Repetitive Peak Reverse Current
Non Repetitive Peak Reverse Currenttp=100 µs1 A
Critical Rate Of Rise Of Reverse Voltage10000V/µs
L
=0.5
δ
tp= 10 ms
Sinusoidal
tp=2 µs
F=1 kHz
3A
75A
1A
1/8February 2002
.
Page 2
STS3DPFS45
TERMAL DATA
Rthj-amb
Rthj-amb
T
stg
T
(*) Mounted on Fr-4 board (Steady State)
Thermal Resistance Junction-ambient MOSFET
Thermal Resistance Junction-ambient SCHOTTKY
Storage Temperature Range
Maximum Lead Temperature For Soldering Purpose
j
MAX
62.5
100
-65 to 150
150
o
C/W
o
C/W
o
C
o
C
ELECTRICAL CHARACTERISTICS (T
= 25 °C unless otherwise specified)
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 250 µA, VGS = 0
I
D
V
= Max Rating
DS
V
= Max Rating TC = 125°C
DS
= ± 16 V
V
GS
45V
1
10
±100nA
ON
V
(BR)DSS
I
DSS
I
GSS
(1)
Drain-source
Breakdown Voltage
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold Voltage
Static Drain-source On
Resistance
On State Drain Current
= VGS ID = 250 µA
DS
V
= 10 VID = 1.5 A
GS
V
= 10 V
GS
234V
0.0800.11
3A
SCHOTTCKY STATIC ELECTRICAL CHARACTERISTICS
SymbolParameterTest ConditionsMin.Typ.Max.Unit
T
= 25 oC VR= 45 V
(*)
I
R
(*)
V
F
Reversed Leakage Curren t
Forward Voltage drop
J
= 125 oC VR= 45 V
T
J
T
= 25 oC IF= 3 A
J
= 125 oC IF= 3 A
T
J
0.03
0.42
0.2
100
0.51
0.46
µA
µA
Ω
mA
mA
mA
mA
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
(*)
g
fs
C
iss
C
oss
C
rss
2/8
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
DS>ID(on)xRDS(on)max ID
= 25V, f = 1 MHz, VGS = 0
V
DS
=1.5A
4S
1190
200
56
pF
pF
pF
Page 3
STS3DPFS45
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 20 V ID = 1.5 A
t
d(on)
t
Turn-on Delay Time
r
Rise Time
V
DD
R
= 4.7 Ω VGS = 10 V
G
(Resistive Load, Figure 3)
Q
g
Q
gs
Q
gd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
= 20V ID= 3A VGS=10V
V
DD
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 20 V ID = 1.5 A
t
d(off)
t
Turn-off Delay Time
f
Fall Time
V
DD
R
= 4.7Ω, V
G
GS
(Resistive Load, Figure 3)
= 10 V
20
25
24.5
4
5.5
100
22
33nC
ns
ns
nC
nC
ns
ns
t
d(off)
t
t
Turn-off Delay Time
f
c
Fall Time
Cross-over Time
= 32 V ID = 3 A
V
clamp
R
= 4.7Ω, V
G
GS
= 10 V
95
11
35
SOURCE DRAIN DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(*)
Pulsed: P ul se duration = 300 µs, dut y cycle 1.5 %.
(
•)Pulse width limited by s afe operating area.
Safe Operating Area
Source-drain Current
(•)
Source-drain Current (pulsed)
(*)
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
= 3 A VGS = 0
SD
= 3 A di/dt = 100A/µs
I
SD
V
= 15 VTj = 150°C
DD
(see test circuit, Figure 5)
Thermal Impedance
3
12
2V
40
85
3.8
ns
ns
ns
A
A
ns
nC
A
3/8
Page 4
STS3DPFS45
Output CharacteristicsTransfer Characteristics
TransconductanceStatic Drain-source On Resistance
Gate Charge vs Gate-source VoltageCapacitance Variations
4/8
Page 5
STS3DPFS45
Normalized Gate Threshold Voltage vs TemperatureNormalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics.
..
5/8
Page 6
STS3DPFS45
Fig. 1: Unclamped Inductive Load Test CircuitFig. 1: Unclamped Inductive Load Test CircuitFig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or o therwise under any patent or patent rights of STMicroelectronics. Specifications menti oned in thi s publicat i on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products a re not
authorized for use as c ri t i cal components in life support dev i ces or systems wi thout exp ress written approval of STMicroel ectronics.
The ST log o i s registered tradem ark of STMicroelectronics
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All other names are the property of their resp ective owners.
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