Datasheet stb60ne03l Datasheet

Page 1
STB60NE03L-10
N - CHANNEL ENHANCEMENT MODE
” SINGLE FEATURE SIZE ” POWER MOSFET
TYPE V
DSS
R
DS(on)
I
D
STB60NE03L-10 30 V < 0.010 Ω 60 A
■ TYPICALR
■ EXCEPTIONAL dv/dt CAPABILITY
■ 100% AVALANCHETESTED
■ APPLICATIONORIENTED
DS(on)
=0.007 Ω
o
C
CHARACTERIZATION
■ FOR THROUGH-HOLE VERSIONCONTACT
SALESOFFICE
DESCRIPTION
This Power Mosfet is the latest development of SGS-THOMSON unique ”Single Feature Size” strip-based process. The resulting transistor shows extremelyhigh packing density for low on­resistance, rugged avalance characteristics and less critical alignment steps therefore a remark­able manufacturingreproducibility.
APPLICATIONS
■ HIGH CURRENT, HIGH SPEEDSWITCHING
■ SOLENOIDANDRELAY DRIVERS
■ MOTORCONTROL, AUDIOAMPLIFIERS
■ DC-DC& DC-AC CONVERTERS
■ AUTOMOTIVE ENVIRONMENT(INJECTION,
ABS, AIR-BAG,LAMPDRIVERS,Etc. )
3
1
D2PAK
TO-263
(suffix ”T4”)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symb o l Para meter Value Uni t
V
V
V
I
DM
P
dv/ dt Peak Diode Recov ery vo lt age sl ope 7 V/ns
T
(•) Pulsewidth limitedby safe operating area (1)ISD≤ 60 A,di/dt ≤ 300 A/µs, VDD≤ V
December 1997
Drain-source Voltage (VGS=0) 30 V
DS
Drain- gate Voltage ( RGS=20kΩ)
DGR
Gat e- source Volt age ± 15 V
GS
I
Drain Current (c on t in uous) at Tc=25oC60A
D
I
Drain Current (c on t in uous) at Tc=100oC42A
D
30 V
(•) Drain Current (pulsed) 240 A
Tot al Dissip at i on at Tc=25oC120W
tot
Derating Factor 0.8 W/
Sto rage T emperat ure -65 to 175
stg
T
Max. Oper at in g Junc t io n Temperatur e 175
j
(BR)DSS,Tj≤TJMAX
o
C
o
C
o
C
1/8
Page 2
STB60NE03L-10
THERMAL DATA
R
thj-case
Rthj-amb
R
thc-sin k
T
AVALANCHE CHARACTERISTICS
Symbol Para met e r Max Va lu e Uni t
I
AR
E
Ther mal Resist ance Junction- case Max Ther mal Resist ance Junction- ambient Max Ther mal Resist ance Case-sink Ty p Maximum Lead Tempera t ure For Sold ering Purpose
l
Avalanche Current, Repetit i v e or Not-Repetitive (pulse w idth limited by T
Single Pulse Avalanche Energy
AS
(starting T
=25oC, ID=IAR,VDD=20V)
j
max, δ <1%)
j
1.25
62.5
0.5
300
60 A
600 mJ
o
C/W
oC/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unlessotherwise specified)
case
OFF
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
=250µAVGS=0
I
D
30 V
Breakdown Voltage
I
DSS
I
GSS
Zer o Gate Vo lt age Drain Cur re nt (V
GS
Gat e-body Leakage Current (V
DS
=0)
=0)
=MaxRating
V
DS
V
=MaxRating Tc=125
DS
o
C
= ± 15 V
V
GS
1
10
± 100 nA
ON (∗)
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
V
GS(th )
Gate Threshold
V
DS=VGSID
=250µA
11.72.5V
Voltage
R
DS(on)
I
D(on)
Stati c Drain-so urce On Resistance
VGS=10V ID=30A
=5V ID=30A
V
GS
On State Drain Cu rr e nt VDS>I
D(on)xRDS(on)max
0.007 0. 01
0.015
60 A
VGS=10V
DYNAMIC
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
g
(∗)Forward
fs
Tr ansconductance
C
C
C
Input Capaci t ance
iss
Out put Capa citance
oss
Reverse Transfer
rss
Capa cit an c e
VDS>I
D(on)xRDS(on)maxID
=30 A 25 S
VDS=25V f=1MHz VGS= 0 4000
1000
320
5400 1350
450
µA µA
Ω
pF pF pF
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Page 3
STB60NE03L-10
ELECTRICAL CHARACTERISTICS (continued)
SWITCHINGON
