The SuperMESH ™ series is obtained through an
extreme optimization of ST’s well established stripbased PowerMESH™ layout. In addition to pushing
on-resistance significantly down,specialcareis taken to ensure a very good dv/dt capability for the
most dem anding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDm es h™ products.
TO-92 (Ammopack)
TO-220FP
3
2
1
IPAK
INTERNAL SCHEMATIC DIAGRAM
3
2
1
APPLICATIONS
AC ADAPTORS AND BATTERY CHARGERS
SWITH MODE POWER SUPPLIES (SMPS)
ORDER CODES
PART NUMBERMARKINGPACKAGEPACKAGING
STD2HNK60Z-1D2HNK60ZIPAKTUBE
STQ2HNK60ZR-APQ2HNK60ZRTO-92AMMOPAK
STF2HNK60ZF2HNK60ZTO-220FPTUBE
1/12April 2004
Page 2
STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
IPAKTO-220FPTO-92
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
V
ESD(G-S)
dv/dt (1)Peak Diode Recovery voltage slope4.5V/ns
V
ISO
T
j
T
stg
() Pulse width limited by safe operating area
≤ 2A,di/dt≤ 200 A/µs, VDD≤ V
(1) I
SD
(*)Current Limitedbypackage
Drain-source Voltage (VGS=0)
Drain-gate Voltage (RGS=20kΩ)
600V
600V
Gate- source Voltage± 30V
Drain Current (continuous) at TC=25°C
Drain Current (continuous) at TC= 100°C
()
Drain Current (pulsed)88 (*)2A
Total Dissipation at TC=25°C
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T
max)
j
Single Pulse Avalanche Energy
(starting T
=25°C, ID=IAR,VDD=50V)
j
2A
120mJ
GATE-SOURCE ZENER DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
BV
GSO
Gate-Source Breakdown
Voltage
Igs=± 1mA (Open Drain)30V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes hav e specifically been designed to enhance not only the device’s
ESD capability, but also to make them sa fely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to prote ct the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
2/12
Page 3
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
ELECTRICAL CHARACTERISTICS (T
=25°C UNLESS O THERWISE SPECIFIED)
CASE
ON/OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
ID=1mA,VGS= 0600V
Breakdown Voltage
I
I
GSS
V
GS(th)
R
DS(on)
DSS
Zero Gate Voltage
Drain Current (V
GS
=0)
Gate-body Leakage
Current (V
DS
=0)
Gate Threshold Voltage
Static Drain-source On
V
=MaxRating
DS
=MaxRating,TC= 125 °C
V
DS
V
= ± 20V±10µA
GS
V
DS=VGS,ID
=50µA
33.754.5V
1
50
VGS=10V,ID= 1.0 A4.44.8Ω
Resistance
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
g
(1)Forward TransconductanceVDS=15V,ID= 1.0 A1.5S
fs
C
oss eq.
C
C
C
t
d(on)
t
d(off)
Q
Q
Q
iss
oss
rss
t
t
gd
r
f
g
gs
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
(3)Equivalent Output
Capacitance
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of u se of suc h informat ion n or for any in fring ement of paten ts or oth er ri ghts of th ird part ies whic h may resul t from
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