Datasheet STU7NB90I Datasheet (SGS Thomson Microelectronics)

Page 1
STU7NB90
STU7NB90I
N-CHANNEL 900V - 1.1 Ω - 7.3 A Max220/Max220I
PowerMesh™ MOSFET
TYPE V
DSS
STU7NB90 900 V < 1.45 STU7NB90I 900 V < 1.45
TYPICAL R
100% AVALANCHE TESTED
VERY LOW INTRINSIC CAPAC ITANCES
GATE CHARGE MINIMIZED
REDUCED VOLTAGE SPREAD
(on) = 1.1
DS
R
DS(on)
I
D
7.3 A
7.3 A
DESCRIPTION
Using the latest high voltage MESH OVERLAY™ process, STMicroelectronics has designed an ad­vanced family of power MOSFETs with outstanding performances. The new patent pending strip layout coupled with the Company’s proprieraty edge termi­nation structure, gives the lowest R
DS(on)
per area, exceptional avalanche and dv/dt capabilities and unrivalled gate charge and switching characteris­tics.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITH MODE POWER SUPPLI ES ( SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT
3
2
1
Max220
Max220I
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
STU7NB90 STU7NB90I
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 4 V/ns
V
ISO
T
stg
T
j
(•)Pu l se width limited by safe operating area
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
900 V 900 V
Gate- source Voltage ±30 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
()
Drain Current (pulsed) 29.2 29.2 (*) A Total Dissipation at TC = 25°C
7.3 7.3 (*) A
4.6 4.6 (*) A
170 60 W
Derating Factor 1.36 0.47 W/°C
Insulation Withstand Voltage (DC) - 2500 V Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
(1) ISD ≤7.3 A, di/dt ≤200A/µs, VDD ≤ V
(*) Curren t Lim i ted by Pack age
(BR)DSS
, Tj ≤ T
JMAX.
1/9May 2001
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STU7NB90 - STU7NB90I
THERMA L D ATA
Max220 Max220 I
Rthj-case Thermal Resistance Junction-case Max 0.734 2.1 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
T
l
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Maximum Lead Temperature For Soldering Purpose 300 °C
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
Drain-source
= 25 °C, ID = IAR, VDD = 50 V)
j
ID = 250 µA, VGS = 0 900 V
7.3 A
600 mJ
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ±30V ±100 nA
GS
A
50 µA
ON (1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
= VGS, ID = 250 µA
DS
VGS = 10 V, ID = 4 A
234V
1.1 1.45
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS > I
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 225 pF Reverse Transfer
Capacitance
ID=4 A
V
DS
D(on)
x R
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
8S
2120 pF
23 pF
2/9
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STU7NB90 - STU7NB90I
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 12 ns Total Gate Charge
Gate-Source Charge 12.5 nC Gate-Drain Charge 23.5 nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
t
t
f
c
Off-voltage Rise Time Fall Time 15 ns Cross-over Time 31 ns
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cycle 1.5 %.
2. Pulse width li mited by safe operating ar ea.
Source-drain Current 7.3 A
(2)
Source-drain Current (pulsed) 29.2 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge 6.3 µC Reverse Recovery Current 18 A
= 450 V, ID = 3.5 A
DD
RG= 4.7Ω VGS = 10 V (see test circuit, Figure 3)
V
= 720V, ID = 7.4A,
DD
VGS = 10V
V
= 720V, ID = 7.4 A,
DD
RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 5)
ISD = 7.3 A, VGS = 0 I
= 7.4 A, di/dt = 100A/µs,
SD
VDD = 100V, Tj = 150°C (see test circuit, Figure 5)
25 ns
51 72 nC
22 ns
1.6 V
700 ns
Safe Operating Area for Max220ISafe Operating Area for Max220
3/9
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STU7NB90 - STU7NB90I
Thermal Impedence for Max220IThermal Impedence for Max220
Output Characteristics Transfer Characteristics
4/9
Static Drain-source On ResistanceTransconductance
Page 5
STU7NB90 - STU7NB90I
Capacitance VariationsGate Charge vs Gate-source Voltage
Normalized Gate Thereshold Voltage vs Temp. Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
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STU7NB90 - STU7NB90I
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
6/9
Page 7
Max220 MECHANICAL DATA
STU7NB90 - STU7NB90I
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.3 4.6 0.169 0.181 A1 2.2 2.4 0.087 0.094 A2 2.9 3.1 0.114 0.122
b 0.7 0.93 0.027 0.036 b1 1.25 1.4 0.049 0.055 b2 1.2 1.38 0.047 0.054
c 0.45 0.6 0.18 0.023
D 15.9 16.3 0.626 0.641 D1 9 9.35 0.354 0.368 D2 0.8 1.2 0.031 0.047 D3 2.8 3.2 0.110 0.126
e 2.44 2.64 0.096 0.104
E 10.05 10.35 0.396 0.407
L 13.2 13.6 0.520 0.535 L1 3 3.4 0.118 0.133
D3 D1
A
mm inch
D2
A2
C
A1
D
b1
b2
E
L1
L
b
e
P011R
7/9
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STU7NB90 - STU7NB90I
I-Max220 MECHANICAL DATA
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.3 4.6 0.169 0.18 1 A1 2.6 2.75 0.102 0.108 A2 1.95 2.15 0.077 0.084
b 0.7 0.93 0.027 0.036
b1 1.25 1.4 0.049 0.055 b2 1.2 1.38 0.047 0.054
c 0.45 0.6 0.017 0.023
D 15.9 16.3 0.626 0.641 D1 12.5 12.9 0.492 0.508 D2 0.6 1 0.023 0.039 D3 1.75 2.15 0.069 0.084
e 2.44 2.64 0.096 0.104
E 10.05 10.35 0.396 0.407
L 13.2 13.6 0.520 0.535
L1 3 3.4 0.118 0.133
mm inch
8/9
P011S
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STU7NB90 - STU7NB90I
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such informa tion n or for an y infring ement of patent s or other rig hts of third part ies which may resu lt from its use . No l i cen se i s granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical compo nents in life support devices or systems without express written approval of STMicroelectronics.
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