This Power MOSFET is the latest dev elo pment of
STMicroelectronis unique "Single Feature Size™"
strip-based process. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a remarkable manufacturing reproducibility.
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SOLENOID AND RELAY DRIVERS
■ MOTOR CONTROL, AUDIO AMPLIFIERS
■ DC-DC & DC-AC CONVERTERS
■ AUTOMOTIVE
3
1
2
D
PAK
TO-263
TO-220
(Suffix “T4”)
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
DS
V
DGR
V
GS
(#)Drain Current (continuous) at TC = 25°C
I
D
I
D
(
I
DM
P
tot
dv/dt
E
AS
T
stg
T
j
(#
Current li mited by the package
)
(•) Pulse width limited safe operating area
NEW DATASHEET ACCORDING TO PCN DSG/CT/2C13 MARKING: P80NF55L-06 @ B80NF55L-06 @
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
55V
55V
Gate- source Voltage± 16V
80A
Drain Current (continuous) at TC = 100°C
•)
Drain Current (pulsed)320A
Total Dissipation at TC = 25°C
80A
300W
Derating Factor2W/°C
(1)
Peak Diode Recovery voltage slope7V/ns
(2)
Single Pulse Avalanche Energy1.3J
Storage Temperature
Operating Junction Temperature
≤80A, di/dt ≤400A/ µ s , VDD ≤ V
(1) I
SD
(2) Starting Tj = 25 oC, ID = 40A, VDD = 35V
-55 to 175°C
(BR)DSS
, Tj ≤ T
JMAX
1/10January 2003
Page 2
STB80NF55L-06 STP80NF55L-06
THERMA L D ATA
Rthj-case
Rthj-amb
T
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
l
Max
Max
0.5
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (T
= 25 °C UNLESS OTHERWISE SPECIFIED)
CASE
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 250 µA, VGS = 0
V
(BR)DSS
Drain-source
I
D
55V
Breakdown Voltage
= Max Rating
V
DS
V
= Max Rating TC = 125°C
DS
V
= ± 16 V
GS
1
10
±100nA
ON
(*)
I
DSS
I
GSS
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage
Static Drain-source On
Resistance
= VGS I
DS
= 10 V ID = 40 A
V
GS
V
= 5 V ID = 40 A
GS
= 250 µA
D
1V
0.005
0.0055
0.0065
0.008
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
(*)
g
fs
C
iss
C
oss
C
rss
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
= 15 V ID= 40 A
DS
= 25V f = 1 MHz VGS = 0
V
DS
150S
4850
1040
375
µA
µA
Ω
Ω
pF
pF
pF
2/10
Page 3
STB80NF55L-06 STP80NF55L-06
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 27 V ID = 40 A
t
d(on)
Turn-on Delay Time
t
r
Rise Time
V
DD
R
= 4.7 Ω VGS = 4.5 V
G
(Resistive Load, Figure 3)
Q
g
Q
gs
Q
gd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
= 44V ID= 80A VGS= 5V
V
DD
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 27 VID = 40 A
t
d(off)
Turn-off Delay Time
t
f
Fall Time
V
DD
R
= 4.7Ω, V
G
GS
= 4.5 V
(Resistive Load, Figure 3)
SOURCE DRAIN DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(*)
Pulsed: P ul se duration = 300 µs, duty c yc l e 1.5 %.
(
Pulse widt h l i m i ted by safe operating area.
•)
Source-drain Current
(•)
Source-drain Current (pulsed)
(*)
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
= 80 A VGS = 0
SD
= 80 Adi/dt = 100A/µs
I
SD
V
= 25 VTj = 150°C
DD
(see test circuit, Figure 5)
32
180
100
18
53
135
80
100
310
6.2
136nC
80
320
1.5V
ns
ns
nC
nC
ns
ns
A
A
ns
nC
A
Safe Operating AreaThermal Impedance
3/10
Page 4
STB80NF55L-06 STP80NF55L-06
Output CharacteristicsTransfer Characteristics
TransconductanceStatic Drain-source On Resistance
Gate Charge vs Gate-source VoltageCapacitance Variations
4/10
Page 5
STB80NF55L-06 STP80NF55L-06
Normalized Gate Threshold Voltage vs TemperatureNormalized on Resistance vs Temperature
Source-drain Diode Forward CharacteristicsNormalized Breakdown Voltage vs Temperature.
..
..
5/10
Page 6
STB80NF55L-06 STP80NF55L-06
Fig. 1: Unclamped Inductive Load Test CircuitFig. 1: Unclamped Inductive Load Test CircuitFig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Information furnished is believed to be accurate an d rel i able. However, STMicroelectro ni cs assumes no responsibility for the consequen ces
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent ri ghts of STM i croelectr onics. Sp ecifications mentioned in thi s publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics product s are not
authorized for use as cri tical comp onents in lif e support devi ces or systems without express written approv al of STMicroel ectronics.
The ST log o i s registered trademark of STMicroelectronics
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All other names are the property of their respective ow ners.
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10/10
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