This Power Mosfet is the latest development of
SGS-THOMSON unique ”Single Feature Size”
strip-based process. The resulting transistor
shows extremelyhigh packing density for low onresistance, rugged avalance characteristics and
less critical alignment steps therefore a remarkable manufacturingreproducibility.
Ther mal Resist ance Junction- caseMax
Ther mal Resist ance Junction- ambientMax
Ther mal Resist ance Case-sinkTy p
Maximum Lead Tempera t ure For Sold ering Purpose
l
Avalanche Current, Repetit i v e or Not-Repetitive
(pulse w idth limited by T
Single Pulse Avalanche Energy
AS
(starting T
=25oC, ID=IAR,VDD=20V)
j
max, δ <1%)
j
1.25
62.5
0.5
300
60A
600mJ
o
C/W
oC/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unlessotherwise specified)
case
OFF
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
=250µAVGS=0
I
D
30V
Breakdown Voltage
I
DSS
I
GSS
Zer o Gate Vo lt age
Drain Cur re nt (V
GS
Gat e-body Leakage
Current (V
DS
=0)
=0)
=MaxRating
V
DS
V
=MaxRatingTc=125
DS
o
C
= ± 15 V
V
GS
1
10
± 100nA
ON (∗)
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
V
GS(th )
Gate Threshold
V
DS=VGSID
=250µA
11.72.5V
Voltage
R
DS(on)
I
D(on)
Stati c Drain-so urce On
Resistance
VGS=10V ID=30A
=5VID=30A
V
GS
On State Drain Cu rr e nt VDS>I
D(on)xRDS(on)max
0.0070. 01
0.015
60A
VGS=10V
DYNAMIC
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
g
(∗)Forward
fs
Tr ansconductance
C
C
C
Input Capaci t ance
iss
Out put Capa citance
oss
Reverse Transfer
rss
Capa cit an c e
VDS>I
D(on)xRDS(on)maxID
=30 A25S
VDS=25V f=1MHz VGS= 04000
1000
320
5400
1350
450
µA
µA
Ω
pF
pF
pF
2/8
Page 3
STB60NE03L-10
ELECTRICAL CHARACTERISTICS (continued)
SWITCHINGON
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
t
d(on)
t
r
Turn-on Time
Rise Tim e
VDD=15VID=30A
=4.7 ΩVGS=5V
R
G
(see test circuit, figure 3)
Q
Q
Q
Total Gate Charge
g
Gat e-Sourc e Charge
gs
Gate-Drain Charge
gd
VDD=24V ID=60A VGS=5V62
SWITCHINGOFF
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
t
r(Voff)
t
Of f - voltage Rise T im e
t
Fall Time
f
Cross-over Time
c
VDD=24VID=60A
=4.7 Ω VGS=5V
R
G
(see test circuit, figure 5)
SOURCE DRAIN DIODE
SymbolParameterTest Cond itionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed: Pulse duration =300 µs, duty cycle 1.5 %
(•) Pulse widthlimited by safe operating area
Source-drain Current
(•)
Source-drain Current
(pulsed)
(∗)For ward O n Vo lt ageISD=60A VGS=01.5V
Reverse Recover y
rr
Time
Reverse Recover y
rr
= 60 Adi/dt = 100 A/µs
I
SD
=24VTj=150oC
V
DD
(see test circuit, figure 5)
Charge
Reverse Recover y
Current
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consequencesof use of such information nor for any infringement ofpatents or otherrights of third parties which may resultsfrom its use. No
licenseis granted by implicationor otherwise underany patentor patentrights ofSGS-THOMSONMicroelectronics. Specificationsmentioned
in this publicationare subject to change without notice. This publication supersedes and replaces all information previously supplied.
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writtenapproval of SGS-THOMSONMicroelectonics.