Datasheet STT1NF100 Datasheet (SGS Thomson Microelectronics)

Page 1
STT1NF100
N-CHANNEL 100V - 0.7-1ASOT23-6L
STripFET™ II POWER MOSFET
PRELIMINARY DATA
TYPE V
DSS
R
DS(on)
I
D
STT1NF100 100V <0.8 1A
TYPICAL R
EXCEPTIONAL dv/dt CAPABILITY
VERY LOW Qg
DS(on)
=0.7
DESCRIPTION
This Power MOSFET is the latest development of ST­Microelectronics unique “Single Feature Size
™”strip-
based process. The resulting transistor shows ex­tremely high packing density for low on-resistance, rugged avalance charac teristics and less critical align­ment steps therefore a remarkable manufacturing re­producibility.
APPLICATIONS
DC-DC & DC-AC CONVERTERS
DC MOTOR CONTROL (DISK DRIV ES, etc.)
SYNCHRONOUS RECTIFICATION
SOT23-6L
INTERNAL SCHEMATIC DIAGRAM
MARKING
STQ0
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt(1) Peak Diode Recovery voltage slope 20 V/ns
T
stg
T
j
() Pulse width limited by safe operating area
September 2002
Drain-source Voltage (VGS=0) Drain-gate Voltage (RGS=20kΩ)
100 V
100 V Gate- source Voltage ± 20 V Drain Current (continuous) at TC= 25°C Drain Current (continuous) at TC= 100°C
()
Drain Current (pulsed) 4 A Total Dissipation at TC= 25°C
1A
0.6 A
1.6 W
Derating Factor 0.013 W/°C
Storage Temperature Max. Operating Junction Temperature
(1) ISD≤1A, di/dt 350A/µs, VDD≤ V
–55to150 °C
(BR)DSS,Tj≤TJMAX.
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STT1NF100
THERMAL DATA
Rthj-amb(*) Thermal Resistance Junction-ambient Max 78 °C/W
T
l
(*) When mounted on FR-4 board of 1inch² pad, 0.5oz Cu
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLES S OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
ON (1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
Maximum Lead Temperature For Soldering Purpose 260 °C
Drain-source
ID= 250 µA, VGS= 0 100 V
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
=0)
Gate-body Leakage Current (V
DS
=0)
Gate Threshold Voltage Static Drain-source On
V
= Max Rating
DS
VDS= Max Rating, TC= 125 °C V
= ± 20V ±100 nA
GS
V
DS=VGS,ID
=10V,ID= 0.5 A
V
GS
= 250µA
2V
0.7 0.8
A
10 µA
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS=15V,ID=1A 1 S
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 20 pF Reverse Transfer
Capacitance
V
=25V,f=1MHz,VGS=0
DS
105 pF
9pF
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STT1NF100
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
t
r
Q
g
Q
gs
Q
gd
Turn-on Delay Time Rise Time 5.5 ns Total Gate Charge
Gate-Source Charge Gate-Drain Charge
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
t
f
Turn-off-Delay Time Fall Time
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Source-drain Current 1 A
(2)
Source-drain Current (pulsed) 4 A
(1)
Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
=50V,ID= 0.5A
DD
= 4.7VGS=10V
R
G
(see test circuit, Figure 1) VDD=50V,ID=1A,
V
=10V
GS
(see test circuit, Figure 2)
VDD= 50V, ID= 0.5A,
=4.7Ω, VGS= 10V
R
G
(see test circuit, Figure 1)
ISD= 1A, VGS=0
= 1A, di/dt = 100A/µs,
I
SD
=20V,Tj= 150°C
V
DD
(see test circuit, Figure 3)
4ns
4
6
1
1.5
13
6.5
1.2 V
45 60
2.7
nC nC nC
ns ns
ns
nC
A
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Page 4
STT1NF100
Resistive Loa d
Fig. 3: Test Circuit For Diode Recovery Behaviour
Fig. 2: Gate Charge test CircuitFig. 1: Switching Times Test Circuit For
4/6
Page 5
TSOP-6 MECHANICAL DATA
STT1NF100
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 0.90 1.45 0.035 0.057
A1 0.00 0.15 0.000 0.006
A2 0.90 1.30 0.035 0.051
b 0.25 0.50 0.010 0.020
C 0.09 0.20 0.004 0.008
D 2.80 3.10 0.110 0.122 E 2.60 3.00 0.102 0.118
E1 1.50 1.75 0.059 0.069
L 0.35 0.55 0.014 0.022 e 0.95 0.037
e1 1.90 0.075
mm mils
AA2
A1
b
e
c
L
E
e1
D
E1
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Page 6
STT1NF100
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for t he consequences of use of su ch in formation nor for any in fringement of paten ts or o ther rights of third parties w hich may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously suppli ed. STMi croelect ronics pr oducts are not author ized for use as c ritical component s in li fe suppo rt devi ces or systems without express written approval of STMicroelectronics.
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