refinements introduced greatly improve the
Ron*areafigure of meritwhile keeping the device
at the leading edge for what concerns switching
speed,gate chargeand ruggedness.
(•) Pulse width limited by safe operating area(1)ISD≤3 A, di/dt ≤ 100 A/µs, VDD≤ V
Drain-source Voltage (VGS=0)500V
DS
Dra in- gate Voltage (RGS=20kΩ)
DGR
Gate -sourc e Voltage
GS
Drain Current (continuous) at Tc=25oC3.2A
I
D
Drain Current (continuous) at Tc=100oC2A
I
D
500V
30V
±
(•)Drain Current (pulsed)12.8A
Total Dissipation at Tc=25oC60W
tot
Derating Factor0.48W/
1) P eak Dio de Recovery volt age slope4V/ns
St orage Tempe rature-65 to 150
stg
Max. Op erating Junc t ion T e m pe rat ure150
T
j
,Tj≤T
(BR)DSS
JMAX
o
C
o
C
o
C
January 2000
1/7
Page 2
STD3NC50
THERMAL DATA
R
thj-case
Rthj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
SymbolPara meterMax Val ueUni t
I
AR
E
Ther mal Resist an c e J unction- caseMax
Ther mal Resist an c e J unction- ambientMax
Thermal Resistance Case-sinkTyp
Maximum Lead Tem perature Fo r Soldering P urpose
l
Avalanche Curr ent, Repetit ive or Not-Re petitive
(pulse width limited by T
Single Pu lse Avalanche Energy
AS
(starting T
=25oC, ID=IAR,VDD=50V)
j
max)
j
2.0
100
1.5
275
3A
40mJ
o
C/W
oC/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwisespecified)
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
=250µAVGS=0
I
D
500V
Break d own V o lt age
I
DSS
I
GSS
Zero Gate Voltage
Drain Cu rr ent (V
GS
Gat e- b ody Le akage
Current (V
DS
=0)
=0)
V
=MaxRating
DS
= Max RatingTc=125oC
V
DS
= ± 30 V
V
GS
1
50
± 100nA
ON(∗)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
GS(th)
Gate Threshold
V
DS=VGSID
= 250 µA
234V
Voltage
R
DS(on)
Static Drain-source On
VGS=10V ID= 1.5 A2.42.7
Resistance
I
D(on)
On Stat e D ra in Curr ent VDS>I
D(on)xRDS(on)max
3A
VGS=10V
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
g
(∗)Forward
fs
Tr ansconductance
C
C
C
Input Cap ac i t an c e
iss
Out put Capacitanc e
oss
Reverse Transf er
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=1.5A2S
VDS=25V f=1MHz VGS=0400
62
7.5
µA
µ
Ω
pF
pF
pF
A
2/7
Page 3
STD3NC50
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHINGON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
Q
Q
Q
Turn-on Time
t
Rise Time
r
Total Gate Charge
g
Gat e- Source Char ge
gs
Gate-Drain Charge
gd
VDD= 300 VID=1.5A
R
=4.7
G
Ω
VGS=10V
VDD= 480 V ID=3A VGS=10V15
11
8
21nC
6.5
5
SWITCHINGOFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
r(Voff)
t
t
Off -voltage Rise Time
Fall Time
f
Cross-over T i m e
c
VDD= 400 VID=3A
=4.7 ΩVGS=10V
R
G
8
5
14
SOURCEDRAINDIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Source-drain Curr ent
(•)
Source-drain Curr ent
3
12
(pulsed)
(∗)For ward On VoltageISD=3A VGS=01.6V
Reverse Recov ery
rr
Time
Reverse Recov ery
rr
= 3 Ad i/ d t = 100 A/µs
I
SD
= 100 VTj=150oC
V
DD
245
980
Charge
Reverse Recov ery
8
Current
ns
ns
nC
nC
ns
ns
ns
A
A
ns
µ
A
C
3/7
Page 4
STD3NC50
Fig. 1:
UnclampedInductive Load TestCircuit
Fig. 3: SwitchingTimes Test CircuitsFor
ResistiveLoad
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implicationor otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademarkof STMicroelectronics
2000 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
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