HYPERFASTRECOVERYCURRENTTO
COMPETE WITH SiC DEVICES. ALLOWS
DOWNSIZING OF MOSFET AND HEATSINKS
■
INTERNAL CERAMIC INSULATED DEVICES
WITH EQUAL THERMAL CONDITIONS FOR
BOTH 300V DIODES
■
INSULATION(2500V
)ALLOWS
RMS
PLACEMENTONSAMEHEATSINKAS
MOSFETFLEXIBLEHEATSINKINGON
COMMON OR SEPARATE HEATSINK
■
STATIC AND DYNAMIC EQUILIBRIUM OF
INTERNAL DIODES ARE WARRANTED BY
DESIGN
■
Package Capacitance: C=7pF
12
2
1
Insulated TO-220AC
DESCRIPTION
The TURBOSWITCH “H” is an ultra high
performance diodecomposedof two300V dicein
series. TURBOSWITCH “H” family drastically cuts
losses in the associated MOSFET when run at
F
/dt.
high dI
ABSOLUTE RATINGS (limiting values)
SymbolParameterValueUnit
V
RRM
I
F(RMS)
I
FSM
Ipeak
T
stg
Tj
October 2003 - Ed: 2A
Repetitive peak reverse voltage
RMS forward current
Surge non repetitive forward currenttp = 10 ms sinusoidal
Peak current waveformδ = 0.15 Tc = 140°C
Storage temperature range
Maximum operating junction temperature
600V
14A
60A
8A
-65 +150°C
+ 150°C
1/5
Page 2
STTH506DTI
THERMAL AND POWER DATA
SymbolParameterTest conditionsValueUnit
R
th (j-c)
Junction to case thermal resistance
STATIC ELECTRICAL CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
3.0°C/W
*
I
R
V
F
Pulse test : * tp = 100 ms, δ <2%
Reverse leakage currentV
**
Forward voltage dropI
** tp = 380 µs, δ <2%
R=VRRM
Tj = 25°C
Tj = 125°C
= 5ATj=25°C
F
Tj = 150°C
860
1.952.4
6µA
3.6V
To evaluate the maximum conduction losses use the following equation :
P=1.7xI
F(AV)
+ 0.14 I
F2(RMS)
DYNAMIC CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
Reverse recovery
t
rr
time
= 0.5 AIrr = 0.25 A
I
F
IR=1A
I
=1A dIF/dt=-50A/µs
F
Tj = 25°C
12ns
25
VR=30V
I
RM
S
Reverse recovery
current
Reverse recovery
VR= 400 V IF=5A
dIF/dt = -200 A/µs
Tj = 125°C
3.64.5A
0.4-
softness factor
Q
rr
Reverse recovery
45nC
charges
TURN-ON SWITCHING CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
t
fr
Forward recovery
time
V
FP
Transient peak
IF=5A dIF/dt = 100 A/µs
Tj = 25°C
VFR=1.1xVFmax
IF=5A dIF/dt = 100 A/µsTj = 25°C
100ns
7V
forward recovery
voltage
2/5
Page 3
STTH506DTI
Fig.1: Conduction lossesversus averagecurrent.
P(W)
20
18
16
14
12
10
8
6
4
2
0
01234567
δ = 0.05
δ = 0.1
δ = 0.2
I(A)
F(AV)
δ = 0.5
δ = 1
δ
=tp/T
T
tp
Fig. 3: Relative variation of thermal impedance
junction to case versus pulse duration.
Z/R
th(j-c) th(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
0.4
δ = 0.2
δ = 0.1
0.3
0.2
Single pulse
0.1
0.0
1.E-031.E-021.E-011.E+00
t (s)
p
δ
=tp/T
T
tp
Fig. 2: Forward voltage drop versus forward
current.
I (A)
FM
100
90
80
70
60
50
40
30
20
10
0
012345678
(typical values)
T=125°C
j
T=125°C
j
(maximum values)
V (V)
FM
T=25°C
j
(maximum values)
Fig. 4:Peak reverse recovery current versus
/dt (typical values).
dI
F
I (A)
RM
9
V =400V
R
T=125°C
j
8
7
6
5
4
3
2
1
0
050100150200250300350400450500
I =0.25 x I
FF(AV)
I =0.5 x I
FF(AV)
I=I
dI /dt(A/µs)
F
F F(AV)
I =2 x I
FF(AV)
Fig. 5:Reverse recovery time versus dIF/dt
(typical values).
t (ns)
rr
50
45
40
35
30
25
20
15
10
5
0
050100150200250300350400450500
I =2 x I
FF(AV)
I=I
F F(AV)
dI /dt(A/µs)
F
I =0.5 x I
FF(AV)
V =400V
R
T=125°C
j
Fig. 6: Reverse recovery charges versus dIF/dt
(typical values).
Q (nC)
rr
100
V =400V
R
T=125°C
j
90
80
70
60
50
40
30
20
10
0
050100150200250300350400450500
dI /dt(A/µs)
F
I =2 x I
FF(AV)
I=I
F F(AV)
I =0.5 x I
FF(AV)
3/5
Page 4
STTH506TDI
Fig. 7: Reverse recovery softness factor versus
/dt (typical values).
dI
F
S
0.60
I=I
F(AV)
F
V =400V
R
T=125°C
j
0.50
0.40
0.30
dI /dt(A/µs)
0.20
050100150200250300350400450500
F
Fig. 9: Transient peak forward voltage versus
/dt (typical values).
dI
F
V (V)
FP
16
I=I
F F(AV)
15
T=125°C
j
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
050100150200250300350400450500
dI /dt(A/µs)
F
Fig. 8: Relative variation of dynamic parameters
versusjunction temperature (reference:Tj = 125°C).
2.50
2.25
2.00
1.75
1.50
1.25
1.00
0.75
0.50
0.25
0.00
255075100125
S
I
RM
T (°C)
j
I=I
F F(AV)
V =400V
R
Reference:T =125°C
j
Fig. 10:Forward recovery time versus dIF/dt
(typical values).
t (ns)
fr
200
180
160
140
120
100
80
60
40
20
0
0100200300400500
dI /dt(A/µs)
F
I=I
F F(AV)
V =1.1 x V max.
FRF
T=125°C
j
Fig. 11: Junction capacitance versus reverse
voltage applied (typical values).
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