Datasheet STQ2HNK60ZR-AP, STF2HNK60Z, STD2HNK60Z-1 Datasheet (ST)

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查询STD2HNK60Z-1供应商
N-CHANNEL 600V - 4.4- 2.0A TO-92/TO-220FP/IPAK
STQ2HNK60ZR-AP
STF2HNK60Z - STD2HNK60Z-1
Zener-Protected SuperMESH™ MOSFET
TYPE V
STQ2HNK60ZR-AP STD2HNK60Z-1 STF2HNK60Z
TYPICAL RDS(on) = 4.4
EXTREMELY HIGHdv/dt CAPABILITY
ESD IMPROVED CAPABILITY
100% AVALANCHE TESTED
NEW HIGH VOLTAGE BENCHMARK
GATE CHARGE MINIMIZED
600 V 600 V 600 V
DSS
R
DS(on)
<4.8 <4.8 <4.8
I
D
0.5 A
2.0 A
2.0 A
P
W
3W 45 W 20 W
DESCRIPTION
The SuperMESH ™ series is obtained through an extreme optimization of ST’s well established strip­based PowerMESH™ layout. In addition to pushing on-resistance significantly down,specialcareis tak­en to ensure a very good dv/dt capability for the most dem anding applications. Such series comple­ments ST full range of high voltage MOSFETs in­cluding revolutionary MDm es h™ products.
TO-92 (Ammopack)
TO-220FP
3
2
1
IPAK
INTERNAL SCHEMATIC DIAGRAM
3
2
1
APPLICATIONS
AC ADAPTORS AND BATTERY CHARGERS
SWITH MODE POWER SUPPLIES (SMPS)
ORDER CODES
PART NUMBER MARKING PACKAGE PACKAGING
STD2HNK60Z-1 D2HNK60Z IPAK TUBE
STQ2HNK60ZR-AP Q2HNK60ZR TO-92 AMMOPAK
STF2HNK60Z F2HNK60Z TO-220FP TUBE
1/12April 2004
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
IPAK TO-220FP TO-92
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
V
ESD(G-S)
dv/dt (1) Peak Diode Recovery voltage slope 4.5 V/ns
V
ISO
T
j
T
stg
() Pulse width limited by safe operating area
2A,di/dt200 A/µs, VDD≤ V
(1) I
SD
(*)Current Limitedbypackage
Drain-source Voltage (VGS=0) Drain-gate Voltage (RGS=20kΩ)
600 V
600 V Gate- source Voltage ± 30 V Drain Current (continuous) at TC=25°C Drain Current (continuous) at TC= 100°C
()
Drain Current (pulsed) 8 8 (*) 2 A Total Dissipation at TC=25°C
2.0 2.0 (*) 0.5 A
1.26 1.26 (*) 0.32 A
45 20 3 W Derating Factor 0.36 0.16 0.025 W/°C Gate source ESD(HBM-C=100pF, R=1.5KΩ) 2000 V
Insulation Withstand Voltage (DC) -- 2500 -- V Operating Junction Temperature
Storage Temperature
(BR)DSS,Tj
T
JMAX.
-55 to 150 °C
THERMAL DATA
IPAK TO-220FP TO-92
Rthj-case Thermal Resistance Junction-case Max 2.77 6.25 -- °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 100 62.5 120 °C/W Rthj-lead Thermal Resistance Junction-lead Max -- -- 40 °C/W
T
Maximum Lead Temperature For Soldering
l
300 300 260 °C
Purpose
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
=25°C, ID=IAR,VDD=50V)
j
2A
120 mJ
GATE-SOURCE ZENER DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BV
GSO
Gate-Source Breakdown Voltage
Igs=± 1mA (Open Drain) 30 V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes hav e specifically been designed to enhance not only the device’s ESD capability, but also to make them sa fely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to prote ct the devices integrity. These integrated Zener diodes thus avoid the usage of external components.
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STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
ELECTRICAL CHARACTERISTICS (T
=25°C UNLESS O THERWISE SPECIFIED)
CASE
ON/OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID=1mA,VGS= 0 600 V
Breakdown Voltage
I
I
GSS
V
GS(th)
R
DS(on)
DSS
Zero Gate Voltage Drain Current (V
GS
=0)
Gate-body Leakage Current (V
DS
=0) Gate Threshold Voltage Static Drain-source On
V
=MaxRating
DS
=MaxRating,TC= 125 °C
V
DS
V
= ± 20V ±10 µA
GS
V
DS=VGS,ID
=50µA
3 3.75 4.5 V
1
50
VGS=10V,ID= 1.0 A 4.4 4.8
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
(1) Forward Transconductance VDS=15V,ID= 1.0 A 1.5 S
fs
C
oss eq.
