Datasheet STV160NF03L Datasheet (SGS Thomson Microelectronics)

Page 1
STV160NF03L
N - CHANNEL 30V - 0.0019Ω - 160A PowerSO-10
STripFET MOSFET
TYPE V
DSS
R
DS(on)
I
D
ST V160NF03L 30 V < 0.0028 160 A
TYPICALR
ULTRA LOW ON-RESISTANCE
ULTRA FAST SWITCHING
VERYLOW GATE CHARGE
LOW THRESHOLDDRIVE
LOW PROFILE, VERY LOWPARASITIC
DS(on)
= 0.0019
INDUCTANCE PowerSO-10 PACKAGE
DESCRIPTION
The STV160NF03L represents the second generation of Application Specific STMicroelectronics well established STripFET process based on a very unique strip layout design. The resulting MOSFET shows unrivalled high packing density with ultra low on-resistance and superior switching charactestics. Process simplification also translates into improved manufacturing reproducibility. This device is particularly suitable for high current, low voltage switchingapplicationwhere efficiency is crucial.
10
1
PowerSO-10
INTERNAL SCHEMATIC DIAGRAM
CONNECTIONDIAGRAM (TOP VIEW)
APPLICATIONS
BUCK CONVERTERSIN HIGH
PERFORMACETELECOMAND VRMs DC-DC CONVERTERS
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Uni t
V
V
V
I
D
I
DM
P
T
() Pulse width limited by safe operating area (**) Limited only maximumjunction temperature allowed by PowerSO-10
November 1999
Drain-source Voltage (VGS=0) 30 V
DS
Drain- gate Volt ag e (RGS=20kΩ)30V
DGR
Gate - source V o lt age
GS
20 V
±
(**) Drain Current (cont inu ous ) at Tc=25oC 160 A
I
Drain Cur rent (co nt inu ous ) at Tc=100oC 113 A
D
(•) Drain Cur rent (pu lsed) 640 A
Tota l Dissipat i on at Tc=25oC 160 W
tot
Derat ing Factor 1.07 W/ Stor age Temperat ure -65 to 175
stg
Max. Operat ing Junction Temperature 175
T
j
o
C
o
C
o
C
1/8
Page 2
STV160NF03L
THERMAL DATA
R
thj-case
R
thj-amb
T
Ther mal Resistanc e Junct ion-case Max Ther mal Resistanc e Junct ion-ambient Max Maximum L ead T e m perature For Soldering Purpose
l
0.9375 50
300
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unlessotherwisespecified)
(T
J
OFF
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
V
(BR)DSS
Drain-source
ID=250µAVGS=0 30 V
Break dow n Vo lt age
I
DSS
I
GSS
Zero Gate Voltage Drain Curre nt (V
GS
Gat e- bod y Leakag e Current (V
DS
=0)
=0)
V
=MaxRating
DS
=MaxRating Tc=25oC
V
DS
V
=± 15 V
GS
1
10
100 nA
±
ON()
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold Voltage VDS=VGSID= 250 µATc=25oC11.72.5V Sta t ic Drain-s our c e On
Resistance
VGS=10V ID=80A
=8V ID=80A
V
GS
V
=4.5V ID=40A
GS
=10V ID=80A Tj=175oC
V
GS
V
=8V ID=80A Tj=175oC
GS
=4.5V ID=40A Tj= 175oC
V
GS
On State Drain Current VDS>I
D(on)xRDS(on )max
1.9
2.0
4.0
160 A
2.8
3.8
6.7
6.4
7.8
12.8
VGS=10V
µA µA
m m m m m m
Ω Ω Ω
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
gfs(∗)Forward
Tr ansc on duc tance
R
C
C
C
Gate re sistance VDS=15V f=1MHz VGS=0 0.9
g
Input Capaci t ance
iss
Out put Capac itance
oss
Reverse Transfer
rss
Capacit a nc e
C
C
C
Input Capaci t ance
iss
Out put Capac itance
oss
Reverse Transfer
rss
Capacit a nc e
2/8
VDS>I
D(on)xRDS(on )maxID
= 80 A 210 S
VDS=15V f=1MHz VGS= 0 4900
2950
565
VDS=0V f=1MHz VGS= 0 7200
13000
4220
pF pF pF
pF pF pF
Page 3
STV160NF03L
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
t