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
t
d(on)
t
r
Turn-on Time Rise Tim e
VDD=15V ID=30A
=4.7 Ω VGS=5V
R
G
(see test circuit, figure 3)
Q
Q
Q
Total Gate Charge
g
Gat e-Sourc e Charge
gs
Gate-Drain Charge
gd
VDD=24V ID=60A VGS=5V 62
SWITCHINGOFF
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
t
r(Voff)
t
Of f - voltage Rise T im e
t
Fall Time
f
Cross-over Time
c
VDD=24V ID=60A
=4.7 Ω VGS=5V
R
G
(see test circuit, figure 5)
SOURCE DRAIN DIODE
Symbol Parameter Test Cond itions Min. Typ. Max. Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed: Pulse duration =300 µs, duty cycle 1.5 % (•) Pulse widthlimited by safe operating area
Source-drain Current
(•)
Source-drain Current (pulsed)
(∗) For ward O n Vo lt age ISD=60A VGS=0 1.5 V
Reverse Recover y
rr
Time Reverse Recover y
rr
= 60 A di/dt = 100 A/µs
I
SD
=24V Tj=150oC
V
DD
(see test circuit, figure 5) Charge Reverse Recover y Current
35
24050320
85 nC 20 31
60 80
150
80
110 200
60
240
70
0.13 4
ns ns
nC nC
ns ns ns
A A
ns
µC
A
Safe Operating Area ThermalImpedance
3/8
Page 4
STB60NE03L-10
OutputCharacteristics
Transconductance
TransferCharacteristics
StaticDrain-sourceOn Resistance
GateCharge vs Gate-sourceVoltage
4/8
CapacitanceVariations
Page 5
STB60NE03L-10
Normalized GateThresholdVoltage vs Temperature
Source-drainDiode Forward Characteristics
Normalized On Resistancevs Temperature
5/8
Page 6
STB60NE03L-10
Fig. 1: UnclampedInductiveLoad Test Circuit
Fig. 3: Switching Times Test CircuitsFor
ResistiveLoad
Fig. 2: UnclampedInductive Waveform
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode RecoveryTimes
6/8
Page 7
TO-263 (D2PAK) MECHANICAL DATA
STB60NE03L-10
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.3 4.6 0.169 0.181
A1 2.49 2.69 0.098 0.106
B 0.7 0.93 0.027 0.036
B2 1.25 1.4 0.049 0.055
C 0.45 0.6 0.017 0.023
C2 1.21 1.36 0.047 0.053
D 8.95 9.35 0.352 0.368 E 10 10.28 0.393 0.404 G 4.88 5.28 0.192 0.208
L 15 15.85 0.590 0.624 L2 1.27 1.4 0.050 0.055 L3 1.4 1.75 0.055 0.068
mm inch
E
A
C2
L2
D
L
L3
B2
B
A1
C
G
P011P6/C
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Page 8
STB60NE03L-10
Information furnished is believedto be accurateand reliable. However,SGS-THOMSON Microelectronics assumes no responsability for the consequencesof use of such information nor for any infringement ofpatents or otherrights of third parties which may resultsfrom its use. No licenseis granted by implicationor otherwise underany patentor patentrights ofSGS-THOMSONMicroelectronics. Specificationsmentioned in this publicationare subject to change without notice. This publication supersedes and replaces all information previously supplied. SGS-THOMSONMicroelectronics productsare notauthorized for useascriticalcomponents in life supportdevices or systems withoutexpress writtenapproval of SGS-THOMSONMicroelectonics.
1997 SGS-THOMSONMicroelectronics - Printedin Italy- AllRights Reserved
Australia- Brazil- Canada - China - France - Germany - Italy- Japan - Korea -Malaysia - Malta- Morocco - The Netherlands -
Singapore- Spain- Sweden - Switzerland- Taiwan - Thailand - United Kingdom- U.S.A
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