Datasheet STB60NF06 Datasheet (SGS Thomson Microelectronics)

Page 1
STB60NF06
N-CHANNEL 60V - 0.014- 60A D2PAK
STripFET™ POWER MOSFET
TYPE V
DSS
STB60NF06 60V < 0.016
TYPICAL R
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
APPLICATION ORIENTED
(on) = 0.014
DS
R
DS(on)
I
D
60A
CHARACTERIZATION
ADD SUFFIX “T4” FOR ORDERING IN TAPE &
REEL
DESCRIPTION
This Power Mosfet series realized with STMicro­electronics unique STripFET process has specifical­ly been designed to minimize input capacitance and gate charge. It is therefore suitable as primary switch in advanced high-efficiency isolated D C-DC converters for T el ecom and Computer application. It is also intended for any application with low gate charge drive requirements.
APPLICATIONS
HIGH-EFFICIENCY DC-DC CONVERTERS
UPS AND MOTOR CONTROL
AUTOMOTIVE
3
1
D2PAK
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 4 V/ns
T
stg
T
j
() Pulse width limited by safe operating area
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
60 V 60 V
Gate- source Voltage ± 20 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
(●)
Drain Current (pulsed) 240 A Total Dissipation at TC = 25°C
60 A 42 A
110 W
Derating Factor 0.73 W/°C
Storage Temperature –65 to 175 °C Max. Operating Junction Temperature 175 °C
(1) I
60A, di/dt≤400 A/µs, V
SD
24V, Tj≤T
DD
jMAX
1/9February 2001
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STB60NF06
THERMA L D ATA
Rthj-case Thermal Resistance Junction-case Max 1.36 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
T
l
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Maximum Lead Temperature For Soldering Purpose 300 °C
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
Drain-source
= 25 °C, ID = IAR, VDD = 30 V)
j
ID = 250 µA, VGS = 0 60 V
30 A
360 mJ
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ± 20V ±100 nA
GS
A
10 µA
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
V
= VGS, ID = 250µA
DS
VGS = 10V, ID = 30 A
24V
0.014 0.016
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS =15V , ID= 30 A 20 S
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 360 pF Reverse Transfer
Capacitance
V
= 25V, f = 1 MHz, VGS = 0
DS
1810 pF
125 pF
2/9
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STB60NF06
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 108 ns Total Gate Charge VDD = 48V, ID =60A,VGS = 10V 49
Gate-Source Charge 18 nC Gate-Drain Charge 14 nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
t
d(off)
t
f
t
f
t
c
Turn-off-Delay Time Fall Time
Off-voltage Rise Time Fall Time Cross-over Time
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (2)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty c ycle 1.5 %.
2. Pulse width li mited by safe operating area.
Source-drain Current 60 A
(1)
Source-drain Current (pulsed) 240 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
= 30 V, ID = 30 A
DD
R
= 4.7Ω VGS = 10V
G
(see test circuit, Figure 3)
VDD = 30 V, ID = 30 A, RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 3) Vclamp =48V, I
RG=4.7Ω, V
D
GS
= 60 A
= 10V
(see test circuit, Figure 3)
ISD = 60 A, VGS = 0
= 60 A, di/dt = 100A/µs,
I
SD
VDD = 25V, Tj = 150°C (see test circuit, Figure 5)
16 ns
66
43 20
40 12 21
1.3 V
73
182
5
nC
ns ns
ns ns ns
ns
nC
A
Safe Operating Area Ther m al Impede n c e
3/9
Page 4
STB60NF06
Output Characteristics
Transconductance Static Drain-source On Resistance
Transfer Characteristics
Gate Charge vs Gate-source Voltage
4/9
Capacitance Variations
Page 5
STB60NF06
Normalized Gate Threshold Voltage vs Temperature
Source-drain Diode Forw ard Ch aracteristi cs
Normalized On Resistance vs Temperatur e
5/9
Page 6
STB60NF06
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
6/9
Page 7
2
D
PAK MECH ANICAL DATA
STB60NF06
DIM.
MIN. TYP MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 A1 2.49 2.69 0.098 0.106 A2 0.03 0.23 0.001 0.009
B 0.7 0.93 0.027 0.036 B2 1.14 1.7 0.044 0.067
C 0.45 0.6 0.017 0.023
C2 1.23 1.36 0.048 0.053
D 8.95 9.35 0.352 0.368
D1 8 0.315
E 10 10.4 0.393 E1 8.5 0.334
G 4.88 5.28 0.192 0.208
L 15 15.85 0.590 0.625 L2 1.27 1.4 0.050 0.055 L3 1.4 1.75 0.055 0.068
mm. inch
M 2.4 3.2 0.094 0.126
R 0.4 0.015
V2 0º8º
3
7/9
1
Page 8
STB60NF06
D2PAK FOOTPRINT
TAPE AND REEL SHIPMENT (suffix ”T4”)*
TUBE SHIPMENT (no suffix)*
REEL MECHANICAL DATA
DIM.
A 330 12.992 B 1.5 0.059 C 12.8 13.2 0.504 0.520 D 20.2 0795 G 24.4 26.4 0.960 1.039 N 100 3.937 T 30.4 1.197
mm inch
MIN. MAX. MIN. MAX.
TAPE MECHANICAL DATA
DIM.
A0 10.5 10.7 0.413 0.421 B0 15.7 15.9 0.618 0.626
D 1.5 1.6 0.059 0.063
D1 1.59 1.61 0.062 0.063
E 1.65 1.85 0.065 0.073
F 11.4 11.6 0.449 0.456 K0 4.8 5.0 0.189 0.197 P0 3.9 4.1 0.153 0.161 P1 11.9 12.1 0.468 0.476 P2 1.9 2.1 0.075 0.082
R 50 1.574
T 0.25 0.35 0.0098 0.0137
W 23.7 24.3 0.933 0.956
* on s ales type
8/9
mm inch
MIN. MAX. MIN. MAX.
BASE QTY BULK QTY
1000 1000
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STB60NF06
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such informa tion n or for an y infring ement of patent s or other rig hts of third part ies which may resu lt from its use . No l i cen se i s granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical compo nents in life support devices or systems without express written approval of STMicroelectronics.
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