d(on)
Tur n-on Delay T ime Rise Time
t
r
VDD=15V ID=40A R
=4.7
G
VGS=10V
23
350
(Resis t iv e Load, see fig. 3)
Q Q Q
Tot al Gate C har ge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
VDD=16V ID= 160 A VGS= 10 V 103
38
9
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
t
d(off)
Tur n-of f Dela y Tim e
t
Fall T ime
f
VDD=15V ID=40A R
G
=4.7
VGS=10V
105 120
(Resis t iv e Load, see fig. 3)
t
d(off)
t
r(Voff)
t
t
Tur n-of f Dela y Tim e Off-volt ag e Rise Time Fall T ime
f
Cross-over Tim e
c
V
=16V ID=80A
clamp
R
=4.7
G
VGS=10V
(Indu ct iv e Load, see fig. 5)
85
46 335 404
SOURCEDRAINDIODE
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed:Pulse duration = 300 µs, duty cycle 1.5% (•) Pulse width limited by safe operating area
Source-drain Current
(•)
Source-drain Current
160 640
(pulsed)
(∗)ForwardOnVoltage ISD= 160 A VGS=0 1.5 V
Reverse Recovery
rr
Time Reverse Recovery
rr
ISD= 80 A di/dt = 100 A/µs
=15V
V
DD
(see test circuit, fig. 5)
100
0.25 Charge Reverse Recovery
5
Current
ns ns
nC nC nC
ns ns
ns ns ns ns
A A
ns
µ
A
C
SafeOperating Area ThermalImpedance
3/8
Page 4
STV160NF03L
OutputCharacteristics
Transconductance
TransferCharacteristics
Static Drain-sourceOn Resistance
Gate Charge vs Gate-sourceVoltage
4/8
CapacitanceVariations
Page 5
STV160NF03L
NormalizedGate ThresholdVoltage vs Temperature
Source-drainDiode Forward Characteristics
NormalizedOn Resistancevs Temperature
BasicSchematic For MotherboardVRM Whith SynchronousRectification
BasicSchematic Mosfet Switch Used In SecondarySideOf a FowardConvert
5/8
Page 6
STV160NF03L
Fig. 1
: UnclampedInductiveLoadTest Circuit
Fig. 3: SwitchingTimes Test Circuits For ResistiveLoad
Fig. 2
: UnclampedInductive Waveform
Fig. 4: Gate Charge test Circuit
Fig. 5
: TestCircuit For Inductive Load Switching
And Diode Recovery Times
6/8
Page 7
PowerSO-10 MECHANICAL DATA
STV160NF03L
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 3.35 3.65 0.132 0.144
A1 0.00 0.10 0.000 0.004
B 0.40 0.60 0.016 0.024
c 0.35 0.55 0.013 0.022
D 9.40 9.60 0.370 0.378
D1 7.40 7.60 0.291 0.300
E 9.30 9.50 0.366 0.374 E1 7.20 7.40 0.283 0.291 E2 7.20 7.60 0.283 0.300 E3 6.10 6.35 0.240 0.250 E4 5.90 6.10 0.232 0.240
e 1.27 0.050
F 1.25 1.35 0.049 0.053
H 13.80 14.40 0.543 0.567
h 0.50 0.002
L 1.20 1.80 0.047 0.071
q 1.70 0.067
α 0
o
o
8
==
==
HE
h
A
F
A1
610
51
eB
M
0.25
D
==
D1
==
DETAIL”A”
E2
==
DETAIL”A”
Q
B
0.10 A
E1E3
==
SEATING PLANE
A
C
α
B
E4
==
SEATING
PLANE
A1
L
==
0068039-C
7/8
Page 8
STV160NF03L
Information furnishedis believed tobeaccurate and reliable.However, STMicroelectronics assumes no responsibilityfor the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specificationmentioned in this publication are subjecttochange without notice. Thispublication supersedes and replaces all information previouslysupplied. STMicroelectronics products are not authorized for use as critical components in lifesupport devicesor systemswithout express written approval of STMicroelectronics.
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1999 STMicroelectronics – Printed in Italy – All Rights Reserved
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