Floor, Wing A (A3/A4)
No. 11, O’Shaugnessey Road
Bangalore, 560 025, India
Tel: 91-80-2290061 Fax: 91-80-2290062
Japan
Microchip Technology Japan K.K.
Benex S-1 6F
3-18-20, Shinyokohama
Kohoku-Ku, Yokohama-shi
Kanagawa, 222-0033, Japan
Tel: 81-45-471- 6166 Fax: 81-45-471-6122
Korea
Microchip Technology Korea
168-1, Youngbo Bldg. 3 Floor
Samsung-Dong, Kangnam-Ku
Seoul, Korea 135-882
Tel: 82-2-554-7200 Fax: 82-2-558-5934
Singapore
Microchip Technology Singapore Pte Ltd.
200 Middle Road
#07-02 Prime Centre
Singapore, 188980
Tel: 65-6334-8870 Fax: 65-6334-8850
Microchip Technology SARL
Parc d’Activite du Moulin de Massy
43 Rue du Saule Trapu
Batiment A - ler Etage
91300 Massy, France
Tel: 33-1-69-53-63-20 Fax: 33-1-69-30-90-79