HYPERFASTRECOVERYCURRENTTO
COMPETE WITH SIC DEVICES. ALLOWS
DOWNSIZING OF MOSFET AND HEATSINKS
■ INTERNAL CERAMIC INSULATED DEVICES
WITH EQUAL THERMAL CONDITIONS FOR
BOTH 300V DIODES
■
INSULATION(2500V
PLACEMENTONSAMEHEATSINKAS
MOSFET AND FLEXIBLE HEATSINKING ON
COMMON OR SEPARATE HEATSINK
■
STATIC AND DYNAMIC EQUILIBRIUM OF
INTERNAL DIODES ARE WARRANTED BY
DESIGN
■
PACKAGE CAPACITANCE: C=16pF
15 A
600 V
)ALLOWS
RMS
STTH1506DPI
12
2
1
DOP3I
(insulated)
DESCRIPTION
The TURBOSWITCH “H” is an ultra high
performance diodecomposedof two300V dicein
series. TURBOSWITCH “H” family drastically cuts
losses in the associated MOSFET when run at
F
/dt.
high dI
ABSOLUTE RATINGS (limiting values)
SymbolParameterValueUnit
V
RRM
I
F(RMS)
I
FSM
Ipeak
T
stg
Tj
October 2003 - Ed: 2A
Repetitive peak reverse voltage
RMS forward current
Surge non repetitive forward currenttp = 10 ms sinusoidal
Peak current waveformδ = 0.15 Tc = 120°C
Storage temperature range
Maximum operating junction temperature
600V
26A
130A
35A
-65 +150°C
+ 150°C
1/5
Page 2
STTH1506DPI
THERMAL AND POWER DATA
SymbolParameterTest conditionsValueUnit
R
th (j-c)
Junction to case
STATIC ELECTRICAL CHARACTERISTICS (for both diodes)
SymbolParameterTests ConditionsMin.Typ.Max.Unit
1.6°C/W
*
I
R
Reverse leakage
current
V
**
F
Pulse test: * tp = 100ms, δ <2%
Forward voltage dropI
** tp = 380µs, δ <2%
V
R=VRRM
Tj = 25°C
Tj = 125°C
= 15ATj=25°C
F
Tj = 150°C
30200
1.952.4
20µA
3.6V
To evaluate the maximum conduction losses use the following equation:
P=1.7xI
F(AV)
+ 0.047 x I
F2(RMS)
RECOVERY CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
t
rr
Reverse recovery
time
IF= 0.5 A Irr = 0.25A
IR=1A
I
=1A dIF/dt = - 50A/µs
F
Tj = 25°C
16ns
35
VR=30V
I
RM
Reverse recovery
current
VR= 400 V IF=15A
dIF/dt = -200 A/µs
Tj = 125°C
4.86.0A
S
Reverse recovery
0.4-
softness factor
Q
rr
Reverse recovery
80nC
charges
TURN-ON SWITCHING CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
t
fr
V
FP
Forward
recovery time
Forward
IF=15A dIF/dt = 100A/µs,
Tj = 25°C
VFR=1.1xVFmax
IF=15A dIF/dt = 100 A/µsTj = 25°C
200ns
6V
recovery voltage
2/5
Page 3
STTH1506DPI
Fig.1: Conduction lossesversus average current.
P(W)
55
50
45
40
35
30
25
20
15
10
5
0
02468101214161820
δ = 0.05
δ = 0.1
δ = 0.2
I(A)
F(AV)
δ = 0.5
δ = 1
=tp/T
δ
T
tp
Fig. 3: Relative variation of thermal impedance
junction to case versus pulse duration.
Z/R
th(j-c) th(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
δ = 0.2
0.4
δ = 0.1
0.3
0.2
Single pulse
0.1
0.0
1.E-031.E-021.E-01
t (s)
p
δ
=tp/T
T
tp
1.E+00
Fig. 2: Forward voltage drop versus forward
current.
I (A)
FM
130
120
110
100
90
80
70
60
50
40
30
20
10
0
012345678
(maximum values)
T=125°C
j
(typical values)
T=125°C
j
(maximum values)
V (V)
FM
T=25°C
j
Fig.4: Peak reverserecovery current versus dIF/dt
(typical values).
I (A)
RM
20
V =400V
R
18
T=125°C
j
16
I =0.5 x I
I =0.25 x I
FF(AV)
FF(AV)
dI /dt(A/µs)
F
14
12
10
8
6
4
2
0
02004006008001000
I=I
F F(AV)
I =2 x I
FF(AV)
Fig. 5: Reverse recovery time versus dIF/dt
(typical values).
t (ns)
rr
70
60
50
40
30
20
10
0
02004006008001000
I =2 x I
FF(AV)
I=I
F F(AV)
dI /dt(A/µs)
F
I =0.5 x I
FF(AV)
V =400V
R
T=125°C
j
Fig. 6: Reverse recovery charges versus dIF/dt
(typical values).
Q (nC)
rr
240
V =400V
R
220
T=125°C
j
200
180
160
140
120
100
80
60
40
20
0
02004006008001000
dI /dt(A/µs)
F
I =2 x I
FF(AV)
I=I
F F(AV)
I =0.5 x I
FF(AV)
3/5
Page 4
STTH1506DPI
Fig. 7: Softness factor versus dIF/dt (typical
values).
S
0.80
I=I
F(AV)
F
V =400V
R
T=125°C
j
0.70
0.60
0.50
0.40
0.30
0.20
02004006008001000
dI /dt(A/µs)
F
Fig. 9: Transient peak forward voltage versus
/dt (typical values).
dI
F
V (V)
FP
12
I=I
F F(AV)
11
T=125°C
j
10
9
8
7
6
5
4
3
2
1
0
050100150200250300350400450500
dI /dt(A/µs)
F
Fig. 8: Relative variations of dynamic parameters
versus junction temperature.
2.50
2.25
2.00
1.75
1.50
1.25
1.00
0.75
0.50
0.25
0.00
255075100125
S
I
RM
T (°C)
j
I=I
F F(AV)
V =400V
R
Reference:T =125°C
j
Fig. 10: Forward recovery time versus dIF/dt
(typical values).
t (ns)
fr
350
I=I
300
250
200
150
100
50
0
0100200300400500
dI /dt(A/µs)
F
F F(AV)
V =1.1 x V max.
FRF
T=125°C
j
Fig. 11: Junction capacitance versus reverse
voltage applied (typical values).
Informationfurnishedis believed to be accurate and reliable. However, STMicroelectronics assumes noresponsibilityforthe consequences of
useof such information nor for any infringement ofpatentsor other rights of third parties which mayresult from its use. No license is granted by
implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
All other names are the property of their respective owners.