HYPERFASTRECOVERYCURRENTTO
COMPETE WITH SiC DEVICES. ALLOWS
DOWNSIZING OF MOSFET AND HEATSINKS
■
INTERNAL CERAMIC INSULATED DEVICES
WITH EQUAL THERMAL CONDITIONS FOR
BOTH 300V DIODES
■
INSULATION(2500V
PLACEMENTONSAMEHEATSINKAS
MOSFETFLEXIBLEHEATSINKINGON
COMMON OR SEPARATE HEATSINK.
■
STATIC AND DYNAMIC EQUILIBRIUM OF
INTERNAL DIODES ARE WARRANTED BY
DESIGN
■
PACKAGE CAPACITANCE: C=16pF
30 A
600 V
/dt OPERATION.
F
)ALLOWS
RMS
STTH3006DPI
12
2
1
DOP3I
(insulated)
DESCRIPTION
The TURBOSWITCH “H” is an ultra high
performance diode composedof two300V dice in
series. TURBOSWITCH “H”family drastically cuts
losses in the associated MOSFET when run at
F
/dt.
high dI
ABSOLUTE RATINGS (limiting values)
SymbolParameterValueUnit
V
RRM
I
F(RMS)
I
FSM
Ipeak
T
stg
Tj
October 2003 - Ed: 2A
Repetitive peak reverse voltage
RMS forward current
Surge non repetitive forward currenttp = 10 ms sinusoidal
Peak current waveformδ = 0.15 Tc = 120°C
Storage temperature range
Maximum operating junction temperature
600V
32A
180A
50A
-65 +150°C
+ 150°C
1/5
Page 2
STTH3006DPI
THERMAL AND POWER DATA
SymbolParameterTest conditionsValueUnit
R
th (j-c)
Junction to case thermal resistance
STATIC ELECTRICAL CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
1.3°C/W
*
I
R
V
F
Pulse test: * tp =100ms, δ <2%
Reverse leakage currentV
**
Forward voltage dropI
** tp = 380 µs, δ <2%
R=VRRM
Tj = 25°C
Tj = 125°C
= 30ATj=25°C
F
Tj = 150°C
60400
1.952.4
40µA
3.6V
To evaluate the maximum conduction losses use the following equation :
P=1.7xI
F(AV)
+ 0.023 I
F2(RMS)
DYNAMIC CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
t
rr
Reverse recovery
time
IF= 0.5 AIrr = 0.25 A
IR=1A
I
=1A dIF/dt=-50A/µs
F
Tj = 25°C
25ns
45
VR=30V
I
RM
S
Reverse recovery
current
Reverse recovery
VR= 400 V IF=30A
dIF/dt = -200 A/µs
Tj = 125°C
6.78.5A
0.3-
softness factor
Q
rr
Reverse recovery
145nC
charges
TURN-ON SWITCHING CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
t
fr
Forward recovery
time
V
FP
Transient peak
IF=30A dIF/dt = 100 A/µs
Tj = 25°C
VFR=1.1xVFmax
IF=30A dIF/dt = 100 A/µs Tj= 25°C
400ns
6V
forward recovery
voltage
2/5
Page 3
STTH3006DPI
Fig.1: Conductionlossesversus average current.
P(W)
110
100
90
80
70
60
50
40
30
20
10
0
0510152025303540
δ = 0.05
δ = 0.1
δ = 0.2
I(A)
F(AV)
δ = 0.5
δ = 1
δ
=tp/T
T
tp
Fig. 3: Relative variation of thermal impedance
junction to case versus pulse duration.
Z/R
th(j-c) th(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
0.4
δ = 0.2
δ = 0.1
0.3
0.2
Single pulse
0.1
0.0
1.E-031.E-021.E-011.E+00
t (s)
p
δ
=tp/T
T
tp
Fig. 2: Forward voltage drop versus forward
current.
I (A)
FM
200
180
160
140
120
100
80
60
40
20
0
012345678
(maximum values)
T=125°C
j
(typical values)
T=125°C
j
V (V)
FM
T=25°C
j
(maximum values)
Fig. 4:Peak reverse recovery current versus
/dt (typical values).
dI
F
I (A)
RM
16
V =400V
R
T=125°C
j
14
12
I =0.5 x I
I =0.25 x I
FF(AV)
FF(AV)
10
8
6
4
2
0
050100150200250300350400450500
I=I
F F(AV)
dI /dt(A/µs)
F
I =2 x I
FF(AV)
Fig. 5:Reverse recovery time versus dIF/dt
(typical values).
t (ns)
rr
90
80
I =2 x I
70
60
50
40
30
20
10
0
050100150200250300350400450500
FF(AV)
I=I
F F(AV)
dI /dt(A/µs)
F
I =0.5 x I
FF(AV)
V =400V
R
T=125°C
j
Fig. 6: Reverse recovery charges versus dIF/dt
(typical values).
Q (nC)
rr
300
V =400V
R
275
T=125°C
j
250
225
200
175
150
125
100
75
50
25
0
050100150200250300350400450500
dI /dt(A/µs)
F
I =2 x I
FF(AV)
I=I
F F(AV)
I =0.5 x I
FF(AV)
3/5
Page 4
STTH3006DPI
Fig. 7: Reverse recovery softness factor versus
/dt (typical values).
dI
F
S
0.40
I=I
F(AV)
F
V =400V
R
T=125°C
j
0.35
0.30
0.25
dI /dt(A/µs)
0.20
050100150200250300350400450500
F
Fig. 9: Transient peak forward voltage versus
/dt (typical values).
dI
F
V (V)
FP
12
I=I
F F(AV)
11
T=125°C
j
10
9
8
7
6
5
4
3
2
1
0
050100150200250300350400450500
dI /dt(A/µs)
F
Fig. 8: Relative variation of dynamic parameters
versusjunctiontemperature (reference: Tj=125°C).
3.00
2.75
2.50
2.25
2.00
1.75
1.50
1.25
1.00
0.75
0.50
0.25
0.00
255075100125
S
I
RM
T (°C)
j
I=I
F F(AV)
V =400V
R
Reference:T =125°C
j
Fig. 10:Forward recovery time versus dIF/dt
(typical values).
t (ns)
fr
800
I=I
700
600
500
400
300
200
100
0
0100200300400500
dI /dt(A/µs)
F
F F(AV)
V =1.1 x V max.
FRF
T=125°C
j
Fig. 11: Junction capacitance versus reverse
voltage applied (typical values).
Informationfurnished is believedto be accurateandreliable. However, STMicroelectronicsassumes no responsibilityforthe consequences of
useof such informationnor for anyinfringement of patentsor other rightsof third partieswhich may resultfrom its use.Nolicense is grantedby
implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
All other names are the property of their respective owners.