C C C
t
d(on)
t
d(off)
Q Q Q
iss oss rss
t
t
gd
r
f
g
gs
Input Capacitance Output Capacitance Reverse Transfer Capacitance
(3) Equivalent Output
Capacitance Turn-on Delay Time
Rise Time Turn-off Delay Time Fall Time
Total Gate Charge Gate-Source Charge Gate-Drain Charge
=25V,f=1MHz,VGS= 0 280
V
DS
38
7
VGS=0V,VDS= 0V to 480V 30 pF
=300V,ID=1.0A
V
DD
R
=4.7Ω VGS=10V
G
(Resistive Load see, Figure 3)
10 30 23 50
=480V,ID=2.0A,
V
DD
VGS=10V
11
2.25
15
6
µA µA
pF pF pF
ns ns ns ns
nC nC nC
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD(1)
t
rr
Q
rr
I
RRM
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area .
3. C
Source-drain Current
(2)
Source-drain Current (pulsed) ForwardOnVoltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current
is defined as a constant equivalent capacitance giving the same charging time as C
oss eq.
.
V
DSS
ISD=2.0A,VGS=0 I
SD
V
DD
(see test circuit, Figure 5) I
SD
V
DD
(see test circuit, Figure 5)
= 2.0 A, di/dt = 100 A/µs
=20V,Tj=25°C
=13A,di/dt=100A/µs
=20V,Tj= 150°C
178 445
5
200 500
5
when VDSincreases from 0 to 80%
oss
2.0
8.0
1.6 V
A A
ns
nC
A
ns
nC
A
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
Thermal Impedance for TO-92Safe Operating Area for TO-92
Safe Operating Area for TO-220FP
Safe Operating Area for IPAK
Thermal Impedance for TO-220FP
Thermal Impedance for IPAK
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STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Output Characteristics
Transconductance
Transfer Characteristics
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variation s
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
Normalized On Resistance vs TemperatureNormalized Gate Theresho ld Voltage vs Temp.
Source-drain Diode Forward Characteristics
Maximum Avalanche Energy vs Temperature
Normalized BVDSS vs Temperature
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STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
TO-92 MECHANICAL DATA
DIM.
A 4.32 4.95 0.170 0.194 b 0.36 0.51 0.014 0.020 D 4.45 4.95 0.175 0.194 E 3.30 3.94 0.130 0.155 e 2.41 2.67 0.094 0.105
e1 1.14 1.40 0.044 0.055
L 12.70 15.49 0.50 0.610 R 2.16 2.41 0.085 0.094
S1 0.92 1.52 0.036 0.060
W 0.41 0.56 0.016 0.022
V5°
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
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STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
TO-92 AMMOPACK
DIM.
A1 4.45 4.95 0.170 0.194
T 3.30 3.94 0.130 0.155 T1 1.6 0.06 T2 2.3 0.09
d 0.41 0.56 0.016 0.022 P0 12.5 12.7 12.9 0.49 0.5 0.51 P2 5.65 6.35 7.05 0.22 0.25 0.27
F1, F2 2.44 2.54 2.94 0.09 0.1 0.11
delta H -2 2 -0.08 0.08
W 17.5 18 19 0.69 0.71 0.74 W0 5.7 6 6.3 0.22 0.23 0.24 W1 8.5 9 9.25 0.33 0.35 0.36 W2 0.5 0.02
H 18.5 20.5 0.72 0.80 H0 15.5 16 16.5 0.61 0.63 0.65 H1 25 0.98 D0 3.8 4 4.2 0.15 0.157 0.16
t0.90.035
L110.43
l1 3 0.11
delta P -1 1 -0.04 0.04
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
TO-220FP MECHANICAL DATA
DIM.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106 D 2.5 2.75 0.098 0.108 E 0 .45 0.7 0.017 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 .0385 0.417 L5 2.9 3.6 0.114 0.141 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
E
A
D
B
10/12
L3
L6
L7
F1
F
G1
H
F2
123
L4
L2
L5
G
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STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
0068771-E
TO-251 (IPAK) MECHANICAL DAT A
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
mm inch
A 2.2 2.4 0.086 0.094 A1 0.9 1.1 0.035 0.043 A3 0.7 1.3 0.027 0.051
B 0.64 0.9 0.025 0.031 B2 5.2 5.4 0.204 0.212 B3 0.85 0.033 B5 0.3 0.012 B6 0.95 0.037
C 0.45 0.6 0.017 0.023 C2 0.48 0.6 0.019 0.023
D 6 6.2 0.236 0.244
E 6.4 6.6 0.252 0.260
G 4.4 4.6 0.173 0.181
H 15.9 16.3 0.626 0.641
L 9 9.4 0.354 0.370 L1 0.8 1.2 0.031 0.047 L2 0.8 1 0.031 0.039
H
C
A
E
= =
C2
L2
B2
= =
D
B3
2
1 3
L1
B6
A1
L
A3
B
B5
G
= =
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STQ2HNK60ZR-AP - STF2HNK 60Z - STD2HNK60Z-1
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of u se of suc h informat ion n or for any in fring ement of paten ts or oth er ri ghts of th ird part ies whic h may resul t from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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